TWI320479B - One optoelectronic 6 degree of freedom measurement system based multi-reflection principle - Google Patents

One optoelectronic 6 degree of freedom measurement system based multi-reflection principle

Info

Publication number
TWI320479B
TWI320479B TW96114278A TW96114278A TWI320479B TW I320479 B TWI320479 B TW I320479B TW 96114278 A TW96114278 A TW 96114278A TW 96114278 A TW96114278 A TW 96114278A TW I320479 B TWI320479 B TW I320479B
Authority
TW
Taiwan
Prior art keywords
optoelectronic
degree
system based
measurement system
based multi
Prior art date
Application number
TW96114278A
Other languages
Chinese (zh)
Other versions
TW200842320A (en
Inventor
Hsin Hung Jwo
Wen Yuh Jywe
Psang Dain Lin
Chun Jen Chen
Teng Yu Yang
Original Assignee
Univ Nat Formosa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Nat Formosa filed Critical Univ Nat Formosa
Priority to TW96114278A priority Critical patent/TWI320479B/en
Publication of TW200842320A publication Critical patent/TW200842320A/en
Application granted granted Critical
Publication of TWI320479B publication Critical patent/TWI320479B/en

Links

TW96114278A 2007-04-23 2007-04-23 One optoelectronic 6 degree of freedom measurement system based multi-reflection principle TWI320479B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW96114278A TWI320479B (en) 2007-04-23 2007-04-23 One optoelectronic 6 degree of freedom measurement system based multi-reflection principle

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW96114278A TWI320479B (en) 2007-04-23 2007-04-23 One optoelectronic 6 degree of freedom measurement system based multi-reflection principle

Publications (2)

Publication Number Publication Date
TW200842320A TW200842320A (en) 2008-11-01
TWI320479B true TWI320479B (en) 2010-02-11

Family

ID=44821944

Family Applications (1)

Application Number Title Priority Date Filing Date
TW96114278A TWI320479B (en) 2007-04-23 2007-04-23 One optoelectronic 6 degree of freedom measurement system based multi-reflection principle

Country Status (1)

Country Link
TW (1) TWI320479B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI419763B (en) * 2010-05-27 2013-12-21 Univ Nat Yunlin Sci & Tech Precision optoelectronic inspection device for sensing the cutter tip position

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117146767B (en) * 2023-10-31 2024-01-30 中国船舶集团有限公司第七〇七研究所 Auxiliary device for measuring posture of buffer base and using method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI419763B (en) * 2010-05-27 2013-12-21 Univ Nat Yunlin Sci & Tech Precision optoelectronic inspection device for sensing the cutter tip position

Also Published As

Publication number Publication date
TW200842320A (en) 2008-11-01

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