TWI320479B - One optoelectronic 6 degree of freedom measurement system based multi-reflection principle - Google Patents
One optoelectronic 6 degree of freedom measurement system based multi-reflection principleInfo
- Publication number
- TWI320479B TWI320479B TW96114278A TW96114278A TWI320479B TW I320479 B TWI320479 B TW I320479B TW 96114278 A TW96114278 A TW 96114278A TW 96114278 A TW96114278 A TW 96114278A TW I320479 B TWI320479 B TW I320479B
- Authority
- TW
- Taiwan
- Prior art keywords
- optoelectronic
- degree
- system based
- measurement system
- based multi
- Prior art date
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW96114278A TWI320479B (en) | 2007-04-23 | 2007-04-23 | One optoelectronic 6 degree of freedom measurement system based multi-reflection principle |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW96114278A TWI320479B (en) | 2007-04-23 | 2007-04-23 | One optoelectronic 6 degree of freedom measurement system based multi-reflection principle |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200842320A TW200842320A (en) | 2008-11-01 |
TWI320479B true TWI320479B (en) | 2010-02-11 |
Family
ID=44821944
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW96114278A TWI320479B (en) | 2007-04-23 | 2007-04-23 | One optoelectronic 6 degree of freedom measurement system based multi-reflection principle |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI320479B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI419763B (en) * | 2010-05-27 | 2013-12-21 | Univ Nat Yunlin Sci & Tech | Precision optoelectronic inspection device for sensing the cutter tip position |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN117146767B (en) * | 2023-10-31 | 2024-01-30 | 中国船舶集团有限公司第七〇七研究所 | Auxiliary device for measuring posture of buffer base and using method |
-
2007
- 2007-04-23 TW TW96114278A patent/TWI320479B/en not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI419763B (en) * | 2010-05-27 | 2013-12-21 | Univ Nat Yunlin Sci & Tech | Precision optoelectronic inspection device for sensing the cutter tip position |
Also Published As
Publication number | Publication date |
---|---|
TW200842320A (en) | 2008-11-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |