TWI317813B - Probe card assembly with zif connectors, method of assembling, wafer testing system and wafer testing method introduced by the same
- Google Patents
Probe card assembly with zif connectors, method of assembling, wafer testing system and wafer testing method introduced by the same
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Application filed by King Yuan Electronics Co LtdfiledCriticalKing Yuan Electronics Co Ltd
Priority to TW96100755ApriorityCriticalpatent/TWI317813B/en
Priority to JP2007003647Aprioritypatent/JP2007227899A/en
Publication of TW200829920ApublicationCriticalpatent/TW200829920A/en
Application grantedgrantedCritical
Publication of TWI317813BpublicationCriticalpatent/TWI317813B/en
TW96100755A2006-01-132007-01-09Probe card assembly with zif connectors, method of assembling, wafer testing system and wafer testing method introduced by the same
TWI317813B
(en)
Anistropic conductive connector, conversion adapter for inspection device having the anisotropic conductive connector, and method for manufacturing the anistropic conductive connector