TWI315399B - - Google Patents
Info
- Publication number
- TWI315399B TWI315399B TW95140391A TW95140391A TWI315399B TW I315399 B TWI315399 B TW I315399B TW 95140391 A TW95140391 A TW 95140391A TW 95140391 A TW95140391 A TW 95140391A TW I315399 B TWI315399 B TW I315399B
- Authority
- TW
- Taiwan
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW95140391A TW200821574A (en) | 2006-11-01 | 2006-11-01 | System and method for measuring junction temperature and thermal resistance of light emitting diode |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW95140391A TW200821574A (en) | 2006-11-01 | 2006-11-01 | System and method for measuring junction temperature and thermal resistance of light emitting diode |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200821574A TW200821574A (en) | 2008-05-16 |
TWI315399B true TWI315399B (en) | 2009-10-01 |
Family
ID=44770552
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW95140391A TW200821574A (en) | 2006-11-01 | 2006-11-01 | System and method for measuring junction temperature and thermal resistance of light emitting diode |
Country Status (1)
Country | Link |
---|---|
TW (1) | TW200821574A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104391004A (en) * | 2014-11-27 | 2015-03-04 | 陕西科技大学 | Device and method for testing heat radiation performance of lossless lamp |
US9110125B2 (en) | 2012-08-14 | 2015-08-18 | Industrial Technology Research Institute | Method and apparatus for detecting relationship between thermal and electrical properties of semiconductor device |
US9557368B2 (en) | 2012-08-16 | 2017-01-31 | Industrial Technology Research Institute | Method of measuring thermal electric characteristics of semiconductor device |
TWI833464B (en) * | 2022-11-24 | 2024-02-21 | 長聖儀器股份有限公司 | Thermal resistance measurement results consistency device for cooling modules |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI404923B (en) * | 2008-07-07 | 2013-08-11 | Ind Tech Res Inst | Standard Test Method for PN Joint Temperature of Light Emitting Diodes |
EP2296436B1 (en) * | 2009-09-07 | 2018-11-14 | Nxp B.V. | System and method for output flux measurement of a light emitting diode |
CN103543174B (en) * | 2013-10-30 | 2015-05-13 | 工业和信息化部电子第五研究所 | Testing method and system of junction-loop thermal resistance |
-
2006
- 2006-11-01 TW TW95140391A patent/TW200821574A/en not_active IP Right Cessation
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9110125B2 (en) | 2012-08-14 | 2015-08-18 | Industrial Technology Research Institute | Method and apparatus for detecting relationship between thermal and electrical properties of semiconductor device |
US9557368B2 (en) | 2012-08-16 | 2017-01-31 | Industrial Technology Research Institute | Method of measuring thermal electric characteristics of semiconductor device |
CN104391004A (en) * | 2014-11-27 | 2015-03-04 | 陕西科技大学 | Device and method for testing heat radiation performance of lossless lamp |
TWI833464B (en) * | 2022-11-24 | 2024-02-21 | 長聖儀器股份有限公司 | Thermal resistance measurement results consistency device for cooling modules |
Also Published As
Publication number | Publication date |
---|---|
TW200821574A (en) | 2008-05-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |