1313352 九、發明說明： 【發明所屬之技術領域】 本發明係關於一種測試設備，特別關於一種電子裝置 之掩軸耐久性測試的測試設備。 【先前技術】 一般而言，電子裝置具備有輕薄短小及方便攜帶之功 能已成為現代潮流的趨勢。為縮小電子裝置的體積，以達 到方便攜帶之功效，目前市面上發展出掀蓋方式來縮小其 體積之可攜式電子裝置，例如筆記型電腦及行動通訊裝置 等，掀蓋式之電子裝置於製造後會利用一測試設備來測試 其樞軸的耐久性，藉以提供製造廠商關於電子裝置樞軸的 使用壽命及耐久性等相關資訊，以利廠商改良結構設計， 控官產品品質及暸解其產品的使用特性。 請參照圖1所示，一種習知之測試設備1係用以進行 電子叙置E之樞軸耐久性測試。於此，電子裝置E以筆記 型電腦為例，電子裝置E具有一第一本體E卜一第二本體 E2及一樞軸E3。第一本體m及第二本體E2係樞接於樞 軸E3上，測試設備！具有一底座u、一框架a以及一控 制裝置14。其中’框架12連結二個夹具13，且框架！2 於底座11’控制裝置14與框架12電性 架12轉動。 於測试電子裝置E的樞軸E3耐久性時，首先，將電 子#置E之第—主體E1固定於測試設備}之底座η上。 5 1313352 接著，利用央具13將電子裝置 牟12卜。·> a 弟—主體E2固定於框 = 再利用控制裝£14來控制框㈣相對 =二體二本體E2，B3為中心，: 丁#、乐丰體jgl轉動。鞋 =::r-n轉動㈣式== 弟-本體E2以樞軸E3為甲心 幻轉動’直到樞軸£3斷裂或損壞為 :壯1313352 IX. Description of the Invention: [Technical Field] The present invention relates to a test apparatus, and more particularly to a test apparatus for the shaft endurance durability test of an electronic device. [Prior Art] In general, the electronic device has the functions of being light, thin, and easy to carry, and has become a trend of modern trends. In order to reduce the size of the electronic device, in order to achieve the convenience of carrying, the portable electronic device such as a notebook computer and a mobile communication device, such as a notebook computer and a mobile communication device, has been developed on the market. After testing, a test equipment is used to test the durability of its pivots, so as to provide manufacturers with information on the service life and durability of the electronic device pivots, so as to improve the structural design, control the quality of the controller and understand its products. Use characteristics. Referring to Figure 1, a conventional test apparatus 1 is used for the pivot durability test of the electronic presentation E. For example, the electronic device E is exemplified by a notebook computer. The electronic device E has a first body E, a second body E2, and a pivot E3. The first body m and the second body E2 are pivotally connected to the pivot E3, and the testing device! There is a base u, a frame a and a control device 14. Where the 'frame 12 joins the two clamps 13, and the frame! 2 The control unit 14 of the base 11' rotates with the frame 12 of the frame 12. When testing the durability of the pivot E3 of the electronic device E, first, the first body E1 of the electronic device E is fixed to the base η of the test device}. 5 1313352 Next, the electronic device is turned on by the center device 13. · a brother - the main body E2 is fixed in the box = reuse control installed £14 to control the box (four) relative = two body two bodies E2, B3 as the center,: Ding #, Le Feng body jgl rotation. Shoe =::r-n rotation (four) == brother - body E2 with pivot E3 for the heart of the magical illusion ' until the pivot is broken or damaged:
置E之抱㈣3的使用壽命及耐久性。冑场知電子I 利用上述方式’僅由框架12帶 本體E2相對於第—主 子裝置β之弟二 況下，使用者於⑽斗1轉動。然而’在長期使用的情 有鐘於此，如何提供期受力作用而損壞。 際使用狀態時，電子I置^ °式°又備施夠正確地模擬實 形，實為重要課題之衫正向力作用而損壞的情 【發明内容】 有鑑於上述課題，本 地模擬實際使用狀態時，：二==供-種能夠正確 損壞的情形之測試設備。裝置因長射正向力作用而 緣疋’為達上述目的， 應用於測試一電子奘番 種叫忒堍備係 二本體及-樞軸ί 2子裝置具有一第一本體、-第 設備包含-底座、一框!體士第二本雜與樞轴樞接。測試 木、一施力機構以及一控制裂置. 1313352 底座係承載並固定第一本體，框架係樞設於底座；施力機 構係設置於框架，以固定第二本體’並施加一正向力至樞 軸；控制裝置係與框架電性連接，控制框架轉動，帶動第 二本體以樞軸相對於第一本體轉動。 承上所述，因依據本發明之測試設備係藉由施力機構 施加一平行於第二主體之正向力至樞轴的方式，來模擬實 際使用時開啟與閉合電子裝置之受力狀態。與習知技術相 較，本發明能夠正確地模擬實際使用狀態，暸解樞軸因長 期受正向力作用而損壞的情形，藉以改良樞軸的結構設 計，提高樞軸的可靠度與使用壽命。 【實施方式】 以下將參照相關圖式，說明依據本發明較佳實施例之 一種測試設備，其中相同的元件將以相同的參照符號加以 說明。 請參閱圖2A所示，本發明較佳實施例之一種測試設 備2包含一底座21、一框架22、一施力機構23以及一控 制裝置24。測試設備2係應用於測試一電子裝置E，電子 裝置E具有一第一本體E卜一第二本體E2及一樞轴E3， 第一本體E1及第二本體E2與樞軸E3框接。電子裝置E 係可為一筆記型電腦或一行動通訊裝置，但不限於手機； 於本實施例中，電子裝置E係以筆記型電腦為例。此外， 具有二個本體並藉由樞軸樞接，而可開啟與閉合的電子裝 置，本發明之測試設備均可應用以模擬實際使用時開啟與 1313352 閉合之受力狀態。 底座21係承載並固定第一本體E1，底座21下更可設 置至少一支撐座25,以因應不同的電子裝置E的尺寸與厚 度，以機械或手動方式調整底座21之高度與角度；於本 實施例中，係配置四個支撐座25鄰近於底座21的四個角 落。框架22樞設於底座21，使框架22能夠以樞接處為轉 動中心，相對於底座21轉動，藉由框架22轉動而帶動第 二本體E2轉動。 施力機構23設置於框架22上，以固定第二本體E2, 俾便於框架22轉動時帶動第二本體E2 —併轉動。此外， 施力機構23施加一正向力N至第二本體E2,第二本體E2 受到正向力N作用會傳遞至樞軸E3，故可模擬柜轴E3長 期受正向力N作用而損壞的情形。控制裝置24與框架22 電性連接，用以控制框架22相對於底座21轉動，而帶動 第二本體E2以枢軸E3為轉動中心，相對於第一本體E1 φ 轉動。控制裝置24係具有一感測元件（圖未顯示），其係 計數第二本體E2相對於第一本體E1轉動之轉動次數，感 測元件係可為一紅外線感測器（IR sensor )、一紫外線感測 ' 器（UV sensor)、一光感測器或一超音波感測器，或可為 一壓電感測器。 請參照圖2B所示，施力機構23具有一夾持件231及 一螺桿232;夾持件231係用以固定第二本體E2,螺桿232 具有一第一端2321及一第二端2322,第一端2321連結於 框架22，第二端2322連結於夾持件231，且藉由螺桿232Set the life and durability of the O (4) 3. In the above-described manner, the user only rotates the body 10 with the body E2 with respect to the first master device β. However, in the long-term use of the situation, how to provide the period of force and damage. In the state of use, the electronic I is set to ° ° ° and the correct simulation of the real shape, which is an important issue of the positive impact of the shirt and the damage [invention] In view of the above issues, the local simulation of the actual use state When: 2 == for a test device that can be properly damaged. The device is used for testing the above-mentioned purpose due to the long-range positive force action, and is applied to test an electronic device. The sub-body and the pivot axis ί 2 sub-device have a first body, and the first device includes - Base, a frame! The second body of the body is pivoted with the pivot. Test wood, a force applying mechanism and a control split. 1313352 The base system carries and fixes the first body, and the frame is pivoted on the base; the force applying mechanism is disposed on the frame to fix the second body and apply a positive force To the pivot; the control device is electrically connected to the frame, and the control frame rotates to drive the second body to pivot relative to the first body. As described above, the test apparatus according to the present invention simulates the force state of opening and closing the electronic device in actual use by applying a positive force parallel to the second body to the pivot by the urging mechanism. Compared with the prior art, the present invention can correctly simulate the actual use state and understand the situation that the pivot is damaged by the positive force for a long period of time, thereby improving the structural design of the pivot and improving the reliability and service life of the pivot. [Embodiment] Hereinafter, a test apparatus according to a preferred embodiment of the present invention will be described with reference to the accompanying drawings, wherein the same elements will be described with the same reference numerals. Referring to FIG. 2A, a test device 2 according to a preferred embodiment of the present invention includes a base 21, a frame 22, a force applying mechanism 23, and a control device 24. The test device 2 is applied to test an electronic device E. The electronic device E has a first body E and a second body E2 and a pivot E3. The first body E1 and the second body E2 are connected to the pivot E3. The electronic device E can be a notebook computer or a mobile communication device, but is not limited to a mobile phone. In the embodiment, the electronic device E is exemplified by a notebook computer. In addition, an electronic device having two bodies that can be opened and closed by pivoting, the test apparatus of the present invention can be applied to simulate the force state of opening and 1313352 closing in actual use. The base 21 carries and fixes the first body E1, and at least one support base 25 is disposed under the base 21 to adjust the height and angle of the base 21 mechanically or manually according to the size and thickness of different electronic devices E; In the embodiment, four support seats 25 are disposed adjacent to the four corners of the base 21. The frame 22 is pivotally mounted on the base 21, so that the frame 22 can be rotated with respect to the base 21 by the pivoting portion, and the second body E2 is rotated by the rotation of the frame 22. The urging mechanism 23 is disposed on the frame 22 to fix the second body E2, so that the second body E2 is driven and rotated when the frame 22 is rotated. In addition, the urging mechanism 23 applies a positive force N to the second body E2, and the second body E2 is transmitted to the pivot E3 by the positive force N, so that the cabinet axis E3 can be damaged by the positive force N for a long time. The situation. The control device 24 is electrically connected to the frame 22 for controlling the rotation of the frame 22 relative to the base 21, and drives the second body E2 to rotate relative to the first body E1 φ with the pivot axis E3 as a center of rotation. The control device 24 has a sensing component (not shown) that counts the number of rotations of the second body E2 relative to the first body E1. The sensing component can be an infrared sensor (IR sensor), A UV sensor, a light sensor or an ultrasonic sensor, or a pressure sensor. As shown in FIG. 2B, the urging mechanism 23 has a clamping member 231 and a screw 232. The clamping member 231 is configured to fix the second body E2. The screw 232 has a first end 2321 and a second end 2322. The first end 2321 is coupled to the frame 22, and the second end 2322 is coupled to the clamping member 231 and is supported by the screw 232.
她刀機稱 1313352 轉動來改變夾持件231與框架22間的距離。舉例來^ 當炎持件231與螺桿232之第二端2322固定時，藉由螺 桿232的第-端2321相對於框架22轉動，使螺桿攻朝 向或遠離框架22位移，使得夾持件別與框架^間的距 離縮短或加長；或者，當螺桿232的第—端2321鱼框 22固定時’藉由螺桿232的第二端m2與夾持件如相 對轉動’使夾持件231於螺桿232上位移，調整夾持件231 與框架22間的距離縮短或加長。換言之，經由夾持件231 與螺桿232、或螺桿232與框架22間的相對轉動，來調敕 (縮短或加長）炎持件231與框架22間的距離，以調= 施力機構23施予第二主體Ε2之正向力㈣大小。 ，旯，、有一彈性件233,其係設置於夾 231與框架22之間；例如，彈性件⑶可套設螺桿2 與螺桿232平行設置於夹持件23!與框架22之間。於此戈 當夾持件231與框架2? 間的距離固定時，則可藉由彈性 件攻的㈣例如壓縮量來馳正 ^ :合實際使用狀態之正向力Ν，達 = =_件231與框架22 :: 整弹性件233所提供之正向 ^ 术凋 可為一彈箬、一彈 的大小。再者，彈性件233 行目女 ㈣或—伸縮㈣’但並不以此為限，任 何具有彈性功能之元件皆為本實施例之範嘴。 動過7_刚本發物之職設備2之作 請參照圖3所 不，首先，將電子裝置 Ε放置在底座21 9 1313352 上，並將第一本體El固定於底座21上。接著，再調整施 力機構23之夾持件231夾持第二本體E2之端部，並調控 施加在第二本體E2之正向力N。最後，啟動控制裝置24， 並控制其作動速度，使框架22相對於底座21轉動，因而 帶動第二本體E2以樞轴E3為中心，相對於第一本體E1 轉動。框架22於轉動的過程中，施力機構23之螺桿232 及彈性件233會施加一正向力N於第二本體E2，再傳遞 _ 作用至樞軸E3。利用上述方式，反覆地模擬使用狀態時樞 m 軸E3長期受正向力N作用的对久性測試，直至植轴E3 損壞或斷裂為止。其中，於測試過程中，控制裝置24之 . 感測元件（例如紅外線感測器）會計數第二本體E2相對 於第一本體E1轉動之轉動次數，得知樞轴E3的使用壽命 及耐久性。 綜上所述，因依據本發明之測試設備係藉由施力機構 施加一平行於第二主體之正向力至樞軸的方式，模擬實際 ^ 使用時開啟與閉合電子裝置之受力狀態。與習知技術相 較，本發明能夠正確地模擬實際使用狀態，瞭解柩軸因長 期受正向力作用而損壞的情形，藉以改良樞軸的結構設 計，提高樞軸的可靠度與使用壽命。 以上所述僅為舉例性，而非為限制性者。任何未脫離 本發明之精神與範疇，而對其進行之等效修改或變更，均 應包含於後附之申請專利範圍中。 【圖式簡單說明】 10 1313352 圖1為一種習知之測試設備之示意圖； 意圖 圖2A為依據本發明較佳實施例:一種測試設備之 2B為依據本發明輕每 意圖；以及 土只轭例之測試設備中施力 圖 構之示意圖；以及 圖3為圖2A的剩試設傷之作動示意圖 元件符號說明： 1 ' 2 :測試設備 11、21 :底座 12 ' 22 :框架 13 :夾具 14 ' 24 :控制裝置 23 :施力機構 231 I夾持件 232 :螺桿 2321 :第一端 2322 :第二端 233 :彈性件 25 :支撐座 E :電子裝置 E1 :第一主體 E2 :第二主體 E3 :樞軸 N :正向力Her cutter calls 1313352 to rotate to change the distance between the clamp 231 and the frame 22. For example, when the holding member 231 is fixed to the second end 2322 of the screw 232, the first end 2321 of the screw 232 is rotated relative to the frame 22 to displace the screw toward or away from the frame 22, so that the clamping member is not The distance between the frames is shortened or lengthened; or, when the first end 2321 of the screw 232 is fixed, the holder 231 is screwed to the screw 232 by the second end m2 of the screw 232 and the clamping member being rotated relative to each other. With the upper displacement, the distance between the adjusting clamp 231 and the frame 22 is shortened or lengthened. In other words, the distance between the susceptor 231 and the frame 22 is adjusted (shortened or lengthened) via the relative rotation between the clamp 231 and the screw 232, or the screw 232 and the frame 22, to be adjusted by the urging mechanism 23 The positive force (four) of the second body Ε2. And, an elastic member 233 is disposed between the clip 231 and the frame 22; for example, the elastic member (3) can be disposed between the clamp member 23 and the frame 22 in parallel with the screw 232. When the distance between the grip member 231 and the frame 2 is fixed, the amount of compression can be corrected by the amount of compression of the elastic member (for example, the amount of compression): the positive force of the actual use state, up to ==_ 231 and the frame 22: the full elastic member 233 provides a positive control, which can be a size of a magazine and a bullet. Furthermore, the elastic member 233 is a female (4) or a telescopic (four)', but is not limited thereto, and any component having an elastic function is the mouth of the embodiment. Moving through the device 2 of the original job of the present invention, please refer to FIG. 3. First, the electronic device Ε is placed on the base 21 9 1313352, and the first body E1 is fixed to the base 21. Next, the gripping member 231 of the biasing mechanism 23 is gripped to clamp the end of the second body E2, and the positive force N applied to the second body E2 is regulated. Finally, the control device 24 is activated, and its actuation speed is controlled to rotate the frame 22 relative to the base 21, thereby driving the second body E2 to rotate relative to the first body E1 centering on the pivot E3. During the rotation of the frame 22, the screw 232 and the elastic member 233 of the urging mechanism 23 apply a positive force N to the second body E2, and then transfer _ to the pivot E3. In the above manner, the durability test of the pivotal m-axis E3 for a long time by the positive force N is repeatedly simulated until the planting axis E3 is damaged or broken. Wherein, during the test, the sensing component (for example, the infrared sensor) counts the number of rotations of the second body E2 relative to the first body E1, and knows the service life and durability of the pivot E3. . In summary, since the test apparatus according to the present invention applies a positive force parallel to the second body to the pivot by the urging mechanism, the actual state of the force of opening and closing the electronic device during use is simulated. Compared with the prior art, the present invention can correctly simulate the actual use state and understand the situation that the boring shaft is damaged by the positive force for a long period of time, thereby improving the structural design of the pivot shaft and improving the reliability and service life of the pivot shaft. The above is intended to be illustrative only and not limiting. Any equivalent modifications or alterations to the spirit and scope of the present invention are intended to be included in the scope of the appended claims. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a schematic view of a conventional test apparatus; FIG. 2A is a preferred embodiment of the present invention; 2B of a test apparatus is a light intent according to the present invention; and a soil yoke example Schematic diagram of the force diagram in the test equipment; and Fig. 3 is the schematic diagram of the operation of the residual test setup of Fig. 2A. Symbol: 1 ' 2 : Test equipment 11, 21: base 12 ' 22 : frame 13 : clamp 14 ' 24 : Control device 23: urging mechanism 231 I clamping member 232: screw 2321: first end 2322: second end 233: elastic member 25: support base E: electronic device E1: first body E2: second body E3: pivot Axis N: positive force