TWI301194B - Inspection member and inspection method using the same - Google Patents

Inspection member and inspection method using the same Download PDF

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Publication number
TWI301194B
TWI301194B TW094126487A TW94126487A TWI301194B TW I301194 B TWI301194 B TW I301194B TW 094126487 A TW094126487 A TW 094126487A TW 94126487 A TW94126487 A TW 94126487A TW I301194 B TWI301194 B TW I301194B
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Taiwan
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optical film
inspection
light
film
inspection member
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TW094126487A
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Chinese (zh)
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TW200610964A (en
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Yukinori Sakumoto
Keiichiro Haji
Tsutomu Kurokoshi
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Tomoegawa Paper Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306Details
    • G02F1/1309Repairing; Testing
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/1335Structural association of cells with optical devices, e.g. polarisers or reflectors
    • G02F1/133509Filters, e.g. light shielding masks

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  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Polarising Elements (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Description

1301194 九、發明說明: 【發明所屬之技術領域】 本毛明係有關光學膜片用檢查構件及光學膜片之檢查 方法者。 【先前技術】 近幾年來,在組裝於液晶顯示器等最前面之偏光板表 面’大部分多用光學膜片。而該光學膜片係為一種防眩膜 片,或為反射防止膜片,係用於防止液晶晝面的受傷、及 為抑制太陽光、外光、日光燈等的光線照射生成之眩光, 以使液晶畫面容易目視。又於電漿顯示面板(pDp,pia咖1301194 IX. Description of the Invention: [Technical Field of the Invention] The present invention relates to an inspection member for an optical film and an inspection method for an optical film. [Prior Art] In recent years, an optical film has been mostly used in the front surface of a polarizing plate assembled on a liquid crystal display or the like. The optical film is an anti-glare film or an anti-reflection film for preventing damage to the liquid crystal surface and suppressing glare generated by irradiation of sunlight, external light, fluorescent lamps, etc., so that The LCD screen is easy to see. Also on the plasma display panel (pDp, pia coffee)

Display Panel)之表面亦以光學膜片,在玻璃表面使用為 PDP用反射防止膜片。 如述,將光學膜片用於液晶顯示器等時,若#氣泡或 異物存在於偏光膜片内部,將造成顯示特性的妨礙。因此, 提案中有一種檢查光學膜片有無異常的檢查方法(參照專 丨利文獻1)。該專利文獻i記載的檢查方法,係於黑色板上 放置膜片等被檢體後,對被檢體照射光線,將該照射光的 反射光’以攝影裝置予以攝影,而檢測出不良的部位。 亦有提案於光學膜片之一面塗上累色墨彳,由光學膜 片之另一面照射光線,以觀察其反射光的方法。更有將偏 光膜片作成偏光轴方向直交重疊的交叉偏光(__ 叫 狀黏貼在光學膜片—面’同樣照射光線,以觀察其反射光 的方法。 〈專利文獻1>曰本·特開平6_288927號公報。 317272修正本 5 1301194 [發明所欲解決的問題] J而,ό己載於上述專利文獻2的膜片檢查方法,因膜 ^與黑色板間形成有空氣層,而由該空氣層產生多餘外亂 〇 ’而有使檢查精確度劣化的情形。另__方面,^係塗布 黑^油墨時,由塗布油墨汁的不均勻,即難於判斷是否為 $孥膜片内部缺陷或塗布不勻。復有因黑色油墨溶媒的光 予膜片侵飯,無法為長時間的保存,且有因黑色油墨 _作業現場的問題。 又若將重疊偏光膜片黏貼在光學膜片一面時,將i黏 ,為=叉偏光鏡的作業上有其困難度而產生品質上的^ 定。復因黏貼為交又偏光鏡的偏光膜片通常為單板,因於 財上的限定較大,故較難使用且在檢查上所需的成本亦 鬲〇 二本發明料解決上述問題而創作者,係提供—種得以 南精確度判斷光學膜片良否的光學膜片用檢 丨膜片檢查方法為目的。 —傅仟及光子 【發明内容】 [為解決問題的手段] 為達成上述目的’本發明係提供下述手段者。 本發明的光學膜片用檢查構件係於基材:堆積黏 件而成的檢查構件,該基材及黏著 性構件。 考稱件之至少-方為遮光 本發明的光學膜片用檢查構件中, 氺柹媸杜口人各 上述黏著構件為遮 先性構件,且含有著色成分。 门、 317272修正本 1301194 中,上述基材為遮光性 本發明的光學膜片用檢查構 構件,且具備金屬落片。 本發明的光學膜片的檢查方法,係於使用上述光學膜 片用檢查構件之光學膜片檢查方法中,具備:於上述黏著 構件上黏貼光學膜片的步驟;在上述光學膜片表面照射光 的步驟;觀察由上述光學膜片反射之反射光的步驟;以及 依據所觀察的反射光,判斷上述光學膜片之良否的 [發明的效果] 有關本發明的光學膜片用檢查構件,係具備··遮斷先 透過的遮光構件,及配置在該遮光構件 =遮光構件予以黏貼之黏著構件的構成,故得藉由:: 遮先構件予以緊密黏貼,由此可抑制多 =ua。因此’得以檢測出僅由光學 因使用遮光構件,不致以如習用方法產生塗布不勾故二 以完全遮斷光線而進行檢查, 赢且W 侍徒升檢查精確度。 •為疋間易的構成,可節省檢查所需的成本。 備:ΪΓ本發明的另一發明的光學膜片用檢查構件,係具 二,配置於該基材之—面並具有可將光學膜片與基 :貝:具:者性遮光構件’因而,可將遮光性 黏著學联片檢查方法,係具有:於 先的學膜片的㈣;在光學膜片的表面照射 /'鄉,减祭由光學膜片及身+ 尤子膜月反射之反射光之步驟;及依據 317272修正本 1301194 判斷光學膜片良否的步驟等;因而,可檢 •查先予膜片的良否,同時’因係簡易檢查之步驟 • 學膜片之檢查效率提升。 ' 【實施方式】 [實施本發明的最佳形態] 兹參照第1及第2圖,說明本發明之—實施形態如下: 有關本發明的光學膜片20用之檢查構件1(),係如第! 圖所示’具備:遮斷透過光的遮光構件u,及配置在遮光 構件11之一面lla,而將光學膜片20與遮光構件n予以 黏貼的黏著構件12。 遮光構件11為樹脂膜片,係以黑色聚對苯二甲酸乙二 醇醋(polyethylene terephthalate,下稱黑色 PET)所成文。由一 此’模擬成交叉偏光(crossnicol)狀態。又於遮光構件 係以交叉偏光狀態為最宜,且係以黑色之可遮光構件較 因此’遮光構件η係採用樹脂膜片,唯不限定為樹月旨 _膜片’亦得為黑色的板狀鐵板等。 ” 12’以黑色染料著色的丙烯酸樹脂(acrylic aCldreSm)為宜。而該著色黏著構件12的著色劑,若為石户 黑㈣bon Mack)等顏料系列物,即因顏料粒子而有使光ς 反射時候’因而於檢查光學膜片時,有不易觀察異物的缺 陷’故以黑色染料系列的著色劑較宜。若以上述方式著色 的黏著構件,即可抑制光學膜片表面的散亂光線,較宜以 提升檢查精確度。 黏著構件12,可不限定於丙烯酸樹脂,例如;eva系、 8 317272修正本 1301194 烯羥(〇lefmes)系、聚酯(polyester)系、矽酮(silic〇ne)系、 胺基甲酸酯(urethane)系等系列的黏著材料皆可使用。唯因 丙烯酸樹脂係與基體22之折射率(refractive index)相等, 且透明性優異而較佳。 由本發明的檢查構件1 〇檢查的光學膜片2〇,係由透 明樹脂層21,與基體22積層而成,上述基體22係抵接於 配置在其一端22a側的透明樹脂層21。然後,將基體22 之另一端22b側的面黏著於黏著構件12上。 又因構成該透明樹脂層21的樹脂,為一種光學上的透 明樹脂,但得使用可透過光線的非透明狀物。該樹脂的透 明性,係以較高程度者為宜。應有透光率(JIS C6714)80o/〇 以上,且以85%以上較為適用。又若該透明樹脂的透光性 極鬲,雖於樹脂本身著色,或以染料及顏料著色亦能用於 檢查。 滿足該特性的材料,可列舉所謂的具有終始黏著性的 籲黏著劑等於加熱時顯示黏著性者、包含溶劑而顯示黏著性 者、及以光或熱硬化材料之硬化前狀態者皆可使用。 而該樹脂即有:聚酯(p〇1yester);聚醯胺(p〇ly_amide); 聚乙烯醇(polyvinyl alc〇h〇1) ··聚胺基曱酸酯 (polyurethane);聚苯乙烯(p〇1yStyrene);聚縮醛 (polyacetal) ;聚碳酸酯(polycarb〇nate) ;丙烯酸系 袞氧(epoxy),砍酮(siHc〇ne);纖維素(ceud⑽等樹脂及 各種衍生物等,但並不限制於這些材料。 又為獲得高透光性,該透明樹脂21的折射率係以14〇 317272修正本 9 1301194 、至1.70的範圍為宜。 基體22,通常可使用一般透明膜片。若能透光亦得使 用非透明狀物,而該透光性基體之透明性,一般係以較高 透明性者為宜。故以透光率(JIS C6714)為80%以上,且以 85%以上較佳。亦以模糊值(Haze value)(JIS K7105)為3.0 以下,且較宜為1·0以下,最好係0·5以下者。折射率即 以1.40至1.80為較適以使用。具體而言,可使用聚對苯 二曱酸乙二酯酯(polyethylene terephthalate,PET);聚萘二 _ 曱酸乙二醇酯(polyethylene naphthalate(PEN);三乙驢基纖 維素(triacetylcellulose,TAC);聚烯丙酯(polyallylate);聚 亞酸胺(polyimide);聚醚(polyether);聚碳酸酯 (polycarbonate);聚楓(polysulfone);聚醚楓 (polyethersulfone);賽路芬(cellophane);聚酸胺 (polyamide);聚乙烯(polyethylene);聚丙烯 (polypropylene);聚乙烯醇(polyvinyl alchol)等所成的各種 •樹脂膜片。 又,黏著構件12的折射率,係為防止基體22與黏著 構件12界面的反射,係以相同於基體22為宜。 如第2圖所示,檢查光學膜片20之檢查裝置30應為 平坦,同時亦須具備:可裝載光學膜片20的基台31,及 向光學膜片20照射光線的光照射部32,而該光照射部32 通常為三波長的日光燈,但得配合用途使用鎢絲燈光、綠 燈、太陽光燈尊。 其次,以使用以上構成的本實施形態之檢查構件,說 10 317272修正本 1301194 明進行光學膜片20檢查的方法於後·· 首先’在黏著構件12上黏著光學膜片2〇的基體22 之另一端22b侧面。 之後’如第2圖所示,使黏著檢查構件10的光學膜片 20能位於基台31基台31側位置,載置於基台31。然後, 由光妝射部32將光線照射在光學膜片20表面,以目視觀 祭光學膜片20的反射光。由該目視觀察的反射光模糊 籲(hazeness)均勻度或依該色相判斷光學膜片2〇的良否。 唯本實施形態可不限於目視觀察,得使用分光光度計 或模糊計等,由分光光譜或模糊度的偏差等判斷光學膜片 20的良否。 由有關本實施形態的光學膜片20用檢查構件1(),因 黏著構件i 2係以黑色染料著色丙烯酸系(acryl)樹脂,以使 黏著構件12㈣的折射率均—,.故得以抑制内部的亂反 射。又因遮光構件11為一膜片,亦得以將檢查構件10捲 •成軸狀’若該光學膜片20能捲為捲軸狀體時,即較為方便。 [實施例] 其次,說明將本發明予以具體化的實施例如下: [製造例1] *製造含有條紋、色差、段差及點缺陷等之低反射防止 膜片(光學膜片)20。該低反射防止膜片2〇的製造方法, 使用塗布裝置(未圖示)予以製造。 ’、 [製造例2] 才双查構件10的製造方法,係於光學用 子用逆的丙烯酸系黏 317272修正本 11 1301194 著劑,對固體部分以質量部4 : 5予以添加黑色染料,由攪 •拌器(shaker)攪拌20分鐘。然後以器具(applicat〇r,未圖示) ,將作成的黑色黏著劑塗布於亲,j離的聚對苯二甲酸乙二醇酯 • (Polyethylene terephthalate,PET),放在 80之烤爐(〇ven, 未圖示)2分鐘。在烤爐加熱後,即可黑色黏著劑片(黏著構 件)12將剝離PET予以剝離(圖略)。再將獲得的黑色黏著 劑片12黏貼於黑pet作成檢查構件10。 [比較例1 ] • 在基台31上鋪好黑布(MIYUKITEXM700),在上面放 置低反射防止膜片20,進行低反射防止膜片的表面檢查。 [比較例2] 一 於低反射防止膜片20背面滴下黑色墨汁。以專用毛刷 予以塗布成評價樣本。然後在基台31上載置低反射防止膜 片20,進行低反射防止膜片2〇的表面檢查。 、 [比較例3] _ 將偏光板(HLC2_5618)黏貼成交叉偏光(crossed nicol) 狀以薄板將偏光板及低反射防止膜片2〇黏貼。然後,於基 台31上載置低反射防止膜片2〇,進行低反射防止膜片 的表面檢查。 [實施例1] 使用疊層器(laminater)’將低反射防止膜片2〇與製造 例2所製的檢查構件10黏貼成第丨圖所示之評價樣本^ = 後於基台31上載置低反射防止膜片2〇,進行低反射防止、、 膜片20的表面檢查。 317272修正本 12 1301194 而於上述比較例1至3及實施例1的低反射防止膜片 -20 ’係如第2圖所示,將低反射防止膜片2〇於三波長的曰 ,光燈下,由目視觀察後,由下述基準評價該低反射防止膜 片20之外觀平坦性。 將其結果表示於表1 [表1]The surface of the display panel is also an optical film, and the surface of the glass is used as a reflection preventing film for PDP. As described above, when an optical film is used for a liquid crystal display or the like, if bubbles or foreign matter are present inside the polarizing film, the display characteristics are hindered. Therefore, there is a method for inspecting whether or not the optical film is abnormal (see the patent document 1). In the inspection method described in Patent Document i, after a subject such as a diaphragm is placed on a black plate, the subject is irradiated with light, and the reflected light of the irradiated light is photographed by the photographing device to detect a defective portion. . There is also a proposal to apply a light-colored ink cartridge to one side of an optical film, and irradiate light from the other side of the optical film to observe the reflected light. Further, there is a method in which a polarizing film is formed as a cross-polarized light in which a polarizing axis direction is orthogonally overlapped (__ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ Japanese Unexamined Patent Publication No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. There is a situation in which the inspection accuracy is deteriorated. In addition, when the black ink is applied, the unevenness of the coating ink is not uniform, that is, it is difficult to judge whether it is an internal defect or coating of the film. Unevenness. The light from the black ink solvent is infiltrated by the film, which cannot be stored for a long time, and there is a problem with the black ink _ the job site. If the overlapping polarizing film is stuck on one side of the optical film, The i-adhesive is a difficulty in the operation of the =-forked polarizer, and the quality is fixed. The polarizing film that is attached to the polarizing lens is usually a single board, because of the large financial limit. Therefore, it is more difficult to use and The cost required for the inspection is also the creator of the invention, and the creator of the invention provides a method for inspecting the optical film for determining the optical film quality with a high degree of accuracy. In the present invention, the present invention provides the following means: The inspection member for an optical film of the present invention is attached to a substrate: an inspection member in which a deposited member is deposited, In the inspection member for an optical film of the present invention, at least the adhesive member of the present invention is a pre-existing member and contains a coloring component. In the case of the optical film sheet inspection member of the present invention, the substrate is a light-shielding member, and the metal film is provided. The optical film inspection method includes: a step of adhering an optical film to the adhesive member; a step of irradiating light on a surface of the optical film; and observing the optical The step of reflecting the reflected light of the sheet; and the effect of the optical film on the basis of the observed reflected light. [Inspection of the optical film of the present invention] The member and the adhesive member disposed in the light-shielding member = the light-shielding member are adhered to each other by the following means: the cover member is closely adhered, thereby suppressing more than ua. Therefore, it is detected that only the optical use is used. The light-shielding member is not inspected by the conventional method to detect the light, and the light is checked to win the inspection. The win and the inspection are accurate. • For the composition of the room, the cost required for inspection can be saved. The inspection member for an optical film according to another aspect of the invention is provided on the surface of the substrate and has an optical film and a base: The method for the inspection of the opaque adhesive adhesion method is as follows: (4) of the film of the prior art; the surface of the optical film is irradiated / 'the township, and the reflection of the light is reflected by the optical film and the body + the scorpion film. Step And according to 317272, the procedure of determining the quality of the optical film according to 1301194; therefore, it is possible to check whether the film is good or not, and at the same time, the step of simple inspection is performed. [Embodiment] [Best Mode for Carrying Out the Invention] The present invention will be described with reference to the first and second drawings. The inspection member 1 () for the optical film 20 of the present invention is as follows. The first! In the figure, the light-shielding member u that blocks the transmitted light and the adhesive member 12 that is disposed on one surface 11a of the light-shielding member 11 and adheres the optical film 20 and the light-shielding member n are provided. The light shielding member 11 is a resin film and is made of black polyethylene terephthalate (hereinafter referred to as black PET). From this one is simulated into a crossnicol state. Further, the light-shielding member is preferably in a cross-polarized state, and is a black light-shielding member. Therefore, the light-shielding member η is a resin film, and is not limited to a tree-shaped film. Iron plate and so on. "12" is preferably an acrylic resin colored with a black dye, and the coloring agent of the colored adhesive member 12 is a pigment series such as Shima Black (four) bon Mack), that is, the light is reflected by the pigment particles. When the optical film is inspected, it is difficult to observe the foreign matter. Therefore, it is preferable to use a black dye series coloring agent. If the adhesive member is colored in the above manner, the scattered light on the surface of the optical film can be suppressed. It is preferable to improve the inspection accuracy. The adhesive member 12 is not limited to an acrylic resin, for example, the eva system, 8 317272, the modified 1301194 olefinic system, the polyester system, the silky ketone system. A series of adhesive materials such as a urethane system can be used, and the acrylic resin is preferably equal to the refractive index of the substrate 22, and is excellent in transparency. The optical film 2〇 to be inspected is formed by laminating the transparent resin layer 21 and the base 22, and the base 22 is in contact with the transparent resin layer 21 disposed on the one end 22a side. The surface on the other end 22b side of the base 22 is adhered to the adhesive member 12. The resin constituting the transparent resin layer 21 is an optically transparent resin, but a light-transmissive non-transparent material is used. Transparency is preferably a higher degree. It should have a light transmittance (JIS C6714) of 80o/〇 or more, and more preferably 85% or more. If the transparent resin is extremely light, although the resin itself Coloring, or coloring with dyes and pigments can also be used for inspection. Materials satisfying this characteristic include so-called adhesives having an initial adhesive property, which are equivalent to those exhibiting adhesion when heated, those exhibiting adhesion by a solvent, and The pre-hardening state of the light or thermosetting material can be used. The resin is: polyester (p〇1yester); polydecylamine (p〇ly_amide); polyvinyl alcohol (polyvinyl alc〇h〇1) ·· Polyurethane; polystyrene (p〇1yStyrene); polyacetal; polycarbene; acrylic epoxy, chopped ketone ; cellulose (ceud (10) and other resins and various derivatives, but It is not limited to these materials. In order to obtain high light transmittance, the refractive index of the transparent resin 21 is preferably in the range of 14 301 172 to 1.70. For the substrate 22, a general transparent film can be usually used. If it is transparent, it is also necessary to use a non-transparent material, and the transparency of the light-transmitting substrate is generally preferably high transparency. Therefore, the light transmittance (JIS C6714) is 80% or more, and 85 More than % is preferred. The Haze value (JIS K7105) is also 3.0 or less, and is preferably 1 or less, preferably 0.5 or less. The refractive index is preferably used from 1.40 to 1.80. Specifically, polyethylene terephthalate (PET); polyethylene naphthalate (PEN); triacetyl cellulose (TAC) can be used. Polyallylate; polyimide; polyether; polycarbonate; polysulfone; polyethersulfone; cellophane Polyurethane, polyethylene, polypropylene, polyvinyl alchol, etc. Resin film. Further, the refractive index of the adhesive member 12 is to prevent the matrix. The reflection at the interface with the adhesive member 12 is preferably the same as that of the substrate 22. As shown in Fig. 2, the inspection device 30 for inspecting the optical film 20 should be flat, and must also have: an optical film 20 can be loaded. The base 31 and the light-irradiating portion 32 that irradiates the optical film 20 with light are generally three-wavelength fluorescent lamps, but the tungsten light, the green light, and the solar light are used for the purpose. Using the above-described configuration The inspection member of the state, said 10 317 272, the method of the inspection of the optical film 20 is described later. First, the side of the other end 22b of the substrate 22 to which the optical film 2 is adhered is adhered to the adhesive member 12. 2, the optical film 20 of the adhesion inspection member 10 can be placed on the base 31 side of the base 31, and placed on the base 31. Then, the light is irradiated onto the surface of the optical film 20 by the light-emitting portion 32. The reflected light of the optical film 20 is visually observed. The hazeness uniformity of the reflected light observed by the visual observation or the quality of the optical film 2 is determined according to the hue. The embodiment is not limited to visual observation. Whether or not the optical film 20 is good or not is determined by a spectrophotometer, a blur meter, or the like, etc. The inspection member 1 () for the optical film 20 according to the present embodiment is used as the adhesive member i 2 The black dye is colored with an acryl resin so that the refractive index of the adhesive member 12 (four) is uniform, so that the internal reflection is suppressed. Further, since the light shielding member 11 is a diaphragm, the inspection member 10 can be wound up and formed into a shaft. shape' When the optical film 20 can be wound into a reel-like body, it is convenient. [Embodiment] Next, an embodiment in which the present invention is embodied will be described. [Production Example 1] * Manufacturing includes streaks, chromatic aberration, step, and dots. A low reflection preventing film (optical film) 20 such as a defect. The method for producing the low reflection preventing film 2 is manufactured by using a coating device (not shown). ', [Production Example 2] The method for manufacturing the double-checking member 10 is to modify the 111301194 agent for the optical acrylic 317272 for optical use, and to add the black dye to the solid portion for the mass portion 4:5. Stir the shaker for 20 minutes. Then, using a device (applicat〇r, not shown), the prepared black adhesive is applied to the polyethylene terephthalate (PET), placed in an 80 oven ( 〇ven, not shown) 2 minutes. After the oven is heated, the peeled PET is peeled off by a black adhesive sheet (adhesive member) 12 (not shown). Further, the obtained black adhesive sheet 12 was adhered to the black pet to form the inspection member 10. [Comparative Example 1] A black cloth (MIYUKITEXM700) was placed on the base 31, and the low reflection preventing film 20 was placed thereon to perform surface inspection of the low reflection preventing film. [Comparative Example 2] A black ink was dropped on the back surface of the low reflection preventing film 20. It was coated into an evaluation sample with a special brush. Then, the low reflection preventing film 20 is placed on the base 31, and the surface of the low reflection preventing film 2 is examined. [Comparative Example 3] _ The polarizing plate (HLC2_5618) was adhered to a crossed nicol, and the polarizing plate and the low reflection preventing film 2 were adhered by a thin plate. Then, the low reflection preventing film 2 is placed on the base 31, and the surface of the low reflection preventing film is inspected. [Example 1] The low reflection preventing film 2 was adhered to the inspection member 10 manufactured in Production Example 2 using a laminator to form an evaluation sample shown in Fig. 2 = and then placed on the base 31. The low reflection preventing film 2 is subjected to low reflection prevention and surface inspection of the diaphragm 20. 317272 Amendment 12 1301194 and the low reflection preventing film -20' of the above Comparative Examples 1 to 3 and Example 1 are as shown in Fig. 2, and the low reflection preventing film 2 is placed at a three-wavelength 曰, light Next, after visual observation, the appearance flatness of the low-reflection prevention film 20 was evaluated by the following criteria. The results are shown in Table 1 [Table 1]

判定基準 看不見 X:可見 由表1可知,使用比較例1至3間之檢查方法時、條 紋、色差、及段差的任何一種變為不見,因而無法確實判 定不良品為不良,故該測定精確度劣化。也就是說;使用 本發明的檢查構件10的檢查方法,可認識全部條紋、色 差、奴差及點缺點等,因而,得以高精確度判斷低反射防 止膜片20之良否。 唯本發明的技術範圍並不由上述實施形態所限,而在 不脫離發明主旨的範圍,得予以作成種種變更。 【圖式簡單說明】 第1圖有關本發明實施形態之檢查構件黏著於光學膜 片時之示例狀態剖面圖。、 第2圖使用有關本發明實施形態之檢查構件,檢查光 學膜片時之檢查方法模式圖。 317272修正本 13 1301194 【主要元件符號說明】 10 檢查構件 11 遮光構件 11a 遮光構件的一面 12 黏著構件 20 光學膜片 21 透明樹脂層 22 基體 22a 基體之一端 22b 基體之另一端 30 檢查裝置 31 基台 32 光照射部 317272修正本It is not clear that the criterion is X. It can be seen from Table 1 that when the inspection method between Comparative Examples 1 and 3 is used, any of the streaks, chromatic aberrations, and step differences are not seen, so that it is impossible to reliably determine that the defective product is defective, so the measurement is accurate. Degree is degraded. That is to say, by using the inspection method of the inspection member 10 of the present invention, it is possible to recognize all the streaks, chromatic aberrations, nuisances, and point defects, and thus, it is possible to judge the quality of the low reflection prevention film 20 with high accuracy. The technical scope of the present invention is not limited to the above-described embodiments, and various modifications may be made without departing from the scope of the invention. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a cross-sectional view showing an exemplary state in which an inspection member according to an embodiment of the present invention is adhered to an optical film. Fig. 2 is a schematic view showing an inspection method for inspecting an optical film according to an inspection member according to an embodiment of the present invention. 317272 Amendment 13 1301194 [Description of main component symbols] 10 Inspection member 11 Light-shielding member 11a One side of the light-shielding member 12 Adhesive member 20 Optical film 21 Transparent resin layer 22 Base 22a One end of the base 22b The other end of the base 30 Inspection device 31 Abutment 32 light irradiation unit 317272 revision

Claims (1)

1301194 ’十、申請專利範圍: 17年(牌g修正本 f光學膜片用檢查構件,係於基材上堆積黏著構侔 :成的檢查構件,該基材及黏著構件之至= . 光性構件。 万馬遮 2.如申請專利範圍第i項之光學膜片用檢查構件,立中, 3如申構件為遮光性構件’且含有著色成分。 .如申印專利乾圍第2項之光學膜片用檢查 上述著色成分為黑色。 再件/、中’ 鬱4.如申請專利範圍第3項之光學膜片用檢查構件,其中, 上述黑色係由染料著色者。 5. 如申請專利範圍第i項之光學膜片用檢查構件,其中, 上述黏著構件係以丙烯酸系樹脂為主成分Γ 6. 如申請專利||圍第i項之光學膜片用檢查構件,其中 上述基材係樹脂膜片。 〃 7. 如申請專利範圍第1項之光學膜片用檢查構件,其中, 上述樹脂膜片,係由聚對苯二甲酸乙二醇酯膜片 (polyethylene terephthalate fnm)所成者。、 8. 如申請專利範圍第!或第6項之光學膜片用檢查構 件,其中,’ 上述基材為遮光性構件,且具備金屬箔片。 9. -種光學膜片用檢查構件,係於構成申請專利範圍 1項之檢查構件之黏著構件表面形成保護層者。 10. -種光學膜片的檢查方法,係使用申請專利範圍第〗 項之光學膜片用檢查構件之光學膜片檢查方法,此方 法具備: 317272修正本 15 1301194 % 在上述4著構件上黏貼光學膜片的步驟; •於上逑光學膜片表面照射光線的步驟; - 觀祭由上述光學膜片反射之反射光的步驟;以及 • 依觀察的反射光,判斷上述光學膜片之良否的步 317272修正本 16 1301194 、 七、指定代表圖: (一) 本案指定代表圖為:第(1 )圖。 (二) 本代表圖之元件符號簡單說明: 八、本案若有化學式時,請揭示最能顯示發明特徵的化學式: 10 檢查構件 11 遮光構件 11a 遮光構件的一面 12 黏著構件 20 光學膜片 21 透明樹脂層 22 基體 22a 基體之一端 22b 基體之另一端1301194 '10, the scope of application for patent: 17 years (the card g correction of the f optical film inspection member, is deposited on the substrate adhesive structure: the inspection member, the substrate and the adhesion member to = = light Component. Wanma Cover 2. For the inspection member for optical film of the scope of the patent application, item i, 3, such as the application member is a light-shielding member' and contains a coloring component. For example, the second paragraph of the patent application In the case of the optical film, the coloring component is black. In the case of the optical film inspection member of the third aspect of the invention, the black color is colored by the dye. The inspection member for an optical film according to the item i, wherein the adhesive member is an acrylic resin as a main component, and the inspection member for an optical film according to the above-mentioned item, wherein the substrate is The resin film sheet according to the first aspect of the invention, wherein the resin film sheet is made of polyethylene terephthalate film (polyethylene terephthalate fnm). , 8. If Shen The inspection member for an optical film according to the above-mentioned item, wherein the substrate is a light-shielding member and is provided with a metal foil. 9. The inspection member for an optical film is a patent application. The surface of the adhesive member of the inspection member of the range 1 is formed into a protective layer. 10. The method for inspecting the optical film is an optical film inspection method for the inspection member for an optical film of the patent application scope, the method Having: 317272 Amendment 15 1301194% The step of adhering the optical film on the above four members; • the step of illuminating the surface of the upper optical film; - the step of observing the reflected light reflected by the optical film; • According to the reflected light of the observation, the step 317272 of the above optical film is judged to be correct. 16 1301194, 7. The designated representative figure: (1) The representative representative figure of the case is: (1). (2) The representative figure Brief description of the component symbol: 8. If there is a chemical formula in this case, please disclose the chemical formula that best shows the characteristics of the invention: 10 Inspection member 11 Light-shielding member 11a Light-blocking member 12 and the other end 22b side of the adhesive matrix 22 of the base end 22a of the base member 20 of the optical film 21 transparent resin layer 4 317272修正本4 317272 Amendment
TW094126487A 2004-08-06 2005-08-04 Inspection member and inspection method using the same TWI301194B (en)

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CN102288619B (en) * 2011-07-01 2013-04-24 明基材料有限公司 Method and system for detecting defects of three-dimensional optical film
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