TWI282421B - Test probe base with precisely adjusted pressure - Google Patents

Test probe base with precisely adjusted pressure Download PDF

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Publication number
TWI282421B
TWI282421B TW93125152A TW93125152A TWI282421B TW I282421 B TWI282421 B TW I282421B TW 93125152 A TW93125152 A TW 93125152A TW 93125152 A TW93125152 A TW 93125152A TW I282421 B TWI282421 B TW I282421B
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Taiwan
Prior art keywords
needle
base
probe
test
scope
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TW93125152A
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Chinese (zh)
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TW200608023A (en
Inventor
Gan-Yuan Li
Chiou-Tian Shiu
Yun-Jin Lai
Guan-Nan Chen
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Fittech Co Ltd
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Publication of TWI282421B publication Critical patent/TWI282421B/en

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  • Transmission And Conversion Of Sensor Element Output (AREA)

Abstract

The present invention provides a test probe base with precisely adjusted pressure, which comprises a base, an adjusting element, a probe mount component and two magnetic elements; wherein, the base is configured on a testing machine and has a support portion; the adjusting element is movably configured on the base; the probe mount component has a hinge portion hinged with the base, a free end portion far away from the hinge portion for mounting with probes, a stop portion against the base support portion and limited therewith, and a forcing portion located at one side of the hinge portion corresponding to the adjusting element; and, these magnetic elements are respectively configured corresponding to the adjusting element and the probe mount component, and making the stop portion of the probe mount component against the base, and employing the adjusting element to adjust the distance between the two magnetic elements, so as to change the pressure of the probe on a workpiece.

Description

1282421 九、發明說明: 【电明所屬之技術領域】 特別是指一種反應靈 本發明是有關於一種測試器材 敏且可精密調壓的測試針座。 【先前技術】 製ie、切割完成後,即需藉由二 ^ ^ L 一彳木針分別接觸個別LED之 一極點,以測量出每顆led的雷厭不★ ^ 的電屋、電流、波長、亮度… 寺貝科’而付以判斷其良莠,再進行封裝作業。 參閱圖1、圖2,一般探斜彳η 二 又ί木針1疋夾固在一測試機1〇〇 之測試針座2上,該測試針座2舍 遍 、1庄2 a含有一座體201、一置針 件202、一調整螺絲203及一彈里 泮貝204。該座體201裝固於 該測試機100之一呈中空圓般壯德 Τ工111盤狀之機台3上,且該座體2〇1 前端部凸伸入該機台3内部中空處。該置針件2〇2位於該 座體201下方’且該置針件2〇2具有一穿設於該座體加 前端部内上下位移之線性軸承2〇5及一固設在該線性車由承 205底端並概呈水平狀之固針桿2〇6,該固針桿2〇6前端伸 入該機台3中心處並可夹固該探針i。該調整螺絲2〇3對應 5亥線性軸承205而螺設於該座體2〇1頂部,且該彈菩2〇4 一鈿抵持於該線性軸承205頂端,相反另一端則抵頂該調 整螺絲203底端。藉此,當一工件2〇〇 (如上述之曰 曰白 圓)置於該測試機100之一工作台4上而往該等探針i靠 合接觸時,該等探針1會受到該工件200頂撐而上移,此 1282421 η 士 、、二若該等探針1未有足夠之針壓,則接觸不良,易導致 測量不準,而若所施針壓過大,則易使該等探針1受損, 或易戳傷该工件2〇〇造成刻痕,而影響到原先性質。 。雖-、、:藉由上述之調整螺絲2〇3與彈簧2〇4之配合, /而可視工^牛細需求調整針壓,惟,該彈簧綱欲製作到 微小精密程度,其相當不容易,且該彈簧綱形成彈力頂 撐:使得該調整螺絲2〇3不易進行調壓動作,又彈簧2〇4 易彈性疲乏,而不夠靈敏。 卜 叙測5式針座2通常會再加設一感應器2〇7,用 以檢知該探針i是否脫離該工件2〇〇之一邊界,該感應器 撕具有-金屬製之簧片寫及一亦為金屬製之導片2〇9, 且該固針# 2〇6為塑膠製成,並在近前端處形成中空狀, 而该簧片208後端固設在該固針桿施上,前端則凸伸入 該固針桿2G6中空處懸空,且該導片·固設在該固針桿 2〇6中空處頂端,而可與該簧片208前端抵接,藉此,當該 工件200未抵觸該探針i時,該簧片谓與導片2〇9相抵 接而可通電導通’而當該抵觸該探針丨時,該固 針桿206前端受力變形,使得該導片2〇9與該菁片細分 離而造成斷路’如此,即可偵測到該工件扇抵觸該探針】 與否’而能判斷出該騎i是否已檢測至該工件扇邊緣 而需換打反向繼續檢測,惟,由於該感應器2〇7是藉由該 固針桿206之塑膠變形能力來進行檢知,因此,靈^度= 足,且塑膠易受氣候溫度影響其變形能力,同時,長久使 用亦容易造成彈性疲乏’而影響到變形能力,造成檢知不 1282421 夠準確。 【發明内容】 ^因此,本發明之目的,即在提供一種靈敏度高、使用 壽命長,且可精密調壓的測試針座。 、於疋,本發明可精密調壓的測試針座,是設置在一測 忒機台上,供一測試用探針裝設,以對一工作台上之工件 做測里,且該測試針座包含有一座體、一調整元件、一置 針件及二磁性元件。該座體裝設在該測試機台上,並具有 一支承部。該調整元件可活動地設置在該座體上。該置針 件具有一與該座體相樞接之樞接部、一遠離該樞接部並供 該板針裝設之自由端部、一可抵接該座體支承部而受其限 位之抵止部及一位於該樞接部一側並對應該調整元件之施 力部。該等磁性元件分別對應設置於該調整元件與該置針 牛知力。卩處’並在常悲下使該置針件抵止部抵靠該座體, 且藉由該調整元件調整該二磁性元件之間的距離,可改變 該探針對工件的壓力。 【實施方式】 有關本發明之前述及其他技術内容、特點與功效,在 以下配合參考圖式之較佳實施例的詳細說明中,將可清楚 的呈現。 在本發明被詳細描述之前,要注意的是,在以下.的說 明内谷中’類似的元件是以相同的編號來表示。 如圖3與圖4所示,本發明可精密調壓的測試針座5 之一第一較佳實施例是設置在一測試機30〇之一呈中空圓 1282421 盤狀的機台6上,供一測試用探針7裝設,以對一工作二8 上之一工件400做測量,於本實施例中,該工件4〇〇為口一 LED晶圓片,且該測試針座5包含有一座體1〇、一調整元 件20、一置針件3〇、二磁性元件 干4ϋ 50、一度量裝置60 及一感應器70。 配合參閱圖5、圖6 ’該座體1〇白扭女 压殿i〇包括有一裝設在該機 台6上之基座U、-滑設於該基座u並受―第―螺桿η 沿-第-方向X驅動的第-滑塊13、—滑設於該第一滑塊 13並受一第二螺桿14沿一第-方& v 乐一方向Y驅動的第二滑塊15 、一滑設於該第二滑塊15並受-第三螺桿16沿一第三方 向Ζ驅動的第三滑塊17及—固結於該第三滑塊17的承座 18,該第一、二、三方向χ、γ、 乙互相垂直,且該第一螺 桿12控制該座體1 〇之前後位蒋 移疋位,該第二螺桿14控制 該座體10之左右位移定位,而柄 ^ 叩邊弟二螺桿Ιό則控制該座 體10之上下位移定位,又該承座 f展18凸伸入該機台6中空 處,並具有一後端部181、一 貝知邵182、二側端部183、 184、一前端部185及一支承邱^ ^ >咕一 文枣邛186,該後端部181固設在 該第三滑塊17前側,且該頂端 ,^ 貝鳊182自該後端部181頂端 = μι μ^_183、184則自該項端部182左 2侧往下延伸形成,並於其卜側端部184沿ζ方向開 a又有一溝槽187,又該前端 ^ y 而1 185自該頂端部182前側往下 延伸形成,且底端距該等側端 邛183、184底端相當距離, 另遠支承部186為金屬製並路技 工垮接於该寺側端部183、184底 端刖側。 一 1282421 /該凋整元件20可活動地設置在該座體10 _h,於本實 J中。亥5周整兀*件2〇為一螺穿過該承座18頂端部182 並與該側端部叫諸叫目對紅職。、^ 182 s丨件30呈長桿狀橫置於該座體⑺之承座 處’且該置針件30具有-位於後端之樞接部31、—位於^ ^自由端部32、-近自由端部32之抵止部33及一位^ 端部32與樞接部31間之施力部34,該樞接部31與 :承座18之二側端部183、184近後端處相樞接,且該自 由端部32遠_枢接部31並可μ該探針7,而該抵止部 位於該承座18支承部186上方,並可往下抵接該支承部 又’、限位,又該施力部34恰位於該調整元件2〇之正 下方。 該等磁性元件40、5〇分別對應設置在該調整元件2〇 底端與為置針件3〇施力部34處,且該等磁性元件、% 4對面為相同極性,而呈同性相斥之狀態,使得該置針 牛3〇之抵止部33在常態下抵靠該座體1〇承座18之支承 部 186。 夕忒度里裝置60具有一樞套在該調整元件20上而隨其 位移之套筒61、-固設於該套筒61並穿伸出該座體1〇承 座18側端部184溝槽丨87之指針62及一固設在該承座18 側端部184上供該指針62指示之壓力表63。 該感應器70末端設置在該座體1〇承座18之支承部 ”忒置針件30抵止部33之間,且該感應器7〇及支承 Ρ 186通電導通,以偵測兩者之抵接狀態,而得知該探針7 1282421 是否已脫離該工件400之一邊界。 如圖4、圖7所示,本發明夾固該探針7進行檢測時 ’該測試機300之工作台8帶動該工件400上升,使該工 件400抵觸該探針7,而頂撐該探針7連同該置針件3G之 自由端部32上抬,此時,該探針7施於該X件4GG之針壓 示探針7本身之重量造成外,需再加上該二磁性元件 、5〇間同性相斥所產生之排斥力的施加。此外,由於該置 針件自由端部32之抬昇會使該抵止部33與該座體1〇 承座18之支承部186分離,而造成該感應器7〇斷路,以_ 得知該探針7有接觸職卫件働,因此,—旦該工作台8 帶動该工件彻上升進行檢測作#時,若該感應器7〇未形 成斷路,即可得知該探針7已脫離該工件之邊界,無 法進仃檢測,而需將該工件4〇〇換行以反向繼續進行檢測 〇 由上述說明可知,本發明主要是藉由旋轉該調整元件 20來調整該二磁性元件4G、5G之間的距離,以改變排斥力 之大小’進而改變該探針7之針壓’且該排斥力之計算相· 當簡便,其是藉由公式F=KQlQ2/r2(F為排斥力,κ為比-例常數,Q】為其中-磁性元件之磁極強度,&為另一磁性 元件之磁極強度’ r則為該二磁性元件之間的距離)來計算 ,故只要知道該二磁性元件40、5〇之磁極強度及二磁性元 件40、50之間的距離’即可輕易得出該排斥力,然後,再 經由槓桿原理之計算,即可確實得知該探針7之針壓,因 此,本發明之度量裝置60可直接利用該二磁性元件4〇、% 10 1282421 之間的距離’換算出該針壓大小,以標示在該壓力表63上 ,供使用者直接目測使用,而有利使用者調整出適度之針 壓。 、T、上所述’由於本發明是利用磁力來調整針壓,而不 需採用彈簣,故無彈力頂撐及彈性疲乏之問題,因此,不 但靈敏度相當高、使用壽命長而不易損壞,且進行調壓時 無月顯阻力而相當容易’同時’因該度量裝置⑼之設置, 使得使用者能彳艮方便且精確地將該針壓調至所需之壓力值 ’此外,由於本發明之感應器70僅藉由該座體10承座18 之支承W 186與該置針件3G抵止部33的分離與否進行感 測即可彳于知該楝針7是否已脫離該工件4〇〇之邊界,故 比起習用採塑膠變形進行感測而言,本發明自然較為靈敏 、精準且壽命長。 值得一提的是,如圖8所示,本發明亦可將該置針件 3〇之樞接部31設置於該施力部34與自由端部32之間,且 该專磁性元件40、50之相對面採相反極性,而使盆呈 相:之狀態,如此,藉由該等磁性元件4〇、_ ,亦可使該探針7具有適度之針壓。 〜淮以上所述者,僅為本發明之較佳實施例而已,當不 月匕以此限定本發明實施之範圍, 範圍及發明說㈣容所作之β &明申請專利 屬h 所作之間早的等效變化與修飾,皆仍 屬本發明專利涵蓋之範圍内。 【圖式簡單說明】 圖1是一般㈣測試機進行檢測時之俯視示意圖; 1282421 圖2是上述LED測試機檢測時之部分剖面示意圖,· 圖3是本發明可精密調屢的測試針座之-第1較佳實 施例裝设在一機台上使用時的俯視示意圖; 圖4是該第-較佳實施例裝設在該機台上使用時的側 視示意圖; 圖5是該第-較佳實施例的部分剖面示意圖; 圖6疋該第一較佳實施例的仰視示意圖; ^圖7是該第一較佳實施例的使用示意圖,說明一探斜 受-工件抵觸而帶動_置針件抬昇之情形;及 圖8是本發明可精密調麼的測試針座之一第二較隹叙 施例的側視示意圖。 ^ ^1282421 IX. Description of the invention: [Technical field to which MIC is compliant] In particular, it is a kind of reaction spirit. The present invention relates to a test needle holder which is sensitive to test equipment and can be precisely adjusted. [Prior Art] After the IE and the cutting are completed, it is necessary to contact one pole of the individual LEDs with two 彳 L 彳 针 针 , , , , , , 以 以 以 以 以 以 以 以 ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ led , brightness ... Temple Beike 'and pay to judge its good, and then carry out the packaging operation. Referring to Fig. 1 and Fig. 2, the general probe 彳 二 又 ί 木 针 针 疋 疋 疋 疋 疋 ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί 201, a needle member 202, an adjusting screw 203 and a bomb mussel 204. The base body 201 is mounted on a machine table 3 in which the one of the testing machine 100 is hollow and has a 111-disk shape, and the front end portion of the base body 2〇1 protrudes into the hollow portion of the machine table 3. The needle 2 〇 2 is located below the seat 201 ′ and the needle 2 〇 2 has a linear bearing 2 〇 5 that is inserted into the front end of the seat body and is vertically displaced, and is fixed to the linear vehicle 205 The bottom end is a horizontal fixing pin 2〇6, and the front end of the fixing pin 2〇6 protrudes into the center of the machine table 3 and can clamp the probe i. The adjusting screw 2〇3 corresponds to the 5H linear bearing 205 and is screwed on the top of the seat body 2〇1, and the elastic ball 2〇4 abuts against the top end of the linear bearing 205, and the other end abuts the adjustment. Screw 203 bottom. Thereby, when a workpiece 2 (such as the above-mentioned white circle) is placed on one of the table 4 of the testing machine 100 and is in contact with the probes i, the probes 1 are subjected to the The workpiece 200 is supported by the top support, and the 1282421 η, and the second probes are not in sufficient contact pressure, and the contact is poor, which may cause the measurement to be inaccurate, and if the applied needle pressure is too large, the When the probe 1 is damaged, or the workpiece is easily scratched, the scratch is caused, which affects the original property. . Although -, ,: by adjusting the screw 2〇3 and the spring 2〇4, the needle pressure can be adjusted according to the needs of the cow, but the spring is intended to be made to a small degree of precision, which is quite difficult. And the spring element forms an elastic top support: the adjustment screw 2〇3 is not easy to perform the pressure regulating action, and the spring 2〇4 is elastic and fatigued, and is not sensitive enough. The sensor 5 is usually further provided with a sensor 2〇7 for detecting whether the probe i is separated from a boundary of the workpiece 2, and the inductor is torn with a metal reed. The writing piece 1 is also a metal guide piece 2〇9, and the fixing pin #2〇6 is made of plastic, and is formed in a hollow shape at the proximal end, and the rear end of the reed 208 is fixed to the fixing needle bar When applied, the front end protrudes into the hollow of the fixing needle bar 2G6, and the guide piece is fixed at the top end of the hollow portion of the fixing needle bar 2〇6, and can abut against the front end of the reed 208, thereby When the workpiece 200 does not interfere with the probe i, the reed is said to be in contact with the guide piece 2〇9 and can be electrically turned on. When the probe is pressed against the probe, the front end of the fixed pin 206 is deformed by force, so that The guide piece 2〇9 is finely separated from the cyanine piece to cause an open circuit, so that the workpiece fan can be detected to interfere with the probe or not, and it can be determined whether the riding i has detected the edge of the workpiece. It is necessary to change the reverse direction to continue the detection. However, since the sensor 2〇7 is detected by the plastic deformation ability of the fixed needle bar 206, the degree is sufficient, and the plastic is easy. It is affected by the climatic temperature, and at the same time, it is easy to cause elastic fatigue due to long-term use, which affects the deformation ability, and the detection is not accurate enough. SUMMARY OF THE INVENTION Therefore, it is an object of the present invention to provide a test needle holder which has high sensitivity, long service life, and can be precisely adjusted. , Yu Yu, the test needle holder of the present invention can be precisely adjusted, and is arranged on a test bench for a test probe to measure the workpiece on a workbench, and the test pin The seat comprises a body, an adjusting component, a needle member and two magnetic components. The seat body is mounted on the test machine and has a support portion. The adjustment element is movably disposed on the seat. The needle member has a pivoting portion pivotally connected to the seat body, a free end portion away from the pivoting portion and provided for the plate needle, and a position that can be abutted against the seat body support portion The abutting portion and a biasing portion on the side of the pivoting portion and corresponding to the adjusting element. The magnetic elements are respectively disposed corresponding to the adjusting element and the pinning force. The pinch is placed against the seat body under constant sorrow, and the pressure of the probe against the workpiece can be changed by adjusting the distance between the two magnetic elements by the adjusting member. The above and other technical contents, features, and advantages of the present invention will be apparent from the following detailed description of the preferred embodiments of the invention. Before the present invention has been described in detail, it is to be noted that the same elements are denoted by the same reference numerals in the following description. As shown in FIG. 3 and FIG. 4, a first preferred embodiment of the test pin holder 5 of the present invention is provided on a machine 6 having a hollow circle 1282421 disk shape in one of the test machines 30〇. A test probe 7 is provided for measuring a workpiece 400 on a working second 8 . In this embodiment, the workpiece 4 is a port-LED wafer, and the test pin holder 5 includes There is a body 1 , an adjusting element 20 , a needle 3 〇 , two magnetic elements 4 ϋ 50 , a measuring device 60 and an inductor 70 . Referring to FIG. 5 and FIG. 6 'the body 1 〇 扭 女 女 女 〇 〇 〇 〇 〇 〇 基座 基座 基座 基座 基座 基座 基座 基座 基座 基座 基座 基座 基座 基座 基座 基座 基座 基座 基座 基座 基座 基座 基座 基座 基座 基座 基座 基座a first slider 13 driven in the -first direction X, a second slider 15 slidably disposed on the first slider 13 and driven by a second screw 14 in a first-side & v-le direction Y a third slider 17 disposed on the second slider 15 and driven by the third screw 16 in a third direction, and a socket 18 fixed to the third slider 17, the first , the second and third directions χ, γ, and B are perpendicular to each other, and the first screw 12 controls the seat body 1 〇 before the position moves, the second screw 14 controls the left and right displacement positioning of the seat body 10, and the handle ^ 叩 弟 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二The side end portions 183, 184, a front end portion 185 and a supporting portion 186, the rear end portion 181 is fixed on the front side of the third slider 17, and the top end The rear end portion 181 top = μι μ^_18 3, 184 extends from the left side 2 side of the end portion 182, and has a groove 187 in the ζ direction of the side end portion 184, and the front end y1 and 185 from the top end portion 182. The front side is formed to extend downward, and the bottom end is at a considerable distance from the bottom ends of the side end turns 183, 184, and the other side support portion 186 is connected to the bottom side of the temple side end portions 183, 184 by the metal side road technician. A 1282421 / the fading element 20 is movably disposed in the base 10_h, in the present J. At 5 weeks, the whole piece of 2 〇 is a snail passing through the top end portion 182 of the socket 18 and is called the red affair with the side end portion. , the 182 s element 30 is placed in a long rod shape at the seat of the seat body (7) and the needle member 30 has a pivoting portion 31 at the rear end, at the free end portion 32, near The abutting portion 33 of the free end portion 32 and the biasing portion 34 between the end portion 32 and the pivoting portion 31, the pivoting portion 31 and the proximal end of the two side ends 183, 184 of the socket 18 The pivoting portion is pivoted, and the free end portion 32 is far away from the pivoting portion 31 and can be the probe 7. The abutting portion is located above the bearing portion 186 of the socket 18 and can be abutted against the supporting portion. And the limit position, and the force applying portion 34 is located just below the adjusting element 2〇. The magnetic elements 40 and 5 are respectively disposed at the bottom end of the adjusting element 2 and the biasing portion 34 of the needle 3, and the magnetic elements, the opposite sides of the % 4 are of the same polarity, and are mutually exclusive. In a state, the abutting portion 33 of the pinch 3 abuts against the support portion 186 of the seat 1 of the seat body 1 in a normal state. The squatting device 60 has a sleeve 61 that is sleeved on the adjusting member 20 and is displaced therewith, is fixed to the sleeve 61 and extends out of the seat body 1 to the side end portion 184 of the socket 18 A pointer 62 of the slot 87 and a pressure gauge 63 fixed to the end portion 184 of the socket 18 for indication by the pointer 62. The end of the sensor 70 is disposed between the support portion of the base 1 of the base 1 and the abutment portion 33 of the pin 30, and the inductor 7 and the support 186 are electrically connected to detect the difference between the two. In the state of connection, it is known whether the probe 7 1282421 has deviated from a boundary of the workpiece 400. As shown in Fig. 4 and Fig. 7, when the probe 7 is clamped for detection, the table 8 of the test machine 300 The workpiece 400 is caused to rise, so that the workpiece 400 is in contact with the probe 7, and the probe 7 is lifted up together with the free end portion 32 of the needle member 3G. At this time, the probe 7 is applied to the X member 4GG. The needle pressure indicates that the weight of the probe 7 itself is caused by the application of the repulsive force generated by the two magnetic elements and the five-dimensional isotropic repulsion. Furthermore, since the free end 32 of the needle is raised, The abutting portion 33 is separated from the supporting portion 186 of the seat body 1 of the seat body 1 to cause the sensor 7 to be disconnected, so that the probe 7 has contact with the guard member, so that the work When the stage 8 drives the workpiece to rise and detects #, if the sensor 7 does not form an open circuit, it can be known that the probe 7 has been separated from the workpiece. The boundary cannot be detected, but the workpiece 4 is required to be lined up to continue the detection in the reverse direction. As can be seen from the above description, the present invention mainly adjusts the relationship between the two magnetic elements 4G, 5G by rotating the adjusting element 20. The distance to change the magnitude of the repulsive force 'and thus change the acupressure of the probe 7' and the calculation of the repulsive force is simple, which is by the formula F = KQlQ2 / r2 (F is the repulsive force, κ is the ratio - the example constant, Q is calculated as the magnetic pole strength of the magnetic element, & the magnetic pole strength of the other magnetic element 'r is the distance between the two magnetic elements," so that only the two magnetic elements 40, The repulsive force can be easily obtained by the magnetic pole strength of 5 及 and the distance between the two magnetic elements 40 and 50. Then, the needle pressure of the probe 7 can be surely obtained through the calculation of the principle of the lever, therefore, The measuring device 60 of the present invention can directly use the distance between the two magnetic elements 4〇, % 10 1282421 to convert the needle pressure to be marked on the pressure gauge 63 for direct visual use by the user, and is advantageously used. Adjust the appropriate acupressure According to the invention, the magnetic force is used to adjust the needle pressure without using the magazine, so there is no problem of elastic top support and elastic fatigue. Therefore, not only the sensitivity is high, but the service life is long and the damage is not easy. Moreover, it is quite easy to perform the pressure regulation without monthly resistance, and at the same time, the setting of the measuring device (9) enables the user to conveniently and accurately adjust the needle pressure to the required pressure value. The sensor 70 can be sensed only by the separation of the support W 186 of the seat 10 of the base 10 and the abutment portion 33 of the needle holder 3G. It is known whether the needle 7 has been separated from the workpiece 4 The boundary of the crucible is therefore more sensitive, precise and long-lived than the sensing of plastic deformation. It should be noted that, as shown in FIG. 8 , the pivoting portion 31 of the needle 3 设置 can be disposed between the urging portion 34 and the free end portion 32 , and the magnetic components 40 , 50 The opposing faces are of opposite polarity, and the basins are in a phase: so that the probes 7 can have a moderate needle pressure by the magnetic elements 4〇, _. The above is only the preferred embodiment of the present invention, and the scope of the invention is not limited thereto, and the scope and the invention (4) are made between the β & Early equivalent changes and modifications are still within the scope of the invention. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a schematic plan view of a general (four) test machine for detecting; 1282421 FIG. 2 is a partial cross-sectional view of the above-mentioned LED tester, and FIG. 3 is a test pin seat of the present invention which can be precisely adjusted. - a schematic plan view of the first preferred embodiment when it is mounted on a machine table; FIG. 4 is a side elevational view of the first preferred embodiment when it is mounted on the machine; FIG. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 6 is a schematic bottom view of the first preferred embodiment; FIG. 7 is a schematic view of the use of the first preferred embodiment, illustrating that a probe is driven by a workpiece to interfere with the needle. The case of lifting up; and FIG. 8 is a side view of a second comparative embodiment of the test needle holder of the present invention. ^ ^

12 1282421 【主要元件符號說明】 300 · * 測試機 185 * * 前端部 400 * · 工件 186 · · 支承部 5…· 測試針座 187 · · 溝槽 6 · * 機台 20· · * 調整元件 Ί…* 探針 30 · · · 置針件 8…· 工作台 31 · · · 極接部 10··* 座體 32· * · 自由端部 11…· 基座 33* * * 抵止部 12*… 第一螺桿 34* · · 施力部 13· · · 第一滑塊 4〇 · · · 磁性元件 14*· - 第二螺桿 50* · · 磁性元件 15· · · 第二滑塊 60 · · · 度量裝置 16 ', 第三螺桿 61··· 套筒 17· · · 第三滑塊 62 * * · 指針 18· · · 承座 63 * · · 壓力表 181 · · 後端部 70· · · 感應器 182 · · 頂端部 X ·… 第一方向 183 * · 側端部 γ ... 第二方向 184 · · 側端部 Z…· 第三方向 1312 1282421 [Description of main components] 300 · * Tester 185 * * Front end 400 * · Workpiece 186 · · Support 5... Test socket 187 · · Groove 6 · * Machine 20 · · * Adjusting componentsΊ ...* Probe 30 · · · Needle 8...· Table 31 · · · Pole part 10··* Seat 32· * · Free end 11...· Base 33* * * Abutment 12*... First screw 34* · · urging part 13 · · · First slider 4 · · · Magnetic element 14* · - Second screw 50* · · Magnetic element 15 · · · Second slider 60 · · · Measuring device 16', third screw 61··· sleeve 17· · · third slider 62 * * · pointer 18 · · · seat 63 * · · pressure gauge 181 · · rear end 70 · · · induction 182 · · Top end portion X ·... First direction 183 * · Side end portion γ ... Second direction 184 · · Side end portion Z...· Third direction 13

Claims (1)

1282421 十、申請專利範圍: 1· 一種可精密調壓的測試針座,是設置在一測試機台上, 供一測試用探針裝設,以對一工作台上之工件做測量, 且該測試針座包含有: 一座體,裝設在該測試機台上,並具有一支承部; 一調整元件,可活動地設置在該座體上; 一置針件,具有一與該座體相樞接之樞接部、一遠 離該樞接部並供該探針裝設之自由端部、一可抵接該座 體支承部而受其限位之抵止部及一位於該樞接部一側並 對應該調整元件之施力部;及 二磁性元件,分別對應設置於該調整元件與該置針 件施力部處,並在常態下使該置針件抵止部抵靠該座體 ,且藉由該調整元件調整該二磁性元件之間的距離,可 改變該探針對工件的壓力。 2. 依據申#專利範圍帛丨㈣述之可精密調壓的測試針座 ,更包含有-度量裝置,該度量裝置具有—樞套在該調 整元件上而隨其位移之套筒、—固設於該套筒並穿伸出 該座體之指針及一固設在該座體上供該指針指示之壓力 表。 3. 依射請專利範圍第i項所述之可精密調壓的測試針座 ,更包含有一設置在該座體支承部與該置針件抵止部間 之感應器,以偵測兩者之抵接狀態,而得知該探針是否 已脫離該工件之一邊界。 疋 4. 依據申請專利範圍第丨項所述之可精密調壓的測試針座 14 1282421 ,其中,該調整元件是一螺栓。 5·依據申請專利範圍第!項所述之可精密調壓的測試針座 ’其中’該置針件之施力部位於該枢接部與自由端部之 間,且該調整元件位於該置針件上方,又該等磁性元件 之相對面為相同極性,而呈同性相斥之狀態。 6.依據申請專利範圍第!項所述之可精密調壓的測試針座 ’其中,該置針件之枢接部位於該施力部與自由端部之 間’且該調整元件位於該置針件上方,又該等磁性元件 之相對面為相反極性,而呈異性相吸之狀離。 7·依據申請專利範圍第1 ,^ 貝所迷之可精密調壓的測試針座 ,其中,該座體包括有一其命 第—螺桿沿於該基座並受一 -滑塊並受一第二螺桿沿―:第—滑塊、-滑設於該第 -滑設於該第二滑塊並受―::方向驅動的第二滑塊、 的第三滑塊及一固結於該第三::#沿-第三方向驅動 、三方向互相垂直,且該塊的承座’該第-、二 設置於該承座上。 n 70件、置針件、支承部是 151282421 X. Patent application scope: 1. A test tube seat that can be precisely adjusted, which is set on a test machine for a test probe to measure the workpiece on a workbench, and The test needle holder comprises: a body mounted on the testing machine and having a support portion; an adjusting component movably disposed on the base; a needle member having a pivotal relationship with the seat body a pivoting portion, a free end portion away from the pivoting portion and provided for the probe, a resisting portion capable of abutting the seat supporting portion and being restrained thereof, and a resting portion located at the pivoting portion And the two magnetic members are respectively disposed at the adjusting member and the needle applying portion, and in the normal state, the needle abutting portion abuts against the base, and By adjusting the distance between the two magnetic elements by the adjusting element, the pressure of the probe on the workpiece can be changed. 2. According to the scope of patent application 帛丨 (4), the test needle holder can be precisely adjusted, and further includes a measuring device, the measuring device has a sleeve that is pivoted on the adjusting member and is displaced with the fixing member. And a pointer disposed on the sleeve and extending through the base and a pressure gauge fixed on the base for indicating by the pointer. 3. According to the scope of the patent, the precision-adjustable test needle holder described in item i of the patent scope further includes a sensor disposed between the seat support portion and the needle-retaining portion to detect both. The state is abutted and it is known whether the probe has left a boundary of the workpiece.疋 4. The precision-adjustable test needle holder 14 1282421 according to the scope of the patent application, wherein the adjusting element is a bolt. 5. According to the scope of patent application! The precision-adjustable test needle holder of the present invention, wherein the force applying portion of the needle placing member is located between the pivoting portion and the free end portion, and the adjusting member is located above the needle placing member, and the magnetic members are The opposite faces are of the same polarity and are in the same state of repelling each other. 6. According to the scope of patent application! The precision-adjustable test needle holder of the item, wherein the pivoting portion of the needle-shaped member is located between the force-applying portion and the free end portion, and the adjusting member is located above the needle-disposing member, and the magnetic members are opposite to each other The faces are of opposite polarity and are in the same shape as the opposite sex. 7. According to the scope of the patent application No. 1, the test needle holder can be precisely adjusted, wherein the seat body includes a life-spindle along the base and receives a-slider and receives a first The second screw is disposed on the first slider, the third slider disposed on the second slider and driven by the ":: direction, and the third slider The three::# drive along the third direction, the three directions are perpendicular to each other, and the sockets of the block are disposed on the socket. n 70 pieces, needle set, support part is 15
TW93125152A 2004-08-20 2004-08-20 Test probe base with precisely adjusted pressure TWI282421B (en)

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