TWI277743B - Circuit providing steady current with high voltage isolation and resistance measurement apparatus with circuit thereof - Google Patents

Circuit providing steady current with high voltage isolation and resistance measurement apparatus with circuit thereof Download PDF

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TWI277743B
TWI277743B TW94115038A TW94115038A TWI277743B TW I277743 B TWI277743 B TW I277743B TW 94115038 A TW94115038 A TW 94115038A TW 94115038 A TW94115038 A TW 94115038A TW I277743 B TWI277743 B TW I277743B
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transistor
electrically connected
current
voltage
diode
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TW94115038A
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Chinese (zh)
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TW200639416A (en
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Shr-Chau Li
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Picotest Corp
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Abstract

A resistance measurement apparatus includes a circuit that providing steady current with high voltage isolation; a voltage measurement unit which can measure the two end voltages of the resistances being tested; a calculating unit; a circuit with steady current and high voltage isolation including a current generator with providing steady current and a protection module. The current that generated by current generator can be put out to the protection module then the resistance being tested, and the protection module by means of its internal diode for impeding positive input voltage. When negative input voltage is applied to the system, the current-guiding unit of the protection module is brought into the non-conduction state for impeding negative voltage flow into the current generator, and the protection element of the protection module can be conducted while negative voltage is applied, thus the system applying said negative voltage on the loaded unit and connected to ground. The current is divided into the calculating unit with a difference of the two voltages, thus to obtain the resistance value of the resistance being tested.

Description

1277743 九、發明說明: 【發明所屬之技術領域】 本發明是有關於一種能產生一穩定電流的電路及具有 該電路的電阻值量測裝置,特別是指一種可隔離高壓且產 生穩定電流的電路及具有該電路的電阻值量測褒置。 【先前技術】1277743 IX. Description of the Invention: [Technical Field] The present invention relates to a circuit capable of generating a steady current and a resistance value measuring device having the same, and more particularly to a circuit capable of isolating a high voltage and generating a stable current And a resistance value measuring device having the circuit. [Prior Art]

參閱圖1,習知之電阻值量測裝置是適用於量測一待測 電阻8的電阻值,且包含一可產生穩定電流的電路5、一電 壓量測單元6及-計算單元7。而該可產生穩定電流的電路 5是包括一電流產生器51及一微處理器52。 該電流產生器51是受該微處理器52的控制以產生不 同大小的穩定電流,而該待測電阻8則與該電流產生器Η 電連接,且該電流產生器51產生的電流將流過該待測電阻 8”。而該電壓量測單元6是用來量測該待測電阻8的兩端電 壓,並將該兩端電壓的值送人該計算單元7。且該計算單元 7是將該兩端電壓間的差值除上該電流產生器、51產生的電 流值以得到該待測電阻8的電阻值大小。 〜〇邓稱适更如圖2所示,該電流 產生器51包括複數雷阳ρ 是数電阻R1〜R7、複數開關S1〜S4、二放大 器a^A2、-電晶體Q、—電容CA一稽納二極體ZD。 吞亥專電阻R1〜R5蛊聯户 , W串聯在—起,且電阻以 於該放大器A1的輪出媳,〇 逑接 等門關S1,4 電阻R5之一端則接地,且該 =關:S4之—端與放大“2之正輸入端電連接 關81之另—端是電連接於電阻R1與RWS2之 5 1277743 另一端是電連接於電阻R2與 電連接於電阻R3與R4之間 電阻R4與R5之間。 R3之間’開關S3之另一端是 開關S4之另一端是電連接於 電阻R6之一端與放大器A1的輸出端、負輸入端電連 接:而電阻R6之另-端則與電晶體Q的第-端、電容C之 ^及放大器A2的負輸人端電連接。而電容c之另一端則 與放大器A2之輸出端及稽納二極體ZD的陽極電連接。且 稽納二極體ZD的陰極則與電阻^及電晶體Q的第二端電 連接,而待測電阻8則是接於該電晶體q的第三端。 該微處理器52可輸出複數控制信號,且該等控制信號 可刀別控制忒等開關§ 1〜S4的導通或不導通。而一固定參 考電壓Vref則由該放大器A1的正輸入端輸入。 當該微處理器52之控制信號控制該開關S4導通且開 關S1〜S3都不導通時,該固定參考電壓Vref將被電阻 R1 〜R5 分壓成 V,,且 V,等於 Vrefx(R5/(R1+R2+R3+R4+R5)Referring to Fig. 1, a conventional resistance value measuring device is suitable for measuring a resistance value of a resistor 8 to be tested, and includes a circuit 5 for generating a steady current, a voltage measuring unit 6, and a calculating unit 7. The circuit 5 for generating a steady current includes a current generator 51 and a microprocessor 52. The current generator 51 is controlled by the microprocessor 52 to generate a stable current of different magnitude, and the resistor 8 to be tested is electrically connected to the current generator ,, and the current generated by the current generator 51 will flow. The voltage measuring unit 6 is configured to measure the voltage across the resistor 8 to be tested, and send the value of the voltage across the terminal to the computing unit 7. The computing unit 7 is The difference between the voltages of the two ends is divided by the current value generated by the current generator 51 to obtain the magnitude of the resistance of the resistor 8 to be tested. 〇 Deng said that as shown in FIG. 2, the current generator 51 Including a plurality of Leiyang ρ is a number of resistors R1 to R7, a plurality of switches S1 to S4, a second amplifier a ^ A2, - a transistor Q, a capacitor CA - a Zener diode ZD. Swallowing resistors R1 ~ R5 蛊 associated , W is connected in series, and the resistor is used for the turn-out of the amplifier A1, the connection is equal to the gate S1, and the end of the resistor R5 is grounded, and the = off: the end of the S4 and the amplification "2" The other end of the input terminal electrical connection 81 is electrically connected to the resistor R1 and RWS2 5 1277743 The other end is electrically connected to the resistor R2 and the electric Connected between the resistors R4 and R5 between the resistors R3 and R4. The other end of the switch S3 between R3 is that the other end of the switch S4 is electrically connected to one end of the resistor R6 and is electrically connected to the output end and the negative input end of the amplifier A1: the other end of the resistor R6 is the same as the transistor Q The terminal, the capacitor C and the negative input terminal of the amplifier A2 are electrically connected. The other end of the capacitor c is electrically connected to the output of the amplifier A2 and the anode of the Zener diode ZD. The cathode of the Zener diode ZD is electrically connected to the second end of the resistor and the transistor Q, and the resistor 8 to be tested is connected to the third end of the transistor q. The microprocessor 52 can output a plurality of control signals, and the control signals can control whether the switches § 1 to S4 are turned on or off. A fixed reference voltage Vref is input from the positive input of the amplifier A1. When the control signal of the microprocessor 52 controls the switch S4 to be turned on and the switches S1 S S3 are not turned on, the fixed reference voltage Vref will be divided into V by the resistors R1 R R5, and V is equal to Vrefx (R5/( R1+R2+R3+R4+R5)

)’故放大器A2之正、負輸入端的電壓值皆為此v,值,而 該電流產生器51即可輸出一大小為(vref-V,)/R6的電流。 而當該微處理器52改變開關S1〜S4的導通情形時,則 該電流產生器51輸出的電流即可因該等電阻R1〜R5的分壓 作用而改變。 當習知之電阻值量測裝置用於量測一安裝於電路板上 的電阻時,若該電路板上含有高電壓,則會發生該高壓回 傳至該電流產生器5 1,而使該電流產生器51燒毁的情形。 此外,該電阻值量測裝置一般是安裝於一數位電錶中 1277743 ,且該數位電錶除了可量測電阻值外,也可切換至量測電 壓或電流值的模式。而使用者在使用該數位電錶時,常常 Is生要里測電屬,但卻忘記要將該數位電錶切換至電壓量 測模式,而在該數位電錶為電阻量測模式下,直接將高電 壓信號接入,而這高電壓信號將饋入至該電流產生器51, 使該電流產生器51損害,並同使造成電阻值量測裝置的損 • 毁。 、 • 故使該可產生穩定電流的電路5具有高壓保護的功能 ' ,將可使該電阻值量測裝置在使用上更為安全與便利,且 可提供使用者直接量測位於電路板上的電阻,並也同時避 免了使用錯誤造成的損害。 【發明内容】 因此,本發明之目的,即在提供一種具有高壓保護功 能及具有高準確特性的電阻值量測裝置。 於是,本發明之一種電阻值量測裝置是適用於量測一 • 待測電阻的電阻值大小。該電阻值量測裝置包含一可隔離 高壓且產生穩定電流的電路、一電壓量測單元及一計算單 元。 該可隔離尚壓且產生穩定電流的電路包含一能產生一 穩定電流的電流產生器及一保護模組。該保護模組包括一 導流單元、一二極體、一負載單元及一保護元件。 該導流單元與該電流產生器電連接,並能將該電流產 生器產生的電流輸出,且當一負電壓輪入時,該導流單元 是呈不導通的逆偏狀態以阻止該負電壓進入該電流產生器 7 1277743 該二極體其陰極與該待測電阻電連接,且其陽極與該 導流單元電連接’而該導流單元流出的電流是流入該二極 體之陽極’並由該二極體之陰極流至該待測電阻,且當一 正電壓從該二極體之陰極輸入時,該二極體將呈逆偏狀態 。該負載單元與該導流單元及該二極體之陽極電連接。 該保護元件與該導流單元、該負載單元電連接,且不 '# 會使由該電流產生器輸出的電流流到地,並能在一負電壓 - 由該二極體之陰極輸入時導通,使該負電壓跨壓於該負載 單元上並接至地而不會傳入至該電流產生器。 該電壓量測單元能量測該待測電阻的二端電壓。而該 什异單元疋將该電壓量測單元量到的該二電壓之差值除以 该電流產生器產生的電流而得到該待測電阻的電阻值。 且值得注意的是’該可隔離高壓且產生穩定電流的電 路可應用至其他需要具高壓保護的穩定電流裝置中,故具 Φ 有獨立存在或獨立販售的特性。 【實施方式】 有關本發明之前述及其他技術内容、特點與功效,在 以下配合參考圖式之二個較佳實施例的詳細說明中,將可 清楚的呈現。 在本發明被詳細描述之前,要注意的是,在以下的說 明内谷中,類似的元件是以相同的編號來表示。 參閱圖3,本發明電阻值量測裝置之第一較佳實施例是 適用於量測-待測電阻4的電阻值大小,且該電阻值量測 1277743 裝f包含—可隔離高i·1產生穩定電流的電路卜一電壓量 測早7G 2及-計算單元3。而該可隔離高麼且產生穩定電流 的電路i包括-電流產生器n、—保護模組以 器13 〇 -亥電抓產生益11 &受該微處理器13的控制以產生不同 大小的穩^電流’該保護模組12則接收該電流產生器_ . _流並送至該待測電阻4上。而_量測單元2是 -· 帛來量測該待測電阻4的兩端,並將該兩端電壓的值 ; 送人該計算單元3。該計算單元3則將該二端㈣的差值除 以該電流產生器U產生的電流值以得到該待測電阻4的電 阻值大小。 如圖4所示,該電流產生器u包括二放大器ai〜a2, 複數電阻R1〜R8、複數開關S1〜S4、複數電晶體Q1〜Q4、 複數稽納二極體ZD1〜ZD2、一電容c。且該等開關叫4 的導通與否是受該微處理器丨3控制。 • 且在本實施例中’該電晶體Qi是-種p通道接合型場 效電晶體(J-而)’電晶體Q4是一種N通道接合型場效電 晶體’而電晶體Q2、Q3是一種絕緣閘型場效電晶體,且電 晶體Q2、Q3的作用為開關。 該放大器A1之正輸人端接收—高穩定且低溫度係數的 參考電壓Vref,而該放大器A1之負輸入端與該電阻R7、 R8之一端及電晶體Q4之一端電連接,且該放大器^之輸 出端則與電晶體Q4之一端電連接。而該電阻R7、R8之另 一端則分別與該電晶體Q2、Q3電連接,且該電晶體Q2、 1277743 Q 3的導通則受该微處理器13控制。 該電阻R1串接於該電晶體q4和該稽納二極體zm之 陽極間,而該電阻R2〜R5之一端也與該稽納二極體zm之 陽極電連接,且另一端則分別與開關S1〜S4之一端電連接 ,而該等開關S1〜S4之另一端則與該電晶體Q1之一端、電 容C及放大器A2之負輸入端電連接。放大器人2之正輸入 端是與電晶體Q4之一端電連接。且稽納二極體ZD2的陽極 與該放大器A2的輸出端及該電容c之另一端電連接,而其 陰極是與電阻R6及電晶體Qi電連接。 在本貫施例中,參考電壓Vref的值為1〇伏特,而電阻 R1 〜R8 的電阻值分別為 2k、lk、l〇k、l〇〇k、200k、4.75k 、200k及20k,且稽納二極體zm、ZD2的導通電壓分別 為3.9V與5.1V。而在上述參數下,該電流產生器丨丨產生 的穩疋電流可為1mA、1 OOuA、1 〇uA、5uA及〇.5uA。 當欲產生1mA的穩定電流時,該微處理器j 3將送出一 為HI的信號至電晶體Q3,使其導通,且送出一為的信 唬至電晶體Q2,使其不導通,此時,因為該放大器A1的 正輸入端之參考電壓Vref大小為10v,故放大器A1的負輸 入端之電壓也為10V ’此時流過電阻R8的電流將為 0.5mA(=10/20k)。而流過電晶體q4及R1的電流u也為 0.5mA,故電阻R1上的跨壓Vcb將為lv (=〇 5m*2k)。 因為稽納二極體ZD1的導通電壓為3.9V,故將使c點 的電麼位於放大器Α2的輸入共模電壓(c〇mm〇n-m〇de voltage)之内,而使放大器A2的輸出電壓不會達到飽和。 10 1277743 而電晶體Φ的間極電壓即為放大器A2之輸出電屡加上稽 納二極體ZD2的電麼(5.lv),故電晶體φ將工作於電阻區 内。而稽納二極體ZD2的作用也使放大器A2的輸出電麼能 於放大II的飽和電仙。故在放大器A2之正、負輸入端之 该微處理器13將使開關si導通且開關S2〜S4 電壓相同時 «Therefore, the voltage values of the positive and negative input terminals of the amplifier A2 are all v, and the current generator 51 can output a current of size (vref-V,) / R6. When the microprocessor 52 changes the conduction state of the switches S1 to S4, the current output from the current generator 51 can be changed by the voltage division of the resistors R1 to R5. When a conventional resistance value measuring device is used to measure a resistor mounted on a circuit board, if the circuit board contains a high voltage, the high voltage is returned to the current generator 51, and the current is generated. The situation in which the generator 51 is burned. In addition, the resistance value measuring device is generally mounted in a digital electric meter 1277743, and the digital electric meter can be switched to a mode for measuring the voltage or current value in addition to the measured resistance value. When the user uses the digital meter, he often wants to measure the electric charge, but forgets to switch the digital electric meter to the voltage measurement mode, and in the resistance measurement mode, the high voltage is directly applied. The signal is applied and the high voltage signal is fed to the current generator 51, causing the current generator 51 to be damaged and causing damage to the resistance value measuring device. Therefore, the circuit 5 capable of generating a stable current has a function of high voltage protection, which makes the resistance value measuring device safer and more convenient to use, and provides a user to directly measure the circuit board. Resistance, and at the same time avoid the damage caused by the use of errors. SUMMARY OF THE INVENTION Accordingly, it is an object of the present invention to provide a resistance value measuring device having a high voltage protection function and a high accuracy characteristic. Thus, a resistance value measuring device of the present invention is suitable for measuring the magnitude of a resistance of a resistor to be tested. The resistance value measuring device comprises a circuit for isolating a high voltage and generating a steady current, a voltage measuring unit and a calculating unit. The circuit for isolating the voltage and generating a steady current comprises a current generator capable of generating a stable current and a protection module. The protection module includes a flow guiding unit, a diode, a load unit and a protection component. The flow guiding unit is electrically connected to the current generator and can output the current generated by the current generator, and when a negative voltage is turned in, the flow guiding unit is in a non-conducting reverse bias state to block the negative voltage. Entering the current generator 7 1277743, the cathode of the diode is electrically connected to the resistance to be tested, and the anode thereof is electrically connected to the flow guiding unit 'the current flowing from the current guiding unit is flowing into the anode of the diode' The cathode of the diode flows to the resistance to be tested, and when a positive voltage is input from the cathode of the diode, the diode will be in a reverse bias state. The load unit is electrically connected to the flow guiding unit and an anode of the diode. The protection element is electrically connected to the flow guiding unit and the load unit, and does not cause the current output by the current generator to flow to the ground, and can be turned on when a negative voltage is input from the cathode of the diode. The negative voltage is across the load cell and connected to ground without being passed to the current generator. The voltage measuring unit measures the two-terminal voltage of the resistance to be tested. The singular unit 除 divides the difference between the two voltages measured by the voltage measuring unit by the current generated by the current generator to obtain the resistance value of the resistance to be tested. It is also worth noting that the circuit that can isolate high voltage and generate a stable current can be applied to other stable current devices that require high voltage protection, so that Φ has the characteristics of being independent or sold separately. The above and other technical contents, features and effects of the present invention will be apparent from the following detailed description of the preferred embodiments of the invention. Before the present invention is described in detail, it is noted that in the following description, similar elements are denoted by the same reference numerals. Referring to FIG. 3, a first preferred embodiment of the resistance value measuring device of the present invention is suitable for measuring the magnitude of the resistance of the resistor 4 to be tested, and the resistance value is measured 1277743. The f-containing - can be isolated high i·1 The circuit that generates the steady current is measured by the voltage measurement 7G 2 and the calculation unit 3. And the circuit i that can isolate the high and generate a stable current includes a current generator n, a protection module, and a microprocessor 13 controlled by the microprocessor 13 to generate different sizes. The current module 'the protection module 12 receives the current generator _ . _ stream and sends it to the resistance 4 to be tested. The _ measuring unit 2 is - 帛 to measure the two ends of the resistance 4 to be tested, and the value of the voltage across the two is sent to the computing unit 3. The calculating unit 3 divides the difference between the two ends (four) by the current value generated by the current generator U to obtain the magnitude of the resistance of the resistor 4 to be tested. As shown in FIG. 4, the current generator u includes two amplifiers ai~a2, a plurality of resistors R1 to R8, a plurality of switches S1 to S4, a plurality of transistors Q1 to Q4, a plurality of capacitors ZD1 to ZD2, and a capacitor c. . And the switch is called 4 is controlled by the microprocessor 丨3. • and in the present embodiment 'the transistor Qi is a p-channel junction type field effect transistor (J-and) 'the transistor Q4 is an N-channel junction type field effect transistor' and the transistors Q2, Q3 are An insulated gate field effect transistor, and the functions of the transistors Q2 and Q3 are switches. The positive input end of the amplifier A1 receives a high stable and low temperature coefficient reference voltage Vref, and the negative input end of the amplifier A1 is electrically connected to one end of the resistors R7, R8 and one end of the transistor Q4, and the amplifier ^ The output is electrically connected to one end of the transistor Q4. The other ends of the resistors R7 and R8 are electrically connected to the transistors Q2 and Q3, respectively, and the conduction of the transistors Q2, 1277743 and Q3 is controlled by the microprocessor 13. The resistor R1 is connected in series between the transistor q4 and the anode of the Zener diode zm, and one end of the resistor R2 R R5 is also electrically connected to the anode of the Zener diode zm, and the other end is respectively One ends of the switches S1 S S4 are electrically connected, and the other ends of the switches S1 S S4 are electrically connected to one end of the transistor Q1, the capacitor C and the negative input terminal of the amplifier A2. The positive input of amplifier 2 is electrically connected to one of the terminals of transistor Q4. The anode of the Zener diode ZD2 is electrically connected to the output of the amplifier A2 and the other end of the capacitor c, and the cathode is electrically connected to the resistor R6 and the transistor Qi. In the present embodiment, the reference voltage Vref has a value of 1 volt, and the resistances of the resistors R1 to R8 are 2k, lk, l〇k, l〇〇k, 200k, 4.75k, 200k, and 20k, respectively. The turn-on voltages of the Zener diodes zm and ZD2 are 3.9V and 5.1V, respectively. Under the above parameters, the current generator 丨丨 produces a steady current of 1 mA, 1 OOuA, 1 〇uA, 5uA, and 〇.5uA. When a steady current of 1 mA is to be generated, the microprocessor j 3 will send a signal of HI to the transistor Q3 to turn it on, and send a signal to the transistor Q2 to make it non-conductive. Because the reference voltage Vref of the positive input terminal of the amplifier A1 is 10v, the voltage of the negative input terminal of the amplifier A1 is also 10V. At this time, the current flowing through the resistor R8 will be 0.5mA (=10/20k). The current u flowing through the transistors q4 and R1 is also 0.5 mA, so the voltage across the resistor V1, Vcb, will be lv (= m 5m * 2k). Since the turn-on voltage of the Zener diode ZD1 is 3.9V, the power at point c is placed within the input common-mode voltage (c〇mm〇nm〇de voltage) of the amplifier Α2, and the output voltage of the amplifier A2 is made. Will not reach saturation. 10 1277743 And the inter-electrode voltage of the transistor Φ is the output of the amplifier A2 and the electric power of the diode ZD2 (5.lv) is added, so the transistor φ will work in the resistance region. The role of the Zener diode ZD2 also makes the output of the amplifier A2 able to amplify the saturation of the II. Therefore, the microprocessor 13 at the positive and negative inputs of the amplifier A2 will turn on the switch si and the voltages of the switches S2 to S4 are the same «

=不導通’此時,端電壓Vcb將等於Vcd,故電阻R2的跨 壓Vcd也為lv’而流過電阻R2的電流將為imA(=Mk)。 且此IniA的電流將經由電晶體Q1流入保護模組12中。 當該微處理器13改變該等開關S1〜S4的切換情形時, 即分別只使關S2〜S4 @其中之—導通時,該電流產生器 11即可分別產生l〇〇uA、10uA、5uA的電流。且當該微處 理器13送出一 HI的信號給電晶體Q2,且送出一 [〇的信 號給電晶體Q3,並在開關S4導通其他開關si〜s3不導通 的情形下,將可產生〇.5uA大小的電流。 而该保護模組12是包括一導流單元121、一負載單元 個一極體D及一保護元件123。而該二極體d是一 種南耐壓型的二極體D,且其陰極與該待測電阻4電連接。 在本實施例中,該導流單元121包括8個電晶體,分 =是第一電晶體T1、第二電晶體T2、第三電晶體至第八電 曰曰體Τ3〜Τ8。且該第一至第八電晶體Τ3〜Τ8皆是一種高耐 壓型的ΡΝΡ雙載子接面電晶體(BJT)。 而該負載單元122包括一第一電阻rl、一第二電阻r2 、一第三電阻r3及一第四電阻r4。且該等電阻rl〜r4串聯 在起,並都是一種可耐高壓的高功率型電阻,並可耐到 11 1277743 350伏特的電壓,故該四個電阻rl〜r4串聯在一起後可耐到 1000伏特以上的高壓。 該第一電晶體Τ1的集極(c〇liector)與第三電晶體Τ3的 射極(emitter)電連接,而該第二電晶體T2的集極與第四電 晶體Τ4的射極電連接,同樣,第三至第六電晶體丁3〜以的 集極分別與第五至第八電晶體Τ5〜Τ8的射極電連接。= non-conducting At this time, the terminal voltage Vcb will be equal to Vcd, so the voltage across the resistor V2 is also lv' and the current flowing through the resistor R2 will be imA (= Mk). And the current of this IniA will flow into the protection module 12 via the transistor Q1. When the microprocessor 13 changes the switching condition of the switches S1 to S4, that is, when only the off S2~S4@ are respectively turned on, the current generator 11 can respectively generate l〇〇uA, 10uA, 5uA. Current. And when the microprocessor 13 sends a signal of HI to the transistor Q2, and sends a [〇 signal to the transistor Q3, and when the switch S4 turns on the other switches si~s3 is not turned on, it will generate a size of u5uA. Current. The protection module 12 includes a flow guiding unit 121, a load unit, a pole body D and a protection component 123. The diode d is a south voltage-resistant diode D, and its cathode is electrically connected to the resistor 4 to be tested. In this embodiment, the flow guiding unit 121 includes eight transistors, and the sub-conductor is the first transistor T1, the second transistor T2, and the third to eighth electro-corpores Τ3 to Τ8. And the first to eighth transistors Τ3 to Τ8 are all a high-resistance type ΡΝΡ double-carrier junction transistor (BJT). The load unit 122 includes a first resistor rl, a second resistor r2, a third resistor r3, and a fourth resistor r4. And the resistors rr~r4 are connected in series, and are high-power type resistors capable of withstanding high voltage, and can withstand voltage of 11 1277743 350 volts, so the four resistors rl~r4 are connected in series and can be withstand High pressure above 1000 volts. The collector of the first transistor Τ1 is electrically connected to the emitter of the third transistor ,3, and the collector of the second transistor T2 is electrically connected to the emitter of the fourth transistor Τ4. Similarly, the collectors of the third to sixth transistors D3 are electrically connected to the emitters of the fifth to eighth transistors Τ5 to Τ8, respectively.

而該第一電晶體τι的基極卬“幻與該第二電晶體Τ2的 射極電連接,同樣,該第三、第五、第七電晶體Τ3、乃、 Τ7的基極分別與該第四、第六、第八電晶體丁4、丁6、τ8 的射極電連接。 而第-電晶體Τ1的射極則與該電流產生器η的電晶 體Q1電連接,而該第七與第八電晶體Τ7、Τ8㈣極是與 二極體D之陽極電連接。 且該第—電阻rl之兩端分別與第二、第四電晶體T2、 丁4之基極電連接,而第二電阻r2之兩端分別與第四、第六 電晶體T4、T6之其;齋、志从 尬 墙 <基極電連接,第三電之兩端分別與 ’、、第八電晶體T6、T8之基極電連接,而第四電阻r4 之兩端分別與“電晶體了 8之基極、集極電連接。 而在本實知例中,該保護元件123是一種低漏電型的 都與第極=]:接,~ 元件123也可是_錄相接。但值得注意的是,該保護 而陰極愈第-電曰辦—極體’且該二極體之陽極接到地’ 二弟-電晶體T2之基極電連接。 而當一正高遷取代該待測電阻4輸入至該二極體d之 12 1277743 陰極時’則因為該二極冑D在正高壓下是呈逆偏狀態,即 不導通,故S亥正高壓將被隔離而無法通過該二極體D進入 至該電流產生器1 1中。 匕卜田負咼壓取代該待測電阻4輸入至該二極體D 之陰極時,此時該二極體D會導通,但因為該第一至第八 電晶體T1〜T8是一種PNP型的電晶體,故該負高屡對該等 電晶體T1〜T8而言是逆偏,所以該負高壓將不會進入該導 流f元121中,而是進入至該負載單元122中。且因為該 負高壓對該保護元# 123而言為順偏,故該保護元件123 將導通並接至地’而該負高壓則將平均分配電塵至該等電 阻ri〜r4上,且透過該保護元件123到地。故此時,該保護 模組12也能阻絕該負高壓進人該電流產生器“,故該電流 產生器11也能因此受到保護。 此外’因為該保護元件123 4源極與③極相接,故是 -類似陽極接到地的二極體,所以由該電流產生器n流出 的電流無法通過該保護元件123到地,且因為該保護元件 123是採用—種低漏電型的電晶體,故該電流產生器u輸 出的電流幾乎都會透過該二極體D輸出至該待測電阻4上 ’而不會因為加人該保護模組12而影響電阻量測的準確度The base 卬 of the first transistor τι is electrically connected to the emitter of the second transistor ,2, and the bases of the third, fifth, and seventh transistors 、3, 、7, respectively The emitters of the fourth, sixth, and eighth transistors D4, D6, and τ8 are electrically connected. The emitter of the first transistor Τ1 is electrically connected to the transistor Q1 of the current generator η, and the seventh And the eighth transistor Τ7, Τ8 (four) pole is electrically connected to the anode of the diode D. The two ends of the first resistor rl are electrically connected to the bases of the second and fourth transistors T2 and D, respectively. The two ends of the two resistors r2 are respectively connected to the fourth and sixth transistors T4 and T6; the fasting and the base are electrically connected to each other, and the two ends of the third electric and the eighth transistor T6 respectively The base of T8 is electrically connected, and the two ends of the fourth resistor r4 are respectively electrically connected to the base and collector of the transistor 8. In the present embodiment, the protection element 123 is a low leakage type and is connected to the first pole =]:, and the component 123 can also be connected to the video. It is worth noting, however, that the protection is the cathode-electrode-electrode and the anode of the diode is connected to the base of the second-electrode T2. When a positive high displacement replaces the input of the resistor 4 to be input to the 12 1277743 cathode of the diode d, 'because the diode 胄D is in a reverse bias state under positive high voltage, that is, it is not conducting, so S Hai positive high voltage It will be isolated and cannot enter the current generator 1 through the diode D. When the negative pressure of the 匕Butian is substituted for the input of the resistance to be tested 4 to the cathode of the diode D, the diode D is turned on at this time, but since the first to eighth transistors T1 to T8 are a PNP type The transistor, so the negative high is repeatedly reversed for the transistors T1 TT8, so the negative high voltage will not enter the diversion f element 121, but enter the load unit 122. And because the negative high voltage is positive for the protection element #123, the protection element 123 will be turned on and connected to the ground', and the negative high voltage will evenly distribute the electric dust to the resistances ri~r4, and through The protection element 123 is to ground. Therefore, at this time, the protection module 12 can also block the negative high voltage from entering the current generator. Therefore, the current generator 11 can also be protected. In addition, because the source of the protection element 123 4 is connected to the 3 poles, Therefore, a diode similar to the anode is connected to the ground, so that the current flowing from the current generator n cannot pass through the protection element 123 to the ground, and since the protection element 123 is a low leakage type transistor, The current output by the current generator u is almost always outputted through the diode D to the resistance to be tested 4 without affecting the accuracy of the resistance measurement by adding the protection module 12

值得注意的是,該第一輕伟眚A A 孕侄實轭例中,該導流單元12 所包括的電晶體數目不以8為 — u i 6亥負載早兀122包浪 的電阻數目也不以4為限。若該導、$ ^ 右巧導机早兀121包括2xn(n j 大於或等於2的正整數)個雷曰鹏 、 数)個電曰曰體,分別是一第一電晶體至 13 1277743 ::2χη電晶體,而該負載單元包括n個電阻,分別是一 二::Γ一第η電阻’則該第i電晶體的集極是與第㈣ =體的射極電連接,且!為1至(2χη·2)間的正整數,且 “幻電晶體之基極與該第(川)電晶體的射極電連接,且j ίΛ至如·1)間的奇數,且該第—電晶體的射極則與該電 &生盗電連接,而該第(2Χ1Μ)與第2χη電晶體的集極與 該:極體之陽極電連接,而該第ρ電阻之兩端分別與第2χρ 、第(2χΡ+2)電晶體之基極電連接,且ρ為i至㈣間的正 ㈣H η電阻之兩端分別與第2χη電晶體之基極、集 極電連接,且该保護元件是與該第二電晶體之基極電連接 如圖5所示,是本發明之第二較佳實施例中的保護模 組12,且因為該第二較佳實施例中的其他元件,如:電流 產生态11、微處理器13、電壓量測單元2、計算單元3等 皆與第一貫施例相同,故在此不再贅述。 而在第二實施例中,該保護模組12是包括一二極體D 、-導流單元m、一負載單元122及一保護元件123。但 該負載單it 122只包括-個第五電阻r5,且該導流單元121 只包含兩個組成達靈頓(Darlington)結構的第九、第十電晶 體T9、TH),即第九電晶體T9的基極是與該第十電晶= τιο的射極電連接,而第九、第十電晶體Τ9、τι〇的集極 與該二極體D之陽極電連接,且第九電晶體Τ9的射極是接 收該電流產生器11產生的電流。 而該第五電阻r5之兩端是電連接於第十電晶體T1〇的 14 1277743 ’該保護元件123也是一 第十電晶體T10的基極電 基極與集極間。而在本實施例中 種J-FET,且其源極與汲極是與該 連接’而其閘極是接到地。 雖然第二實施例也可達到保護該電流產生器U的功能 ’但最高可保護的電壓範圍將比第一實施例小。 且值仔注思的疋,在該第一或第二較佳實施例中,該It is worth noting that in the first example of the yoke, the number of transistors included in the flow guiding unit 12 is not 8 - the number of resistors of the 122-wave wave is not 4 is limited. If the guide, $^, the right guide is earlier than 121, including 2xn (nj is a positive integer greater than or equal to 2), Lei Peng, number of electric body, respectively, a first transistor to 13 1277743 :: 2 χ 电 transistor, and the load unit includes n resistors, respectively, a :: Γ η η resistor', then the collector of the ith transistor is electrically connected to the emitter of the (4)th body, and! a positive integer between 1 and (2χη·2), and the "the base of the magic crystal is electrically connected to the emitter of the first transistor, and the odd number between j Λ to (1), and the The emitter of the transistor is electrically connected to the electric and the thief, and the collectors of the (2Χ1Μ) and the 2nd 电O crystal are electrically connected to the anode of the pole body, and the two ends of the ρ resistor are respectively The bases of the second χρ and (2χΡ+2) transistors are electrically connected, and the two ends of the positive (tetra)H η resistance between ρ and i are electrically connected to the base and the collector of the second 电 transistor, respectively, and the protection is The component is electrically connected to the base of the second transistor, as shown in FIG. 5, which is the protection module 12 in the second preferred embodiment of the present invention, and because of other components in the second preferred embodiment, For example, the current generating state 11, the microprocessor 13, the voltage measuring unit 2, the calculating unit 3, and the like are the same as the first embodiment, and therefore will not be described herein. In the second embodiment, the protection module 12 includes a diode D, a diversion unit m, a load unit 122, and a protection element 123. However, the load unit it 122 includes only a fifth resistor r5. The flow guiding unit 121 includes only two ninth and tenth transistors T9, TH) constituting a Darlington structure, that is, the base of the ninth transistor T9 is shot with the tenth transistor = τιο The poles are electrically connected, and the collectors of the ninth and tenth transistors Τ9, τι〇 are electrically connected to the anode of the diode D, and the emitter of the ninth transistor Τ9 receives the current generated by the current generator 11. The two ends of the fifth resistor r5 are electrically connected to the tenth transistor T1〇14 1277743. The protection element 123 is also between the base of the tenth transistor T10 and the collector. In this embodiment. Medium J-FET, and its source and drain are connected to the ' and its gate is connected to ground. Although the second embodiment can also achieve the function of protecting the current generator U', the highest protectable voltage The range will be smaller than that of the first embodiment. And in the first or second preferred embodiment,

電⑽產生盗11也可為先前技術中所述之電流產生器或是 其他習知之電流產生器。 歸、、、内上述’本發明藉由增加—與該電流產生器電連 ^保護模組12來達到保護該電流產生器u的目的,且無 順疋輸人-正兩壓或負高壓’該保護模組12都可以達到其 力效此外,本發明之保護模阻12的設計方式並不會影響 由”亥電流產生為11流到該待測電阻4上的電流值,而使該 電阻值里測裝置在具有高麗保護的功能外也具有高準確的 特性。且雖然該可隔離高壓且產生穩定電流的電路1在本 發明中是應用於一量測電阻值之裝置,但在實際應用上, 也可應用至其他需要具高壓保護的穩定電流裝置中,故具 有獨立存在或獨立販售的特性。 惟以上所述者,僅為本發明之較佳實施例而已,當不 月匕以此限定本發明實施之範圍,即大凡依本發明申請專利 乾圍及發明說明内容所作之簡單的等效變化與修飾,皆仍 屬本發明專利涵蓋之範圍内。 【圖式簡單說明】 圖1是一習知之電阻值量測裝置的系統方塊圖; 15 1277743The electric (10) generating thief 11 can also be a current generator as described in the prior art or other conventional current generators. In the above, the present invention achieves the purpose of protecting the current generator u by adding - electrically connecting the current generator to the protection module 12, and does not have a smooth input-positive pressure or negative high voltage. The protective module 12 can achieve its power efficiency. In addition, the design of the protective mold 12 of the present invention does not affect the current value generated by the current generated by the current of 11 to the resistance to be tested 4, and the resistance is made. The value measuring device also has high accuracy characteristics in addition to the function of the Goryic protection, and although the circuit 1 capable of isolating the high voltage and generating a stable current is applied to a device for measuring the resistance value in the present invention, in practical application In addition, it can also be applied to other stable current devices that require high voltage protection, so it has the characteristics of being independent or independently sold. However, the above is only the preferred embodiment of the present invention, when not The scope of the present invention is defined by the scope of the present invention, and the simple equivalent changes and modifications made by the present invention are still within the scope of the present invention. 1 is a system block diagram of a conventional resistance value measuring device; 15 1277743

圖2是習知之一電流產生器的電路圖; 圖3是本發明電阻值量測裝置之第一較佳實施例的系 統方塊圖; 圖4是該第一較佳實施例之一可隔離高壓且產生穩定 電流的電路之電路圖;及 圖5是該第二較佳實施例之一保護模組的電路圖。 16 12777432 is a circuit diagram of a conventional current generator; FIG. 3 is a system block diagram of a first preferred embodiment of the resistance value measuring device of the present invention; FIG. 4 is a first high-voltage embodiment of the first preferred embodiment A circuit diagram of a circuit for generating a steady current; and FIG. 5 is a circuit diagram of a protection module of the second preferred embodiment. 16 1277743

【主要元件符號說明】 1 * * 可隔離高壓且產 r4 · · · 第四電阻 生穩定電流的電路 r5,· * 第五電阻 11 ·… 電流產生器 R1 〜R8 電阻 12— * 保護模組 S1 〜S4 開關 121 * * 導流單元 Τ1· · · 第一電晶體 122 · * 負載單元 Τ2· · 第二電晶體 123 · · 保護元件 Τ3· · 第三電晶體 13* · ♦ 微處理器 Τ4· ·· 第四電晶體 2 *… 電壓量測單元 Τ5 · · 第五電晶體 3…· 計算單元 Τ6 · · 第六電晶體 · 待測電阻 Τ7· · · 第七電晶體 A1 〜A2 放大器 Τ8· · _ 第八電晶體 C * · 電容 T9 · · _ 第九電晶體 D ·… 二極體 Τ10 · · 第十電晶體 Icb·… 電流 Q1 〜Q4 電晶體 rl…· 第一電阻 Vref· · 參考電壓 r2 · · · 第二電阻 ZD1 ·· 稽納二極體 r3 · · · 第三電阻 ZD2 · 稽納二極體 17[Main component symbol description] 1 * * Can isolate high voltage and produce r4 · · · Fourth resistor to generate stable current circuit r5, · * Fifth resistor 11 ·... Current generator R1 ~ R8 Resistance 12 - * Protection module S1 ~S4 switch 121 * * Diversion unit Τ1 · · · First transistor 122 · * Load unit Τ 2 · · Second transistor 123 · · Protection element Τ3 · · Third transistor 13* · ♦ Microprocessor Τ4· ·· Fourth transistor 2 *... Voltage measuring unit Τ5 · · Fifth transistor 3...· Calculation unit Τ6 · · Sixth transistor · Resistance to be measured Τ7· · · Seventh transistor A1 ~ A2 Amplifier Τ8· · _ eighth transistor C * · capacitor T9 · · _ ninth transistor D ·... diode Τ10 · · tenth transistor Icb·... current Q1 ~ Q4 transistor rl...· first resistor Vref· · reference Voltage r2 · · · Second resistance ZD1 ·· 稽 二 diode r3 · · · Third resistance ZD2 · 稽 二 diode 17

Claims (1)

1277743 及 计真單元’將該電麼量測單元量到的該二電壓之 差值除以該電流產生器產生的電流而得到該待測電阻的 電阻值。 2·依據申請專利範圍第丨項所述之電阻值量測裝置,其中 ’该可隔離高壓且產生穩定電流的電路更包括一微處理 器,該微處理器與該電流產生器電連接,且能控制該電 流產生器產生的電流大小。 3·依據申請專利範圍第1項所述之電阻值量測裝置,其中 ’該負載單元包括複數電阻,且該等電阻串聯在一起, 而該負電壓則是跨壓於該等電阻上。 4·依據申請專利範圍帛丨項所述之電阻值量测|置,其中 ,該保護模組之二極體是一種高耐壓型的二極體。/、 5·依據申清專利範圍帛丨項所述之電阻值量測裝置,复 ,該保護元件是一低漏電型的j_fet, ’、 、 _閘極、 -源極及-汲極,且其閘極接到地,而其源極 該導流單元及該負載單元電連接。 一 ° &依據中請專利範圍帛!項所述之電阻值量測 ’該保護元件是一二極體,且其陽極接到地二立二中 是與該導流單元及該負載單元電連#。 ”陰極 7.依據申請專利範圍第i項所述之電阻值 ’該導流單元包括一第一電晶體及一第二電晶體,:中 負載單元包括-第一電阻,且該第而該 有一射極、一基極及― /、—電晶體都具 集極,該第一電晶體之射極與該 19 1277743 電流產生器電連接,而其基極與該第二電晶體之射極電 連接,且其集極與該二極體之陽極、該第二電晶體之集 極電連接,而該第—電阻之兩端與該第二電晶體之基極 與集極電連接,且該保護元件是與該第二電晶體之 電連接 8·依據申請專利範圍第7所述之電阻值量測裝置,其中 4弟一與弟一電晶體是一種高耐壓型的PNP雙載子接 電晶體,而該第一電阻是一種可耐高壓的高功率型電: 9·依據申請專利範圍第8所述之電阻值量測裝置,其中 該保護元件是一低漏電型的J-FET,且具有一閘極、一 源極及一汲極,且其閘極接到地,而其源極與汲極與該 第二電晶體之基極電連接。 〃 μ 10·依據申請專利範圍第i項所述之電阻值量測裝置,其中 ’該導流單元包括2xn個電晶體,且n為大於或等於2 的正整數,而該2χη個電晶體分別是一第一電晶體至一 第2 χη電晶體,而該負載單元包括η個電阻,分別是一 第一電阻至一第η電阻,且每一電晶體都具有一射極、 一基極及一集極,而該第i電晶體的集極與第(i+2)電晶 體的射極電連接,且i為1至(2xn_2)間的正整數,且5 第j電晶體之基極與該第(j + Ι)電晶體的射極電連接, J 為1至(2χη-1)間的奇數,且該第一電晶體的射極則與該 電流產生器電連接,而該第(2χη-ΐ)與第2χη電晶體的集 極與該二極體之陽極電連接,而該第Ρ電阻之兩端分別 20 1277743 與第2xp、第(2xp+2)電曰曰曰體之基極電連接,且p為i至 ㈤)間的正整數,而第n電阻之兩端分別與第—電晶 體之基極、集極電連接,且該保護元件是與該第二電晶 體之基極電連接。 •依據申明專利範圍第10項所述之電阻值量測裝置,其中 忒第一至第(2 χη)電晶體是一種高耐壓型的ρΝρ雙載子 接面電晶體’而該第一至第η電阻是一種可耐高壓的高 功率型電阻。 12·依據申請專利範圍第u所述之電阻值量測裝置,其中, ”亥保喜元件疋一低漏電型的,且具有一閘極、一 源極及一汲極,且其閘極接到地,而其源極與汲極與該 第一電晶體之基極電連接。 13 · —種可隔離高壓且產生穩定電流的電路,包含: 一電流產生器,能產生一穩定電流;及 一保護模組,包括: 一導流單元,與該電流產生器電連接,並能將 該電流產生器產生的電流輸出,且當一負電壓輸入 時’該導流單元是呈不導通的逆偏狀態以阻止該負 電壓進入該電流產生器; 一二極體,其陽極與該導流單元電連接,而該 導流早元流出的電流是流入該二極體之陽極,並由 該二極體之陰極流出,且當一正電壓從該二極體之 陰極輸入時,該二極體將呈逆偏狀態; 一負載單元,與該導流單元及該二極體之陽極 21 1277743 電連接;及 一保4元件,與該導流單元、該負載單元電連 接,且不會使由該電流產生器輪出的電流流到地, 並能在一負電壓由該二極體之陰極輸入時導通,使 該負電壓跨壓於該負載單元上並接至地而不會傳入 至該電流產生器。 14·依據申請專利範圍第13項所述之可隔離高壓且產生穩定 :φ 電抓的電路,更包含一微處理器,該微處理器與該電流 產生器電連接,且能控制該電流產生器產生的電流大小 〇 15. 依據申請專利範圍第13項所述之可隔離高壓且產生穩定 電/;,L的電路,其中,該負載單元包括複數電阻,且該等 電阻串聯在一起,而該負電壓則是跨壓於該等電阻上。 16. 依據申請專利範圍第13項所述之可隔離高壓且產生穩定 電流的電路,其中,該保護模組之二極體是一種高耐壓 鲁 型的二極體。 又據申咕專利範圍第丨3項所述之可隔離高壓且產生穩定 的電路其中’該保護元件是一低漏電型的丁 ’、有閘極、一源極及一汲極,且其閘極接到地, 18而其源極與沒極與該導流單元及該負«單元電連接。 依據申清專利範圍第13項所述之可隔離高屢且產生穩定 電机的電路’其中,該保護元件是一二極體,且其陽極 接到地’而其陰極是與該導流單元及該負載單元電連接 22 1277743 19. 依據申請專利範圍帛13項所述之可隔離 電流的電路,其中,該導流單元包括一第一電= 第二電晶體’而該負載單元包括-第-電阻,且該第一 與第二電晶體都具有一射極、一基極及一集極,該第一 電晶體之射極與該電流產生器電連接,而其基極與該第 二電晶體之射極電連接,且其集極與該二極體之陽極、 :第二電晶體之集極電連接,而該第一電阻之兩端與該 第二電晶體之基極與集極電連接,且該保護元件是與該 第二電晶體之基極電連接。 20. 依據申請專利範圍第19項所述之可隔離高壓且產生穩定 電流的電路,其中,該第一與第二電晶體是一種高耐壓 ?的PNP雙載子接面電晶體,而該第一電阻是一種可耐 高壓的高功率型電阻。 21·依據中請專利範圍帛2G項所述之可隔離高壓且產生穩定 電机的電路,其中,該保護元件是一低漏電型的J-FET 且具有一閘極、一源極及一汲極,且其閘極接到地, 而其源極與汲極與該第二電晶體之基極電連接。 .依據申睛專利範圍第13項所述之可隔離高壓且產生穩定 電机的電路,其中,該導流單元包括2 xn個電晶體,且 η為大於或等於2的正整數,而該2⑼個電晶體分別是 第一電晶體至一第(2 χη)電晶體,而該負載單元包括η 個電阻,分別是一第一電阻至一第η電阻,且每一電晶 體都具有一射極、一基極及一集極,而該第i電晶體的 集極與第(1+2)電晶體的射極電連接,且i為1至(2xn-2) 23 1277743 間的正整數,且該第j電晶體之基極與該第(j + 1)電晶體 的射極電連接,且j為1至(2 xn-l)間的奇數,且該第一 電晶體的射極則與該電流產生器電連接,而該第(2 xn-1) 與第2xn電晶體的集極與該二極體之陽極電連接,而該 第P電阻之兩端分別與第2xp、第(2xp+2)電晶體之基極 電連接’且p為1至(n_ 1)間的正整數,而第η電阻之兩 端分別與第2χη電晶體之基極、集極電連接,且該保護 φ 元件是與該第二電晶體之基極電連接。 ' 23·依據申請專利範圍第22項所述之可隔離高壓且產生穩定 電流的電路,其中,該第一至第(2 xn)電晶體是一種高耐 壓型的PNP雙載子接面電晶體,而該第一至第n電阻是 一種可耐鬲壓的高功率型電阻。 第23項所述之可隔離高壓且產生穩定 ,該保遵元件是一低漏電型的j_FEt 一源極及一汲極,且其閘極接到地, 24·依據申請專利範圍第 電流的電路,其中, ,且具有一閘極、一 籲㈤其源極與沒極與該第二電晶體之基極電連接 241277743 and the counter-true unit' divide the difference between the two voltages measured by the measuring unit by the current generated by the current generator to obtain the resistance value of the resistor to be tested. 2. The resistance value measuring device according to the above application, wherein the circuit for isolating the high voltage and generating the steady current further comprises a microprocessor electrically connected to the current generator, and It is possible to control the amount of current generated by the current generator. 3. The resistance value measuring device according to claim 1, wherein the load unit comprises a plurality of resistors, and the resistors are connected in series, and the negative voltage is across the resistors. 4. The resistance value measured according to the scope of the patent application is set, wherein the diode of the protection module is a high voltage type diode. /, 5. According to the resistance value measuring device described in the scope of the patent application, the protection component is a low leakage type j_fet, ', _ gate, - source and - drain, and The gate is connected to the ground, and the source of the current guiding unit and the load unit are electrically connected. One ° & The resistance value measured in the item is that the protection element is a diode, and its anode is connected to the grounding diode and is electrically connected to the current guiding unit and the load unit. Cathode 7. The resistance value according to the scope of claim ′ of the patent application. The flow guiding unit comprises a first transistor and a second transistor, wherein the medium load unit comprises a first resistor, and the first one has a The emitter, a base, and the / /, - transistor have a collector, the emitter of the first transistor is electrically connected to the 19 1277743 current generator, and the base thereof and the second transistor are electrically Connecting, and the collector is electrically connected to the anode of the diode and the collector of the second transistor, and the two ends of the first resistor are electrically connected to the base of the second transistor and the collector The protection element is electrically connected to the second transistor. 8. The resistance value measuring device according to the seventh aspect of the patent application, wherein the 4th brother and the brother-one transistor are a high-voltage type PNP double carrier. a transistor, and the first resistor is a high-voltage type that can withstand high voltage: 9. The resistance value measuring device according to the eighth aspect of the patent application, wherein the protection component is a low leakage type J-FET, And having a gate, a source and a drain, and the gate is connected to the ground, and The source and the drain are electrically connected to the base of the second transistor. 〃 μ 10. The resistance value measuring device according to claim i, wherein the current guiding unit comprises 2 x n transistors, and n is a positive integer greater than or equal to 2, and the 2χη transistors are respectively a first transistor to a 2nd 电n transistor, and the load unit includes n resistors, respectively, a first resistor to a η a resistor, and each of the transistors has an emitter, a base, and a collector, and the collector of the ith transistor is electrically connected to the emitter of the (i+2)th transistor, and i is 1 to a positive integer between (2xn_2), and the base of the fifth j-th transistor is electrically connected to the emitter of the (j + Ι) transistor, J is an odd number between 1 and (2χη-1), and the first The emitter of the transistor is electrically connected to the current generator, and the collector of the (2χη-ΐ) and the 2nd transistor is electrically connected to the anode of the diode, and the two ends of the second resistor are respectively 20 1277743 is electrically connected to the base of the 2xp, (2xp+2)th electric body, and p is a positive integer between i and (f)), and the two ends of the nth resistor are respectively The base of the first transistor is electrically connected to the collector, and the protection element is electrically connected to the base of the second transistor. The resistance value measuring device according to claim 10, wherein The first to the (2 χn) transistors are a high-voltage type ρΝρ double-carrier junction transistor' and the first to ηth resistors are high-voltage resistors capable of withstanding high voltages. The resistance value measuring device according to the above, wherein the "Haibaoxi device" has a low leakage type and has a gate, a source and a drain, and the gate thereof is connected to the ground, and the source thereof The pole and the drain are electrically connected to the base of the first transistor. 13 a circuit capable of isolating a high voltage and generating a steady current, comprising: a current generator capable of generating a steady current; and a protection module comprising: a flow guiding unit electrically connected to the current generator and capable of Outputting the current generated by the current generator, and when a negative voltage is input, the current guiding unit is in a non-conducting reverse bias state to prevent the negative voltage from entering the current generator; a diode, an anode thereof and the anode The flow guiding unit is electrically connected, and the current flowing out of the guiding element is flowing into the anode of the diode and flowing out from the cathode of the diode, and when a positive voltage is input from the cathode of the diode, the The diode will be in a reverse bias state; a load unit is electrically connected to the flow guiding unit and the anode 21 1277743 of the diode; and a 4 component is electrically connected to the flow guiding unit and the load unit, and The current that is rotated by the current generator flows to the ground, and can be turned on when a negative voltage is input from the cathode of the diode, so that the negative voltage is pressed across the load unit and connected to the ground without Incoming to the current production Device. 14. The circuit capable of isolating high voltage and generating stability according to claim 13 of the patent application scope: φ electric grasping circuit further includes a microprocessor electrically connected to the current generator and capable of controlling the current generation The current generated by the device is 〇15. The circuit for isolating the high voltage and generating a stable electric power, according to claim 13 of the patent application, wherein the load unit comprises a plurality of resistors, and the resistors are connected in series, and The negative voltage is across the resistors. 16. The circuit for isolating a high voltage and generating a stable current according to claim 13 of the patent application, wherein the diode of the protection module is a high withstand voltage type diode. According to the third paragraph of the patent scope of the application, the high voltage isolation circuit can be isolated, wherein the protection component is a low leakage type D, having a gate, a source and a drain, and the gate thereof The pole is connected to ground 18 and its source and the pole are electrically connected to the flow guiding unit and the negative «unit. A circuit capable of isolating high and generating a stable motor according to claim 13 of the patent scope of the invention, wherein the protection element is a diode and its anode is connected to the ground and the cathode is connected to the current guiding unit And the load unit is electrically connected to the circuit of the present invention, wherein the current-conducting unit includes a first electric=second electric crystal and the load unit includes- a resistor, and the first and second transistors each have an emitter, a base and a collector, the emitter of the first transistor being electrically connected to the current generator, and the base and the second The emitter of the transistor is electrically connected, and the collector is electrically connected to the anode of the diode, the collector of the second transistor, and the base of the first resistor and the base and the collector of the second transistor The pole is electrically connected and the protective element is electrically connected to the base of the second transistor. 20. The circuit for isolating a high voltage and generating a steady current according to claim 19, wherein the first and second transistors are a high withstand voltage PNP bipolar junction transistor, and the The first resistor is a high-power type resistor that can withstand high voltage. 21. A circuit capable of isolating a high voltage and generating a stable motor according to the scope of the patent application 帛2G, wherein the protection element is a low leakage type J-FET and has a gate, a source and a 汲a pole, and its gate is connected to ground, and its source and drain are electrically connected to the base of the second transistor. The circuit for isolating a high voltage and generating a stable motor according to claim 13 of the claim, wherein the flow guiding unit comprises 2 x n transistors, and η is a positive integer greater than or equal to 2, and the 2 (9) The transistors are respectively a first transistor to a (2 χn) transistor, and the load unit comprises n resistors, respectively a first resistor to an η resistor, and each transistor has an emitter a base and a collector, wherein the collector of the ith transistor is electrically connected to the emitter of the (1+2)th transistor, and i is a positive integer between 1 and (2xn-2) 23 1277743, And the base of the jth transistor is electrically connected to the emitter of the (j+1)th transistor, and j is an odd number between 1 and (2 xn-1), and the emitter of the first transistor is Electrically connecting with the current generator, and the collectors of the (2 xn-1) and the 2xn transistors are electrically connected to the anode of the diode, and the two ends of the P resistor are respectively associated with the 2xp, the ( 2xp+2) the base of the transistor is electrically connected' and p is a positive integer between 1 and (n-1), and both ends of the η-resistance are electrically connected to the base and collector of the second 电n transistor, respectively, and The protection φ element is electrically connected to the base of the second transistor. A circuit capable of isolating a high voltage and generating a steady current according to claim 22, wherein the first to (2 x n) transistors are a high-voltage type PNP double carrier junction A crystal, and the first to nth resistors are high-voltage resistors that are resistant to rolling. The high voltage can be isolated and stabilized according to item 23, the compliant component is a low leakage type j_FEt a source and a drain, and the gate is connected to the ground, 24 · the circuit according to the patent application range current , wherein, and having a gate, a (5) source and the pole are electrically connected to the base of the second transistor 24
TW94115038A 2005-05-10 2005-05-10 Circuit providing steady current with high voltage isolation and resistance measurement apparatus with circuit thereof TWI277743B (en)

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