1276779 .九、發明說明· 【發明所屬之技術領域】 本發明係有關於一種脈衝式渦電流檢測數據溫度校 正方法與設備，尤其是指一種當設備或管線的表面溫度不 均勻時’可迅速扠正溫差所造成的誤差，可以準確地量測 設備的厚度之脈衝式渦電流檢測數據溫度校正方法與設 備創新設計者。 … 【發明背景】 按，脈衝式渦電流（pulse Eddy ，簡稱ρ队） 檢測技術是—種非破壞性腐⑽職術，檢測者無需拆除 設備外部的包覆材’即可由渦電流的強度在鐵磁材料中的 衰滅程度推估材料的厚度，快额測碳鋼設備或管線的腐 蚀狀況，已普遍應用於煉油與化學讀設備的檢測。 交流電通過導線時，會產生-交變磁場。當線圈置於 導體附近時，導體内的自由雷早 .t ^ ^ 電子會欠到外來磁場的感應1276779. Nine, the invention relates to the technical field of the invention. The invention relates to a pulse eddy current detection data temperature correction method and device, in particular to a kind of rapid fork when the surface temperature of the device or pipeline is not uniform The error caused by the positive temperature difference can accurately measure the thickness of the device, and the pulse eddy current detection data temperature correction method and equipment innovation designer. [Background of the Invention] According to the pulse eddy current (pulse Eddy, referred to as ρ team) detection technology is a kind of non-destructive rot (10) job, the detector does not need to remove the outer cladding material of the device' can be the intensity of the eddy current The degree of decay in ferromagnetic materials estimates the thickness of the material, and the corrosion condition of the carbon steel equipment or pipeline is rapidly applied to the detection of refining and chemical reading equipment. When alternating current is passed through the wire, an alternating magnetic field is generated. When the coil is placed near the conductor, the free lightning in the conductor is early .t ^ ^ The electron owes the induction of the external magnetic field
而進灯51^運動’形朗_路徑。這絲數同心圓周的 運動。渦電流的流動方向與線圈纏繞方向平 ，，而且會隨時因線圈交流電的方 二電i率相ί :被度與磁場強度成正比。頻率與線圈交 3 ί二在磁場範圍内活動，-般磁場的有 相似。渦電流本身亦會產生磁場，其方 ΐ ==相反(愣次定律)，其大小與導體之品 产，丄=關。渦電流磁場可部份抵消線圈磁場強 缺陷存在，則渦電流的方向將备 泠體 產生的渦電流，因磁場反作用；。：變。導體内所感應 、線圈磁場，以至大部分渦 5 1276779 ^ 電流集中在導體表面，這種現象稱為集膚效性（Skin effect)，属電流雄、度隨著深度之增加而快速遞減。 在渦電流檢測過程中，有許多變數會影響輪出的訊 號，諸如導電率、導磁率、偶合距離、頻率調整、品質狀 況、幾何形狀、尺寸變化等。應力改變、震動情形、環境 ，擾、溫度變化、邊緣效應等，以致於有意義之訊號被^ 蔽或誤判，執行時必須瞭解並掌握各種可能存在之變數豕 以獲得可靠的數據。 • 脈衝式渦電流檢測系統藉由連續切換電流方向的方 j產生父艴磁場，感應生成一種類似脈衝式的渦電流，於 —， =表面誘導出渦電流。而依據愣次定律，當磁場方向改 同時也將誘導出與磁場方向相反的渦電流。在足夠 $父變磁場強度下，產生的渦電流將自受測工件表面散佈 至底部。 田渦電流由工件表面散佈至底部時，會產生出相對抵 ^的=場。當磁場穿透探頭上的接收線圈時，將使線圈產 _ ’此—誘導電流和訊號經由量測及放大後，而可行 叶异出檢測的結果。 月渦電流持續時間（Γ)與導電率（外導磁率（A) 考:測工件之厚度值平方成正比，如公式（1)。執行時必 工件上選擇一參考點決定材/料導磁率與導電率乘 貝，/、他各檢测點將依此參考點作為標準進行計算分析。 〜σά Cl) r渦電流持續時間，單位··毫秒㈣ 為工件仏查位置的厚度，單位··公厘瓜^ σ 導電率（Conductivity) 6 1276779 认 導磁率（Permeability) ，脈衝式’尚電流檢測技術雖已普遍應用於煉油與化學 工廠設備的檢測，設備廠商與檢測者對於視包覆厚度、受 ’貝】物材貝、失设材料及振動狀況專因素的影響了解透徹， 且已發展出校正補償方法；但是由於過去絕大多數的檢測 對象皆為表面溫度均勻的設備或管線上，從未重視溫 影響6 一由過去實場檢測的經驗可知，當設備表面的溫度不均 勻時，局部位置檢測與驗證結果之誤差往往超過5%，有些 誤差值甚至超過15%。當設備溫度在常溫至28(rc之間， 表面溫度的差異超過20T時，檢測所得厚度即會超過±2% (以设備檢測决差5%估算，考慮設備儀器本身靈敏度士2%， 並假設其它其他影響因子所造成的誤差為1%，則溫差對檢 測的影響必須低於±2%)。此種現象尤其以熱交換器為最嚴 重，因為熱交換器的表面溫度較不均勻，溫差多超過2〇。〇 以上。錯誤的檢測結果會造成設備腐餘狀況的錯誤判斷， 甚至導致不必要的停爐檢修，嚴重影響操作及營運效益。 如欲將脈衝式渦電流應用於表面溫度不均勻的設備檢測 時，必須尋找出誤差校正的方法，否則檢測結果不具任何 意義。 由公式（1)可知，渦電流強度與鐵磁材料的導磁率與 導電率乘積的有關，當受測設備的表面溫度不均時，導磁 率與導電率會因溫度的變化而改變，進而導致檢測結果的 誤差；因此，由導磁率與導電率乘積與溫度變化的關係， 即可演鋒出溫度校正函數，進而應用此函數發展出校正工 具。 7 1276779 【發明内容】 本發明之脈衝式渦電流檢測數據溫度校正方法與設 備，其主要係可以校正溫度對於脈衝式渦電流檢測數： 產生的誤差，適用於表面溫度不均㈣設備或管線 測’可將溫度差異對於脈衝式渦電流檢測數據所 ς 差降至可接受的範圍（5%)之内。 風 本發明所提出的脈衝式渦電流檢測數據 法係應用參考點與_點的㈣率與導 S = =艮，校正參考點與檢測點的⑽^ d: =(L、、"refaref)/、Ui^'in A ··檢測所得原始厚度值； :校正後檢測點厚度值； 、I· ^ : ί Ϊ茶考點溫度與在檢測點溫度的數值; *二二，、率在參考點溫度與在檢測點溫度的數值。 若:磁率率的數據無法取得時，則使用下列經驗函數： ώ = + 0. 001085 (r_^/} 3 上列A式中7；e/與；；為參考點位與檢測點的溫度；And the light 51^ motion 'shape lang_ path. This number of filaments moves in a concentric circle. The flow direction of the eddy current is flat with the winding direction of the coil, and it is always proportional to the alternating current of the coil. The degree is proportional to the strength of the magnetic field. The frequency interacts with the coil. It is active in the magnetic field, and the magnetic field is similar. The eddy current itself also produces a magnetic field, the square ΐ == opposite (Lenz's law), its size and the product of the conductor, 丄 = off. The eddy current magnetic field can partially cancel the existence of the coil magnetic field defect, and the direction of the eddy current will prepare the eddy current generated by the corpuscle due to the magnetic field reaction; :change. The inductance, the magnetic field of the coil, and most of the eddy 5 1276779 ^ current is concentrated on the surface of the conductor. This phenomenon is called the skin effect. It belongs to the current and the degree decreases rapidly with increasing depth. During the eddy current detection process, there are many variables that affect the wheeled signals, such as conductivity, permeability, coupling distance, frequency adjustment, quality conditions, geometry, dimensional changes, and so on. Stress changes, vibration conditions, environment, disturbances, temperature changes, edge effects, etc., so that meaningful signals are obscured or misjudged. During execution, you must understand and master the various variables that may exist to obtain reliable data. • The pulsed eddy current detection system generates a pulse-like eddy current by continuously switching the direction of the current direction to generate a pulsating eddy current, which induces eddy currents on the surface. According to Lenz's law, when the direction of the magnetic field is changed, the eddy current opposite to the direction of the magnetic field will be induced. At a sufficient parental magnetic field strength, the resulting eddy current will spread from the surface of the workpiece to the bottom. When the field eddy current is spread from the surface of the workpiece to the bottom, a field corresponding to ^ is generated. When the magnetic field penetrates the receiving coil on the probe, it will cause the coil to produce _' this - the induced current and signal are measured and amplified, and the result of the leaf out detection is feasible. Monthly eddy current duration (Γ) and conductivity (external magnetic permeability (A) test: the square of the thickness of the workpiece is measured, as shown in formula (1). When performing, a reference point is selected on the workpiece to determine the material/material permeability. With the conductivity multiplied by, /, his detection points will be calculated according to this reference point as a standard. ~σά Cl) r eddy current duration, unit · · milliseconds (four) is the thickness of the workpiece inspection position, unit · · public PCT Con conductivity (Conductivity) 6 1276779 Permeability, pulsed 'current measurement technology has been widely used in refining and chemical plant equipment testing, equipment manufacturers and testers for the thickness of the coating, subject 'Bei】The influence of the material, the missing material and the special condition of the vibration condition is well understood, and the correction compensation method has been developed; however, since most of the inspection objects in the past are on the equipment or pipeline with uniform surface temperature, never Pay attention to the influence of temperature. 6 From the experience of past real field detection, when the temperature of the surface of the device is not uniform, the error of local position detection and verification results often exceeds 5%, and some error values. Even more than 15%. When the temperature of the equipment is between room temperature and 28 (rc), the difference in surface temperature exceeds 20T, the thickness of the test will exceed ±2% (estimated by 5% of the equipment test deviation, considering the sensitivity of the equipment itself is 2%, and Assuming that the error caused by other other impact factors is 1%, the temperature difference must have an impact on the detection of less than ±2%. This phenomenon is especially the case with heat exchangers because the surface temperature of the heat exchanger is not uniform. The temperature difference is more than 2 〇. 〇 Above. The wrong test result will cause the wrong judgment of the equipment's residual condition, and even lead to unnecessary shutdown maintenance, which will seriously affect the operation and operational efficiency. If the pulsed eddy current is applied to the surface temperature When the device is not evenly detected, the error correction method must be found, otherwise the detection result has no meaning. It can be known from formula (1) that the eddy current intensity is related to the product of the magnetic permeability and conductivity of the ferromagnetic material, when the device under test When the surface temperature is uneven, the magnetic permeability and the conductivity change due to the temperature change, which leads to an error in the detection result; therefore, the product of the permeability and the conductivity The relationship between the temperature changes can be used to develop the temperature correction function, and then the function is developed to develop the calibration tool. 7 1276779 SUMMARY OF THE INVENTION The pulse eddy current detection data temperature correction method and device of the present invention are mainly capable of correcting the temperature. For pulsed eddy current detection: The error generated is suitable for surface temperature unevenness. (4) Equipment or pipeline measurement' can reduce the temperature difference to the acceptable range (5%) of the pulsed eddy current detection data. The pulsed eddy current detection data method proposed by the present invention applies the (four) rate and the guide S ==艮 of the reference point and the _ point, and corrects the reference point and the detection point of (10)^d: =(L,, "refaref ) /, Ui ^ 'in A · · The original thickness value obtained by the test; : the thickness of the detection point after correction; , I· ^ : ί 考 tea test point temperature and the value at the detection point temperature; * 22, the rate is in reference Point temperature and the value at the temperature of the detection point. If the data of the magnetic rate rate cannot be obtained, the following empirical function is used: ώ = + 0. 001085 (r_^/} 3 7 in the above formula A; e/ and ;; The temperature of the reference point and the detection point;
Ie t上：：：出的脈衝式渦電流檢測數據溫度校正設 =由兩偶、一條數據輸入導線、一個手動材質輸 入裔、二個類比/數位轉換器（A/D Converter)、-個内 含溫度校正函數的微處理機計算器（M i α叩歐_)、 與-個y顯不四組數據（參考點溫度、測試點溫度、原始 數據、权正數據）的數據顯示器所組成，可經由導線與脈 衝式渦電流檢測儀器連接，將原始測試數據輸入，然後依 據翏考點與峨點的溫麵錢行校正，最後將校正結果 Γ276779 - 直接顯示於顯示器上。 【實施方式】 首先，請參閱第一圖所示，本發明溫度校正方法，其 數據校正係依據導磁率與導電率的乘積在參考點溫度與 在檢測點溫度的比值的平方根： dm — dm\_ C jU ref (7 re f^) /(^ jU m (7 ώ:檢測所得原始厚度值； :校正後檢測點厚度值； 7^〆脈衝式渦電流檢測參考點位置的溫度； ® 7；:檢測點的溫度； #導磁率在參考點溫度與在檢測點溫度的數值； iTW、π/導電率在參考點溫度與在檢測點溫度的數值。 校正方法如下： (1) 若Αν及7；皆大於280°C且小於500°C，則無需進行 厚度補償及校正。 (2) 若7^及7；皆位處常溫至280°C間，且相差10°C以 上，則校正方式如下： 馨 dm = dm\^ jU ref (7 ref、/Q jU m d Λ:檢測所得原始厚度值 ώ，：校正後檢測點厚度值 (3) 若7^及7V中其一為大於280°C，則視為等同於 280°C，依據上列公式進行校正。 其中導磁率//d與導電率在參考點 溫度與在檢測點溫度的數值無法取得時，則使用下列經驗 函數取代： d/ =ώ[1 + 0. 001085 ( 7；-T„/)] 1276779 • ώ:檢測所得原始厚度值； :校正後檢測點厚度值； 7^/:脈衝式渦電流檢測參考點位置的溫度； 7；:檢測點的溫度。 而請再參閱第二圖所示，本發明溫度校正設備，則是 由檢測點溫度輸入裝置（1)、參考點溫度輸入裝置（2)、厚 度檢測數據輸入裝置（3)、材質代號輸入裝置（4)、溫度校 正計算裝置（5)、數據輸出與結果顯示裝置（6)等六個部分 所組成，其中： ® 該檢測點溫度輸入裝置（1)，其係由一個熱電偶與類 比/數位轉換器組成，熱電偶可將檢測點溫度轉換成類比 訊號，經類比/數位轉換器轉換成數位訊號後輸至溫度校 正計算裝置（5); 該參考點溫度輸入裝置（2)，其係由一個熱電偶與類 比/數位轉換器組成，熱電偶可將參考點溫度轉換成類比 訊號，經類比/數位轉換器轉換成數位訊號後輸至溫度校 正計算裝置（5); • 該厚度檢測數據輸入裝置（3)，其係由一條數據訊號 導線與類比/數位轉換器組成，數據訊號導線直接與脈衝 式渦電流檢測儀器相連，將厚度檢測所得的類比數據輸 入，此類比訊號載經類比/數位訊號轉換器轉換成數據訊 號輸至溫度校正計算裝置（5); 該材質代號輸入裝置（4)，其係為一個可由手動方式 將材質代號輸入的數字鍵盤，使用者可利用此鍵盤將材質 代號輸入至溫度校正計算裝置（5); 該溫度校正計算裝置（5)，其係為一個微處理機計算 10 Γ276779 器’内含在各種材質在不同溫度下^材料的導電率與導磁 率的數據資料庫與計算公式，且連接至數據輸出與結果顯 示裝置（6)以將計算結果予以顯示出。可依據材質代號輸 入鍵盤所輸入的代號、參考點與測試點的溫度，在資料庫 中找出所需數據，再依據下列關係式，校正脈衝式渦電流 檢測儀器所測得的原始厚度數據： dm dH jUrefCJ re^)/、jUm(7 A' Λ :檢測所得原始厚度值； Λ':校正後檢測點厚度值； ® Aw、///導磁率在參考點溫度與檢測點溫度的數值； Θ 〃/、ί7 〃 ·導電率在爹考點溫度與檢測點溫度的數 值。 該數據輸出與結果顯示裝置（6)，其係為一個數位顯 示器，可顯示參考點溫度、檢測點溫度、原始檢測數據與 才父正後的檢測數據。 其中數據校正部份中導磁率與導電率 (θ /·(?/、^7 在蒼考點溫度與在檢測點溫度的數值無法取得 # 時，則使用下列經驗函數取代： d/ =ώ[1 + 0. 001085 ( 7；-7,,/)] ώ:檢測所得原始厚度值； ά':校正後檢測點厚度值； 7^厂脈衝式渦電流檢測參考點位置的溫度； 7；:檢測點的溫度。 本發明於實際操作施行方式如下： 1.現場檢測步驟 (1)首先將第一條熱電偶穿透所欲測試的設備的包覆材 11 1276779 料或包/盈材料，直接與設備表面接觸，以取得設備 表面的貫際溫度的類比訊號，再經類比/數位轉換器 轉換成數位訊號後，輸至溫度校正微處理機中； (2) 將第二條熱電偶與參考點相連接，已取得參考點的 μ度，的類比訊號，再經類比/數位轉換器轉換成數 位成號後’輸至溫度校正微處理機； (3) 將輪入導線與脈衝式渦電流檢測設備相連接，直接 將厚度的原始測試數據類比訊號輸入，再經類比/ 數位轉換器轉換成數位訊號後輸至溫度校正微處理 機中； (4) 以手動方式將材質代號輸入由手動輸入鍵盤輸至溫 度校正微處理機鐘； ⑴校正微處理機内含不同材質在不同溫度下的導磁率 與導電率的數據資料庫與補償及校正函數。校正程 序如下： Α評估設備是何能產生非均溫的狀況，並了解可 能溫度範圍。 Β脈衝式渦電流檢測參考點位置的溫度為及各 檢測點的溫度為7；。 C若U 7；皆大於28(rc且小於5〇吖（此為本設 備原廠規範操作上限），則無需進行厚度補償及校 正。 D若“及7；皆位處常溫至28代間，且相差靡 以上，則校正方式如下： 么’ =(L\、UrefGred/、jumam)Yn (2) A :檢測所得原始厚度值 12 1276779 ά,:校正後檢測點厚度值 導磁率在參红溫度與在檢測 的數值； 〜、〜·導電率在參考點溫度與在檢測點溫度 的數值。 若導磁率與導電率的數據無法取得時，則使 用下列經驗函數·· d/ =ώ[1+0. 001085 (L-Tref)] ⑶Ie t::: pulsed eddy current detection data temperature correction setting = two pairs, one data input wire, one manual material input, two analog/digital converters (A/D Converter), one A microprocessor with a temperature correction function (M i α 叩 _), and a y display of four sets of data (reference point temperature, test point temperature, raw data, positive data), a data display, It can be connected to the pulsed eddy current testing instrument via wire, input the original test data, and then correct according to the temperature point of the test point and the defect point. Finally, the calibration result Γ276779 - directly displayed on the display. [Embodiment] First, referring to the first figure, the temperature correction method of the present invention is based on the square root of the ratio of the product of the permeability and the conductivity at the reference point temperature to the temperature at the detection point: dm - dm\ _ C jU ref (7 re f^) /(^ jU m (7 ώ: original thickness value detected; : corrected detection point thickness value; 7^〆 pulsed eddy current detection reference point position temperature; ® 7; : temperature of the detection point; #magnetic permeability at the reference point temperature and the value at the detection point temperature; iTW, π/conductivity at the reference point temperature and the value at the detection point temperature. The calibration method is as follows: (1) If Αν and 7 If both are greater than 280 ° C and less than 500 ° C, thickness compensation and correction are not required. (2) If 7^ and 7; both are at room temperature to 280 ° C, and the difference is more than 10 ° C, the correction method is as follows : 馨dm = dm\^ jU ref (7 ref, /Q jU md Λ: original thickness value detected ώ,: thickness of the detected point after correction (3) If one of 7^ and 7V is greater than 280 °C, It is regarded as equivalent to 280 ° C, and is corrected according to the above formula. The magnetic permeability / / d and the conductivity are at the reference point temperature. If the value at the temperature of the detection point cannot be obtained, the following empirical function is used instead: d/ =ώ[1 + 0. 001085 ( 7;-T„/)] 1276779 • ώ: The original thickness value is detected; Check point thickness value; 7^/: pulse eddy current detection reference point position temperature; 7;: detection point temperature. Please refer to the second figure, the temperature correction device of the present invention is determined by the detection point temperature Input device (1), reference point temperature input device (2), thickness detection data input device (3), material code input device (4), temperature correction calculation device (5), data output and result display device (6), etc. It consists of six parts, among which: ® The detection point temperature input device (1) consists of a thermocouple and an analog/digital converter. The thermocouple converts the detection point temperature into an analog signal, analog/digital conversion. The device converts the digital signal into a temperature correction computing device (5); the reference point temperature input device (2) is composed of a thermocouple and an analog/digital converter, and the thermocouple converts the reference point temperature into an analogy Signal Converted into a digital signal by an analog/digital converter and then input to a temperature correction computing device (5); • The thickness detection data input device (3) consists of a data signal conductor and an analog/digital converter, the data signal conductor Directly connected with the pulsed eddy current detecting instrument, the analog data obtained by the thickness detection is input, and the analog signal is converted into a data signal by the analog/digital signal converter and sent to the temperature correction computing device (5); the material code input device ( 4), which is a numeric keypad that can be manually input into the material code, and the user can use the keyboard to input the material code to the temperature correction calculation device (5); the temperature correction calculation device (5) is a The microprocessor calculates 10 Γ 276779 'data library and calculation formula containing conductivity and permeability of various materials at different temperatures, and is connected to the data output and result display device (6) to calculate the calculation result Shows. According to the material code, input the code of the keyboard, the reference point and the temperature of the test point, find the required data in the database, and correct the original thickness data measured by the pulse eddy current testing instrument according to the following relationship: Dm dH jUrefCJ re^)/, jUm(7 A' Λ : original thickness value detected; Λ': thickness of the detected point after correction; ® Aw, /// magnetic permeability at the reference point temperature and the temperature of the detection point; Θ 〃/, ί7 〃 · Conductivity at the temperature of the test point and the temperature of the detection point. The data output and result display device (6), which is a digital display, can display the reference point temperature, the detection point temperature, the original detection The data and the test data of the father and the father. Among them, the magnetic permeability and conductivity in the data correction part (θ / · (? /, ^7) when the temperature of the test site and the temperature at the detection point cannot obtain #, the following The empirical function replaces: d / = ώ [1 + 0. 001085 ( 7; -7,, /)] ώ: the original thickness value detected; ά ': the thickness of the detection point after correction; 7 ^ factory pulse eddy current detection Temperature at the reference point position; 7;: temperature at the detection point The actual operation of the present invention is as follows: 1. On-site detection step (1) First, the first thermocouple is penetrated through the coating material 11 1276779 material or package/profit material of the device to be tested, directly with the surface of the device. Contact to obtain an analog signal of the ambient temperature of the surface of the device, and then convert it into a digital signal by an analog/digital converter, and then input it to the temperature correction microprocessor; (2) connect the second thermocouple to the reference point , the analog signal of the μ degree of the reference point has been obtained, and then converted into a digital correction by the analog/digital converter, and then sent to the temperature correction microprocessor; (3) the wheeled wire and the pulsed eddy current detecting device are Connect, directly input the original test data of the thickness analog signal, and then convert it into digital signal by analog/digital converter and input it to the temperature correction microprocessor; (4) Manually input the material code input by manual input keyboard to Temperature-corrected microprocessor clock; (1) Correct the data database and compensation and correction function of the magnetic permeability and conductivity of different materials at different temperatures in the microprocessor. The calibration procedure is as follows : Α Evaluate how the device can generate non-equal temperature conditions and understand the possible temperature range. 温度 Pulse eddy current detection reference point temperature and the temperature of each detection point is 7; C if U 7; are greater than 28 (rc and less than 5〇吖 (this is the original operating limit of the equipment), no thickness compensation and correction are required. D If “and 7; all positions are between room temperature and 28 generations, and the difference is more than ,, then the correction method As follows: ???' = (L\, UrefGred /, jumam) Yn (2) A: The original thickness value of the test is 12 1276779 ά,: the thickness of the test point after the correction is measured at the red temperature and the detected value; ~· Conductivity is the reference point temperature and the value at the detection point temperature. If the data of magnetic permeability and conductivity cannot be obtained, the following empirical function is used. · d/ =ώ[1+0. 001085 (L-Tref)] (3)
E若L及7；中其一為大於28〇t：，則視為等同於 280 C後依據公式（2)或（3)進行校正。 2 ·現场檢測應用 (1)摘要E If L and 7; one of them is greater than 28〇t:, it is regarded as equivalent to 280 C and then corrected according to formula (2) or (3). 2 · On-site inspection application (1) Abstract
•將本發明應用於兩座熱交換器的殼側（shell side)厚度檢測結果後，再與超音波檢測數據相比 較，發現脈衝式渦電流檢測所得的原始數據誤差介於 2· 6%至9%之間，其中半數超過5%可接受的誤差範圍。 然而經本發明校正後，可將誤差降於〇1%至4%之間， 全部低於可接受的誤差範圍（5%)之内。 (2) 目的 為驗證本研究結果於設備檢查應用上之適用 性’實際於工廠内挑選可應用本研究結果之設備進行 脈衝式渦電流檢測，並配合該設備大修停爐檢查時之 超音波測厚結果為標準，藉以比較於溫差影響下脈衝 式渦電流檢測結果修正前後與設備實際狀況之誤差。 (3) 檢测對象及設計條件說明 本檢測工作共針對兩座熱交換器的殼側（she 11 13 1276779 ~ side)進行檢測，各熱交換器基本資料及製程條件如 下：• Applying the present invention to the shell side thickness detection results of the two heat exchangers, and comparing with the ultrasonic detection data, it is found that the original data error obtained by the pulsed eddy current detection is between 2.6 and 6%. Between 9%, half of them exceed 5% acceptable error range. However, after correction by the present invention, the error can be reduced to between %1% and 4%, all below the acceptable error range (5%). (2) The purpose is to verify the applicability of the results of this study in equipment inspection applications. Actually, the equipment that can apply the results of this study can be selected for pulsed eddy current testing in the factory, and the ultrasonic wave test when the equipment is overhauled and shut down. The thick result is the standard, so as to compare the error of the pulsed eddy current detection result with the actual condition of the equipment before and after the temperature difference. (3) Test object and design condition description The test work is carried out on the shell side of the two heat exchangers (she 11 13 1276779 ~ side). The basic data and process conditions of each heat exchanger are as follows:
A. 熱交換器I 材質：A285-C 包覆厚度：80mm 殼侧設計厚度：9. 0mm 設計溫度：280°CA. Heat exchanger I Material: A285-C Coating thickness: 80mm Shell side design thickness: 9. 0mm Design temperature: 280 °C
B. 熱交換器II 材質：A285-C ® 包覆厚度：80mmB. Heat exchanger II Material: A285-C ® Coating thickness: 80mm
殼侧設計厚度：12. 7mm 設計溫度：280°C 該熱交換器I、II構造示意圖如第三圖所示。 (4 )檢測規劃 有關脈衝式渦電流檢測位置規晝，在器身軸向上 為自殼側進口端開始每50公分檢測一處，而周向為 每處均分四點，即每90°檢測一點。檢測規劃示意圖 Φ 如第四圖所顯示。 (5) 檢測結果 檢查結果如第五圖與第六圖所顯示，因考量溫度 量測及後分析作業，故檢測執行時以脈衝式渦電流檢 測點與保溫孔位置相同者為參考點。 (6) 結果效正及比對 A設備溫度量測 依據熱交換器進出口管線溫度計指示，熱交換器 I殼側進口溫度為232°C，出口溫度171°C，溫差約 14 1276779 61°C ;而熱交換器π殼側進口溫度為245°C，出口 溫度197°C，溫差約48°C。但僅依設備進出口溫度 資料並無法準確推估各檢測位置溫度分佈情形，故 以咼溫溫度計於設備外部保溫材開孔處進行溫度 量測，再行對各點進行分析，各量測點溫度紀錄與 PEC檢測點之對應如第七圖與第八圖所顯示。 B 4双查結果於修正前後誤差比較說明 針對已知PEC檢測結果和溫度的測點，依據現 %仏測步驟中的公式（2 )或（3 )進行校正，所得結果 如第九圖與第十圖所示。 C與超音波厚度檢測結果相比較 依據停爐大修時，應用超音波設備所檢測的參 考點厚度為100%，然後換算各點百分比，其結果與 脈衝式渦電流原始檢測數據及校正後結果相比。未 校正的數據誤差介於2· 6%至9%之間，經本發明校 正後，誤差介於0· 1%至4%之間，低於可接受的誤 差範圍（5%)。各檢測位置誤差百分比如第圖 • 與第十二圖所示。 ° 纟示上所述，本發明實施例確能達到所預期之使用功 效，又其所揭露之具體構造，不僅未曾見諸於同類產品 中’亦未冒公開於申請前，誠已完全符合專利法之規定與 要求，爰依法提出發明專利之申請，懇請惠予審查，並賜 准專利，則實感德便。 — 、 15 1276779 【圖式簡單說明】 第一圖：本發明之溫度校正流程圖 第二圖：本發明之溫度校正設備示意圖 第三圖：本發明之熱交換器I、II構造示意圖 第四圖：本發明之檢測規劃示意圖 第五圖：本發明之脈衝式渦電流檢測結果（熱交換器I) 第六圖：本發明之脈衝式渦電流檢測結果（熱交換器II) 第七圖：本發明之溫度測量紀錄（熱交換器I) 第八圖：本發明之溫度測量紀錄（熱交換器II) 第九圖：本發明之結果修正紀錄（熱交換器I) 第十圖：本發明之結果修正紀錄（熱交換器II) 第十一圖：本發明之結果比對（熱交換器I) 第十二圖：本發明之結果比對（熱交換器II) 【主要元件符號說明】 (1) 檢測點溫度輸入裝置 (2) 參考點溫度輸入裝置 (3) 厚度檢測數據輸入裝置 (4) 材質代號輸入裝置 (5) 溫度校正計算裝置 (6) 數據輸出與結果顯示裝置 16Shell side design thickness: 12. 7mm Design temperature: 280 ° C The schematic diagram of the heat exchanger I, II is shown in the third figure. (4) The inspection plan is related to the pulse eddy current detection position specification. In the axial direction of the body, one position is detected every 50 cm from the inlet end of the shell side, and the circumferential direction is divided into four points, that is, every 90°. a little. Schematic diagram of inspection plan Φ As shown in the fourth figure. (5) Test results The inspection results are shown in the fifth and sixth figures. Because the temperature measurement and the post-analysis operation are considered, the pulse eddy current detection point and the position of the thermal insulation hole are the same as the reference point during the detection execution. (6) Results and comparison The temperature measurement of the A equipment is based on the indication of the heat exchanger inlet and outlet line thermometer. The inlet temperature of the shell side of the heat exchanger I is 232 ° C, the outlet temperature is 171 ° C, and the temperature difference is about 14 1276779 61 ° C. The heat exchanger π shell side inlet temperature is 245 ° C, the outlet temperature is 197 ° C, the temperature difference is about 48 ° C. However, it is not possible to accurately estimate the temperature distribution of each detection location based on the temperature information of the inlet and outlet of the equipment. Therefore, the temperature measurement is performed at the opening of the external thermal insulation material of the equipment by means of a temperature thermometer, and then the points are analyzed, and the measurement points are measured. The correspondence between the temperature record and the PEC detection point is as shown in the seventh and eighth figures. B 4 double check results before and after correction error comparison description for the known PEC test results and temperature measurement points, according to the current % test step in the formula (2) or (3) to correct, the results are as shown in Figure IX and Ten figures are shown. C is compared with the ultrasonic thickness detection result. According to the shutdown overhaul, the reference point thickness detected by the ultrasonic device is 100%, and then the percentage of each point is converted. The result is compared with the pulsed eddy current raw detection data and the corrected result. ratio. The uncorrected data error is between 2.6 and 9%. After correction by the present invention, the error is between 0.1% and 4%, which is below the acceptable error range (5%). The percentage error of each detection position is shown in Figure 1 and Figure 12. According to the above description, the embodiment of the present invention can achieve the expected use efficiency, and the specific structure disclosed therein has not been seen in the same kind of products, and has not been disclosed before the application, and has completely complied with the patent. The provisions and requirements of the law, the application for invention patents in accordance with the law, and the application for review, and the grant of patents, are really sensible. —, 15 1276779 [Simplified description of the drawings] First: Flow chart of temperature correction according to the present invention Second figure: Schematic diagram of temperature correction device of the present invention Third figure: Schematic diagram of the structure of heat exchangers I and II of the present invention : FIG. 5 is a schematic diagram of the detection plan of the present invention: the pulsed eddy current detection result of the present invention (heat exchanger I). FIG. 6 is a pulsed eddy current detection result of the present invention (heat exchanger II). Temperature measurement record of the invention (heat exchanger I) Fig. 8: Temperature measurement record of the present invention (heat exchanger II) Fig. 9: Correction record of the result of the invention (heat exchanger I) Fig. 11: The present invention Result Correction Record (Heat Exchanger II) Figure 11: Comparison of Results of the Invention (Heat Exchanger I) Twelfth Figure: Comparison of Results of the Invention (Heat Exchanger II) [Explanation of Main Component Symbols] ( 1) Detection point temperature input device (2) Reference point temperature input device (3) Thickness detection data input device (4) Material code input device (5) Temperature correction calculation device (6) Data output and result display device 16