TWI268115B - The diaphragm chip of a silicon-based microphone and its manufacturing method - Google Patents
The diaphragm chip of a silicon-based microphone and its manufacturing method Download PDFInfo
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1268115 九、發明說明: 【發明所屬之技術領域】 本發明是有關於_種晶片 石夕微麥克風之晶片的製造方法。^特別種 【先前技術】 自從第-顆利用石夕晶片所完成 由於石夕晶片具有體積小、,見風七表後, P姑n、1 I,利用半導體與微機電製 釭技術可以精確的控制尺寸、 ^ ^ 圖像,亚可以批次生產、忐 研究與製造日益廣泛/ 4錢點,因此㈣麥克風的 利时晶片所完成的额麥克風具有極多的 服::也;在著許多梦晶片製程上的問題需要加以克 t ^ "^日片都必須進行體蝕刻(bulk etchmg)製程,形成矽微麥克 .的日日片所必備的「振膜 (dmphragm)」與「氣室( 朕1268115 IX. DESCRIPTION OF THE INVENTION: TECHNICAL FIELD OF THE INVENTION The present invention relates to a method of manufacturing a wafer of a wafer wafer. ^Special species [prior art] Since the first use of Shi Xi wafer is completed because the Shi Xi wafer has a small volume, after seeing the wind seven tables, P n, 1 I, using semiconductor and micro-electromechanical technology can be accurate Controlling the size, ^ ^ image, sub-production, 忐 research and manufacturing is increasingly widespread / 4 money points, so (4) microphones for the time-based microphones have a lot of clothes:: also; in many dreams The problem in the wafer processing process needs to be carried out. ^^ The film must be subjected to a bulk etchmg process to form the "dmphragm" and "air chamber" necessary for the Japanese film. I
SdP >»」等構造;而需要推荇 =:?多广刻的過程越長,製程也就越“ :L: 質也因而變異較大,製程良率也就 又例如,當經過多數道半導體製程過程,例如微影技 術、蝕刻技術、蒸(濺)鍍技術..等 ' 予I備成晶圓(wafer)後 ,再切割(sawing)」成複數晶片 因振動、摩擦等因素損及單一晶片之「振膜」、厂氣室」等 構造,而導致整體製程良率的降低。 因此,如何整體設計石夕微來* 克風及其相關製程,以提 ⑧SdP >»" and other structures; and need to push =:? The longer the process is, the more the process will be: "L: the quality is also more variable, and the process yield is, for example, when the majority passes. Semiconductor process, such as lithography, etching, steaming (splash) plating, etc. After the wafer is wafered, it is sawn into a plurality of wafers due to vibration, friction and other factors. The structure of the "diaphragm" and the factory air chamber of a single wafer causes a reduction in overall process yield. Therefore, how to design the overall design of Shi Xiwei to the wind and its related processes to mention 8
1268115 什日日片成品品質、製寇_良產,AAA X, li=> T=f , 貝I柱艮羊,攸而提昇矽微麥克風的 際應用,是業界、學界一直努力的目標。 、 【發明内容】 因此,本發明之目的,即在提供一種無須進行切割, 即可將製備成之晶圓分離取得複數晶片切微麥克 膜晶片:製造方法’以及由此方法所製得的振膜晶片。'^ 於是,本發明矽微麥克風之振膜晶片的製造方法, 含以下步驟: / ’匕 、/a)在一基板以可溶於預定蝕刻液之被溶蝕材料定義 ⑴在該脫離層上以絕緣材料定義一分隔塊層 絕緣且可對應聲能作用而產生形變之材料定義一振臈層。 (〇在該振臈層上以導體材料定義一種晶臈,‘以古 分子材料定義-犧牲層’該犧牲層對應地遮覆該振膜^ -感應形變區域的部分’並使該種晶膜對應環圍該心層 之感應形變區域的一環壁區域的部分裸露。 曰 ⑷以導體材料自該種晶膜對應該環壁區域裸露 分向上增厚成一環圍該犧牲層的_,該種晶膜的二 固層共同定義成作為電極之環壁。 "牙 广)移除該犧牲層,該環壁、振膜層與該分隔塊層共 同形成一振膜晶片。 ' 曰/、 ⑴以蝕刻液溶蝕該脫離層而使該振膜晶片盥 相分離,製得該振膜晶片。 土孜 此外,以上述製造方法所製得本發明矽微麥克風之振 1268115 膜晶片,封裝於界定出一封裝空間的殼座中,而與該殼座 一可將電容變化轉換成電壓變化的場效電晶體,及一封裝 於封裝空間中的背板共同構成該矽微麥克風,該背板包括 一由導體材料形成的導體層、一由駐極體材料形成在該導 體層上並帶電荷之駐極體層,及一穿通該導體層與該駐極 體層的音孔圖像,該導體層與該殼座相間隔地連結而共同 疋義出一供氣流流動的氣室,該振膜晶片包含一分隔塊層 、一振獏層,及一環壁。 該分隔塊層以絕緣材料形成,與該背板相連結。 該振膜層以絕緣材料形成,與該分隔塊層相連結,使 該振膜層、分隔塊層與該背板共同界定出一藉由該音孔圖 像與該氣室相通之振動空間。 該環壁與該振膜層相連結並作為電極,具有一以導體 材料形成在該振膜層上的種晶膜,及一以導體材料自該種 晶膜增厚形成的撐固層,該環壁與該駐極體層共同構成對 應該振膜層被該撐固層圈界成之一振膜,因聲能作用產生 對應形變而變化的電容。 【實施方式】 有關本發明之前述及其他技術内容、特點與功效,在 以下配合餐考圖式之_個較佳實施例的詳細說明中,將可 清楚的呈現。 在本發明被詳細描诚^ θ 细迅之則,要注意的是,在以下的說 月内今中類似的兀件是以相同的編號來表示。 1 夕微麥克風4之振膜晶片7的製造方 1268115 法的一較佳實施例,是可製傷出如圖2所示的振膜晶片7; 並配合如圖3所述的矽微麥克風4的製造方法所述,可封 裝製備成如圖4所示的石夕微麥克風4。 首先參閱圖4,矽微麥克風4包含一殼座5、一場效電 晶體(FET) 1〇〇、-背板6,及_振膜晶片7。1268115 The quality of finished products, 寇 ,, AAA X, li=> T=f, the shell of the I-pillar, and the application of the micro-microphone, is the goal of the industry and the academic community. SUMMARY OF THE INVENTION Accordingly, it is an object of the present invention to provide a wafer-cut microchip film wafer obtained by separating a prepared wafer without cutting, a manufacturing method, and a vibration method obtained by the method. Film wafer. Thus, the method for manufacturing a diaphragm wafer of the micro-microphone of the present invention comprises the following steps: / '匕, /a) is defined on a substrate as a material to be dissolved which is soluble in a predetermined etching liquid (1) on the release layer The insulating material defines a vibrating layer that defines a material that is insulated by a block layer and that is deformable in response to the action of acoustic energy. (〇 定义 定义 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该Correspondingly, a portion of a ring wall region surrounding the inductive deformation region surrounding the core layer is exposed. 曰 (4) is thickened by a conductor material from the seed film corresponding to the exposed portion of the ring wall region to form a ring surrounding the sacrificial layer. The two solid layers of the film are collectively defined as a ring wall of the electrode. The tooth layer, the diaphragm layer and the separator layer together form a diaphragm wafer. '曰/, (1) The diaphragm wafer was phase-separated by etching the release layer with an etching solution to obtain the diaphragm wafer. In addition, the vibrating 1268115 film wafer of the micro-microphone of the present invention is prepared by the above manufacturing method, and is packaged in a housing defining a package space, and the housing can convert the capacitance change into a field of voltage change. An effect transistor, and a backplane encapsulated in the package space, together comprise the micro-microphone, the backplane comprising a conductor layer formed of a conductor material, and an electret material formed on the conductor layer and charged An electret layer, and a sound hole image passing through the conductor layer and the electret layer, the conductor layer being spaced apart from the housing to collectively define a gas chamber for airflow, the diaphragm wafer comprising a separator layer, a vibrating layer, and a ring wall. The spacer layer is formed of an insulating material and is coupled to the backing plate. The diaphragm layer is formed of an insulating material and is coupled to the partition layer such that the diaphragm layer and the partition layer together with the backboard define a vibration space communicating with the air chamber through the sound hole image. The ring wall is coupled to the diaphragm layer and serves as an electrode, and has a seed film formed on the diaphragm layer by a conductor material, and a support layer formed by thickening the conductor material from the seed film. The ring wall and the electret layer together form a capacitance corresponding to the diaphragm of the diaphragm layer being bounded by the supporting layer, and the corresponding deformation is changed by the action of the acoustic energy. [Embodiment] The above and other technical contents, features and effects of the present invention will be apparent from the following detailed description of the preferred embodiments of the accompanying drawings. In the detailed description of the present invention, it should be noted that in the following description, similar components are denoted by the same reference numerals. 1 Manufacture of the diaphragm wafer 7 of the micro-microphone 4, a preferred embodiment of the method 1268115, can produce a diaphragm wafer 7 as shown in FIG. 2; and cooperate with the micro-microphone 4 as shown in FIG. As described in the manufacturing method, the Shixi micro-microphone 4 shown in FIG. 4 can be packaged. Referring first to Fig. 4, the micro microphone 4 includes a housing 5, a field effect transistor (FET) 1 〇〇, a back plate 6, and a diaphragm wafer 7.
殼座5由一封裝基板51及一罩殼52配合組裝而成。 封裝基板51由2片PCB板組成,形成包括一表面511、一 相反於表面511的底面512、一設置於表面511與底面512 之間的電路佈局513,及—形成在表面511的凹槽514。 罩殼52包括一供聲波穿通之頂壁521,及一自頂壁 52i向下延伸之周壁522,頂壁521與周壁522共同界定出 一具有-封裝π 523的封裝空間524,封裝基板51可與周 壁522内壁面相連結以封閉封裝口 523。 場效電晶體100封裝於封裝基板51的凹槽514中並與 电路佈局513形成電連接,用以將電容變化轉換成電壓變 化0 背板6包括-以導體材料形成的導體層6卜一以叫 體材料形成在導體層61上的駐極體層62,及—穿通導體^ 61與駐極體層62的音孔圖像63,導體層61與封裝基板' 表面511的預定區域相連結’並與凹肖514$置場^土電晶; 1 〇 〇後之剩餘空間界定屮供翁古、、六& 门介疋出仏孔机机動的氣室41,駐極體^ 62並寫入有電荷。 同時配合參閱圖2,振膜晶片7具有-分隔塊層71 —自分隔塊層71向上形成的振膜層72,及—自振膜層, 1268115 向上形成的環壁73。 〜ΓΛ層λ以絕緣材料形成,並具有預定圖像,連置 於振膜7上。在此以二相間陪日# 為例說明。 4〜且截面略成U字型的長條塊 振膜層7 2以絕緣且可對廡舞> J對應弇迠作用而產生形變的材料 形成,連結在分隔塊層71上,包 匕祜截面成凹凸皺折態樣The housing 5 is assembled by a package substrate 51 and a cover 52. The package substrate 51 is composed of two PCB boards, and includes a surface 511, a bottom surface 512 opposite to the surface 511, a circuit layout 513 disposed between the surface 511 and the bottom surface 512, and a recess 514 formed on the surface 511. . The cover 52 includes a top wall 521 for sound wave passage, and a peripheral wall 522 extending downward from the top wall 52i. The top wall 521 and the peripheral wall 522 together define a package space 524 having a package π 523. The package substrate 51 can be The inner wall surface of the peripheral wall 522 is coupled to close the sealing opening 523. The field effect transistor 100 is packaged in the recess 514 of the package substrate 51 and electrically connected to the circuit layout 513 for converting the capacitance change into a voltage change. The backplane 6 includes a conductor layer 6 formed of a conductor material. The electret layer 62 formed on the conductor layer 61, and the sound hole image 63 of the through conductor 61 and the electret layer 62, and the conductor layer 61 is connected to a predetermined region of the surface 511 of the package substrate 'and Concave Shaw 514$ Set the field ^ 电 晶; 1 剩余 之 之 之 之 屮 翁 翁 翁 翁 翁 翁 翁 翁 翁 翁 翁 翁 翁 翁 翁 翁 翁 翁 翁 翁 翁 翁 翁 翁 翁 翁 翁 翁 翁 翁 翁 翁 翁 翁 翁 翁 翁. 2, the diaphragm wafer 7 has a spacer layer 71 - a diaphragm layer 72 formed upward from the spacer layer 71, and a ring wall 73 formed upward from the diaphragm layer 1268115. The ΓΛ layer λ is formed of an insulating material and has a predetermined image and is attached to the diaphragm 7. Here is an example of the two-phase inter-day #. The long block diaphragm layer 7 2 having a U-shaped cross section is formed of a material which is insulated and can be deformed by the action of the 庑 & J , , , , , , , , , , , , , , , , Cross section into a concave and convex wrinkle
的感應形變區域721,及-環圍此感應形變區域721的環壁 區域m ’振膜層72 μ應形變區域721即為石夕微麥克風 4用以感應聲能並產生對應形變的振膜721,振膜層μ之 感應形變區域721、分隔塊層71與背板6共同界定出一藉 由音孔圖像63與氣室41相通之振動空間42,供振膜^ 被聲能作用時形變之用。 %壁73以導體材料形成作為電極之用,而與導體層 ,同構成對應振膜721因聲能作用產生對應形變而變化的 電谷。環壁73包括一形成在振膜層72上的種晶膜731,及 一自種晶膜731上對應環壁區域722增厚形成的撐固層732 ,撐固層732並與罩殼52内壁面相頂連以作為接地之用。 當外界的聲能穿透過罩殼52的頂壁521作用到振膜晶 片7的振膜721時’振膜721相對應地產生形變,而使得 月板6與振膜721的間距產生變化,也就是使得作為電極 之用的環壁73與導體層61共同構成的電容產生對應變化 ’場效電晶體1〇〇將此電容變化轉換成電壓變化後,經由 電路佈局513傳輸以供後續運算使用。 上述的矽微麥克風4與振膜晶片7,再配合圖1與圖3 9 ⑧ 1268115 所示的製造過程說明後,當可更清楚地明白。The inductive deformation region 721, and the ring wall region m surrounding the inductive deformation region 721, the diaphragm layer 72 μ should be the deformation region 721, which is the diaphragm 721 used by the Shixi microphone 4 to induce acoustic energy and generate corresponding deformation. The sensing deformation region 721 of the diaphragm layer μ and the partitioning layer 71 and the backing plate 6 jointly define a vibration space 42 that communicates with the air chamber 41 through the sound hole image 63, and is deformed when the diaphragm is applied by the acoustic energy. Use. The % wall 73 is formed of a conductor material as an electrode, and forms a voltage valley corresponding to the conductor layer 721 which changes in response to deformation due to the action of acoustic energy. The ring wall 73 includes a seed film 731 formed on the diaphragm layer 72, and a reinforcing layer 732 formed by thickening the corresponding ring wall region 722 from the seed film 731, and the reinforcing layer 732 and the inner wall of the casing 52. The top of the surface is connected for grounding. When the external sound energy penetrates through the top wall 521 of the casing 52 and acts on the diaphragm 721 of the diaphragm wafer 7, the diaphragm 721 is deformed correspondingly, and the spacing between the moon plate 6 and the diaphragm 721 is changed. That is, the capacitance formed by the ring wall 73 as the electrode and the conductor layer 61 is changed correspondingly. The field effect transistor 1 converts this capacitance change into a voltage change, and then transmits it via the circuit layout 513 for subsequent operations. The above described micro-microphone 4 and diaphragm wafer 7 can be more clearly understood after the description of the manufacturing process shown in Figs. 1 and 3 9 8 12 681.
先參閱圖1,上述振膜晶片7的製作過程,是先進行井 驟η,自石夕晶圓基板表面向下定義出分隔塊圖像(為= 二 =膜晶片7之分隔塊層71截面略成以型的長條塊: :封閉區塊,在此的分隔塊圖像即為二相間隔且截面略成U 子型的凹槽)後,以可被鹽酸溶蝕之鋁為材料,在形成 分隔塊圖像之基板表面向上沉積出—極薄的脫離層LReferring to FIG. 1 , the diaphragm film 7 is fabricated by first performing a well η and defining a partition image downward from the surface of the wafer substrate (for the second layer of the diaphragm layer 7 of the film wafer 7). A slightly elongated block: : a closed block, where the image of the partition block is a two-phase groove with a U-shaped cross section, and is made of aluminum that can be dissolved by hydrochloric acid. The surface of the substrate forming the image of the spacer is deposited upward - an extremely thin release layer L
接著進行形成振膜層72與分隔塊層71的步驟12。此 步驟是先在脫離層21上對應於分隔塊圖像的區域,以絕緣 材料定義出分隔塊層7卜使得分隔塊層71具有對應於奸 塊圖像之態樣(即環圍且截面略成U字型的封閉區塊),^ 以銘(Α1)為材料向上定義出皺折圖像後,接著,以 :可^聲能作用而產生形變之材料,定義出遮覆皺折圖 刀塊層,及未被赦折圖像、分隔塊層遮覆而裸露之 脫離層的振膜層72,使得振膜層72之感應形變區域721的 截::ί皺折圖像而產生凹凸皺折態樣’以作為感應聲能 亚對應產生形變的振膜72丨使用。 然後進行步驟13,在振膜層72上以導體材料如絡/金 Cr/Au)定義蒸鍍出作為後續長晶晶種的種晶膜731後, =Γ材料,如光阻在種晶膜731上定義出對應地遮 復㈣層72的感應形變區域721,同時,形成種晶膜731 對應壤壁區域722之部分區域裸露的犧牲層22。、 接著繼續進行步驟14,選用導體材料,例如錄,自種 晶膜⑶對應環壁區域722的裸露部分向上電鑛增厚成環Next, the step 12 of forming the diaphragm layer 72 and the spacer layer 71 is performed. This step is to first define the partition layer 7 with an insulating material on the area of the release layer 21 corresponding to the image of the partition block, so that the partition layer 71 has a pattern corresponding to the image of the patch (ie, the circle and the section are slightly U-shaped closed block), ^ After defining the wrinkle image with the material of Ming (Α1), then, the material can be deformed by the action of sound energy, and the wrinkle cutter is defined. The block layer, and the diaphragm layer 72 of the detached layer which is not covered by the folded image and the partition block layer, causes the interception of the inductively deformed region 721 of the diaphragm layer 72 to crease the image The folded pattern 'is used as a diaphragm 72 that is used to induce deformation in response to acoustic energy. Then, in step 13, after the seed film 731 as a subsequent crystal seed crystal is vapor-deposited on the diaphragm layer 72 with a conductor material such as a complex/gold Cr/Au, the germanium material, such as a photoresist, is formed on the seed film. A sensing deformation region 721 corresponding to the (four) layer 72 is correspondingly defined on 731, and a sacrificial layer 22 in which the seed film 731 corresponds to a portion of the locus region 722 is formed. Then, proceeding to step 14, the conductor material is selected, for example, the self-cultivating film (3) corresponding to the exposed portion of the annular wall region 722 is thickened into a ring.
10 1268115 圍犧牲層22的撐固層— 口層732’而-成由種晶膜731與撐固層 732 /、同構成並作為電極用的環壁73。 然後進行步驟15,以對應於步驟13的光阻撥除劑(pR 移除犧牲層22,此時,已由環壁73、㈣層^ ”刀塊層71共同構成與基板相連結的振臈晶片7。 在此要特別加以說明的是,由於環壁73主要是導體材 枓’特別都是金屬材料構成,而振膜層72與犧牲層22又 分別以不同性質的材料定義形成,因此,在此步驟中’可 以在不溶姓影響到振膜層72、環壁73結構的狀況下 钱刻移除犧牲層22,進而可以精確地掌控此「姓刻」製程 〇 最後進行步驟16,以鹽酸溶㈣銘為材料形成的脫離 _21 ’同時鹽酸也會一併溶蚀移除以銘為材料形成的皺折 圖':即可無須進行切割,而使振膜晶片7與基板相分離 ’而‘得卜的振膜晶片7,同時基板也可再次回收利用。 在此钱_是,脫離層21切以選料對應被緩衝 X石夕㈣液(刪)溶㈣二氧切為㈣形成,原本以 1材料所形成的皺折圖像也需改以二氧化石夕為材料形成 田'、、、/驟16則需更改為以被緩衝氧化矽蝕刻液(BQE )進行,而在耗犧牲層22、脫離層21缝折圖像後,即 可無須進行切割,而直接製得振膜晶片7。 卜振M日日^的製法’亦不限囿於上述的製法,而 :在基板上應用微影技術定義出如圖5所示之對應分隔 塊層π與振膜層722的感應形變區域(振膜”21的凹凸 1268115 圖像8後,再於形成有凹凸圖像8的基板上依序定義出 脫離層21、分隔塊層71、振膜層72與環壁73後,再溶钱 ,牲層22與脫離層21,而製得振膜晶片7。當然,若是預 ^製備之振膜晶片7的振膜721是屬於平板式振膜時,則 可以省略以定義出皺折圖像或是將基板定義出凹凸圖像8 的過程,而製備振膜721呈平杯能嫌沾工4 曰 派朕/21呈千板恶樣的平板式振膜的振膜10 1268115 The support layer-to-mouth layer 732' of the sacrificial layer 22 is formed into a ring wall 73 for the electrode by the seed film 731 and the anchor layer 732. Then, step 15 is performed to correspond to the photoresist removal agent of step 13 (pR removes the sacrificial layer 22, at this time, the ring wall 73, the (four) layer ^" block layer 71 collectively constitutes a vibration connected to the substrate. Wafer 7. It should be particularly noted that, since the ring wall 73 is mainly composed of a conductor material 枓', particularly a metal material, and the diaphragm layer 72 and the sacrificial layer 22 are respectively defined by materials of different properties, therefore, In this step, the sacrificial layer 22 can be removed in the condition that the insoluble name affects the structure of the diaphragm layer 72 and the ring wall 73, so that the "last name" process can be accurately controlled. Finally, step 16 is performed to hydrochloric acid. Dissolved (4) is the material formed by the detachment _21 'At the same time, the hydrochloric acid will also be dissolved and removed to remove the wrinkle pattern formed by the material': the diaphragm wafer 7 can be separated from the substrate without cutting. The diaphragm film 7 can be obtained, and the substrate can be recycled again. In this case, the separation layer 21 is cut to select the material corresponding to the buffered X Shi Xi (4) liquid (deletion) dissolved (tetra) dioxo (4), originally The wrinkle image formed by 1 material also needs to be changed to dioxide For the formation of the material, the fields ', ', and / / 16 need to be changed to be buffered cerium oxide etching solution (BQE), and after the sacrificial layer 22 and the release layer 21 are sewn into the image, the cutting is not required. The diaphragm wafer 7 is directly produced. The method of Bu Zhen M 日日^ is not limited to the above-mentioned method, but the lithography technique is applied on the substrate to define the corresponding spacer layer π and vibration as shown in FIG. After the inductive deformation region of the film layer 722 (the unevenness 1268115 image 8 of the diaphragm 21), the release layer 21, the spacer layer 71, the diaphragm layer 72 and the ring are sequentially defined on the substrate on which the uneven image 8 is formed. After the wall 73, the film 22 and the release layer 21 are further dissolved, and the diaphragm wafer 7 is obtained. Of course, if the diaphragm 721 of the diaphragm 7 prepared in advance is a flat diaphragm, it may be omitted. The process of defining a wrinkle image or defining a concave-convex image 8 on a substrate, and preparing a diaphragm of the diaphragm 721 in a flat cup can be used for the flat diaphragm of the 曰 曰 / 21 membrane
晶片7,提供另一態樣的振膜晶片7供消費選擇,由於此等 相關變化僅屬_晶片7結構態樣的不同,其製造過程雖 有k化,然亦大同小異,故在此不再多加贅述。 當製備完成石夕微麥克風4之主要構造-振膜晶片7後 ,即可進行如圖3所示之矽微麥克風4的製造。 &百先進行步驟31,備妥如圖4所示具有封裝基板51與 罩成52的喊座5、背板6,及如圖2所示的振膜晶片7。在 J中月板6疋先將駐極體材料製成的薄膜連結在以導 體材料製成的薄片上,製成具有駐極體層62及導體層Μ :背板基材後,以例如微機電技術在背板基材上形成穿通 :板基材的音孔圖像63,並將電荷寫入於駐極體層62後製 :寻’而由於背6的製法眾多,也大多具有不同的專利保 4,在此不再多加舉例說明背板的製作方式。 接著進仃步驟32,將場效電晶體100對應地封裝於封 裝基板51的凹槽514中,並與電路佈局513形成電連接。 然後進行步驟33,將振膜晶片7以環壁73頂連罩殼 5頂土 521的内壁面,而封置入封裝空間〇 再進行步驟34,將背板6以駐極體層62朝向振膜晶片 12 ⑧ 1268115 7地封置入封裝空間524中,而使背板6與振臈晶片7的分 隔塊層71相連結,同時使振膜晶片7之振膜層72、分隔塊 層71與背板ό共同界定出振動空間42。 “ 最後進行步驟35,將封裝基板51以封置有場效電晶體 100之凹槽514朝向背板6,且使封裝基板51之表面川頂 連於背板6地與周壁5 2 2連結以封閉封裝口 5 2 3,並使凹槽 514容置場效電晶體1⑻之剩餘空間形成藉背板6之音孔^ 像63與振動空間42相通的氣室41,而完成石夕微麥克風* 的製備。 由上述說明可知,本發明主要是利用技術成熟的黃光 微影,並配合蒸鍍與電鍍,簡單地一體定義出振膜晶片7 的結構,並同時配合材料對應的犧牲$ 22,以精準的护制 钮刻掏空犧牲層33同時不損及其他構造的過程,以製備形 成在基板上的振膜晶片7,之後,再應用脫離技術溶钮脫離 層21以分離取得振膜晶片7,並重複回收基板利用,不但 同時避免體蝕刻製程較不易精確掌控的缺點,同時又可免 於因切割造成振膜晶片7結構損壞的缺點,而確實提高振 膜晶片7的品質與製程良率。 此外,本發明以此振膜晶片7,配合具有駐極體層62 的背板6,以及可將場效電晶體!⑼埋設其中的殼座5配合 ’在將振膜曰曰“ 7與背板6封裝入殼座5中以製得矽微麥 克風4的同時,架構出麥克風所必備,供氣流流動的「氣 至41」、供振膜721形變所需的「振動空間42」,以及將聲 能轉換成電容變化的「背駐極式電容」等結構,不但能以 ⑧ 1268115The wafer 7 provides another mode of the diaphragm wafer 7 for consumption selection. Since these related changes are only different from the structural form of the wafer 7, the manufacturing process is k-shaped, but it is similar, so it is no longer More details. When the main structure of the Shihua micro-microphone 4, the diaphragm wafer 7, is prepared, the manufacture of the micro-microphone 4 as shown in Fig. 3 can be performed. <First, step 31 is performed, and a shim 5 having a package substrate 51 and a cover 52, a back plate 6, and a diaphragm 7 as shown in Fig. 2 are prepared as shown in Fig. 4. In J, the moon plate 6 连结 first joins a film made of an electret material to a sheet made of a conductor material, and has an electret layer 62 and a conductor layer Μ: a backing substrate, for example, a microelectromechanical device. The technique forms a punch-through image on the backing substrate: the sound hole image 63 of the board substrate, and writes the electric charge on the electret layer 62 to be made: and because the back 6 has a large number of methods, most of them have different patents. 4, here is no more to illustrate the way the backplane is made. Next, in step 32, the field effect transistor 100 is correspondingly packaged in the recess 514 of the package substrate 51 and electrically connected to the circuit layout 513. Then, in step 33, the diaphragm wafer 7 is connected to the inner wall surface of the top wall 521 of the casing 5 by the ring wall 73, and is sealed into the package space. Then, the step 34 is performed, and the back plate 6 is oriented toward the diaphragm with the electret layer 62. The wafer 12 8 1268115 is sealed into the package space 524, and the back plate 6 is coupled to the spacer layer 71 of the vibrating wafer 7, while the diaphragm layer 72, the spacer layer 71 and the back of the diaphragm wafer 7 are backed. The plates together define a vibration space 42. The final step 35 is to connect the package substrate 51 to the back plate 6 with the recess 514 of the field effect transistor 100, and connect the surface of the package substrate 51 to the back plate 6 to connect with the peripheral wall 52 2 . The sealing port 5 2 3 is closed, and the recess 514 accommodates the remaining space of the field effect transistor 1 (8) to form a gas chamber 41 communicating with the vibration space 42 through the sound hole 63 of the back plate 6, thereby completing the Shixi micro microphone* According to the above description, the present invention mainly utilizes the mature yellow light lithography, and cooperates with vapor deposition and electroplating to simply define the structure of the diaphragm wafer 7 in an integrated manner, and at the same time, the material corresponding to the sacrifice of $22, with precision. The protective button engraves the sacrificial layer 33 while not damaging the process of other structures to prepare the diaphragm wafer 7 formed on the substrate, and then applying the disengagement button release layer 21 to separate the diaphragm wafer 7 and Repeated recycling of the substrate can not only avoid the disadvantage that the body etching process is difficult to accurately control, but also avoid the disadvantage of structural damage of the diaphragm 7 due to the cutting, and indeed improve the quality and process yield of the diaphragm 7 . The diaphragm film 7 of the present invention is matched with the back plate 6 having the electret layer 62, and the housing 5 in which the field effect transistor! (9) is embedded is matched with the package of the diaphragm 7 and the back plate 6. Into the housing 5 to make the micro-microphone 4, the microphone is necessary for the airflow, the "gas to 41" for the airflow, the "vibration space 42" required for the deformation of the diaphragm 721, and the conversion of the sound energy. Structures such as "back electret capacitors" that change capacitance can not only be 8 1268115
,同時也 之矽微麥克風的消費選擇 以單晶片或雙晶片直接定義出 電容」等結構後,再封裝而成 而確實達到本發明的創作目的 处惟以上所述者,僅為本發明之較佳實施例❿已,當不 :以此限疋本發明實施之範圍,即大凡依本發明巾請專利 範圍及發明說明内容所作之簡單的等效變化與㈣,皆仍 屬本發明專利涵蓋之範圍内。 【圖式簡單說明】 圖1疋一流程圖,說明本發明矽微麥克風之振膜晶片 的製造方法的一較佳實施例; 圖2是一結構示意圖’說明以圖丨本發明矽微麥克風 之振膜晶片的製造方法所製得的振膜晶片; 圖3是一流程圖,說明配合圖丨本發明矽微麥克風之 振膜晶片的製造方法所製得的振膜晶片,封裝製備成一矽 微麥克風; 圖4是一結構示意圖,說明以圖3的製造過 的矽微麥克風;及 、于 圖5是一結構示意圖,說明先將基板定義出凹凸圖像 以製備敵折式的振膜。 ⑧ 1268115At the same time, the consumption selection of the micro-microphone is directly defined by a single chip or a dual-chip, and then packaged to achieve the purpose of the present invention, but only the above. The preferred embodiment is not limited to the scope of the present invention, that is, the simple equivalent changes and (4) of the patent scope and the description of the invention according to the invention are still covered by the patent of the present invention. Within the scope. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a flow chart showing a preferred embodiment of a method for fabricating a diaphragm wafer of a micro-microphone according to the present invention; FIG. 2 is a schematic structural view illustrating the micro-microphone of the present invention. The diaphragm wafer produced by the method for manufacturing the diaphragm wafer; FIG. 3 is a flow chart showing the diaphragm wafer prepared by the method for manufacturing the diaphragm wafer of the micro-microphone of the present invention, and the package is prepared into a micro FIG. 4 is a schematic structural view showing the manufactured micro-microphone of FIG. 3; and FIG. 5 is a schematic structural view showing that the substrate is first defined as a concave-convex image to prepare an enemy-shaped diaphragm. 8 1268115
【主要元件符號說明】 100 * ^ 場效電晶體 513 * 11 4 s, 步驟 514 * 12…* 步驟 52… 13…♦ 步驟 521 * 14…, 步驟 522 · 15…, 步驟 523 * 16* 步驟 524 ^ 21 ^ ^ ^ 脫離層 6… 22…, 犧牲層 61… 31… 步驟 62、· 32…' 步驟 63… 33…, 步驟 7… 34* •步驟 71… 35…, > 步驟 72… * * f 矽微麥克風 721 * 41… 氣室 振膜) 42* -振動空間 722 * 5… ^ 殼座 73·. 51… •封裝基板 731 * 511 * ,表面 732 « 512 * • 底面 8… 電路佈局 凹槽 罩殼 頂壁 周壁 封裝口 封裝空間 背板 導體層 駐極體層 音孔圖像 振膜晶片 分隔塊層 振膜層 感應形變區域( 環壁區域 環壁(電極) 種晶版 撐固層 凹凸圖像 15 ③[Description of main component symbols] 100 * ^ Field effect transistor 513 * 11 4 s, step 514 * 12...* Step 52... 13...♦ Step 521 * 14..., Step 522 · 15..., Step 523 * 16* Step 524 ^ 21 ^ ^ ^ Disengagement layer 6...22..., sacrificial layer 61... 31... Step 62, · 32...' Step 63... 33..., Step 7... 34* • Step 71... 35..., > Step 72... * * f 矽Microphone 721 * 41... Air chamber diaphragm) 42* - Vibration space 722 * 5... ^ Housing 73·. 51... • Package base 731 * 511 * , surface 732 « 512 * • Bottom 8... Circuit layout concave Slot cover shell top wall peripheral wall package port package space backplane conductor layer electret layer sound hole image diaphragm wafer spacer block diaphragm layer induced deformation region (ring wall region ring wall (electrode) seed plate support layer bump map Like 15 3
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Cited By (4)
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TWI457269B (en) * | 2007-09-19 | 2014-10-21 | Wolfson Microelectronics Plc | Mems device and process |
TWI466814B (en) * | 2007-09-19 | 2015-01-01 | Wolfson Microelectronics Plc | Mems device and process |
TWI469912B (en) * | 2008-09-25 | 2015-01-21 | United Microelectronics Corp | Structure of mems electroacoustic transducer and fabricating method thereof |
US9783408B2 (en) | 2008-09-19 | 2017-10-10 | United Microelectronics Corp. | Structure of MEMS electroacoustic transducer |
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TWI457269B (en) * | 2007-09-19 | 2014-10-21 | Wolfson Microelectronics Plc | Mems device and process |
TWI466814B (en) * | 2007-09-19 | 2015-01-01 | Wolfson Microelectronics Plc | Mems device and process |
US9783408B2 (en) | 2008-09-19 | 2017-10-10 | United Microelectronics Corp. | Structure of MEMS electroacoustic transducer |
TWI469912B (en) * | 2008-09-25 | 2015-01-21 | United Microelectronics Corp | Structure of mems electroacoustic transducer and fabricating method thereof |
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