TWI266894B - Laser beam pattern generator having rotating scanner compensator and method - Google Patents

Laser beam pattern generator having rotating scanner compensator and method

Info

Publication number
TWI266894B
TWI266894B TW091133654A TW91133654A TWI266894B TW I266894 B TWI266894 B TW I266894B TW 091133654 A TW091133654 A TW 091133654A TW 91133654 A TW91133654 A TW 91133654A TW I266894 B TWI266894 B TW I266894B
Authority
TW
Taiwan
Prior art keywords
laser beam
rotating scanner
substrate
pattern generator
rotating
Prior art date
Application number
TW091133654A
Other languages
English (en)
Other versions
TW200300498A (en
Inventor
Enrique Rodrigo Agorio
Original Assignee
Applied Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Applied Materials Inc filed Critical Applied Materials Inc
Publication of TW200300498A publication Critical patent/TW200300498A/zh
Application granted granted Critical
Publication of TWI266894B publication Critical patent/TWI266894B/zh

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70383—Direct write, i.e. pattern is written directly without the use of a mask by one or multiple beams
    • G03F7/704—Scanned exposure beam, e.g. raster-, rotary- and vector scanning
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20—Exposure; Apparatus therefor
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N1/00—Scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission; Details thereof
    • H04N1/04—Scanning arrangements, i.e. arrangements for the displacement of active reading or reproducing elements relative to the original or reproducing medium, or vice versa
    • H04N1/047—Detection, control or error compensation of scanning velocity or position

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Lasers (AREA)
TW091133654A 2001-11-16 2002-11-18 Laser beam pattern generator having rotating scanner compensator and method TWI266894B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/991,251 US6697096B2 (en) 2001-11-16 2001-11-16 Laser beam pattern generator having rotating scanner compensator and method

Publications (2)

Publication Number Publication Date
TW200300498A TW200300498A (en) 2003-06-01
TWI266894B true TWI266894B (en) 2006-11-21

Family

ID=25537022

Family Applications (1)

Application Number Title Priority Date Filing Date
TW091133654A TWI266894B (en) 2001-11-16 2002-11-18 Laser beam pattern generator having rotating scanner compensator and method

Country Status (6)

Country Link
US (1) US6697096B2 (zh)
EP (1) EP1449031A2 (zh)
JP (1) JP4349908B2 (zh)
KR (1) KR100943545B1 (zh)
TW (1) TWI266894B (zh)
WO (1) WO2003044602A2 (zh)

Families Citing this family (46)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0325803D0 (en) * 2003-11-05 2003-12-10 Renishaw Plc Method of scanning
US7906722B2 (en) * 2005-04-19 2011-03-15 Palo Alto Research Center Incorporated Concentrating solar collector with solid optical element
US7765949B2 (en) * 2005-11-17 2010-08-03 Palo Alto Research Center Incorporated Extrusion/dispensing systems and methods
US7799371B2 (en) * 2005-11-17 2010-09-21 Palo Alto Research Center Incorporated Extruding/dispensing multiple materials to form high-aspect ratio extruded structures
US20070169806A1 (en) * 2006-01-20 2007-07-26 Palo Alto Research Center Incorporated Solar cell production using non-contact patterning and direct-write metallization
US20070107773A1 (en) * 2005-11-17 2007-05-17 Palo Alto Research Center Incorporated Bifacial cell with extruded gridline metallization
US8057463B2 (en) * 2006-04-07 2011-11-15 Amo Development, Llc. Adaptive pattern correction for laser scanners
US7855335B2 (en) 2006-04-26 2010-12-21 Palo Alto Research Center Incorporated Beam integration for concentrating solar collector
US7638708B2 (en) * 2006-05-05 2009-12-29 Palo Alto Research Center Incorporated Laminated solar concentrating photovoltaic device
US7851693B2 (en) * 2006-05-05 2010-12-14 Palo Alto Research Center Incorporated Passively cooled solar concentrating photovoltaic device
US8322025B2 (en) * 2006-11-01 2012-12-04 Solarworld Innovations Gmbh Apparatus for forming a plurality of high-aspect ratio gridline structures
US7922471B2 (en) * 2006-11-01 2011-04-12 Palo Alto Research Center Incorporated Extruded structure with equilibrium shape
US7780812B2 (en) * 2006-11-01 2010-08-24 Palo Alto Research Center Incorporated Extrusion head with planarized edge surface
US8226391B2 (en) * 2006-11-01 2012-07-24 Solarworld Innovations Gmbh Micro-extrusion printhead nozzle with tapered cross-section
US20080116183A1 (en) * 2006-11-21 2008-05-22 Palo Alto Research Center Incorporated Light Scanning Mechanism For Scan Displacement Invariant Laser Ablation Apparatus
US20080116182A1 (en) * 2006-11-21 2008-05-22 Palo Alto Research Center Incorporated Multiple Station Scan Displacement Invariant Laser Ablation Apparatus
US7638438B2 (en) 2006-12-12 2009-12-29 Palo Alto Research Center Incorporated Solar cell fabrication using extrusion mask
US7928015B2 (en) * 2006-12-12 2011-04-19 Palo Alto Research Center Incorporated Solar cell fabrication using extruded dopant-bearing materials
US20080186593A1 (en) * 2007-02-02 2008-08-07 Sol Focus, Inc. Metal trace fabrication for optical element
US7954449B2 (en) * 2007-05-08 2011-06-07 Palo Alto Research Center Incorporated Wiring-free, plumbing-free, cooled, vacuum chuck
US7999175B2 (en) * 2008-09-09 2011-08-16 Palo Alto Research Center Incorporated Interdigitated back contact silicon solar cells with laser ablated grooves
US7952783B2 (en) * 2008-09-22 2011-05-31 Microvision, Inc. Scanning mirror control
US7948668B2 (en) * 2008-09-26 2011-05-24 Microvision, Inc. Scanning mirror control having least mean square tone adder
US20100117254A1 (en) * 2008-11-07 2010-05-13 Palo Alto Research Center Incorporated Micro-Extrusion System With Airjet Assisted Bead Deflection
US8117983B2 (en) * 2008-11-07 2012-02-21 Solarworld Innovations Gmbh Directional extruded bead control
US20100221435A1 (en) * 2008-11-07 2010-09-02 Palo Alto Research Center Incorporated Micro-Extrusion System With Airjet Assisted Bead Deflection
US20100118081A1 (en) * 2008-11-07 2010-05-13 Palo Alto Research Center Incorporated Dead Volume Removal From An Extrusion Printhead
US9150966B2 (en) * 2008-11-14 2015-10-06 Palo Alto Research Center Incorporated Solar cell metallization using inline electroless plating
US8080729B2 (en) * 2008-11-24 2011-12-20 Palo Alto Research Center Incorporated Melt planarization of solar cell bus bars
US20100130014A1 (en) * 2008-11-26 2010-05-27 Palo Alto Research Center Incorporated Texturing multicrystalline silicon
US20100139754A1 (en) * 2008-12-09 2010-06-10 Palo Alto Research Center Incorporated Solar Cell With Co-Planar Backside Metallization
US8960120B2 (en) * 2008-12-09 2015-02-24 Palo Alto Research Center Incorporated Micro-extrusion printhead with nozzle valves
US20100139756A1 (en) * 2008-12-10 2010-06-10 Palo Alto Research Center Incorporated Simultaneously Writing Bus Bars And Gridlines For Solar Cell
US20100206356A1 (en) * 2009-02-18 2010-08-19 Palo Alto Research Center Incorporated Rotational Trough Reflector Array For Solar-Electricity Generation
US20100206302A1 (en) * 2009-02-18 2010-08-19 Palo Alto Research Center Incorporated Rotational Trough Reflector Array For Solar-Electricity Generation
US20100206357A1 (en) * 2009-02-18 2010-08-19 Palo Alto Research Center Incorporated Two-Part Solar Energy Collection System With Replaceable Solar Collector Component
US20100206379A1 (en) * 2009-02-18 2010-08-19 Palo Alto Research Center Incorporated Rotational Trough Reflector Array With Solid Optical Element For Solar-Electricity Generation
KR100952201B1 (ko) * 2009-07-10 2010-04-09 주식회사 엘에스텍 레이저를 이용한 패턴형성장치
US20110083728A1 (en) * 2009-10-14 2011-04-14 Palo Alto Research Center Incorporated Disordered Nanowire Solar Cell
US20110100418A1 (en) * 2009-11-03 2011-05-05 Palo Alto Research Center Incorporated Solid Linear Solar Concentrator Optical System With Micro-Faceted Mirror Array
US20110100419A1 (en) * 2009-11-03 2011-05-05 Palo Alto Research Center Incorporated Linear Concentrating Solar Collector With Decentered Trough-Type Relectors
US20110216401A1 (en) * 2010-03-03 2011-09-08 Palo Alto Research Center Incorporated Scanning System With Orbiting Objective
US8263899B2 (en) * 2010-07-01 2012-09-11 Sunpower Corporation High throughput solar cell ablation system
US8962424B2 (en) 2011-03-03 2015-02-24 Palo Alto Research Center Incorporated N-type silicon solar cell with contact/protection structures
KR20210014835A (ko) 2019-07-30 2021-02-10 삼성디스플레이 주식회사 레이저 결정화 장치 및 이를 이용한 폴리실리콘층을 갖는 기판 제조방법
CN111781562B (zh) * 2020-07-03 2023-03-31 西安长远电子工程有限责任公司 一种机械扫描雷达设置静默区域的方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4002830A (en) 1975-01-22 1977-01-11 Laser Graphic Systems Corporation Apparatus for compensating for optical error in a rotative mirror
US4796038A (en) 1985-07-24 1989-01-03 Ateq Corporation Laser pattern generation apparatus
JP2761744B2 (ja) 1988-12-01 1998-06-04 旭光学工業株式会社 走査式描画装置のポリゴンミラー分割面倒れに基づく走査ビーム補正装置
US5386221A (en) 1992-11-02 1995-01-31 Etec Systems, Inc. Laser pattern generation apparatus
IL105188A (en) * 1993-03-28 1998-02-08 Scitex Corp Ltd scanner
US5999302A (en) * 1997-06-27 1999-12-07 Speedring Systems, Inc. Polygon scanner having a fluid film bearing and active correction of cross-scan and in-scan errors
US6084706A (en) 1997-07-09 2000-07-04 Etec Systems, Inc. High efficiency laser pattern generator

Also Published As

Publication number Publication date
TW200300498A (en) 2003-06-01
KR20040054778A (ko) 2004-06-25
JP4349908B2 (ja) 2009-10-21
WO2003044602A3 (en) 2004-01-29
EP1449031A2 (en) 2004-08-25
KR100943545B1 (ko) 2010-02-22
US20030095175A1 (en) 2003-05-22
US6697096B2 (en) 2004-02-24
JP2005535104A (ja) 2005-11-17
WO2003044602A2 (en) 2003-05-30

Similar Documents

Publication Publication Date Title
TWI266894B (en) Laser beam pattern generator having rotating scanner compensator and method
KR100700132B1 (ko) 마이크로리소그래픽 기록에서의 빔 위치조정 방법 및 그 장치
JP2005535104A5 (zh)
ATE184123T1 (de) Laser-abtastvorrichtung und abtastverfahren zum lesen von strichcodes
DE50105156D1 (de) Projektionsvorrichtung
KR970049072A (ko) 반도체 노광 장치
NO981964D0 (no) FremgangsmÕte for forbedring av LADAR-oppl÷sning
WO2003060593A2 (en) Multi-beam polygon scanning system
JPH06175055A (ja) スキャニングシステムと、スキャニングシステムのエラー補正方法
KR890016519A (ko) 광학식 기록장치
AU2001214632A8 (en) Scanned display with variation compensation
JPS58221566A (ja) 半導体レ−ザビ−ム駆動方式
GB2043375A (en) Method for driving a light scanning apparatus
JPS6228447B2 (zh)
JPS56156856A (en) Printer
JPH06198955A (ja) 画像品質変動を補償する方法
EP0365182A3 (en) Flat stationary field light beam scanning device
US6693660B2 (en) Method and apparatus for controlling an acousto-optic modulator
KR100346550B1 (ko) 레이저 전사장치
US5191447A (en) Scanning beam control system with translated reference scale
JP3474302B2 (ja) 光ビーム偏向走査装置
WO2003075208A3 (en) Device and method for generating a print image in a laser-marking system
US6118470A (en) Optical scanning system
KR100396707B1 (ko) 레이저 시스템의 레이저 다이오드 광 모듈 장치
KR100396677B1 (ko) 레이저 시스템의 레이저 다이오드 광 모듈 장치

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees