TWI266809B - Sputtering target and manufacturing method therefor - Google Patents
Sputtering target and manufacturing method thereforInfo
- Publication number
- TWI266809B TWI266809B TW094116043A TW94116043A TWI266809B TW I266809 B TWI266809 B TW I266809B TW 094116043 A TW094116043 A TW 094116043A TW 94116043 A TW94116043 A TW 94116043A TW I266809 B TWI266809 B TW I266809B
- Authority
- TW
- Taiwan
- Prior art keywords
- sputtering target
- target
- manufacturing
- method therefor
- backing plate
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/54—Controlling or regulating the coating process
- C23C14/542—Controlling the film thickness or evaporation rate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3435—Target holders (includes backing plates and endblocks)
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Physical Vapour Deposition (AREA)
Abstract
This invention provides a sputtering target for use in making a thin film by sputtering and a method for making the sputtering target. The sputtering target comprises a target, a backing plate, and a bonding agent layer for bonding the target and the backing plate. The bonding agent layer is free from a spacer and has a thickness of within the range of 0.25-2 mm and the bonding surface of the target and the bonding surface of the backing plate are kept substantially parallel with each other.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004148084 | 2004-05-18 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200602507A TW200602507A (en) | 2006-01-16 |
TWI266809B true TWI266809B (en) | 2006-11-21 |
Family
ID=35394174
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094116043A TWI266809B (en) | 2004-05-18 | 2005-05-18 | Sputtering target and manufacturing method therefor |
Country Status (5)
Country | Link |
---|---|
JP (1) | JPWO2005111261A1 (en) |
KR (2) | KR100745437B1 (en) |
CN (1) | CN1842613A (en) |
TW (1) | TWI266809B (en) |
WO (1) | WO2005111261A1 (en) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7550055B2 (en) | 2005-05-31 | 2009-06-23 | Applied Materials, Inc. | Elastomer bonding of large area sputtering target |
JP5198925B2 (en) * | 2008-04-10 | 2013-05-15 | 三井金属鉱業株式会社 | Sputtering target |
JP5289007B2 (en) * | 2008-11-20 | 2013-09-11 | 日東電工株式会社 | Masking pressure-sensitive adhesive sheet and tape, and sputtering target manufacturing method |
JP5385883B2 (en) * | 2010-10-05 | 2014-01-08 | 株式会社神戸製鋼所 | Target assembly |
KR101312412B1 (en) * | 2011-07-04 | 2013-09-27 | 삼성코닝정밀소재 주식회사 | Method for manufacturing sputtering target |
JP7118630B2 (en) * | 2017-12-12 | 2022-08-16 | デクセリアルズ株式会社 | Method for manufacturing a sputtering target |
CN108315699A (en) * | 2018-05-10 | 2018-07-24 | 苏州精美科光电材料有限公司 | A method of it reducing target and misses the target in coating process |
CN112063986A (en) * | 2020-09-17 | 2020-12-11 | 福建阿石创新材料股份有限公司 | Target binding method |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3967067B2 (en) * | 1999-06-15 | 2007-08-29 | 東ソー株式会社 | Sputtering target |
JP2001181834A (en) * | 1999-12-17 | 2001-07-03 | Kojundo Chem Lab Co Ltd | Sputtering target joined body |
JP4419040B2 (en) * | 2001-02-28 | 2010-02-24 | 三菱マテリアル株式会社 | Backing plate |
JP2003155563A (en) * | 2001-11-20 | 2003-05-30 | Tosoh Corp | Long-size, multi-divided ito sputtering target |
JP4000813B2 (en) * | 2001-10-12 | 2007-10-31 | 東ソー株式会社 | Sputtering target |
JP2003147518A (en) * | 2001-11-06 | 2003-05-21 | Mitsui Mining & Smelting Co Ltd | Sputtering target |
-
2005
- 2005-05-17 KR KR1020067003704A patent/KR100745437B1/en not_active IP Right Cessation
- 2005-05-17 KR KR1020077012162A patent/KR20070063050A/en not_active Application Discontinuation
- 2005-05-17 CN CNA2005800010089A patent/CN1842613A/en active Pending
- 2005-05-17 JP JP2006513606A patent/JPWO2005111261A1/en active Pending
- 2005-05-17 WO PCT/JP2005/008965 patent/WO2005111261A1/en active Application Filing
- 2005-05-18 TW TW094116043A patent/TWI266809B/en active
Also Published As
Publication number | Publication date |
---|---|
WO2005111261A1 (en) | 2005-11-24 |
TW200602507A (en) | 2006-01-16 |
CN1842613A (en) | 2006-10-04 |
JPWO2005111261A1 (en) | 2008-03-27 |
KR20070063050A (en) | 2007-06-18 |
KR100745437B1 (en) | 2007-08-02 |
KR20060057620A (en) | 2006-05-26 |
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