1252997 九、發明說明·· 【發明所屬之技術領域】 本發明是有關於一種電孑設備之測試裝置，特別是指 種可自動對電子設備進行測試，而不需手動進行反覆操 作的電子設備之測試裝置。 【先前技術】 參閱圖1所示，是習知/種電子設備的測試方式，該 電子設備5可能是一電腦主機或伺服器等電子裝置之主機 。一般在電子設備5被製造出來時，為了確認電子設備5 的功能及作動是否正常無誤，通常會以手動操作方式，由 一輸入裝置，例如鍵盤4輸入測試資料給電子設備5以進 行功月b /則《式，因此，當待測的電子設備數量龐大、測試資 料很多或必須進行多次測試時，操作者必須反覆地將測試 ’如此一來，不但需要耗費相當多的1252997 IX. OBJECT DESCRIPTION OF THE INVENTION · TECHNICAL FIELD The present invention relates to a test device for an electric power device, and more particularly to an electronic device capable of automatically testing an electronic device without manual repetitive operation. Test device. [Prior Art] Referring to Fig. 1, it is a test method of a conventional electronic device. The electronic device 5 may be a host of an electronic device such as a computer host or a server. Generally, when the electronic device 5 is manufactured, in order to confirm whether the function and the operation of the electronic device 5 are normal, the test data is usually input to the electronic device 5 by an input device, such as the keyboard 4, for manual operation. / Then, "When the number of electronic devices to be tested is large, the test data is large, or the test must be performed multiple times, the operator must repeatedly test the test, so that not only does it take a lot of time."
【發明内容】 資料輸入給電子設错s…丨1七 —，^ _ .此.、. 即在提供一種可自動輸入測試 t果的電子設備之測試裝置。 因此，本發明之目的，即在^ 資料至電子設備並儲存測試結果的 1252997 於是，本發明電子設備之測試裝置是包含— __ 叛入單元 、一記憶單元、一控制單元及一回授單元。該輪入單元是 用以輸入一測試資料及一功能設定。該控制單 于凡連接該輸 入單元及該電子設備，用以接受該輸入單元 、一 ^钿入的該測 試資料和該功能設定。該記憶單元是連接該控制單元用 以儲存經由該控制單元傳送來之該測試資料， 五涊控制早 元是根據該功能設定將儲存在該記憶單元的該測試資料送 至該電子設備以進行測試。該回授單元是連接該電子設備 及該記憶單元，用以將該電子設備之一測試結果送至該記 憶單元儲存。 【實施方式】 有關本發明之前述及其他技術内容、特點與功效，在 以下配合蒼考圖式之兩個較佳實施例的詳細說 清楚的呈現。 ^ 麥閱圖2戶斤*，本發明電子設備之測試裝f丨之第一 較佳實施例主要是包含一 抑— s控制早兀11、一記憶單元I 2、一 回授早元1 3及"一輪入留-1 r 〇*·!_ 早兀15。其中電子設備2可以是一電 腦主機或伺服器等電子裝置之主機。 幸月"ίΐ入早兀 1 5是用丨、7私v、 、 ^入一測試資料及一功能設定給招 制單元11。控制單元u是 疋迷接知入早兀1 5及電子設備2， 以接受^單元15所輪入的測試資料和功能設定。 疋連接控制單S U，用以儲存控制單元] 斤傳送來之測試資料，且批在σ 一 ^ ^ 乜制早兀11是根據功能設定，網 儲存在記憶單元12的測气次士 、°式貝枓頊出並送至電子設備2以 1252997 行測試。回授單元U是連接電子設備2及記憶單元i2，用 以將電子設備2之—測試結果送至記憶單元12儲存。 麥閱圖3所不，本發明電子設備的測試裝置3之第二 車父佳實施例是包含—控 卜立 口。 刺早兀11、一圮fe早元]：2、一回授 早元 1 3、一 示單亓 Ί / 、 、一輸入單兀1 5、—傳輸介面16 及一回授介面17。 侧八平兀P㈣-第一輸入介面15]及一第二輸入^ 152第幸刖入"面151用以輸入一測試資料給控制單天 11，第二輸入介面152用以輸入一功能設定給控制單元} °在本實施例中’該第-輸人介s 151可為_外接之鍵盤 ’而第二輸人介面152係為—内建之鍵盤。且該功能設定 包括測試時間設定、測試次數設定、測試模式設定、測試 開始設定、測試暫停設定及資料清除設定等，其中測試時 巧。又疋係用以纟又疋測试資料被輸入至電子設備2的時間， 測試次數設定是設定測試資料被輸入電子設備2的次數， 亦即設定電子設備2的測試次數。測試模式設定是設定電 子設備在測試過程中發生異常時，是否即自動停止測試， 或疋達到設定之測试次數後才停止測試。測試暫停設定係 令控制單元11暫停對電子設備2的測試，亦即暫停輸出測 試資料給電孑設備2。而資料清除設定則是令控制單元j】 凊除儲存在記憶單元12中之測試資料。 控制單元11連接記憶單元12及電子設備2，以將測試 資料儲存在記憶單元12中，並根據功能設定，讀取儲存在 1己憶單元12中之測試資料並送至電子設備2以進行測試。 1252997 控制單元11包括依序串接的—串列轉並列介面⑴、 -微處理器U2及一並列轉串列介面ιΐ3。其中，串列轉並 列介面1U與第一輸入介連接’用以將第一輸入介面 輪入之H貝料由串列訊號轉成並列訊號後，傳給微處 理“2’以經由微處理器112將測試資料儲存至記憶單元 :”，微處理器112與第二輸入介自152連接，用以接收 弟二輸入介面152輸入之功能設定。i列轉串列介面113與 傳輸介面16連接，以透過傳輸介面16連接電子設備，其 中傳輸介面16可以是P/S2介面或USB介面。 微處：ΐ"在第二輸入介面152 6完成功能設定之後，當 t °° 2收到弟二輸人介面152傳來之測試開始設定訊 二微處理器112即根據第二輸入介面m預先設定之測 4式’讀取料在記憶單元12中之測試資料，並送給並 串113 ’使將測試資料由並列訊號轉成串列訊號 傳輪介面16’以經由傳輸介面16將測試資料送 σ兒十6又備2進行測試。 干回授單元13連接記憶單元12’其經由回授介面17盘 :子设備丨連接，用以將電子設備2之測試結果送至記憶 早兀12。藉此，微處理器112即可根據儲存在記憶單 中之測試結果，比較及判別電子設備2在測 ^ A： w ^ 〜仕1^疋否 ^ 一吊，以進一步判定電子設備2功能不佳之處。農 該回授介面17可以是ρα介面或⑶_琿等 既 之傳輸介面。 ^既有 鮮員不單7L ]4是一液晶顯示器，其與記憶單元12 1252997 ，主要用以顯示電子設備2的運作狀態 '由第一輸入介面 15 1輸入之測試資料、電子設備2在開機過程中進行 P〇ST(P〇wer On Self Test，開機自我測試）時產生之P〇ST碼 ’以及電子設備2之測試結果。測試資料是由微處理器112 傳送至記憶單元12，再經由記憶單元12輸出至顯示單元 14。測4結果和p〇ST則是經由回授單元n送至記憶單元 12，再輪出至顯示單元14。 絲3上述說明可知，本發明之測試裝置3藉 元1 1之Μ處理斋1 12之控制，可由第一輸入介面丨5丨經由 串列轉並列介面ln輸入測試資料給微處理器112，以透過 微處理裔12將測試資料儲存在記憶單元12中。並於測試 電子設備2時，由微處理器112根據第二輸入介面152輸 之力月匕。又疋，自動地碩取儲存在記憶單元】2中的測試資 料，透過並列轉串列介面113及傳輸介面16傳給電子設備 2進行測試，而達到將人力操作轉換為自動化操作之目的， 使得在每一次進行電子設備2之測試時，不須以手動方式 反覆輪入測試資料，故可大大地節省測試人力及時間成本 匕外本赍明之測試裝置2更具有回授測試結果的功能 :其將電子設備2之測試結果經由回授單元13傳送至記憶 早7^ 12儲存，並同時顯示在顯示單元14上，使操作者可 針對測試結果分析電子設備2之功能優劣及失效之原因， 而有助於縮短電子設備2之改良時間。 〜准以上所迷者’僅為本發明之較佳實施例而已，當不 能以此限定本發明實施之範圍，即大凡依本發明申請:利 1252997 範圍及發明說明内容所作之簡單的等效變化與修飾，皆仍 屬本發明專利涵蓋之範圍内。 【圖式簡早說明】 圖1是習知一種電子設備之測試方式的示意圖； 圖2是本發明電子設備之測試裝置的第一較佳實施例 之電路方塊圖；及 圖3是本發明電子設備之測試裝置的第二較佳實施例 之電路方塊圖。 10 1252997 【主要元件符號說明】 卜 測試裝置 14 1 1 控制單元 15 111 串列轉並列介面 151 112 微處理器 152 113 並列轉串列介面 16 12 記憶單元 17 ' 13 - 回授單元 2… 顯示單元 輸入單元 第一輸入介面 第二輸入介面 傳輸介面 回授介面 電子設備SUMMARY OF THE INVENTION The data input to the electronic setting error s...丨1 7 —, ^ _ . This is a test device for providing an electronic device capable of automatically inputting the test t fruit. Therefore, the object of the present invention is to store data to an electronic device and store the test result. Thus, the test device of the electronic device of the present invention comprises a __ treason unit, a memory unit, a control unit and a feedback unit. The wheeling unit is used to input a test data and a function setting. The control unit is connected to the input unit and the electronic device for accepting the input unit, the test data and the function setting. The memory unit is connected to the control unit for storing the test data transmitted via the control unit, and the test element is configured to send the test data stored in the memory unit to the electronic device for testing according to the function setting. . The feedback unit is connected to the electronic device and the memory unit for sending a test result of the electronic device to the memory unit for storage. [Embodiment] The foregoing and other technical contents, features and effects of the present invention will be apparent from the following detailed description of the preferred embodiments of the present invention. ^ 麦看图2 斤*, the first preferred embodiment of the test device of the electronic device of the present invention mainly comprises a s-control sip early 11, a memory unit I 2, a feedback early 1 3 And " one round of entry -1 r 〇*·!_ early 兀15. The electronic device 2 can be a host of an electronic device such as a computer host or a server. Fortunately, the month 1 is for the test unit 11 with 丨, 7 private v, , ^ into a test data and a function. The control unit u is connected to the early detection device 15 and the electronic device 2 to receive the test data and function settings of the unit 15 .疋Connecting control unit SU for storing the test data transmitted by the control unit], and the batch is in σ_^^ 兀 兀 是 11 is based on the function setting, the net is stored in the memory unit 12, the gas meter, ° type Bessie went out and sent to electronic device 2 to test at 1252997 lines. The feedback unit U is connected to the electronic device 2 and the memory unit i2 for sending the test result of the electronic device 2 to the memory unit 12 for storage. Referring to Figure 3, the second embodiment of the test device 3 of the electronic device of the present invention comprises a control port.刺早兀11, 一圮fe早元]: 2, one feedback early Yuan 1 3, one display single Ί / , , an input single 兀 1 5, - transmission interface 16 and a feedback interface 17. The side eight 兀 P (four) - the first input interface 15] and a second input ^ 152 the first enter the " face 151 for inputting a test data to the control day 11 and the second input interface 152 for inputting a function setting To the control unit} ° In the present embodiment, the first input interface 151 can be an external keyboard and the second input interface 152 is a built-in keyboard. And the function setting includes test time setting, test time setting, test mode setting, test start setting, test pause setting and data clear setting, etc., where the test is timely. Further, the time is used to input the test data to the electronic device 2, and the number of test times is set to set the number of times the test data is input to the electronic device 2, that is, the number of times the electronic device 2 is tested. The test mode setting is to set whether the electronic device stops the test automatically when an abnormality occurs during the test, or stops the test after the set number of tests is reached. The test pause setting command causes the control unit 11 to suspend the test of the electronic device 2, i.e., suspends the output of the test data to the power device 2. The data clear setting is to cause the control unit to delete the test data stored in the memory unit 12. The control unit 11 is connected to the memory unit 12 and the electronic device 2 to store the test data in the memory unit 12, and according to the function setting, read the test data stored in the memory unit 12 and send it to the electronic device 2 for testing. . 1252997 The control unit 11 comprises a serial-to-serial parallel interface (1), a microprocessor U2 and a parallel serial interface ιΐ3. Wherein, the serial-to-parallel interface 1U is connected to the first input medium to convert the H-bed material in which the first input interface is rotated into a parallel signal by the serial signal, and then transmitted to the micro-processing "2" via the microprocessor. 112 stores the test data to the memory unit:", the microprocessor 112 is coupled to the second input port 152 for receiving the function setting of the input of the second input interface 152. The i-to-serial interface 113 is coupled to the transport interface 16 for connecting to the electronic device via the transport interface 16, wherein the transport interface 16 can be a P/S2 interface or a USB interface. Micro: ΐ" After the second input interface 152 6 completes the function setting, when t ° ° 2 receives the test from the second input interface 152, the first microprocessor 112 is pre-processed according to the second input interface m. The test data of the type 4 'reading material in the memory unit 12 is set and sent to the string 113 ' to convert the test data from the parallel signal to the serial signal transmission interface 16' to test the data via the transmission interface 16 Send σ children 10 and 2 for testing. The dry feedback unit 13 is connected to the memory unit 12' via a feedback interface 17: sub-device , for transmitting the test result of the electronic device 2 to the memory early 12. In this way, the microprocessor 112 can compare and discriminate the electronic device 2 according to the test result stored in the memory list, and further determine that the electronic device 2 does not function according to the test: A: w ^ ~ 1 1 Good place. The feedback interface 17 can be either a ρα interface or a (3)_珲 transmission interface. ^There is a freshman not only 7L] 4 is a liquid crystal display, and the memory unit 12 1252997 is mainly used to display the operating state of the electronic device 2 'test data input by the first input interface 15 1 , the electronic device 2 during the boot process The P〇ST code generated during P〇ST (P〇wer On Self Test) and the test result of the electronic device 2. The test data is transmitted from the microprocessor 112 to the memory unit 12 and output to the display unit 14 via the memory unit 12. The test result 4 and the p〇ST are sent to the memory unit 12 via the feedback unit n and then rotated out to the display unit 14. The above description of the wire 3 shows that the test device 3 of the present invention can control the processing of the fasting by the first input interface 丨5丨, and the test data can be input to the microprocessor 112 via the serial transfer parallel interface ln. The test data is stored in the memory unit 12 by the micro-processing person 12. When the electronic device 2 is tested, the microprocessor 112 outputs a force according to the second input interface 152. Moreover, the test data stored in the memory unit 2 is automatically retrieved and transmitted to the electronic device 2 for testing through the parallel serial interface 113 and the transmission interface 16, thereby achieving the purpose of converting the manual operation into an automatic operation. Each time the test of the electronic device 2 is carried out, it is not necessary to manually turn the test data repeatedly, so that the test manpower and the time cost can be greatly saved. The test device 2 of the present invention has the function of returning the test result: The test result of the electronic device 2 is transmitted to the memory storage unit 14 via the feedback unit 13 and simultaneously displayed on the display unit 14, so that the operator can analyze the function of the electronic device 2 and the cause of the failure for the test result. Helps to shorten the improvement time of the electronic device 2. The above is only a preferred embodiment of the present invention, and is not intended to limit the scope of the practice of the present invention, i.e., the simple equivalent variation of the scope of the invention and the description of the invention. And modifications are still within the scope of the invention patent. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a schematic diagram of a conventional test method of an electronic device; FIG. 2 is a circuit block diagram of a first preferred embodiment of the test device for an electronic device of the present invention; and FIG. A block diagram of a second preferred embodiment of a test device for a device. 10 1252997 [Description of main component symbols] Bu test device 14 1 1 Control unit 15 111 Serial to parallel interface 151 112 Microprocessor 152 113 Parallel serial interface 16 12 Memory unit 17 ' 13 - Feedback unit 2... Display unit Input unit first input interface second input interface transmission interface feedback interface electronic device