TWI248451B - Semiconductor interlayer dielectric material and a semiconductor device using the same - Google Patents

Semiconductor interlayer dielectric material and a semiconductor device using the same Download PDF

Info

Publication number
TWI248451B
TWI248451B TW90101671A TW90101671A TWI248451B TW I248451 B TWI248451 B TW I248451B TW 90101671 A TW90101671 A TW 90101671A TW 90101671 A TW90101671 A TW 90101671A TW I248451 B TWI248451 B TW I248451B
Authority
TW
Taiwan
Prior art keywords
group
organic
decane
same
film
Prior art date
Application number
TW90101671A
Other languages
Chinese (zh)
Inventor
Min-Jin Ko
Hye-Yeong Nam
Jung-Won Kang
Myung-Sun Moon
Dong-Seok Shin
Original Assignee
Lg Chemical Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from KR20000029031A external-priority patent/KR100425242B1/en
Application filed by Lg Chemical Ltd filed Critical Lg Chemical Ltd
Application granted granted Critical
Publication of TWI248451B publication Critical patent/TWI248451B/en

Links

Landscapes

  • Formation Of Insulating Films (AREA)
  • Silicon Polymers (AREA)

Abstract

The present invention relates to low a dielectric material essential for a next generation semiconductor with high density and high performance, and more particularly to a low dielectric material that is thermally stable and has good film-forming properties and excellent mechanical properties, a dielectric film comprising the low dielectric material, and a semiconductor device manufactured using the dielectric film. The present invention provides an organic silicate polymer having a flexible organic bridge unit in the network prepared by the resin composition of the component (a) and the component (b): (a) organosilane of the formula R1mR2nSiX4-m-n (where each of R1 and R2 which may be the same or different, is a non-hydrolysable group; X is a hydrolysable group; and m and n are integers of from 0 to 3 satisfying 0 <= m+n <= 3) and/or a partially hydrolyzed condensate thereof; (b) organic bridged silane of the formula R3pY3-pSi-M-SiR4qZ3-q (where each of R3 and R4 which may be the same or different, is a non-hydrolysable group; each of Y and Z which may be the same or different, is a hydrolysable group; and p and q are integers of from 0 to 2) and/or a cyclic oligomer with organic bridge unit (Si-M-Si).

Description

12484511248451

經濟部智慧財產局員工消費合作社印製Ministry of Economic Affairs, Intellectual Property Bureau, employee consumption cooperative, printing

發明之技術背景 (a) 發明技術領域 本發明係錢—種對於具高黯及高性能之下-代半 導體元件係重要之低介電材料,且特別係有關一種呈熱安 定及具良好之膜成形性質及優異機械性質之低介電材料、 包含此材料之介電膜’及自此介電膜製備之半導體元件。 (b) 相關技藝之描述 半導體產業係移向增加農置複雜性,需收縮之幾何尺 寸及於積體電路裝置(例如,記憶夾及邏輯夾)中具更大之 尺寸密度之更高之組件整體性。此已導致佈線層數之增加 及佈線間距之降低,以增加佈線密度。現今之前緣邏輯處 理器具有6·7個高密度内連接層,且内連接線寬度被排定 於約2005年減至〇.1 ν m。 因衣置尺寸收縮至少於〇.25vm,由於電阻-電容(Rc) 偶合作用之傳導延遲、串音(cr〇sstalk)噪音及動力消散變 顯著。較小之線尺寸增加金屬線之電阻性,且窄的金屬間 之間隔增加金屬線間之電容。因此,雖然裝置之速率會於 特徵尺寸減少時增加,中間連接延遲變成總延遲之主要部 伤,且限制整體晶片性能。因此,為製備具高速率之晶片 ,具低電阻性之導體及具低介電常數之介電材料需被使用 。此外,低介電材料之使用能顯著減少動力消散及串音噪 音° “ 最近’數半導體元件製造者已對市面上產品測試,顯 示20%或更多之性能改良,其係使用具高導電性之銅線,BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a low dielectric material that is important for high-lying and high-performance under-generation semiconductor components, and particularly relates to a heat-stable and good film. A low dielectric material having a molding property and excellent mechanical properties, a dielectric film containing the material, and a semiconductor element prepared from the dielectric film. (b) Description of related art The semiconductor industry is moving towards increasing the complexity of farming, the geometry required to shrink, and the higher component density in integrated circuit devices (eg, memory clips and logic clips). Integrity. This has led to an increase in the number of wiring layers and a reduction in wiring pitch to increase the wiring density. Today's leading edge logic processors have 6.7 high density interconnect layers, and the inner connecting line width is scheduled to be reduced to 〇.1 ν m in about 2005. Due to the shrinkage of the garment size, it is at least 〇25mm, and the conduction delay, crosstalk (cr〇sstalk) noise and power dissipation become significant due to the resistance-capacitance (Rc) coupling. The smaller wire size increases the electrical resistance of the wire, and the narrow spacing between the metals increases the capacitance between the wires. Therefore, although the rate of the device will increase as the feature size decreases, the intermediate connection delay becomes a major component of the total delay and limits overall wafer performance. Therefore, in order to prepare a wafer having a high rate, a conductor having low resistance and a dielectric material having a low dielectric constant are used. In addition, the use of low dielectric materials can significantly reduce power dissipation and crosstalk noise. “Recently, several semiconductor component manufacturers have tested products on the market, showing performance improvements of 20% or more, which are highly conductive. Copper wire,

本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐)This paper scale applies to the Chinese National Standard (CNS) A4 specification (210 X 297 mm)

(請先閱讀背面之注意事項再填寫本頁) 一裝------ 五、發明說明(2 ) 以替代使用傳統之鋁線。最近,其更換使用展現低介電常 數性能之新材料,用於中間連接。若積體電路内之中間連 接層間之介電膜可使用此等材料,對於操作速率之作用將 與以自紹更換成銅之技術形成者相目。例士口,若介電材料 之&quot;電^數由4.0改變成約2.5,積體電路之操作速率將被 改良約20%。 用於半導體積體電路裝置之中間層介電常材主要係 mo、2,其一般係使用化學蒸氣沈積(CVD)或電漿促進技術 形成’且具有用以抵抗與半導體製備有關之各種加工處理 操作所需之機械及熱性f。叫材料之相對介電常數係依 形成介電質之條件改變,石夕熱氧化膜(其具有最低之介電 系數)之&quot;電吊數係4 0之等級。已致力於藉由使氟原子併 入以CVD沈積之無機膜内而降低介電常數。但是,大量 併入氟原子降低化學及熱之安枝,因此,實際實施中= 成之介電常數係於3.5等級。氟化氧化物可提供立即之短 期溶液,且變換至具副·3介電常數之新型式絕緣材料可能 尖貝恢選物料係有機聚合物 —叩丹啕,、於3. 步 之介電常數。使說併入此等有機聚合物内係已知之進— 降低介電常數。但是,大部份有機聚合物不擁有晶片上: 半導體絕緣所f之物理_化學性f,特料熱安定性及機 械性質(足以抵抗範圍内之線製備溫度之 。少數有機聚合物於大於45(rc之溫度係穩^。其亦 低的玻璃轉化溫度,因此’其彈性於高溫時顯著降低了且 1248451 經濟部智慧財產局員工消費合作社印製 A7 五、發明說明(3 ) 其具有非常高之線性膨脹係數。因為溫度於半導體ic積體 化及封裝處理期間上升至最高達45(rc,形成之低熱安定 性及彈性及南線性膨脹係數會損及裝置之可信賴产。 最近為解決有機聚合物之熱安定性問題,使用溶膠凝 膠方法發展有機矽酸鹽聚合物已出現。特別地,有機s〇g( 玻璃上旋轉)已被提出作為中間層介電質,其間有機組份 之側鏈(烷基,諸如,甲基)被鍵結至矽氧烷鍵之主鏈。雖 然具有比傳統玻璃更低之介電常數(例如,約2.7〜3.2之範 圍),此等材料典型上具有差的機械性質。例如,甲基矽 倍半噁烷聚合物於加工處理期間遭受裂縫形成,除非膜非 常薄(一般係&lt; 1 // m)。 米勒(Miller)等人已報導一種藉由併入小量之聚合物 取代物(諸如,聚醯亞胺)韌化矽倍半噁烷材料系統之方法 。一種混合無機細微顆粒粉末之方法亦係已知之另一種改 良有機石夕酸鹽之機械性質之方法。雖然各種系統已被提出 ,其仍需一種具有適當低介電常數及適當物理_化學性質 之材料,以作為未來生產之IC裝置之中間層介電質。、 發明之概要說明 本發明係考量習知技藝之問題而為之,且本發明之目 的係提供一種能使半導體元件之速率提高、降低其動力消 耗及降低金屬佈線間串音之介電材孝斗。 本發明之另-目的係提供—種具有改良之抗破裂性及 _強度之有财酸《合物’使用該有機料鹽聚合物 製備之介電膜,包含該介電膜之半導體元件,及其製備方 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297 ^57(Please read the notes on the back and fill out this page.) One Pack ------ V. Invention Description (2) Instead of using traditional aluminum wire. Recently, it has been replaced with new materials that exhibit low dielectric constant performance for intermediate connections. If such a material can be used for the dielectric film between the intermediate connection layers in the integrated circuit, the effect on the operation rate will be in line with the technique of replacing the copper into a metal. In the case of a mouth, if the dielectric value of the dielectric material is changed from 4.0 to about 2.5, the operating speed of the integrated circuit will be improved by about 20%. The intermediate dielectric materials used in semiconductor integrated circuit devices are mainly mo, 2, which are generally formed using chemical vapor deposition (CVD) or plasma promotion techniques and have various processing treatments resistant to semiconductor fabrication. Mechanical and thermal f required for operation. The relative dielectric constant of the material is changed according to the conditions for forming the dielectric, and the electric thermal insulation film (which has the lowest dielectric constant) is classified as "the number of electric cranes". It has been proposed to lower the dielectric constant by incorporating fluorine atoms into an inorganic film deposited by CVD. However, the incorporation of a large amount of fluorine atoms reduces the chemical and thermal branching. Therefore, in practice, the dielectric constant is in the 3.5 grade. The fluorinated oxide can provide an immediate short-term solution and can be changed to a new type of insulating material with a sub-3 dielectric constant. The phenotype of the phenanthrene is the organic polymer - 叩丹啕, the dielectric constant at step 3. . It is known to incorporate into the organic polymers to reduce the dielectric constant. However, most organic polymers do not possess wafers: the physical properties of semiconductor insulation, the thermal stability, and the mechanical properties (sufficient to resist the temperature of the wire preparation in the range. A few organic polymers are greater than 45 (The temperature of rc is stable. It also has a low glass transition temperature, so its elasticity is significantly reduced at high temperatures and 1248451 Ministry of Economic Affairs Intellectual Property Bureau employees consumption cooperatives printed A7 V. Inventions (3) It is very high Linear expansion coefficient. Because the temperature rises up to 45 (rc during semiconductor IC integration and packaging process, the low thermal stability and elasticity and the south linear expansion coefficient will damage the reliable production of the device. Recently solved The problem of thermal stability of organic polymers, the development of organic silicate polymers using the sol-gel method has emerged. In particular, organic s〇g (rotation on glass) has been proposed as an intermediate layer dielectric with organic components in between. The side chain (alkyl group, such as methyl group) is bonded to the main chain of the decane bond. Although it has a lower dielectric constant than conventional glass (for example, a range of about 2.7 to 3.2) These materials typically have poor mechanical properties. For example, methyl sesquiterpene polymers are subject to crack formation during processing unless the film is very thin (typically &lt; 1 // m). Miller A method for toughening a sulfonium sesquioxalate material system by incorporating a small amount of a polymer substituent such as a polyimine, has been reported, and a method of mixing an inorganic fine particle powder is also known. A method for improving the mechanical properties of organic oxalates. Although various systems have been proposed, there is still a need for a material having a suitable low dielectric constant and appropriate physical-chemical properties to serve as an intermediate layer for future production of IC devices. SUMMARY OF THE INVENTION The present invention has been made in view of the problems of the prior art, and an object of the present invention is to provide a medium for improving the rate of semiconductor elements, reducing power consumption, and reducing crosstalk between metal wirings. Electrical material filial piety. Another object of the present invention is to provide an acid film having improved crack resistance and strength, and a dielectric film prepared using the organic salt polymer. The semiconductor device including the dielectric film, the present sheet preparing and applies China National Standard Scale (CNS) A4 size (210 X 297 ^ 57

裝 (請先閱讀背面之注意事項再填寫本頁) 7 A7Packing (please read the notes on the back and fill out this page) 7 A7

1248451 為達成此等目的,本發明提供於網絡内具可撓性有機 橋接單元之有機石夕酸鹽聚合物,其係藉由組份(a)及組份(匕) 之樹脂組成物製備。 (a) 化學式之有機矽烷(其中Rl&amp;R2之每 一者可為相同或相異,係不可水解之基;χ係可水解之基 ,且111及11係滿足〇sm+ng 3之〇至3之整數)及/或其部份水 解縮合物 (b) 化學式R3pY3_pSi-M-SiR4qZ3_qi有機橋接矽烷(其中 R及R之每一者係相同或相異,且係不可水解之基;γ及 Z(其可為相同或相異)之每一者係可水解之基;且?及^係〇 至2之整數)及/或具有機橋接單元si)之環狀寡聚物 jjjg_描述及較佳具艚例 本發明提供一種低介電樹脂組成物,其係能作為,例 如,藉由克服諸如機械脆化之缺點及同時保持機械硬度及 具低介電常數之樹脂優異電性質而能形成均勻介電膜之樹 脂組成物。 本發明提供一種包含下述組份(a)及(b)之低介電樹脂 組成物,及其製備方法。藉由本發明之樹脂組成物形成之 介電膜係具有最多為3.3(較佳係少於3·0)之介電常數之膜 ’其中藉由組份(a)及組份(b)製備之固化產物係藉由化學 反應均勻交聯: (a)化學式R^R^SiX^n之有機矽烷(其中Rl&amp;R2之每 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐)1248451 To achieve these objects, the present invention provides an organic silicate polymer having a flexible organic bridging unit in a network prepared by the resin composition of component (a) and component (匕). (a) an organic decane of the formula (wherein each of R1 &amp; R2 may be the same or different, a non-hydrolyzable group; a hydrazine-based hydrolyzable group, and the 111 and 11 systems satisfy the 〇sm+ng 3 to An integer of 3) and/or a partial hydrolysis condensate thereof (b) a chemical formula R3pY3_pSi-M-SiR4qZ3_qi organic bridged decane (wherein each of R and R is the same or different, and is a non-hydrolyzable group; γ and Z (which may be the same or different) each of which is a hydrolyzable group; and ? and is an integer of 2) and/or a cyclic oligomer having a mechanical bridging unit si) jjjg_ description and comparison The present invention provides a low dielectric resin composition which can be formed, for example, by overcoming the disadvantages such as mechanical embrittlement while maintaining mechanical hardness and excellent electrical properties of a resin having a low dielectric constant. A resin composition of a uniform dielectric film. The present invention provides a low dielectric resin composition comprising the following components (a) and (b), and a process for the preparation thereof. The dielectric film formed by the resin composition of the present invention has a film having a dielectric constant of at most 3.3 (preferably less than 3.0), wherein it is prepared by component (a) and component (b) The cured product is uniformly crosslinked by a chemical reaction: (a) an organic decane of the formula R^R^SiX^n (wherein each paper size of Rl&amp;R2 is applicable to the Chinese National Standard (CNS) A4 specification (210 X 297 mm) )

-------------- (¾先閱讀背面之注意事項再填寫本頁) % 經濟部智慧財產局員工消費合作社印製 1248451 A7 B7-------------- (3⁄4 first read the back of the note and then fill out this page) % Ministry of Economic Affairs Intellectual Property Bureau employee consumption cooperative printing 1248451 A7 B7

經濟部智慧財產局員工消費合作社印«Ministry of Economic Affairs, Intellectual Property Bureau, employee consumption cooperatives, printing «

者可為相同或相異,係不可水解之基;X係可水解之基 ,且㈤及11係滿足之〇至3之整數)及/或其部份水 解縮合物 (b)化學式之有機橋接矽烷(其中 R及R之每一者係相同或相異,且係不可水解之基;Y及 Z(/、可為相同或相異)之每一者係可水解之基;且p及q係〇 至2之整數)及/或具有機橋接單元(Si-M-Si)之環狀寡聚物 作為化學式RlmR2nSlX4-m-n之組份(a)有機矽烷,Rl及R2 之每一者係個別為氫、烷基(諸如,甲基、乙基或其它)、 含氟烷基(諸如,三氟甲烷或三氟丙烷),或芳基(諸如, 苯基),X係個別為可水解之基、鹵化物(諸如,氯)、烷氧 基(諸如,甲氧基、乙氧基或丙氧基)、醯氧基(諸如,乙 醯氧基或其它)。組份(a)有機矽烷之某些例子包含四烷氧 基矽烷、單-烷基三烷氧基矽烷、二烷基烷氧基矽烷、四 氯石夕烧、單烧基三氯料、二院基二氯钱、其混合物等 。有機我單體之部份水解產物可藉由於不高於有機溶劑 沸點之溫度時於添加水及催化劑後使單體或寡聚物於有機 溶劑内反應所定時間而獲得。 作為化學式R3pY3_pSi-M_SiR4qZ3 q之組份⑻有機橋接 矽烷時,R3及R4之每一者係個別為氫、烷基(諸如,甲基 、乙基或其它)、含氟烷基(諸如,三氟f烷或三氟丙烷) 、烯基(諸如,乙烯基或烯丙基,或芳基(諸如,苯基),Y 及Z係個別為可水解之基、鹵化物(諸如,氯)、烷氧基They may be the same or different, non-hydrolyzable groups; X-based hydrolyzable groups, and (5) and 11 systems satisfy the integer of 3 to 3) and / or its partial hydrolysis condensate (b) organic bridge of the chemical formula a decane (wherein each of R and R is the same or different and is a non-hydrolyzable group; each of Y and Z (/, may be the same or different) is a hydrolyzable group; and p and q a cyclic oligomer having a mechanical bridging unit (Si-M-Si) as a component of the chemical formula RlmR2nSlX4-mn (a) an organic decane, each of R1 and R2 being individually Is hydrogen, alkyl (such as methyl, ethyl or other), fluoroalkyl (such as trifluoromethane or trifluoropropane), or aryl (such as phenyl), X is individually hydrolyzable A group, a halide (such as chloro), an alkoxy group (such as methoxy, ethoxy or propoxy), a decyloxy group (such as ethoxylated or others). Component (a) Some examples of organodecane include tetraalkoxydecane, mono-alkyltrialkoxydecane, dialkylalkoxydecane, tetrachlorite, monoalkyl trichloride, and The yard is based on dichlorohydrin, its mixture, and the like. The partial hydrolyzate of the organic monomer can be obtained by reacting the monomer or the oligomer in an organic solvent for a predetermined period of time after the addition of water and a catalyst at a temperature not higher than the boiling point of the organic solvent. As a component of the chemical formula R3pY3_pSi-M_SiR4qZ3 q (8) when organically bridged decane, each of R3 and R4 is independently hydrogen, alkyl (such as methyl, ethyl or others), fluorine-containing alkyl (such as trifluoro) F alkane or trifluoropropane), alkenyl (such as vinyl or allyl, or aryl (such as phenyl), Y and Z are each a hydrolyzable group, a halide (such as chlorine), an alkane Oxyl

本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐This paper scale applies to the Chinese National Standard (CNS) A4 specification (210 X 297 mm)

ΦΜ--------訂·-------- (請先閱讀背面之注咅?事項再填寫本頁) -— I I , 1248451ΦΜ--------Book·------- (Please read the note on the back? Please fill out this page again) - I I , 1248451

如’甲氧基、乙氧基或丙氧基)、氧基(諸如,乙酿氧基 或其它)。當R3及/或R4係烯基時,其可進一步藉由下述之 氫矽烷基化反應之方法進一步橋接。有機橋接單元(M)可 為伸烷基或伸芳基,較佳係伸乙基或伸丙基。 有機橋接矽烷之合成係自氫矽烷基化反應提供,即, 於催化劑或自由基起始劑存在中之含以#基之矽烷單體與 含脂肪族不飽和碳(-CH=CH2)之矽烷單體間之加成反應。 本發明中之較佳催化劑係含鉑族金屬之催化劑。其可為任 何業界已知之有以使矽鍵結氫原子與不飽和碳-碳鍵之氫 石夕烧基化反應有效者’例如,始、纪、鐵、鈒及釕等。過 渡金屬催化劑(諸如,鉑)或自由基起始劑係以有效量被使 用,其係依所用特殊催化劑而定。 具有有機橋鍵(Si_M-Si)單元之環狀寡聚物可藉由於催 化劑或自由基起始劑存在中之環結構⑴及/或環結構(11)之 寡聚物之氫矽烷基化反應(即,含Si_H基之矽烷單體與含 脂肪族不飽和碳(-CH=CH2)之環狀寡聚物(I)及/或(11)間之 加成反應)合成。 ----------丨—钃裝—— (請先閱讀背面之注意事項再填寫本頁) 訂: 經濟部智慧財產局員工消費合作社印製 』、〇 jsi—、 /.IN \1&gt; /ο L o—si/ 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 10 1248451 A7For example, 'methoxy, ethoxy or propoxy), oxy (such as ethyl oxy or others). When R3 and/or R4 are alkenyl groups, they may be further bridged by the hydroquinone alkylation reaction described below. The organic bridging unit (M) may be an alkyl group or an aryl group, preferably an ethyl group or a propyl group. The synthesis of an organic bridged decane is provided by a hydroquinone alkylation reaction, that is, a decyl monomer containing a #-base and a decane containing an aliphatic unsaturated carbon (-CH=CH2) in the presence of a catalyst or a radical initiator. Addition reaction between monomers. Preferred catalysts in the present invention are catalysts containing a platinum group metal. It may be any one known in the art to be effective for the hydrogenation reaction of a hydrogen atom bonded to an unsaturated carbon-carbon bond, for example, Si, Ji, Iron, Niobium and Tantalum. A transition metal catalyst (such as platinum) or a free radical initiator is used in an effective amount depending on the particular catalyst used. The cyclic oligomer having an organic bridge bond (Si_M-Si) unit can be hydroquinone-alkylated by an oligomer of a ring structure (1) and/or a ring structure (11) in the presence of a catalyst or a radical initiator (i.e., an addition reaction of a Si-H group-containing decane monomer with a cyclic oligomer (I) and/or (11) containing an aliphatic unsaturated carbon (-CH=CH2)). ----------丨-钃装- (Please read the notes on the back and fill out this page) Order: Printed by the Ministry of Economic Affairs, Intellectual Property Bureau, Consumer Cooperatives, 〇jsi—, /.IN \1&gt; /ο L o-si/ This paper size applies to the Chinese National Standard (CNS) A4 specification (210 X 297 mm) 10 1248451 A7

經濟部智慧財產局員工消費合作社印 其中Ll係烯基(諸如,乙烯基或烯丙基),l2#氳、烧基〇 如,甲基、乙基或其它),或芳基(諸如,苯基),Μι· 基(諸如,乙烯基或浠丙基),Μ2係氫、烧基(諸如,甲; 、乙基或其它),或芳基(諸如,苯基)。組份⑷及組份刚之交聯反應可於溶液狀態或於; 成塗覆發生。但是,較佳㈣交聯反應係」 料狀態部份發生,以形成㈣分佈之無規共聚物。㈣尺解之共來物產物可藉由於添加水及催化劑後使組份(乏 及組伤(b)於有機溶劑中反應而獲得。 樹脂(b)之組成比例可被設定為選擇性之程度,其令 依特定目的而^。—般,較佳係以每1GG份重量之樹脂(a 為多於5份重量(較佳係多於1〇份)之量混合有機橋接矽爲 (b)。若有機橋接矽烷含量比例太小,機械性質可能不勒 適當改良。 可被使用之溶劑包含能使組成物溶解而形成組份(a、 及(b)之均質液體混合物之任何試劑或試劑之混合物。此 等/谷劑包含醇(諸如,甲醇、乙醇或異丙醇)、芳香族烴( 諸如本或尹本)、_(乙酿基丙酮、甲基異丁基酮或甲其 本紙張尺度適用中國國家標準(CNSM4規袼⑽X撕公釐)Ministry of Economic Affairs, Intellectual Property Office, Staff Consumer Cooperative, printed with Ll alkenyl (such as vinyl or allyl), l2#, hydrazine, methyl, ethyl or others), or aryl (such as benzene) Base, Μι· group (such as vinyl or propyl), Μ 2 is hydrogen, alkyl (such as methyl; ethyl or others), or aryl (such as phenyl). The cross-linking reaction of component (4) and the component can be carried out in the form of a solution or in a coating. However, it is preferred that the (four) crosslinking reaction occurs in a state of the material to form a (four) distribution of the random copolymer. (4) The co-product product of the ruler can be obtained by reacting the component (the lack of group damage (b) in an organic solvent by adding water and a catalyst. The composition ratio of the resin (b) can be set to the degree of selectivity. For the specific purpose, it is preferred to mix the organic bridging agent in an amount of more than 5 parts by weight (preferably more than 1 part by weight) per 1 GG part by weight of the resin (b). If the proportion of organic bridged decane content is too small, the mechanical properties may not be properly modified. The solvent that can be used contains any reagent or reagent that can dissolve the composition to form a homogeneous liquid mixture of components (a, and (b). Mixtures. These / granules contain alcohol (such as methanol, ethanol or isopropanol), aromatic hydrocarbons (such as Ben or Yin Ben), _ (ethyl ketone acetone, methyl isobutyl ketone or paper) The scale applies to Chinese national standards (CNSM4 rules (10) X tears)

裝--------訂: (請先閱讀背面之注意事項再填寫本頁) -I I I . I I I . 11 1248451Packing -------- Order: (Please read the notes on the back and fill out this page) -I I I . I I I . 11 1248451

五、發明說明(8 ) 乙基酮)、醚或酯等。 I I · I I (請先閱讀背面之注意事項再填寫本頁) 作為催化劑時,酸或鹼可被使用。酸可包含氫氯酸、 硫酸、破酸、硝酸、曱酸、丙酸、丁酸、草酸或乙酸、琥 珀酸等。鹼可包含氨、甲胺、乙胺、氫氧化鈉、氫氧化钾 等0 ▲產物被製得具有高分子量時,對於反應溫度係無特 別限制。溫度較佳可為不高於所用有機溶劑之沸點,較佳 可為〇 C至80°c,以便控制形成水解產物之分子量。對於 水解犄之反應時間並無特別限制,且反應可於產物達所示 分子I時完成。一般較佳者係將500至100,000範圍内之產 物分子量定為重量平均分子量。若組份(a)及0)之水解共 縮合物之分子量少於5〇〇,其可能難以形成均勻之塗覆物 膜’且右水解共縮合物之分子量大於100,000,共縮合聚 合物可能變成不可溶。溶液内之固體内容物濃度(樹脂組 伤(a)及樹脂組份(b)之總和)可於固體内容物溶解之範圍内 土於/合液之所欲黏度或塗覆物膜之膜厚度等觀點適當選擇 〇 經濟部智慧財產局員工消費合作社印製 人為於基材上形成塗覆物膜之方法時,較佳係使用其 _有合劑之本叙明組成物被塗覆於基材上,其後加熱及 、、…fx /合刈之方法。此間,樹脂組成物係藉由業界已 、帝^ (諸如mi覆、浸潰塗覆、噴灑塗覆、流動 師、、罔印刷等)塗覆至基材。塗覆方法可依欲被塗覆 之土材之形狀、所需膜厚度等而被選擇。當本發明塗覆物 被塗覆至半導體71件之中間層介電膜時,旋轉塗覆方法係 x 297公釐) 本紙張尺度I用中 12 1248451 五、 經濟部智慧財產局員工消費合作社印製 發明說明(9 ) 較佳,因為膜厚度之面内分佈藉此可為均句。溶液内之固 體内容物濃度((a)及(b)之樹脂組成物之總和)可於固體内 容物溶解之範圍内基於溶液之所欲黏度或塗覆物膜之膜厚 度等觀點適當選擇。 、予 為形成塗覆物膜,於塗覆後係需要固化步驟,以墓發 溶劑及進一步交聯樹脂組份(a)及(b)之混合物之部份水解 共縮合物。加熱可以單一步驟方法或逐步式方法進行。為 充分固化樹脂組成物(a)及(b)之混合物之部份水解共縮1 物及確保未反應之烷氧基矽烷基或矽烷醇基未被保留,口 較佳為300至500°C(更佳係400至5〇〇。〇之溫度之最後固化 係必需的。未反應之烧氧基石夕烧基或石夕燒醇基可為藉其增 加塗覆物膜介電常數之因子,且其可進一步為吸水位置,曰 其藉由水造成介電常數之增加。因此,所欲者係不使其保 留於塗覆物膜内。 藉由此間方法製備之塗覆物係於任何基材上(諸如, 金屬或陶瓷)’但特別係用於欲用於製備電子裝置;積 電路(1C)裝置(諸如,記憶Ic、邏輯ic*mmic(整塊式 波1C);雜化IC);光學裝置(諸如’發光二極體或電荷偶~ 合裝置);顯示裝置(諸如,液晶顯示裝置)等之電子基材 上。 藉由本發明組成物形成之塗覆物膜係以電子裝置之緩 衝塗覆膜、鈍化膜或中間層介電膜被施用,藉此,其可於 ’例如’藉由優異電性質(諸如,低電介常數及高介電 度)降低裝置之訊號傳導延遲時間中達成高性能,其亦 體 微 強 可 ‘紙張尺度適用中關家標準(CNS)A4 ‘格(21G X 297公£ 於 化5. Description of the invention (8) Ethyl ketone), ether or ester, and the like. I I · I I (Please read the notes on the back and fill out this page). As a catalyst, acid or alkali can be used. The acid may comprise hydrochloric acid, sulfuric acid, acid breaker, nitric acid, citric acid, propionic acid, butyric acid, oxalic acid or acetic acid, succinic acid or the like. The base may contain ammonia, methylamine, ethylamine, sodium hydroxide, potassium hydroxide or the like. ▲ When the product is obtained to have a high molecular weight, there is no particular limitation on the reaction temperature. The temperature may preferably be not higher than the boiling point of the organic solvent used, and is preferably 〇 C to 80 ° C in order to control the molecular weight of the hydrolyzed product. There is no particular restriction on the reaction time for the hydrolysis of hydrazine, and the reaction can be carried out when the product reaches the indicated molecule I. It is generally preferred to set the molecular weight of the product in the range of 500 to 100,000 as the weight average molecular weight. If the molecular weight of the hydrolyzed cocondensate of components (a) and 0) is less than 5 Å, it may be difficult to form a uniform coating film 'and the molecular weight of the right hydrolyzed cocondensate is greater than 100,000, and the cocondensed polymer may become Insoluble. The solid content concentration in the solution (the sum of the resin group damage (a) and the resin component (b)) may be the desired viscosity of the soil/liquid mixture or the film thickness of the coating film within the range in which the solid content is dissolved. If the viewpoint is properly selected, the Ministry of Economic Affairs, the Intellectual Property Office, the employee, the consumer cooperative, and the manufacturer, when the method of forming a coating film on the substrate, is preferably applied to the substrate using the composition of the composition. , followed by heating and, ... fx / combined method. Here, the resin composition is applied to the substrate by the industry, such as mi coating, dipping coating, spray coating, flow, printing, etc. The coating method can be selected depending on the shape of the soil to be coated, the desired film thickness, and the like. When the coating of the present invention is applied to the intermediate dielectric film of the semiconductor 71 piece, the spin coating method is x 297 mm). The paper size I is used in 12 1248451 5. The Ministry of Economic Affairs Intellectual Property Bureau employee consumption cooperative prints The invention (9) is preferred because the in-plane distribution of the film thickness can be a uniform sentence. The solid content concentration in the solution (the sum of the resin compositions of (a) and (b)) can be appropriately selected from the viewpoints of the desired viscosity of the solution or the film thickness of the coating film in the range in which the solid content is dissolved. In order to form a coating film, after the coating, a curing step is required to partially hydrolyze the co-condensate with the solvent of the tomb and further cross-linking the mixture of the resin components (a) and (b). Heating can be carried out in a single step process or a stepwise process. In order to sufficiently cure the partial hydrolyzed co-condensation of the mixture of the resin compositions (a) and (b) and to ensure that the unreacted alkoxyalkylene or stanol group is not retained, the mouth is preferably from 300 to 500 ° C. (More preferably, it is 400 to 5 Torr. The final curing of the temperature of yttrium is necessary. The unreacted alkoxylated group or the sulphuric acid group can be a factor for increasing the dielectric constant of the coating film. And it may further be a water absorption position, which causes an increase in the dielectric constant by water. Therefore, the desired one does not remain in the coating film. The coating prepared by the method is attached to any base. On board (such as metal or ceramic) 'but especially for use in the preparation of electronic devices; integrated circuit (1C) devices (such as memory Ic, logic ic*mmic (monolithic wave 1C); hybrid IC) An optical device (such as a 'light emitting diode or charge coupling device); an electronic substrate such as a display device (such as a liquid crystal display device), etc. The coating film formed by the composition of the present invention is an electronic device a buffer coating film, a passivation film, or an interlayer dielectric film is applied, whereby 'For example, 'High performance is achieved by reducing the signal conduction delay time of the device by excellent electrical properties (such as low dielectric constant and high dielectric), and it is also very strong. 'The paper scale is applicable to the Central Standards (CNS). A4 'Ge (21G X 297 public)

裝--------訂: (請先閱讀背面之注意事項再填寫本頁) 1248451 A7 B7 五、發明說明(10) 經濟部智慧財產局員工消費合作社印製 藉由優異機械性質達成高可靠度。本發明之樹脂組成物可 作為用以製備多孔介電膜之基材樹脂組成物。例如,本發 明樹脂組成物及熱不安定聚合物或有機小分子之混合物可 被旋轉塗覆及熱固化,以起始不安定聚合物或小分子之玻 璃化及分解。 現在,下列範例被提供以例示說明本發明。詳細製備 係落於上示之較普遍描述之方法,且係用以作為其等之例 示。此等範例僅被呈現作為例示說明之目的,且不應被用 以限制申清專利範圍中發現之本發明範圍。 [範例1 ] 10 // 1之0·1 Μ鉑催化劑及1.74亳升之乙烯基三曱氧基 矽烷於室溫時之完全乾燥反應容器内混合及反應約15分鐘 ,然後,2.3毫升之三甲氧基矽烷被引入其間,且反應於 氮氣氛圍下且於5(TC時持續15小時。剩餘反應物於真空下 完全移除,且氫矽烷基化反應之完成以NMR光譜確認。 6毛升之甲基三甲氧基矽烷及1〇6亳升之氫矽烷基化 反應產物(雙三甲氧基矽烷基乙烷)於具15亳升四氫呋喃溶 背J之另谷為内混合,且其溫度於氮氛圍下降至5。〇。於 混合溶液中,0.7毫升之2N之氫氣酸(其係以12毫升蒸館 水稀釋)被緩慢添加並攪拌。於7〇t時反應隔夜後,溶液 被冷卻至室溫,然後以甲苯稀釋且以蒸餾水清洗至細 值變中性為止。硫酸鎂被引至獲得之有機層内,以完全移 除其間剩餘之水,且有機溶劑於真空爐内自獲得之有機: 完全移除。 (請先閱讀背面之注意事項再填寫本頁) 一裝--------訂· -ϋ H _ 本紙張尺度賴巾關冢標準(CNS)A4規格(210 χ_ 297公釐)Installation -------- Order: (Please read the note on the back and fill in this page) 1248451 A7 B7 V. Invention Description (10) Ministry of Economic Affairs Intellectual Property Bureau employee consumption cooperative printing achieved by excellent mechanical properties High reliability. The resin composition of the present invention can be used as a base resin composition for preparing a porous dielectric film. For example, a mixture of the resin composition of the present invention and a thermally unstable polymer or small organic molecule can be spin coated and thermally cured to initiate the glassing and decomposition of the unstable polymer or small molecule. The following examples are now provided to illustrate the invention. The detailed description is based on the methods generally described above and is used as an illustration thereof. The examples are presented for illustrative purposes only and are not intended to limit the scope of the invention as claimed. [Example 1] 10 // 1 0·1 Μ Platinum catalyst and 1.74 liter of vinyl trimethoxy decane were completely dried in a reaction vessel at room temperature and reacted for about 15 minutes, then, 2.3 ml of the third Oxydecane was introduced between them, and the reaction was carried out under a nitrogen atmosphere at 15 °C for 15 hours. The remaining reactants were completely removed under vacuum, and the completion of the hydroquinone alkylation reaction was confirmed by NMR spectroscopy. Methyltrimethoxydecane and 1〇6 liter of hydroquinone alkylation reaction product (bistrimethoxydecylethane) are mixed in a valley with 15 liters of tetrahydrofuran, and the temperature is in nitrogen. The atmosphere dropped to 5. 〇. In the mixed solution, 0.7 ml of 2N hydrogen acid (which was diluted with 12 ml of steaming water) was slowly added and stirred. After 7 〇t, the reaction was cooled to room after overnight. The temperature is then diluted with toluene and washed with distilled water until the fineness becomes neutral. Magnesium sulfate is introduced into the obtained organic layer to completely remove the water remaining therebetween, and the organic solvent is obtained in a vacuum furnace: Remove completely. (Please read the note on the back first) Matters then fill out this page) -------- installed a set · -ϋ H _ depends on the scale of this paper towel off Otsuka Standard (CNS) A4 size (210 χ_ 297 mm)

I I 14 經濟部智慧財產局員工消費合作社印製 1248451 A7 ------- —_B7______ 五、發明說明(U) 3〇〇宅克之獲得粉末被溶於甲基異丁基酮,以使總溶 液含量為1 _5克。所獲得之溶液被過濾以自其移除雜質, 旋轉塗覆以獲得薄膜,且於43〇。〇之氮氛圍下固化1小時, 以製備介電膜。 [範例2] 10# 1之0.1M鉑催化劑及1.0毫升之2,4,6,8-四乙烯基-2,4,6,8-四甲基矽氧烷於室溫時之完全乾燥反應容器内混 合及反應約15分鐘,然後,315毫升之三甲氧基矽烷被引 入其間’且反應於氮氣氛圍下且於50°C時持續15小時。剩 餘反應物於真空下完全移除,且反應之完成以NMR光譜 確認。 40宅升之四氫咬喃及19毫升之曱基三甲氧基矽烷於另 一谷為内混合,且其溫度於氮氛圍下降至rc。於混合溶 液中1〇·24耄升之蒸德水及2.1毫升之2.0N之氫氯酸被緩 k添加並攪拌。然後,21毫升之氫矽烷基化產物被再次 緩〖又h、、加。於70 C時反應隔夜後,溶液被冷卻至室溫,然 後以甲笨稀釋且以条鶴水清洗至其值變中性為止。硫 酉欠鎂被引至獲得之有機層内,以完全移除其間剩餘之水, 且有機溶劑於真空爐内自獲得之有機層完全移除。 藉由fe例1之相同方法使獲得粉末被乾燥及固化以製 備介電膜。 [比較例1 ] 丄7.6¾升之曱基三曱氧基石夕烷、4〇5毫升之蒸鶴水及⑺ 毛升之四氫呋喃於室溫時混合,然後,〇·8毫升之氫氯 本紙張尺度適用中國國家標準(CNS)A4規格(21〇 297公釐) --------ί—t--- (請先閱讀背面之注意事項再填寫本頁) 訂-· %_ 15 1248451 A7 B7 五、發明說明(12 酸被缓慢添加至混合物並授掉之。於7代時反應隔夜後, 溶液被冷卻至室溫,錢以甲苯_且1^财清洗至其 pH值變中性為止。硫酸鎮被引至獲得之有機層内,以完 全移除其間剩餘之水,且有機溶劑於真空爐内自獲得之有 機層完全移除。 藉由範例!之相同方法使獲得粉末被乾燥及固化以製 備介電膜。 膜之破裂性質使用顯微型威氏壓痕計(其可產生自壓 痕角發散之小裂縫)測量。以範例丨及2之方法製備之膜之 裂縫增殖係』10,〜㈣m/s之速率進行。藉由比較例k 方法製備之相同厚度之甲基sisesqui〇Xane膜係以1〇_7〜1〇·9 m/s範圍之速率進行。機械楊氏模量係使用亳微塵痕計測 量。藉由範例1及2之方法製備之膜之揚氏模量係3.5〜6() GPa之範圍,而比較例!之甲基膜係於2.5〜3 5 GPa之範圍。 部 智 慧 財 產 局 員 工 消 費 合 作 社 印 製 本發明藉由於網絡内製備具可撓性有機橋接單元之有 機矽酸鹽聚合物而解決習知技藝之缺失(傳統有機矽酸鹽 膜具有低的抗破裂性及機械強度)。雖然本發明已以特殊 具體例描述,其細節不應被作為限制而解釋之,因為明顯 地,各種不同具體例、改變及改良可在未偏離其精神及範 圍下被憑藉,且需瞭解此等等化具體例需被包含於本發明 範圍内。 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公爱)II 14 Ministry of Economic Affairs Intellectual Property Bureau Employees Consumption Cooperative Printed 1244851 A7 ------- —_B7______ V. Invention Description (U) 3 The acquisition of the powder is dissolved in methyl isobutyl ketone to make the total The solution content is 1 _ 5 grams. The obtained solution was filtered to remove impurities therefrom, spin coated to obtain a film, and at 43 Torr. It was cured under a nitrogen atmosphere for 1 hour to prepare a dielectric film. [Example 2] 10# 1 of 0.1 M platinum catalyst and 1.0 ml of 2,4,6,8-tetravinyl-2,4,6,8-tetramethylphosphonane completely dried at room temperature The vessel was mixed and reacted for about 15 minutes, then 315 ml of trimethoxydecane was introduced between it and reacted under a nitrogen atmosphere at 50 ° C for 15 hours. The remaining reactants were completely removed under vacuum and the completion of the reaction was confirmed by NMR spectrum. The 40 liters of tetrahydrotetramine and 19 ml of decyltrimethoxydecane were mixed in another valley, and the temperature was lowered to rc in a nitrogen atmosphere. 1 〇 24 liters of distilled water and 2.1 ml of 2.0 N hydrochloric acid in a mixed solution were added and stirred. Then, 21 ml of the hydroquinone alkylation product was again slowed down again, h, and added. After the reaction at 70 C overnight, the solution was cooled to room temperature, then diluted with a scorpion and washed with a crane water until the value became neutral. Sulfur bismuth is introduced into the obtained organic layer to completely remove the remaining water therebetween, and the organic solvent is completely removed from the obtained organic layer in a vacuum furnace. The obtained powder was dried and solidified by the same method as in Example 1 to prepare a dielectric film. [Comparative Example 1] 丄7.63⁄4 liter of decyltrimethoxy oxetane, 4 〇 5 ml of steamed crane water and (7) liter of tetrahydrofuran mixed at room temperature, then, 〇·8 ml of hydrogen chloride paper scale Applicable to China National Standard (CNS) A4 specification (21〇297 mm) -------- ί—t--- (Please read the notes on the back and fill out this page) Order-· %_ 15 1248451 A7 B7 V. Description of the invention (12 acid was slowly added to the mixture and was given. After 7 days of reaction, the solution was cooled to room temperature, and the money was washed with toluene _ and 1 财 until its pH became neutral. So far, the sulphuric acid town is introduced into the obtained organic layer to completely remove the remaining water, and the organic solvent is completely removed from the obtained organic layer in a vacuum furnace. The obtained powder is dried by the same method as in the example! And curing to prepare a dielectric film. The rupture properties of the film are measured using a micro-Vickers indenter (which produces small cracks from the indentation angle divergence). The crack propagation system of the film prepared by the method of Example 丨 and 2 10, ~ (four) m / s rate. The same thickness of methyl sise prepared by the method of comparison example k The squi〇Xane film system was carried out at a rate ranging from 1 〇7 to 1 〇·9 m/s. The mechanical Young's modulus was measured using a micro-dust gauge. The film prepared by the methods of Examples 1 and 2 was Young. The modulus is in the range of 3.5 to 6 () GPa, and the methylation of the comparative example! is in the range of 2.5 to 3 5 GPa. The Ministry of Intellectual Property Bureau employee consumption cooperative prints the present invention by means of flexibility in the preparation of the network. The organic strontium polymer of the organic bridging unit solves the lack of the prior art (the conventional organic phthalate film has low crack resistance and mechanical strength). Although the invention has been described in a specific embodiment, the details should not be It is to be understood that the various specific examples, modifications, and improvements may be made without departing from the spirit and scope thereof, and it is to be understood that the specific examples are included in the scope of the present invention. The scale applies to the Chinese National Standard (CNS) A4 specification (210 X 297 public)

Claims (1)

1248451 年月 无1_ 六、申請專利範圍 第9〇1〇1671號專射請㈣請專案範圍修正本 94 8 1· -種用於半導體裝置作為絕緣薄膜之有機㈣鹽聚合 物,其實質上於網絡中包括化學式:IM-SH其帽 為伸乙基或伸丙基)之-有機橋接單元,藉由下述組份 (a)及(b)間之交聯反應製備: (a) 化學式R mR2nSiX4n之有機矽烷(其中 之每-者可為相同或相異,係選自氫、烧基、含氣坑基 或芳基之不可水解之基;X係選自函化物、烧氧基或醯 氧基之可水解之基;且m&amp;n係滿足〇^m+n^3之〇至3 之整數)及/或其部份水解縮合物,其中該有機石夕垸之部 份水解縮合物係藉由添加水及催化劑後於有機溶劑内 之有機矽烷單體或寡聚物間之反應獲得; (b) 化學式R3pY3_pSi_M_SlR4qZ3 q之有機橋接矽烷( 其中R3及R4之每一者係相同或相異,且係選自氫、烷基 、含氟烷基、烯基或芳基之不可水解之基;γ&amp;ζ(其可 為相同或相異)之每一者係選自函化物、烷氧基或醯氧 基之可水解之基;Μ係伸乙基或伸丙基;且^及^係〇至二 之整數)或具有機橋接單元(Si_M_si)之環狀寡聚物,其 中該有機橋接矽烷係藉由於催化劑存在中使含有Sl-H 之石夕院單體與含有脂肪酸不飽和碳(-CH=CH2)之矽垸 單體反應而合成。 2. 種製備有機矽酸鹽聚合物之方法,該有機矽酸鹽聚合 物貫質上於網絡包含化學式:_Sl_M_Sl_(其中Μ為伸乙 基或伸丙基)之一有機橋接單元,該方法之步驟係: 17 六、申請專利範圍 於添加水及催化劑後,於有機溶劑内使下列組份(a) 與下列組份(b)反應: (a)化學式R]mR2nSlX4_n之有機矽烷(其中r】及y 之每一者可為相同或相異,係選自氫、烷基、含氟烷基 或芳基之不可水解之基;X係選自南化物、烧氧基或酿 氧基之可水解之基;且m&amp;n係滿足〇gm+n^3之〇至3 之整數)及/或其部份水解縮合物,其中該有機矽烷之部 份水解縮合物係藉由添加水及催化劑後於有機溶劑内 之有機矽烷單體或寡聚物間之反應獲得; ⑻化學式R3pY3_pSl|SlR4qZ3 q之有機橋接矽烷( 其中R3及R4之每-者係相同或相異,且係選自氫、统基 、含氟烷基、烯基或芳基之不可水解之基;丫及2(其可 為相同或相異)之每一者係選自鹵化物、院氧基或酸氧 基之可水解之基;M係伸乙基或伸丙基,·且P&amp;係〇至2 之整數)或具有機橋接單元(Sl_M_Si)之環狀寡聚物,其 中。亥有機“接石夕焼係藉由於備化劑存在中使含有 之石夕烧單體與含有脂肪酸不餘和碳(-⑶:项)之石夕烷 早體反應而合成。 3.如申請專利範圍第2項之方法,其中該具有有機橋接單 兀(S卜M-SO之環狀寡聚物係藉由環結構⑴及/或環結 ⑴)之寡聚物之氫矽烷基化反應合成: ° 1248451No. 1 in the year of 1248451. Patent application No. 9〇1〇1671. (4) Please correct the scope of the project. 94 8 1 - An organic (tetra) salt polymer used as an insulating film for semiconductor devices, which is essentially The network includes an organic bridging unit of the chemical formula: IM-SH whose cap is ethyl or propyl, which is prepared by crosslinking reaction between the following components (a) and (b): (a) Chemical formula R An organic decane of mR2nSiX4n (each of which may be the same or different, selected from a non-hydrolyzable group of a hydrogen, an alkyl group, a pit-containing group or an aryl group; and the X system is selected from a complex, an alkoxy group or an anthracene). a hydrolyzable group of an oxy group; and m&amp;n is an integer corresponding to 〇^m+n^3 to 3) and/or a partially hydrolyzed condensate thereof, wherein the partially hydrolyzed condensate of the organic stone It is obtained by a reaction between an organic decane monomer or an oligomer in an organic solvent by adding water and a catalyst; (b) an organic bridged decane of the formula R3pY3_pSi_M_SlR4qZ3 q (wherein each of R3 and R4 is the same or different) And a non-hydrolyzable group selected from the group consisting of hydrogen, alkyl, fluoroalkyl, alkenyl or aryl; Each of γ&amp;ζ (which may be the same or different) is selected from a hydrolyzable group of a functional group, an alkoxy group or a decyloxy group; a hydrazine-extended ethyl group or a propyl group; An integer of 〇2) or a cyclic oligomer having a bridge unit (Si_M_si), wherein the organic bridged decane is caused by the presence of a catalyst in the presence of a catalyst for the inclusion of S1-H and a fatty acid-containing unsaturated carbon ( -CH=CH2) is synthesized by reacting with a monomer. 2. A method for preparing an organic silicate polymer, the organic bismuth silicate polymer comprising an organic bridge unit of a chemical formula: _Sl_M_Sl_ (wherein Μ is an extended ethyl group or a propyl group), the method Steps: 17 VI. Patent application scope After adding water and catalyst, the following components (a) are reacted with the following components (b) in an organic solvent: (a) Organic decane of the formula R]mR2nSlX4_n (where r) And each of y may be the same or different, selected from a non-hydrolyzable group of a hydrogen, an alkyl group, a fluorine-containing alkyl group or an aryl group; and the X system is selected from the group consisting of a amide, an alkoxy group or a ethoxy group. a base of hydrolysis; and m&amp;n is an integer corresponding to 〇gm+n^3 to 3) and/or a partial hydrolysis condensate thereof, wherein the partial hydrolysis condensate of the organic decane is added by adding water and a catalyst Obtained by reaction between an organic decane monomer or oligomer in an organic solvent; (8) an organic bridged decane of the formula R3pY3_pSl|SlR4qZ3 q (wherein each of R3 and R4 is the same or different and is selected from hydrogen, a non-hydrolyzable group of a fluorinated alkyl group, an alkenyl group or an aryl group; Each of which may be the same or different) is selected from the group consisting of a hydrolyzable group of a halide, an alkoxy group or an acidoxy group; an M group extending an ethyl group or a propyl group, and a P&amp; Or a cyclic oligomer having a bridge unit (Sl_M_Si), wherein. The organic organic "Ji Xi Xi" is synthesized by the early reaction of the contained sulphur monomer with the fatty acid and the carbon (-(3): item) in the presence of the preparation agent. The method of claim 2, wherein the organobranched monoterpene (Sb M-SO cyclic oligomer is hydroquinone alkylated by an oligomer of the ring structure (1) and/or the ring junction (1)) Reaction Synthesis: ° 1248451 其中Ll係乙稀基或稀丙基,L2係氫、垸基或芳基,Ml 係乙稀基或稀丙基,且m2係氣、烧基或芳基。 4如申請專利範圍第2項之方法,其中該有機橋接我係 以每⑽份重量之⑷有機錢為多於5份重量之含量添 加0 5.如申請專利範圍第2項之方法,其中該有㈣酸鹽聚合 物具有500至100,000範圍内之重量平均分子量。 6·:種用—於半導體元件之中間層介電膜,其包含申請專利 範圍第1項之有機矽酸鹽聚合物。 7·二:半導體元件’其包含申請專利範圍第6項之中間層 介電膜。 曰 8·-種製備用於半導體元件之中間層介電膜之方法 含之步驟係: &quot;GWherein L1 is an ethylene group or a dilute propyl group, L2 is a hydrogen group, a fluorenyl group or an aryl group, M1 is an ethylene group or a dilute propyl group, and m2 is a gas, a burnt group or an aryl group. [4] The method of claim 2, wherein the organic bridge is added to each of (10) parts by weight of (4) organic money for more than 5 parts by weight. 5. The method of claim 2, wherein The (tetra) acid salt polymer has a weight average molecular weight in the range of 500 to 100,000. 6: An intermediate layer dielectric film for a semiconductor device, which comprises the organic silicate polymer of claim 1 of the patent. 7. 2: Semiconductor element 'The intermediate layer dielectric film of claim 6 is included in the patent application.曰 8·- A method for preparing an interlayer dielectric film for a semiconductor device, comprising the steps: &quot;G 19 ^48451 申請專利範圍 〜 —一^' ^ a)使申請專利範圍第i項之有機石夕酸鹽聚合物 /谷劑内; )使步驟a)獲得之溶解溶液旋轉塗覆於基材上以 形成膜; c) 使步驟b)獲得之塗覆物膜乾燥;及 d) 於300至500 C之溫度時使步驟c)獲得之乾燥膜 固化。 ' 9. 一種半導體元件,其包含依據申請專利範圍第8項之方 法製備之中間層介電膜。19 ^ 48451 Patent Application Scope ~ - ^ ^ ^ a) in the application of the scope of the scope of the organolithic acid polymer / granules;) The solution obtained in step a) is spin coated on the substrate To form a film; c) drying the coating film obtained in the step b); and d) curing the dried film obtained in the step c) at a temperature of 300 to 500 C. A semiconductor component comprising an interlayer dielectric film prepared according to the method of claim 8 of the patent application.
TW90101671A 2000-02-02 2001-01-29 Semiconductor interlayer dielectric material and a semiconductor device using the same TWI248451B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US17965300P 2000-02-02 2000-02-02
KR20000029031A KR100425242B1 (en) 2000-05-29 2000-05-29 Dielectrics material for layer of semiconductor and semiconductor device using the same

Publications (1)

Publication Number Publication Date
TWI248451B true TWI248451B (en) 2006-02-01

Family

ID=26638036

Family Applications (1)

Application Number Title Priority Date Filing Date
TW90101671A TWI248451B (en) 2000-02-02 2001-01-29 Semiconductor interlayer dielectric material and a semiconductor device using the same

Country Status (2)

Country Link
JP (1) JP2001253945A (en)
TW (1) TWI248451B (en)

Also Published As

Publication number Publication date
JP2001253945A (en) 2001-09-18

Similar Documents

Publication Publication Date Title
TWI291728B (en) A process for preparing insulating material having low dielectric constant
TW498093B (en) Organohydridosiloxane resins with low organic content, its process for preparation and silicon-based polymer comprising the same
US20010053840A1 (en) Semiconductor interlayer dielectric material and a semiconductor device using the same
US7470636B2 (en) Semiconductor interlayer dielectric material and a semiconductor device using the same
US7238627B2 (en) Organosilicate polymer and insulating film therefrom
KR101100463B1 (en) Silicon-Containing Polymer, Process for Producing the Same, Heat-Resistant Resin Composition, and Heat-Resistant Film
TW200806714A (en) Organic silica film and method for forming the same, composition for forming insulating film of semiconductor device and method for producing the same, wiring structure and semiconductor device
EP1328571B1 (en) A process for preparing organic silicate polymer
KR101647360B1 (en) High silicon content siloxane polymers for integrated circuits
TW200404838A (en) Organic silicate polymer and insulation film comprising the same
TW200424238A (en) Organic siloxane resins and insulating film using the same
TWI248451B (en) Semiconductor interlayer dielectric material and a semiconductor device using the same
KR100405312B1 (en) Organic silicate polymer and low dielectric insulation film comprising the same
JP5915878B2 (en) Method for producing silicone polymer
JPH07173434A (en) Coating fluid for forming oxide film and production of oxide film
TWI311570B (en) A process for preparing organic silicate polymer
KR100422916B1 (en) Organic silicate polymer and low dielectric insulation film comprising the same
KR100888613B1 (en) Hardmask Composition Coated under Photoresist And Method for Preparing Semiconductor Devices Using Thereof
TW403767B (en) Synthesis of hydridosiloxane resins

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees