TWI243893B - Fluorescence testing analyzer - Google Patents
Fluorescence testing analyzer Download PDFInfo
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- TWI243893B TWI243893B TW93110693A TW93110693A TWI243893B TW I243893 B TWI243893 B TW I243893B TW 93110693 A TW93110693 A TW 93110693A TW 93110693 A TW93110693 A TW 93110693A TW I243893 B TWI243893 B TW I243893B
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五、發明說明d) 【毛明所屬之技術領域】 t "^明係、有奶— 域,特別f么二關一種檢測裝置,應用於生物醫學相關領 【先前技術】一種可調整物鏡位置之螢光檢測分析儀。 重大的ί 5生11學等科技’隨著世界進步的腳步而有著 元件持續的研導體產業的興起’致使相關電子 上一層。 x展迅速,而帶動生物醫學上的研究亦更 其中生物醫學々百φ 習知的檢測方法Γ域檢測技術,是目前的研究重點, 片上,並/以於^、’係將生物晶片置放於具有資料層的光碟 裝置同時讀Si的光進行照射,接著利用光碟片讀取 層之資料層气號=片所幅射的螢光訊號,與光碟片資料 料層訊號,而重b逢取後經由資料處理單元將螢光訊號與資 而在美國專利Ιί格式的生物晶片之榮光訊號。 裝置」,即揭霖第6 3 2 0 6 6 0號之「生醫晶片之筛選 所需搭配之光學以用於生醫晶片巾,·用以偵測-檢體 、衣置 I op 11 ca 1 s i e ν 1 ng apparatus) ° 光機裝置通常Γ二j師選裝置」與一般螢光檢測分析儀之 f郎本w哭—探測機構(即聚光元件)與一接收機構 一、"^ =個部份所組成。此探測機構即是將一激發 光源所毛出之光汛唬經過物鏡(〇b j e c t丨V e i ens )…等元件 之導引’而使光訊號聚焦於一檢 份,則是使用光偵剛器(驗〇 Detect〇r;⑼以^的部 订光訊 1243893 片之篩選裝置」或是一般的螢 學元件(如顯微鏡物鏡、物鏡 >體積較大,因此,當這些光 因不同光學元件之間定位上的 而影響量測之結果。 量測時間及數據之間的比對 時量測數個不同位置的螢光訊 〇 同時測量不同位置之螢光訊號 置或是光學元件組裝時的誤 螢光訊號,而某些光源不能偵 人員只能擷取到一個大略的數 據只能忽略不計,這些都會是 光檢測分析儀内之測試機構、 之誤差,則是相關產業亟待解 本發明提供一種螢光檢測分析儀,係將 聚焦距離,以 如此一來,操作人員不致因 測不到待測物所幅射之螢光 五、發明說明(2) 號之接收。 不論是上 光檢測分析儀 或是光電倍增 學元件在組裝 誤差,而使其 且操作人 值,通常會在 號,以節省實 然而,當 時,可能會因 差,使得某些 測到螢光訊號 值,對於某些 造成實驗誤差 因此,如 降低各光學元 決的課題。 【發明内容】 有鑑於此 聚焦物鏡設置 位置至最佳的 述之「生醫晶 ,其包含的光 管)數目較多、 定位時,常會 精度降低,進 貝為節省檢體 操作時一次同 驗量測的時間 有數個光源要 為螢光反應位 光源能偵測到 。因此,操作 誤差較大的數 的原因。 何簡化整個螢 件組裝對位時 於一致動器 以藉由此致動器調整此物鏡的 量測到較為準確的實驗數據。 組裝定位時的誤差,而發生量 訊號或只能擷、取到一個大略的V. Description of the invention d) [Technical Field to which Mao Ming belongs] t " ^ Ming Department, with milk — domain, especially f2, a detection device for biomedical related fields [prior art] An adjustable objective lens position Fluorescent detection analyzer. Major technologies such as 5 students and 11 students ’with the pace of world progress and the continuous rise of the research and development of the conductor industry’ have led to a higher level of related electronics. The x exhibition is fast, and the research on biomedicine is also more advanced. Among them, the conventional detection method of biomedical φ φ detection technology is the focus of current research. On-chip, and / The optical disk device with the data layer reads the light of Si at the same time for irradiation, and then uses the data layer gas number of the read layer of the optical disc = the fluorescent signal radiated by the sheet, and the signal of the data layer of the optical disc. Then the data processing unit passes the fluorescent signal and the glory signal of the biochip in the US patent Ιί format. Device ", ie, the optics required for the screening of biomedical wafers for Jielin No. 6 2 0 6 6 0 for biomedical wafer towels, for detection-specimens, clothing I op 11 ca 1 sie ν 1 ng apparatus) ° Opto-mechanical devices are usually selected by two teachers and devices "and common fluorescent detection analyzers. The detection mechanism (that is, the light collecting element) and a receiving mechanism ^ = Composed of parts. The detection mechanism is to guide the light emitted by an excitation light source through the objective lens (〇bject 丨 V ei ens), etc., so that the optical signal is focused on an inspection unit, and a light detector is used. (Examination 〇 Detect〇r; ⑼ order the screening device of 1238993 pieces of optical information ”or general fluorescent elements (such as microscope objectives, objectives > larger volume, so when these lights due to different optical elements It affects the result of the measurement during the positioning between the measurement time. When measuring the time and the comparison between the data, it measures the fluorescence signals at several different positions. At the same time, it measures the fluorescence signal settings at different positions or the error in the assembly of optical components. Fluorescent signals, and some light sources ca n’t detect personnel can only capture a rough data can only be ignored, these will be the test institutions in the light detection analyzer, the error is related industries urgently need to solve this invention to provide a The fluorescence detection analyzer will focus the distance. In this way, the operator will not be able to detect the fluorescence emitted by the object to be measured. 5. Acceptance of invention description (2). Instrument or photomultiplier element is assembly error, and the value of the operator is usually on the number to save the actual value. However, at that time, due to the difference, some fluorescent signal values may be measured, and for some causes Therefore, the experimental error, such as reducing the problem of each optical element. [Summary of the Invention] In view of the fact that the setting position of the focusing objective lens is the best, there are a large number of "biomedical crystals, which contain light tubes." Decrease, to save the time of the same measurement during the operation of the specimen, there are several light sources that can be detected by the fluorescence reaction position light source. Therefore, the reason for the large number of operating errors. How to simplify the assembly of the entire fluorescence The actuator is located at the actuator to adjust the measurement of the objective lens by this actuator to obtain more accurate experimental data. Errors in assembly and positioning, and the measurement signal may only capture and obtain a rough
第7頁 1243893 五、發明說明(3) 數值之情形。 依據本發明所揭露之一種螢光檢測分析儀,其主要包 含有:激發光源、第一準直鏡(c ο 1 1 i m a t 〇 r)、極化分光鏡 (Polarization Beam Splitter)、第一光學濾波模組、物 鏡、致動器、第二準直鏡及光感測器。 此激發光源是用以發射一激發光。而此第一準直鏡是 設置於激發光源之一侧,以接收此激發光並將其轉換為一 平行光。此極化分光鏡是設置於第一準直鏡之一側,以接 收此平行光’並將其反射出去,而此極化分光鏡之出光邊Page 7 1243893 V. Description of the invention (3) Value situation. A fluorescence detection analyzer disclosed in accordance with the present invention mainly includes: an excitation light source, a first collimator (c ο 1 1 imat 〇r), a polarization beam splitter (Polarization Beam Splitter), and a first optical filter Module, objective lens, actuator, second collimator lens, and light sensor. The excitation light source is used to emit an excitation light. The first collimator is disposed on one side of the excitation light source to receive the excitation light and convert it into a parallel light. The polarizing beam splitter is disposed on one side of the first collimator to receive the parallel light ’and reflect it, and the light exiting edge of the polarizing beam splitter
緣具有一第一光學濾波模組,以作為之後不同波長之光訊 號濾波之用。 此 動器上 俾使反 此 長之檢 束,並 為 響到數 鏡及其 光或雜 此 使具有 直鏡一 物鏡是裝 ,藉由微 射後之平 待測物經 測螢光, 穿透此極 防止激發 據量測時 出光邊緣 光渡除, 第二準直 特定波長 側之光感 配於極化 調此致動 行光經過 由平行光 而此檢測 化分光鏡 光及其他 之準確性 之第一光 以得到較 鏡是設置 之檢測螢 測器便將 分光鏡之 器使物鏡 此物鏡而 之照射後 螢光再經 〇 背景光或 ,因此, 學濾波模 為正確之 於第一光 光聚焦。 所接收到 一侧,且係設置於一致 到達最佳的聚焦位置, 聚焦於待測物上。 會幅射一具有一特定波 & #鏡轉換為平行光 雜光進入光感測器而影 本發明係藉由極化分光 組將數發光及其他背景 量測結果。 學據波模組之 最後The edge has a first optical filter module for filtering optical signals of different wavelengths later. This actuator reverses this long detection beam, and is equipped with a straight lens and an objective lens to make the digital microscope and its light ring, or to mix it with the objective lens. Transmitting this pole prevents the edge light from passing out during the measurement of the excitation data. The second collimated light at the specific wavelength side is matched with the polarized light. The actuating light passes through the parallel light and the detection of the spectroscope light and other accuracy. The first light is used to obtain the detection fluorescence detector. The spectroscope is used to make the objective lens irradiated by this objective lens and then the fluorescence is passed through the background light or. Therefore, the filtering mode is correct for the first light. The light is focused. The received side is set up to reach the best focus position and focus on the object to be measured. It will radiate a specific wave &#mirror into parallel light and stray light enters the light sensor and shadow. The present invention uses a polarization beam splitter to emit light and other background measurement results. The Last of the Evidence Wave Module
側 以 由設置於第二準 輸 的檢測螢光轉換為The side is converted from the detection fluorescence set in the second quasi input to
1243893 五、發明說明(4) 出訊號,以進行螢光訊號之分析處理。 為使對本發明的目的、構造特徵及其功能有進一步的 了解,茲配合圖示詳細說明如下: 【實施方式】 請參考「第1圖」所示,係為本發明之螢光檢測分析 儀1 0 0第一實施例之系統架構圖,此第一實施例係用以進 行單一待測物之量測’其包含有:激發光源丨〇、第一準直 鏡2 0、極化分光鏡30、第一光學濾波模組31、物鏡4〇、致 動器50、第二準直鏡60及光感測器7〇。 此激奄光源1 0係用以發射一激發光,其可實施的種類 很多’市售產品大都採用氣體雷射與連續光譜之汞燈等。 然而此類光源模組其價格昂貴,且汞燈之使用壽命短,因 此,在此貫施例中選用功能相近的具有單一波長之雷射二 極體(Laser D1〇de)來作為激發光源1〇。而以下將以波 長為4 5 0奈米之激發光為例以作說明。 當然,此激發光源1 0之波長需對應於待測物8 〇添加的 染料而有不同,以使待測物80幅射出具有特定波長之檢測 螢光,因此,本發明不限於僅使用波長為45〇奈米之激發 光源1 0。1243893 V. Description of the invention (4) Signal output for analysis and processing of fluorescent signal. In order to further understand the purpose, structural features, and functions of the present invention, detailed descriptions are given in conjunction with the drawings as follows: [Embodiment] Please refer to "Figure 1", which is the fluorescence detection analyzer 1 of the present invention 0 0 A system architecture diagram of the first embodiment. This first embodiment is used to perform measurement of a single object to be measured. It includes: an excitation light source, a first collimator lens, and a polarization beam splitter. The first optical filter module 31, the objective lens 40, the actuator 50, the second collimator lens 60, and the light sensor 70. This excitation light source 10 is used to emit an excitation light, and many types of it can be implemented. Most of the commercially available products use gas lasers and continuous-spectrum mercury lamps. However, this type of light source module is expensive and the life of the mercury lamp is short. Therefore, in this embodiment, a laser diode (Laser D10) with a single wavelength and a similar function is selected as the excitation light source 1 〇. In the following, an excitation light with a wavelength of 450 nm is taken as an example for illustration. Of course, the wavelength of the excitation light source 10 needs to be different from the dye added to the object under test 80, so that the object under test 80 emits detection fluorescence with a specific wavelength. Therefore, the present invention is not limited to using only the wavelength It is an excitation light source 10 at 45 nm.
而此第一準直鏡20是設置於激發光源1〇之一側,以接 收激發光源1 0所發射出來的激發光,並將此激發光轉換為 一平行光或聚集光。 ' ' 此極化分光鏡3 0是設置於第一準直鏡2 〇之一側,以接 收由第一準直鏡20輸出之平行光,並將此平行光由45度面The first collimator 20 is disposed on one side of the excitation light source 10 to receive the excitation light emitted by the excitation light source 10 and convert the excitation light into a parallel light or a concentrated light. '' This polarization beam splitter 30 is set on one side of the first collimating mirror 20 to receive the parallel light output from the first collimating mirror 20, and the parallel light is transmitted from a 45-degree plane.
第9頁 1243893 五、發明說明(5) 反射出去。而此極化分 濾波模組3 1,以作為之 此第一光學渡波模組3 1 鏡30之出光邊緣,可形 波器數量之多寡係依據 此物鏡40係為一種 之一側 將由極 而此物 物鏡40 此致動 可為音 因 尋到最 上。此 波長之 長,十 (nW)。 檢 原本的 讓所搜 數反射 背景光 此,可 ,並位於折射後 化分光鏡30反射 鏡40是設置於一 進行微量距離的 器5 0 ’而改變物 圈馬達或是其他 此’可藉由此致 佳的聚焦位置, 待測物8 0經由光 檢測螢光,而此 數奈米之光訊號 測螢光再經過物 光路返回極化分 集到的檢測螢光 ’然而,為防止 或雜光進入光感 藉由第一光學濾Page 9 1243893 V. Description of Invention (5) Reflected. The polarization splitting filter module 31 is used as the light output edge of the first optical wave module 31 lens 30. The number of shapeable wave filters depends on whether the objective lens 40 is a type. The objective lens 40 is actuated to the top of the sound factor. This wavelength is long, ten (nW). The original allows the searched number to reflect the background light. This is possible, and is located in the refracted post-reflection beam splitter 30. The mirror 40 is set on a device that performs a small distance. This excellent focus position, the test object 80 detects the fluorescence through light, and the nanometer light signal measures the fluorescence and then returns to the polarization fluorescence detection fluorescence through the object optical path. However, to prevent or stray light from entering Light perception through the first optical filter
光鏡30之出光邊緣具有一第一光學 後不同波長之光訊號濾波之用,而 是利用鍍膜的方式製作於極化分光 成一層或是多層的濾波器,而其濾 使用者不同之量測需求而定。 非球面物鏡,擺放於極化分光鏡3〇 之激發光之光路上,以藉由物鏡40 出來的平行光聚焦於待測物80上, 致動器50上,此致動器50是用以將 調整(在此圖面中,係可藉由微調 鏡40在z軸上之位置)。此致動器5〇 可用以微調物鏡4 〇位置之元件。 動器5 0微調此物鏡4 〇之位置,以搜 使光訊號全部聚焦於此待測物8 〇 訊號之照射後會幅射出具有一特定 檢測螢光之波長係大於激發光之波 ,然而其光強度僅為數十奈米瓦 鏡4 0搜哥轉換為平行光束,並經由 光鏡3 0,此時,此極化分光鏡3 〇會 全部入射通過,此時讓激發光源多 波長4 5 0奈米的剩餘激發光及其他 測器7 0而影響到量測之準確性,因 波模組3 1將激發光及其他背景光或The light-emitting edge of the optical mirror 30 has a filter for filtering optical signals of different wavelengths after the first optical, but a coating method is used to make a polarized beam split into one or more layers, and the filter filters different measurements for users Demand. The aspherical objective lens is placed on the excitation light path of the polarization beam splitter 30, and the parallel light from the objective lens 40 is focused on the object 80 to be measured. The actuator 50 is used for It will be adjusted (in this figure, the position of the mirror 40 on the z axis can be adjusted). This actuator 50 can be used to fine-tune the element of the objective 40 position. The actuator 50 fine-tunes the position of the objective lens 40, so that all the optical signals are focused on the object to be measured. After the irradiation of the 80 signal, the wavelength with a specific detection fluorescence is larger than the excitation light. However, Its light intensity is only a few tens of nanometer mirrors 40. The search beam is converted into a parallel beam and passes through the light mirror 30. At this time, the polarization beam splitter 30 will be completely incident through. At this time, the excitation light source is multi-wavelength 4 The remaining excitation light of 50 nanometers and other measuring devices 70 affect the accuracy of the measurement. Because the wave module 31 will excite light and other background lights or
第10頁 1243893Page 10 1243893
五、發明說明(6) ΐ i ί ϊ ’以得到較為正確之量測結果。❿為達到較佳的 學淚波哭’可t極化分光鏡3〇之出光邊緣鍍上多層膜的光 予&及。。’以盡可能地濾除不要的光訊號。 置於之範圍較大、能量較弱’因&,利用設 聚焦使ί!!:模組31 —侧之第二準直鏡60將檢測營光 门 、此里提咼,以易於偵測及接收。 所接:I的:置ΐ第二準直鏡6。一側之光感測器7◦便將 之分析。 光轉換為一輸出訊號’卩進行螢光訊號 至致動哭5Π ’ ::光感測器7〇將此訊號輸出處理,再回傳V. Description of the invention (6) ΐ i ί ϊ ’to get a more accurate measurement result. ❿ In order to achieve better learning tears, the light emitting edge of the T-polarizable beam splitter 30 can be coated with a multilayer film of light & and. . ’To filter out unwanted light signals as much as possible. Placed in a larger range and weaker energy 'cause & use the focus to make ί !!: The second collimator 60 on the side of the module 31 will detect the light gate and lift it here for easy detection And receive. Connected: I: Set the second collimator lens 6. The light sensor 7 on one side analyzes it. The light is converted into an output signal ‘卩 for a fluorescent signal to actuate to cry 5Π’: The light sensor 70 outputs this signal for processing, and then returns
崩气目 器7〇可為一受光二極體⑽)或是雪 月式先感刪器(Avalanche ph〇t〇 AM)。 儀1〇〇而運控作制此^致f力器50移_之方 <,是在此螢光檢測分析 / 之刖,先輸入—參考訊號至致動器5 0,此參考 汛號疋作為將致動器5〇調整到最佳聚焦位置時之參考。 田此:動态5 0接收到光感測器7 0回傳之輸出訊號時, 猎由此餐考訊號與輸出訊號之比較,即可以調整此致動器 矛夕動之方向及其位各畺之大小,而使物鏡4 〇調整到最佳的 聚焦位置。The gas collapse eyepiece 70 can be a photodiode (A) or a snow-type sensor (Avalanche pH 0 AM). The instrument is controlled by the operation controller 100. The method of moving the force sensor 50 is described below. This is the fluorescence detection and analysis. First, input—the reference signal to the actuator 50. This reference is the flood number.疋 Used as a reference when adjusting the actuator 50 to the optimal focus position. Tian Tian: When the dynamic 50 receives the output signal returned by the light sensor 70, the comparison between the test signal and the output signal can be used to adjust the direction and position of the actuator. And the objective lens 40 is adjusted to an optimal focusing position.
、,明考^「第2圖」所示,係為本發明之螢光檢測分析 儀1 0 0_第厂貫施例之系統架構圖,此第二實施例之架構與 第一貝施例相似’不過,其激發光源丨0的部份是使用發光 二極體11以發射出激發光,在發光二極體11與第一準直鏡 20之間加入一組空間濾波器(Spacial Filtei_)i2〇使成點 光源,並在極化分光鏡30之入光邊緣鍍上第二光學濾波模As shown in Figure 2, "The second figure" is a system architecture diagram of the first embodiment of the fluorescent detection analyzer 100 according to the present invention. The structure of this second embodiment is the same as the first embodiment. Similar to 'However, part of its excitation light source 0 uses the light emitting diode 11 to emit excitation light. A set of spatial filters (Spacial Filtei_) are added between the light emitting diode 11 and the first collimator 20 i20 is made into a point light source, and a second optical filter mode is plated on the light entrance edge of the polarization beam splitter 30
第11頁 1243893 五、發明說明(7) 組9 0 ’以選取適用之光源頻段。 、,請參考「第3圖」所示,係為本發明之螢光檢 儀10 0第三實施例的系統架構圖,此第三實施例之加 與第一實施例雷同,不過,第一實施例中一次僅^"旦^ 〆待測物8 0所幅射之檢測螢光;而當操作人員一次里、日广 量測數個待測物80所幅射之檢測螢光訊號時,^ 三實施例之光學架構進行檢測螢光之偵測。 ϋ 弟 此第三實施例基本上是將多組第一實施例平疒 形成此螢光檢測分析儀1 0 0,此第三實施例是藉由口夕$ / 同的測試光路及光學元件,以同時量測多個待測物10^斤3幅 射之檢測 '螢光訊號,而為簡化此第三實施例中光學元件: 數目’因此’在第二貫施例中便將原本的極化分光鏡3 〇做 成〆個長條狀的極化分光鏡模組丨丨〇,以直接置入光學載 異中。而原本的第一光學濾波模組3丨則同樣利用鍍膜的方 忒製作於極化分光鏡模組11 0之出光邊緣。 此第三實施例同樣可以採用雷射二極體或是發光二極 體作為其激發光源1 0,而當採用發光二極體作為其激發光 源1〇時’可自行搭配第二光學濾波模組9〇,而其結構在此 不再贅述。 以上所述者,僅為本發明其中的較佳實施例而已,並 养用來限定本發明的實施範圍;即凡依本發明申請專利範 園所作的均等變化與修飾,皆為本發明專利範圍所涵蓋。Page 11 1243893 V. Description of the invention (7) Group 9 0 ′ to select the applicable light source frequency band. Please refer to "Figure 3", which is a system architecture diagram of the third embodiment of the fluorescent detector 100 of the present invention. The addition of this third embodiment is the same as the first embodiment, but the first In the embodiment, only once ^ " Dan ^ 检测 detection fluorescence emitted by the test object 80 radiation; and when the operator measures the detection fluorescence signal emitted by a number of test objects 80 in a wide range, day and day ^ The optical architecture of the three embodiments performs detection of fluorescent light.第三 This third embodiment basically forms a plurality of groups of the first embodiment to form the fluorescent detection analyzer 100. This third embodiment uses the same test optical path and optical element as the first embodiment. In order to simplify the optical element in this third embodiment, the number of the 'fluorescence signals' is measured by measuring the measurement of 10 ^ kg and 3 radiations of multiple objects at the same time. Therefore, in the second embodiment, the original polarities are changed. The chemical beam splitter 30 is made into a long polarized beam splitter module 丨 丨 0 to be directly placed into the optical anisotropy. The original first optical filter module 3 丨 was also fabricated on the light emitting edge of the polarization beam splitter module 110 using the coated square. In this third embodiment, a laser diode or a light emitting diode can also be used as its excitation light source 10, and when a light emitting diode is used as its excitation light source 10, it can be used with a second optical filter module by itself. 90, and its structure is not repeated here. The above are only the preferred embodiments of the present invention and are used to limit the scope of implementation of the present invention; that is, all equivalent changes and modifications made in accordance with the patent application park of the present invention are within the scope of the present invention patent. Covered.
第12頁Page 12
1243893 圖式簡单說明 第1圖,係為本發明之螢光檢測分析儀第一實施例的系統 架構圖; 第2圖,係為本發明之螢光檢測分析儀第二實施例的系統 架構圖;及 第3圖,係為本發明之螢光檢測分析儀第三實施例的系統 架構圖。 【圖 式符 號 說 明 ] 10 激 發 光 源 11 發 光 -^^ 極 體 20 第 -^ 準 直 鏡 30 極 化 分 光 鏡 31 第 一 光 學 滤 波 模組 40 物 鏡 50 致 動 器 60 第 -- 準 直 鏡 70 光 感 測 器 80 待 測 物 90 第 二 光 學 濾 波 模組 100 螢 光 檢 測 分 析 儀 110 極 化 分 光 鏡 模 組 120 空 間 濾 波 器1243893 Brief description of the figure 1 is a system architecture diagram of the first embodiment of the fluorescence detection analyzer of the present invention; FIG. 2 is a system architecture diagram of the second embodiment of the fluorescence detection analyzer of the present invention Figures; and Figure 3 are system architecture diagrams of a third embodiment of the fluorescence detection analyzer of the present invention. [Illustration of Symbols] 10 Excitation light source 11 Light-emitting ^^ Polar body 20 No .- ^ Collimator 30 Polarizing beam splitter 31 First optical filter module 40 Objective lens 50 Actuator 60 No.-Collimating lens 70 Light Sensor 80 DUT 90 Second optical filter module 100 Fluorescence detection analyzer 110 Polarizing beam splitter module 120 Spatial filter
第13頁Page 13
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