TWI241482B - Built-in power-on memory testing method of computer - Google Patents

Abstract

A built-in power-on memory testing method of computer mainly has a DRAM testing program embedded in the BIOS of a computer main board. When a computer equipment boots up, a screen immediately is displayed an operation command screen. The screen at least contains two commands, namely ""press DEL to enter SETUP"" and ""press CTRL to memory test"". After user further press the ""CTRL"" key, a test program of the present invention is entered to automatically carry out a test of a DRAM inside the main computer system so as to quickly and precisely provide a DRAM that is compatible with the main board and has a high quality and to further enhance the stability during the operation of the system.

Description

1241482 _Case No. 91122560_year month__ V. Description of the invention (1) The present invention relates to a built-in computer boot memory test method, especially when a computer device is turned on, it immediately displays a work instruction screen According to the instructions in this screen, you can choose to enter the dynamic memory (DRAM) test, or choose to perform the basic setting of the motherboard, or enter the OS operating system without making a selection to complete the general computer startup worker. According to the invention, the invention can choose to perform a dynamic memory (DRAM) test when the computer is turned on to determine whether the memory is compatible with the motherboard, and its proper rate and memory capacity are sufficient, thereby ensuring the stability of the computer system. The purpose of the operation.

Press, it is known that the program function of P 0 ST (P 0wer 0 n S e 1 f T est) in BI OS which is used to boot a conventional computer motherboard will be a simple dynamic memory (DRAM) test. Taking two more common types of BIOS (AMI BIOS and Award BIOS) computers as examples, they are warning users based on different sounds. What is the status of this dynamic memory? The various sounds displayed by this simple dynamic memory (DRAM) test can only tell the user to basically judge that the current dynamic memory (DRAM) may be due to the need to replace the dynamic memory or the condition is not inserted, so the computer is caused. Can not boot. And this simple and easy dynamic memory (DRAM) test cannot provide a complete memory test operation for general computers under the condition of booting into 0 S, especially now that computers are getting faster and faster, the host and memory The design of the body is also getting more and more complicated, which causes greater compatibility (matching) problems between the host and the memory; therefore, in order to allow the entire system to have a stable working environment, only the above simple memory test and only In general, it is not enough for the computer to enter 0S without turning on the computer, which often causes crashes to occur for users.

Page 51241482 _ Case No. 91122560_ year and month amended _ V. The description of the invention (2) caused inconvenience, that is, the general computer can only be aimed at the computer system is not turned on, by P 0 ST (P〇wer 〇 n S e 1 f T est) The sound discrimination function of the simple dynamic memory (DR AM) test provided in the program function of automatic detection, but it cannot be used for the dynamic memory (DRA Μ) test of the computer system in the bootable state. Therefore, it is necessary to study and solve this problem. The inventor of this case has learned that the above-mentioned conventional computer fails to provide a complete memory test function, which leads to users often failing to perform or lack of crashes while operating the computer. Therefore, they have carefully studied and accumulated personally engaged in the electronic With many years of experience in manufacturing and designing his business, he finally invented a new "built-in computer boot memory test method." The main objective of the present invention is to provide a built-in computer boot memory test method, which is to build a memory test program into the main board input / output unit (B I 0 S) of the motherboard, which is displayed immediately when the computer is turned on. A work instruction day is provided for selection, and then all or part of the dynamic memory therein can be completely tested to confirm the compatibility of the memory and the motherboard, so that the system achieves a stable effect. In order to achieve the above object, the present invention mainly includes a memory test program built into the basic input / output unit (B I OS) of the motherboard. When the memory test program is turned on, it will immediately display a work order on the screen. On the day, the day surface includes at least π P ress DEL to enter SETUP used by conventional computers at the present time. In addition to the CMOS SETUP operation of the motherboard, the newly added "Press CTRL to Memory Test" There are two instructions to enter the dynamic memory (DRAM) test program of the present invention, and the memory test program contains a record in the working environment.

Page 61241482 _Case No. 9Π22560_ Year Month Revision _ i. Description of the Invention (3) · "Hidden Area Setting (Memory Setup), Sound Setting (Sound), Select Test Results Display Mode (F 〇rm — S e 1), set the execution method of the test method (P a 11 er η Setup) and leave test (E sc), etc., and can be set by the designated function key (for example: n DEL "and n CTRL" keys and controller. According to the above, when the computer is turned on, the work instruction screen displayed on the screen can be used to select and press the n CTRL π key, and the system enters the memory test program and uses the above functions according to the setting of each function key. The test program continuously and automatically tests part or all of the dynamic memory in the host, and can display the measured results on the screen. After pressing the function key to leave the test, the system resets and restarts to restart Complete the test to quickly and accurately provide a motherboard that is compatible with the motherboard and high-quality dynamic memory usage (that is, immediately check the DRAM's goodness rate), which can improve the stability of the system during use. In order to allow your reviewers to have a deeper understanding and understanding of the structure, device and features of the present invention, a preferred and feasible embodiment is described in detail below with reference to the drawings: Please refer to the first to third figures In the "built-in computer boot memory test method" of the present invention, a dynamic memory (DRAM) test program is built into the basic input / output unit (BIOS) of the motherboard, and the memory test program will immediately turn on when the computer is powered on. Display a day of work (work window) on the screen, the day of the day includes at least the general current _Press DEL to enter SETUP used by traditional computers to select the basic setup (CMOS SETUP) operation of the motherboard And newly added "Press CTRL to Memory Test" to choose to enter the present invention

Page 7 1241482 _ Case No. 91122560_year month__ V. Description of the invention (4) Two instructions, such as state memory (DRA M) test program, and the memory area setting in the working environment of the memory test program , Sound setting, selection of test results display mode, setting test method, and execution test of functions such as leaving the test, and can be set and controlled by the designated function key (screens of each window, the implementation of this case is shown in reference images 1 to 7 ). In addition, the above-specified n DEL ”and“ CTRL ”keys can also be replaced by other function keys. As in the above method, after pressing the“ CTRLπ key ”in step G of the second figure, you will enter the next display page to list this Examples of tools for executing the various test functions described in the invention are on the screen for users to click:

"Memory area setting" is able to set a dynamic memory with a memory capacity of 1 28MB or 2 5 6 MB, and select a certain section (such as: set the test range to 3 2 ~ 6 4 MB in the memory Area) or all functions for testing. , "Sound Settings" can be used to turn the volume of the alarm on / off. "Select test result display mode" means the user can choose to display the test result in text or image. "Set test method" can choose one of the programs: random number (RAND OM) test method, scanning (SCAN) test method, check (CHECK) test method, MARKING test method, WALKBIG test method, etc. Test the dynamic memory (DRAM).

"Leave test" uses a designated function key (such as De 1 or E s c key) to end the test program of the dynamic memory. As described above, when the computer device is turned on, a work instruction day and day surface may be immediately displayed on the screen, and then selected according to the work instruction in the day and day surface.

Page 81241482 _Case No. 91122560_year month__ V. Description of the invention (5) · After pressing the n CTRL π key, the system will enter the above memory test program; otherwise, if you choose " DEL ” Key or without pressing any key, it will directly enter the conventional motherboard settings or OS operating system according to the boot program of the computer. Also as above, when pressing the "CTRL" key, the system will enter the memory test program. When the test process is as shown in the second figure, the hardware status of the motherboard (including: CPU, memory, motherboard chipset, etc.) is first detected, and then the fast write memory in the motherboard is set to writeback Mode, secondly perform speed analysis on dynamic memory and display its speed, then automatically perform various test analysis and recording of dynamic memory, and finally check whether any function key is pressed (as shown in the third picture). None, the loop will continue to return to the previous step to perform dynamic memory test analysis and record the work; if there is, it will automatically respond to the program according to the program defined or selected by each function key. A part or all of the dynamic memory (DRAM) in a host is tested for its compatibility with the motherboard and its memory capacity, and the measured results are displayed on the screen; in addition, after the above test work is completed, Then enter the above-mentioned work of performing dynamic memory test analysis and recording, until the function key to leave the test is pressed, the system resets and restarts to complete the test work, so as to quickly and accurately provide a compatible with the motherboard and The use of dynamic memory of capacity and quality can further improve the stability of the system during use. In addition, when the method described above enters the execution program of each test item, the execution flow of each test item is shown in Figures 4 to 10 (these processes are similar to the general windows control processes, which are known techniques So I won't repeat them here.

Page 91241482 Case No. 9121260 Amendment V. Description of the invention (6) In summary, the "built-in computer boot memory test method" of the present invention can indeed achieve a complete test of the compatibility between dynamic memory and the motherboard With its memory capacity and quality, to ensure the stability of the system when it is used, and to make it easier for consumers to use the computer, and to improve the practicality of the computer system, it is the case that this case can meet the requirements of the patent law for invention patents; the applicant 爰In accordance with the provisions of Articles 19 and 20 of the Patent Law, an application for an invention patent was filed with the Bureau, and I urge you to grant the patent in this case as soon as possible. Participate

Page 101241482 _Case No. 9122560_Year Month Day__ Brief Description of the Drawings The first picture is the block diagram of the built-in computer booting memory test method of the present invention when it is turned on. The second picture is the built-in type of the present invention. The flowchart of the computer booting memory test method when entering the memory test. The third diagram is the block diagram of the check function key structure in the second diagram. The fourth diagram is the operation flowchart of the F 2 function after entering the test program. The seventh diagram is the operation flowchart of performing the functions of FI, F2, and F3 in the fourth diagram. The eighth to tenth diagrams are the operation flowcharts of performing the functions of F3, F5, and Esc after entering the test program. The main screen image of one embodiment is another form of the test results of the present invention. The daytime surface image is a child performing the function of the bottom edge F 1 of the main screen. The daytime surface image is a sub screen image performing the function of the bottom edge F 2 of the main screen. Up to image seven is the root of the daylight surface of the fourth edge of the daylight surface F1, F2, F3.

Claims (1)

1241482 _ Case No. 91122560_year month__ VI. Patent Application Scope 1 · A built-in computer power-on memory test method, which mainly has a built-in memory test in the main board input / output unit (BI 0 S) of the motherboard Program, the memory test program will immediately display a day of the work command on the screen when it is turned on, the day of the day includes at least n Press DEL to enter SETUP " and, 'Press CTRL to Memory Test,' two commands , And in the working environment of the memory test program, it contains the execution programs of functions such as memory area setting, sound setting, selection of test result display mode, setting test method, and exit test, which can be set and controlled by the designated function key ; When the computer equipment is turned on, the work instructions displayed on the screen can be selected to press the "CTRL" key on the day, the system will enter the above memory test program, and automatically according to the program set by each function key Test some or all of the dynamic memory (dram) in the host, and display the measured result on the screen, After pressing the function key to leave the test, the system resets and restarts to complete the test. It can quickly and accurately provide a dynamic memory that is compatible with the motherboard and has sufficient capacity, which can improve the use of the system. Stability of the time. Page 12