TWI234097B - Quality improvement team knowledge base system and the operation procedures thereof - Google Patents

Abstract

The present invention discloses a quality improvement team knowledge base system and the operation procedures thereof for the product manufactured in a machine with a process, which includes a computer host; a terminal connected to the computer host through a network for inputting a specific data to the computer host; and, an integration system executed in the computer host. The integration system comprises a daily-abnormal type quality improvement team processing unit, an after-checking abnormal quality improvement team processing unit, an improved quality improvement team processing unit, an abnormal re-work quality improvement team processing unit, and the tool for analyzing the abnormal conditions of the process or the machine to improve the product quality.

Description

1234097 V. Description of the invention (1) [Technical field to which the invention belongs] The present invention relates to a knowledge-based system, and in particular, to a quality-improved collaborative knowledge-based system and its operation program. [Previous Technology] B i 1 1 G a t e s emphasized in the book "Digital Nervous System" that "the way you collect, manage, and use information determines your winning or losing." In the era of the knowledge economy, the use of technology and the innovation of business operations are the two main driving forces for the economic growth of enterprises and the country. In the knowledge economy plan proposed by the Economic and Construction Commission of the Executive Yuan of China last year, the so-called knowledge economy is "an economy directly based on the stimulation, diffusion, and application of knowledge and information, the ability and efficiency to create knowledge and use it cheaply. Above the traditional production requirements such as land and capital, it has become a driving force for the continuous development of the economy. "Therefore, the production, distribution, and use of information and knowledge have become the core concepts of national economic development. "Lester, who is full of competition and system play a more and more mature mechanism, creative, reward management guide:" Knowing this, the knowledge of the government or the challenge of the knowledge economy of the twenty important soul. Yu Luo ( Lester is the creative of the knowledge economy, and the master Peter Du is a knowledge worker in the production industry ~ w% In the first century, the role of talent cultivation and knowledge learning is the role of the creative and adventurous spirit is successfully taught for twenty (Thurow, the most influential economist at the end of the century) was invited to come to our country to give the secret of success ^, the government must be committed to the direction of R & D. ° Lack also advocated the future of the 11th century in the California Management Review in 1999 The most important asset, the power will be a great challenge in the future management, and unauthorised authors will quickly increase 'how to strengthen knowledge workers:

j234097 & 'Explanation of the invention (2) Productive forces' is the government and the introduction of a knowledge economy will be a niche for Taiwan to increase its competitiveness. The key to success is that Taiwan's ability to maintain its competitiveness in the 21st century will not be able to achieve its goals; 源源 and human resources, to the bay of R & D and innovation, start with foundry manufacturing, and gradually develop. Same as the past development process, although Taiwan's design capabilities, although I 2 = technology and part of the foundry team leader, but through the ^ / has become a way of innovative technology and knowledge. In the new economic era, the rules of the game of "Shi Jie's coming out of a large and healthy Taiwan if he can grasp Jiang Bing and bian 1" are different, although they are different. 4 This grasps the spirit of innovation and knowledge. I believe we will still be Winner of the new century. Let's take this as an example. Take care of the domestic market and the government's various controls to make the economy; = Passed, but ten years of efforts to make India: = No, producing country. The development of the Indian software industry is not a matter of taking advantage of it; In recent years, the Taiwan software industry has had a growth rate of more than double-digits in terms of both the output value, exports, and employment of the information software industry in Taiwan in recent years. One hundred and seventy-two households' employment will increase from 6,000 to 20,000 brains. 2 The development of electric carcasses in India and the development experience of Taiwan over the past five years can be seen as unlimited. Development must shift towards a knowledge-based economy, and irrespective of θ: Second foreign investment can no longer rely on cheap labor, d ^ = Hai wants to establish a good knowledge-based economic environment. The reform of the education mechanism is the best. 0492-7642TWF (nl); 90 -149; EDWARD.ptd Page 8 1234097 V. Description of the invention (3) First, because of the accumulation of human knowledge, it is impossible to educate. J = "is education. Lack of quality educators' economic competitiveness. "=: Next :: 'It is not possible to innovate knowledge and strengthen the ability and effectiveness of national studies. One subject is designed to enhance academic education and pay more attention to thinking; the second is: basic skills necessary for mothers. Analysis, diagnosis, and day counting "Cultivation of power" such as: innovation, problem solving, in the era of knowledge-based economy, the company's economic growth and the country's economic growth, and the innovation of Chong Lu, the knowledge Cf force proposed last year. Built directly on the knowledge plate =: The so-called knowledge economy is economic, and the traditional production factors such as the creation of knowledge and applications and the use of gold are driven by land and capital. ”Therefore, the information economy continues to develop and move the economy. Core concepts of development. Knowledge in the country can be divided into explicit logic or intuition in the human conception. Actually, text or graphics cannot be used to improve the collaborative knowledge base tool (Quality Improvement Te Qiao Knowledge Base Tool). The comparative experience and intuition still have its irreplaceable status. Process; since the record and keep it to establish "Quality Improvement Collaborative Knowledge Basis System"% Verification — to save the data as a whole and make it available to all engineers for inquiries. After the construction is completed, the following substantial benefits in the entire production management operation system can be expected in the future: F will get

1234097 V. Description of the invention (4) 1 · Engineering processing experience will be systematically retained, and the original paper archiving operation will be replaced by the electrical system. Systematically replace the sentence: written information, which is more convenient for personnel's query action. 4 This project = verified data can show its effectiveness. '2. Newly-entered engineers can use this system to inquire about the valuable processing experience left by the engineers before the abnormal teaching of a machine. As a training principle, it can narrow the scope of the machine's abnormal causes and guide workers: : The direction 'makes the newly-advanced health engineers in the entire learning curve through 3 departments \ by borrowing from the system to cross-module communication' all personnel can be processed by other engineers and the processing experience of other modules As a result, the relative experience and knowledge of going to work in one of the other engineering fields is quite helpful for a test. The report of the teacher + stop, but the assignments are replaced by the "Q1 τ summary table" instead of the engineering report format, which can be used to unify the χ. / ,,,, σ results. And the report of the engineer to his supervisor [Summary of the Invention] In order to achieve the above-mentioned purpose, a basic system is suitable for the production of a kind of quality improvement cooperative process. It is used for one process A μ L in one process. Including a computer host. A terminal ， Products produced on D. Ports, charter planes, for input—special,. ,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,-,-,-,-,-,-,-,-,-,-,-,-,-,,-,-,-,-,-,-,,-Integrate-I, Hang-type-quality-improvement-coordination

0492-7642TWF (η 1); 9.10.149; EDWARD Ptd Page 10 Quality Improvement Coordination Office $ & Include first-the abnormal heart shape is welcomed early, check the Delhi 1234097 V. Description of the invention (5) Management unit An improved quality improvement collaborative processing unit, an abnormal heavy industry quality improvement collaborative processing unit, and a plurality of tools are used to analyze the abnormality of the process or the machine to improve the quality of the product. The present invention further provides an operating procedure of a quality improvement collaborative knowledge base system, which is applicable to products produced on a machine by a process. First, a system is provided. The system includes a computer host, and the computer host is connected to the computer host via a network. A terminal, and an integrated system implemented in the host computer, the integrated system includes an abnormal quality improvement cooperative processing unit, an abnormal quality improvement cooperative processing unit after checking, an improved quality improvement cooperative processing unit, An abnormal heavy industry type quality improvement cooperative processing unit and plural tools. When an abnormal problem is found in this process or on this machine, the integrated system is entered, and one of the subsystems in the integrated system is selected according to the abnormal problem. Finally, according to the abnormal problem and the subsystem, this tool is used to analyze the process or the abnormal condition of the machine to improve the quality of the product. [Embodiment] Fig. 1 shows a block diagram of a quality improvement collaborative knowledge base system in this embodiment. The devices used in this quality improvement collaborative knowledge base system include: computer host 10, several department terminals 20, 30, 40. The computer host 10 can be any type of computer host system, or multiple types of computer hosts or servers are connected in series. The computer host 10 also functions as a network server 12 at the same time. The host computer 10 and the terminals 20, 30, and 40 are connected through a network 90, such as the Internet, a local area network (LAN), and a wide area network. , WAN) or other types of networks.

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V. Description of the invention (6), the host computer 10 of this embodiment has a software component (subsystem) integration system 50. This integration system 50 includes a day-to-day abnormal quality improvement cooperative processing unit 52, and a post-development check (After Devei〇pment

Inspection, ADI) abnormal quality improvement cooperative processing unit 54, an improved product ^ improved collaborative processing unit 56, an abnormal heavy industry type quality improvement coordinated processing unit 58, a system maintenance unit 60, and a plurality of tools 70 used. Use ^ to explain the operation content of each software component (subsystem). 1 s 1 · Official abnormal quality improvement collaborative processing unit 5 2: This processing unit is used to provide equipment or process engineers with regard to abnormal events that occur in the machine or process in Changzhong. The supervisor assigns tasks or specifications for control. It is abnormal, and the processing time is within 5 days for the registration, maintenance and inquiry of abnormal events. f After the abnormal login of the day management, in addition to the basic data, there are normal groups and abnormal groups with analysis results, which are used to explain the differences between normal conditions and abnormal conditions' and emergency measures in cases where the true cause is unknown. When the true cause is known, 'it is possible to enter the true cause, the countermeasures for the process, and the effect after the process' and explain what countermeasures can be taken to prevent recurrence, whether to establish a standard operating procedure (SO P) and expand to other levels. Machine. 2 · AD I abnormal quality improvement collaborative processing unit 54: This processing unit is provided to the lithographic equipment or process engineer and is found during the after development inspection (ADI) The registration, maintenance and inquiry of abnormal events or specifications that affect the machine, product, batch number 'station and processing time within five days. After checking the abnormal login, you can enter the abnormal product model, batch

0492-7642TWF (η 1); 90-149; EDWARD.ptd Page 12 1234097 V. Description of the invention ⑺ The station type, and the analysis results are positive Λ s A ice hoist, and and anomaly group, used to explain | T 太 —the inferiority of the situation and the abnormal situation, * aCa 丄 — a & Θ under the normal condition and the abnormal situation $ solid ^ eight six ΦW find the difference between 坭 明 正 and 杳 挟 # 'and check The truth is that Goff has clearly identified that the abnormality occurred in the previous layer or this layer after the check of the β policy and = and and im: ϊ ': You can enter true ® in the system, what countermeasures are processed f + M a month In order to prevent recurrence You can do the opposite, whether you want to establish a standard drop J to take other machines. Thousand cups of order (S0P) and horizontal expansion to improve the mouth quality improvement collaboration mouth: ... process or machine found significant / two. This / two 'element system is resolved, the time limit for processing in the /, hanging events "must Cross-department allegations (· η. Theme sources such as specifications, defective products xrr,), departmental policy improvement, cost reduction, change registration, maintenance, and inspection ;: Productivity issues such as productivity improvement, waste reduction and pollution improvement 4 vary Li Changdang heavy industry Λ quality. Improved collaborative processing unit 58: it is targeted at 奸 σ ^ but it is not required to be scrapped by the engineer, only re-processing WAT # in / D registration and tracking, and depending on the degree or demand of heavy industry: The analysis of the electrical properties and yields' is to clarify step by step whether the heavy products have a significant impact on the yield. After the different cranes are logged in, enter the abnormal product route (route), model, batch number, normal and The basic information such as abnormal manufacturing processes are used to explain ^ those products that need to be reworked if they are abnormal. ”$ 重工 '' 、、 ° The results are analyzed by electrical analysis and yield analysis in WAT (wafer acceptance test ing) in order to understand After heavy industry is

1234097

V. Description of the invention (8) -________ Does it have any impact on the yield, and explains the method of the result, and finally returns to the integration engineering department to make conclusions and future processing standards 5 · System maintenance unit 60: Provide two special recommendations. The data, abnormal items, abnormal causes, and abnormal pair flutes a are aimed at the basic system operation of the engineer. Maintenance, so that in addition, according to common QIT analysis methods, Γ0, t assists the engineer to analyze and record the detailed information of the supply / portion abnormality, so that the machine can be used as a “clothing inspection”. After querying and training new engineers, the retention of these received iC sources is mainly divided into several categories. The first category is the machine ... the collected data, and the second one is the transfer data of the machine connection test factory. The third type of input asset is WAT or engineer's own judgment turn: the fifth type is phase or scan pattern. The introduction of the machine or product of the following types, types, and types: The following is a detailed description of each tool of the tool 70 1 Trend chart 71: F1 graphic system through the connection of manual or manual input Display trend graphs for sets of machine or RTC regulated items to watch Edc engineers enter what they want 'parallel-by-step interpretation. The time interval and parameters of the trend graph will be displayed. The system can further explain. In the document or file, the engineer can input the factor analysis diagram 72 · ^-in the system, the system 'commonly known as the fishbone diagram, provides the user with a common factor analysis diagram, and a factor analysis diagram is generated by a cow. Let engineers be able to μ

0492-7642TW (nl); 90-l49; EDWARD.ptd Step 14—step t clear the problem, system = 1234097 V. Description of the invention (9) The function for marking allows engineers to mark the most important Factors also have the ability to modify, so that engineers can more easily modify if they find new factors or wrong factors during analysis. 3 · Scanning pattern 7 3: Allows the engineer to attach the abnormal condition image captured or scanned from the machine or product, as a proof of normal or abnormal conditions or as a future reference. 4 · Regression analysis 7 4: The engineer performs experiments or observes the values on the independent variables and strain numbers. After entering the system, the system automatically generates graphics and calculates the regression equation and correlation coefficient once to understand the independent variables and strain numbers. Correlation. 5 · AN0VA analysis 75: AN0VA analysis is to decompose the total sample variation into known and unexplained variation, and use F right-tail test to determine whether the average between mothers is the same. The system provides one factor and two factors. Due to AN0VA analysis, after the user enters the corresponding value and selects a significant level, the system automatically calculates its F value and its significant condition, which is used to check whether the average number between the parents is the same. For example, the engineer wants to verify whether the furnace tube temperature will affect the The thickness of the oxide layer, the observed data, after entering the following values into the system, the system will bring out the F value 9. 50 4 greater than F (0.503.24, indicating a significant degree of difference. 6 · Estimated verification 7 6: Give a hypothetical value for an unknown parameter, and then randomly sample a sample from the parent to use the principle of probability to test whether this hypothesis holds. The user performs experiments or observations on the parameters of the suspect point, and the obtained value is entered into the system and After selecting a significant level, the system automatically calculates its Z value and determines whether it is significant in order to test whether the hypothesis of the parent is

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It is true, for example, the engineer claims that the oxide layer has fallen off, and randomly removes 16 pieces from the product. The system calculates z value = 4 · 5 8 1 7, which is a significant difference at 0. The average thickness is 4 3 0. It is suspected that the following values have been obtained. After being brought into the system, the two-tailed test in the 〇5 k Lai interval has 7. Histogram 77: The histogram can be used to determine whether the mother can be assigned normally. , And whether there is a difference between the two histograms of the level, the system provides users to choose the CP output value 'EDC' RTC or WAT module to draw the histogram / these values are connected by the machine, manually entered and tested by the factory The data of the project is converted to the engineering data of the material library, which is provided to the engineers for judgment in a graphical manner of frequency distribution, and whether there is a difference between the different machines. 8 · Wafer Map 7 8 ·· Use the wafer map data returned by the test factory to draw the wafer map and the range of the mask for the batch number selected by the user. 'It can be used for engineers to produce CP on the wafer map. Whether there is a certain trend in the value 'to further judge the impact caused by the machine or the mask. For example, if the output of the mask is low on the periphery, it indicates that there may be an abnormality when the mask is aligned. 9 · KT tool 79: Provide a fixed input format for users to use simple KT method to clarify the problem. The engineer level identified this abnormal machine or process (what) problem, but in a similar Machine / table? There is a problem, where (wh e r e) does this occur, elsewhere? There are abnormal events that occurred, when did they occur, when did they not have the same abnormal events, and other extended problems (Extent), then enter the system as a control to find the problem point. 1 0 · Attach 0 f f i c e file 8 0: Provide users to attach in the system

1234097 V. Description of Invention (11)

Microsoft Office files, including Word, Excel, Power Po int, etc. for the convenience of users to retain all data more flexibly and completely. When the engineer has a previously saved file box or document, save it with 0 ffi ce, if you need to refer to This document can be attached as a future reference. In addition to the engineering experience of a systematic storage engineer, in order to make the quality improvement collaborative knowledge base system more effective use of this knowledge, the quality improvement collaborative knowledge base system strengthens the query function and provides the following functions: 1. Keyword searchable, In addition to displaying the search method, 2. The statistics of the abnormal item π, π, π, π, and π of the true cause π allow the engineer to clear his eyes, the true cause, and 3. The engineer's status of all engineers can be provided to this embodiment as described later. Computer-user interface machine 10. A software query: After entering the keywords you are looking for, the system will have related registered information, such as allowing engineers to find the information they are looking for in a more convenient way, in addition to the normal ones. Material query: Single machine query: List the pull charts under a single machine, and then query the map of a single abnormal item, and then display "Countermeasures" for the same true cause. The most frequently occurring abnormal items under this machine. Query of processing times: query by module, the distribution chart of processing times in the column, and the query and comparison of each case's engineers and supervisors can be checked down. Improve the operating procedures of the collaborative knowledge-based system. The host 10 and department terminals 20, 30, and 40 are provided to allow users to enter and rotate out relevant information to the computer main component (subsystem) integration system 50 settings and Computer owner

$ 17 pages 1234097 V. Description of the invention (12) Implemented in machine 10 to generate a corresponding message based on the above-mentioned rotation and output information. Figure 2 shows the flow chart of the operation procedure of the quality improvement collaborative knowledge base system of this embodiment. First, as shown in step S 300, a system is provided, including a computer host 10, terminals 20, 30, and 40 connected to the computer host 10 via a network 90, and executed in the computer host 100. One software component (subsystem) integration system, system 5 (3 °

Then, as shown in the step "10, when the manual input, machine connection or CP, WAT test finds an abnormal problem in the process or machine, the engineer enters the system 50, and judges the time or abnormality that it may handle. After seriousness, select appropriate subsystems, including tube abnormal quality improvement collaborative processing unit 52, post-development check abnormal quality improvement collaborative processing unit 5 4, improved quality improvement collaborative processing unit 5 6, abnormal heavy industry quality Improve the collaborative processing unit 58, system maintenance unit 60, and plural tools 7. After that, as shown in step S320, select the abnormal machine and the abnormal item. If the abnormal item has experienced a warp, use the old one. Abnormal items, otherwise enter a new abnormal item, with the help of ten analysis tools 7 〇, gradually send out the part of the true cause, if the true cause is still unknown, you can temporarily store 0

Finally, as shown in step S330, after further observation or experimentation, 'if the cause is found', the engineer enters the preliminary settlement after turning in all the relative information, and the system actively sends an email to the bean supervisor to notify The supervisor enters the system to sign, and if there is still any doubt that needs to be cleared up, he can return the case, and the system will notify the original processing engineer and change the case to

1234097 V. Description of Invention (13) The case is closed. If the supervisor approves, the system will also notify the engineer, and the case will enter the formal close. According to the above, the present invention has the following advantages: 1 · The learning curve of new hires will be shortened; 2 · Machine crashes, 00C and other processing time reduction (MTTR), machine crash processing time meter can be reduced by about 10 %, The RTC 00C processing time meter can be shortened by about 5%, the total production time can be increased by about 2%, and the wafer output can be increased by about 548 PCS ° 3 · Reduce the paper usage of engineering reports by engineers. 4 · Engineering personnel query machine processing time is shortened. Although the present invention has been disclosed as above by the description of the preferred embodiment, it is not intended to limit the present invention. Any person skilled in the art can make some changes and decorations without departing from the spirit and scope of the present invention. The protection scope of the present invention shall be determined by the scope of the attached patent application.

0492-7642TWFC η 1); 90-149; EDWARD.p t d page 19 1234097_ Brief description of the diagram The first diagram is a block diagram showing a quality improvement collaborative knowledge base system in this embodiment. FIG. 2 is a flowchart showing the operation procedure of the quality improvement collaborative knowledge base system of this embodiment. [Symbols] 10 to computer host; 12 to network server; 20, 30, 40 to terminal; 90 to network; 50 to software component integration system; 5 to 2 exception Type quality improvement collaborative processing unit; 5 4 ~ post development check abnormal quality improvement collaborative processing unit; 5 6 ~ improved quality improvement collaborative processing unit; 5 8 ~ abnormal heavy industry type quality improvement collaborative processing unit; 6 0 ~ system maintenance unit 70 ~ tools 71 ~ trend diagram 72 ~ factor analysis diagram 7 3 ~ scanning graph 7 7 ~ regression analysis 75 ~ AN0VA analysis 76 ~ estimation verification 77 ~ histogram 78 ~ wafer map

0492-7642TWF (η 1); 90-149; EDWARD.p t d p. 20 1234097 Schematic illustration 79 ~ KT tool; 80 ~ additional Office slot case. Page 0492-7642TWF (η 1); 90-149; EDWARD.p t d

Claims (1)

1234097 VI. Scope of patent application 1. A quality improvement collaborative knowledge base system suitable for products produced on one machine by one process, including: a computer host; a terminal connected to the computer host through a network, using To input a specific data to the computer host; and 4 'an integrated system to execute in the computer host, the integrated system includes a plurality of subsystems, the above subsystems include a day-to-day abnormal quality improvement collaborative processing unit, a check A post-abnormal quality improvement collaborative processing unit, an improved quality improvement collaborative processing unit, an abnormal heavy industry type quality improvement collaborative processing unit, and a plurality of tools for analyzing abnormal conditions of the process or the machine to improve the quality of the product; when When an abnormal problem is found on the process or the machine, the integration system selects one of the subsystems in the integration system based on the abnormal problem, and uses the tool to analyze the abnormality based on the abnormal problem and the subsystem. Manufacturing process or abnormal conditions of the machine to improve the quality of the product The first term of quality improvement collaborative knowledge base system, wherein the said tube anomalous quality improvement processing unit to provide a synergistic log maintenance abnormal event occurred within 5 days for the process or machine table and the query. 3. The quality improvement collaborative knowledge base system described in item 1 of the scope of patent application, wherein the post-check abnormal quality improvement collaborative processing unit is to provide registration for abnormal events that occur within the process or after the check of the machine within 5 days , Maintenance and inquiry. 4 · Quality improvement collaborative knowledge base as described in item 1 of the scope of patent application 0492 -7642TWF (η 1); 90-149; EDWARD.ptd Page 22 1234097 6. The scope of the patent application system, in which the improved quality improvement collaborative processing unit is provided for the process or the machine found significant within 5 days. Abnormal events include registration, maintenance and inquiry of department policy improvement, cost reduction improvement, safety maintenance improvement, productivity improvement, waste reduction and pollution improvement improvement. 5. The quality improvement collaborative knowledge base system described in item 1 of the scope of the patent application, wherein the abnormal heavy industrial quality improvement collaborative processing unit is to provide products that are abnormal, but do not need to be scrapped, and only need to be reprocessed. track. 6. The quality improvement collaborative knowledge base system described in item 1 of the scope of patent application, wherein the tool is used to analyze and record abnormal processing status data of the process or the machine to systematically retain such processing status data. 7. The quality improvement collaborative knowledge base system described in item 1 of the scope of patent application, wherein the tool includes a trend chart, which is a trend chart for the data collected by the machine connection or manual input to observe EDC or RTC control Item variation and further interpretation. 8 · The quality improvement collaborative knowledge base system described in item 1 of the scope of patent application, where the tool includes a factor analysis chart, which provides an input interface, and uses the factor analysis chart to clarify the problem. 9. The quality improvement collaborative knowledge base system as described in item 1 of the scope of the patent application, wherein the tool includes a scanning pattern, which is an additional image of the abnormal condition photographed or scanned from the machine or the product as a function of Confirmation under normal or abnormal conditions or future reference. 10. The quality improvement collaborative knowledge base as described in item 1 of the scope of patent application 0492- 764 2TWF (η 1); 90-149; EDWARD.ptd Page 23 1234097 6. The scope of the patent application system, where the tool includes a regression analysis, which is based on the experimental and observational values of independent variables and strain numbers After entering the system, the system automatically generates graphics and calculates the regression equation and correlation coefficient once to understand the correlation between independent variables and strain numbers. 1 1. The quality improvement collaborative knowledge base system described in item 1 of the scope of patent application, wherein the tool includes an ANOVA analysis, which is to analyze the total variation of the sample into the variation caused by known factors and the unexplained variation. The right tail test is used to determine if the mean between the mothers is the same. 12. The quality improvement collaborative knowledge base system described in item 1 of the scope of patent application, wherein the tool includes an estimation test, which is based on the principle of giving an assumed value to an unknown parameter, and then randomly drawing a sample from the parent to use the probability To test whether this hypothesis is true, experiment or observe the parameters of the questionable point. After the obtained value is entered into the system and a significant level is selected, the system automatically calculates its Z value and determines whether it is significant to test whether the hypothesis of the parent is true. . 1 3. The quality improvement collaborative knowledge base system described in item 1 of the scope of patent application, wherein the tool includes a histogram, which is used to determine whether the parent is normally assigned, and whether there is a difference between the two histograms of the level. The system provides the user to choose the CP output value, and the EDC, RTC or WAT module will output the histogram daily. 1 4. The quality improvement collaborative knowledge base system described in item 1 of the scope of patent application, wherein the tool includes a wafer map, which uses the wafer map data returned by the test plant to draw the wafer map and light Hood range. 1 5. The quality improvement collaborative knowledge base as described in item 1 of the scope of patent application 0492-7642TWF (η 1); 90-149; EDWARD.p t d p. 24 1234097 VI. Scope of patent application The system includes an additional file of 0 f f ce, which provides auditing of Microsoft Office in the system. 1 6. — An operating procedure of a quality improvement collaborative knowledge-based system, which is applicable to products produced on one machine by one process, including the following steps: Provide a system that includes a computer host and is connected to the network via a network. A terminal of a computer host and an integrated system implemented in the computer host. The integrated system includes a plurality of subsystems, and the subsystems include an abnormal quality improvement cooperative processing unit and an abnormal quality improvement cooperative processing after checking. Unit, an improved quality improvement collaborative processing unit, an abnormal heavy industry type quality improvement collaborative processing unit, and a plurality of tools; when an abnormal problem is found in the process or the machine, enter the integrated system, according to the situation of the abnormal problem , Select one of the subsystems in the integrated system; and use the tool to analyze the process or the abnormal condition of the machine to improve the quality of the product according to the abnormal problem and the subsystem. 1 7. The operation procedure of the quality improvement collaborative knowledge base system described in item 16 of the scope of patent application, wherein the abnormal quality improvement collaborative processing unit is provided for the abnormal events occurring within the process or the machine within 5 days. Login, maintenance and query. 1 8. The operating procedure of the quality improvement collaborative knowledge base system as described in item 16 of the scope of the patent application, wherein the abnormal quality improvement collaborative processing unit after inspection is provided for the process or inspection of the machine within 5 days. Login, maintenance, and query of abnormal events. 1 9. Collaborative knowledge of quality improvement as described in item 16 of the scope of patent application 0492 -7642TWF (η 1); 90-149; EDWARD.ptd Page 25 1234097 VI. Patent application scope of the basic system operating procedures, where the improved quality improvement collaborative processing unit is provided for the process or the machine within 5 days The major abnormal events discovered by the station include the registration, maintenance, and inquiry of departmental policy improvement, cost reduction improvement, safety maintenance improvement, productivity improvement, waste reduction and pollution improvement. 2 〇 · The operation procedure of the quality improvement cooperative knowledge base system described in item 16 of the scope of patent application, wherein the abnormal heavy industry type quality improvement collaborative processing unit is provided for product exceptions, but does not need to be scrapped, and only needs to be reprocessed. Product, log in and track. 2 1 · The operating procedures of the quality improvement collaborative knowledge base system as described in item 16 of the scope of patent application, where the tool is used to analyze and record the abnormal process status data of the process or the machine to systematically Keep such processing status information. 2 2. The operation procedure of the quality improvement collaborative knowledge base system as described in item 16 of the scope of patent application, wherein the tool includes a trend chart, which displays the trend chart for the connection of the machine or manual input of the collected data to Observe the variation of EDC or RTC control items and further interpret. 2 3. The operating procedure of the basic system for quality improvement collaborative knowledge as described in item 16 of the scope of patent application, wherein the tool includes a factor analysis chart, which provides an input interface and uses the factor analysis chart to clarify the problem. 2 4. The operating procedure of the quality improvement collaborative knowledge base system as described in item 16 of the scope of the patent application, wherein the tool includes a scanning pattern, which is an additional condition photographed or scanned from the machine or the product. The graphic is used as a confirmation under normal or abnormal conditions or as a future reference. 2 5. Quality improvement collaborative knowledge as described in item 16 of the scope of patent application 0492-7642TWF (η 1); 90-149; EDWARD.p t d p.26 1234097 6. The operating procedure of the basic system for applying for patents, in which the worker examines the independent variables and strains =-regression analysis. After the system is introduced, the system automatically generates the value. Enter the coefficient to understand your age. ^ Correlation of 4 degree regression equations and related fresh self-numbers and strain numbers. .26 · As the basis of the basic system described in the scope of the application for patents, chapter 16 轺 床 甘 士 # ——Bei improved collaborative knowledge, including the private order of dishes, where the tool includes-AN0VA points Jiao, said the total sample Variety Ba Niu # a 1 m ± ㈣υνΑ knife analysis, surprised, use F right / k knives to resolve the variation caused by known factors and unexplained hair change test to determine whether the average number between mothers is the same. λ η Cooperative knowledge of quality improvement as described in item 16 of the scope of patent application i η The operating procedure m tools include-estimation check, which assumes the values given by the parameters known by the needle-like IS, and then randomly extracts samples from the mothers to use The principle of probability is used to test whether this hypothesis is true. Experiments or observations are performed on the suspect points and parameters. The obtained value is entered into the system and a significant level is selected. The system automatically calculates its Z value and determines whether it is significant. Assume it holds. 28. The operation procedure of the quality improvement collaborative knowledge base system as described in item No. 丨 6 of the scope of patent application, where the work difference includes a histogram, which is used to determine whether the parent is a normal distribution, and the two histograms of the level. If there is a difference between them, the system provides the user to select the CP value, and the EDC, RTC or WAT module draws the histogram. 2 9 · The operation procedure of the quality improvement collaborative knowledge base system described in item 16 of the scope of patent application, wherein the tool includes a wafer map, which uses the wafer map data returned by the test plant to draw the crystal Circle map and mask range. 0492-7642TWF (nl); 90.i49; EDWARD.ptd 1234097 VI. Scope of patent application 3 0 · The operation procedure of the quality improvement collaborative knowledge base system as described in item 16 of the scope of patent application, in which the tool includes an additional 0 ffice broadcast case, which provides additional M icrosoft 0 in the system ffice eaves case. 0492-7642TWF (n1); 90-149; EDWARD.p t d p.28