TWI227239B - Ruthenium complex, process for producing the same and process for producing thin film - Google Patents

Ruthenium complex, process for producing the same and process for producing thin film Download PDF

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TWI227239B
TWI227239B TW91120626A TW91120626A TWI227239B TW I227239 B TWI227239 B TW I227239B TW 91120626 A TW91120626 A TW 91120626A TW 91120626 A TW91120626 A TW 91120626A TW I227239 B TWI227239 B TW I227239B
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ruthenium
general formula
represented
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Kazuhisa Kawano
Kenichi Sekimoto
Noriaki Oshima
Tetsuo Shibutami
Shuji Kumagai
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Tosoh Corp
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Abstract

A ruthenium-containing thin film is produced by the chemical vapor deposition method etc. with the use of an organometallic ruthenium compound represented by the general formula (1), specific example of which is (2,4-dimethyl-pentadienyl) (ethylcyclopentadienyl) ruthenium: or an organometallic ruthenium compound represented by the general formula (7), specific example of which is carbonylbis (2-methyl-1,3-pentadiene) ruthenium: as the precursor.

Description

r1227239 A7 經濟部智慧財產局員工消費合作社印製 ______B7五、發明説明(1) 發明領域 本發明有關一種有機金屬釕錯合物,其可用以藉由化 學氣相沉積方法(以下稱爲CVD方法)、塗層熱分解法等 方法形成含有釕之薄膜,其製法及製造使用於電子裝置諸 如半導體記憶體中之含釕薄膜的方法。 發明背景 隨著記憶體構件之精密加工的進步及近彰對於高度積 合半導體記憶體裝置的傾向,已嘗試使用鐵電性薄膜諸如 (Ba,Sr)Ti〇3作爲電容器中之絕緣薄膜。具有鐵電性薄膜 之電容器中,使用貴金屬諸如pt、Ru及ir作爲電極。此 等金屬中,預測Ru係最有效之電極材料,因其氧化物具 有電導係數及優越之精密加工性質。因此,已於由;Ru薄 膜或RuCh薄膜製得之電極上進行檢測。爲於高度積合之 記憶體裝置中形成該種含釕之薄膜,CVD方法係爲最適 當之方法,因其階度覆蓋性及組成控制性優越。 一般認爲具有低熔點且可輕易地於金屬化合物中操作 之有機金屬化合物係爲適於藉此CVD方法形成薄膜之前 驅物。就用於沉積釕或釕氧化物薄膜之有機金屬化合物而 言,實際上係使用釕錯合物或三(二特戊醯基甲基)釕(以 下稱爲Ru(DPM)3)[日本公開專利第283438/1 994號]或三( 辛烷-2,4-二酮基)釕(以下稱爲ru(0D)3)[日本公開專利第 2 0 0 0 - 2 1 2 7 4 4號]。釕錯合物具有夾層結構,釘係夾置於兩 個各僅由碳及氫所構成之環戊二烯環之間。因爲在大氣中 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) ~ —/i mm (請先閱讀背面之注意事項再填寫本頁) 裝·r1227239 A7 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economics ______ B7 V. Description of the invention (1) Field of the invention The present invention relates to an organometallic ruthenium complex, which can be used by chemical vapor deposition (hereinafter referred to as CVD method) ), Coating thermal decomposition method and the like to form a thin film containing ruthenium, a manufacturing method thereof, and a method for manufacturing a ruthenium-containing thin film used in electronic devices such as semiconductor memories. BACKGROUND OF THE INVENTION With the advancement of precision processing of memory components and the recent trend towards highly integrated semiconductor memory devices, attempts have been made to use ferroelectric films such as (Ba, Sr) Ti03 as insulating films in capacitors. In a capacitor having a ferroelectric thin film, noble metals such as pt, Ru, and ir are used as electrodes. Among these metals, Ru is predicted to be the most effective electrode material because its oxides have electrical conductivity and superior precision machining properties. Therefore, detection has been performed on electrodes made of Ru thin film or RuCh thin film. In order to form such a ruthenium-containing film in a highly integrated memory device, the CVD method is the most suitable method because of its step coverage and composition control. Organometallic compounds which have a low melting point and can be easily handled in metal compounds are generally considered to be suitable precursors for forming thin films by this CVD method. As for the organometallic compound used for depositing a ruthenium or ruthenium oxide film, a ruthenium complex or tris (di-pentamylmethyl) ruthenium (hereinafter referred to as Ru (DPM) 3) is actually used [Japanese Publication Patent No. 283438/1 994] or tris (octane-2,4-diketo) ruthenium (hereinafter referred to as ru (0D) 3) [Japanese Laid-Open Patent No. 2 0 0 0-2 1 2 7 4 4 ]. The ruthenium complex has a sandwich structure, and the nail system is sandwiched between two cyclopentadiene rings each consisting only of carbon and hydrogen. Because in the atmosphere, this paper size applies the Chinese National Standard (CNS) A4 specification (210X297 mm) ~ — / i mm (Please read the precautions on the back before filling this page)

、1T 線 1227239 A7 B7 經濟部智慧財產局員工消費合作社印製 五、發明説明(2) 極爲安定且不具有毒性,釕錯合物適於作爲CVD前驅物 。然而,該前驅物之蒸發及傳送至基材具有困難度,因爲 其於常溫下係爲固態,且具有約200t之相對高熔點。 是故,近年來對於具有較低熔點之釕化合物積極地進 行硏究。含釕之有機金屬化合物的熔點可藉著將其轉化成 釕錯合物衍生物而降低,其中釕錯合物之環戊二烯環中至 少一個氫原子係由烷基諸如甲基或乙基所置換。例如,曰 本公開專利第35589/1 999號揭示雙(烷基環戊二烯基)釕, 例如雙(乙基環戊二烯基)釕(以下稱爲Ru(EtCp)2)及雙(異 丙基環戊二烯基)釕爲釕錯合物衍生物。此外,日本公開 專利第2000-281694揭示經烷基取代之釕錯合物作爲CVD 前驅物的用途。其陳述此等有機金屬化合物於常溫下各處 於液態,具有低於釕錯合物之熔點,即具有作爲適用於 CVD方法之前驅物所需的特性。然而,此等雙(烷基環戊 二烯基)釕基本上係具有釕錯合物結構。因爲此種結構具 有極高安定性,因此,此等錯合物具有極高之分解溫度。 因此,在薄膜形成時,基本上需升高基材溫度,導致階度 覆蓋性變差之問題。 另一方面,R. Gleiter 等人(Organometallics,8,298 (1989))記載(環戊二烯基)(2,4-二甲基環戊二烯基)釕爲合 成具有環戊二烯基配位基之半夾層錯合物的實例。然而, 此種錯合物無法視爲適當之CVD前驅物,因爲具有1 36 至13 7 °C之熔點,且於常溫下係固體。根據記載,尙未合 成在室溫下爲液態且顯示優越之蒸發性質的半夾層釕錯合 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) (請先閱讀背面之注意事項再填寫本頁) -裝·1T line 1227239 A7 B7 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 5. Description of the invention (2) Extremely stable and non-toxic, ruthenium complexes are suitable as precursors for CVD. However, the evaporation and transfer of the precursor to the substrate is difficult because it is a solid at normal temperature and has a relatively high melting point of about 200t. For this reason, ruthenium compounds having a lower melting point have been actively investigated in recent years. The melting point of a ruthenium-containing organometallic compound can be lowered by converting it to a ruthenium complex derivative, wherein at least one hydrogen atom in the cyclopentadiene ring of the ruthenium complex is an alkyl group such as methyl or ethyl The replacement. For example, Japanese Patent Publication No. 35589/1 999 discloses bis (alkylcyclopentadienyl) ruthenium, such as bis (ethylcyclopentadienyl) ruthenium (hereinafter referred to as Ru (EtCp) 2) and bis ( Isopropylcyclopentadienyl) ruthenium is a ruthenium complex derivative. In addition, Japanese Laid-Open Patent No. 2000-281694 discloses the use of an alkyl-substituted ruthenium complex as a CVD precursor. It states that these organometallic compounds are in a liquid state at ordinary temperature and have a melting point lower than that of a ruthenium complex, that is, they have characteristics required as precursors for use in a CVD method. However, such bis (alkylcyclopentadienyl) ruthenium basically has a ruthenium complex structure. Because this structure has extremely high stability, these complexes have extremely high decomposition temperatures. Therefore, when the film is formed, it is basically necessary to raise the temperature of the substrate, resulting in a problem that the step coverage is deteriorated. On the other hand, R. Gleiter et al. (Organometallics, 8,298 (1989)) describe that (cyclopentadienyl) (2,4-dimethylcyclopentadienyl) ruthenium is synthesized with cyclopentadienyl Examples of half-sandwich complexes of ligands. However, this complex cannot be considered a suitable CVD precursor because it has a melting point of 1 36 to 13.7 ° C and is a solid at room temperature. According to the record, osmium has not been synthesized at room temperature and is semi-sandwich ruthenium with excellent evaporation properties. This paper is sized to the Chinese National Standard (CNS) A4 (210X297 mm) (Please read the precautions on the back first) (Fill in this page)

、1T •Μ線 -5- 1227239 A7 B7 五、發明説明(3) 物。 裝-- (請先閱讀背面之注意事項再填寫本頁) 爲合成半夾層釕錯合物,一般係一次添加戊二烯衍生 物、環戊二烯衍生物、鋅及鹵化釕水合物於適當之溶劑, 之後於適當之反應條件下進行反應。然而,此種方法實際 上無法使用,因爲僅能達到極低之產率。就反應後之後處 理而言,液體反應混合物亦經濃縮以產生糊狀混合物,標 的產物使用適當之溶劑自該糊狀混合物萃取出來,之後經 鈣礦石過濾或使用氧化鋁管柱進行管柱層析而進行純化, 產生標的產物。然而,此種方法包括不利於工業化之步驟 ,諸如在完成反應之後自濃縮所得之糊狀混合物進行萃取 ,及鈣礦石過濾或管柱層析。因此,爲工業化地製得半夾 層有機金屬釕化合物,極需要建立一種可於高產率下於穩 定狀態下得到標的產物的製造方法。 線· 經濟部智慧財產局員工消費合作社印製 另一方面,藉塗層熱分解方法形成薄膜係應用於製造 具有相對低之積合度的元件。因爲使用於塗層熱分解方法 中之前驅物在使用之前係溶解於有機溶劑中以控制薄膜厚 度,因此此等前驅物以可溶於有機溶劑中且於低溫下分解 爲佳。然而,具有前述特性之釕化合物極少。 除了 羰基雙(1,3-丁二烯)釕(D. Minniti and P.L· Timms, ;[.〇1^&11〇11^1(:1^111.,258,(:12 (1983))、羰基雙(2,3-二甲 基-1,3-丁二烯)釕及羰基雙(1,3-環己二烯)釕(D.N. Cox and R· Roulet,Helv· Chim. Acta,67,1 365 ( 1 984))之外,並無 已知之羰基雙(二烯)釕錯合物。此等錯合物係藉由需要在 低溫下反應之方法製得,即Ru與二烯於-196°C下進行反 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) -6- 1227239 A7 B7 五、發明説明(4) 應,之後添加C〇。 CVD方法中,作爲薄膜前驅物之錯合物應以氣體形 式施加。目前所採用之錯合物中,Ru(DPM)3係藉昇華蒸 發,因爲其168 °C之高熔點之故。藉昇華蒸發時,發生該 前驅物氣體濃度因爲固體表面積改變而變化,因而無法穩 定地提供前驅物氣體之問題。爲克服此項問題,日本公開 專利第1 32776/1 993號提出一種方法,其中錯合物係於使 用之前溶解於有機溶劑中。然而,該前驅物於此方法亦非 始終穩定地供料,因爲產生溶劑單獨蒸發或固體於溶劑與 錯合物之間的蒸發性質差異而沉積的一些問題。另一方面 ,Ru(〇D)3及Ru(EtCp)2不會有穩定提供前驅物之問題, 因爲其於室溫下各爲液體,且具有相對高之蒸汽壓。然而 ’此等錯合物中,Ru係穩定地鍵結於個別有機配位基上 。因此,此等錯合物難以分解,應於高溫下進行處理以形 成薄膜。 發明槪沭 本發明係針對於提供釕錯合物,其可於低溫下藉由 CVD方法使用前述錯合物進行薄膜形成,且可適當地提 供其前驅物,其製法及製造含釕之薄膜的方法。 本發明者進行徹底硏究以求克服前述問題。結果,發 現具有釕錯合物結構之已知化合物的分解溫度可藉由使用 直鏈戊二烯基取代環戊二烯環(以下稱爲Cp環)中之一而 降低。後續硏究之結果,成功地發展出新穎之釕錯合物, 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) ---------裝-- (請先閱讀背面之注意事項再填寫本頁) 訂 線 經濟部智慧財產局員工消費合作社印製 1227239 A7 B7 五、發明説明(5) 其藉由將低烷基導入該Cp環中而顯現在室溫下爲液體之 熔點,且具有較佳之蒸發性質及分解性質。進一步發現前 述目的可藉由具有低分子量二烯及羰基配位基之羰基雙( 二烯)釕錯合物而達成,完成了本發明。 是故,本發明提供一種半夾層型有機金屬釕化合物, 其特徵係由通式(1)表示:1T • M line -5- 1227239 A7 B7 5. Description of the invention (3). Equipment-(Please read the precautions on the back before filling this page) To synthesize semi-sandwich ruthenium complexes, it is generally to add pentadiene derivatives, cyclopentadiene derivatives, zinc and ruthenium halide hydrates at one time. Solvent, and then reacted under appropriate reaction conditions. However, this method cannot be practically used because only very low yields can be achieved. For post-reaction post-treatment, the liquid reaction mixture is also concentrated to produce a paste-like mixture. The target product is extracted from the paste-like mixture using a suitable solvent, and then filtered through calcium ore or column chromatography using an alumina column. Instead, purification is performed to produce the target product. However, this method includes steps that are not conducive to industrialization, such as extraction from the paste-like mixture obtained after concentration after completion of the reaction, and filtration of calcium ore or column chromatography. Therefore, in order to industrially obtain a semi-interlayered organometallic ruthenium compound, it is extremely necessary to establish a manufacturing method capable of obtaining a target product in a stable state at a high yield. Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs. On the other hand, thin films formed by thermal decomposition of coatings are used to manufacture components with relatively low integration. Since the precursor used in the thermal decomposition method of the coating is dissolved in an organic solvent to control the thickness of the film before use, it is preferable that these precursors are soluble in the organic solvent and decompose at a low temperature. However, very few ruthenium compounds have the aforementioned characteristics. In addition to carbonyl bis (1,3-butadiene) ruthenium (D. Minniti and PL · Timms ,; [.〇1 ^ & 11〇11 ^ 1 (: 1 ^ 111., 258, (: 12 (1983) ), Carbonyl bis (2,3-dimethyl-1,3-butadiene) ruthenium and carbonyl bis (1,3-cyclohexadiene) ruthenium (DN Cox and R · Roulet, Helv · Chim. Acta, Other than 67,1 365 (1 984)), there are no known carbonyl bis (diene) ruthenium complexes. These complexes are prepared by a method that requires reaction at low temperature, that is, Ru and diene Inverted at -196 ° C The paper size is applicable to Chinese National Standard (CNS) A4 (210X297 mm) -6- 1227239 A7 B7 V. Description of the invention (4) should be followed by adding C. In the CVD method, as The complex of the film precursor should be applied as a gas. Among the complexes currently used, Ru (DPM) 3 is evaporated by sublimation because of its high melting point of 168 ° C. This occurs when sublimation is evaporated. The precursor gas concentration changes due to changes in the solid surface area, so the problem of the precursor gas cannot be stably provided. To overcome this problem, Japanese Laid-Open Patent No. 1 32776/1 993 proposes a method The complex is dissolved in an organic solvent before use. However, the precursor is not always supplied stably in this method, because the evaporation of the solvent alone or the difference in the evaporation properties of the solid between the solvent and the complex is generated. There are some problems with deposition. On the other hand, Ru (OD) 3 and Ru (EtCp) 2 do not have the problem of providing precursors steadily because they are liquid at room temperature and have relatively high vapor pressures. However, in these complexes, Ru is stably bonded to individual organic ligands. Therefore, these complexes are difficult to decompose and should be processed at high temperature to form a thin film. The present invention is directed to In order to provide a ruthenium complex, which can be used to form a thin film by the CVD method using a CVD method at a low temperature, and a precursor thereof, a method for manufacturing the same, and a method for manufacturing a ruthenium-containing film can be provided appropriately. Research was conducted to overcome the foregoing problems. As a result, it was found that the decomposition temperature of a known compound having a ruthenium complex structure can be substituted by one of the cyclopentadienyl rings (hereinafter referred to as the Cp ring) with a linear pentadienyl group. While falling Low. As a result of subsequent research, a novel ruthenium complex was successfully developed. The paper size is applicable to the Chinese National Standard (CNS) A4 specification (210X297 mm) --------- install-(Please Read the precautions on the back before filling this page) Printed by the Consumers ’Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 1227239 A7 B7 V. Description of the invention (5) It appears at room temperature by introducing a low alkyl group into the Cp ring Below is the melting point of the liquid, and has better evaporation and decomposition properties. It was further found that the foregoing objects can be achieved by a carbonylbis (diene) ruthenium complex having a low molecular weight diene and a carbonyl ligand, and completed the present invention. Therefore, the present invention provides a semi-sandwich type organometallic ruthenium compound, which is characterized by the general formula (1):

---------裝-- (請先閱讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 其中R1、R2、R3及R4相同或相異且各表示氫、鹵原子、 低釀基、低院承i基、低院氧鑛基或低院基,其先決條件爲 不包括R1至R4皆爲氫之情況,及R1係爲氫,R2至R4中 之一係爲氫,其餘者係爲甲基之情況。 本發明另外提供一種製造含釕薄膜之方法,其特徵爲 使用前述半夾層有機金屬釕化合物作爲前驅物,且藉化學 氣相沉積方法於加熱基材上形成含釕之薄膜。 本發明另外提供一種方法,其特徵爲使以下通式(3) 所示之開放型二茂釕:--------- Install-(Please read the notes on the back before filling this page) Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs where R1, R2, R3 and R4 are the same or different and each indicates The prerequisites for hydrogen, halogen atoms, low-density radicals, low-density radicals, low-oxygen radicals, or low-density radicals do not include the case where R1 to R4 are all hydrogen, and R1 is hydrogen, and R2 to R4 One is hydrogen, and the other is methyl. The present invention further provides a method for manufacturing a ruthenium-containing film, which is characterized by using the aforementioned semi-interlayered organometallic ruthenium compound as a precursor, and forming a ruthenium-containing film on a heated substrate by a chemical vapor deposition method. The present invention further provides a method, which is characterized in that the open-type ruthenium octadecene represented by the following general formula (3):

其中R2、R3及R4係相同或相異,且各表示氫、鹵原子、 本紙張尺度適用中國國家標準(CNS)Α4規格(210x297公釐) 、?τ -8- 1227239 Α7 Β7 五、發明説明(6) 低醯基、低烷氧基、低烷氧羰基或低烷基; 於溶劑中鋅存在下與以下通式(4)所示之環戊二烯進 行反應: R1 (4) 其中R1係表示氫、鹵原子、低醯基、低烷氧基、低 烷氧羰基或低烷基; 以製得通式(1)所示之半夾層有機金屬釕化合物。 此外,本發明提供一種羰基雙(二烯)釕錯合物,其特 徵爲由以下通式(7)表示:Among them, R2, R3 and R4 are the same or different, and each represents hydrogen and halogen atoms. The paper size is applicable to the Chinese National Standard (CNS) A4 specification (210x297 mm),? Τ -8-1227239 Α7 Β7 V. Description of the invention (6) Low fluorenyl, low alkoxy, low alkoxycarbonyl or low alkyl; react with cyclopentadiene represented by the following general formula (4) in the presence of zinc in a solvent: R1 (4) where R1 Represents a hydrogen, a halogen atom, a lower fluorenyl group, a lower alkoxy group, a lower alkoxycarbonyl group, or a lower alkyl group; to obtain a semi-interlayered organometallic ruthenium compound represented by the general formula (1). In addition, the present invention provides a carbonylbis (diene) ruthenium complex, which is characterized by the following general formula (7):

R5 R8 R6 R7R5 R8 R6 R7

R8 R5 R7 R6 (7) ί-- (請先閲讀背面之注意事項再填寫本頁) 、言 經濟部智慧財產局員工消費合作社印製 其中R5至R8係各表示氫、烷基、或含有烷氧基、烷 氧羰基、烷醯基、羥基、羰基、鹵原子、羧基、胺基或胺 基甲醯基之烷基,該未經取代之烷基及經取代之烷基各具 有1至6個碳原子,其先決條件不包括R5至R8皆爲氫之 情況及R5及R8係爲氫且R6及RM系爲甲基之情況。 此外,本發明提供一種製造前述羰基雙(二烯)釕錯合 物之方法,其特徵爲氯化釕η-水合物(其中η係爲1或更R8 R5 R7 R6 (7) ί-- (Please read the notes on the back before filling this page), printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs, where R5 to R8 each represent hydrogen, alkyl, or alkane An alkyl group of oxy, alkoxycarbonyl, alkylfluorenyl, hydroxy, carbonyl, halogen atom, carboxyl, amine or aminomethyl, the unsubstituted alkyl group and substituted alkyl group each having 1 to 6 For carbon atoms, the prerequisites do not include the case where R5 to R8 are all hydrogen and the case where R5 and R8 are hydrogen and R6 and RM are methyl. In addition, the present invention provides a method for manufacturing the aforementioned carbonylbis (diene) ruthenium complex, which is characterized by ruthenium chloride η-hydrate (where η is 1 or more)

本紙張尺度適用中國國家標準(CNS ) Α4規格(210Χ297公釐) -9 - 1227239 A7 ___ B7 _ 五、發明説明(7) 大之數)與二烯於醇中於鋅粉存在下進行反應。 (請先閱讀背面之注意事項再填寫本頁) 此外,本發明提供一種製造含釕薄膜之方法,其特徵 爲使用前述羰基雙(二烯)釕錯合物作爲前驅物。 圖式簡單說明 圖1係爲顯不CVD裝置之示意圖的圖。 圖2係爲顯不實施例1中之測量的MS圖。 圖3係爲顯示實施例1所測量之分解性質(DSC)結果 的圖。 圖4係爲顯示對照例1所測量之分解性質(DSC)結果 的圖。 圖5係顯示實施例2之測量的MS圖。 圖6係爲顯示實施例3中氧流速與分解速率之間的關 係之圖。 圖7係爲顯示實施例3所製得之薄膜的X-射線繞射 圖型的圖。 圖8係爲顯示薄膜生長速率之Arrehenius圖的圖。 經濟部智慧財產局員工消費合作社印製 圖9係爲顯示實施例4所得之薄膜的電阻係數的圖。 圖10係爲顯示實施例5所得之薄膜的X-射線繞射圖 型的圖。 圖11係爲顯示實施例5所得之薄膜的電阻係數之圖 〇 圖1 2係爲實施例5所得之薄膜的SEM相片。 圖1 3係爲對照例2所得之薄膜的SEM相片。 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) -10 - 1227239 A7 B7 五、發明説明(8) 圖14係爲實施例5所得之薄膜的SEM相片。 圖1 5係爲對照例2所得之薄膜的SEM相片。 (請先閱讀背面之注意事項再填寫本頁) 圖1 6係爲實施例5所得之薄膜的AFM相片。 圖1 7係爲對照例2所得之薄膜的AFM相片。 圖1 8係爲實施例5所得之薄膜的AF M相片。 圖1 9係爲對照例2所得之薄膜的AFM相片。 圖2 0係爲顯示實施例6中載體氣體流速與沉積速率 之間的關係之圖。 圖2 1係爲顯示沉積時間與薄膜厚度之間的關係之圖 〇 圖22係爲顯示實施例9之DSC曲線的圖。 符號描述 1 :前驅物容器 2 :油浴 3 :反應槽 4 :基材 經濟部智慧財產局員工消費合作社印製 5 :氧化氣體 6 :相對氣體 7 :載體氣體 8 :質流控制器 9 :質流控制器 1 0 :質流控制器 1 1 :真空泵 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) -11 - 1227239 A7 ~_____ _B? __ 五、發明説明(9) 12 :廢氣 詳述 現在,詳細描述本發明。 首先,描述本文所採用之辭彙的定義及特例。 除非另有陳述,否則本發明所使用之”低”一辭係意指 使用該辭之基團係爲具有1至6個碳原子之直鏈、分支鏈 或環狀烴基。 是故,R1、R2、R3或R4中所使用之低烷基的實例係 包括甲基、乙基、正丙基、異丙基、正丁基、異丁基、第 二丁基、第三丁基、戊基(戊基)、異戊基、新戊基、第三 戊基、1-甲基丁基、2-甲基丁基、1,2-二甲基丙基、己基 、異己基、1-甲基戊基、2-甲基戊基、3-甲基戊基、1,1· 二曱基丁基、2,2-二甲基丁基、1,3-二甲基丁基、2,3-二甲 基丁基、3,3-二甲基丁基、1-乙基丁基、2-乙基丁基、 1,1,2-三甲基丙基、1,2,2-三甲基丙基、1-乙基-1-曱基丙基 、1-乙基-2-甲基丙基、環丙基、環丁基、環戊基、環己 基 '環丙基甲基、環丙基乙基、環丁基甲基等。較佳實例 包括甲基、乙基、丙基、異丙基及環丙基。 R1、R2、R3或R4中所使用之低烷氧基的實例係包括 甲氧基、乙氧基、正丙氧基、異丙氧基、正丁氧基、異丁 氧基、第二丁氧基、第三丁氧基、戊氧基、甲基丁氧基 、2 -甲基丁氧基、3 -甲基丁氧基、1,2 -二甲基丙氧基、己 氧基、1-甲基戊氧基、1-乙基丙氧基、2-曱基戊氧基、3- 本紙張又度適用中國國家標準(CNS ) Α4規格(210><297公釐) (請先閱讀背面之注意事項再填寫本頁) -裝_This paper size applies Chinese National Standard (CNS) A4 specification (210 × 297 mm) -9-1227239 A7 ___ B7 _ 5. Description of the invention (7) Large number) and diene in alcohol in the presence of zinc powder to react. (Please read the notes on the back before filling this page.) In addition, the present invention provides a method for manufacturing a ruthenium-containing film, which is characterized by using the aforementioned carbonylbis (diene) ruthenium complex as a precursor. Brief Description of the Drawings Fig. 1 is a schematic diagram showing a CVD apparatus. FIG. 2 is an MS chart showing the measurement in Example 1. FIG. FIG. 3 is a graph showing the results of decomposition properties (DSC) measured in Example 1. FIG. FIG. 4 is a graph showing the results of the decomposition properties (DSC) measured in Comparative Example 1. FIG. FIG. 5 is a MS chart showing the measurement of Example 2. FIG. Fig. 6 is a graph showing the relationship between the oxygen flow rate and the decomposition rate in Example 3. Fig. 7 is a view showing an X-ray diffraction pattern of a film obtained in Example 3. FIG. 8 is a diagram showing an Arrehenius diagram showing a film growth rate. Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs Figure 9 is a graph showing the resistivity of the film obtained in Example 4. Fig. 10 is a view showing an X-ray diffraction pattern of the film obtained in Example 5. FIG. 11 is a graph showing the resistivity of the thin film obtained in Example 5. FIG. 12 is a SEM photograph of the thin film obtained in Example 5. 13 are SEM photographs of the film obtained in Comparative Example 2. This paper size applies the Chinese National Standard (CNS) A4 (210X297 mm) -10-1227239 A7 B7 V. Description of the invention (8) Figure 14 is a SEM photograph of the film obtained in Example 5. Fig. 15 is a SEM photograph of the film obtained in Comparative Example 2. (Please read the precautions on the back before filling out this page) Figure 16 is an AFM photo of the film obtained in Example 5. Figure 17 is an AFM photograph of the film obtained in Comparative Example 2. FIG. 18 is an AF M photograph of the film obtained in Example 5. FIG. Figure 19 is an AFM photograph of the film obtained in Comparative Example 2. Fig. 20 is a graph showing the relationship between the carrier gas flow rate and the deposition rate in Example 6. Fig. 21 is a graph showing the relationship between the deposition time and the film thickness. Fig. 22 is a graph showing the DSC curve of Example 9. DESCRIPTION OF SYMBOLS 1: Precursor container 2: Oil bath 3: Reaction tank 4: Printed by the Consumer Cooperative of Intellectual Property Bureau of the Ministry of Economic Affairs 5: Oxidizing gas 6: Relative gas 7: Carrier gas 8: Mass flow controller 9: Mass Flow controller 1 0: Mass flow controller 1 1: Vacuum pump The paper size is applicable to the Chinese National Standard (CNS) A4 specification (210X297 mm) -11-1227239 A7 ~ _____ _B? __ V. Description of the invention (9) 12: Exhaust gas detailed description Now, the present invention is described in detail. First, the definitions and special cases of the vocabulary used in this article are described. Unless otherwise stated, the term "low" as used in the present invention means that the group using the term is a straight-chain, branched-chain or cyclic hydrocarbon group having 1 to 6 carbon atoms. Therefore, examples of the lower alkyl group used in R1, R2, R3 or R4 include methyl, ethyl, n-propyl, isopropyl, n-butyl, isobutyl, second butyl, third Butyl, pentyl (pentyl), isopentyl, neopentyl, third pentyl, 1-methylbutyl, 2-methylbutyl, 1,2-dimethylpropyl, hexyl, isohexyl Base, 1-methylpentyl, 2-methylpentyl, 3-methylpentyl, 1,1 · difluorenylbutyl, 2,2-dimethylbutyl, 1,3-dimethyl Butyl, 2,3-dimethylbutyl, 3,3-dimethylbutyl, 1-ethylbutyl, 2-ethylbutyl, 1,1,2-trimethylpropyl, 1 , 2,2-trimethylpropyl, 1-ethyl-1-fluorenylpropyl, 1-ethyl-2-methylpropyl, cyclopropyl, cyclobutyl, cyclopentyl, cyclohexyl ' Cyclopropylmethyl, cyclopropylethyl, cyclobutylmethyl and the like. Preferred examples include methyl, ethyl, propyl, isopropyl and cyclopropyl. Examples of the lower alkoxy group used in R1, R2, R3 or R4 include methoxy, ethoxy, n-propoxy, isopropoxy, n-butoxy, isobutoxy, and second butylene Oxy, tertiary butoxy, pentyloxy, methylbutoxy, 2-methylbutoxy, 3-methylbutoxy, 1,2-dimethylpropoxy, hexyloxy, 1-methylpentyloxy, 1-ethylpropoxy, 2-fluorenylpentyloxy, 3- This paper is also applicable to the Chinese National Standard (CNS) A4 specification (210 > < 297mm) (please (Please read the notes on the back before filling out this page)

、1T 經濟部智慧財產局員工消費合作社印製 -12- 1227239 A7 B7 經濟部智慧財產局員工消費合作社印製 五、發明説明(id 甲基戊氧基、4-甲基戊氧基、1,2-二甲基丁氧基、ι,3-二 甲基丁氧基、2,3-二甲基丁氧基、1,1-二甲基丁氧基、2,2_ 二甲基丁氧基、3,3-二甲基丁氧基等。較佳實例係包括甲 氧基、乙氧基及丙氧基。 R1、R2、R3或R4中所使用之低烷氧羰基之實例係包 括甲氧碳基、乙氧鑛基、丙氧鑛基、異丙氧簾基、環丙氧 羰基、丁氧羰基、異丁氧羰基、第二丁氧羰基、第三丁氧 羰基等。較佳實例係包括甲氧羰基、乙氧羰基、丙氧羰基 、異丙氧羰基及環丙氧羰基。 R1、R2、R3或R4中所使用之低醯基的實例係包括甲 醯基、乙醯基、丙醯基、丁醯基、異丁醯基、戊醯基、1-甲基丙基羰基、異戊醯基、戊基羰基、1-甲基丁基羰基、 2-甲基丁基羰基、3-甲基丁基羰基、1-乙基丁基羰基、2-乙基丙基羰基等。較佳實例係包括甲醯基、乙醯基及丙醯 基。 R1、R2、R3或R4中,除了前述低烷基、低烷氧基、 低烷氧羰基及低醯基之外,以使用--相同或相異之--氫或 鹵原子爲佳。鹵原子之特例係包括氟、氯、溴及碘。以氟 及氯爲佳。 本發明有關一種由前述通式(1)表示之半夾層有機金 屬釕化合物。較佳係有關一種由以下通式(2)表示之半夾 層有機金屬釕化合物: (請先閱讀背面之注意事項再填寫本頁) -裝· 訂 I·線· 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) -13- 1227239 A7 ________ B7 五、發明説明(1) R1Printed by 1T Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs -12-12239239 A7 B7 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 5. Description of the invention (id methylpentyloxy, 4-methylpentyloxy, 1, 2-dimethylbutoxy, ι, 3-dimethylbutoxy, 2,3-dimethylbutoxy, 1,1-dimethylbutoxy, 2,2-dimethylbutoxy Group, 3,3-dimethylbutoxy, etc. Preferred examples include methoxy, ethoxy and propoxy. Examples of lower alkoxycarbonyl groups used in R1, R2, R3 or R4 include Methoxycarbon, ethoxylate, propoxylate, isopropoxyl, cyclopropoxycarbonyl, butoxycarbonyl, isobutoxycarbonyl, second butoxycarbonyl, third butoxycarbonyl, etc. Preferred Examples include methoxycarbonyl, ethoxycarbonyl, propoxycarbonyl, isopropoxycarbonyl, and cyclopropoxycarbonyl. Examples of lower fluorenyl groups used in R1, R2, R3, or R4 include formamyl, acetamyl , Propionyl, butylfluorenyl, isobutylfluorenyl, pentamyl, 1-methylpropylcarbonyl, isopentyl, pentylcarbonyl, 1-methylbutylcarbonyl, 2-methylbutylcarbonyl, 3-methyl Butylcarbonyl , 1-ethylbutylcarbonyl, 2-ethylpropylcarbonyl, etc. Preferred examples include methylamidino, ethylamido, and propylamido. Among R1, R2, R3 or R4, in addition to the aforementioned lower alkyl, In addition to lower alkoxy, lower alkoxycarbonyl and lower fluorenyl groups, it is preferred to use-the same or different-hydrogen or halogen atoms. Specific examples of halogen atoms include fluorine, chlorine, bromine and iodine. Fluorine The present invention relates to a semi-interlayered organometallic ruthenium compound represented by the aforementioned general formula (1). The present invention relates to a semi-interlayered organometallic ruthenium compound represented by the following general formula (2): (Please read first Note on the back, please fill out this page again)-Binding, binding, I, thread, and paper size are applicable to Chinese National Standard (CNS) A4 (210X297 mm) -13- 1227239 A7 ________ B7 V. Description of the invention (1) R1

(請先閱讀背面之注意事項再填寫本頁) 其中R1及R2係相同或相異,且各表示氫、鹵原子、 低醯基、低烷氧基、低烷氧羰基或低烷基,其先決條件爲 不包括R1係爲氫且R2係爲甲基之情況。亦佳者係爲Ri及 R2兩者皆爲低烷基,尤其是R1係爲乙基,而R2係爲甲基 〇 經濟部智慧財產局員工消費合作社印製 此外,本發明有關一種藉CVD方法使用前述半夾層 有機金屬釕化合物製造含釕薄膜之方法。圖丨出示裝置之 一實例。本發明半夾層有機金屬釕化合物係導入前驅物容 器1中,於其中保持40至120°C。之後於減壓下使載體 氣體7冒泡通入該液體中,使該半夾層有機金屬釕化合物 蒸發,且輸送至反應槽3。該半夾層有機金屬釕化合物隨 之於藉加熱保持200至75(TC之基材4上熱分解,以形成 含釕薄膜。 本發明CVD薄膜形成方法可藉著圖1所示之冒泡方 法進行。或可使用溶液蒸發方法,其中本發明有機金屬釕 化合物本身或其於有機溶劑中之溶液係輸送至蒸發容器內 ,且於其中轉化成氣體。 使用於本發明CVD方法中之半夾層有機金屬釕化合 物可於原始狀態下使用,或於該半夾層有機金屬釕化合物 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) -14- 經濟部智慧財產局員工消費合作社印製 1227239 A7 _____ B7五、發明説明(1会 溶解於有機溶劑中之溶液形式下使用。可使用於本發明之 有機溶劑的實例係包括醇類,諸如甲醇、乙醇及異丙醇, 酯類諸如乙酸乙酯、乙酸丁酯及乙酸異戊酯,二醇醚類諸 如乙二醇單乙醚、乙二醇單甲醚及乙二醇單丁醚,醚類諸 如二乙醚、葛來米(gly me)、二葛來米、三葛來米及四氫 呋喃,酮類諸如甲基· 丁基酮、甲基·異丙基酮、乙基· 丁基酮、二丙基酮、二異丁基酮、甲基·戊基酮及環己酮 ,及烴類諸如己烷、環己烷、庚烷、辛烷、苯、甲苯及二 甲苯,唯本發明不受限於此。 本發明所通式(1)所示之化合物可藉著通式(3)所示之 開放型一茂釕與通式(4)所示之環戊二烯進行反應而製得 。欲使用於本發明而由通式(3)所示之開放型二茂釕可藉 著通式(5)所示之戊二烯衍生物與通式(6)所示之鹵化釕水 合物於鋅存在下進行反應而製得。反應式⑴係出示此等 反應。許多習用以製造此等半夾層有機金屬釕化合物之方 法中’係單次添加戊二烯衍生物及環戊二烯衍生物,結果 ’僅得到較差之產率。相反地,前述製法可於高產率下得 到標的產物。 (請先閱讀背面之注意事項再填寫本頁) •裝· 訂 -I·線 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) -15- 1227239 A7 B7 五、發明説明(佗 (5)(Please read the precautions on the back before filling out this page) where R1 and R2 are the same or different, and each represents hydrogen, halogen atom, lower fluorenyl, lower alkoxy, lower alkoxycarbonyl, or lower alkyl. The prerequisite is that the case where R1 is hydrogen and R2 is methyl is not included. Also preferred is that both Ri and R2 are low alkyl, especially R1 is ethyl, and R2 is methyl. Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs. In addition, the present invention relates to a method of borrowing CVD. Method for producing a ruthenium-containing film using the aforementioned semi-interlayered organometallic ruthenium compound. Figure 丨 shows an example of the device. The semi-sandwich organometallic ruthenium compound of the present invention is introduced into the precursor container 1 and maintained therein at 40 to 120 ° C. Thereafter, the carrier gas 7 was bubbled into the liquid under reduced pressure, and the semi-interlayered organometallic ruthenium compound was evaporated and sent to the reaction tank 3. The semi-interlayered organometallic ruthenium compound is then thermally decomposed on the substrate 4 held by heating to 200 to 75 ° C. to form a ruthenium-containing film. The method for forming a CVD film of the present invention can be performed by a bubbling method as shown in FIG. 1. Alternatively, a solution evaporation method may be used, in which the organometallic ruthenium compound of the present invention or a solution thereof in an organic solvent is transported into an evaporation container and converted into a gas therein. The semi-interlayer organic metal used in the CVD method of the present invention The ruthenium compound can be used in its original state, or the semi-sandwich organometallic ruthenium compound. The paper size applies to the Chinese National Standard (CNS) A4 specification (210X297 mm). -14- Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 1227239 A7 _____ B7 V. Description of the invention (1 It will be used in the form of a solution dissolved in an organic solvent. Examples of organic solvents that can be used in the present invention include alcohols such as methanol, ethanol, and isopropanol, and esters such as ethyl acetate , Butyl acetate and isoamyl acetate, glycol ethers such as ethylene glycol monoethyl ether, ethylene glycol monomethyl ether and ethylene glycol monobutyl ether, ethers such as diethylene glycol Ether, Glyme, Diglyme, Triglyme and Tetrahydrofuran, Ketones such as methyl · butyl ketone, methyl · isopropyl ketone, ethyl · butyl ketone, dipropyl Ketones, diisobutyl ketones, methyl-pentyl ketones, and cyclohexanone, and hydrocarbons such as hexane, cyclohexane, heptane, octane, benzene, toluene, and xylene, but the present invention is not limited to these Therefore, the compound represented by the general formula (1) of the present invention can be prepared by reacting an open type ruthenocene represented by the general formula (3) with a cyclopentadiene represented by the general formula (4). In the present invention, the open-type ruthenium metallocene represented by the general formula (3) may exist in zinc through a pentadiene derivative represented by the general formula (5) and a ruthenium halide hydrate represented by the general formula (6). It can be prepared by carrying out the reaction. The reaction formula ⑴ shows these reactions. Many methods used to produce these semi-interlayer organometallic ruthenium compounds include a single addition of a pentadiene derivative and a cyclopentadiene derivative. 'Only a poor yield is obtained. On the contrary, the aforementioned method can obtain the target product at a high yield. (Please read the precautions on the back before filling this page) • Binding · Binding-I · Line This paper size is applicable to Chinese National Standard (CNS) A4 specification (210X297 mm) -15- 1227239 A7 B7 V. Description of invention (佗 (5)

(請先閲讀背面之注意事項再填寫本頁) -裝· 其中X係表示鹵原子;η係爲由〇至10之數;且R1、R2 、R3及R4各如前文定義。 此種製法中,該反應溶劑不特別限制。相同地,收集 及純化該產物之方法不特別限制。然而,該標的產物可經 由工業化方法使用曱醇作爲整體反應溶劑或其中一部分而 製得,完成反應之後濾除過量之鋅,之後使用與甲醇絕不 相溶混之溶劑萃取由通式(1)所示之半夾層有機金屬釕化 合物,濃縮且蒸餾所得之油狀產物。與其中所使用之甲醇 絕不相溶混之溶劑的實例係包括脂族烴類諸如戊烷、己烷 、庚烷及辛烷。其中,以戊烷及己烷特佳,因其具有經濟 效益及工業優勢。 雖然本發明反應中之鋅用量不特別限制,但較佳係每 莫耳通式(6)所示之化合物或通式(3)所示之化合物使用i .〇 莫耳或更多之鋅’ 1.5莫耳或更多更佳。使用太過量之鋅 不具經濟優勢。即,較佳使用由1 ·5至1 〇〇莫耳之鋅。通 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公餐) I·線 經濟部智慧財產局員工消費合作社印製 -16 - 1227239 A7 經濟部智慧財產局員工消費合作社印製 B7五、發明説明(U 式(5)所示之化合物與通式(6)所示之化合物於鋅存在下進 行反應之步驟中,較佳係每莫耳通式(6)所示之化合物使 用2莫耳或過量之通式(5)所示之化合物。使用太大量之 該化合物不具有經濟優勢。即,較佳係使用由2至20莫 耳由通式(5)所示之化合物。 通式(5)所示之化合物與通式(6)所示之化合物於鋅存 在下進行反應的步驟中,反應溫度較佳係介於-20至100 °C範圍內,由-20至80°C更佳。通式(3)所示之化合物與通 式(4)所示之化合物於鋅存在下進行反應的步驟中,反應 溫度較佳係介於-20至100°C範圍內,由-20至80°C更佳 〇 通式(3)所示之化合物與通式(4)所示之化合物於鋅存 在下進行反應的步驟中,較佳係每莫耳通式(3)所示之化 合物使用由0.8至1.0莫耳之通式(4)所示化合物。若使用 低於0.8莫耳之量的通式(4)化合物,則有大量通式(3)所 示之化合物保持未反應。若使用超過1.0莫耳之量的通式 (4)所示化合物,則形成大量之雙(乙基環戊二烯基)釕副產 物。因此,該兩情況皆較不佳。 若於本發明中藉由通式(5)所示之化合物與通式(6)所 示之化合物進行反應而製造由通式(3)所示之化合物,則 通式(3)所示之化合物以不經單離,而於原樣下於單一鍋 中與通式(4)所示之化合物進行反應,以合成通式(1)所示 之化合物爲佳。 本發明之所有反應皆以於氮氣或惰性氣體氛圍中進行 (請先閱讀背面之注意事項再填寫本頁) -裝· 訂 I·線 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) -17- 1227239 A7 B7 五、發明説明( 爲佳。惰性氣體之實例係包括氨、氖、氬、氪、氙及氡。 此等氣體中,仍以氮及氬爲佳,因其較具經濟效益。 其次,說明通式(7)所示之化合物。該種羰基雙(二烯) 釕錯合物之實例係包括羰基雙(1,3-己二烯)釕[R5至R7 = _h ,Rs = -C2H5]、羰基雙(2,4-己二烯)釕[R5,Rk-CH3, R6,R7 = -H] 、羰基雙(3-甲基 _1,3_戊二烯)釕[R5,R6 = -H,R7,R8 = -CH3]、 羰基雙(2,4-己二烯醛)釕[R、-CH3, R8 = -C = 〇,R6,R7 = -H]、鑛 基雙(2,4-二烯-1-醇)釕[R = -CH3, R8 = -CH2〇H,R6,R7 = -H]、鑛 基雙(1-乙醯氧-1,3-丁二烯)釕[R5 = -〇-C〇CH3,R6,R7,r8 = _h] 、羰基雙(2,4-己二烯酸釕[R5 = -CH3, R8 = -COOH,R6,R7 = _h] 、羰基雙(2,4-戊二烯酸甲酯)釕[R5 = -C〇〇CH3, R6,R7,r8 = _H] 等。 其他實例包括羰基雙(2,4-庚二烯醛)釕[R5 = -C2H5, R8 = -C = 〇,R6,R7 = -H]、羰基雙(2,6-二甲基- 2,4,6-辛三烯)釕 [R5,R6 = -CH3, R8 = -C = C(CH3)2, R7 = -H]、羰基雙(2,4-癸二烯 酸乙酯)釕[R5 = -CH2CH2CH2CH2CH3, R8 = _COOC2H5, R6,R7 = -H] 、羰基雙(香葉烯)釕[R6 = -CH2CH2CH = C(CH3)2, R5,R6,R7 = -H] 、羰基雙(2,4-辛二烯醛)釕[R5 = -CH2CH2CH3, R8 = -C = 〇, R6,R7 = -H]、羰基雙(山梨酸乙酯)釕[R5 = -CH3, R8 = -C〇〇C2H5, R6,R7 = -H]、羰基雙(山梨酸甲酯)釕[R5 = -CH3,R8 = -C〇〇CH3, R6,R7 = -H]、羰基雙(2,4-庚二烯-6-酮)釕[尺5 = -(:;^,尺8 =-C0CH3, R6,R7 = -H]等。 就降低該錯合物之蒸發點的觀點而言,R5至R8中至 少一者係爲烷基或含有烷氧基、烷氧羰基、烷醯基、羥基 本紙張尺度適用中國國家標準(CNS ) A4規格(X297公釐) 私衣-- (請先閲讀背面之注意事項再填寫本頁) 訂 線· 經濟部智慧財產局員工消費合作社印製 -18- 1227239 經濟部智慧財產局員工消費合作社印製 A7 B7五、發明説明(1》 、羰基、鹵原子、羧基、胺基或胺基甲醯基之烷基爲佳, 該未經取代之烷基及經取代之烷基各具有1或2個碳原子 ’而其餘者係爲氫。R5至R8中至少一者係爲具有1或2 個碳原子,而其餘者係爲氫爲佳。其中,最期望羰基雙 (2·甲基-1,3-戊二烯)釕[R5,R7 = -H,R6,R8 = -CH3]。 本發明由通式(7)表示之羰基雙(二烯)釕錯合物可藉由 氯化釕η-水合物與二烯於鋅存在下在醇中進行反應而製 得。此反應中缺少二烯導致形成金屬釕,因而降低產率。 因此較佳係使用過量之二烯進行前述反應。即,較佳係使 用較氯化釕η-水合物多出10至20莫耳倍數之二烯。爲充 分減少氯化釕η-水合物,較佳係使用過量之鋅粉(10莫耳 倍數或更多)。若混合此等反應物,則氯化釕η-水合物之 醇溶液滴入二烯或該二烯之醇溶液一其中分散有鋅粉一中 ,以於高產率下製得標的羰基雙(二烯)釕錯合物。 本發明所使用之二烯不特別限制,只要其係爲在其分 子中的連續碳鏈上具有2個或多個雙鍵之化合物。因爲雙 鍵於反應過程中轉移,故可使用非共軛二烯諸如1,4-己二 烯、1,5-己二烯、2-甲基-1,4-戊二烯、3-甲基-1,4-戊二烯 或2-曱基-1,5-己二烯。然而,較佳係使用由下列通式(8) 所示之共軛二烯: R6 R7(Please read the notes on the back before filling out this page)-Equipment · Where X is a halogen atom; η is a number from 0 to 10; and R1, R2, R3 and R4 are as defined above. In this production method, the reaction solvent is not particularly limited. Similarly, the method of collecting and purifying the product is not particularly limited. However, the target product can be prepared by industrial methods using methanol as the overall reaction solvent or a part of it. After the reaction is completed, excess zinc is filtered off, and then extracted with a solvent that is not miscible with methanol. The semi-interlayered organometallic ruthenium compound shown is an oily product obtained by concentration and distillation. Examples of solvents which are never miscible with the methanol used therein include aliphatic hydrocarbons such as pentane, hexane, heptane and octane. Among them, pentane and hexane are particularly preferred because of their economic benefits and industrial advantages. Although the amount of zinc used in the reaction of the present invention is not particularly limited, it is preferred to use 1.0 mole or more of zinc per mole of the compound represented by the general formula (6) or the compound represented by the general formula (3) ' 1.5 moles or more is better. There is no economic advantage to using too much zinc. That is, it is preferable to use zinc of from 1.5 to 1,000 moles. The paper standard is applicable to the Chinese National Standard (CNS) A4 specification (210X297 meals). Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs -16-1227239 A7 Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economy B7. V. Invention ((U) In the step of reacting the compound represented by formula (5) with the compound represented by general formula (6) in the presence of zinc, it is preferred to use 2 moles per mole of compound represented by general formula (6). Or an excess of the compound represented by the general formula (5). It is not economically advantageous to use too much of the compound. That is, it is preferred to use a compound represented by the general formula (5) from 2 to 20 moles. 5) In the step of reacting the compound represented by the general formula (6) with the compound represented by the general formula (6) in the presence of zinc, the reaction temperature is preferably in the range of -20 to 100 ° C, and more preferably -20 to 80 ° C. In the step of reacting the compound represented by the general formula (3) with the compound represented by the general formula (4) in the presence of zinc, the reaction temperature is preferably in the range of -20 to 100 ° C, from -20 More preferably to 80 ° C. Compounds represented by general formula (3) and compounds represented by general formula (4) are stored in zinc. In the step of carrying out the next reaction, it is preferred to use a compound represented by the general formula (4) from 0.8 to 1.0 mole per compound represented by the formula (3). A large amount of the compound represented by the general formula (3) remains unreacted with the compound of the formula (4). If the compound represented by the general formula (4) is used in an amount exceeding 1.0 mol, a large amount of bis (ethylcyclopentane) is formed. Dienyl) ruthenium by-product. Therefore, both of these cases are less favorable. In the present invention, if a compound represented by the general formula (5) is reacted with a compound represented by the general formula (6), The compound represented by the formula (3), the compound represented by the general formula (3) is reacted with the compound represented by the general formula (4) in a single pot as it is without isolation, to synthesize the general formula (1) The compounds shown are preferred. All reactions of the present invention are performed in a nitrogen or inert gas atmosphere (please read the notes on the back before filling this page) National Standard (CNS) A4 specification (210X297 mm) -17-1227239 A7 B7 5. Description of the invention (preferably. Examples of gasses include ammonia, neon, argon, krypton, xenon, and krypton. Among these gases, nitrogen and argon are still preferred because they are more economical. Next, the compounds represented by the general formula (7) will be described. Examples of such carbonylbis (diene) ruthenium complexes include carbonylbis (1,3-hexadiene) ruthenium [R5 to R7 = _h, Rs = -C2H5], carbonylbis (2,4-hexane Diene) Ruthenium [R5, Rk-CH3, R6, R7 = -H], carbonylbis (3-methyl_1,3-pentadiene) ruthenium [R5, R6 = -H, R7, R8 = -CH3 ], Carbonylbis (2,4-hexadienal) ruthenium [R, -CH3, R8 = -C = 〇, R6, R7 = -H], mineral-based bis (2,4-diene-1-ol ) Ruthenium [R = -CH3, R8 = -CH2〇H, R6, R7 = -H], mineral-based bis (1-acetamido-1,3-butadiene) ruthenium [R5 = -〇-C〇 CH3, R6, R7, r8 = _h], carbonylbis (2,4-hexadienoate ruthenium [R5 = -CH3, R8 = -COOH, R6, R7 = _h], carbonylbis (2,4-pentadienoate methyl Esters) Ruthenium [R5 = -CoCH3, R6, R7, r8 = _H] and the like. Other examples include carbonylbis (2,4-heptadienal) ruthenium [R5 = -C2H5, R8 = -C = 〇, R6, R7 = -H], carbonylbis (2,6-dimethyl-2, 4,6-octatriene) ruthenium [R5, R6 = -CH3, R8 = -C = C (CH3) 2, R7 = -H], carbonylbis (2,4-decadienoate ethyl) ruthenium [ R5 = -CH2CH2CH2CH2CH3, R8 = _COOC2H5, R6, R7 = -H], carbonylbis (geranene) ruthenium [R6 = -CH2CH2CH = C (CH3) 2, R5, R6, R7 = -H], carbonylbis ( 2,4-octadienal) ruthenium [R5 = -CH2CH2CH3, R8 = -C = 〇, R6, R7 = -H], carbonylbis (ethyl sorbate) ruthenium [R5 = -CH3, R8 = -C 〇〇C2H5, R6, R7 = -H], carbonylbis (methyl sorbate) ruthenium [R5 = -CH3, R8 = -CO〇CH3, R6, R7 = -H], carbonylbis (2,4- Heptadiene-6-one) ruthenium [foot 5 =-(:; ^, foot 8 = -C0CH3, R6, R7 = -H], etc. From the viewpoint of reducing the evaporation point of the complex, R5 to At least one of R8 is alkyl or contains alkoxy, alkoxycarbonyl, alkanoyl, and hydroxyl groups. The paper size is applicable to China National Standard (CNS) A4 (X297 mm). Clothing-(Please read the back first (Please fill in this page before taking note) Printed by the Consumer Property Cooperative of the Smart Property Bureau -18-1227239 Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs A7 B7 V. Description of the invention (1), carbonyl, halogen atom, carboxyl, amine or aminomethyl alkyl Preferably, the unsubstituted alkyl group and the substituted alkyl group each have 1 or 2 carbon atoms' and the rest are hydrogen. At least one of R5 to R8 is 1 or 2 carbon atoms, and The others are preferably hydrogen. Among them, carbonylbis (2 · methyl-1,3-pentadiene) ruthenium is most desirable [R5, R7 = -H, R6, R8 = -CH3]. The present invention is based on the general formula The carbonyl bis (diene) ruthenium complex represented by (7) can be prepared by reacting ruthenium chloride η-hydrate with diene in the presence of zinc in an alcohol. The lack of diene in this reaction leads to the formation of a metal Ruthenium reduces the yield. Therefore, it is preferable to use an excessive amount of diene for the aforementioned reaction. That is, it is preferable to use a diene that is 10 to 20 mol times more than the ruthenium chloride η-hydrate. In order to sufficiently reduce chlorine Ruthenium η-hydrate is preferably used in excess of zinc powder (10 moles or more). If these reactants are mixed, ruthenium chloride η- The alcohol solution of the hydrate was dropped into the diene or the alcohol solution of the diene-zinc powder dispersed therein, to obtain the target carbonyl bis (diene) ruthenium complex in high yield. The diene used in the present invention is not particularly limited as long as it is a compound having two or more double bonds on a continuous carbon chain in its molecule. Because the double bond is transferred during the reaction, non-conjugated diene such as 1,4-hexadiene, 1,5-hexadiene, 2-methyl-1,4-pentadiene, 3-methyl -1,4-pentadiene or 2-fluorenyl-1,5-hexadiene. However, it is preferable to use a conjugated diene represented by the following general formula (8): R6 R7

本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) (請先閲讀背面之注意事項再填寫本頁) -裝' 、1Τ i·線 -19- 1227239 A7 B7 五、發明説明( (請先閲讀背面之注意事項再填寫本頁) 其中R5至R8係各表示氫、烷基、或含有烷氧基、烷 氧羰基、烷醯基、羥基、羰基、鹵原子、羧基、胺基或胺 基曱醯基之烷基,該未經取代之烷基及經取代之烷基各具 有1至6個碳原子,其先決條件不包括R5至r8皆爲氫之 情況及R5及R8係爲氫且R6及R7係爲曱基之情況。 通式(8)中,較佳係R5至R8中至少一者係爲烷基或含 有烷氧基、烷氧羰基、烷醯基、羥基、羰基、鹵原子、羧 基、胺基或胺基甲醯基之烷基爲佳,該未經取代之烷基及 經取代之烷基各具有1或2個碳原子,而其餘者係爲氫。 該共軛二烯之實例係包括1,3 -己二烯(R 5至R 7 = - Η, R8 = -C2H5)、2,4-己二烯(R5,R8 = -CH3,R6,R7 = -H)、3-甲基-1,3-戊二烯(R5,R6 = -H,R7,R8 = -CH3)、2,4-己二烯醛 (R5 = -CH3, R8 = -C = 〇,R6,R7 = -H)、2,4-二烯·1-醇(R = -CH3, R8 = -CH2〇H,R6,R7 = -H)、1·乙醯氧-1,3-丁二烯(R5 = -0-C0CH3, R6,R7,R8 = -H)、2,4-己二烯酸(R5 = -CH3,R8 = -COOH,R6,R7 = -H) 、2,4-戊二烯酸甲酯(R5 = -C〇〇CH3, R6,R7,R8 = -H)及 2,4-庚二 烯醛(R5 = -C2H5,R8 = -C = 0,R6,R7 = -H)。 經濟部智慧財產局員工消費合作社印製 其他實例係包括2,6-二甲基- 2,4,6-辛三烯(R5,R6 = -CH3, R8 = -C = C(CH3)2, R7 = -H)、2,4-癸二烯酸乙酯(尺5 =-CH2CH2CH2CH2CH3, R8 = -C〇〇C2H5, R6,R7 = -H)、香葉烯(尺6 = · CH2CH2CH = C(CH3)2, R5,R6,R7 = -H)、2,4-辛二烯醛(R5 = -CH2CH2CH3, R8二-C = 〇,R6,R7 = -H)、山梨酸乙酯(R5 = -CH3, R8 = -COOC2H5, R6,R7 = _H)、山梨酸甲酯(R5 = -CH3,R8 = -C00CH3, R6,R7 = _H)、2,4_庚二烯 _6_ 酉同(R5 = _CH3, R8 = _C〇CH3, 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) -20- 1227239 A7 B7 五、發明説明( R6,R7 = -H)等。其中,最期望2-甲基-1,3-戊二烯(R5,R7 = -H, R6,R8 = -CH3)。 該醇未特別限制,只要其於室溫(251 )下係爲液態。 因爲作爲配位基之C0係自醇形成,故就反應速率之觀點 而言,較佳係使用甲醇、乙醇或1 -丙醇。可使用單一醇 或數種醇之混合物。若將氯化釕η-水合物之醇溶液滴入 二烯或含有鋅粉之二烯的醇溶液內,則用以溶解該二烯之 醇及用以溶解該氯化釕η-水合物之醇可相同或相異。該 反應係於低溫下緩緩進行,而二烯之聚合係於高溫下增加 。是故,反應溫度以介於由0至80°C之範圍內爲佳。完 成反應之後,濾除鋅粉。之後可使用溶劑諸如戊烷或己院 ,直接自反應混合物或在移除醇及未反應之二烯之後萃取 所形成之錯合物。因爲所萃取之錯合物被二烯聚合物及反 應過程中形成者所污染,故其藉層析、蒸餾等方式純化。 使用此等羰基雙(二烯)釕錯合物作爲前驅物,可製得 含有釕之薄膜。 若藉CVD方法使用羰基雙(二烯)釕錯合物作爲前驅 物於基材上製造含有釕諸如釕或氧化釕之薄膜,則該羰基 雙(二烯)釕錯合物係經蒸發且提供於該基材上。蒸發方法 之實例係包括一種方法,其中惰性載體氣體係於液態下導 入加熱之錯合物內,之後該錯合物與載體氣體一起提供至 放置有基材之反應槽內;一種方法,其中該錯合物係溶解 於有機溶劑中,產生溶液,之後該溶液提供至蒸發器內, 於其中蒸發,將該氣體提供至放置有基材之反應槽內;等 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) (請先閱讀背面之注意事項再填寫本頁) 、言 經濟部智慧財產局員工消費合作社印製This paper size applies to China National Standard (CNS) A4 specification (210X297 mm) (Please read the precautions on the back before filling out this page) -Packing ', 1T i · line-19- 1227239 A7 B7 V. Description of the invention (( (Please read the notes on the back before filling out this page) where R5 to R8 each represent hydrogen, alkyl, or contain alkoxy, alkoxycarbonyl, alkylfluorenyl, hydroxyl, carbonyl, halogen atom, carboxyl, amine or The amino alkyl groups of the amino group, the unsubstituted alkyl group and the substituted alkyl group each have 1 to 6 carbon atoms, the prerequisites do not include the case where R5 to r8 are all hydrogen and R5 and R8 are In the case where hydrogen and R6 and R7 are fluorenyl groups, in the general formula (8), it is preferable that at least one of R5 to R8 is an alkyl group or contains an alkoxy group, an alkoxycarbonyl group, an alkylfluorenyl group, a hydroxyl group, and a carbonyl group. A halogen atom, a carboxyl group, an amino group, or an aminomethylamino alkyl group is preferred. The unsubstituted alkyl group and the substituted alkyl group each have 1 or 2 carbon atoms, and the rest are hydrogen. The Examples of conjugated dienes include 1,3-hexadiene (R 5 to R 7 =-Η, R8 = -C2H5), 2,4-hexadiene (R5, R8 = -CH3, R6, R7 = -H), 3-methyl-1,3-pentadiene (R5, R6 = -H, R7, R8 = -CH3), 2,4-hexadienal (R5 = -CH3, R8 =- C = 〇, R6, R7 = -H), 2,4-diene · 1-ol (R = -CH3, R8 = -CH2〇H, R6, R7 = -H), 1 · acetamidine-1 3-butadiene (R5 = -0-C0CH3, R6, R7, R8 = -H), 2,4-hexadiene acid (R5 = -CH3, R8 = -COOH, R6, R7 = -H), 2, Methyl 4-pentadienoate (R5 = -CO〇CH3, R6, R7, R8 = -H) and 2,4-heptadienal (R5 = -C2H5, R8 = -C = 0, R6, R7 = -H). Other examples printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs include 2,6-dimethyl-2,4,6-octatriene (R5, R6 = -CH3, R8 = -C = C (CH3) 2, R7 = -H), ethyl 2,4-decadienoate (feet 5 = -CH2CH2CH2CH2CH3, R8 = -CO〇C2H5, R6, R7 = -H), geranene (feet 6 = · CH2CH2CH = C (CH3) 2, R5, R6, R7 = -H), 2,4-octadialdehyde (R5 = -CH2CH2CH3, R8 di-C = 〇, R6, R7 = -H), Ethyl sorbate (R5 = -CH3, R8 = -COOC2H5, R6, R7 = _H), methyl sorbate (R5 = -CH3, R8 = -C00CH3, R6, R7 = _H), 2,4_heptane Olefin_6_ different (R5 = _CH3, R8 = _C〇CH3, this Paper size applies to Chinese National Standard (CNS) A4 specification (210X297 mm) -20-1227239 A7 B7 V. Description of invention (R6, R7 = -H), etc. Among them, 2-methyl-1,3-pentadiene is most desirable (R5, R7 = -H, R6, R8 = -CH3). The alcohol is not particularly limited as long as it is a liquid at room temperature (251). Since CO as a ligand is formed from an alcohol, it is preferable to use methanol, ethanol, or 1-propanol from the viewpoint of the reaction rate. A single alcohol or a mixture of several alcohols can be used. If an alcohol solution of ruthenium chloride η-hydrate is dropped into an alcohol solution of diene or a diene containing zinc powder, the alcohol used to dissolve the diene and the alcohol used to dissolve the ruthenium chloride η-hydrate The alcohols may be the same or different. The reaction proceeds slowly at low temperatures, while the polymerization of diene increases at high temperatures. Therefore, the reaction temperature is preferably in the range from 0 to 80 ° C. After the reaction was completed, the zinc powder was filtered off. The complex formed can then be extracted directly from the reaction mixture using a solvent such as pentane or hexane, or after removing the alcohol and unreacted diene. Because the extracted complex is contaminated by the diene polymer and those formed during the reaction, it is purified by chromatography, distillation, and other methods. Using these carbonylbis (diene) ruthenium complexes as precursors, ruthenium-containing films can be obtained. If a CVD method is used to produce a thin film containing ruthenium such as ruthenium or ruthenium oxide on a substrate using a carbonylbis (diene) ruthenium complex as a precursor, the carbonylbis (diene) ruthenium complex is evaporated and provided. On the substrate. Examples of the evaporation method include a method in which an inert carrier gas system is introduced into a heated complex in a liquid state, and then the complex is provided together with a carrier gas into a reaction tank in which a substrate is placed; a method in which the The complex is dissolved in an organic solvent to produce a solution. The solution is then supplied to an evaporator, where it is evaporated, and the gas is supplied to a reaction tank where the substrate is placed; etc. The paper dimensions are subject to Chinese national standards (CNS ) A4 size (210X297mm) (Please read the precautions on the back before filling out this page), printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs

-21 - 經濟部智慧財產局員工消費合作社印製 1227239 A7 ____B7五、發明説明( ο 若羰基雙(二烯)釕錯合物係於在有機溶劑中之溶液形 式使用,則有機溶液之實例係包括醇類,諸如醇類,諸如 甲醇、乙醇及異丙醇,酯類諸如乙酸乙酯、乙酸丁酯及乙 酸異戊酯,二醇醚類諸如乙二醇單乙醚、乙二醇單甲醚及 乙二醇單丁醚,醚類諸如二乙醚、葛來米(glyme)、二葛 來米、三葛來米及四氫呋喃,酮類諸如甲基· 丁基酮、甲 基·異丙基酮、乙基·丁基酮、二丙基酮、二異丁基酮、 甲基·戊基酮及環己酮,及烴類諸如己烷、環己烷、庚烷 、辛烷、苯、甲苯及二甲苯,唯本發明不受限於此。 爲藉塗層熱分解法於基材上形成含有釕諸如釕或氧化 釕之薄膜,羰基雙(二烯)釕錯合物亦於溶液形式下使用。 此情況下,亦可使用前述有機溶劑。 用以製造本發明含釕薄膜之CVD方法不特別限制, 其先決條件爲其係爲一般使用於技藝界中之CVD方法, 例如熱CVD、電漿CVD或光-CVD。塗層熱分解法中,前 驅物可藉例如旋塗法、浸漬法或噴霧法塗覆。加熱時,可 使用爐具、熱板或其類者。塗覆方法、加熱方法及其組合 方法不特別限制。 本發明通式(1)所示之半夾層有機金屬釕化合物於室 溫下係爲液態,且於約loot下具有充分之蒸汽壓。因爲 此等特性,其可藉由氣體冒泡而以CVD前驅物形式大量 提供。與習用前驅物比較之下,其可於低溫下熱分解。因 此,可於基材上形成具有優越之階度覆蓋性的含釕薄膜。 本紙張尺度適用中國國家標準(CNS ) A4規格(210X 297公釐) (請先閲讀背面之注意事項再填寫本頁) 裝· 訂 I·線 -22- 1227239 A7 B7 五、發明説明(2d 根據本發明,含釕薄膜可藉CVD方法製得,其大量產能 優越。 藉由CVD方法使用本發明有機金屬釕化合物,可藉 由控制氧流率而形成Ru薄膜或Ru〇2薄膜。所得之含釕薄 膜因此具有高密度,被少量雜質所污染,且具有優越之結 晶性。結果,可得到具有接近本體位準之較佳電阻係數的 含釕薄膜。與使用習用產物所得之薄膜比較之下,本發明 含釕薄膜具有高密度及平坦之薄膜表面。 根據本發明製造半夾層有機金屬釕化合物之方法,可 於高產率下穩定地得到該半夾層有機金屬釕化合物一藉習 用方法僅得到低產率。而且,標的產物可藉由此種方法製 得,而不將該醇濃縮,就能量消耗而言,此係優點。是故 ,製造本發明半夾層有機金屬釕化合物之方法可廣泛應用 ,不僅應用於此等產物之小規模製造,亦可應用於其工業 規格製造。 使用本發明羰基雙(二烯)釕錯合物,可於較目前藉 CVD方法使用於薄膜形成之錯合物低的溫度下形成薄膜 ,而且,可在穩定狀態下提供前驅物的情況下形成含釕薄 膜。此外,該羰基雙(二烯)釕錯合物具有低熱分解溫度, 且於溶劑具有高溶解度,使其可亦用以藉塗層熱分解法形 成含釕之薄膜。進一步預測可於溶劑中作爲反應觸媒。與 習知製造羰基雙(二烯)釕錯合物之方法比較之下,其可於 溫和條件下製得,因此,有製造優勢。 現在,參照以下實施例更詳細地描述本發明。然而, 本紙張尺度適用中國國家標準(CNS ) A4規格(21〇X297公釐) U3 (請先閱讀背面之注意事項再填寫本頁) 、\呑 經濟部智慧財產局員工消費合作社印製-21-Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 1227239 A7 ____B7 V. Description of the invention (ο If carbonylbis (diene) ruthenium complex is used in the form of a solution in an organic solvent, an example of an organic solution is Include alcohols, such as alcohols, such as methanol, ethanol, and isopropanol, esters such as ethyl acetate, butyl acetate, and isoamyl acetate, and glycol ethers such as ethylene glycol monoethyl ether, ethylene glycol monomethyl ether And ethylene glycol monobutyl ether, ethers such as diethyl ether, glyceme, digremide, trigeminy, and tetrahydrofuran, and ketones such as methyl · butyl ketone, methyl · isopropyl ketone , Ethyl · butyl ketone, dipropyl ketone, diisobutyl ketone, methyl · pentyl ketone and cyclohexanone, and hydrocarbons such as hexane, cyclohexane, heptane, octane, benzene, toluene The present invention is not limited to this. In order to form a thin film containing ruthenium such as ruthenium or ruthenium oxide on the substrate by thermal decomposition of the coating, the carbonyl bis (diene) ruthenium complex is also in solution form. In this case, the aforementioned organic solvent can also be used. For producing the ruthenium-containing film of the present invention The CVD method is not particularly limited, and its prerequisite is that it is a CVD method generally used in the art world, such as thermal CVD, plasma CVD, or photo-CVD. In the thermal decomposition method of coatings, the precursor can be applied by, for example, spin coating. Coating method, dipping method or spray method. When heating, a stove, hot plate or the like can be used. The coating method, heating method and combination method are not particularly limited. The half shown by the general formula (1) of the present invention The interlayer organometallic ruthenium compound is liquid at room temperature, and has sufficient vapor pressure at about loot. Because of these characteristics, it can be provided in large quantities as CVD precursors by gas bubbling. Compared with conventional precursors Below, it can be thermally decomposed at low temperature. Therefore, a ruthenium-containing film with excellent step coverage can be formed on the substrate. This paper size applies to China National Standard (CNS) A4 (210X 297 mm) ( Please read the precautions on the back before filling this page) Binding and binding I · line-22- 1227239 A7 B7 V. Description of the invention (2d According to the present invention, the ruthenium-containing film can be made by the CVD method, and its large capacity is superior. Use of the hair by CVD method It is clear that the organometallic ruthenium compound can form a Ru film or RuO2 film by controlling the oxygen flow rate. The resulting ruthenium-containing film therefore has a high density, is contaminated by a small amount of impurities, and has excellent crystallinity. As a result, it can be obtained A ruthenium-containing film having a preferable resistivity near the bulk level. Compared with a film obtained by using a conventional product, the ruthenium-containing film of the present invention has a high density and a flat film surface. A semi-interlayered organometallic ruthenium compound is manufactured according to the present invention This method can stably obtain the semi-interlayered organometallic ruthenium compound at a high yield. The conventional method can only obtain a low yield. In addition, the target product can be prepared by this method without concentrating the alcohol, which consumes energy. In terms of this, this is an advantage. Therefore, the method for manufacturing the semi-interlayer organometallic ruthenium compound of the present invention can be widely used, not only for the small-scale manufacturing of these products, but also for its industrial specifications. Using the carbonyl bis (diene) ruthenium complex of the present invention, a thin film can be formed at a lower temperature than the complexes currently used for thin film formation by the CVD method, and can be formed under the condition that a precursor is provided in a stable state. Ruthenium-containing film. In addition, the carbonyl bis (diene) ruthenium complex has a low thermal decomposition temperature and high solubility in solvents, making it also useful for forming ruthenium-containing thin films by coating thermal decomposition. It is further predicted that it can be used as a reaction catalyst in a solvent. Compared with the conventional method for producing a carbonylbis (diene) ruthenium complex, it can be produced under mild conditions, and therefore has manufacturing advantages. Now, the present invention will be described in more detail with reference to the following examples. However, this paper size applies the Chinese National Standard (CNS) A4 specification (21 × 297 mm) U3 (Please read the precautions on the back before filling this page), \ 呑 Printed by the Employees' Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs

-23- 1227239 A7 B7 五、發明説明(2) 已知本發明不受限於此。 實施例1 (2,4-二甲基戊二烯基)(乙基環戊二烯基)釕之合成及 其熱分解性質 400克鋅於四頸燒瓶中稱重。以氬沖洗容器之後,添 加205毫升之2,4-二甲基-1,3-戊二烯,產生懸浮液。之後 於室溫下使用40分鐘滴入30克三氯化釕η-水合物(η :約 3)溶解於1000毫升甲醇中之溶液。完成滴液之後,該混 合物於室溫下攪拌30分鐘,之後加熱至60°C,另外攪拌 2小時。混合物放置冷卻,之後添加1 2毫升乙基環戊二 烯。形成之混合物於室溫下攪拌30分鐘,之後加熱至60 °C,另外攪拌2小時。完全反應之後,混合物冷卻至室溫 ,使用玻璃濾器移除未反應之鋅。其次,使用己烷萃取 (7 50毫升xl,300毫升x4)。萃取液於減壓下濃縮,所得 之油狀產物於減壓下蒸餾,產生25.4克標的(2,4-二甲基 戊二烯基)(乙基環戊二烯基)釕(產率:76.3%)。 油狀黃色產物: 'H-NMRCSOOMHz, CDCh, 5 ppm) 5.38 (s,1H),4.63 (t,J = 2.0Hz,2H),4.52 (t,J = 2.0Hz,2H), 2.70(d, J = 2.5Hz, 2H), 2.15 (q, J = 7.5Hz, 2H), 1.93 (s, 6H), 1.12 (t, J = 7.5Hz, 3H), -0.09(d, J = 2.5Hz, 2H) IR (純,cm-1) 3050, 2960,2910,1475,1 445,1430,1 375,1 030,860,800, MS(GC/MS,El) 本紙張尺度適用中國國家標準(CNS ) A4規格(210X 297公釐) (請先閱讀背面之注意事項再填寫本頁) -裝' 訂 線 經濟部智慧財產局8工消費合作社印製 -24- 1227239 A7 __B7 五、發明説明(2会 (請先閲讀背面之注意事項再填寫本頁) (2,4-二甲基戊二烯基)(乙基環戊二烯基)釕之分子離 子尖峰係位於1()2Ru : m/z 290。圖2顯示此種MS圖。 (分解性質) 圖3顯示所得之(2,4-二甲基戊二烯基)(乙基環戊二烯 基)釕的分解性質之測量結果。分解性質係於下列條件下 測量。 測量方法:能量補償差示掃描熱量法(DSC) 測量條件:參考物:氧化鋁 惰性氣體:氮50毫升/分鐘 加熱速率:1(TC /分鐘 對照例1 雙(乙基環戊二烯基)釕之分解性質 雙(乙基環戊二烯基)釕之分解性質係於與實施例1相 同之條件下測量。自約3 2 0 °C觀察放熱反應。圖4出示結 經濟部智慧財產局員工消費合作社印製 果。 實施例2 (2,4-二甲基戊二烯基)(甲基環戊二烯基)釕之合成 將8.0克鋅稱入50毫升Schlenk試管中。以氮沖洗該 容器之後,添加4毫升2,4 -二甲基-1,3 -戊二儲,產生懸浮 液。之後於室溫下使用50分鐘滴入0.6克三氯化釕水合 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) -25- 1227239 A7 B7 五、發明説明(2$ (請先閲讀背面之注意事項再填寫本頁) 物溶解於20毫升乙醇中之溶液。滴加完成之後’混合物 於室溫下攪拌30分鐘,之後加熱至70°C,再另外攪拌2 小時。混合物放置冷卻,之後添加240微升之甲基環戊二 烯。形成之混合物於室溫下攪拌30分鐘’之後加熱至70 °C,再另外攪拌2小時。反應完全之後,混合物冷卻至室 溫,使用玻璃濾器移除未反應之鋅。之後,濃縮成糊狀混 合物。所得之糊狀混合物使用戊烷萃取,萃取液使用氧化 鋁作爲載體且使用戊烷作爲溶離物,而進行管柱層析。因 而得到0.28克標的(2,4-二甲基戊二烯基)(甲基環戊二烯基) 釕。 1H-NMR(500MHz, CDCh, 5 ppm) 5.36 (s,1H),4.61 (t,J = 2.0Hz,2H),4.57 (t,J = 2.0Hz,2H), 2.67(d,J = 2.5Hz, 2H),1·93 (s,6H),1.83 (s,3H), -0.07(d,J = 2.5Hz,2H) MS (GC/MS,El) 經濟部智慧財產局員工消費合作社印製 (2,4-二甲基戊二烯基)(甲基環戊二烯基)釕之分子離 子尖峰位於1()2Ru : m/z 276。圖5出示此MS圖。 實施例3 使用(2,4-二甲基戊二烯基)(甲基環戊二烯基)釕作爲前驅 物藉CVD方法製得含釕之薄膜 使用圖1所示之裝置,以表面上形成有Si〇2薄膜(1〇〇 奈米)之Si基材作爲基材。約1〇克(2,4-二甲基戊二烯基)( 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) ' -26- 1227239 A7 _ B7 五、發明説明(24 (請先閱讀背面之注意事項再填寫本頁) 甲基環戊二烯基)釕進料至前驅物容器1中,於油浴中加 熱至60°C之恒溫態。反應槽3及前驅物容器1之內部係 使用真空泵11及壓力控制閥個別控制於1 〇托耳及1 00托 耳。使用氮作爲載體氣體7,其流速係使用質流控制器設 定於100 seem。採用氧作爲氧化氣體5,而以氮作爲相對 氣體6。氧化氣體之流速係設定於0、10、30及300 seem ’而相對氣體之流速係個別設定於與氧化氣體之和爲500 seem之位準。基材4之溫度係設定於400°C,而薄膜形成 係於加熱下進行60分鐘。 圖6出示在基材上所形成之含釕薄膜的膜厚相對於氧 流速之圖。圖7出示圖6之A、B及C所得之薄膜的X-射 線繞射圖型。如圖7所明白顯示,在0 seem之氧流速(A) 下得到Ru薄膜,而於大於〇 sccm(B)或(C)之氧流速下得 到Ru〇2薄膜。即,已發現可藉由控制CVD中之氧流速而 產生Ru薄膜或Ru〇2薄膜。 實施例4 經濟部智慧財產局員工消費合作社印製 使用(2,4-二甲基戊二烯基)(乙基環戊二烯基)釕作爲前驅 物藉CVD方法製得含釕之薄膜 使用圖1所示之裝置,以表面上形成有Si〇2薄膜(1〇〇 奈米)之Si基材作爲基材。約1〇克(2,4-二甲基戊二烯基)( 乙基環戊二烯基)釕進料至前驅物容器1中,於油浴中加 熱至60°C之恒溫態。反應槽3及前驅物容器1之內部係 使用真空栗11及壓力控制閥個別控制於1 〇托耳及1 〇〇托 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) -27- 1227239 A7 B7 五、發明説明(2$ (請先閱讀背面之注意事項再填寫本頁) 耳。使用氮作爲載體氣體7,其流速係使用質流控制器設 定於100 seem。採用氧作爲氧化氣體5,而以氮作爲相對 氣體6。氧化氣體之流速係設定於300 seem,而相對氣體 之流速係設定於200 seem。基材4之溫度係設定於170、 200、200、300、400、500及60(TC,而薄膜形成係於加 熱至各溫度之下進行60分鐘。 圖8中之閉合環U)係顯示薄膜生長速率之Arrehenius 圖。含釕薄膜可於200°C或更高溫下形成。圖9出示所得 薄膜之電阻係數。得到接近本體電阻係數(圖9中之箭號 所示)的較佳電阻係數。 實施例5 使用(2,4-二甲基戊二烯基)(乙基環戊二烯基)釕作爲前驅 物藉CVD方法製得含釕之薄膜 經濟部智慧財產局員工消費合作社印製 使用圖1所示之裝置,以表面上形成有SiCh薄膜(100 奈米)之Si基材作爲基材。約10克(2,4-二甲基戊二烯基)( 乙基環戊二烯基)釕進料至前驅物容器1中,於油浴中加 熱至60°C之恒溫態。反應槽3及前驅物容器1之內部係 使用真空泵11及壓力控制閥個別控制於1 〇托耳及1 00托 耳。使用氮作爲載體氣體7,其流速係使用質流控制器設 定於1 0 0 s c c m。在不採用任何氧化氣體之情況下,以氮作 爲相對氣體6,相對氣體之流速係設定於500 seem。基材 4 之溫度係設定於 250、275、300、325' 350、375、400 、450、500、550及600°C,而薄膜形成係於加熱至各溫 本紙張又^用中周國家標準㈧⑽丨八视格丨训乂撕公釐) " -28- 1227239 A7 B7 五、發明説明(2έ 度之下進行60分鐘。 圖8中之閉合環(b)係顯示薄膜生長速率之Arrehenius 圖。含釕薄膜可於27 5 °C或更高溫下形成。圖丨〇出示所 得薄膜之X-射線繞射圖型。於4〇〇°C及更高溫下得到具有 較佳結晶性之薄膜。圖1 1出示所得薄膜之電阻係數。得 到接近本體電阻係數(圖1 1中之箭號所示)之較佳電阻係 數。圖12及14個別顯示在3〇(rc及60CTC基材溫度下形 成之薄膜的剖面SEM相片。雖然於各溫度下發現致密薄 膜,但在600°C下所形成之薄膜的密度較佳。圖16及18 個別顯示在350°C及600°C基材溫度下形成之薄膜的剖面 之AFM影像。表1中’(a)係表示藉AFM測量表面糙度之 結果所得之Ra(對數平均糙度)及Ry(最大高度)。Ra及Ry 個別係根據nS B0601- 1994及JIS B003 1 - 1994所描述之方 法測量。因此,已知本發明每一種含有釕之薄膜皆具有極 平坦之表面。 (請先閱讀背面之注意事項再填寫本頁) 裝- -線 經濟部智慧財產局員工消費合作社印製 表1 基材溫度 (a)實施例6 (b)對昭仿丨丨ο rc ) Ra Ry Ra Ry 300 4.75 61.12 20.07 223.26 600 4.14 72.25 26.23 326.45 對照例2 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) -29· 1227239 A7 B7 五、發明説明(2) —--------裝-- (請先閱讀背面之注意事項再填寫本頁) 薄膜形成係使用圖1所示之裝置如實施例5般地進行 ’但提供約10克市售雙(乙基環戊二烯基)釕於前驅物容 器1內。圖13及15係個別顯示在300°C及60(TC之基材 溫度下形成之薄膜的剖面的SEM相片。每一種情況下, 該薄膜之密度皆較差,且發現生成柱狀結晶。圖17及19 個別顯示在350°C及60(TC基材溫度下形成之薄膜的剖面 AFM影像。表1中,(b)係表示由AFM之表面糙度測量結 果所得之Ra及Ry。與前述實施例比較之下,發現高値表 面糖度。 實施例6 使用(2,4-二甲基戊二烯基)(乙基環戊二烯基)釕作爲前驅 物藉CVD方法製造含釕之薄膜 -線· 經濟部智慧財產局員工消費合作社印製 使用圖1所示之裝置,以表面上形成有Si〇2薄膜(1〇〇 奈米)之Si基材作爲基材。約10克(2,4 -二甲基戊二烯基)( 乙基環戊二烯基)釕進料至前驅物容器1中,於油浴中加 熱以達到60°C之恒溫狀態。反應槽3及前驅物容器內部 使用真空栗1 1及壓力控制閥個別控制於1 0托耳及1 〇 〇托 耳。採用氮作爲載體氣體7,其流速使用質流控制器設定 於30及100 seem。使用氧作爲氧化氣體5,而以氮作爲 相對氣體6。氧化氣體之流速係設定於3 0 0 s c c m,而相對 氣體之流速係設定於200 seem。基材4溫度係設定於4〇〇 °C,薄膜形成係於加熱下進行60分鐘。圖20顯示載體氣 體流速與形成於基材上之含釕薄膜的沉積速率之間的關係 本紙張尺度適用中國國家標準(CNS ) A4規格(210X撕公釐) -30- 1227239 A7 ___B7 五、發明説明(2έ 。可使用少量載體氣體於該區內形成充分均勻之薄膜。 實施例7 (請先閱讀背面之注意事項再填寫本頁) 使用(2,4 - 一甲基戊二烯基)(乙基環戊二烯基)釕作爲前驅 物藉CVD方法製造含釕之薄膜 使用圖1所示之裝置,以表面上形成有Si〇2薄膜(1〇〇 奈米)之Si基材作爲基材。約1〇克(2,4 -二甲基戊二烯基)( 乙基ϊ哀戊一烯基)釕進料至前驅物容器1中,於油浴中加 熱以達到60°C之恒溫狀態。反應槽3及前驅物容器內部 使用真空泵1 1及壓力控制閥個別控制於丨〇托耳及1 〇〇托 耳。採用氮作爲載體氣體7,其流速使用質流控制器設定 於3 0及1 0 0 s c c m。在不使用任何氧化氣體5之情況下, 以氮作爲相對氣體6,相對氣體之流速係設定於500 seem 。基材4溫度係設定於350°C,薄膜形成係於加熱下進行 2.5、5、10、20、60 及 120 分鐘。 經濟部智慧財產局員工消費合作社印製 圖21中,閉合環(a)係顯示形成於基材上之含釕薄膜 的沉積時間及薄膜厚度。於2.5分鐘及較長沉積時間下得 到含釕薄膜,薄膜厚度係隨著沉積時間之增長而線性增加 。可輕易地形成本發明含釕薄膜,而不顯示任何培育時間 (基材上不形成任何薄膜的時間)。 對照例3 薄膜形成係使用圖1所示之裝置如同實施例7般地進 行,但將約10克之市售雙(乙基環戊二烯基)釕進料至前 驅物容器1中。圖21中之方格(b)係顯示形成於基材上之 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) -31 - 經濟部智慧財產局員工消費合作社印製 1227239 A7 ________B7_ 五、發明説明(2$ 含釕薄膜的沉積時間及薄膜厚度。在沉積時間達到20分 鐘之前發現培育時間。 實施例8 鑛基雙(2-甲基-1,3_戊二烯)釕之合成 將160克鋅粉導入100〇毫升四頸燒瓶中。連接攪梓 器、滴液漏斗、冷凝器及溫度計之後,以氬沖洗燒瓶。之 後,添加60毫升2-甲基-1,3-戊二烯,鋅粉藉攪拌而分散 於其中。其次,使用1小時自滴液漏斗添加1 〇克溶解於 4 0 0晕升乙醇中之氯化釕η -水合物,同時於水浴中保持溫 度爲25 °C或較低。完成滴液之後,形成之混合物加熱至 7 0 °C且攪拌3小時。自反應混合物濾出鋅粉,於減壓下移 除乙醇等物。所得之糊狀產物使用戊烷萃取。萃取液藉管 柱層析使用氧化鋁作爲塡充物且使用戊烷作爲溶劑進行純 化。移除溶劑之後,得到9·99克羰基雙(2-曱基_1,3_戊二 烯)釕之黃色液體(產率:89%)。 ^-NMR (COCh)S 3.91 (d, 2H, J = 7.5Hz), 2.04 (s, 6H), 1.42(s,2H),1·27 (d,6H,J = 6Hz),1.17 (dq,2H,J=14Hz), 0.30 (s,2H)。 13C-NMR (CDCh) δ 218.88(CO), 91.51 (〇, 89.47 (CH), 50.51 (CH),37.58 (CHa),22.84 (CH3),18.78 (CH〇 IR 1 967 cm'1 (CO) MS 294 (M + ) 本紙張尺度適用中國國家標準(CNS ) A4規格(210x297公釐) (請先閲讀背面之注意事項再填寫本頁) .裝· 訂 -線 •32- 1227239 A7 B7 五、發明説明(30 實施例9 羰基雙(2-甲基-1,3-戊二烯)釕之熱分解性質(藉DSC測量) 將6.7毫克實施例8所得之羰基雙(2-甲基-1,3-戊二烯) 釕導入不銹鋼盤內,氣密性地覆蓋不銹鋼蓋。此試樣於 l〇°C /分鐘速率下使用18.8毫克氧化鋁作爲參考物進行加 熱’使用差示掃描熱量計(DSC)測量加熱時之熱量變化。 於約120°C下發現放熱反應,確認錯合物之分解。圖22 出示結果。 實施例1 0 使用羰基雙(2-曱基-1,3-戊二烯)釕作爲前驅物藉CVD方法 製造含釕之薄膜 使用圖1所示之CVD裝置,以羰基雙(2-甲基-1,3-戊 二烯)釕作爲前驅物,於50°C前驅物溫度、1〇〇 sccm載體 氣體(N2)流速、400托耳前驅物壓力、200 sccm相對氣體 (N2)流速、80°C管溫、300°C基材溫度、10托耳槽壓及300 seem氧化氣體(〇2)流速下,於具有Si〇2薄膜之矽晶圓上 進fj薄膜形成歷經1小時。藉由分析用X -射線繞射計, 發現該薄膜係包含ru〇2。藉SEM測量之薄膜厚度係爲 500奈米。 實施例11 使用駿基雙(2 -甲基-1,3-戊二烯)釕作爲前驅物藉旋塗 法製造含釕薄膜 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) ----------壯衣-- (請先閱讀背面之注意事項再填寫本頁j -訂· -線· 經濟部智慧財產局員工消費合作社印製 -33- 經濟部智慧財產局員工消費合作社印製 1227239 A7 _B7___五、發明説明(3) 藉著將1毫升羰基雙(2-甲基-1,3-戊二烯)釕溶解於9 毫升庚烷中而製備溶液。此溶液於500轉每分鐘下旋塗於 矽晶圓上歷經5秒鐘,且於1 000轉每分鐘下歷經1 0秒鐘 ,之後於150°C爐中加熱20分鐘。藉由分析用X-射線繞 射法,發現該薄膜係包含Ru〇2。藉SEM測量之薄膜厚度 係爲300奈米。 對照例4 薄膜形成係如實施例1 〇般進行,但始自雙(乙基環戊 二烯基)釕。結果,無法得到含釕之薄膜。 實施例1 2 將8.0克鋅導入Schlenk試管中。以氬沖洗容器之後 ,添加240微升乙基環戊二烯及4毫升2,4-二甲基-1,3-戊 二烯。於冰冷卻下,使用1小時及15分鐘滴加608毫克 溶解於25毫升無水乙醇中之氯化釕η-水合物(η :約3)。 之後,形成之混合物於冰冷卻下攪拌歷經1小時及3 0分 鐘,之後於室溫下歷經1小時。完全反應之後,使用玻璃 濾器移除未反應之鋅,殘留物於減壓下濃縮,產生糊狀產 物。此種糊狀產物以戊烷萃取,萃取液進行管柱層析(戊 烷/氧化鋁)產生106毫克標的(2,4-二甲基戊二烯基)(乙基 環戊二烯基)釕(產率:16%)。而且得到70毫克雙(乙基環 戊二烯基)釕之副產物(產率:11%)。 雖已參照特別具體實例詳細描述本發明,但熟習此技 (請先閱讀背面之注意事項再填寫本頁} •裴 -訂 I·線 本紙張尺度適用中國國家標準(CNS ) Α4規格(210Χ 297公釐) -34- 1227239 A7 B7五、發明説明(3i藝者已知可在不偏離本發明精神及範圍的情況下進行各種 變化及修飾。 裝— (請先閲讀背面之注意事項再填寫本頁) 訂 I·線 經濟部智慧財產局員工消費合作社印製 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) -35--23- 1227239 A7 B7 V. Description of the invention (2) It is known that the present invention is not limited to this. Example 1 Synthesis and thermal decomposition properties of (2,4-dimethylpentadienyl) (ethylcyclopentadienyl) ruthenium 400 g of zinc was weighed in a four-necked flask. After flushing the container with argon, 205 ml of 2,4-dimethyl-1,3-pentadiene was added to produce a suspension. Then, a solution of 30 g of ruthenium trichloride η-hydrate (η: about 3) dissolved in 1000 ml of methanol was added dropwise at room temperature over 40 minutes. After the dripping was completed, the mixture was stirred at room temperature for 30 minutes, then heated to 60 ° C, and stirred for another 2 hours. The mixture was left to cool before adding 12 ml of ethylcyclopentadiene. The resulting mixture was stirred at room temperature for 30 minutes, then heated to 60 ° C and stirred for another 2 hours. After the reaction was completed, the mixture was cooled to room temperature, and unreacted zinc was removed using a glass filter. Next, it was extracted with hexane (7 50 ml x 1, 300 ml x 4). The extract was concentrated under reduced pressure, and the resulting oily product was distilled under reduced pressure to yield 25.4 g of the standard (2,4-dimethylpentadienyl) (ethylcyclopentadienyl) ruthenium (yield: 76.3%). Oily yellow product: 'H-NMRCSOOMHz, CDCh, 5 ppm) 5.38 (s, 1H), 4.63 (t, J = 2.0Hz, 2H), 4.52 (t, J = 2.0Hz, 2H), 2.70 (d, J = 2.5Hz, 2H), 2.15 (q, J = 7.5Hz, 2H), 1.93 (s, 6H), 1.12 (t, J = 7.5Hz, 3H), -0.09 (d, J = 2.5Hz, 2H ) IR (pure, cm-1) 3050, 2960, 2910, 1475, 1 445, 1430, 1 375, 1 030, 860, 800, MS (GC / MS, El) This paper standard applies to Chinese National Standard (CNS) A4 specification (210X 297 mm) (Please read the notes on the back before filling this page)-Assembled 'Printed by the Intellectual Property Bureau of the Ministry of Economic Affairs and printed by 8 Industrial Consumer Cooperatives-24- 1227239 A7 __B7 V. Invention Description (2 sessions (Please read the precautions on the back before filling this page) (2,4-Dimethylpentadienyl) (ethylcyclopentadienyl) The molecular ion peak of ruthenium is located at 1 () 2Ru: m / z 290. This MS chart is shown in Fig. 2. (Decomposition properties) Fig. 3 shows the measurement results of the decomposition properties of the obtained (2,4-dimethylpentadienyl) (ethylcyclopentadienyl) ruthenium. Decomposition The property is measured under the following conditions: Measurement method: Energy-compensated differential scanning calorimetry (DSC) measurement Item: Reference: Alumina inert gas: Nitrogen 50ml / min Heating rate: 1 (TC / min Comparative Example 1 Decomposition properties of bis (ethylcyclopentadienyl) ruthenium bis (ethylcyclopentadienyl) The decomposition properties of ruthenium were measured under the same conditions as in Example 1. The exothermic reaction was observed from about 320 ° C. Figure 4 shows the printed fruits of the consumer cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs. Example 2 (2,4 -Synthesis of dimethylpentadienyl) (methylcyclopentadienyl) ruthenium Weigh 8.0 g of zinc into a 50 ml Schlenk test tube. After flushing the container with nitrogen, add 4 ml of 2,4-dimethyl -1,3-Pentaic distillate to produce a suspension. After that, 0.6 g of ruthenium trichloride hydrated in drops at room temperature for 50 minutes. This paper is sized for the Chinese National Standard (CNS) A4 (210X297 mm) -25- 1227239 A7 B7 V. Description of the invention (2 $ (please read the precautions on the back before filling this page) The solution of the substance dissolved in 20 ml of ethanol. After the dropwise addition is complete, the mixture is stirred at room temperature for 30 minutes, and then heated to 70 ° C, stir for another 2 hours. The mixture is left to cool and 240 is added. Liter methyl cyclopentadiene. The formed mixture was stirred at room temperature for 30 minutes' After heating to 70 ° C, and then further stirred for 2 hours. After the reaction was completed, the mixture was cooled to room temperature, and unreacted zinc was removed using a glass filter. After that, it was concentrated to a paste-like mixture. The obtained paste mixture was extracted with pentane, and the extract was subjected to column chromatography using alumina as a carrier and pentane as an eluate. As a result, 0.28 g of the target (2,4-dimethylpentadienyl) (methylcyclopentadienyl) ruthenium was obtained. 1H-NMR (500MHz, CDCh, 5 ppm) 5.36 (s, 1H), 4.61 (t, J = 2.0Hz, 2H), 4.57 (t, J = 2.0Hz, 2H), 2.67 (d, J = 2.5Hz , 2H), 1.93 (s, 6H), 1.83 (s, 3H), -0.07 (d, J = 2.5Hz, 2H) MS (GC / MS, El) Printed by the Consumer Cooperative of Intellectual Property Bureau, Ministry of Economic Affairs The molecular ion peak of (2,4-dimethylpentadienyl) (methylcyclopentadienyl) ruthenium is located at 1 () 2Ru: m / z 276. Figure 5 shows this MS picture. Example 3 A ruthenium-containing film was prepared by a CVD method using (2,4-dimethylpentadienyl) (methylcyclopentadienyl) ruthenium as a precursor. Using the apparatus shown in FIG. A Si substrate with a Si02 film (100 nm) formed as a substrate. Approx. 10 g (2,4-dimethylpentadienyl) (This paper size applies Chinese National Standard (CNS) A4 specification (210X297 mm) '-26- 1227239 A7 _ B7 V. Description of the invention (24 ( Please read the precautions on the back before filling in this page) Methylcyclopentadienyl) Ruthenium is fed into the precursor container 1 and heated to a constant temperature of 60 ° C in an oil bath. Reaction tank 3 and precursor container The interior of 1 uses vacuum pump 11 and pressure control valve individually controlled at 10 Torr and 100 Torr. Nitrogen is used as the carrier gas 7, and the flow rate is set to 100 seem using the mass flow controller. Oxygen is used as the oxidizing gas 5 And nitrogen is used as the relative gas 6. The flow rate of the oxidizing gas is set at 0, 10, 30, and 300 seem ', and the flow rate of the relative gas is individually set to the level of the sum of the oxidizing gas to 500 seem. The temperature was set at 400 ° C, and the film formation was performed under heating for 60 minutes. Fig. 6 shows a graph of the film thickness of the ruthenium-containing film formed on the substrate with respect to the oxygen flow rate. Fig. 7 shows A and B of Fig. 6 And the X-ray diffraction pattern of the film obtained from C and C. As clearly shown in Fig. 7, at 0 s Ru films were obtained at an oxygen flow rate (A) of eem, and Ru02 films were obtained at an oxygen flow rate greater than 0 sccm (B) or (C). That is, Ru has been found to be produced by controlling the oxygen flow rate in CVD Thin film or RuO2 thin film. Example 4 Printing by (2,4-dimethylpentadienyl) (ethylcyclopentadienyl) ruthenium as a precursor using the CVD method printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs. Preparation of a film containing ruthenium Using the apparatus shown in FIG. 1, a Si substrate with a Si02 film (100 nm) formed on the surface was used as the substrate. Approximately 10 g (2,4-dimethyl) Pentadienyl) (ethylcyclopentadienyl) ruthenium was fed into the precursor container 1 and heated to a constant temperature of 60 ° C in an oil bath. The inside of the reaction tank 3 and the precursor container 1 was vacuumed. The pump 11 and the pressure control valve are individually controlled at 10 Torr and 100 Torr. The paper size is applicable to the Chinese National Standard (CNS) A4 specification (210X297 mm) -27- 1227239 A7 B7 V. Description of the invention (2 $ (please First read the notes on the back before filling this page) ears. Use nitrogen as the carrier gas 7 and its flow rate is set to 100 seem using a mass flow controller Use oxygen as the oxidizing gas 5 and nitrogen as the relative gas 6. The flow rate of the oxidizing gas is set to 300 seem, and the flow rate of the relative gas is set to 200 seem. The temperature of the substrate 4 is set to 170, 200, 200 , 300, 400, 500, and 60 (TC, and the film formation is performed by heating to each temperature for 60 minutes. The closed ring U in Figure 8) is an Arrehenius diagram showing the growth rate of the film. The ruthenium-containing film can be at 200 ° C or higher. Fig. 9 shows the resistivity of the obtained film. A better resistivity near the bulk resistivity (shown by the arrow in Figure 9) is obtained. Example 5 A thin film containing ruthenium was prepared by a CVD method using (2,4-dimethylpentadienyl) (ethylcyclopentadienyl) ruthenium as a precursor and printed by a consumer cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs The device shown in FIG. 1 uses a Si substrate with a SiCh film (100 nm) formed on the surface as a substrate. About 10 g of (2,4-dimethylpentadienyl) (ethylcyclopentadienyl) ruthenium was fed into the precursor container 1 and heated to a constant temperature of 60 ° C in an oil bath. The inside of the reaction tank 3 and the precursor container 1 are individually controlled at 100 Torr and 100 Torr using a vacuum pump 11 and a pressure control valve. Nitrogen was used as the carrier gas 7 and its flow rate was set at 100 s c c m using a mass flow controller. In the case where no oxidizing gas is used, nitrogen is used as the relative gas 6, and the flow velocity of the relative gas is set at 500 seem. The temperature of the substrate 4 is set at 250, 275, 300, 325 '350, 375, 400, 450, 500, 550, and 600 ° C, and the film is formed by heating to the temperature of the paper and using the National Standard of China ㈧⑽ 丨 Eight-view grid 丨 Training tear mm) " -28- 1227239 A7 B7 V. Description of the invention (60 minutes at 2 degrees. The closed loop (b) in Figure 8 is an Arrehenius diagram showing the growth rate of the film The ruthenium-containing film can be formed at 27 5 ° C or higher temperature. Figure X shows the X-ray diffraction pattern of the obtained film. A film with better crystallinity is obtained at 400 ° C and higher temperature. Figure 11 shows the resistivity of the obtained film. A better resistivity close to the bulk resistivity (shown by the arrow in Figure 11) is obtained. Figures 12 and 14 individually show the formation at 30 ° C and 60CTC substrate temperature. SEM photograph of the cross section of the film. Although dense films are found at various temperatures, the density of the films formed at 600 ° C is better. Figures 16 and 18 individually show the formation at 350 ° C and 600 ° C substrate temperatures AFM image of the cross section of the thin film. '(A) in Table 1 shows the results of measuring surface roughness by AFM The obtained Ra (log average roughness) and Ry (maximum height). Ra and Ry are individually measured according to the methods described in nS B0601-1994 and JIS B003 1-1994. Therefore, each of the ruthenium-containing films of the present invention is known All have a very flat surface. (Please read the precautions on the back before filling out this page.) Equipment--Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs. Table 1 Substrate temperature (a) Example 6 (b) Imitation 丨 丨 rc) Ra Ry Ra Ry 300 4.75 61.12 20.07 223.26 600 4.14 72.25 26.23 326.45 Comparative Example 2 This paper size applies the Chinese National Standard (CNS) A4 specification (210X297 mm) -29 · 1227239 A7 B7 V. Description of the invention (2) —-------- Installation— (Please read the precautions on the back before filling out this page) The film formation is performed as in Example 5 using the device shown in Figure 1 'but provides about 10 Grams of commercially available bis (ethylcyclopentadienyl) ruthenium in the precursor container 1. Figures 13 and 15 are SEM photographs showing the cross section of a film formed at a substrate temperature of 300 ° C and 60 ° C, respectively. In each case, the density of the film was poor, and columnar crystals were found to form. 17 and 19 individually show cross-section AFM images of films formed at 350 ° C and 60 ° C substrate temperature. In Table 1, (b) represents Ra and Ry obtained from the surface roughness measurement results of AFM. In comparison with the examples, a high saccharin surface sugar content was found. Example 6 Use of (2,4-dimethylpentadienyl) (ethylcyclopentadienyl) ruthenium as a precursor to manufacture a ruthenium-containing film by CVD method-Wire · Printed by the Consumers ’Cooperative of Intellectual Property Bureau of the Ministry of Economic Affairs The system shown in Fig. 1 was used, and a Si substrate with a Si02 film (100 nm) formed on the surface was used as the substrate. About 10 g of (2,4-dimethylpentadienyl) (ethylcyclopentadienyl) ruthenium was fed into the precursor container 1 and heated in an oil bath to reach a constant temperature of 60 ° C. The inside of the reaction tank 3 and the precursor container were individually controlled at 10 Torr and 1000 Torr using a vacuum pump 11 and a pressure control valve. Nitrogen was used as the carrier gas 7 and its flow rate was set at 30 and 100 seem using a mass flow controller. Oxygen is used as the oxidizing gas 5 and nitrogen is used as the counter gas 6. The flow rate of the oxidizing gas is set at 300 s c c m, and the flow rate of the relative gas is set at 200 seem. The temperature of the substrate 4 was set at 400 ° C, and the film formation was performed under heating for 60 minutes. Figure 20 shows the relationship between the carrier gas flow rate and the deposition rate of the ruthenium-containing film formed on the substrate. The paper size applies the Chinese National Standard (CNS) A4 specification (210X tear mm) -30- 1227239 A7 ___B7 V. Invention Instructions (2). A small amount of carrier gas can be used to form a sufficiently uniform film in this area. Example 7 (Please read the precautions on the back before filling this page) Use (2,4-monomethylpentadienyl) ( Ethylcyclopentadienyl) ruthenium is used as a precursor to produce ruthenium-containing films by CVD. Using the device shown in Figure 1, a Si substrate with a Si02 film (100nm) formed on the surface is used as the base. Approximately 10 grams of (2,4-dimethylpentadienyl) (ethyl pentadienyl) ruthenium was fed into the precursor container 1 and heated in an oil bath to reach 60 ° C. Constant temperature. Vacuum tank 11 and pressure control valve are used to control the reaction tank 3 and the precursor container individually at 100 Torr and 100 Torr. Nitrogen is used as the carrier gas 7, and the flow rate is set to 3 using a mass flow controller. 0 and 1 0 0 sccm. Without using any oxidizing gas 5, Nitrogen is used as the relative gas 6, and the flow rate of the relative gas is set to 500 seem. The temperature of the substrate 4 is set to 350 ° C, and the film formation is performed under heating for 2.5, 5, 10, 20, 60, and 120 minutes. Ministry of Economy Wisdom Printed by the Employees' Cooperative of the Property Bureau. In Figure 21, the closed ring (a) shows the deposition time and film thickness of the ruthenium-containing film formed on the substrate. The ruthenium-containing film was obtained at 2.5 minutes and a longer deposition time. It increases linearly with the increase of the deposition time. The ruthenium-containing film can be easily formed without showing any incubation time (the time when no film is formed on the substrate). Comparative Example 3 The device was run as in Example 7, but about 10 grams of commercially available bis (ethylcyclopentadienyl) ruthenium was fed into the precursor container 1. Box (b) in Fig. 21 shows the formation on the base The paper size on the material applies the Chinese National Standard (CNS) A4 specification (210X297 mm) -31-Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 1227239 A7 ________B7_ V. Description of the invention (2 $ during the deposition of ruthenium-containing films And the thickness of the film. The incubation time was found before the deposition time reached 20 minutes. Example 8 Synthesis of mineral-based bis (2-methyl-1,3-pentadiene) ruthenium 160 g of zinc powder was introduced into 100 ml of four necks In a flask, after connecting a stirrer, a dropping funnel, a condenser, and a thermometer, the flask was flushed with argon. Thereafter, 60 ml of 2-methyl-1,3-pentadiene was added, and zinc powder was dispersed therein by stirring. Secondly, 10 g of ruthenium chloride η-hydrate dissolved in 400 liters of ethanol was added from the dropping funnel for 1 hour, while maintaining the temperature in the water bath at 25 ° C or lower. After the dripping was completed, the resulting mixture was heated to 70 ° C and stirred for 3 hours. Zinc powder was filtered from the reaction mixture, and ethanol and the like were removed under reduced pressure. The obtained pasty product was extracted with pentane. The extract was purified by column chromatography using alumina as the filling and pentane as the solvent. After removing the solvent, 9.99 g of carbonylbis (2-fluorenyl-1,3-pentadiene) ruthenium was obtained as a yellow liquid (yield: 89%). ^ -NMR (COCh) S 3.91 (d, 2H, J = 7.5Hz), 2.04 (s, 6H), 1.42 (s, 2H), 1.27 (d, 6H, J = 6Hz), 1.17 (dq, 2H, J = 14Hz), 0.30 (s, 2H). 13C-NMR (CDCh) δ 218.88 (CO), 91.51 (〇, 89.47 (CH), 50.51 (CH), 37.58 (CHa), 22.84 (CH3), 18.78 (CH〇IR 1 967 cm'1 (CO) MS 294 (M +) This paper size is applicable to Chinese National Standard (CNS) A4 size (210x297 mm) (Please read the precautions on the back before filling this page). Binding · Binding-Thread • 32- 1227239 A7 B7 V. Invention Explanation (30 Example 9 Thermal decomposition properties of carbonylbis (2-methyl-1,3-pentadiene) ruthenium (measured by DSC) 6.7 mg of the carbonylbis (2-methyl-1, 3-Pentadiene) Ruthenium is introduced into a stainless steel pan and hermetically covers the stainless steel lid. This sample was heated at a rate of 10 ° C / min using 18.8 mg of alumina as a reference 'using a differential scanning calorimeter ( DSC) measures the change in heat during heating. An exothermic reaction was found at about 120 ° C to confirm the decomposition of the complex. The results are shown in Figure 22. Example 10 0 Carbonylbis (2-fluorenyl-1,3-pentane (Ene) ruthenium as a precursor to manufacture ruthenium-containing films by CVD method Using the CVD apparatus shown in FIG. 1 with carbonylbis (2-methyl-1,3-pentadiene) ruthenium as a precursor, At 50 ° C precursor temperature, 100 sccm carrier gas (N2) flow rate, 400 Torr precursor pressure, 200 sccm relative gas (N2) flow rate, 80 ° C tube temperature, 300 ° C substrate temperature, 10 Torr The fj film was formed on a silicon wafer with a Si02 film under an ear groove pressure and a flow rate of 300 seem oxidizing gas (〇2) over 1 hour. By analyzing the X-ray diffractometer, the film was found to contain ru〇2. The thickness of the film measured by SEM was 500 nm. Example 11 A spin-coating method was used to produce a ruthenium-containing film using spinyl bis (2-methyl-1,3-pentadiene) ruthenium as a precursor. Paper size applies Chinese National Standard (CNS) A4 specification (210X297 mm) ---------- Zhuang Yi-(Please read the precautions on the back before filling in this page j -Order · -Line · Economy Printed by the Consumer Cooperatives of the Ministry of Intellectual Property Bureau -33- Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economy 1227239 A7 _B7___ V. Description of the Invention (3) By putting 1 ml of carbonylbis (2-methyl-1,3- Pentadiene) ruthenium was dissolved in 9 ml of heptane to prepare a solution. This solution was spin-coated on a silicon wafer at 500 rpm for 5 seconds and at 100 After 10 seconds at 0 revolutions per minute, it was then heated in a furnace at 150 ° C for 20 minutes. By analysis by X-ray diffraction, the film was found to contain RuO2. The film thickness measured by SEM was 300 nm. Comparative Example 4 The film formation was performed in the same manner as in Example 10, but starting from bis (ethylcyclopentadienyl) ruthenium. As a result, a ruthenium-containing film cannot be obtained. Example 12 2 8.0 grams of zinc was introduced into a Schlenk test tube. After flushing the container with argon, 240 µl of ethylcyclopentadiene and 4 ml of 2,4-dimethyl-1,3-pentadiene were added. Under ice cooling, 608 mg of ruthenium chloride η-hydrate (η: about 3) dissolved in 25 ml of absolute ethanol was added dropwise over 1 hour and 15 minutes. Thereafter, the resulting mixture was stirred under ice cooling for 1 hour and 30 minutes, and then at room temperature for 1 hour. After the reaction was completed, unreacted zinc was removed using a glass filter, and the residue was concentrated under reduced pressure to give a pasty product. This paste product was extracted with pentane, and the extract was subjected to column chromatography (pentane / alumina) to produce 106 mg of the target (2,4-dimethylpentadienyl) (ethylcyclopentadienyl). Ruthenium (yield: 16%). Further, 70 mg of a by-product of bis (ethylcyclopentadienyl) ruthenium was obtained (yield: 11%). Although the present invention has been described in detail with reference to specific specific examples, familiarize yourself with this technique (please read the notes on the back before filling out this page) • Pei-Order I · Threaded paper size applies Chinese National Standard (CNS) A4 Specification (210 × 297 (Mm) -34- 1227239 A7 B7 V. Invention Description (3i artists are known to make various changes and modifications without departing from the spirit and scope of the invention. Equipment— (Please read the precautions on the back before filling out this Page) Ordered by I · Line Ministry of Economic Affairs Intellectual Property Bureau Employees' Cooperatives Printed on this paper Standards applicable to Chinese National Standard (CNS) A4 (210X297 mm) -35-

Claims (1)

1227239 Β81227239 Β8 (請先閲讀背面之注意事項再填寫本頁) 其中R、R2、r3及R4相同或相異且各表示氫、鹵原子、 '低院氧基、低烷氧羰基或低烷基,其先決條件爲 不包括Rl至R4皆爲氫之情況,及R1係爲氫,R2至R4中 之一係爲氫,其餘者係爲甲基之情況。 2. % $請專利範圍第1項之半夾層型有機金屬釕化合 年勿’其中該半夾層型有機金屬釕化合物係由以下通式(2) 表示: R1(Please read the notes on the back before filling out this page) where R, R2, r3, and R4 are the same or different and each represents hydrogen, halogen atom, 'lower oxygen, lower alkoxycarbonyl, or lower alkyl, which are prerequisites The conditions are excluding the case where R1 to R4 are hydrogen, and the case where R1 is hydrogen, one of R2 to R4 is hydrogen, and the other is methyl. 2.% $ Please apply the semi-sandwich type organometallic ruthenium compound in the first item of the patent scope. The semi-sandwich type organometallic ruthenium compound is represented by the following general formula (2): R1 經濟部智慧財產局員工消費合作社印製 其中R1及R2係相同或相異,且各表示氫、鹵原子、低醯 基、低烷氧基、低烷氧羰基或低烷基,其先決條件爲不包 括R1係爲氫且R2係爲甲基之情況。 3.—種製造含釕薄膜之方法,其特徵爲使用如申請專 利範圍第1項之半夾層型有機金屬釕化合物作爲前驅物, 本紙張尺度適用中國國家梂準(CNS ) A4規格(210X297公釐) -36- 1227239 六、申請專利範圍 2 C8 D8 且藉化學氣相沉積方法於加熱基材上形成含釕之薄膜。 4· 一種製造由以下通式(1)所示之半夾層型有機金屬釕 化合物的方法,Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs, where R1 and R2 are the same or different and each represents hydrogen, halogen atom, low fluorenyl, low alkoxy, low alkoxycarbonyl or low alkyl, the prerequisites are: The case where R1 is hydrogen and R2 is methyl is not included. 3. A method for manufacturing a ruthenium-containing thin film, which is characterized in that a semi-sandwich-type organometallic ruthenium compound such as the first item in the scope of patent application is used as a precursor. (%) -36- 1227239 6. Apply for a patent scope of 2 C8 D8 and form a ruthenium-containing film on a heated substrate by chemical vapor deposition. 4. A method for producing a semi-sandwich type organometallic ruthenium compound represented by the following general formula (1), (1) 其中R1至R4相同或相異且各表示氫、鹵原子、低醯基、 低院氧基、低烷氧羰基或低烷基,其包括使以下通式(3) 所示之開放型二茂釕: R2 R2(1) wherein R1 to R4 are the same or different and each represents hydrogen, a halogen atom, a lower fluorenyl group, a lower alkoxy group, a lower alkoxycarbonyl group, or a lower alkyl group, which includes opening up represented by the following general formula (3) Ruthenium type: R2 R2 R3 R4 (3) 广请先聞讀背面之注意事項鼻填寫本 •絮· .1 其中R、R及R各如前文定義; 於溶劑中鋅存在下與以下通式(4)所示之環戊二烯進 行反應: 經濟部智慧財產局員工消費合作社印製 (4) 其中R1係如前文所描述。 5 · —種如申請專利範圍第4項之製造半夾層型有機金 屬釕化合物的方法,其中通式(3)所示之開放型二茂釕係 爲藉著在由以下通式(5)所示之戊二烯與鋅的液體混合物 本紙張尺度適用中國國家標準(CNS ) A4«L^rf71〇x297公董_y -37- 1227239 Α8 Β8 C8 D8 六、申請專利範圍 3 中: R2R3 R4 (3) Please read the precautions on the back first to fill in this note. · 1. Where R, R and R are as defined above; in the presence of zinc in the solvent, the ring represented by the following general formula (4) Pentadiene reacts: Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs (4) where R1 is as described above. 5 · A method for producing a semi-sandwich-type organometallic ruthenium compound as described in item 4 of the scope of the patent application, wherein the open-type ruthenium system represented by the general formula (3) is obtained by the following general formula (5) The liquid mixture of pentadiene and zinc shown in this paper applies the Chinese National Standard (CNS) A4 «L ^ rf71〇x297 public director_y -37-1227239 Α8 Β8 C8 D8 6. Scope of patent application 3: R2 (5) 低醯基、低烷氧基、低烷氧羰基或低烷基; 滴入以下通式(6)所示之鹵化釕水合物經溶劑稀釋之 溶液: RuXs · nH2〇 (6) (請先閲讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 其中X係表示鹵原子;且η係爲由〇至10之數; 且與其進行反應。 6.—種如申請專利範圍第4項之製造半夾層型有機金 屬釕化合物的方法,其中採用甲醇作爲整體溶劑或其一部 分’在完成反應之後濾出過量鋅之後,使用與甲醇絕不相 溶混之溶劑萃取由通式(1)表示之釕錯合物。 7 · —種如申請專利範圍第4項之製造半夾層型有機金 屬釕化合物的方法,其中,在使用與甲醇絕不相溶混之溶 劑萃取之後’該溶液係濃縮且蒸餾,以純化由通式(1)表 不之半夾層有機金屬釕化合物。 8 · —種如申請專利範圍第5項之製造半夾層型有機金 屬釕化合物的方法,其中由通式(5)所示之戊二烯的添加 量係爲每莫耳鹵化釕水合物由2至20莫耳。 本紙張尺度適用中國國家標準(CNS ) Α4規格(210X297公釐) •38- 1227239 A8 B8 C8 D8 六、申請專利範圍 4 9. 一種如申請專利範圍第4項之製造半夾層型有機金 屬釘化合物的方法,其中鋅添加量係爲每莫耳鹵化釕水合 物或通式(3)所示之開放型二茂釕由ι·5至ι〇〇莫耳。 10· —種如申請專利範圍第4項之製造半夾層型有機 金屬釕化合物的方法,其中由通式(5)所示之戊二烯與由 通式(6)所示之鹵化釕水合物反應以合成通式(3)所示之開 放型二茂釕之反應係於由_2〇至1〇〇°C之溫度下進行。 11. 一種如申請專利範圍第4項之製造半夾層型有機 金屬釕化合物的方法,其中由通式(3)所示之開放型二茂 釘與由通式(4)所示之環戊二烯反應以合成通式(1)所示之 半夾層型有機金屬釕化合物之反應係於由_2〇至1〇〇它之 溫度下進行。 12. —種如申請專利範圍第4項之製造半夾層型有機 金屬釕化合物的方法,其中,通式所示之半夾層型有 機金屬釕錯合物藉由通式(3)所示之開放型二茂釕與通式 (4)所示之環戊二烯進行反應的合成中,通式(4)所示之環 戊二儲的添加量係爲每莫耳通式(3)所示之開放型二茂釕 由0.8至1莫耳。 13· —種如申請專利範圍第4項之製造半夾層型有機 金屬釕化合物的方法,其中’在製得通式(3)所示之開放 型二茂釕之後’不進行單離,而於單一鍋中與通式(4)所 示之環戊二嫌進行反應,以合成通式(1)所示之半夾層型 有機金屬釕化合物。 14. 一種如申請專利範圍第4項之製造半夾層型有機 本紙張尺度適用中國國家摞準(CNS ) A4規格(210X297^3 ---Mr-----_裝—— (請先閲讀背面之注意事項再填寫本頁) 、^1 經濟部智慧財產局員工消費合作社印製 -39- 1227239 A8 B8 C8 D8々、申請專利範圍 5 金屬釕化合物的方法’其中該反應係於氮氣或惰性氣體氛 圍中進行。 15. 如申請專利範圍第3項之製造含釕薄膜之方法, 其中使用藉由將如申請專利範圍第1項之半夾層型有機金 屬釕化合物溶解於有機溶劑中所製備之半夾層型有機金屬 釕化合物溶液。 16. —種由以下通式(7)所表示之羰基雙(二烯)釕錯合 物, (請先閲讀背面之注意事項再填寫本頁)(5) a lower fluorenyl group, a lower alkoxy group, a lower alkoxycarbonyl group or a lower alkyl group; a solvent-diluted solution of the ruthenium halide hydrate represented by the following general formula (6) is added dropwise: RuXs · nH2O (6) ( Please read the notes on the back before filling out this page) Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs where X is a halogen atom; and η is a number from 0 to 10; and react with it. 6. A method for manufacturing a semi-sandwich-type organometallic ruthenium compound as described in item 4 of the patent application, wherein methanol is used as the overall solvent or a part thereof 'After the excess zinc is filtered out after the reaction is completed, it is incompatible with methanol The mixed solvent extracts the ruthenium complex represented by the general formula (1). 7 · A method for producing a semi-sandwich-type organometallic ruthenium compound as described in item 4 of the scope of patent application, wherein after extraction with a solvent that is absolutely miscible with methanol, the solution is concentrated and distilled to purify the Formula (1) represents a semi-interlayer organometallic ruthenium compound. 8 · A method for manufacturing a semi-sandwich-type organometallic ruthenium compound as described in item 5 of the patent application, wherein the amount of pentadiene represented by the general formula (5) is 2 to 2 moles of ruthenium halide hydrate To 20 mol. This paper size applies the Chinese National Standard (CNS) A4 specification (210X297 mm) • 38-1227239 A8 B8 C8 D8 6. Application for patent scope 4 9. A semi-sandwich-type organometallic nail compound as described in item 4 of the patent scope Method, wherein the amount of zinc added is from ι · 5 to ιοι mol per mol of ruthenium halide hydrate or an open-type ruthenium metalcene represented by the general formula (3). 10 · —A method for manufacturing a semi-sandwich type organometallic ruthenium compound as described in item 4 of the patent application, wherein pentadiene represented by the general formula (5) and ruthenium halide hydrate represented by the general formula (6) The reaction is carried out by synthesizing an open ruthenium metallocene represented by the general formula (3) at a temperature ranging from -20 to 100 ° C. 11. A method for manufacturing a semi-sandwich-type organometallic ruthenium compound according to item 4 of the scope of patent application, wherein the open-type dicene nail represented by the general formula (3) and cyclopentadiene represented by the general formula (4) The reaction of ene to synthesize a semi-sandwich type organometallic ruthenium compound represented by the general formula (1) is carried out at a temperature ranging from -20 to 100. 12. —A method for manufacturing a semi-sandwich type organometallic ruthenium compound as described in item 4 of the scope of patent application, wherein the semi-sandwich type organometallic ruthenium complex shown by the general formula is opened by the formula (3) In a synthesis in which a type of ruthenium is reacted with a cyclopentadiene represented by the general formula (4), the amount of cyclopentadiene storage represented by the general formula (4) is shown by the general formula (3) per mole The open type of ruthenium is from 0.8 to 1 mole. 13. · A method for producing a semi-sandwich-type organometallic ruthenium compound as described in item 4 of the scope of the patent application, wherein 'after obtaining an open ruthenium metallocene represented by the general formula (3)' A single pot is reacted with cyclopentadiene represented by the general formula (4) to synthesize a semi-sandwich type organometallic ruthenium compound represented by the general formula (1). 14. A kind of semi-sandwich type organic paper as in the scope of patent application No. 4 is applicable to China National Standard (CNS) A4 specification (210X297 ^ 3 --- Mr -----_ installation-(Please read first Note on the back, please fill out this page again), ^ 1 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs -39-1227239 A8 B8 C8 D8々, Patent Application Method 5 Method of metal ruthenium compounds' where the reaction is under nitrogen or inert It is carried out in a gas atmosphere. 15. The method for manufacturing a ruthenium-containing thin film according to item 3 of the patent application, wherein a method prepared by dissolving a semi-sandwich type organometallic ruthenium compound as described in item 1 of the patent application in an organic solvent is used. Semi-sandwich type organometallic ruthenium compound solution. 16. —A carbonyl bis (diene) ruthenium complex represented by the following general formula (7), (Please read the precautions on the back before filling this page) R6 R7R6 R7 訂 經濟部智慧財產局員工消費合作社印製 其中R5至R8係各表示氫、烷基、或含有烷氧基、烷氧羰 基、烷醯基、羥基、羰基、鹵原子、羧基、胺基或胺基甲 醯基之烷基,該未經取代之烷基及經取代之烷基各具有1 至6個碳原子,其先決條件不包括R5至R8皆爲氫之情況 及R5及R8係爲氫且R6及R7係爲甲基之情況。 17.如申請專利範圍第16項之羰基雙(二烯)釕錯合物 ,其中,在通式(7)中,R5至R8中至少一者係爲烷基或含 有烷氧基、烷氧羰基、烷醯基、羥基、羰基、鹵原子、羧 基、胺基或胺基甲醯基之烷基,該未經取代之烷基及經取 代之烷基各具有1或2個碳原子,而其餘者係爲氫,其先 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) -40- 1227239 Α8 Β8 C8 D8 六、申請專利範圍 6 決條件爲不包括R5至R8皆爲氫之情況,及R5及R8係爲 氫,且R6及R7係爲甲基之情況。 18·如申請專利範圍第16項之羰基雙(二烯)釕錯合物 ,其中’在通式(7)中,R5及R7係爲氫,而R6及R8係爲 甲基。 19·一種製造如申請專利範圍第16項之羰基雙(二烯) 釕錯合物的方法,其中氯化釕η -水合物一其中η係爲1或 較大之數一係與二烯於醇中於鋅粉存在下進行反應。 20·如申請專利範圍第19項之製造羰基雙(二烯)釕錯 合物的方法,其中該二烯係由以下通式(8)表示: (請先閲讀背面之注意事項再填寫本頁)Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs, where R5 to R8 each represent hydrogen, alkyl, or contain alkoxy, alkoxycarbonyl, alkylfluorenyl, hydroxyl, carbonyl, halogen atom, carboxyl, amine, or amine The methylformyl alkyl group, the unsubstituted alkyl group and the substituted alkyl group each have 1 to 6 carbon atoms, the prerequisites do not include the case where R5 to R8 are all hydrogen and R5 and R8 are hydrogen When R6 and R7 are methyl groups. 17. The carbonyl bis (diene) ruthenium complex according to item 16 of the application, wherein in the general formula (7), at least one of R5 to R8 is an alkyl group or contains an alkoxy group or an alkoxy group. Carbonyl, alkyl, hydroxy, carbonyl, halogen, carboxy, amine, or aminomethyl alkyl groups, the unsubstituted alkyl group and substituted alkyl group each having 1 or 2 carbon atoms, and The rest is hydrogen, and its paper size is applicable to the Chinese National Standard (CNS) A4 specification (210X297 mm) -40-1227239 Α8 Β8 C8 D8 VI. Patent application scope 6 The prerequisite is that R5 to R8 are not hydrogen This is the case where R5 and R8 are hydrogen, and R6 and R7 are methyl. 18. The carbonyl bis (diene) ruthenium complex according to item 16 of the application, wherein 'in the general formula (7), R5 and R7 are hydrogen, and R6 and R8 are methyl. 19. A method for producing a carbonyl bis (diene) ruthenium complex as described in item 16 of the scope of patent application, wherein ruthenium chloride η-hydrate-wherein η is 1 or a larger number The reaction proceeds in the presence of zinc powder in the alcohol. 20. The method for manufacturing a carbonylbis (diene) ruthenium complex according to item 19 of the scope of patent application, wherein the diene is represented by the following general formula (8): (Please read the precautions on the back before filling this page ) 、1Τ 經濟部智慧財產局員工消費合作社印製 其中R5至R8係各表示氫、烷基、或含有烷氧基、烷氧羰 基、烷醯基、羥基、羰基、鹵原子、羧基、胺基或胺基甲 醯基之烷基,該未經取代之烷基及經取代之烷基各具有1 至6個碳原子,其先決條件不包括R5至R8皆爲氫之情況 及R5及R8係爲氫且R6及R7係爲甲基之情況。 21.如申請專利範圍第20項之製造羰基雙(二烯)釕錯 合物的方法,其中,在通式(8)中,R5至R8中至少一者係 爲烷基或含有烷氧基、烷氧羰基、烷醯基、羥基、羰基、 鹵原子、羧基、胺基或胺基甲醯基之烷基,該未經取代之 烷基及經取代之烷基各具有1或2個碳原子,而其餘者係 爲氫,其先決條件爲不包括R5至R8皆爲氫之情況,及R5 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) -41 - 1227239 A8 B8 C8 D8 六、申請專利範圍 7 及R8係爲氫,且R6及R7係爲係爲甲基之情況。 22·如申請專利範圍第20項之製造羰基雙(二烯)釕_ 合物的方法,其中,在通式(8)中,R5及R7係爲氫,而r6 及R8係爲甲基。 23·如申請專利範圍第19項之製造羰基雙(二烯)釕錯 合物的方法,其中氯化釕η-水合物之醇溶液係滴入二烯 內或分散有鋅粉之二烯的醇溶液中,且於〇至8(TC下反 應。 24·—種製造含釕薄膜之方法,其包括使用如申請專 利範圍第16項之羰基雙(二烯)釕錯合物作爲前驅物。 25·如申請專利範圍第24項之製造含釕薄膜之方法, 其中釕或氧化釕係於基材上藉化學氣相沉積方法生長。 26.如申請專利範圍第24項之製造含釕薄膜之方法, 其中藉由塗層熱分解方法於基材上形成釕或氧化釕。 -----------__ Μ裝 I — (請先閲讀背面之注意事項再填寫本頁) 訂 經濟部智慧財產局員工消費合作社印製 本紙張尺度適用中國國家摞準(CNS ) A4規格(210X297公釐) -42-Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs, where R5 to R8 each represents hydrogen, alkyl, or contains alkoxy, alkoxycarbonyl, alkylfluorenyl, hydroxyl, carbonyl, halogen atom, carboxyl, amine or The aminomethylamino alkyl group, the unsubstituted alkyl group and the substituted alkyl group each have 1 to 6 carbon atoms, the prerequisites do not include the case where R5 to R8 are all hydrogen and R5 and R8 are When hydrogen and R6 and R7 are methyl. 21. The method for producing a carbonylbis (diene) ruthenium complex as claimed in claim 20, wherein in the general formula (8), at least one of R5 to R8 is an alkyl group or contains an alkoxy group , Alkoxycarbonyl, alkylfluorenyl, hydroxy, carbonyl, halogen, carboxyl, amine or aminomethyl alkyl groups, the unsubstituted alkyl group and substituted alkyl group each having 1 or 2 carbons Atoms, while the rest are hydrogen. The prerequisites are that the cases where R5 to R8 are all hydrogen, and R5. This paper size applies the Chinese National Standard (CNS) A4 specification (210X297 mm) -41-1227239 A8 B8 C8 D8 6. The scope of patent application 7 and R8 are hydrogen, and R6 and R7 are methyl. 22. The method for producing a carbonylbis (diene) ruthenium compound according to item 20 of the application, wherein, in the general formula (8), R5 and R7 are hydrogen, and r6 and R8 are methyl. 23. The method for producing a carbonyl bis (diene) ruthenium complex according to item 19 of the application, wherein the alcohol solution of ruthenium chloride η-hydrate is a diene in which the diene is dropped into the diene or zinc powder is dispersed. It is reacted in an alcohol solution at 0 to 8 ° C. 24. A method for manufacturing a ruthenium-containing film, which comprises using a carbonylbis (diene) ruthenium complex as a precursor as described in item 16 of the patent application. 25. The method for manufacturing a ruthenium-containing thin film as claimed in item 24 of the patent application, wherein ruthenium or ruthenium oxide is grown on a substrate by a chemical vapor deposition method. 26. The method for producing a ruthenium-containing thin film as claimed in item 24 of the patent application Method, in which ruthenium or ruthenium oxide is formed on the substrate by thermal decomposition of the coating. -----------__ M 装 I — (Please read the precautions on the back before filling this page) The paper size printed by the Employees' Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs is compliant with China National Standards (CNS) A4 (210X297 mm) -42-
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI483948B (en) * 2008-12-25 2015-05-11 Tosoh Corp A ruthenium compound, a method for producing the same, a method for producing a ruthenium-containing thin film using the ruthenium compound, and a ruthenium-containing film
TWI831983B (en) * 2019-06-21 2024-02-11 日商Adeka股份有限公司 Ruthenium compound, material for thin film formation, and process for thin film formation

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI483948B (en) * 2008-12-25 2015-05-11 Tosoh Corp A ruthenium compound, a method for producing the same, a method for producing a ruthenium-containing thin film using the ruthenium compound, and a ruthenium-containing film
TWI831983B (en) * 2019-06-21 2024-02-11 日商Adeka股份有限公司 Ruthenium compound, material for thin film formation, and process for thin film formation

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