TWI226309B - Method for fabricating a diamond film having low surface roughness - Google Patents

Method for fabricating a diamond film having low surface roughness Download PDF

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Publication number
TWI226309B
TWI226309B TW92118795A TW92118795A TWI226309B TW I226309 B TWI226309 B TW I226309B TW 92118795 A TW92118795 A TW 92118795A TW 92118795 A TW92118795 A TW 92118795A TW I226309 B TWI226309 B TW I226309B
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Taiwan
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substrate
diamond film
surface roughness
low surface
carrier plate
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TW92118795A
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Chinese (zh)
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TW200502168A (en
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Bing-Yin Liou
Jiun-Hau Shie
Jeng-Hung Fan
Hung-Ying Tsai
Jian-Jang Su
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Ind Tech Res Inst
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Abstract

A process for making a diamond film with low surface roughness. A substrate is provided. A diamond layer is deposited on the substrate. A binder layer is coated over the diamond layer. A carrier plate is provided to join with the binder layer, thereby forming a laminate structure. The substrate is then removed, thereby obtaining a diamond film with a low surface roughness with respect to the surface roughness of the removed substrate.

Description

1226309 五、發明說明(1) 【發明所屬之技術領域】 本發明係為一種具低表面粗糙度之鑽石膜結構製程, 尤指f用於具有低表面粗糙度鑽石膜之表面聲波渡波器( SA Fi 1 t e r)或用於奈米轉印技術之轉印頭製 造。 【先前技術】 ί於鑽石具有極佳之物理及化學特性,因此已被廣泛 ,應用於傳統的切削工具及光通訊元件上,且目前均係以 溥膜之型態應用,該鑽石膜通常以熱燈絲化學氣相沉積( f°^,fllament cvd)及電漿輔助化學氣 目 /儿、Plasma assisted CVD)等 沉積於基板上’且不論利用何種方式沉積該鑽石膜,其表 面之粗糙度(a v e r a g e s u [ f a c e r 〇 u ghne s s)大約在數微米("瓜)左右,對於製作電 2元件基材而5 ,如此高的表面粗糙度根本無法應用於精 岔電子元件上。 示’當利用上述之方法於承載板1 〇 3上 "Μ貝鑽膜2 0a,由於該鑽石骐2〇 a表面之表面較為 粗糙,因此欲得到低表面粗糙度之 表面,則 必J依賴平坦化加工製程才能達到:一=。該平坦化加 =土:通常利用機械能或能量束方式進行,如機械拋光、 i加輔助研磨、熱化學機械加工等。 ^上述名知之鑽石膜平坦化製程仍具有缺點: 鑽石膜表面經機械能或能量束方式加工後,其表面粗糙度1226309 V. Description of the invention (1) [Technical field to which the invention belongs] The present invention is a diamond film structure manufacturing process with a low surface roughness, especially f is used for a surface acoustic wave transformer (SA) having a diamond film with a low surface roughness. Fi 1 ter) or transfer head manufacturing for nano transfer technology. [Previous technology] Diamonds have excellent physical and chemical characteristics, so they have been widely used in traditional cutting tools and optical communication components. At present, they are all used in the form of rhenium film. The diamond film is usually Thermal filament chemical vapor deposition (f ° ^, fllament cvd) and plasma-assisted chemical gas deposition (Plasma assisted CVD, Plasma assisted CVD, etc.) are deposited on the substrate 'and the surface roughness of the diamond film is deposited regardless of the method used (Averagesu [facer 〇u ghne ss) is about several micrometers (" melon), for the production of electrical 2 element substrate 5, such a high surface roughness can not be applied to precision electronic components. It is shown that when the above method is used on the carrier plate 1 03 " M shell diamond film 20a, because the surface of the diamond 20a is relatively rough, so if you want to obtain a surface with a low surface roughness, you must rely on The planarization process can only be achieved: a =. The flattening plus soil: usually performed by mechanical energy or energy beam methods, such as mechanical polishing, i plus auxiliary grinding, thermochemical mechanical processing, and the like. ^ The well-known diamond film flattening process still has disadvantages: After the surface of the diamond film is processed by mechanical energy or energy beam, its surface roughness

I 第7頁 1226309 五、發明說明(2) 一 只可加工至數微米(# m ),但是花費時間通常為數天之 久’因此耗費過長時間,且增加製程設備費用,並使得製 程技術門檀較高。 緣是,發明人乃根據此等缺失及依據多年來從事製造 產品之相關經驗,悉心觀察且研究之,乃潛心研究並配合 學理之運用,而提出一種設計合理且有效改善上述缺失之 本發明。 【發明内容】 本發明之目的一係提供一種具低表面粗輪度之鑽石膜 結構製程,以降低鑽石膜表面之粗糙度。 本發明之目的二係提供一種具低表面粗糙度之鑽石膜 結構製程’以簡單化製程技術’且同時減少製程時間。 本發明之目的三係提供一種具低表面粗糙度之鑽石膜 結構製程,以製造出具低表面粗糙度且具有微結構之鑽石 膜表面。 依據前述發明目的’本發明係為一種具低表面粗糙度 之鑽石膜結構製程,其實施例一步驟包括: 提供一基板; 上’以形成一多層結 沉積一鑽石膜層於該基板上; 膠合一結合劑於該鑽石膜層上; 提供一承載板,其接合於該結合劑 構體;及 移除該基板 鑽石膜。 藉以得到相對於該基板之低表面粗糙度之I Page 7 1226309 V. Description of the invention (2) One can be processed to several micrometers (#m), but it usually takes several days', so it takes too long, and increases the cost of process equipment, and makes the process technology door Tan is higher. The reason is that the inventor based on these deficiencies and based on years of relevant experience in manufacturing products, carefully observed and researched them, and devoted himself to studying and cooperating with the application of science, to propose a present invention with a reasonable design and effective improvement of the aforementioned deficiencies. [Summary of the Invention] An object of the present invention is to provide a diamond film structure manufacturing process with a low surface roughness to reduce the roughness of the diamond film surface. The second object of the present invention is to provide a diamond film structure process with a low surface roughness to simplify the process technology and reduce the process time. The third object of the present invention is to provide a diamond film structure manufacturing process with low surface roughness to manufacture a diamond film surface with low surface roughness and microstructure. According to the foregoing object of the invention, 'The present invention is a diamond film structure manufacturing process with a low surface roughness. One embodiment of the method includes: providing a substrate; on' to form a multilayer junction and depositing a diamond film layer on the substrate; Gluing a bonding agent on the diamond film layer; providing a carrier plate which is bonded to the bonding agent structure; and removing the substrate diamond film. Thereby, a low surface roughness relative to the substrate is obtained.

第8頁 1226309 五、發明說明(3) 另外,本發明實施例二之步驟包括: 提供一基板; 沉積一鑽石膜層於該基板上; 鍍置一導電膜於該鑽石膜層上; 鑛置一金屬厚膜於該導電膜上;及 移除該基板,藉以得到相對於該基板之低表面粗糙度之 鑽石膜。 再者,本發明實施例三之步驟包括:Page 1226309 V. Description of the invention (3) In addition, the steps of the second embodiment of the present invention include: providing a substrate; depositing a diamond film layer on the substrate; plating a conductive film on the diamond film layer; A thick metal film on the conductive film; and removing the substrate to obtain a diamond film with a low surface roughness relative to the substrate. Furthermore, the steps in the third embodiment of the present invention include:

提供一基板及一承載板其各具有一相對應沉積面; …排列該基板及該承載板,使其相對應沉積面間形成一預 定之沉積膜間距; 通入一化學氣相沉積氣體於該沉積膜間距,以沉積一鑽 石膜於該沉積膜間距内並附著於該基板及該承載板上之沉 積面上;及 移除該基板 糙度之鑽石膜 藉以得到相對於該基板沉積面之低表面粗Provide a substrate and a carrier plate each having a corresponding deposition surface; ... arrange the substrate and the carrier plate so that a predetermined deposition film interval is formed between the corresponding deposition surfaces; a chemical vapor deposition gas is passed in the Deposited film spacing to deposit a diamond film within the deposited film spacing and adhere to the substrate and the deposition surface of the carrier plate; and remove the diamond film of the substrate roughness to obtain a lower relative to the substrate deposition surface Rough surface

為了使 貴審查員能進一 内各’请參閱以下有關本發明 附圖示僅提供參考與說明用, 者。 步了解本發明之特徵及技術 之詳細說明及附圖,然而所 並非用來對本發明加以限制 【實施方式】 ^ 本毛明係為一種具低表面粗糖度之 ^利用接合和蝕刻之方式取代以機械能 匕鑽石膜表面,據以獲得大面積且低表 鑽石膜結構製程, 或能量束方式平坦 面粗糙度之鑽石膜In order to make your examiner better, please refer to the following description of the present invention for reference and explanation only. Step by step to understand the detailed description and drawings of the features and technology of the present invention, but it is not intended to limit the present invention. [Embodiment] ^ This Maoming is a kind of low surface coarse sugar ^ using bonding and etching instead of using Diamond film surface with mechanical energy, according to the process of obtaining large area and low surface diamond film structure, or diamond film with flat surface roughness by energy beam method

$ 9頁 1226309 發明說明 ’而因此簡化製程,無須複雜且昂貴之設備,以節省賃及 物力’且大大地縮短製程時間。 %參閱第二圖A至二圖D所示,其中先提供一具低表$ 9 pages 1226309 Description of the invention ‘and therefore simplify the process without the need for complicated and expensive equipment to save rent and material resources’ and greatly shorten the process time. % Refer to the second chart A to second chart D, which first provides a low meter

面粗輪度沉積面之基板1 0,該基板1 〇可為矽(S 1 }、麵合金(Mo A1 loy)、石墨(Graphi t e )或碳化鎢(W C )等,先濺鍍一中間層1 5於該基 板t 0之沉積面上,其厚度為幾奈米,且材質可為氮化鋁 或碳化石夕,再以化學沉積方式沉積鑽石膜2 〇於該中間層 1 5上’且膠合一結合劑3 〇於該鑽石膜2 〇之表面,該 結合劑3 0可為高分子複合材料、溶膠凝膠(s 〇 1 一 g e 1 )、環氧樹脂、U V感光樹酯、玻璃結合劑或金屬複 合材料等低溫硬化結合劑,再提供承載板4 〇並膠合於該 結合劑3 0上,當該結合劑3 〇為U V感光樹酯時,該承 載板4 〇必須為透明承載板如石英玻璃板等,以當使透明 承載板4 0置於該U V感光樹酯上時,並透過該透明承載 板4 〇以照射u V光於該U V感光樹酯,使該u V感光樹 賴與透明承載板4 0及鑽石膜2 〇接合,最後再同時移除 "亥基板1 〇及該中間層1 5 ,其移除之方式係可利用κ〇 Η 、Η Ν Α等濕式蝕刻或乾式蝕刻方式以移除,且反轉後可 得到具有低表面粗糙度之鑽石膜,其中該中間層1 5係作 為邊鑽石膜2 0與该基板1 〇間之緩衝層,防止相互間之 ^膨脹不同而產生之剝離現象,且於該承載板4 〇接合於 為結合劑3 0上之步驟前,係先將該承載板4 0之接合面Substrate 10 with a rough roundness deposition surface, the substrate 10 may be silicon (S 1), surface alloy (Mo A1 loy), graphite (Graphite), or tungsten carbide (WC), etc., and an intermediate layer is sputter-plated first. 15 On the deposition surface of the substrate t 0, the thickness is a few nanometers, and the material may be aluminum nitride or carbide carbide, and then a diamond film is deposited on the intermediate layer 15 by chemical deposition. A bonding agent 30 is bonded to the surface of the diamond film 20, and the bonding agent 30 may be a polymer composite material, a sol-gel (s 〇1—ge 1), an epoxy resin, a UV-sensitive resin, and a glass bond. Agent or metal composite material, such as low temperature hardening bonding agent, and then provide a carrier plate 40 and glued to the bonding agent 30. When the bonding agent 30 is a UV-sensitive resin, the carrier plate 40 must be a transparent carrier plate Such as a quartz glass plate, etc., when the transparent carrier plate 40 is placed on the UV photosensitive resin, and the transparent carrier plate 40 is passed through to irradiate u UV light to the UV photosensitive resin, so that the u V photosensitive tree Lai was bonded to the transparent carrier plate 40 and the diamond film 20, and finally the " Hai substrate 10 and the intermediate layer were removed at the same time. 15. The removal method can be removed by wet or dry etching methods such as κ〇Η, Η Ν Α, etc., and a diamond film with low surface roughness can be obtained after inversion, wherein the intermediate layer 1 5 is used as a buffer layer between the edge diamond film 20 and the substrate 10 to prevent the peeling phenomenon caused by the different expansion between each other, and before the carrier plate 40 is bonded to the step of bonding agent 30, The joint surface of the carrier plate 40

第10頁 1226309 五、發明說明(5) 蝕刻有複數微溝槽4 1且呈同心圓狀(如第三圖所示), 以使微溝槽4 1能吸收該鑽石膜2 0、接合劑3 〇與該承 載板4 0之熱膨脹而產生之微變形,防止該鑽石膜2 〇與 该承載板4 0因熱膨服而剝離’並且其中於該旦低表面粗 糙度之鑽石膜結構製程中,該中間層1 5可視情況而省略 另外’請參閱第四圖A至第四圖D所示,其中先提供 一具低表面粗糙度沉積面之基板1 〇,其材質可如上述, 再沉積該鑽石膜2 0於該中間層1 5上,其後再以丨賤鐘方 式鍍置導電層5 0於該鑽石膜2 0上,該導電層5 〇係可 為錄(Ni)、錄銘(Ni — Co)、欽錄(Ti 一 N i )及紹(A 1 )專’並再以電鍛厚膜之方式於該導電層 50上鍍置金屬厚膜60如鎳(N i )等,以形成(基& 1 0 /中間層1 5 /鑽石膜2 0 /導電層5 〇 /金屬^膜 6 0 )之結構,最後以濕式蝕刻或乾式蝕刻方式以移除該 基板1 0及該中間層1 5 ’即可獲得原先與該基板1 〇之 沉積面附著一起之低表面粗糙度之鑽石膜2 〇表面,以形 成(鑽石膜2 0/導電層50/金屬厚膜6〇),因此該 鑽石膜2 〇表面很谷易可達到奈米(nm)級之表面粗链度 ,其中該中間層1 5係可情狀況而將予省略。 請參閱第五圖A至第五圖D所示,其中為使低表面粗 糙度之鑽石膜形成特殊凹凸狀或曲面狀,在此提供一基板 1 0及一承載板4 0其各具有一相對應沉積面,且該基板 1 0之沉積面係為低粗糙度’先賤錢一中間層1 5於該基Page 10 1226309 V. Description of the invention (5) A plurality of micro-grooves 41 are etched and are concentric circles (as shown in the third figure), so that the micro-grooves 41 can absorb the diamond film 20, the bonding agent 3 ′ and the micro-deformation caused by the thermal expansion of the carrier plate 40 to prevent the diamond film 20 and the carrier plate 40 from peeling off due to thermal expansion, and is used in the low-roughness diamond film structure manufacturing process. The intermediate layer 15 may be omitted depending on the situation. Please refer to the fourth figure A to the fourth figure D, in which a substrate 1 with a low surface roughness deposition surface is provided first, and the material can be as described above, and then deposited. The diamond film 20 is on the intermediate layer 15, and then a conductive layer 50 is plated on the diamond film 20 in the manner of a bell. The conductive layer 50 can be recorded as (Ni) or recorded. (Ni — Co), Chin (Ti-N i) and Shao (A 1), and then electro-forged a thick film on the conductive layer 50 with a thick metal film 60 such as nickel (N i), etc. To form a structure (base & 1 0 / intermediate layer 15 / diamond film 2 0 / conductive layer 5 0 / metal ^ film 6 0), and finally use wet or dry etching to move The substrate 10 and the intermediate layer 15 ′ can obtain a diamond film 20 surface with a low surface roughness originally attached to the deposition surface of the substrate 10 to form (diamond film 20 / conductive layer 50 / metal Thick film 60), so the surface of the diamond film 20 is very easy to reach the nanometer (nm) level of coarse chain degree, in which the intermediate layer 15 is in a condition that will be omitted. Please refer to the fifth graph A to fifth graph D, in order to make the diamond film with a low surface roughness to have a special concave-convex shape or a curved shape, here are provided a substrate 10 and a carrier plate 40 each having a phase Corresponds to the deposition surface, and the deposition surface of the substrate 10 is of low roughness.

第11頁 1226309 五、發明說明(6) 板1 0之沉積面上,且排列該基板1 0及該承載板4 0 , 使其相對應之沉積面間形成一預定之沉積膜間距7 〇,再 通入一化學氣相沉積氣體於該沉積膜間距7 0 ’以沉積該 鑽石膜2 0於該基板1 〇之中間層1 5,及該承載板4 〇 上之沉積面上,見第五圖C,最後移除該基板1 0及該中 間層1 5,藉以得到相對於該基板1 〇沉積面之低表面袓 糙度的鑽石膜2 0表面,且該鑽石膜2 0係附著於該承栽 板4 0上之沉積面上,其中該中間層1 5作為其後鑽石膜 2 0與該基板1 0間之緩衝層,防止相互間之熱膨脹而產 生之剝離現象’且該中間層1 5可視情況而省略,該承載 板4 0之沉積面蝕刻有複數微溝槽4 1且如前述,以使微 溝槽4 1能吸收該鑽石膜2 0與該承載板4 0之熱膨脹而 產生之微變形’防止該鑽石膜2 〇與該承載板4 0因熱膨 服剝離。 綜上所述’藉由本發明之「具低表面粗糙度之鑽石膜 結構製程」4降低鑽石膜表面粗糙度達奈米(ηπι )級之表 面,且簡化製程技術,並減少製程時間。 惟以上所述僅為本發明之較佳可行實施例,非因此拘 =發明之專利範圍’轉凡運用本發明之說明書及圖示 谷所為之等效結構變化’均皆包含於本發明之範圍内, 无給予陳明。Page 11 1226309 V. Description of the invention (6) The substrate 10 and the carrier plate 40 are arranged on the deposition surface of the substrate 10 so that a predetermined deposition film interval 7 is formed between the corresponding deposition surfaces. Then, a chemical vapor deposition gas is passed through the deposited film at a distance of 70 ′ to deposit the diamond film 20 on the intermediate layer 15 of the substrate 10 and the deposition surface on the carrier plate 40. Figure C. Finally, the substrate 10 and the intermediate layer 15 are removed to obtain a diamond film 20 surface with a low surface roughness relative to the substrate 10 deposition surface, and the diamond film 20 is attached to the substrate. On the deposition surface on the carrier plate 40, the intermediate layer 15 is used as a buffer layer between the diamond film 20 and the substrate 10 to prevent the peeling phenomenon caused by thermal expansion between each other 'and the intermediate layer 1 5 may be omitted according to circumstances. The deposition surface of the carrier plate 40 is etched with a plurality of micro-grooves 41 and as described above, so that the micro-grooves 41 can absorb the thermal expansion of the diamond film 20 and the carrier plate 40. The slight deformation 'prevents the diamond film 20 and the carrier plate 40 from peeling due to thermal expansion. In summary, the "diamond film structure manufacturing process with low surface roughness" 4 of the present invention reduces the surface roughness of the diamond film to the nanometer (ηm) level, and simplifies the process technology and reduces the process time. However, the above are only the preferred and feasible embodiments of the present invention. Therefore, the scope of the patents of the invention is not limited to the scope of the invention. Within, nothing was given to Chen Ming.

1226309 圖式簡單說明 【圖示簡單說明】 第一圖係習知鑽石膜結構之側視圖。 第二圖A至第二圖D係本發明實施例一之製程流程圖 第三圖係本發明承載板4 0之等角視圖。 第四圖A至第四圖D係本發明實施例二之製程流程圖 第五圖A至第五圖D係本發明實施例三之製程流程圖 【圖示中參考號數】 習知 基板1 0 鑽石膜2 0 本發明 基板1 0 中間層1 5 鑽石膜2 0 結合劑3 0 承載板4 0 導電層5 0 金屬厚膜6 0 沉積膜間距7 01226309 Brief description of the drawings [Simplified illustration of the drawings] The first picture is a side view of a conventional diamond membrane structure. The second diagram A to the second diagram D are process flow charts of the first embodiment of the present invention. The third diagram is an isometric view of the carrier plate 40 of the present invention. The fourth diagram A to the fourth diagram D are the process flow diagrams of the second embodiment of the present invention. The fifth diagram A to the fifth diagram D are the process flow diagrams of the third embodiment of the present invention. 0 Diamond film 2 0 Inventive substrate 1 0 Intermediate layer 1 5 Diamond film 2 0 Bonding agent 3 0 Carrier board 4 0 Conductive layer 5 0 Thick metal film 6 0 Deposited film pitch 7 0

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Claims (1)

1226309 六、申請專利範圍 包 1、 一種具低表面粗糙度之鑽石膜結構製程,复+ 括: 〜 提供一基板; 沉積一鑽石膜層於該基板上; 塗敷一低溫硬化結合劑於該鑽石膜層上; 結 提供一承載板,其結合於該結合劑上,以形成一夕 構體;及 夕續 利用濕式或乾式蝕刻方式移除該基板,藉以得到 該基板低表面粗糙度之鑽石膜。 、於 2 如申請專利範圍第1項所述之具低表面粗糙度之鑽 石膜結構製程,其中該結合劑係為感光樹脂,且該承載板 係為透明板。 3、如申明專利範圍第2項所述之具低表面粗糙度之鑽 石膜結構製程,其中該感光樹脂係為紫外光(U V )感光 樹脂。 4、如申請專利範圍第2項所述之具低表面粗糙度之鑽· 石膜結構製程,其中該承載板係為石英玻璃板。 5如申請專利範圍第1項所述之具低表面粗糙度之鑽 石膜結構製程,其中沉積一鑽石膜層前,係先沉積一中間 層於該基板上,再沉積該鑽石膜於該中間層上。1226309 VI. Patent application package 1 、 A diamond film structure manufacturing process with low surface roughness, including: ~ Provide a substrate; deposit a diamond film layer on the substrate; apply a low temperature hardening bonding agent to the diamond On the film layer; the junction provides a carrier plate, which is combined with the bonding agent to form an overnight structure; and the substrate is removed by wet or dry etching to obtain a diamond with a low surface roughness of the substrate membrane. 2. The diamond film structure manufacturing process with low surface roughness as described in item 1 of the scope of the patent application, wherein the bonding agent is a photosensitive resin and the carrier plate is a transparent plate. 3. The diamond film structure manufacturing process with low surface roughness as described in item 2 of the declared patent scope, wherein the photosensitive resin is an ultraviolet (U V) photosensitive resin. 4. The process of drilling and stone film structure with low surface roughness as described in item 2 of the scope of patent application, wherein the carrier plate is a quartz glass plate. 5. The diamond film structure manufacturing process with low surface roughness as described in item 1 of the scope of the patent application, wherein before depositing a diamond film layer, an intermediate layer is deposited on the substrate, and then the diamond film is deposited on the intermediate layer. on. 第14頁 1226309 六、申請專利範圍 6、如申請專利範圍第1項所述之具低表面粗糙度之鑽 石膜結構製程,其中該移除該基板之步驟中包括移除中間 層。 7 如申請專利範圍第1項所述之具低表面粗糙度之鑽 石膜結構製程,其中該承載板之貼合面係具有複數微溝 槽0Page 14 1226309 VI. Scope of patent application 6. The diamond film structure process with low surface roughness as described in item 1 of the scope of patent application, wherein the step of removing the substrate includes removing the intermediate layer. 7 The process of drilling the membrane structure with a low surface roughness as described in item 1 of the scope of the patent application, wherein the bonding surface of the carrier plate has a plurality of micro-grooves. 0 8、如申請專利範圍第1項所述之具低表面粗糙度之鑽 石膜結構製程,其中該結合劑係為紫外光感光樹脂,且該 承載板係為透明板,並該承載板接合於該結合劑之步驟包 括: 置放該承載板於該結合劑上;及 透過該承載板使該結合劑暴露於紫外光中,藉以使承載 板與結合劑接合。 9 一種具低表面粗糙度之鑽石膜結構製程,其步驟包 括:8. The diamond film structure manufacturing process with low surface roughness as described in item 1 of the scope of the patent application, wherein the bonding agent is an ultraviolet light-sensitive resin, and the carrier plate is a transparent plate, and the carrier plate is bonded to the The step of bonding agent includes: placing the carrier plate on the bonding agent; and exposing the bonding agent to ultraviolet light through the carrier plate, thereby bonding the carrier plate to the bonding agent. 9 A diamond membrane structure manufacturing process with low surface roughness, the steps include: 提供一基板; 沉積一鑽石膜層於該基板上; 鍍置一導電膜於該鑽石膜層上; 鍍置一金屬厚膜於該導電膜上;及 利用濕式或乾式蝕刻方式移除該基板,藉以得到相對於Providing a substrate; depositing a diamond film layer on the substrate; plating a conductive film on the diamond film layer; plating a thick metal film on the conductive film; and removing the substrate by wet or dry etching To get relative to 1226309 六、申請專利範圍 該基板低表面粗糙度鑽石膜。 10、如申請專利範圍第9項所述之具低表面粗糙度之 鑽石膜結構製程,其中該導電膜係以濺鍍方式鍍置於該鑽 石膜層上。 11、 如申請專利範圍第9項所述之具低表面粗糙度之 鑽石膜結構製程,其中該金屬厚膜係以電鍍之方式鍍置於 該導電膜上。 12、 一種具低表面粗糙度之鑽石膜結構製程,其步驟 包括: 提供一基板及一承載板,其各具有一相對應沉積面; 排列該基板及該承載板,使其相對應沉積面間形成一預 定之沉積膜間距; ' 通入一化學氣相沉積氣體於該沉積膜間距,以沉積一鑽 石膜於該沉積膜間距内,並附著於該基板及該承載板上之 沉積面上;及 利用濕式或乾式蝕刻方式移除該基板,藉以得到相對於 該基板沉積面之低表面粗糙度之鑽石膜。 13、如申請專利範圍第1 2項所述之具低表面粗键度 之鑽石膜結構製程,更包括濺鍍一中間層於該基板之沉X 面,再沉積鑽石膜於該基板之中間層上及該承載板上之=1226309 6. Scope of patent application The substrate has a low surface roughness diamond film. 10. The diamond film structure manufacturing process with low surface roughness as described in item 9 of the scope of patent application, wherein the conductive film is deposited on the diamond film layer by sputtering. 11. The diamond film structure manufacturing process with low surface roughness as described in item 9 of the scope of patent application, wherein the metal thick film is plated on the conductive film by electroplating. 12. A diamond film structure manufacturing process with low surface roughness, the steps include: providing a substrate and a carrier plate, each of which has a corresponding deposition surface; arranging the substrate and the carrier plate between the corresponding deposition surfaces Forming a predetermined deposition film interval; 'pass in a chemical vapor deposition gas to the deposition film interval to deposit a diamond film within the deposition film interval and attach to the substrate and the deposition surface on the carrier plate; And removing the substrate by wet or dry etching to obtain a diamond film with a low surface roughness relative to the deposition surface of the substrate. 13. The diamond film structure manufacturing process with low surface coarse bond as described in item 12 of the patent application scope, further comprising sputtering an intermediate layer on the sunken surface of the substrate, and then depositing a diamond film on the intermediate layer of the substrate. On and on the carrier board = 第16頁 1226309 六、申請專利範圍 積面上。 14、 如申請專利範圍第1 2項所述之具低表面粗糙度 之鑽石膜結構製程,其中該移除該基板之步驟中同時移除 該中間層。 15、 如申請專利範圍第1 2項所述之具低表面粗糙度 之鑽石膜結構製程,其中該承載板之沉積面具有複數微溝 槽0Page 16 1226309 VI. Scope of patent application 14. The diamond film structure manufacturing process with low surface roughness as described in item 12 of the scope of the patent application, wherein the step of removing the substrate simultaneously removes the intermediate layer. 15. The diamond film structure manufacturing process with low surface roughness as described in item 12 of the scope of the patent application, wherein the deposition surface of the carrier plate has a plurality of micro-grooves. 第17頁Page 17
TW92118795A 2003-07-10 2003-07-10 Method for fabricating a diamond film having low surface roughness TWI226309B (en)

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