TWD239459S - IC test probe - Google Patents

IC test probe

Info

Publication number
TWD239459S
TWD239459S TW113303693D01F TW113303693D01F TWD239459S TW D239459 S TWD239459 S TW D239459S TW 113303693D01 F TW113303693D01 F TW 113303693D01F TW 113303693D01 F TW113303693D01 F TW 113303693D01F TW D239459 S TWD239459 S TW D239459S
Authority
TW
Taiwan
Prior art keywords
test probe
design
inspected
pads
terminals
Prior art date
Application number
TW113303693D01F
Other languages
Chinese (zh)
Inventor
黃東源
黃裁白
裁白 黃
黃路建載
路建載 黃
Original Assignee
韓商惠康有限公司 (南韓)
韓商惠康有限公司
黃東源 (南韓)
黃東源
黃 裁白 (美國)
裁白 黃
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 韓商惠康有限公司 (南韓), 韓商惠康有限公司, 黃東源 (南韓), 黃東源, 黃 裁白 (美國), 裁白 黃 filed Critical 韓商惠康有限公司 (南韓)
Publication of TWD239459S publication Critical patent/TWD239459S/en

Links

Abstract

【物品用途】;本設計係關於一種IC測試用探針，特別是有關於一種用於檢查電子元件之IC測試用探針。;【設計說明】;本設計係與待檢查物體的電極、端子或焊盤接觸的探針，例如半導體裝置、半導體封裝、積體電路、印刷電路板等。[Application] This design relates to an IC test probe, particularly an IC test probe for inspecting electronic components. [Design Description] This design is for contacting electrodes, terminals, or pads on an object to be inspected, such as a semiconductor device, semiconductor package, integrated circuit, or printed circuit board.

Description

IC測試用探針IC test probes

本設計係關於一種IC測試用探針，特別是有關於一種用於檢查電子元件之IC測試用探針。This design relates to an IC test probe, and more particularly to an IC test probe for inspecting electronic components.

本設計係與待檢查物體的電極、端子或焊盤接觸的探針，例如半導體裝置、半導體封裝、積體電路、印刷電路板等。This design involves a probe that contacts the electrodes, terminals, or pads of an object to be inspected, such as a semiconductor device, semiconductor package, integrated circuit, printed circuit board, etc.

TW113303693D01F 2024-01-18 2024-07-18 IC test probe TWD239459S (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR30-2024-0002495 2024-01-18
KR20240002495 2024-01-18

Publications (1)

Publication Number Publication Date
TWD239459S true TWD239459S (en) 2025-07-21

Family

ID=96474508

Family Applications (1)

Application Number Title Priority Date Filing Date
TW113303693D01F TWD239459S (en) 2024-01-18 2024-07-18 IC test probe

Country Status (1)

Country Link
TW (1) TWD239459S (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW202342988A (en) 2022-04-27 2023-11-01 新煒科技有限公司 Probe and probe module thereof

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW202342988A (en) 2022-04-27 2023-11-01 新煒科技有限公司 Probe and probe module thereof

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