TW567593B - Packaging method of memory and apparatus of the same - Google Patents
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Description
567593 五、發明說明(1) 本發明係關於一種記憶體裝置,特別是關於一種堆疊 · 式封裝之記憶體裝置。 由於記憶體技術不斷發展,記憶體裝置之容量已由以 往的1Mb擴充至現今之512Mb,並且朝向更大容量突破。通 常一個較小谷篁之§己憶體的技術,已經發展至一個相常成 熟的地步時,才會突破進入較大容量之記憶體技術,舉例 來說,如2 5 6 M b記憶體的相關技術,由於發展時間較51 2 μ b 記憶體之相關技術來得久,所以製程、測試、包裝···等等 相關技術’都較5 12Mb記憶體之相關技術來得穩定、成熟 。如果能用較小容量之記憶體之成品,堆疊以製成較大容 肇 量之記憶體,在較小容量之記憶體技術相當成熟的情況 下,無非是一個十分可行的方法。 然而,以堆疊方式形成一個較大容量之記憶體,亦會 有需克服的地方。由於標準256Mb之DDR記情體晶片,廿^ 是與標準512Mb議記憶體晶片完全匹配:體;日參片考下並列不 表一0567593 V. Description of the invention (1) The present invention relates to a memory device, and more particularly to a memory device in a stacked package. Due to the continuous development of memory technology, the capacity of memory devices has been expanded from the previous 1Mb to the current 512Mb, and it is moving towards greater capacity. Usually, a smaller Gu 篁 memory technology has developed to a level of maturity, and then it will break into a larger capacity memory technology, for example, 2 5 6 M b memory Relevant technology, because the development time is longer than the related technology of 51 2 μ b memory, so the related technology of process, test, packaging, etc. is more stable and mature than the related technology of 5 12 Mb memory. If the finished product with smaller capacity can be stacked to make a larger capacity memory, it will be a very feasible method if the technology of the smaller capacity memory is quite mature. However, to form a large-capacity memory in a stacked manner, there are also some areas to be overcome. Due to the standard 256Mb DDR memory chip, 廿 ^ is a perfect match with the standard 512Mb memory chip: body; side-by-side test is not listed in Table 1.
0548-7420TWf(N) · 90106 ; dennis.ptd 第 4 頁 567593 五、發明說明(2) 表一0548-7420TWf (N) · 90106; dennis.ptd page 4 567593 5. Description of the invention (2) Table 1
晶片尺寸 (chip size) 256Mb~- 512Mb ~ mm (Item) 64M x 4 128M x 4 架構 (orginizaton) 16M x 4 x 4 32M x 4 x 4 列位址 Crow address) AxO~Axl2 AxO~Axl2 行位址 (column address) AyO~Ay9, Ay11 Ay0-Ay9, Ayll, Ay12 庫位址 (bank address) BAO, BA1 BAO, BA1 目動預死電旗號 (auto precharge —- A10 A10 更新_ (refersh) 8K 8K 由上述表一可以得知,同樣為四輸入/輸出結構(4 I/O configuration)之256Mb記憶體晶片及512—記憶體晶 片,之唯一不同在於51 2Mb記憶體晶片多了一個Ayl2這個 接腳’就是說256Mb記憶體Y(行)位址範圍為Ay〇〜Ayll,而 512Mb記憶體Y(行)位址範圍為Ay〇〜Ayl2,故256Mb記憶體 沒有位址Ayl2的控制信號。Chip size 256Mb ~-512Mb ~ mm (Item) 64M x 4 128M x 4 architecture (orginizaton) 16M x 4 x 4 32M x 4 x 4 Crow address AxO ~ Axl2 AxO ~ Axl2 Row address (column address) AyO ~ Ay9, Ay11 Ay0-Ay9, Ayll, Ay12 bank address (BAO, BA1 BAO, BA1) pre-dead power flag (auto precharge —- A10 A10 update_ (refersh) 8K 8K by The above table 1 shows that the 256Mb memory chip and the 512-memory chip, which also have a four-input / output configuration (4 I / O configuration), the only difference is that the 51 2Mb memory chip has an additional Ayl2 pin. That is to say, the 256Mb memory Y (row) address range is Ay0 ~ Ayll, and the 512Mb memory Y (row) address range is Ay0 ~ Ayl2, so the 256Mb memory has no control signal of address Ayl2.
如第1圖中所示’C1為一個標準型包裝之512Mb之DDR( Double Data Rate)記憶體晶片,而C2為一個傳統堆疊式 包裝之512Mb之DDR記憶體顆粒。由於256Mb記憶體沒有位 址Ayl2的控制信號,所以需要將傳統堆疊式包裝之512Mb 記憶體顆粒中,/CS0及/CS1這兩隻接腳搭配使用來決定内 部兩個256Mb記憶體晶片之動作。因此,傳統堆疊式包裝As shown in Figure 1, 'C1 is a 512Mb DDR (Double Data Rate) memory chip in a standard package, and C2 is a 512Mb DDR memory chip in a traditional stacked package. Since the 256Mb memory does not have the control signal of the address Ayl2, it is necessary to use the two pins of / CS0 and / CS1 to determine the action of the two internal 256Mb memory chips in the 512Mb memory particles of the traditional stacked package. Therefore, traditional stacked packaging
五、發明說明(3) 之5 12Mb記憶體顆粒,盥一曰 完全相容。 " θ曰片之512Mb記憶體顆粒並非 有鑑此,本發明之目的’係提供一個斑#準# $之 512Mb記憶體顆粒完全相容 铽丰包裝之 /CSO及/CSI兩個接腳來押^且大6己隐體,且不需使用 記憶體顆粒標準包裝之 根據本發明之一目止:物二來控制即可。 ,用以將一第―、第二-種记憶體之封裝方法 之記憶體晶片,其中上述:-曰曰’ 2裝成-堆疊式包裝 -、第二堆疊功能電先第提別r 一第 述第一、第二堆疊功能電路各含有二選’ 啟動端。接著,上诚笛一^選擇^以及一 分別電性連接至一基材;片二接合電極, 且電性連接:Γ第ίϋίί擇端至-第-電壓準位, 電性連接上述第-、第二 之啟動鳊至一電源供應電位。 *丘刀此电砂 根據上述另一目的,本發明 包含一第-記憶體晶片;—第:式記憶體,至少 第-記憶體晶…及一第;片’搞接至上述 功能電路’分別設置於上述第:乂:電路及-第二堆疊 個別地具有-選擇端,i述第一堆最::憶體晶片中’且 接至一高位準電壓,且上述第電路之選擇端連 禾一堆疊功能電路之選擇端連 367593 五、發明說明(4) 接至一低位準電壓;其中,上述第— ,於一控制信號為高位準時,使上 一堆疊功能電路 存取動作;而於上述控制信號為低以:記f體晶片執行 憶體晶片執行存取動作。 _丰時,使上述第二記 ,外’本發明的特色及優點將於以下描 〇p分將出現於描述中,或透過t 發明* 、耳她本發明而學得。本 所附Ξ : 將透過其描豸、專利申請範圍及 不中’所仔細指之結構及方法而了解、獲得。 體上發明=憶體封裝方法1以將一第一第二記憶 中U — 1’封裝成一堆疊式包裝之記憶體晶片,其 人執一:第二半導體晶片Cpl、Cp2具有相同定義之接 1 , ? + 說上述第一及第二半導體晶片Cpl、Cp2各為 DDR記憶體晶片’都具有相同定義之電源供應 接a墊(bonding pad)、資料接合墊…等等的接合墊。 本發明之上述記憶體封裝方&,包括首先,分別提供 、第一堆疊功能電路Ccl、Cc2於上述第一、第二記 憶體晶片t,其中上述第一堆疊功能電路Ccl,含有一選 擇(column address 3616(:1^〇11)端(:_ 以及一啟動(stack unction enable)端(:_,且上述第二堆疊功能電路Cc2各 含有一選擇端C2SFE以及一啟動端。 ^由於標準256Mb DDR記憶體,並沒有和標準512Mb DDR §己憶體一樣’可以根據AY 1 2腳位上之控制信號,來決定是 否存取那一晶片的功能,於是本發明在上述第一及第二記5. Description of the invention (3) 5 12Mb memory particles are completely compatible. " θ said that the 512Mb memory particle of the tablet is not the case, the purpose of the present invention is to provide a spot # 准 # $ of the 512Mb memory particle is fully compatible with the two / CSO and / CSI pins of Fengfeng Packaging It is big and hidden, and it is not necessary to use the standard packing of the memory particles according to one aspect of the present invention: the second control. A memory chip for packaging a first and a second memory packaging method, in which the above:-said "2 packed into-stacked packaging-", the second stacking function first mentions r a The first and second stacked functional circuits each include a two-choice start terminal. Next, Shang Cheng Di ^ select ^ and one are respectively electrically connected to a substrate; the sheet is bonded to two electrodes, and electrically connected: Γ 第 ίϋίί alternative terminal to -th-voltage level, electrically connected to the above-, The second start is to a power supply potential. * Qiaodao This electric sand According to the above another object, the present invention includes a first-memory chip;-first-type memory, at least -memory crystal ... and first; tablets 'connected to the above functional circuit' respectively It is arranged in the above-mentioned first circuit:-the circuit and the second stack individually have a -selection terminal, the first stack of the first: the memory chip is connected to a high level voltage, and the selection terminal of the above-mentioned circuit is connected to the The selection terminal of a stacking function circuit is connected to 367593 V. Description of the invention (4) Connect to a low level voltage; where the above-mentioned, when a control signal is at a high level, the previous stacking function circuit is accessed; The control signal is low: the memory chip executes the memory chip to perform the access operation. _Funshi, make the second note above, the features and advantages of the present invention will be described in the following. Pp points will appear in the description, or learned through t invention *, the present invention. This attached Ξ: will be understood and obtained through its description, the scope of patent applications, and the structures and methods carefully referred to in the 'Not Included'. Invention on the Body = Memories Packaging Method 1 to package a U-1 'in a first and second memory into a stacked packaged memory chip. One of them is: the second semiconductor chip Cpl, Cp2 has the same definition as the connection 1 ,? + It is said that the first and second semiconductor wafers Cpl and Cp2 are each a DDR memory chip. Both have the same definition of power supply pads (bonding pads, data bonding pads, etc.). The above-mentioned memory packaging method & of the present invention includes firstly providing first stacking function circuits Ccl and Cc2 to the first and second memory chips t, respectively, wherein the first stacking function circuit Ccl contains a selection ( The column address 3616 (: 1 ^ 〇11) terminal (: _ and a stack unction enable terminal (: _), and the second stacking function circuit Cc2 each includes a selection terminal C2SFE and a startup terminal. ^ Because of the standard 256Mb The DDR memory is not the same as the standard 512Mb DDR §memory body. 'You can decide whether to access the function of that chip according to the control signal on the AY 12 pin. Therefore, the present invention is described in the first and second records above.
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IM 0548-7420TWf(N) ; 90106 ; dennis.ptd 567593 五、發明說明(5) 憶體晶片Cpl、Cp2中,以内建(design in)的方式各加入 一個堆疊功能電路Cel、Cc2,以根據上述AY12腳位上之控 制信號,決定那一記憶體晶片來作存取。 而且上述堆疊功能電路Cel、Cc2中,若上述啟動端 ClCAS、C2CAS連接至一電源供應電位時,即可啟動上述第一 、第二記憶體晶片Cpl、Cp2之堆疊功能,就是說,上述第 一及第二記憶體晶片Cpi、Cp2堆疊成具有原本第一記憶體 晶片C p 1之雙倍容量的一個記憶體晶片。並且上述第一、 第二記憶體晶片Cpl、Cp2之啟動端匕⑴、C2cas,若是不連 接至一個電源供應電位時,則與一個標準256Mb DDR記憶 體完全相同。 接著’以打線接合(bonding wire)的方式將上述第一 及第二記憶體晶片Cpl、Cp2中相同定義之接合墊,連接至 基材T1,例如一導線架(lead frame)或印刷電路板 (p r i n t e d c i r c u i t b 〇 a r d)上’以形成一個球形閘陣列 (Ball Grid Array)包裝或一薄型小尺寸封裝(ΤΜη Smau Out 1 ine Package)。舉例來說,上述第一、第二記憶體晶 片Cpl、Cp2之A0接合墊,就打線接合至用以接收外部電^ 之A0信號的一引線(lead) 29上,其他接合墊則打線接合 至上述導線架上對應之引線卜66上。 然後’打線接合上述第一、第二堆疊功能電路Cci、 Cc2之啟動端C1CAS、(:_至一電源供應電位,以啟動上 一、第二堆疊功能電路Ccl、Cc2。並且打線接合上述第一 堆疊功能電路Cel之上述選擇端Cisfe至一第一電壓準位,且IM 0548-7420TWf (N); 90106; dennis.ptd 567593 V. Description of the invention (5) In the memory chips Cpl, Cp2, a stack function circuit Cel, Cc2 is added in a design (design in) manner, in accordance with the above The control signal on the AY12 pin determines which memory chip is used for access. Moreover, in the stacking function circuits Cel and Cc2, if the startup terminals ClCAS and C2CAS are connected to a power supply potential, the stacking functions of the first and second memory chips Cpl and Cp2 can be activated, that is, the first And the second memory chip Cpi and Cp2 are stacked into a memory chip having double the capacity of the original first memory chip C p 1. In addition, the start ends and C2cas of the first and second memory chips Cpl and Cp2 are completely the same as a standard 256Mb DDR memory if they are not connected to a power supply potential. Then, 'bonding wire' is used to connect the bonding pads with the same definition in the first and second memory chips Cpl and Cp2 to the substrate T1, such as a lead frame or a printed circuit board ( printed circuit board (Oard) to form a Ball Grid Array package or a thin small size package (Tmη Smau Out 1 ine Package). For example, the A0 bonding pads of the first and second memory chips Cpl, Cp2 are wire-bonded to a lead 29 for receiving the A0 signal of an external electrical signal, and other bonding pads are wire-bonded to The corresponding lead wire 66 on the lead frame. Then, wire the bonding terminals C1CAS of the first and second stacking functional circuits Cci, Cc2, (: to a power supply potential to activate the previous and second stacking functional circuits Ccl, Cc2. And wire bonding to the first The above-mentioned selection terminal Cisfe of the stacked functional circuit Cel to a first voltage level, and
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侍上述第—記憶體晶片Cpl於AY12腳位 控制信號,為上述第一雷壓付腳位 ., 币 電歷位準時’執行外部雷 動作’而上述第二記愔栌曰 卜^電 什批剎衿铋^ 。己隐體曰日片Cp2於上述AY12腳 違控制k说’為上流笛—φ ^ . „ Μ + 7迷第一電壓位準時,執行外部 取動作。於本例+ ’上述第—、 上述第一堆疊功能雷攸r 〇 進你,祐π L、電路Cc2之上述選擇端C1SFF至一 為256Mb DDR記恃麫,从0太 丄 您篮日日片 、 G隐體,故此時,由兩個256Mb DDR 疊而成之一 51 2Mb DDR記憶體就形成了,且與第1 包裝之512Mb DDR記憶體C1完全地相容。 打線接合 第二電壓 上之上述 路之存取 位上之上 電路之存 cPl、Cp2 記憶體堆 圖中標準 u上述第一、第二記憶體晶片Cpl、Cp2為256心d⑽ 圮憶體來說明本發明之堆疊式記憶體的動作,請參考第3 圖,當一個外部電路(未示於圖中)執行一個寫入的指令時 ,上述第一、第二記憶體晶片Cpl、Cp2同時會被啟動,即 兩個64MB的區間(i tem)被啟動,並且依據位址解碼器所解 碼出來之列位址信號axO〜axl2及行位址信號ay〇〜ayi2來寫 入資料,若當中解出來之列位址信號ay丨2為一高邏輯位準 時’則將上述^料寫入上述第一記憶體晶片C P 1中,定址 為上述列位址axO〜axl2及行位址ay〇〜ayll之記憶胞中,同 時,上述第二堆疊功能電路Cc2會阻擋上述資料,寫入上 述第二記憶體晶片Cp2中定址為上述列位址ax〇〜axl2及行 位址a y 0〜a y 11之記憶胞。 反過來說,若當中解出來之上述行位址信號ayl2為一 低邏輯位準時,則將上述資料寫入上述第二記憶體晶片 Cp2中,定址為上述列位址axO〜axl2及行位址ayO〜ayll之Serving the above-mentioned memory chip Cpl at the AY12 pin control signal, it is the first lightning pressure payment pin. Brake bismuth ^. The hidden body Japanese film Cp2 said that the above-mentioned AY12 foot violated the control k and said that it is an upstream flute—φ ^. „M + 7 fans perform an external flick when the first voltage level is reached. In this example + 'the above-mentioned, the above-mentioned A stacking function Leiyou r 〇 enter you, you π L, the above-mentioned selection terminal C1SFF of the circuit Cc2 to a 256Mb DDR record, from 0 to 丄 your basket day and day film, G hidden, so at this time, two 512Mb DDR memory is formed by stacking 256Mb DDR, and it is completely compatible with the 512Mb DDR memory C1 in the first package. Wire the circuit on the access bit of the above path on the second voltage. Save the cPl and Cp2 memory stack standard. The above first and second memory chips Cpl and Cp2 are 256 cores. 圮 Memory to explain the operation of the stacked memory of the present invention, please refer to Figure 3, when a When an external circuit (not shown in the figure) executes a write instruction, the first and second memory chips Cpl, Cp2 will be activated at the same time, that is, two 64MB intervals (item) will be activated, and according to the bit The column address signals axO ~ axl2 and row address signals ay decoded by the address decoder ~ Ayi2 to write data, if the column address signal ay 丨 2 solved there is a high logic level on time, then write the above data into the first memory chip CP 1 and address it as the above column address axO ~ Xl2 and the memory cells of row address ay0 ~ ayll, at the same time, the second stack function circuit Cc2 will block the data and write to the second memory chip Cp2 and address it as the column address ax0 ~ axl2 and Memory cells of row addresses ay 0 to ay 11. Conversely, if the above-mentioned row address signal ayl2 is a low logic level, the above data is written into the second memory chip Cp2 and addressed. For the above column addresses axO ~ axl2 and row addresses ayO ~ ayll
567593 五、發明說明(7) " " ' '—" ^、隐胞中,同時,上述第一堆疊功能電路Cc 1會阻擋上述 為料寫入上述第一 s己憶體晶片C p 1中定址為上述列位址 axO〜axl2及行位aayoiyu之記憶胞。 如第2圖中所示,本發明形成堆疊式記憶體丨〇 1,至少 包含一第一記憶體晶片Cpl、一第二記憶體晶片Cp2以及一 第一堆疊功能電路Cel及一第二堆疊功能電路(^2。其中上 述第一及第二記憶體晶片Cpl、。“舉例來說,可為二 256Mb DDR記憶體,且以對相同定義之接合墊(pin七〇 Pin),施以打線接合(b〇nding wire)至一導線架(丨⑽廿 frame)或印刷電路板(Printed circuit board)上,以形 成一個球形閘陣列(Ball Grid Array)包裝或一薄型小尺 寸封裝(Thin Small Outline Package)。 另外,上述第一堆疊功能電路Ccl及第二堆疊功能電 路堆疊功能電路Cc2分別設置於上述第一及第二記憶體晶 片Cpl、CP2中,且個別地具有一選擇端c刪、c·,上述 第一堆疊功能電路之選擇端C1SFE連接至一高位準電壓,且 上述第二堆疊功能電路之選擇端(;2咖連接至一低位準 壓〇 其中,上述第一堆疊功能電路Ccl及第二堆疊功能電 路堆疊功能電路Cc2,用以於一控制信號為高位準時,使 上述第一記憶體晶片C p 1執行存取動作;而於上述控制信 號為低位準時,使上述第二記憶體晶片Cp2執行存取動作 。舉例來說,上述控制信號係為一外部位址解碼器所解碼 出來之行位址 吕號ayO〜ayl2中之一者,例如ayi2,若上^567593 V. Description of the invention (7) " " ''-" ^ In the hidden cell, at the same time, the first stacked functional circuit Cc 1 will prevent the material from being written into the first s memory chip C p The address in 1 is the memory cell of the above-mentioned column address axO ~ axl2 and row position aayoiyu. As shown in FIG. 2, the present invention forms a stacked memory, which at least includes a first memory chip Cpl, a second memory chip Cp2, a first stacking function circuit Cel, and a second stacking function. Circuit (^ 2. Among them, the first and second memory chips Cpl, ". For example, it can be two 256Mb DDR memory, and the same definition of the bonding pad (pin 70pin), wire bonding (B〇nding wire) onto a lead frame or printed circuit board to form a Ball Grid Array package or a Thin Small Outline Package In addition, the above-mentioned first stacking function circuit Ccl and the second stacking function circuit stacking function circuit Cc2 are respectively disposed in the above-mentioned first and second memory chips Cpl and CP2, and each has a selection terminal c. The selection terminal C1SFE of the first stacking function circuit is connected to a high level voltage, and the selection terminal (2) of the second stacking function circuit is connected to a low level voltage. Among them, the first stacking function circuit is Ccl and second stacking function circuit Cc2 are used to enable the first memory chip C p 1 to perform an access operation when a control signal is at a high level; and when the control signal is at a low level, to make the second The memory chip Cp2 performs an access operation. For example, the above control signal is one of the row address LyO ~ ayl2 decoded by an external address decoder, such as ayi2, if above ^
567593 五、發明說明(8) 列位址信號ay 1 2為一高邏輯位準時,則將外部輸入之資 ,寫入上述第一記憶體晶片CP1中,定址為上述列位址 axO〜axl2及行位址ayO〜ayll之記憶胞中,同時,上述二 堆疊功能電路Cc2會阻擋上述外部輸入之資料,寫入上一 第二記憶體晶片CP2中,定址為上述列位址ax〇〜axi2及行 位址ayO〜ayll之記憶胞。反過來說,若上述列位址信諕 ayl2為一低邏輯位準時,則將外部輸入之資料, b 第二記憶體晶片CP2中,定址為上述列位址ax〇〜a^i2及行L 位址ayO〜ayll之記憶胞中,同時,卜 ^ ^ t ⑵會阻擔上述外部輸入之資料夸寫上入述上第μ堆叠功能電路 片Cpl中’定址為上述列位—axl2及行位隐體; 讀取動作時’亦是與寫入動作相同原理y,故 透明之記憶體之封裝方法,可以將兩個 曰曰片’封裝成-個雙倍容量之堆疊式記憶體晶[盥 雙倍容量之標準包裝記憶體晶片完全相容,不論 ^ 是外部電路的信號都相容,因而減少 ^ 異,並因而提高產能。 又&刿ΛI私之差 =本發明已以較佳實施例揭露如上,声 和範圍内,當可作些許之以潤:不:離本發明之精神 範圍當視後附之中請專利範圍所界定者為f本發明之保護 第11頁 0548-7420TWf(N) ; 90106 ; dennis.ptd 567593 圖式簡單說明 第1圖為標準包裝之5 12Mb記憶體顆粒與一傳統堆疊式 包裝5 1 2Mb記憶體顆粒之示意圖。 第2圖為本發明之堆疊式記憶體的示意圖。 第3圖為本發明之堆疊式記憶體之另一示意圖。 [符號說明] C卜標準包裝之512Mb記憶體顆粒; C2〜傳統堆疊式包裝5 12Mb記憶體顆粒; 1 0 1〜本發明之堆疊式記憶體;567593 V. Description of the invention (8) When the column address signal ay 1 2 is at a high logic level, the external input data is written into the above-mentioned first memory chip CP1, and the address is the above-mentioned column addresses axO ~ axl2 and In the memory cells of row addresses ayO ~ ayll, at the same time, the two stacked functional circuits Cc2 will block the externally inputted data and write it into the previous second memory chip CP2, addressing the column addresses ax0 ~ axi2 and Memory cells of row addresses ayO ~ ayll. Conversely, if the above-mentioned column address signal 諕 ayl2 is at a low logic level, the externally input data will be b. In the second memory chip CP2, the above-mentioned column address ax0 ~ a ^ i2 and row L will be addressed. In the memory cells of the addresses ayO ~ ayll, at the same time, ^ ^ t 阻 will hinder the above-mentioned external input data. In the above description, the μ stacking function circuit chip Cpl is addressed as the above-mentioned column position-axl2 and row position. Hidden body: The same principle is used during the reading operation as the writing operation. Therefore, the transparent memory packaging method can package two chips into a double-capacity stacked memory crystal. The double-capacity standard packaged memory chip is fully compatible, which is compatible with signals from external circuits, thereby reducing differences and increasing productivity. And & 刿 ΛI Private difference = The present invention has been disclosed in the preferred embodiment as above. Within the scope of the sound, when it can be done slightly: No: from the spirit of the present invention, please attach the scope of patents as attached. What is defined is the protection of the present invention. Page 11 0548-7420TWf (N); 90106; dennis.ptd 567593 The diagram is briefly explained. The first diagram is a standard package of 5 12Mb memory particles and a traditional stacked package 5 1 2Mb. Schematic diagram of memory particles. FIG. 2 is a schematic diagram of a stacked memory according to the present invention. FIG. 3 is another schematic diagram of the stacked memory of the present invention. [Symbol description] C. Standard packaging of 512Mb memory particles; C2 ~ traditional stacked packaging 5 12Mb memory particles; 1 0 1 ~ stacked memory of the present invention;
Cpl〜第一記憶體晶片; 馨Cpl ~ first memory chip; Xin
Cp2〜第二記憶體晶片;Cp2 ~ second memory chip;
Cel〜第一堆疊功能電路;Cel ~ first stacking function circuit;
Cc2〜第二堆疊功能電路;Cc2 ~ second stack function circuit;
ClCAS、C2CAS〜啟動端’ClCAS, C2CAS ~ Initiator ’
CiSFE、CgsPE〜選擇端’ 1-66〜引線; 110-120〜導線; a X 0 - a X1 2〜列位址信號; a y 0 - a y 1 2〜行位址信號; π〜基材。CiSFE, CgsPE ~ selection terminal '1-66 ~ lead; 110-120 ~ lead wire; a X 0-a X1 2 ~ column address signal; a y 0-a y 1 2 ~ row address signal; π ~ substrate.
0548-7420TWf(N) ; 90106 ; dennis.ptd 第12頁0548-7420TWf (N); 90106; dennis.ptd page 12
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