TW554421B - A front open unified pod door opener with a dust-proof means - Google Patents
A front open unified pod door opener with a dust-proof means Download PDFInfo
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且特別是有關 防塵裝置之前 本發明是有關於一種半導體製程設備, 於一種設置於處理1 2吋晶圓之機台中的具有 開式晶圓盒門開裝置。 隨著積體電路之半導體元件的積集度曰益增加,相對 的製程的準確度就顯得格外重要。因為一旦在製程中發生 些微的錯誤(Error)或污染,即可能就會造成製程的失 敗’導致晶圓的毁損或報廢,因而耗費大量成本。In particular, before the dust-proof device, the present invention relates to a semiconductor process equipment, which is provided in a machine for processing a 12-inch wafer and has an open-type wafer box door opening device. As the integration of semiconductor components in integrated circuits increases, the accuracy of the relative process becomes particularly important. Because once a slight error or contamination occurs in the process, it may cause the process to fail ', which will cause the wafer to be damaged or scrapped, which will cost a lot of cost.
一般之半導體製程中,半導體製程之機台係由數個模 、、且(製私/傳輸/儲存/安全連鎖/反應氣體)所組成,並藉由 日日圓傳輸系統(Wafer Transfer System),使晶圓在製程 模組與儲存模組間傳輸。而晶圓的傳輸係利用機器手 <臂王 (Robot Blade),將晶圓從晶圓載具中取出,傳送至製程 反應室内進行製程反應,並於製程結束後將晶圓傳回,再 送回晶圓載具中,以進行一系列之製程步驟。 傳統8吋晶圓係使用一種稱做標準機械界面(StandadIn the general semiconductor manufacturing process, the equipment of the semiconductor manufacturing process is composed of several molds, and (private manufacturing / transmission / storage / safety chain / reactive gas), and through the Japanese yen transfer system (Wafer Transfer System), The wafer is transferred between the process module and the storage module. The wafer transfer system uses a robot arm, Robot Blade, to remove the wafer from the wafer carrier and transfer it to the process reaction chamber for process reactions. After the process is completed, the wafer is returned and sent back. In a wafer carrier, a series of process steps are performed. Traditional 8-inch wafers use a standard mechanical interface (Standad
Mechanical Inter-Face,SMIF)之晶圓載具。然而,隨著 半導體製造技術之進步,晶圓尺寸已增至12忖,其使用之 晶圓載具與8吋晶圓之晶圓載具不同,稱為前開式晶圓盒 (Front Opening Unified Pod,F0UP),以適合較大之晶Mechanical Inter-Face (SMIF) wafer carrier. However, with the advancement of semiconductor manufacturing technology, the wafer size has increased to 12mm. The wafer carrier used is different from the 8-inch wafer carrier. It is called the Front Opening Unified Pod (F0UP). ) To fit larger crystals
圓。此種前開式晶圓盒(F0UP)係將晶圓固定保持於密閉@空 間甲’以防禦大氣中之微塵污染晶圓。然而,雖然前開$ 晶圓盒(F0UP)内部之潔淨度較高,但是在將晶圓載入製程 ,備之過程中,前開式晶圓盒(F〇up)之開啟盒蓋與關閉盒 蓋的動作都需要灌入大量的氮氣以減少前開式晶圓盒内之circle. This type of front-opening wafer cassette (F0UP) is to keep the wafer fixed in a closed @ 空间 甲 ’to prevent the dust from contaminating the wafer in the atmosphere. However, although the internal cleanness of the front-opened wafer box (F0UP) is relatively high, the opening and closing of the lid of the front-opening wafer box (F〇up) is in the process of loading the wafer into the process of preparation. All actions need to be filled with a large amount of nitrogen to reduce the
^54421 五 、發明說明(2) 閉盒蓋二^ : : f f J $氧的環境。而且,開啟盒蓋與關 而污染晶圓。此Ϊ今擾動外圍環境及晶圓背面之微塵進 門、外門所構成之丄以反應爐管為例,該機台具有由内 Opener,FD()),雜則開式晶圓盒門開裝置(FOUP Door 機台的影響。 由内外門的開啟控制,亦能減低微塵對 第1圖所繪示為習 示意圖。請參照1 S知之處理1 2吋晶圓的反應爐管上視 m、氮氣加載互口戶:示,反應爐管1〇〇包括反應室 開式晶圓盒門開穿署°;n(^ad-Lock)104、機械手臂106與前 低氧環境。前開^ ΐ 其中,氮氣加載互鎖區104係為 裝置108上。前曰圓盒110係固定於前開式晶圓盒門開 100,作為晶圓;盒門開裝置1〇8則為開啟反應爐管 置108包括内門108二入口之用。前開式晶圓盒門開裝 l〇8a設置於靠近前門\外曰門1〇8b、氮氣嘴頭1〇8c。内門 於靠近氮氣加載互^ 圓那盒,這^,外門1〇8b設置 内門l〇8a與外門l08b,p 4那一侧。氮氣噴頭1〇8c設置於 M m+曰n ^之間。而且,為了保持前開式晶圓盒 、,、别。開式B曰圓盒門開裝置1〇8之間具有良好之密封,而 以钳夾—器11 2將則開式晶圓盒i i G與前開式晶圓盒門開裝置 1 0 8固定在一起。 f進行將前開式晶圓盒11 〇内之晶圓載入反應室丨02 時’巧啟前開式晶圓盒門開裝置1〇8之内門i〇8a,接著 利用氮亂喷頭1 08c噴吹氮氣至前開式晶圓盒丨丨〇内部數分 1里’以降低刖開式晶圓盒11 0内部之氧濃度。然:後,再開 554421 五、發明說明(3)^ 54421 V. Description of the invention (2) Closed box cover II ^:: f f J $ oxygen environment. Moreover, opening the lid and contaminating the wafer. This example disturbs the surrounding environment and the dust entrance door on the back of the wafer and the outer door. Take the reaction furnace tube as an example. The machine has an internal Opener, FD ()), and a miscellaneous open wafer box door opening device. (The influence of the FOUP Door machine. The opening and control of the inner and outer doors can also reduce the dust on the schematic diagram shown in Figure 1. Please refer to the reactor tube for 12-inch wafers, see m, nitrogen, as shown in Figure 1. Loading mutual account: It is shown that the reaction furnace tube 100 includes the opening of the reaction chamber wafer box door; n (^ ad-Lock) 104, the robot arm 106 and the front hypoxic environment. Front opening ^ ΐ Among them, The nitrogen loading interlocking area 104 is on the device 108. The round box 110 was fixed to the front-opening wafer box door 100 and opened as a wafer. The box door opening device 108 was used to open the reactor tube 108 including the inside. The door 108 is used for the entrance. The front-opening wafer box door opening 108a is set close to the front door \ outside door 108b, and the nitrogen nozzle 108c. The inner door is close to the nitrogen loading box, which ^, The outer door 108b is provided with the inner door 108a and the outer door 108b, p 4. The nitrogen spray head 108 is located between M m + n n. Also, in order to Hold the front open type wafer box ,,,, etc. The open type B means that the round box door opening device 10 has a good seal, and the clamp-tool 11 2 will open the open type wafer box ii G and the front open type. The wafer box door opening device 108 is fixed together. F. Load the wafer in the front-opening wafer box 110 into the reaction chamber. At 02 o'clock, open the front opening-type wafer box door opening device 108. Gate i〇8a, and then use a nitrogen chaos nozzle 108c to inject nitrogen to the front open-type wafer cassette 丨 丨 〇 internal 1 minute to reduce the oxygen concentration inside the open-type wafer cassette 110. Then: Reopening 554421 V. Description of Invention (3)
啟前開式晶圓盒門開裝置丨〇8之外門108b,並以機械手臂 1 0 6伸入前開式晶圓盒11 〇内以拿取晶圓傳回反應爐管 1 00,並將晶圓放置於晶舟上。當前開式晶圓盒内所有的 晶圓都移至晶舟後,前開式晶圓盒門開裝置丨〇8之内門 10 8a與外門l〇8b會關閉。之後,再重複同樣的動作將另一 個前開式晶圓盒内的晶圓移至晶舟,直到晶舟被填滿後 (一般是1 2 0片晶圓),才將晶舟傳送至反應室丨〇 2進行反 應。同樣的’在將晶圓載入前開式晶圓盒1 1 〇内時,先將 晶舟從反應室1 〇 2中送出,然後打開前開式晶圓盒門開裝 置108之内門i〇8a,並利用氮氣噴頭108(:喷吹氮氣至前開 式晶圓盒11 0内部數分鐘。接著,打開外門丨08b ,並以機 $手臂1 0 6拿取晶舟上之晶圓後,將晶圓送入前開式晶圓 盒11 〇内。當前開式晶圓盒11 〇被填滿後,前開式晶圓盒門 開裝置108之内門l〇8a與外門108b會關閉。之後,再重&複 同樣的動作將晶舟内剩餘的晶圓移至另一個前開式晶圓盒 内’直到移完晶舟内所有的晶圓。 |Open the front-opening wafer box door opening device. 08 The outer door 108b, and extend the front-opening wafer box 110 with a robotic arm 106 to take the wafer back to the reaction furnace tube 100, and The circle is placed on the wafer boat. After all the wafers in the open wafer box are moved to the wafer boat, the inner door 108a and the outer door 108b of the front open wafer box door opening device 08 will be closed. After that, repeat the same operation to move the wafers in another front-opening wafer cassette to the wafer boat, and then transfer the wafer boat to the reaction chamber until the wafer boat is filled (usually 120 wafers). The reaction was performed. Similarly, when loading a wafer into the front-opening wafer cassette 110, the wafer boat is first sent out from the reaction chamber 102, and then the inner door i0a of the front-opening wafer cassette opening device 108 is opened. And use the nitrogen nozzle 108 (: blowing nitrogen to the inside of the front open wafer box 110 for several minutes. Then, open the outer door 08b, and take the wafer on the wafer boat with the arm $ 106, then Wafers are fed into the front open wafer cassette 110. After the current open wafer cassette 110 is filled, the inner and outer doors 108a and 108b of the front open wafer cassette door opening device 108 will be closed. After that, Repeat the same operation and move the remaining wafers in the wafer boat to another front-opening wafer box 'until all the wafers in the wafer boat have been moved. |
^ 在上述步驟中,由於氮氣加載互鎖區1 0 4係為低氧環 土兄A因此在開啟反應爐管j θ 〇時,必須利用氮氣喷頭1 〇 喷吹氮氣至前開式晶圓盒丨丨θ内部,以降低前開式晶圓盒 110内,部之氧濃度,否則前開式晶圓盒11 0内部之空氣也合 ,入氮氣加載互鎖區1 04。因此,為了充分的降低前開式曰 =圓益110内部之氧濃度,通常需要氮氣喷頭1〇8c喷吹氮 氣至則開式晶圓盒11 〇内部數分鐘,不但浪費時間還會 費氮氣。 τ展^ In the above steps, since the nitrogen-loaded interlocking zone 104 is a low-oxygen ring soil brother A, when the reactor tube j θ 〇 is turned on, the nitrogen nozzle 10 must be used to blow nitrogen to the front-opening wafer cassette.丨 丨 θ inside, in order to reduce the oxygen concentration in the front-opening wafer cassette 110, otherwise the air inside the front-opening wafer cassette 110 is also closed, and nitrogen is loaded into the interlocking zone 104. Therefore, in order to sufficiently reduce the oxygen concentration in the front-open type = Yuanyi 110, the nitrogen nozzle 108c is usually required to blow nitrogen to the interior of the open-type wafer cassette 11 minutes, which not only wastes time but also consumes nitrogen. τ exhibition
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而 曰 , ,nQ ^ 由於開啟前開式晶圓盒門開裝置1 08之内門 内部,同睹用鼠乳喷頭1〇8C喷吹氮氣至前開式晶圓盒110 日、也會揚起前開式晶圓盒11 0内部及晶圓背面之 if…此當外門i〇8b打開時,微塵就會進入氮氣加載互 品处而#污染氮氣加載互鎖區104,並且當微塵落下時, · 也可月b會落在晶圓表面,而對晶圓造成影響。 ^此外,為了防止外界之空氣及微塵在反應爐管之前開 ^日日圓凰門開裝置1 0 8開啟時進入反應爐管中,就必須使 刖2式晶圓盒110與前開式晶圓盒門開裝置1〇8之間具有良 好密封,因此必須使用鉗夾器112固定前開式晶圓盒n〇與鲁 前開式晶圓盒門開裝置108。 因此,本發明之一目的為提供一種具有防塵裝置之前 開式晶圓盒門開裝置,可以防止微塵與空氣進入氮氣加載 互鎖區,亦可避免氮氣漏出氮氣加載互鎖區。 本發明之另一目的為提供一種具有防塵裝置之前開式 晶圓盒門開裝置’即使前開式晶圓盒門開裝置與前開式晶 圓盒之間密封不良也不會影響到氮氣加載互鎖區,不需要 鉗夾器固定前開式晶圓盒。 本發明之再一目的為提供一種具有防塵裝置之前開式 -晶圓盒門開裝置,可以直接將晶圓從前開式晶圓盒傳送i Φ 晶舟,以及使晶圓直接回到前開式晶圓盒内,而可以節省 時間並提高產能° 本發明之又一目的為提供一種具有防塵裝置之前開式 晶圓盒門開裝置’可以節省氮氣用量並降低成本。 工On the other hand, because the inside of the door of the front-opening wafer box door opening device 108 is opened, the same time, using the rat milk nozzle 108C to blow nitrogen to the front-opening wafer box 110 days, the front-opening wafer box will also be raised. If the inside of the wafer cassette 110 and the back of the wafer ... When the outer door i08b is opened, the dust will enter the nitrogen-loaded interproduct and the #contaminate the nitrogen-loaded interlocking area 104, and when the dust falls, · It may also fall on the wafer surface and affect the wafer. ^ In addition, in order to prevent outside air and fine dust from opening before the reactor tube ^ Yen Phoenix door opening device 108 enters the reactor tube when it is turned on, it is necessary to make the type 2 wafer box 110 and the front open type wafer box The door opening device 108 has a good seal between the front opening wafer box no. 0 and the Lu front opening wafer box door opening device 108. Therefore, an object of the present invention is to provide a front-opening wafer box door opening device with a dust-proof device, which can prevent dust and air from entering the nitrogen-loaded interlocking area, and also can prevent nitrogen from leaking out of the nitrogen-loading interlocking area. Another object of the present invention is to provide a front-opening type wafer box door opening device having a dust-proof device. Even if a poor seal between the front-opening type wafer box door opening device and the front-opening type wafer box does not affect the nitrogen loading interlock Area, no clamps are needed to secure the front-opening cassette. Another object of the present invention is to provide a front-opening-wafer box door opening device with a dust-proof device, which can directly transfer wafers from the front-opening wafer box to the i Φ wafer boat, and directly return the wafers to the front-opening wafer. It can save time and increase productivity in a round box. Another object of the present invention is to provide a front-opening wafer box door opening device with a dust-proof device, which can save the amount of nitrogen and reduce the cost. work
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554421 五、發明說明(5) 本發明提供一種具有防塵裝置 置,此裝置設置於處理12吋晶圓之 可開啟機台並可在從前開式晶圓盒 防止微塵進入機台中。此前開式晶 内門、外門所構成。防塵裝置則設 裝置靠近反應爐管之氮氣加載互鎖 具備有用於抽取氣體之抽氣裝置、 並用於過濾氣體中之微塵的過濾裝 氣口’可吹出層流狀態之氣體的出 裝置之進氣口,使從出氣構件吹出 之進氣構件。其中,出氣構件與進 兩者之間具有一空間,此空間為晶 通道’且出氣構件與進氣構件所形 係與晶圓表面平行,可以吹拂晶圓 本發明另外提供一種防塵裝置 圓之機台如反應爐管之前開式晶圓 裝置具備有用於抽取氣體之抽氣裝 氣口並用於過滤氣體中之微塵的過 之出氣口,可吹出層流狀態之氣體 抽氣裝置之進氣口,使從出氣構件 裝置之進氣構件。其中,出氣構件 置,且兩者之間具有一空間,空間 通道’且出氣構件與進氣構件所形 係與晶圓表面平行,而可以吹拂晶 之前開式晶圓盒門開裝 機台(如反應爐管)中, 中拿取、放入一晶圓時 圓盒門開裝置一般是由 置於前開式晶圓盒門開 區的一側。此防塵裝置 連接抽氣裝置之出氣口 置、連接過濾裝置之出 氣構件、以及連接抽氣 之氣體可回到抽氣裝置 氣構件係相對設置,且 圓進出前開式晶圓盒之 成氣幕的氣體流動方向 之上表面與下表面。 ,設置於一處理12吋晶 盒門開裝置中,此防塵 置、連接抽氣裝置之出 濾裝置、連接過濾裝置 的出氣構件、以及連接 吹出之氣體可回到抽氣 與進氣構件係相對設 為晶圓進出反應爐管之 成氣幕的氣體流動方向 圓之上表面與下表面。554421 V. Description of the invention (5) The present invention provides a dust-proof device. The device is installed on a 12-inch wafer openable machine and can prevent the dust from entering the machine in the previously opened wafer cassette. Previously opened crystals consist of inner and outer doors. The dust-proof device is provided with a nitrogen-loaded interlock near the reactor tube. The air-inlet is provided with an air-exhaust device for extracting gas and a filter air inlet for filtering fine dust in the gas. , So that the air intake member blown from the air exhaust member. Among them, there is a space between the gas outlet member and the inlet. This space is a crystal channel. The shape of the gas outlet member and the air inlet member is parallel to the surface of the wafer, and the wafer can be blown. The open-type wafer device before the reactor tube is provided with an exhaust gas inlet for extracting gas and an air outlet for filtering the fine dust in the gas, which can blow out the air inlet of the gas exhaust device in a laminar flow state, so that The air inlet member from the air outlet member device. Wherein, the air outlet member is provided, and there is a space between the two, the space passage is' and the shape of the air outlet member and the air inlet member is parallel to the wafer surface, and the wafer box door opening and mounting machine (such as In the reactor tube), the round box door opening device is generally placed on one side of the front-opening wafer box door opening area when a wafer is taken in and placed in. This dust-proof device is connected to the air outlet of the air extraction device, the air outlet member connected to the filter device, and the air component connected to the air extraction device can be returned to the air outlet of the air extraction device. The upper and lower surfaces of the gas flow direction. It is installed in a 12-inch crystal box door opening device. This dustproof installation, the filter device connected to the air extraction device, the air outlet member connected to the filter device, and the blown gas can be returned to the air extraction and opposed to the air intake member system. The upper and lower surfaces of the gas flow direction of the gas curtain formed by the wafer entering and exiting the reaction furnace tube are set.
第10頁 554421 五、發明說明(6) 本發明於處理1 2吋晶圓之機台(如反應爐管)的前開式 晶圓盒門開裝置上加裝防塵裝置,此防塵裝置可吹喷氮氣 形成氣幕(Curtaiη),且此氣幕之流動方向係與晶圓表面 平行。由於晶圓要進出前開式晶圓盒時都要通過防塵裝置 之氣幕,因此晶圓表面上之微塵可被防塵裝置移除過濾, 而可以防止微塵與空氣進入氮氣加載互鎖區。Page 10 554421 V. Description of the invention (6) The present invention is equipped with a dust-proof device on the front-opening wafer box door opening device of a machine (such as a reaction furnace tube) for processing 12-inch wafers. The nitrogen forms an air curtain (Curtaiη), and the flow direction of the air curtain is parallel to the wafer surface. Since wafers must pass through the air curtain of the dustproof device when entering and exiting the front-opening wafer cassette, the dust on the wafer surface can be removed and filtered by the dustproof device, which can prevent the dust and air from entering the nitrogen-loaded interlocking area.
而且,由於晶圓要進出前開式晶圓盒時都要通過防塵 t置’因此即使前開式晶圓盒門開裝置與前開式晶圓盒之 間密封不良也不會影響到氮氣加載互鎖區(低氧環境),以 鉗夾裝置固定前開式晶圓盒便並非必要。 此外,本發明在處理12吋晶圓之機台(如反應爐管合 前開式晶圓盒門開裝置上加裝防塵裝置,當晶圓要進S二 開式晶圓盒時都要通過防塵裝置,使晶圓可以直接々义月 式日日圓益傳送至晶舟,或使晶圓直接回到前開式曰 則择 因此可以不需要以氮氣喷吹前開式晶圓盒,或^,盒5 短以氮氣喷吹前開式晶圓盒之時間,而可以節可以與 加產能與氮氣之用量。 時間、力In addition, since wafers must be dust-proofed when entering and exiting the front-opening wafer cassette, even if the seal between the front-opening wafer-box door opening device and the front-opening wafer cassette is poor, the nitrogen-loaded interlocking zone will not be affected. (Hypoxic environment), it is not necessary to fix the front-opening cassette with the clamping device. In addition, the present invention is equipped with a dust-proof device on the machine for processing 12-inch wafers (such as the reactor door opening device before the furnace tube is closed). The device allows the wafer to be directly transferred to the wafer boat in the form of a moon-yen-yen-yin, or returns the wafer directly to the front-open type. Therefore, it is not necessary to blow the front-open type wafer box with nitrogen, or ^, box 5 Short the time for blowing the front open wafer box with nitrogen, which can save the capacity and the amount of nitrogen used.
為讓本發明之上述和其他目的、特徵、和優點& 顯易懂,下文特舉一較佳實施例,並配合所附★也更明 細說明如下: 巧’作詳 圖式之標記說明: 100、200 :反應爐管 102、202 :反應室 104、204 :氮氣加載互鎖區In order to make the above and other objects, features, and advantages of the present invention easier to understand, a preferred embodiment is exemplified below, and it will be explained in more detail in conjunction with the attached ★. 100, 200: reactor tube 102, 202: reaction chamber 104, 204: nitrogen-loaded interlock zone
554421 五、發明說明(7) I 0 6、2 0 6 ·•機械手臂 108、208 :前開式晶圓盒門開裝置 108a、212 :内門 108b、214 :外門 108c :氮氣喷頭 II 0、21 0 :前開式晶圓盒 11 2 :鉗夾器 216、300 :防塵裝置 302 :抽氣裝置 304 :過濾裝置 306 :出氣構件 308 :吸氣構件 310、312、314 :管路 4 0 0 ·晶圓 402、404、406、408、410、412 :箭號 實施例 第2圖所繪示為設置本發明較佳實施例之具有防塵裝 置之刚開式晶圓盒門開裝置的反應爐管上視圖。請參照第 2圖所示,反應爐管200包括反應室202、氮氣加載互鎖區 2 0 4、機械手臂2 0 6與前開式晶圓盒門開裝置2 〇 8。其中, 前開式晶圓盒210係設置於前開式晶圓盒門開裝置2〇8上。 此刖開式晶圓盒門開裝置2 〇 8包括内門2 1 2、外門2 1 4及防 塵裝置216。其中’内門212設置於靠近前開式晶圓盒21〇554421 V. Description of the invention (7) I 0 6, 2 0 6 • Robotic arms 108, 208: front-opening wafer box door opening devices 108a, 212: inner door 108b, 214: outer door 108c: nitrogen nozzle II 0 , 2 1 0: Front-opening wafer cassette 11 2: Clamps 216, 300: Dustproof device 302: Extraction device 304: Filter device 306: Air outlet member 308: Air inlet member 310, 312, 314: Pipe 4 0 0 Wafers 402, 404, 406, 408, 410, and 412: The second embodiment of the arrow shows the reaction furnace provided with a dust-proof device for a newly opened wafer box door opening device, which is a preferred embodiment of the present invention. Tube top view. Referring to FIG. 2, the reaction furnace tube 200 includes a reaction chamber 202, a nitrogen-loaded interlocking zone 204, a robot arm 206, and a front-opening wafer box door opening device 2008. The front-opening wafer cassette 210 is disposed on the front-opening wafer cassette door opening device 208. The open-type wafer box door opening device 2008 includes an inner door 2 1 2, an outer door 2 1 4, and a dust prevention device 216. Among them, the 'inner door 212 is disposed near the front-opening wafer cassette 21 〇
第12頁 554421 五、發明說明(8) 這一側,外門2 1 4設置於内門21 2與防塵裝置2 1 6之間。防 塵裝置2 1 6則設置於靠近氮氣加載互鎖區2 〇 4之那一側 第3A圖與第3B圖所繪示為本發明之防塵裝置之不同視 角的結構示意圖。其中,第3B圖係為第3A圖轉90度角之示 意圖。 睛參照第3 A圖與第3 B圖所示,不赞明之防塵裝置0 υ υ 包括抽氣裝置302、過濾裝置304、出氣構件306、吸氣構 件3 08、管路310、管路312、管路314所構成。其中,管路 310連接抽氣裝置302之出氣口與過濾裝置3〇4之進氣口。 管路312連接過濾裝置3〇4之出氣口與出氣構件3〇6。管路 314連接吸氣構件31〇與抽氣裝置3〇2之進氣口。 氣裝置3〇2例如是鼓風機,用於抽取氣體。過濾裝 濾氣體中之微粒。出氣構件306與吸氣構件 管,使Γ 置r,且出氣構件306中例如是設置有許多小Page 12 554421 V. Description of the invention (8) On this side, the outer door 2 1 4 is arranged between the inner door 21 2 and the dustproof device 2 1 6. The dust-proof device 2 1 6 is arranged on the side near the nitrogen-loaded interlocking area 204. Figures 3A and 3B are schematic diagrams of the structure of the dust-proof device of the present invention at different viewing angles. Among them, Fig. 3B is a schematic view of Fig. 3A turning 90 degrees. Referring to Figures 3A and 3B, the unexplained dust-proof device 0 υ υ includes an air extraction device 302, a filtering device 304, an air outlet member 306, an air inlet member 308, a pipeline 310, a pipeline 312, The pipeline 314 is formed. Among them, the pipeline 310 connects the air outlet of the air extraction device 302 and the air inlet of the filter device 304. The pipeline 312 is connected to the air outlet of the filter device 304 and the air outlet member 306. The pipeline 314 connects the suction member 31 and the air inlet of the suction device 302. The gas device 302 is, for example, a blower for extracting gas. Filters the particles in the gas. The air outlet member 306 and the air suction member tube have Γ set to r, and for example, a large number of small holes are provided in the air outlet member 306.
Flow) /1構件306吹出之氣體為層流(Laminar qh 狀4 ’然後由吸氣構件3〇8吸入。於是,a屮翕槿# 3〇6與吸氣構件夕次八於疋,在出軋構件 3〇6與吸氣間的軋、",L會形成氣幕,而且出氣構件 盒之通道件3G8之間的空1^,係為晶圓進出前開式晶圓Flow) / 1 The gas blown out by the member 306 is laminar (Laminar qh-like 4 'and then sucked by the suction member 308. Therefore, a 屮 翕 hibi # 3〇6 and the suction member are eight times later, in the exit The rolling between the rolling member 306 and the suction, ", L will form an air curtain, and the space 1 ^ between the channel members 3G8 of the gas outlet member box is a wafer open-front wafer
抽氣裝置3 〇 8抽取^塵裝置的動作原理,首先启 管路310到達過 ^罢(氣氣)並加壓氣體,然後氣體經 氣體中之微塵或;他』〇:合:二體通過過濾裝置3〇4^^ J運出虱構件306,氣體通iExtraction device 3 08 The working principle of the dust extraction device. First, open the pipeline 310 to reach the gas (gas) and pressurize the gas, and then the gas passes through the fine dust in the gas or; The filtering device 3〇4 ^^ J transported the lice member 306, and the gas passage i
554421554421
置於出氣構件3 Ο 6内之小管就合燃 構件308方向移動而形成氣幕,流狀態,並往吸氣 302吸引,而從吸氣構件308通 、、、由抽軋裝置 中。如此,氣體可以在防塵裝;二路中3 =到抽氣裝置3。2 之矜塵可利用過、、廣哭飧队 U I # Μ ’而且氣體中 之U麈了利用過濾器濾&,而使從 有一定的潔淨度。 傅仟人出之乳體具 第4圖所繪示為晶圓通過防塵裝置及 圖。在第4圖t,構件與第3Α圖與第3β圖相= ^ !f02 ^ ^ ^4〇4 ^ ^ ΐ ^410#. ?二二上' 向。箭號40 8為補充氣體(氮氣 )’前號412則4曰晶圓400之移動方向。 如第4圖所示,|^氣經過抽氣裝置3〇2加壓後,通過過 濾裝置3G4,然後到達出氣構件3G6,氣體通過設置於出氣 構件306内之小管就會變成層流狀態,並往吸氣構件3〇8方 向移動而形成氣幕,之後氣體再經由吸氣構件3〇8回到抽 氣裝置302。當晶圓400通過出氣構件3〇6斑吸氣構件之 間的空間時,由於晶圓400之表面係與氮氣流動方向(箭號 410)平行’因此晶圓4〇〇之上表面與下表面都可受到氮氣 吹拂,而可移除附著於晶圓4〇〇表面之微塵或雜質。 、 接著請參照第2圖,說明裝上具備有本發明之防塵敦 置的反應爐管之前開式晶圓盒門開裝置的操作原理。其 中’防塵裝置216在反應爐管200中是一直運作,可以不声 的過濾反應爐管2 0 0中之微塵。 T 在將前開式晶圓盒2 1 0内之晶圓載入反應室2 〇 2時,打The small tube placed in the exhaust member 3 06 moves in the direction of the combusting member 308 to form an air curtain, a flow state, and is attracted to the suction member 302, and passes from the suction member 308 to the drawing device. In this way, the gas can be installed in a dust-proof manner; in the second way, 3 = to the air extraction device 3.2. The dust in the gas can be used, and the wide crying team UI # Μ ', and the gas in the gas is filtered using a filter &, So that there is a certain degree of cleanliness. Fu Liren's breast body Figure 4 shows the wafer passing through the dustproof device and the diagram. In Figure 4, t, the components and Figures 3A and 3β are equal to ^! F02 ^ ^ ^ 4〇4 ^ ^ 410 410 #. Arrow 40 8 is the supplementary gas (nitrogen). The former number 412 is the moving direction of wafer 400. As shown in Figure 4, after the gas is pressurized by the air extraction device 3202, it passes through the filter device 3G4 and then reaches the air outlet member 3G6. The gas passes through a small tube provided in the air outlet member 306 and becomes laminar flow. The air curtain is formed by moving in the direction of the suction member 308, and then the gas returns to the suction device 302 through the suction member 308. When the wafer 400 passes through the space between the gas-extracting member and the gas-absorbing member, the surface of the wafer 400 is parallel to the direction of nitrogen flow (arrow 410), so the upper and lower surfaces of the wafer 400 Both can be blown by nitrogen, and the dust or impurities attached to the 400 surface of the wafer can be removed. Next, with reference to FIG. 2, the operation principle of the open-type wafer box door opening device provided with the reaction furnace tube equipped with the dust-proof mounting of the present invention will be described. Among them, the dustproof device 216 is always operated in the reaction furnace tube 200, and can silently filter the fine dust in the reaction furnace tube 200. T When loading the wafers in the front-opening cassette 2 10 into the reaction chamber 202,
554421 、發明說明(10) 1前開式晶圓盒門開裝置108之内門214與外門216後,以 機械手臂206伸入前開式晶圓盒210中拿取晶圓。然後,當 為械手|2〇6旱取晶圓並返回氮氣加載互鎖區204時,晶圓 會通過防塵裝置216。由於防塵裝置216之氣流係與晶圓表 面平行,因此晶圓上表面與晶圓下表面皆可受到氮氣吹 拂由於當晶圓通過防塵裝置2 1 6時,晶圓上之微塵可被 防塵裝置21 6吹除並過濾之,因此微塵不會進入氮氣加載 互鎖區204。而且,因為防塵裝置216在反應室2〇〇中是一 直運作,所以當前開式晶圓盒門開裝置2〇8之外門214與内 門2i 2開啟時’所揚起之微塵也會被防塵裝置2 1 6抽除,而 =會進入氮氣加載互鎖區204。然後機械手臂206將晶圓放 於曰曰舟上,當前開式晶圓盒内所有的晶圓都移至晶舟 $ j前開式晶圓盒門開裝置2〇8之内n212與外門214會關 =之後,再重複同樣的動作將另一個前開式晶圓盒内的 曰曰圓移至晶舟,直到晶舟被填滿後(一般是12〇片晶圓), 才將晶舟傳送至反應室2〇2進行反應。 同樣的,在進行將晶圓載入前開式晶圓盒2丨〇内時, 門梦反應室2〇2中送出,然後打開前開式晶圓盒門 = 之外門214與内門212,當機械手臂206拿取拿取 曰:ί it晶圓後,將晶圓送往前開式晶圓盒210,晶圓會 ^214 I裝置216。於是,在前開式晶圓盒門開裝置208之 外門2 1 4與内門2 1 2開Μ # Ο 1 . ^ A、 欠時’所揚起之微塵也會被防塵裝置 各210 進入氮氣加載互鎖區204。當前開式晶圓 填滿曰曰圓後,前開式晶圓盒門開裝置208之内門212 554421 五、發明說明(π) 與外門21 4會關閉。之後,再重複同樣的動作將晶舟内剩 餘的晶圓移至另一個前開式晶圓盒内,直到移完晶舟内所 有的晶圓。 依照本發明實施例所述,在反應爐管之前開式晶圓盒 門開裝置上加裝防塵裝置’此防塵裝置噴吹氣體如氮氣^ 成氣幕(Curtain),當晶圓要進出前開式晶圓盒時都要通 過防塵裝置之氣幕,因此晶圓上之微塵可被防塵裝置移除 過濾,而可以防止微塵與空氣進入氮氣加載互鎖區。 μ554421, description of the invention (10) 1 After the inner door 214 and the outer door 216 of the front-opening wafer box door opening device 108, the robot arm 206 is extended into the front-opening wafer box 210 to pick up the wafer. Then, when the wafer is retrieved for the robot | 206 and returned to the nitrogen-loaded interlocking zone 204, the wafer passes through the dustproof device 216. Since the airflow of the dust-proof device 216 is parallel to the wafer surface, both the upper surface and the lower surface of the wafer can be blown by nitrogen. When the wafer passes the dust-proof device 2 1 6, the dust on the wafer can be protected by the dust-proof device 21 6 It is blown off and filtered, so that the fine dust does not enter the nitrogen-loaded interlocking zone 204. Moreover, since the dust-proof device 216 is always operated in the reaction chamber 2000, the dust particles raised by the outer door 214 and the inner door 2i 2 of the current open-type wafer box door opening device 2 will also be removed The dustproof device 2 1 6 is removed, and = will enter the nitrogen-loaded interlocking area 204. Then the robotic arm 206 puts the wafer on the boat, and all the wafers in the current open wafer box are moved to the wafer boat. The front open wafer box door opening device 208 is within n212 and the outer door 214. Will be closed = After that, repeat the same action to move the circle in another front-open wafer box to the wafer boat, and then transfer the wafer boat until the wafer boat is filled (usually 120 wafers). Go to the reaction chamber 200 for reaction. Similarly, when loading a wafer into the front-opening wafer cassette 2o0, the door dream reaction chamber 200 is sent out, and then the front-opening wafer cassette door is opened = the outer door 214 and the inner door 212. After the robotic arm 206 picks up the wafer, it sends the wafer to the open-front wafer cassette 210, and the wafer will be 214 and the device 216. Therefore, in the front-opening wafer box door opening device 208, the outer door 2 1 4 and the inner door 2 1 2 are opened. M # Ο 1. ^ A, when the dust is raised, the dust will also enter the nitrogen 210 Loading interlocking area 204. After the current open wafer is filled, the inner door 212 of the front open wafer box door opening device 208 554 421 421 5. Description of the invention (π) and the outer door 21 4 will be closed. After that, repeat the same operation to move the remaining wafers in the wafer boat to another front-opening wafer cassette until all the wafers in the wafer boat are moved. According to the embodiment of the present invention, a dustproof device is installed on the open-type wafer box door opening device in front of the reaction furnace tube. This dust-proof device sprays gas such as nitrogen ^ to form a curtain. The wafer box must pass the air curtain of the dustproof device, so the dust on the wafer can be removed and filtered by the dustproof device, which can prevent the dust and air from entering the nitrogen-loaded interlocking area. μ
而且,由於晶圓要進出前開式晶圓盒時都要通過防塵 裝置,因此即使前開式晶圓盒門開裝置與前開式晶圓盒之 間密封不良也不會影響到氮氣加載互鎖區(低氧環境):甜 夾裝置固定前開式晶圓盒便並非必要。 此外’本發明在反應爐管之前開式晶圓盒門開穿置上 加裝防塵裝置,當晶圓要進出前開式晶圓盒時都要^過防 塵裝置,使晶圓可以直接將晶圓從前開式晶圓盒傳送$晶 舟,或使晶圓直接回到前開式晶圓盒,因此可以不恭= 氮氣喷吹(Purge)前開式晶圓盒,或者也可以縮短以而 噴吹(Purge)前開式晶圓盒之時間,而可以節省 、祕 加產能與氮氣之用量。 ~In addition, since wafers must pass through the dust-proof device when entering and exiting the front-opening wafer cassette, even if the sealing between the front-opening wafer-box door opening device and the front-opening wafer cassette is not affected, the nitrogen loading interlock zone ( Hypoxic environment): It is not necessary to fix the front open wafer box with the sweet clip device. In addition, according to the present invention, a dustproof device is installed on the opening and closing of the wafer box door before the reaction furnace tube. When the wafer is to enter and exit the front-opening wafer box, the dustproof device must be passed, so that the wafer can directly place the wafer. Transfer the wafer boat from the front-opening wafer box, or return the wafer directly to the front-opening wafer box, so it can be disrespectful = Purge the front-opening wafer box, or it can be shortened to inject ( Purge) The time of the front-opening wafer cassette, which can save and increase the production capacity and the amount of nitrogen. ~
雖然本發明已以一較佳實施例揭露如上, =限定本發明,任何熟習此技藝者,在不 :::範圍内’當可作各種之更動與潤飾,因此本 護蛇圍當視後附之中請專利^圍所界定者為準。月之Although the present invention has been disclosed as above with a preferred embodiment, = to limit the present invention, anyone skilled in this art will not be able to make various changes and retouches within the scope of :::: Among them, the ones defined by the patent ^ shall prevail. Yuezhi
554421 圖式簡單說明 第1圖係為繪示習知之反應爐管上視示意圖; 第2圖係為繪示設置本發明之具有防塵裝置之前開式 晶圓盒門開裝置的反應爐管上視示意圖; 第3A圖與第3B圖所繪示為本發明一較佳實施例之防塵 裝置的結構示意圖;以及 第4圖所繪示為晶圓通過防塵裝置之示意圖。554421 Brief description of the drawings The first diagram is a schematic diagram showing the top view of a conventional reaction furnace tube; the second diagram is a diagram showing the top view of a reactor tube with an open-type wafer box door opening device provided with a dustproof device according to the present invention 3A and 3B are schematic structural diagrams of a dustproof device according to a preferred embodiment of the present invention; and FIG. 4 is a schematic diagram of a wafer passing through the dustproof device.
9736twf.ptd 第17頁9736twf.ptd Page 17
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TW91118965A TW554421B (en) | 2002-08-22 | 2002-08-22 | A front open unified pod door opener with a dust-proof means |
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