TW546660B - Current-mode sense amplifier with low power consumption - Google Patents

Current-mode sense amplifier with low power consumption Download PDF

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Publication number
TW546660B
TW546660B TW91100808A TW91100808A TW546660B TW 546660 B TW546660 B TW 546660B TW 91100808 A TW91100808 A TW 91100808A TW 91100808 A TW91100808 A TW 91100808A TW 546660 B TW546660 B TW 546660B
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Taiwan
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circuit
current
voltage
output
terminal
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TW91100808A
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Chinese (zh)
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Hong-Chin Lin
Fu-Nian Liang
Ching-Yuan Lin
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Ememory Technology Inc
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Priority to TW91100808A priority Critical patent/TW546660B/en
Priority to JP2002273827A priority patent/JP2003217292A/en
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Publication of TW546660B publication Critical patent/TW546660B/en

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Abstract

A current-mode sense amplifier for detecting data stored in a flash memory cell. The sense amplifier has a first current generator for generating a first current to a first circuit according to current passing through the memory cell, a second current generator for generating a second current to a second circuit according to current passing through a reference cell, and a switch. When the switch is on and a common node of the first circuit and the second circuit is floating, the first and second circuit will generate equal initial voltages. When the switch is off and the common node of the first and second circuits is ground, one of the initial voltages will increase, and the other initial voltage will decrease.

Description

546660 --- 五、發明說明(1) 發明之領域 本發明提供一種庳用於快閃記憶體的感測電路,尤指 於低電壓下操作且低功率消耗之感測電路。 明 背景說 近年來’隨著可攜式(por tab le)電子產品的需求增 加’快閃(f 1 ash )記憶體的技術以及市場應用也日益成熟 擴大。這些可攜式電子產品包括有i位相機的底片、手 機 遊戲機(video game apparatus)、個人數位助理 (Personal digital assistant,PDA)之記憶體、電話答 錄裝置以及可程式I C等等。快閃記憶體為一種非揮發性記 憶體(non-volatile me;mory),其運作原理是藉由改變電 晶體或記憶單元的起始電壓(threshold voltage)來控制 閘極通道的開關以達到記憶資料的目的,使儲存在記憶體 中的資料不會因電源中斷而受到消失。 一般而言,快閃記憶體主要包含有一用來健存電荷# 浮置閘極(f 1 〇 a t i n g g a t e )以及一用來控制資料存取的押' 制閘極(control gate)設置於浮置閘極上,並藉由_ 〇NO(〇xide-nitride-oxide)結構的介電層與浮置閘極隔 離。所以記憶體可以利用熱電子或穿遂的原理,將感應電 荷儲存於堆疊式閘極中,使記憶體存入訊號” 0 ”。如果"^需546660 --- 5. Description of the invention (1) Field of the invention The present invention provides a sensing circuit for flash memory, especially a sensing circuit that operates at low voltage and has low power consumption. Ming Background In recent years, as the demand for portable electronic products has increased, flash memory (f 1 ash) technology and market applications have also matured and expanded. These portable electronic products include i-camera film, video game apparatus, personal digital assistant (PDA) memory, telephone answering device, and programmable IC. Flash memory is a type of non-volatile memory (non-volatile memory). Its operating principle is to control the switching of the gate channel to achieve memory by changing the threshold voltage of the transistor or memory cell. The purpose of the data, so that the data stored in the memory will not be lost due to power interruption. Generally speaking, flash memory mainly includes a floating gate (f 1 〇atinggate) and a control gate for controlling data access. And the gate is isolated from the floating gate by a dielectric layer of 〇〇 (〇ide-nitride-oxide) structure. Therefore, the memory can use the principle of thermoelectron or tunneling to store the inductive charge in the stacked gate, so that the memory stores the signal "0". If " ^ required

546660 五、發明說明(2) 〜-- 要更換圮憶體中的資料,只需再供給些許額外的能量,抹 除儲存於浮置閘極中的電子,就可再重新進行資料寫入。 為了 4取。己憶體中各記憶單元(memory cell)的狀 I、必/頁使用感測放大器(s e n s e a m p 1 i f i e r)來偵測 記憶單兀中感應電荷的儲存狀態,以判別該記憶單元所代 表的數值為11 0 ’’或” 1 ”。一般而言,習知感測放大器以感測 頌型區刀為電壓模式(v〇ltage mode)及電流模式 (current mode),對於運作於低電壓之下的快閃記憶體 而曰’會由於電壓擺盛(v〇itage swing)過低,造成電 壓模式之感測放大器無法於該低電壓操作環境中正常運 作’因此不能準確地判別該記憶單元中感應電荷的儲存狀 態。然而’使用電流模式之感測放大器可以於低電壓操作 下的快閃記憶體中,透過電流變化對電壓的影響而得知記 憶單元的電荷儲存狀態。 請參閱圖一,圖一為習知快閃記憶體之感測電路1 〇的 電路示意圖,感測電路1 〇包含有一訊號產生器1 1用來輸入 脈波,一輸出端1 3用來輸出代表二進位數值的訊號,兩輪 入電路12、14分別連接於一參考單元16( reference cell )及一纟己’丨思早元18( memory cell) ’ 一差動放大裔 (differential amplifier) 2 0用來依據兩不同的輸入訊 號而產生一相對應的輸出訊號,一電壓源V d d用來提供該 感測電路1 0的操作偏壓,以及另一差動放大器2 2用來處理546660 V. Description of the invention (2) ~-To replace the data in the memory, you only need to supply a little extra energy, erase the electrons stored in the floating gate, and then write the data again. Take 4 for. The state of each memory cell in the memory body I, must / page uses a sense amplifier (senseamp 1 ifier) to detect the storage state of the induced charge in the memory cell to determine the value represented by the memory cell as 11 0 '' or `` 1 ''. Generally speaking, the conventional sense amplifier uses the sensing mode knife as the voltage mode and current mode. For flash memory operating under low voltage, The voltage swing is too low, so that the voltage-mode sense amplifier cannot operate normally in the low-voltage operating environment. Therefore, the storage state of the induced charge in the memory unit cannot be accurately determined. However, a sense amplifier using a current mode can know the charge storage state of the memory cell in the flash memory under low voltage operation through the influence of the current change on the voltage. Please refer to FIG. 1. FIG. 1 is a circuit diagram of a conventional flash memory sensing circuit 1 〇, the sensing circuit 10 includes a signal generator 11 for inputting a pulse wave, and an output terminal 13 for outputting A signal representing a binary value. The two input circuits 12, 14 are connected to a reference cell 16 (reference cell) and one's own '丨 思 元 18 (memory cell)' a differential amplifier (differential amplifier) 2 0 is used to generate a corresponding output signal according to two different input signals, a voltage source V dd is used to provide the operating bias of the sensing circuit 10, and another differential amplifier 22 is used to process

546660 元1 8所輸出的 輸入電路1 2、 聲1 2、1 4是否 器2 2之電晶體 ,因此參考單 放大器22申同 2 8與差動放大 單元1 8所產生 同時產生一相 五、發明說明(3) 丨參考單元1 6及記憶單 |相對應的電壓變化。 S2 ’用來控制輸入電 電晶體24與差動放大 current mirror) 由該電流鏡而於差動 |流,同樣地,電晶體 電流鏡,因此記憶 而於差動放大器22中 電流並於端點A、B產生 14包含有控制開關si、 為通路或斷路,此外, 2 6形成一電流鏡 元1 6所產生的電流會經 時產生一相同大小的電 器22之電晶體3〇亦形成 的電流會經由該電流鏡 同大小的電流。 生器 32 ' 電 放大 當訊 時電 I入電 經由 同理 |形成 生之 準位 之上 假若電壓源Vdd提供一"伏特的操 11輸入一高電壓準位(high)的訊號= 虽訊旎產 34會導通’所以端點A、B的電壓料 2電晶體 器20所產生的輪出電壓重置(MM/所以使差動 號產生器11輸入一低電壓準位(1〇的接地電壓。 曰曰』32、34會關閉,而當控制開關S1、的J虎時’此 路12、μ形成通路時,則輸入電路12所】而使輸 電晶體26、24所形成的電流鏡而輸入差流會 ,輸入電路14所產生之電流亦會經由電= 的電流鏡而輸入差動放大器22, 所 電流小於輸入電路14所產生之 ,電路12所產 經由接地電壓而t 、j ^點A的電壓 味點A的電壓達到使電晶體33導通的 J it ^ ^546660 yuan 1 8 output circuit 1 2, sound 1 2, 1 4 whether the transistor 2 2 transistor, so refer to the single amplifier 22 Shen Tong 2 8 and the differential amplifier unit 18 to produce a phase five, Description of the invention (3) 丨 the reference unit 16 and the corresponding memory voltage change. S2 'is used to control the input transistor 24 and the differential amplifier current mirror). The current mirror is used for the differential current. Similarly, the transistor current mirror is used to memorize the current in the differential amplifier 22 and to the terminal A. , B produces 14 including the control switch si, which is a path or an open circuit. In addition, the current generated by 2 6 forming a current mirror element 16 will generate an electric current of the same size as the electric transistor 22 over time. A current of the same magnitude through the current mirror. The generator 32 'electrically amplifies electricity when it is energized. By the same reason, if the voltage source Vdd provides a "Volt operation 11 input a high voltage level (high) signal = although the signal The output 34 will be turned on, so the voltages at the terminals A and B are reset by the output voltage of the transistor 20 (MM / so the differential number generator 11 is input to a low voltage level (10 "When 32 and 34 are turned off, when the switch S1 is controlled by J Tiger, 'When this path 12, μ forms a path, it is input to the circuit 12] and the current mirror formed by the power transmission crystals 26, 24 is input. Differential current, the current generated by the input circuit 14 is also input to the differential amplifier 22 through an electric current mirror, the current is smaller than that generated by the input circuit 14, and the circuit 12 produces t and j ^ points A through the ground voltage. The voltage of the voltage taste point A reaches J it which makes the transistor 33 conductive ^^

第7頁 546660 五、發明說明(4)Page 7 546660 V. Description of the invention (4)

起始值(threshold)時,端點b的電壓仍尚未達到使電晶 體3 5導通的起始值,然後,電晶體3 3會導通而使端點6的 電壓下降而嵌制於接地電壓,而電晶體3 5會—直保持關閉 狀態,所以造成端點A的電壓大於端點b的電壓,最後經^ 差動放大器電路2 0而產生一接近電壓源vdd的輪出電壓。 同理,若輸入電路1 2所產生之電流大於輸入電路i 4所產生 之電流’則差動放大器電路20會產生一接近接地電壓的 出電壓’由於感測電路1 〇操作時,端點A、鱗以接地電^ 為起始值’而後慢慢提高電壓,當到達使電晶體32或電曰 體3 4導通的起始值時,兩端點a、B+,其一端會被嵌制= 接地電壓而下降’然而另一端點必須不斷輸入電流以使電 壓上升至接近電壓源Vdd的電壓值,因此習知電流模式之 感測電路1 0會萵要較多的能量才能運作,因此其功率消耗 (power consumption);較大 〇 發明概述 因此本發明的主要目的係提供一種應用於低電壓的操 作壞境之快閃5己憶體的感測電路,而且使用較少的功率、、^ 耗,以解決上述問題。 ' 本發明之申請專利範圍提供一種快閃記憶體之感測電 路,用來依據該快閃記憶體中之記憶單元與一參考單元的At the threshold, the voltage at terminal b has not yet reached the starting value for turning on transistor 35, and then transistor 33 will turn on and the voltage at terminal 6 will drop and become embedded in the ground voltage. The transistor 35 will remain in the closed state, so that the voltage at the terminal A is greater than the voltage at the terminal b, and finally the differential amplifier circuit 20 generates a round voltage close to the voltage source vdd. Similarly, if the current generated by the input circuit 12 is greater than the current generated by the input circuit i 4 ', the differential amplifier circuit 20 will generate an output voltage close to the ground voltage'. Because the sensing circuit 10 operates, the terminal A The scale takes grounding voltage ^ as the initial value, and then gradually increases the voltage. When the initial value that makes the transistor 32 or the electric body 3 4 conductive is reached, the two ends a, B +, and one end will be embedded = The ground voltage drops. However, the other end must continuously input current to increase the voltage to a value close to the voltage source Vdd. Therefore, the sensing circuit 10 of the conventional current mode requires more energy to operate, so its power Power consumption; larger. Summary of the invention Therefore, the main object of the present invention is to provide a fast flash memory circuit for low-voltage operation, and it uses less power. To solve the above problems. '' The scope of the patent application of the present invention provides a flash memory sensing circuit based on the memory cell and a reference unit in the flash memory.

第8頁 546660 五、發明說明(5) 電流準位偵測 電流產 路之第 生器用來依據 電路,電連接 產生器輸出之 第一端係連接 於該第一電路 一電壓及該第 第二電流降至 該記憶 流產生器用來 第一電路,電 ,該第 一電流及該第 二電壓 趨近該 第一電路及該 於一接地端之 一電路 之第一 一電壓 開啟且該第一 ,該第一電路 地分散至該第一電路 該第一電壓及該第二 一第二電壓 存之資料。該 記憶單元之電 該第一電流產生器, 一電流產生一第一電 一電源供應器,一第 感測電路包含一 流產生一第一電 電流產生一第二 產生器,用來 以及一輸 二電流升至趨 中之另一電壓 接地電壓。 第一電 流,一 該第一 第一電 該第一 資料之 相互連 電路之 餘電荷 之輸出 應器之 當該開 端連接 壓會依 且該第 流及該 電壓及 輸出訊 接,當 第二端 會平均 端以使 供應電 關關閉 至該接 據該第 生器輸 一端係 該參考 於該第 第二電 至該電 之輸出 該第二 號。該 該開關 浮接時 壓及高 且該第 地端時 單元儲 依據該 連接於 出之第 連接至 單元之 —電流 流產生 源供應 端及該 電壓產 器 第二電 生一對 路之輸 應於該 第二電 電路之 及該第 之輸出 電壓趨 接地電 端及該 及該第 電流 依據該 且該第 出電路 出端, 記憶單 路係經 第二端 二電路 端及該 近低於 壓的起 第二電 二電壓 近該供 會依據 用來依據 壓,且該 二電流產 ,一第二 第二電流 二電路之 ,電連接 用來依據 元儲存之 由一開關 及該第二 之間的殘 第二電路 該電源供 始電壓。 路之第一 中之一電 應電壓, 該第一電 發明之詳細說明Page 8 546660 V. Description of the invention (5) Current level detection The first generator of the current generation circuit is used according to the circuit. The first end of the output of the electrical connection generator is connected to a voltage of the first circuit and the second The current is reduced to the memory current generator for the first circuit, electricity, the first current and the second voltage approach the first circuit and the first voltage of a circuit at a ground terminal is turned on and the first, The ground of the first circuit is distributed to the data stored in the first circuit and the first voltage and the second voltage. The memory unit powers the first current generator, a current generating a first power and a power supply, and a first sensing circuit including a first generating a first electrical current generating a second generator, and a two-output The current rises to another centered ground voltage. The first current, the output charge of the remaining charge of an interconnect circuit of the first first electrical and the first data, when the open end connection voltage will depend on the first current and the voltage and output signal connection, when the second end The terminal will be averaged so that the supply power is turned off until the output terminal of the receiving device is the second number that refers to the output from the second power to the power. When the switch is floating, the voltage is high and the first ground is connected to the output of the first connected to the unit, the current source of the current source and the second generator of the voltage generator. The second electrical circuit and the first output voltage tend to ground electrical terminals and the and the first currents are based on the and the first output circuit terminals. The memory single circuit is through the second terminal two circuit terminals and the near-low voltage. From the second electric second voltage, the supply voltage is used for the voltage reference, and the two electric currents are generated, and a second second electric current is used for the electric circuit. Residual second circuit supplies this power supply with the starting voltage. The voltage of one of the first electric circuits, the detailed description of the first electric invention

第9頁 546660 五、發明說明(6) 請參閱圖二,圖二為本發明第一種快閃記憶體之感測 電路3 0的電路示意圖,感測電路3 0係用來依據一記憶單元 3 2以及一參考單元3 4的電流準位來偵測記憶單元3 2所代表 的二進位數值。感測電路3 0包含一第一電流鏡3 6,一第一 電路38,一第二電流鏡40,一第二電路42,一輸出電路44 以及一電源供應器4 5。第一電路3 8與第二電路4 2係為互相 對稱的電路,亦即第一電路3 8與第二電路4 2中的電路元件 之連接方式與規格均相同。此外,一電晶體5 0連接第一電 路3 8與第二電路4 2,其經由一第一時脈5 1來控制導通狀 _ 態,當電晶體50導通時,第一電路38中端點S的電位會趨 近於第二電路42中端點T的電位。另一電晶體52連接於第 一電路3 8與第二電路4 2之一端,經由一第二時脈5 3來控制 導通狀態以控制第一電路3 8與第二電路4 2是否連接於接地 電壓。開關S卜S2、S3係用來控制記憶單元32是否與第一 電流鏡3 6形成一電流傳輸路徑,以及參考單元3 4是否與第 二電流鏡4 0構成一電流傳輸路徑,當記憶單元3 2與第一電 流鏡3 6形成一通路時,記憶單元3 2所產生的電流會經由第 一電流鏡3 6產生一第一電流4 6而輸入第一電路3 8,同樣 地,當參考單元3 4與第二電流鏡4 0形成一通路時,參考單 元3 4所產生的電流會經由第二電流鏡4 0產生一第二電流4 8 ' 而輸入第二電路4 2,本發明快閃記憶體之感測電路3 0的運 — 作詳述如下。Page 9 546660 V. Description of the invention (6) Please refer to FIG. 2. FIG. 2 is a schematic circuit diagram of the first flash memory sensing circuit 30 according to the present invention. The sensing circuit 30 is based on a memory unit. 32 and a reference current level of unit 34 to detect the binary value represented by memory unit 32. The sensing circuit 30 includes a first current mirror 36, a first circuit 38, a second current mirror 40, a second circuit 42, an output circuit 44 and a power supply 45. The first circuit 38 and the second circuit 42 are symmetrical circuits, that is, the connection methods and specifications of the circuit elements in the first circuit 38 and the second circuit 42 are the same. In addition, a transistor 50 is connected to the first circuit 38 and the second circuit 42, which controls the conduction state via a first clock 51, and when the transistor 50 is turned on, the endpoint in the first circuit 38 The potential of S will approach the potential of the terminal T in the second circuit 42. The other transistor 52 is connected to one end of the first circuit 38 and the second circuit 42, and the conduction state is controlled through a second clock 53 to control whether the first circuit 38 and the second circuit 42 are connected to ground. Voltage. The switches S2, S2, and S3 are used to control whether the memory unit 32 forms a current transmission path with the first current mirror 36, and whether the reference unit 34 and the second current mirror 40 form a current transmission path. When the memory unit 3 When 2 forms a path with the first current mirror 36, the current generated by the memory unit 3 2 will generate a first current 4 6 through the first current mirror 36 and enter the first circuit 3 8. Similarly, when the reference unit When 3 4 and the second current mirror 40 form a path, the current generated by the reference unit 34 will generate a second current 4 8 ′ through the second current mirror 40 and enter the second circuit 4 2. The operation of the memory sensing circuit 30 is described in detail below.

第10頁 546660 五、發明說明(7) 請參閱圖二及圖三,圖三為圖二所示之感測電路30的 驅動時脈示意® °本實施例中,電源供應器45提 =30運作所需的偏壓(例如18伏特),當於時間電 月,J ,開關SI、S2、S3及第—時脈51為低電壓準位, 時脈53係為高電壓準位,此時感測電 到-平衡”,而端點s、τ亦會達到同一電壓準 電壓準位係咼於接地電壓。而當時間 S2、S3及第一時脈51為柄Φ /^隹仞姑 间關S卜 電壓準位轉變為低電壓準& Λ =第二時脈53由高 的電壓準位會略微調整,且亦會達到; :壓準位係高於接地電壓。然後,當:該 Si、s2、S3由低電壓準位轉變為高電壓準位,^以帝 流ΐ3二依ί記:!元32所產生的電流而產生相對應的ΐ 2鏡54 0會依據參考單元34所產生的電流 產生才子應的弟一電流48,以及電晶體 趨近同-電壓準位,但是由於電晶體52 係為V通,因此弟一電路3 8與第二電路4 2的一端係連接於 電源供應器45,而另一端則互相連接於接地電壓。此時, 第一電路38與第二電路42中,電晶體54、56、62、63係運 作於飽和區(saturation region),而電晶體58、6〇則 運作於線性區域(1 inear region)。若第二電流48小於 第一電流4 6,則流過電晶體6 0的電流亦會小於流過電晶體 5 8的電流’由於電晶體5 8、6 0運作於線性區域,因此第一 電路38中端點X的電壓準位會大於第二電路42中端點γ的電Page 10 546660 V. Description of the invention (7) Please refer to Fig. 2 and Fig. 3. Fig. 3 shows the driving clock of the sensing circuit 30 shown in Fig. 2 ° In this embodiment, the power supply 45 is raised to 30 The bias voltage required for operation (for example, 18 volts), when the electric time is J, the switches SI, S2, S3, and the first clock 51 are at the low voltage level, and the clock 53 is at the high voltage level. "Sensing electricity to -balance", and the terminals s, τ will also reach the same voltage quasi-voltage level is tied to the ground voltage. When the time S2, S3 and the first clock 51 are the handle Φ / ^ 隹 仞The threshold voltage level is changed to a low voltage level & Λ = the second clock 53 will be slightly adjusted from the high voltage level and will also be reached;: The voltage level is higher than the ground voltage. Then, when: Si, s2, and S3 change from a low voltage level to a high voltage level. ^ Take the diurnal 依 3 二 2 as follows: The current generated by the element 32 will generate a corresponding ΐ 2 mirror 54 0 will be based on the reference unit 34. The generated current produces the talented current Yiyi 48, and the transistor approaches the same-voltage level, but because the transistor 52 is V-pass, the brother Yi circuit 3 One end of 8 and the second circuit 42 are connected to the power supply 45, and the other end is connected to the ground voltage. At this time, in the first circuit 38 and the second circuit 42, the transistors 54, 56, 62, 63 The system operates in the saturation region, and the transistors 58 and 60 operate in the linear region (1 inear region). If the second current 48 is less than the first current 4 6, the current flowing through the transistor 60 is also Will be less than the current flowing through the transistor 58 because the transistors 58, 60 operate in a linear region, so the voltage level of the terminal X in the first circuit 38 will be greater than the voltage of the terminal γ in the second circuit 42

第11頁 546660 五、發明說明(8) 壓準位,但是,電晶體5 0係為導通而使兩端點S、T同時趨 近一大於接地電壓的起始電壓(例如1伏特)。電晶體 5 4、5 6係運作於飽和區,而電晶體5 4、5 6的閘極(ga t e) 電壓由於兩端點S、T而同時趨近同一電壓準位,但是端點 X的電壓準位大於端點γ的電壓準位,所以電晶體5 4的源極 (source)電壓會大於電晶體5 6的源極電壓而造成流過電 晶體5 4的電流會小於電晶體5 6的電流,如上所述,於時間 12之前,兩端點s、T的電壓準位會由於電晶體5 〇開啟而同 時趨近同一準位。當時間為12時,第一時脈5丨由低電壓準 位轉變為高電壓準位,而開關sl、S2、S3仍維持於高電 壓準位以及第二時脈53仍維持於低電壓準位,所以第一電 流鏡3 6會依據記憶單元3 2所姦斗μ堂、六I 士 -電流46輸入第—;路38所ί ^的;ΐ而產生相對應的第 元34所產生的電流而產k ^ = r鏡40會依據參考單 路42’而由於電晶體52導;對=二:流_入第二電 42的-端會連接於接地“。電:38與第二電路 電流小於電晶體56的電流,戶 ^ ^ 由於電晶體54的 位而使電晶體5 0非導通時1且,^當第一時脈5 1為高電壓準 晶體52導通時,電晶體^會第^時脈53為低電壓準位使電 準位略為下降,同樣地,^,第二電路4 2中端點T的電壓 點S的電壓準位略為上升,I晶&體54亦會使第一電路38中端 使電晶體6 2導通時,端點當端點T的電壓準位降低而最後 供應器4 5提供感測電路3 〇的電壓準位會提昇至趨近電源 昇電晶體6 0的閘極電壓而 乍所的電壓,並進一步地提 - 使電晶體6 0能導通更大的電流,Page 11 546660 V. Description of the invention (8) The voltage level, however, the transistor 50 is turned on so that both ends S, T approach a starting voltage (for example, 1 volt) which is greater than the ground voltage at the same time. Transistors 5 4, 5 6 operate in the saturation region, and the gate (ga te) voltage of transistors 5 4, 5 6 approaches the same voltage level at the same time due to the two ends S, T, but the end point X The voltage level is greater than the voltage level of the terminal γ, so the source voltage of the transistor 5 4 will be greater than the source voltage of the transistor 5 6 and the current flowing through the transistor 5 4 will be less than that of the transistor 5 6 As mentioned above, before time 12, the voltage levels at both ends s, T will approach the same level at the same time because the transistor 50 is turned on. When the time is 12, the first clock 5 丨 changes from a low voltage level to a high voltage level, while the switches sl, S2, and S3 remain at the high voltage level and the second clock 53 remains at the low voltage level Position, so the first current mirror 36 will be input to the first — based on the memory unit 32, the six currents and the current 46, and the 38th; and the corresponding 34th element will be generated. The current k ^ = r mirror 40 will be conducted by the transistor 52 according to the reference single circuit 42 '; pair = two: the-terminal of the current flowing into the second circuit 42 will be connected to the ground. "Electricity: 38 and the second circuit The current is less than the current of transistor 56. When the transistor 50 is non-conducting due to the bit of transistor 54, and when the first clock 51 is high voltage quasi-crystal 52, the transistor will be The ^ clock 53 is a low voltage level, which causes the electrical level to drop slightly. Similarly, the ^, the voltage level of the voltage point S of the terminal T in the second circuit 42 is slightly increased, and the I crystal & body 54 will also When the middle end of the first circuit 38 turns on the transistor 6 2, the voltage level of the terminal T when the terminal T decreases and the voltage level of the sensor circuit 3 provided by the last supplier 45 will increase to Near the power transistor gate voltage rise 60 while the voltage at first, and to provide further - make the transistor 60 capable of conducting more current,

546660 五、發明說明(9) 因此使端點T的電麼準位能更快地趨近接地電塵,最後使 端點S達到高電壓準位而端點T為低電壓準位,然後輸出電 路44則依據端點S、T的電壓準位而輪出一輸出^號來表示 記憶單元3 2所代表的二進位數值。同理,若對廡於參考單 元3 4所產生的第二電流4 8大於對應於記憶單元3 2所產生第 一電流4 6,則最後端點S為低電壓準位而端點τ為高電壓準 位。 請參閱圖二及圖四,圖四為圖二所示之輸出電路44的 電路示意圖。輸出電路44係由互補^屬氧化半導體 (complementary metal-oxide semiconductor, CMOS) 電晶體6 4、6 6組成,而電晶體6 4的閘極連接於第一電路3 8 的端點S ’以及電晶體6 6的閘極連接於第二電路& 2的端點 T ’且g第一日守脈5 1輸入一南電壓準位的訊號時,輸出電 路4 4才會啟動而使電晶體6 4、6 6所構成的反向器 (inverter)發生作用。當端點s為高電壓準位而端點τ為 低電壓準位時,第一輸出端68會輸出高電壓準位而第二輸 出端7 0會輸出低電壓準位,相反的,當端點τ為高電壓準 位而端點S為低電壓準位時,第一輸出端6 8會輸出低電壓 準位而第二輸出端7 0會輸出高電壓準位,因此可依據第一 輸出端6 8或第二輸出端7 〇來判斷記憶單元3 2所代表的二進 位數值」舉例來說,若第一電流46大於第二電流48,則端 點S為高電壓準位而端點τ為低電壓準位,因此輸出電路“ 之第一輸出端6 8會輸出高電壓準位,亦即記憶單元3 2代表546660 V. Description of the invention (9) Therefore, the electric level of the terminal T can approach the grounding electric dust faster, and finally the terminal S reaches a high voltage level and the terminal T is a low voltage level, and then output The circuit 44 outputs an output caret according to the voltage levels of the terminals S and T to represent the binary value represented by the memory unit 32. Similarly, if the second current 4 8 generated by the reference unit 3 4 is greater than the first current 4 6 generated by the memory unit 32, the last endpoint S is a low voltage level and the endpoint τ is high. Voltage level. Please refer to FIG. 2 and FIG. 4. FIG. 4 is a circuit diagram of the output circuit 44 shown in FIG. The output circuit 44 is composed of complementary metal-oxide semiconductor (CMOS) transistors 6 4 and 6 6, and the gate of the transistor 6 4 is connected to the terminal S ′ of the first circuit 3 8 and the circuit. The gate of the crystal 6 6 is connected to the terminal T ′ of the second circuit & 2 and the first day guard pulse 5 1 When the signal of a south voltage level is input, the output circuit 4 4 will start and the transistor 6 will be activated. The inverters composed of 4, 6 and 6 work. When the terminal s is a high voltage level and the terminal τ is a low voltage level, the first output terminal 68 will output a high voltage level and the second output terminal 70 will output a low voltage level. Conversely, when the terminal When the point τ is a high voltage level and the endpoint S is a low voltage level, the first output terminal 68 will output a low voltage level and the second output terminal 70 will output a high voltage level. Terminal 68 or the second output terminal 70 to determine the binary value represented by the memory unit 32. For example, if the first current 46 is greater than the second current 48, the endpoint S is a high voltage level and the endpoint τ is a low voltage level, so the first output terminal 68 of the output circuit will output a high voltage level, that is, the memory unit 3 2 represents

第13頁 546660 五、發明說明(ίο) 一進位數值π 1π,若第一電流4 6小於第二電流4 8,則端點 S為低電壓準位而端點τ為高電壓準位,因此輸出電路44之 第一輸出端68會輸出低電壓準位,亦即記憶單元μ代表二 進位數值π Γ。本實施例,輸出電路44包含電晶體64、66 所構成的兩反向器來對第一電流46及第二電流48進行相對 應處理,然而亦可應用一差動放大器來對第一電流4 6及第 二電流4 8進行相對應處理,亦屬本發明之範缚。 本實施例中,此外,由於記憶單元3 2係經由第一電流 鏡3 6而連接於第一電路3 8,因此第一電流鏡3 6所產生的第 一電流46係固定的,不會受到第一電路38影響而改變,所 以本發明感測電路3 0亦可應用於多位準快閃記憶體 (multi-level flash memory) 〇Page 13 546660 V. Description of the invention (ίο) A carry value π 1π, if the first current 4 6 is less than the second current 4 8, the terminal S is a low voltage level and the terminal τ is a high voltage level, so The first output terminal 68 of the output circuit 44 outputs a low voltage level, that is, the memory unit μ represents a binary value π Γ. In this embodiment, the output circuit 44 includes two inverters composed of transistors 64 and 66 to correspondingly process the first current 46 and the second current 48. However, a differential amplifier may also be applied to the first current 4 6 and the second current 4 8 are correspondingly processed, which also belongs to the scope of the present invention. In this embodiment, in addition, since the memory unit 32 is connected to the first circuit 38 through the first current mirror 36, the first current 46 generated by the first current mirror 36 is fixed and will not be affected. The influence of the first circuit 38 changes, so the sensing circuit 30 of the present invention can also be applied to multi-level flash memory.

請參閱圖五’圖五為本發明第二種快閃記憶體之感測 電路8 0的電路示意圖。圖二所示之感測電路3 0係以電流鏡 的方式來產生第一電流4 6及第二電流4 8,而本實施例中, 係以第一電流產生器8 1來輸出對應於記憶單元3 2之第一電 流4 6,以及使用第二電流產生器8 2來輸出對應於參考單元 3 4之第二電流4 8,而感測電路8 0中,第一時脈5 1,第二時 脈5 3以及開關S 1、S 2、S 3的驅動時脈如同圖三所示,且端 點X、Y、S、T的電壓準位變化亦如同感測電路3 0所述,最 後,輸出電路4 4則依據端點S、T的電壓準位而輸出一輸出 訊號來表示記憶單元3 2所代表的二進位數值。Please refer to FIG. 5 'FIG. 5 is a schematic circuit diagram of a second flash memory sensing circuit 80 according to the present invention. The sensing circuit 30 shown in FIG. 2 generates a first current 46 and a second current 48 by means of a current mirror. In this embodiment, the first current generator 81 outputs a signal corresponding to the memory. The first current 46 of the unit 32 and the second current generator 8 2 are used to output the second current 4 8 corresponding to the reference unit 3 4. In the sensing circuit 80, the first clock 51, the first The driving clocks of the two clocks 5 3 and the switches S 1, S 2, and S 3 are as shown in FIG. 3, and the voltage levels of the terminals X, Y, S, and T also change as described in the sensing circuit 30. Finally, the output circuit 44 outputs an output signal according to the voltage levels of the terminals S and T to represent the binary value represented by the memory unit 32.

第14頁 546660 五、發明說明(11) 請參閱 之感測電路 憶體之感測 快閃記憶體 100、 110中 而輸入端點 示)而輸入 脈如圖三所 一電流46及 電路44則依 不該記憶早 圖六至圖八,圖六為本發明第三種快閃記憶體 9 0的電路示意圖,圖七為本發明第四種快閃記 電路10 0的電路示意圖,圖八為本發明第五種 之感測電路1 1 0的電路示意圖。感測電路9 0、 ,第一電流4 6係對應於一記憶單元(未顯示) X,而第二電流4 8係對應於一參考單元(未顯 端點Y,且第一時脈5 1與第二時脈5 3的驅動時 示,如上所述,端點S、T的電壓準位會依據第 第二電流4 8而產生相對^的變動,最後,輸出 據端點S、T的電壓準位而輸出一輸出訊號來表 元所代表的二進位數值。 相較於習知技術,本發明快閃記憶體之感測電路於啟 動輸出電路以進行偵測記憶單元與參考單元之電流前,先 將連接於輸出電路的兩端點之電位提昇至一預定準位,然 後於偵測記憶單元與參考單元之電流時,兩端點之電位則 以該預定準位為起始點而分別提昇至高電壓準位及低電壓 準位,因此可以大幅減少功率消耗。 以上所述僅為本發明之較佳實施例,凡依本發明申請 專利範圍所做之均等變化與修飾,皆應屬本發明專利之涵 蓋範圍。Page 14 546660 V. Description of the invention (11) Please refer to the sensing circuit of the flash memory 100 and 110 (refer to the input terminals shown in the flash memory), and the input pulse is shown in Figure 3, current 46 and circuit 44. I don't want to memorize early FIG. 6 to FIG. 8. FIG. 6 is a schematic circuit diagram of the third flash memory 900 according to the present invention, and FIG. 7 is a circuit schematic diagram of the fourth flash memory circuit 100 according to the present invention. A circuit diagram of the fifth sensing circuit 110 is invented. The sensing circuit 9 0,, the first current 4 6 corresponds to a memory unit (not shown) X, and the second current 4 8 corresponds to a reference unit (the terminal Y is not shown, and the first clock 5 1 As shown in the driving timing of the second clock 53, as described above, the voltage levels of the terminals S and T will change relatively according to the second current 48. Finally, the output according to the An output signal is output from the voltage level to represent the binary value represented by the table element. Compared to the conventional technology, the flash memory sensing circuit of the present invention activates the output circuit to detect the current of the memory unit and the reference unit. Before, the potentials connected to the two ends of the output circuit were first raised to a predetermined level, and then when the current between the memory unit and the reference unit was detected, the potentials at both ends were based on the predetermined level as the starting point. Raising to the high voltage level and the low voltage level, respectively, can greatly reduce power consumption. The above description is only a preferred embodiment of the present invention, and all equal changes and modifications made in accordance with the scope of the patent application of the present invention should belong to The scope of the invention patent.

第15頁 546660 圖式簡單說明 圖式之簡單說明 圖一為習知快閃記憶體之感測電路的電路示意圖。 圖二為本發明第一種快閃記憶體之感測電路的電路示 意圖 意圖 意圖 意圖 0 圖三為圖二所示之感測電路的驅動示意圖。 圖四為圖二所不之輸出電路的電路不意圖。 圖五為本發明第二種快閃記憶體之感測電路的電路示 〇 圖六為本發明第三種快閃記憶i之感測電路的電路示 〇 圖七為本發明第四種快閃記憶體之感測電路的電路示 0 圖八為本發明第五種快閃記憶體之感測電路的電路示 意圖。 圖式之符號說明Page 15 546660 Brief description of the diagram Brief description of the diagram Figure 1 is a circuit diagram of a conventional flash memory sensing circuit. FIG. 2 is a circuit diagram of a first flash memory sensing circuit according to the present invention. FIG. 3 is a driving schematic diagram of the sensing circuit shown in FIG. FIG. 4 is a circuit diagram of the output circuit shown in FIG. 2. Figure 5 is a circuit diagram of a second flash memory sensing circuit of the present invention. Figure 6 is a circuit diagram of a third flash memory i of the sensing circuit of the present invention. Figure 7 is a fourth flash memory of the present invention. Circuit diagram of the sensing circuit of the memory FIG. 8 is a schematic circuit diagram of the sensing circuit of the fifth flash memory of the present invention. Schematic symbol description

10> 30^ 80> 90^ 100' 110 感 測 電 路 11 訊號 產生 器 12^ 14 輸入 電路 13 輸 出 端 16' 34 參考 ΧίΧί 一 早兀 18> 32 記 憶 單 元 20 差動 放大 器 電路 22 差 動 放 大 器 24' 26^ 28> 30> Λ 33、 35、 5(L· 52^ 54 卜 56 1 Λ 58 第16頁 546660 圖式簡單說明 60' 62> 63、6[ 66 36 第一電流鏡 40 第二電流鏡 44 輸出電路 4 6 第一電流 51 第一時脈 6 8 第一輸出端 8 2 5 8 3 0 3 4 4 4 5 7 器 端 路路應流脈出 體電電供電時輸 晶一二源二二二 電第第電第第第10 > 30 ^ 80 > 90 ^ 100 '110 Sensing circuit 11 Signal generator 12 ^ 14 Input circuit 13 Output 16' 34 Reference X XL Early morning 18> 32 Memory unit 20 Differential amplifier circuit 22 Differential amplifier 24 '26 ^ 28 > 30 > Λ 33, 35, 5 (L52 52 54 54 56 1 Λ 58 Page 16 546660 Brief description of the diagram 60 '62> 63, 6 [66 36 First current mirror 40 Second current mirror 44 Output circuit 4 6 The first current 51 The first clock 6 8 The first output 8 2 5 8 3 0 3 4 4 4 5 7 The end of the device should flow out of the body when the electricity is supplied. Electricity No. Electricity No.

第17頁Page 17

Claims (1)

546660 六、申請專利範圍 1. 一種快閃記憶體(f 1 a s h m e m 〇 r y)之感測電路 (current-mode sense amplifier),用來依據該快閃記 憶體中之記憶單元(memory cell)與一參考單元 (r e f e r e n c e c e 1 1)的電流準位偵測該記憶單元儲存之資 料,該感測電路包含: 一第一電流產生器,用來依據該記憶單元之電流產生 一第一電流; 一第一電路,電連接於該第一電流產生器,用來依據 電流產生器輸出之第一電流產生一第一電壓,該第 之第一端係連接至一電源供▲器; 流產生器,用來依據該參考單元之電流產生 該第一 一電路 一第二 該第二 第二電 電流; 第二電 電流產 二電路之第 電路之 對應於 其 接,當 第二端 會平均 端以使 供應電 輸出電 輸出端 該記憶單元儲 中該第 該開關 浮接時 路,電連接於該 生為科j 弟— 端係連接至該電源供應 路,電連接於該 ,用來依據該第 存之資料 弟二電流產生 電流產生一第 來依據 ,該第 第一電 一電壓 電路及該第二 開啟且 ,該第 地分散至該第 該第一電 一電路及 一電路之 該第一電壓及該第二電 壓及高於一接地端之接 之輸出 電路係 路之第 該第二 輸出端 壓趨近 地電壓 器;以 路之輸 及該第 訊號; 經由一 二端及 電路之 及該第 低於該 的起始 器,用 二電壓 及 出端及該第二 二電壓 開關相 該第二 間的殘 二電路 電源供 電壓, 產生一 互連 電路之 餘電荷 之輸出 應器之 當該開546660 VI. Application for patent scope 1. A flash-memory (f 1 ashmem 0ry) current-mode sense amplifier, which is based on the memory cell (memory cell) in the flash memory and a A current level of a reference unit (reference 1 1) detects data stored in the memory unit, and the sensing circuit includes: a first current generator for generating a first current according to the current of the memory unit; a first A circuit electrically connected to the first current generator for generating a first voltage according to the first current output by the current generator, and the first first end is connected to a power supply; a current generator for The first electric circuit, the second electric circuit, and the second electric current are generated according to the current of the reference unit. The second electric circuit generates the second electric circuit corresponding to its connection. When the second terminal is averaged, the output power is output. The electrical output end stores the first floating switch circuit in the memory unit, and is electrically connected to the student's brother. The terminal system is connected to the power supply circuit, and is electrically connected to the circuit. According to the first stored data, the second current generating current generates a first basis, the first electric-voltage circuit and the second are turned on, and the first ground is dispersed to the first electric-first circuit and a circuit. The first voltage, the second voltage, and the output circuit connected to a ground terminal are the voltage of the second output terminal of the circuit approaching the ground voltage; the output of the circuit is applied to the first signal; And the starter lower than the second, the two voltages and the output terminal and the second two voltage switch phase are used to supply voltage to the second two circuit power supply to generate an output circuit of the remaining charge of the interconnection circuit. Should be opened 第18頁 546660 六、申請專利範圍 關關閉且該第一電路之第二端及該第二電路之第二端連接 至該接地端時,該第一電壓及該第二電壓中之一電壓會依 據該第一電流及該第二電流升至趨近該供應電壓,且該第 一電壓及該第二電壓中之另一電壓會依據該第一電流及該 第二電流降至趨近該接地電壓。 2. 如申請專利範圍第1項所述之感測電路,其中該輸出 電路包含至少一對反向器或至少一差動放大器。 3. 如申請專利範圍第1項所述之感測電路,其中該第一 電路及該第二電路係為相互對稱。 4. 如申請專利範圍第1項所述之感測電路,其中該第一 電流產生器係為一第一電流鏡,用來依據該記憶單元之電 流產生該第一電流,該第二電流產生器係為一第二電流 鏡,用來依據該參考單元之電流產生該第二電流。Page 18 546660 6. When the scope of patent application is closed and the second terminal of the first circuit and the second terminal of the second circuit are connected to the ground terminal, one of the first voltage and the second voltage will According to the first current and the second current, the voltage is approached to the supply voltage, and the other voltage of the first voltage and the second voltage is reduced to approach the ground according to the first current and the second current. Voltage. 2. The sensing circuit according to item 1 of the patent application scope, wherein the output circuit includes at least one pair of inverters or at least one differential amplifier. 3. The sensing circuit according to item 1 of the scope of patent application, wherein the first circuit and the second circuit are symmetrical to each other. 4. The sensing circuit according to item 1 of the scope of patent application, wherein the first current generator is a first current mirror for generating the first current and the second current according to the current of the memory unit. The device is a second current mirror for generating the second current according to the current of the reference unit. 第19頁Page 19
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