TW536868B - Piezoelectric substrate working method of surface acoustic device - Google Patents
Piezoelectric substrate working method of surface acoustic device Download PDFInfo
- Publication number
- TW536868B TW536868B TW91111922A TW91111922A TW536868B TW 536868 B TW536868 B TW 536868B TW 91111922 A TW91111922 A TW 91111922A TW 91111922 A TW91111922 A TW 91111922A TW 536868 B TW536868 B TW 536868B
- Authority
- TW
- Taiwan
- Prior art keywords
- piezoelectric substrate
- surface acoustic
- acoustic wave
- wave device
- substrate
- Prior art date
Links
Landscapes
- Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
Abstract
Description
536868 _+案號91111fl22_年月日 修正 五、發明說明(1) 本發明係一種表面聲波(Surface Acoustic Wave: SAW)裝置之壓電基板(piezoeiectric substrate)加工方 法’尤指一種在表面聲波元件中運用壓電材料所製成之壓 電基板,並在該壓電基板上設計表面指狀電極來進行訊號 處理之裝置,而以本發明之特殊加工法用於該裝置之壓電 基板,可以有效降低表面指狀電極進行表面聲波激發之同 時所產生的塊體波對設計元件頻率響應之影響。 早期,表面聲波元件最先被運用在雷達中,作為頻譜 分析的脈衝壓縮濾波,與此同時,在各個領域中亦可見其 應用。現今,由於表面聲波元件具有高性能、尺寸小、低 成本及高重複製造性的優點,使其不論在電子工業或通訊 系統上均佔有很重要的地位。而目前習知用於製作表面聲 波渡波器之壓電基板1 ’多為一表面設有表面指狀電極2, (interdigital transducers: IDT)(如第一圖所示), 另一面(即背面)則不加以處理,遂保持平整。而此種基 板裝置,固然可正常發揮其壓電效應,但於抑制塊體波1 仍有改進的空間。為改進此項缺點,於美國專利號第 5708402號中揭露了在表面聲波裝置中壓電基板之背面施 以切割或磨切的製作加工方式形成粗糙面丨丨,(如第二^ 所示),以達成抑制塊體波的目地。 惟,上述先前專利之壓電基板背面加工法存在有加工 不易與實際實施上所面臨的缺失,因該基板厚度不大,欲 施行侧向切割之難度十分地高,尤其要切成不規則之粗料 面,更要控制其深度,實是難上加難;另,該粗糙面以ς 割或磨切方式加工,不易徹底使該粗縫面切割成均勻的粗536868 _ + Case No.91111fl22_ Revised Year, Month, and Day V. Description of the Invention (1) The present invention is a method for processing a piezoelectric substrate (piezoeiectric substrate) of a surface acoustic wave (Surface Acoustic Wave: SAW) device, especially a surface acoustic wave element. A piezoelectric substrate made of piezoelectric materials is used in the device, and a surface finger electrode is designed on the piezoelectric substrate to perform signal processing. The special processing method of the present invention is used for the piezoelectric substrate of the device. Effectively reduce the influence of the bulk wave generated by the surface acoustic wave excitation of the surface finger electrode on the frequency response of the design element. In the early days, surface acoustic wave elements were first used in radars as pulse compression filters for spectrum analysis. At the same time, their applications were also seen in various fields. Today, due to the advantages of high performance, small size, low cost, and high reproducibility, surface acoustic wave components make them important in both the electronics industry and communication systems. Currently, the conventional piezoelectric substrate 1 used to make a surface acoustic wave wave transformer is generally provided with surface finger electrodes 2 (interdigital transducers: IDT) on one surface (as shown in the first figure), and the other surface (that is, the back surface). It is left untreated, and is kept flat. While such a substrate device can normally exert its piezoelectric effect, there is still room for improvement in suppressing bulk wave 1. In order to improve this shortcoming, it is disclosed in US Patent No. 5708402 that a rough surface is formed by cutting or grinding on the back surface of a piezoelectric substrate in a surface acoustic wave device, as shown in the second figure. In order to achieve the purpose of suppressing block waves. However, the above-mentioned method of processing the back surface of piezoelectric substrates has some disadvantages such as difficulty in processing and practical implementation. Because the thickness of the substrate is not large, it is very difficult to perform side cutting, especially to cut into irregular It is more difficult to control the depth of the rough surface. In addition, the rough surface is processed by cutting or grinding, which makes it difficult to completely cut the rough surface into a uniform rough surface.
第4頁 536868Page 4 536868
晶圓全面保有一定 再者,由於該壓電 壓電基板背面的切 面指狀電極損壤, 大缺點。 之粗糙規則性,乃使 基板必需先製作表面 割加工,因此極容易 甚至使其斷裂,造成 糖面,即未使壓電 其功能大打折扣; 指狀電極後再施行 在切割時,將其表 良率大為降低之重 子 上的各缺失,本發明提供一種表面聲波裝置之 壓$基板加工方法,使提升下列功效之目的: 1 · S電基板的加工,以較溫和之喷砂加工之方式形成粗糙 面’不會對該壓電基板造成損壞。 2·以喷砂加厚的方式對壓電基板加工,容易控制厚度。 3·以喷砂形成的粗糙度,較易加工成均勻的粗糙面。 ^ $使本發明所達成之上述目的及優點所應用之技術手 段’茲配合簡單圖式,並列舉較佳實施例說明如后。 具體貫施例 本發明之壓電基板的加工方法可適用於數種表面聲波 ,以表面聲波濾波器為例(請參照第三圖A、第三圖B ),該表面聲波裝置a由一壓電基板丄與其表面丨丨之一 入電極、一組輸出電極所組成,其中壓電基板1之表 以光學顯影技術或網版印刷技術製作表面指狀電極2 入指狀電極21及輸出指狀電極22電路圖案,而由該電 案之密度及構件組成之設計變化,搭配指裝電 波觸發/接收裝置(如反射器等)後,俾能產電生才不同之 長P的操作頻率為其應用,同時,在該壓電基板1之背 以適當粗糙度之背面噴砂處理,以造成一適當程度之 表面’俾能有效地抑制該輪入指狀電極2丨所激發出之The wafer is fully maintained. Furthermore, the finger electrodes on the cut surface of the piezoelectric piezoelectric substrate are damaged, which is a big disadvantage. The rough regularity is that the substrate must be cut on the surface first, so it is very easy to even break it, causing sugar surface, that is, the function of the piezoelectricity is not greatly reduced; the finger electrode is used to cut the surface after cutting. The yield rate is greatly reduced for each of the defects on the baryon. The present invention provides a method for processing a substrate of a surface acoustic wave device to improve the following effects: 1 · S electrical substrate processing, a more gentle sandblasting method The formation of a roughened surface will not cause damage to the piezoelectric substrate. 2. The piezo substrate is processed by sandblasting and thickening, which makes it easy to control the thickness. 3. The roughness formed by sand blasting is easier to be processed into a uniform rough surface. ^ The technical means for applying the above-mentioned objects and advantages achieved by the present invention 'are combined with simple drawings, and the preferred embodiments are described later. Specific implementation examples The method for processing a piezoelectric substrate of the present invention can be applied to several types of surface acoustic waves. A surface acoustic wave filter is taken as an example (please refer to FIG. 3A and FIG. 3B). The electric substrate is composed of an input electrode and a set of output electrodes on its surface. The surface of the piezoelectric substrate 1 is produced by optical development technology or screen printing technology. The surface finger electrode 2 is provided with the finger electrode 21 and the output finger. The circuit pattern of the electrode 22, and the design change of the density and component composition of the electric case, combined with the installation of a radio wave trigger / receiving device (such as a reflector, etc.), the operating frequency of the long P that is different from the electricity generation is At the same time, at the same time, the back of the piezoelectric substrate 1 is sandblasted on the back with an appropriate roughness to create a proper degree of surface, which can effectively suppress the excitation of the wheel-in finger electrode 2 丨
ηπι ^ 7 ' 536868ηπι ^ 7 '536868
_案號 91111Q22 五、發明說明(3) 塊體波,以改善其帶通頻帶之鏈波響應及帶拒頻帶之^。 抑制(如第四圖所示)。 又,前述之背面喷砂處理1 2粗糙面之壓電基板,其表 面之指狀電極2之型態之不同,可提供不同的頻率,亦可& 與壓電基板背面產生相加的效果,對於改善其帶通頻帶< 鏈波響應及帶拒頻帶之信號抑制有正面的效果,如該表面 指狀電極或結合其反射器可為:分割指狀電極b ( gp 1 i卜 Finger IDT)(如第五圖A所示)、可控電極寬度之指狀電 極c(Electrode Width Controlled IDT)(如第五圖b戶斤 示)、短路結構之反射器d(Structure of Short Reflectors)(如第五圖C所示)或開路結構之反射器e (Structure of 〇pen Reflectors)(如第五圖 D所示)之 型態者。 續請參照第六圖所示,上述之壓電基板所作之背面粗 糙喷砂加工面的粗糙曲線上,截取一段測量長度L,並以 該測量長度L内粗糙深之中心線為X軸,取中心線之垂直線 為y軸,則粗糙曲線用y二f(x)表示之,以中心線之X軸為基 準將下方曲線反摺,然後計算中心線上方經反摺後之全部 曲線所涵蓋面積,再以測量長度L除之,所得數值以# m為 單位中心線,平均粗糙度為[^,該Ra的數學表示式為_Case No. 91111Q22 V. Description of the invention (3) Block wave to improve the chain wave response of its bandpass band and the rejection band ^. Suppression (as shown in Figure 4). In addition, the above-mentioned blasted 12-sided piezoelectric substrate with a rough surface has different types of finger electrodes 2 on the surface, which can provide different frequencies, and can also produce an additive effect with the back surface of the piezoelectric substrate. , Has a positive effect on improving its bandpass frequency band < chain wave response and band rejection frequency band signal suppression, such as the surface finger electrode or its reflector can be: split finger electrode b (gp 1 i 卜 Finger IDT ) (As shown in the fifth figure A), the finger electrode c (Electrode Width Controlled IDT) (as shown in the fifth picture b), the short-structure reflector d (Structure of Short Reflectors) ( As shown in the fifth figure C) or an open circuit structure e (Structure of 〇pen Reflectors) (as shown in the fifth figure D). Continuing, please refer to the sixth figure. On the rough curve of the rough sandblasted back surface of the above-mentioned piezoelectric substrate, a section of measurement length L is taken, and the center line of the rough depth within the measurement length L is taken as the X axis. The vertical line of the centerline is the y-axis, then the rough curve is represented by y = f (x), and the lower curve is reverse-folded based on the X-axis of the centerline, and then all the curves covered by the reverse-folding above the centerline are calculated. The area is then divided by the measured length L. The resulting value is centerline with # m as the unit and the average roughness is [^. The mathematical expression of Ra is
L 其R a值在0 · 8 // in至1 · 9 // in之間者為較佳實施例’其功效 之增益比較可由第七圖(圖中壓電基板厚度為350 um情形L The value of R a between 0 · 8 // in and 1 · 9 // in is the preferred embodiment. The comparison of the gain of its effect can be seen in the seventh graph (the thickness of the piezoelectric substrate is 350 um)
536868536868
案號 91111Q22 五、發明說明(4) 下,水平軸為頻率、垂直軸為插入損失,此為背切 GC# 1 0 0 0為一般背面無喷砂處理之壓電基板)及第八 X 中壓電基板厚為50〇Um情形時,水平軸為頻率、垂直 = 插入損失,Ra為平均粗糙度,GC#1〇〇〇為 理 之壓電基板)示出。 處理 由士可知,本發明於表面聲波裝置元件中,對該 基板之月面施以喷砂加工,除可提高施工良率與效 更易於控制該粗糙面之粗糙程度,也對整 詈、 ’ 改善其帶通頻帶之鏈波響應及帶拒頻帶之信 質濾波波型,1此技術於申請前尚未公開,實U :: 發明專利之申請要#,爰依法提起發明專利之申請已,、備 雖然本發明以一較佳實施例揭露如上,麸盆】 限定本發明,任何熟習此項技藝者, 齙卜用以 神和範圍内,當可作各種更動盥 在不脫離本务明之精 所規乾,財發明之保護範圍 ?:月 範圍所界定者。 j π ^的俊附之申睛專利Case No. 91111Q22 5. In the description of the invention (4), the horizontal axis is the frequency and the vertical axis is the insertion loss. This is the back-cut GC # 1 0 0 0 is a piezoelectric substrate without sandblasting on the general back) and the eighth X When the thickness of the piezoelectric substrate is 50 Um, the horizontal axis is frequency, vertical = insertion loss, Ra is average roughness, and GC # 1000 is a rational piezoelectric substrate). It can be known from the treatment that the present invention applies sandblasting to the lunar surface of the substrate in the surface acoustic wave device element. In addition to improving the construction yield and efficiency, it is easier to control the roughness of the rough surface. Improve the chain wave response of its band-pass frequency band and the quality filter waveband with rejection frequency band.1 This technology has not been published before the application. The actual U: :: invention patent application is #. The application for an invention patent has been filed according to law, Although the present invention is disclosed in a preferred embodiment as above, the bran is limited to the present invention. Anyone skilled in the art can use it within the scope of God and the scope, and can make various changes without departing from the essence of this matter. Regulations, the scope of protection of property inventions? : Month Defined by the range. J π ^ Jun Fuzhi's patent application
536868 _案號911Π922_年月日__^__ 圖式簡單說明 【圖式簡單說明】 第一圖係習知表面聲波裝置中之壓電基板及其表面指狀電 極剖面不意圖。 第二圖係採用背切(磨切)方式加工壓電基板底面之剖面 示意圖。 第三圖A係本發明之表面聲波裝置中,壓電基板及其表面 指狀電極剖面示意圖。 第三圖B係本發明之表面聲波裝置中,壓電基板及其表面 指狀電極、反射器剖面示意圖。 第四圖係本發明之壓電基板上之表面指狀電極型式較佳實 施例a。 第五圖A係本發明之表面聲波裝置中表面為分割指狀電極 型態實施例。 第五圖B係本發明之表面聲波裝置中表面為可控電極寬度 之指狀電極型態實施例。 第五圖C係本發明之表面聲波裝置中表面為短路結構之反 射器型態實施例。 第五圖D係本發明之表面聲波裝置中表面為開路結構之反 射器型態實施例。 第六圖係本發明之壓電基板底部加工面中心線平均粗糙度 表示圖。 第七圖係習知之壓電基板背面平整及不同深度的背切加工 <頰譜響應特性比較示意圖。 第八圖係本發明之壓電基板背面不同粗糙度噴砂及背面平 頻譜響應特性比較示意圖。536868 _Case No. 911Π922_ Year Month Day __ ^ __ Brief Description of the Drawings [Simplified Illustration of the Drawings] The first diagram is a cross section of the piezoelectric substrate and the surface finger electrodes in the conventional surface acoustic wave device. The second figure is a schematic cross-sectional view of the bottom surface of the piezoelectric substrate processed by back cutting (grinding). The third figure A is a schematic cross-sectional view of a piezoelectric substrate and finger electrodes on its surface in the surface acoustic wave device of the present invention. The third figure B is a schematic cross-sectional view of a piezoelectric substrate and finger electrodes and reflectors on the surface of the surface acoustic wave device of the present invention. The fourth figure is a preferred embodiment a of the surface finger electrode type on the piezoelectric substrate of the present invention. The fifth figure A is an embodiment of the surface acoustic wave device of the present invention in which the surface is a segmented finger electrode. The fifth figure B is an example of a finger electrode type in which the surface of the surface acoustic wave device of the present invention is a controllable electrode width. The fifth figure C is an embodiment of a reflector in which the surface of the surface acoustic wave device of the present invention has a short-circuit structure. The fifth figure D is an embodiment of a reflector in which the surface of the surface acoustic wave device of the present invention has an open circuit structure. The sixth figure is a graph showing the center line average roughness of the processed surface of the bottom of the piezoelectric substrate of the present invention. The seventh figure is a conventional schematic diagram of a piezoelectric substrate having a flat back surface and backcut processing at different depths. The eighth figure is a comparison diagram of the sandblasting and flat spectrum response characteristics of the back surface of the piezoelectric substrate with different roughnesses.
536868 _案號91111922_年月日 修正 圖式簡單說明 【習知技術所用圖式標號說明】 1 .壓電基板 11 ’ .粗糖面 2 表面指狀電極 本發明技術所用圖式標號說明: a. 本案較佳實施例 b、 c、d、e ·其他較佳實施例 P.波長 R a.中心線平均粗糙度為 L.測量長度 1. 壓電基板 11.表面 1 2.背面喷砂處理 2. 表面指狀電極 2 1.輸入指狀電極 2 2.輸出指狀電極 3. 反射器 4. 分割指狀電極 5. 可控電極寬度之指狀電極 6 .短路結構之反射器 7.開路結構之反射器536868 _Case No. 91119922_ Simple description of the revised version of the year [Description of the symbols used in the conventional technology] 1. Piezoelectric substrate 11 '. Coarse sugar surface 2 Surface finger electrode Description of the symbols used in the technology of the present invention: a. The preferred embodiments b, c, d, and e of this case · Other preferred embodiments P. Wavelength R a. Average roughness of the center line is L. Measurement length 1. Piezoelectric substrate 11. Surface 1 2. Backside blasting treatment 2 Surface finger electrode 2 1. Input finger electrode 2 2. Output finger electrode 3. Reflector 4. Split finger electrode 5. Finger electrode with controllable electrode width 6. Reflector with short-circuit structure 7. Open circuit structure Reflector
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW91111922A TW536868B (en) | 2002-05-31 | 2002-05-31 | Piezoelectric substrate working method of surface acoustic device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW91111922A TW536868B (en) | 2002-05-31 | 2002-05-31 | Piezoelectric substrate working method of surface acoustic device |
Publications (1)
Publication Number | Publication Date |
---|---|
TW536868B true TW536868B (en) | 2003-06-11 |
Family
ID=29268342
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW91111922A TW536868B (en) | 2002-05-31 | 2002-05-31 | Piezoelectric substrate working method of surface acoustic device |
Country Status (1)
Country | Link |
---|---|
TW (1) | TW536868B (en) |
-
2002
- 2002-05-31 TW TW91111922A patent/TW536868B/en not_active IP Right Cessation
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TW425758B (en) | Surface acoustic wave device | |
GB1491896A (en) | Acoustic bulk mode suppressor | |
WO2011007690A1 (en) | Surface acoustic wave device | |
CN110999076A (en) | SAW device with spurious mode signal suppressed | |
GB1594339A (en) | Elastic surface wave device | |
CN102549923A (en) | Surface acoustic wave device | |
US6545388B2 (en) | Surface acoustic wave device and method of producing the same | |
JPH0583067A (en) | Surface acoustic wave element | |
JPH09223943A (en) | Surface acoustic wave device | |
DE112007002113B4 (en) | Boundary acoustic wave device | |
KR20210141345A (en) | Composite substrate for surface acoustic wave device and manufacturing method thereof | |
TW536868B (en) | Piezoelectric substrate working method of surface acoustic device | |
JP2024001367A (en) | Converter structure for generation source suppression in saw filter device | |
CN113206651A (en) | Lamb wave resonator with high electromechanical coupling coefficient and preparation method thereof | |
JP2007295504A (en) | Surface acoustic-wave substrate and acoustic-wave substrate using ultra-low speed thin-film, and surface acoustic-wave function element and acoustic-wave function element using the substrate | |
JPH1168496A (en) | Structure of surface acoustic wave device and its manufacture | |
JPS5994910A (en) | Frequency fine adjusting method | |
CN109462384A (en) | A kind of SAW filter and production method | |
CN115001438B (en) | Structure of longitudinal leakage surface acoustic wave resonator and filter | |
CN220067386U (en) | Bulk acoustic wave resonator and filter | |
JPH036113A (en) | Surface acoustic wave device | |
JPH01233907A (en) | Surface acoustic wave device | |
JPS5864815A (en) | Surface acoustic wave element | |
JP3975924B2 (en) | Surface wave device and manufacturing method thereof | |
JP2001102898A (en) | Surface acoustic wave device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
GD4A | Issue of patent certificate for granted invention patent | ||
MM4A | Annulment or lapse of patent due to non-payment of fees |