TW522255B - Micro-mirror positioning device - Google Patents

Micro-mirror positioning device Download PDF

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Publication number
TW522255B
TW522255B TW90108048A TW90108048A TW522255B TW 522255 B TW522255 B TW 522255B TW 90108048 A TW90108048 A TW 90108048A TW 90108048 A TW90108048 A TW 90108048A TW 522255 B TW522255 B TW 522255B
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Taiwan
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lens
micro
positioning device
scope
unit
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TW90108048A
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Chinese (zh)
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Cheng-Tang Pan
Shin-Chou Chen
Gwo-Bin Lee
Hsien-Min Yang
Chen-Sho Shey
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Ind Tech Res Inst
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Publication of TW522255B publication Critical patent/TW522255B/en

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Abstract

A micro mirror positioning device includes a stationary vertical element, a stationary horizontal element and an interference eliminator. The stationary horizontal element holds micro mirrors in place during transportation for avoiding vibration and collision. The stationary vertical element accurately orientates the micro mirrors in the vertical position. The interference eliminator assures that the micro mirrors are free from the interference caused by the operating magnetic field of other micro mirrors in the micro mirror array, or external magnetic field, thereby preventing the magnetic field from interfering the overall operation of the micro mirror array.

Description

522255 修正 -1S 90108048 五、發明說明α) 發明領域: 本發明係有關於-種微鏡片定 ϋ微鏡ί作精準垂直定位,且可提供微鏡片免干擾之Γ 月匕,使微鏡片在微鏡片陣列操作過程中免於磁場之干擾, 又提七、水平疋位功旎,可固定微鏡片或微鏡片陣列之所有 微鏡片,使微鏡片在攜帶及運送過程中避免震動、碰撞造 成微鏡片移位或損壞,故本發明可提供微鏡片或微鏡片陣 列精準定位及·免除干擾之功能,並可提高微鏡片或微鏡 陣列移動或攜帶之可靠度。 發明背景: 近年來高科技產業在各領域均有長足之進步,其中微 光通訊與微機電二領域之發展,亦為快速;其中應用沉積522255 Modification -1S 90108048 V. Description of the invention α) Field of the invention: The present invention relates to a kind of micro-lens fixed micro-mirror for precise vertical positioning, and can provide the micro-lens without interference. The lens array is free from the interference of magnetic field during the operation of the lens array. Besides, the horizontal and horizontal positioning functions can be used to fix all the micro lenses of the micro lens or the micro lens array, so that the micro lenses can avoid vibration and collision during the carrying and transportation of the micro lenses. Displacement or damage, so the present invention can provide the function of micro-lens or micro-lens array accurate positioning and avoid interference, and can improve the reliability of micro-lens or micro-lens array movement or carrying. Background of the Invention: In recent years, the high-tech industry has made great progress in various fields. Among them, the development of micro-optical communication and micro-electromechanical fields is also rapid. Among them, application deposition

(deposit)、體蝕刻(bulk microiachining)、面蝕刻、 (surface micro —machining)等黃光微影製程,已生產製 造出許多過去技術無法製成之微物件、微元件,此類微物 件 4元件’可應用於微機電領域及其他高科技領域。 與此同時,光通訊領域中之微光通訊技術亦進展迅速,其 中微光通訊系統中需要大量微型、高速、高可靠度之光開 關’此光開關可依據各種應用需要改變光路方向,而前^ 之黃光微影製程技術,正可適用於生產符合微型、高速、 高可靠度等要求之微物件,因此有些研究機構已從事相關 研究,並發表研究成果,其中有兩篇論文(第一篇論文為# Yang Yi and Chang Liu, "Parallel assembly 〇f(deposit), bulk etching (bulk microiachining), surface etching, (surface micro-machining) and other yellow light lithography processes, has produced many micro-objects, micro-devices that can not be made in the past technology, such micro-objects 4 elements' may Used in micro-electromechanical fields and other high-tech fields. At the same time, the micro-optical communication technology in the field of optical communication is also progressing rapidly. Among them, a large number of miniature, high-speed, high-reliability optical switches are required in the micro-optical communication system. This optical switch can change the direction of the optical path according to the needs of various applications. ^ The yellow light lithography process technology is applicable to the production of micro-objects that meet the requirements of micro, high speed, high reliability, etc. Therefore, some research institutions have engaged in related research and published research results, including two papers (the first paper For # Yang Yi and Chang Liu, " Parallel assembly 〇f

第5頁 522255 一案號 90108048, 五、發明說明(2) hinged microstructures using magnetic actuation” Solid-state sensor and actuator 1998,第二篇論文為 Hiroshi : Tosh i yosh i and Hiroyuki Fu j i ta, n An electrostatically operated torsion mirror for optical switching device” Transducers 1995)與兩件 吴國專利(U S P a t · N o · 6,0 9 4,2 9 3 及 U S P a t. N o · 5,9 6 0, 1 3 2 )均提出以前述微影製程製作之微光開關。 以上資料·所述之微光開關,係分別提出以靜電或磁場 方式插作可擺動微鏡片,令其自反射狀態擺動至非反射狀 態後停止,或使其自反射狀態擺動至非反射狀態後停止, 其中非反射狀態係允許入徑光線通過,沿原光路繼續前 進;而反射狀態則以全反射改變入徑光線之原光路。惟以 上資料’無論其自反射狀態擺動至非反射狀態,抑或自非 反射狀態擺動至反射狀態,其微鏡片常受擺動慣性影響, 產生擺動超過反射狀態定點或非反射狀態定點之缺失,造 成微鏡片無法精準定位,進出導致微鏡片反射後微光光路 無法精準定位之缺失。 發明概述: 請爹閱圖一與圖二所示,其係為習用技術微鏡片擺動 裝置之立體不意圖與正視圖。該習用技術微鏡片擺動裝置 1〇,了 ί係於一具相當平整度之矽基板1K或玻璃基板) 上,以育光微影製程技術製作一微鏡片擺動裝置丨〇,該微 鏡片擺動裝置10包括一第一固定端12a、一第二固定端Page 5 522255 case number 90108048, V. Description of the invention (2) hinged microstructures using magnetic actuation "Solid-state sensor and actuator 1998, the second paper is Hiroshi: Tosh i yosh i and Hiroyuki Fu ji ta, n An electrostatically operated torsion mirror for optical switching device ”Transducers 1995) and two Wu Guo patents (USP at · N o · 6,0 9 4,2 9 3 and USP a t. No · 5, 9 6 0, 1 3 2 ) Have proposed micro-optic switches manufactured by the aforementioned lithographic process. The above-mentioned micro-optical switches are proposed to be inserted into a swingable micro-lens by electrostatic or magnetic fields to make it stop from the self-reflecting state to the non-reflecting state, or after the self-reflecting state to the non-reflecting state. Stop, where the non-reflective state allows the incoming light to pass through and continue along the original light path; while the reflective state changes the original light path of the incoming light with total reflection. However, the above information 'whether it oscillates from non-reflective state to non-reflective state, or from non-reflective state to reflective state, its microlenses are often affected by the inertia of the swing, resulting in a swing exceeding the fixed point of the reflective state or the absence of the fixed point of the non-reflective state, causing micro The lens cannot be accurately positioned, and the lack of accurate positioning of the low-light optical path after reflection by the micro-lens results in the lack. Summary of the Invention: Please refer to FIG. 1 and FIG. 2, which are three-dimensional intention and front view of a conventional micro-lens swing device. The conventional microlens swinging device 10 is attached to a silicon substrate (K substrate or glass substrate) with a relatively flat surface, and a microlens swinging device is manufactured by using the Yuguang lithography process technology. The microlens swinging device 10 10 includes a first fixed end 12a and a second fixed end

第6頁 522255 --—羞靈―90108048 Θ ^年月 _____ _日 修正 五、發明說明(3) ―― ~~~^一— 12b’ 进轉元件121、一反射鏡片14、一擋塊15、一微線 圈 16。 、、 其中該第一固定端i 2a、第二固定端12b、扭轉元件 1 2 1、反射鏡片1 4與擋塊丨5係藉前述黃光微影製程一體成 型者’其材料通常係具適當.彈性之多晶矽 (P〇iy-siiiC0n);該第一固定端12a、第二固定端12b之間 係相隔一適當距離,並分別固定於矽基板丨丨之上,該扭轉 元件1 2 1係以水平懸吊方式,設於該二固定端1 2^、1 2b之 間’该反射鏡片1 4係為該扭轉元件1 21中央部份於水平方 向之延長。該反射鏡片14之上更設有一軟磁合金141,該 軟磁合金(perm-alloy),其係以濺鍍(sputtering)或電鍍 (electroplating)製程,固定於該反射鏡片14之上方;一 反射區域142,其係為該反射鏡片14上一具高度平整之反 射區域’可提供入射光經反射區域142反射後,改變光路 之功能。該擋塊1 5係可為至少一方形擋塊或一長條矩形, 其係固定於該反射鏡片丨4之下方,其高度恰可提供該反射 鏡片1 4之水平靜止位置。該微線圈1 β係設於該石夕基板11下 方,可提供推動該反射鏡片1 4擺動之磁性斥力。 請蒼閱圖三、圖四與圖五所示,其係習用技術微鏡片 擺動裝置10之擺動機制示意圖,其中圖三為該微鏡片擺動 裝置1 0位於水平位置,且該微線圈丨6剛通電時之示意圖; 圖四為該微鏡片擺動裝置10由水平方向垂直方向擺動過程 中之示意圖;圖五係該微鏡片擺動裝置1〇可能因擺動時產 生之慣性而擺動超過垂直位置定點之示意圖。Page 6 522255 --- Shame ― 90108048 Θ ^ year month _____ _ day correction V. Description of the invention (3) —— ~~~ ^ a — 12b 'advancing element 121, a reflecting lens 14, a stop 15. A microcoil 16. The first fixed end i 2a, the second fixed end 12 b, the torsion element 1 2 1, the reflective lens 14, and the stopper 5 are integrally formed by the aforementioned yellow light lithography process, and their materials are usually suitable for elasticity. Polycrystalline silicon (Poiy-siiiC0n); the first fixed end 12a and the second fixed end 12b are separated by an appropriate distance and fixed on the silicon substrate, respectively, and the torsion element 1 2 1 is horizontal The suspension method is provided between the two fixed ends 12 2 and 12 b. The reflection lens 14 is an extension of the central portion of the torsion element 121 in the horizontal direction. A soft magnetic alloy 141 is further provided on the reflective lens 14. The soft magnetic alloy (perm-alloy) is fixed above the reflective lens 14 by a sputtering or electroplating process; a reflective region 142 It is a highly flat reflection area 'on the reflection lens 14 which can provide the function of changing the light path after the incident light is reflected by the reflection area 142. The stopper 15 can be at least one square stopper or a long rectangle, which is fixed below the reflective lens 4 and its height can provide the horizontal rest position of the reflective lens 14. The micro-coil 1 β is provided under the Shixi substrate 11 and can provide a magnetic repulsive force for pushing the reflection lens 14 to swing. Please refer to Figures 3, 4, and 5, which are schematic diagrams of the swing mechanism of the conventional micro-lens swinging device 10. Figure 3 shows the micro-lens swinging device 10 in a horizontal position, and the micro-coil 6 Schematic diagram when power is applied; Figure 4 is a schematic diagram of the micro-lens swinging device 10 swinging from the horizontal direction to the vertical direction; Figure 5 is a schematic diagram of the micro-lens swinging device 10 swinging beyond the fixed point of the vertical position due to inertia generated during swinging .

522255 ---- 案號9〇1〇別缒_________—日 修不 五、發明說明(4) 請參閱圖三,設於該微鏡片擺動裝置1 〇下方之微線圈 16通電後,產生一磁通密度(flux density) 161,同時該 軟磁合金1 4 1受該磁通密度1 6 1感應,產生一磁化 (magnetization) 163 ’該石兹通密度161之N極與該磁化163 之Ν極之間,產生一斥力164,此斥力164係將該反射鏡片 丄4丨〇』上泰離梦基权i i之^一子F用刀,入板據前述,該扭轉元 件121係連接該微鏡片14與該二固定端12a、12b,且係以 黃光微影製程.一體成型,具適當彈性之材料,故當該軟磁 合金141受該磁通密度161感應產生磁化163,該磁化163之 N極與磁通密度1 61之N極相斥時,該扭轉元件丨21可以其所 具適當彈性扭曲,供該反射鏡片1 4由水平位置向垂直位置 擺動。請注意當反射鏡片1 4位於水平位置時,該二N極間 之距離最近,該反射鏡片14所受之斥力164亦最大。 凊參閱圖四’當反射鏡片14受斥力164,自水平位置 向垂直位置擺動時,該二N極間距離逐漸加大,該反射鏡 片1 4所受之斥力1 6 4逐漸減低,而該扭轉元件1 21則持續提 供適當彈性扭曲,供該反射鏡片由水平位置繼續向垂直值 置擺動。 ~ 請參閱圖五,當該反射鏡片14擺動至接近垂直位置 時,該二N極間距離進一步加大,該反射鏡片1 4所受之斥 力164亦大幅降低,當該反射鏡片擺動至一垂直位置17之 瞬間,該斥力164無法提供該反射鏡片14繼續擺動超過垂 直位置之作用力;惟該反射鏡片1 4擺動時產生之慣性,史 成反射鏡片1 4擺動至垂直位置後仍無法停止於該垂直位^522255 ---- Case No. 9〇1〇 Don't 缒 _________— Everyday, 5. Description of the invention (4) Please refer to Figure 3. After the micro-coil 16 provided under the micro-lens swinging device 10 is powered on, a The magnetic flux density is 161. At the same time, the soft magnetic alloy 1 4 1 is induced by the magnetic flux density 1 6 1 to generate a magnetization 163 'The N pole of the stone flux density 161 and the N pole of the magnetization 163 Between them, a repulsive force 164 is generated. The repulsive force 164 is a reflection of the reflecting lens 丄 4 丨 〇 ″ on the slab of the right of the dream ii. Use a knife to enter the board. According to the foregoing, the twisting element 121 is connected to the microlens. 14 and the two fixed ends 12a, 12b, and are formed by a yellow light lithography process. They are integrally formed and have a suitable elastic material. Therefore, when the soft magnetic alloy 141 is induced by the magnetic flux density 161 to generate magnetization 163, the N pole of the magnetization 163 and When the N poles of the magnetic flux density 1 61 repel each other, the torsion element 21 can be appropriately elastically twisted for the reflecting lens 14 to swing from the horizontal position to the vertical position. Please note that when the reflecting lens 14 is in a horizontal position, the distance between the two N poles is the shortest, and the repulsive force 164 of the reflecting lens 14 is also the largest.凊 Refer to FIG. 4 'When the repulsive force 164 of the reflecting lens 14 swings from the horizontal position to the vertical position, the distance between the two N poles gradually increases, and the repulsive force 1 6 4 of the reflecting lens 14 gradually decreases, and the twist Element 1 21 continues to provide an appropriate elastic twist for the reflective lens to continue to swing from a horizontal position to a vertical value. ~ Please refer to FIG. 5, when the reflecting lens 14 swings to a near vertical position, the distance between the two N poles is further increased, and the repulsive force 164 experienced by the reflecting lens 14 is also greatly reduced. At the moment of position 17, the repulsive force 164 cannot provide the force that the reflecting lens 14 continues to swing beyond the vertical position; but the inertia generated when the reflecting lens 14 swings, Shi Cheng's reflecting lens 14 cannot stop at the vertical position after swinging The vertical bit ^

522255 一迎一生(孓月 X 日 修正 五、發明說明(5) «——一《 —一·—一一一一 1 7 i以致往往超過其預定之垂直位置1 7後才停止於一靜止 位置1 8 ’因而無法達成垂直定位之需求。當反射鏡片^ 4靜 止於靜止位置18時’該斥力164係可防止該反射鏡片14向 下擺動回水平位置。 u ,請茶閱圖六所示,其係為習用技術一微鏡片擺動裝置 i υ位於靜止位置1 8之示意圖,當微線圈丨6關閉,原磁場消 失後’該反射鏡片14之軟磁合金141不再受斥力164作用, 反射鏡片1 4即由於前述扭轉元件丨2 1之彈性回復力,自該 靜止位置1 8向水平位置擺動,請參閱圖七所示,其係為習 用技術微鏡片擺動裝置1〇擺動至水平位置之示意圖。同樣 道理’該反射鏡片1 4即可能因擺動產生之慣性而擺動超過 其水平位置,因該反射鏡片1 4設有一擋塊1 5,故讓反射鏡 片1 4可停止於該擋塊1 5所設之水平位置。 請參閱圖七,當該微鏡片擺動裝置1 〇需移動或攜帶 時,或當至少一微鏡片擺動裝置所組成之一微鏡片陣列擺 動裝置需移動或攜帶時,該擋塊1 5即無法提供該微鏡片1 〇 或一微鏡片陣列固定於該水平位置之機制與功能。 請參閱圖八,其係為習用技術一微鏡片陣列2 0之示意 圖,該微鏡片陣列2 0係由十六個微鏡片2 11、21 2、21 3、 214 ^ 221 > 222 > 223 、 224 > 231 ^ 232 ^ 233 ^ 234 > 241 、 242、2 43及244所組成,其中四微鏡片213、221、232、 244係處於垂直狀態,故自四光源20Α、20Β、20C、20D發 射之入射光分別由該四微鏡片213、221、232、244反射, 並分別由位於下方之四感測單元2 0 Ε、2 0 F、2 0 G、2 0 Η所接522255 Yi Ying Yi Yi (Amendment on the Xth day of each month V. Invention description (5) «—— 一 《— 一 · — 一一 一一 1 1 7 i so that it often exceeds its predetermined vertical position 17 before stopping in a stationary position 1 8 'Therefore, the requirement of vertical positioning cannot be achieved. When the reflecting lens ^ 4 is stationary at the static position 18', the repulsive force 164 prevents the reflecting lens 14 from swinging downward to the horizontal position. U, please see Figure 6 for tea, It is a schematic diagram of a conventional micro-lens swinging device i υ located at a static position 18 when the micro-coil 丨 6 is closed and the original magnetic field disappears. 4 is due to the elastic restoring force of the aforementioned torsion element 丨 2 1, swinging from the rest position 18 to the horizontal position, please refer to FIG. 7, which is a schematic diagram of the conventional micro lens swinging device 10 swinging to the horizontal position. Similarly, the reflecting lens 14 may swing beyond its horizontal position due to the inertia generated by the swing. Because the reflecting lens 14 is provided with a stop 15, the reflecting lens 14 can be stopped at the stop 15 Set it See Fig. 7. When the micro-lens swing device 10 needs to be moved or carried, or when one of the micro-lens array swing devices composed of at least one micro-lens swing device needs to be moved or carried, the stopper 1 5 That is, the mechanism and function of fixing the microlens 10 or a microlens array in the horizontal position cannot be provided. Please refer to FIG. 8, which is a schematic diagram of a microlens array 20 of conventional technology. The microlens array 20 is composed of Sixteen microlenses 2 11, 21 2, 21 3, 214 ^ 221 > 222 > 223, 224 > 231 ^ 232 ^ 233 ^ 234 > 241, 242, 2 43 and 244, of which four micro The lenses 213, 221, 232, and 244 are in the vertical state, so the incident light emitted from the four light sources 20A, 20B, 20C, and 20D is reflected by the four microlenses 213, 221, 232, and 244, respectively, and is respectively Sensing unit 2 0 Ε, 2 0 F, 2 0 G, 2 0

第9頁 522255 一――一一案號90108048 七年〇-月匕日 絛正 五、發明說明(6) ~~ 收。其餘十二微鏡片 211、212、214、222、223、224、 231、233、234、241、242、243係設定於水平狀態,此 時,前述位於該垂直位置凹微鏡片213、221、2 32、244下 方微線圈之磁場係處於啟動狀態,故可能影響處於水平位 置之十二微鏡片 211、212、214、222、223、224、231、 233、234 '241、242、243,其中某些鏡片因附近磁場影 響,無法靜止於水平位置而擺動,將可能攔截圖中任何一 入射光或反射.光,造成習用技術微鏡片陣列2 〇操作失常。 該十二微鏡片 211、212、214、222、223、224、231、 233、234、241、242、243將受磁場影響,本說明書於發 明之詳細說明中將揭露一免干擾機構,以解決習用技術微 鏡片1 0或微鏡片陣列2 0之磁場干擾問題。設定於水平位置 之十一微鏡片 211、212、214、222、223、224、231、 233、234、241、242、243中,某些鏡片可能受附近磁場 影響,無法固定於水平位置而擺動,且可能攔截圖中任何 一入射光或反射光,而造成習用技術微鏡片陣列2 〇操作失 常。 〃 發明簡單說明·· 本發明之目的’係在於提供一種可將微鏡片或微鏡片 陣列定位於垂直位置之微鏡片定位裝置。 本發明之另一目的,係在於提供一種可將微鏡片或微 鏡片陣列定位於水平位置之微鏡片定位裝置。Page 9 522255 One-one case number 90108048 Seven years 0-month dagger 绦 Zheng V. Description of the invention (6) ~ ~ Close. The remaining twelve microlenses 211, 212, 214, 222, 223, 224, 231, 233, 234, 241, 242, and 243 are set in a horizontal state. At this time, the aforementioned concave microlenses 213, 221, 2 are located in the vertical position. The magnetic field of the micro-coils below 32 and 244 is activated, so it may affect the twelve micro-lenses 211, 212, 214, 222, 223, 224, 231, 233, 234 '241, 242, 243 in a horizontal position. Due to the influence of nearby magnetic fields, these lenses cannot swing at a horizontal position and will swing. They may intercept any incident light or reflected light in the picture, causing the abnormal operation of conventional micro-lens arrays. The twelve microlenses 211, 212, 214, 222, 223, 224, 231, 233, 234, 241, 242, 243 will be affected by the magnetic field. In this detailed description of the invention, an interference-free mechanism will be disclosed to solve the problem. The magnetic field interference problem of conventional microlens 10 or microlens array 20. Eleven micro-lenses 211, 212, 214, 222, 223, 224, 231, 233, 234, 241, 242, 243 set in the horizontal position, some lenses may be affected by nearby magnetic fields and cannot be fixed in the horizontal position to swing , And may intercept any incident light or reflected light in the picture, resulting in abnormal operation of the conventional technology micro lens array 20.简单 Brief description of the invention ... The object of the present invention is to provide a micro lens positioning device capable of positioning a micro lens or a micro lens array in a vertical position. Another object of the present invention is to provide a micro lens positioning device capable of positioning a micro lens or a micro lens array in a horizontal position.

522255 一~一― ☆车丨 z月 6 曰 五、發明說明(7) 之微鏡片定位裝置。 較佳實施例之詳細說明: ,熟悉本技術者 不用於限制本發 將於下文中說明本發明,請參考附圖 須瞭解下文中的說明僅係作為例證用,而 明。 為了解決上述習知技術中的問題,本發明提出一種 新的微鏡片定.位裝置3,包括一垂直定位單元4〇,一水平 定位單元50與一免干擾單元6〇,可分別解決習用技術微鏡 片1 〇或微鏡片陣列20之垂直定位問題,水平定位問題與 優問題。 凊芩閱圖九與圖十所示,其係為本發明微鏡片定位裝 置3第一較佳實際例之立體示意圖與正視圖。該第一較佳 貫際例中’本發明垂直定位單元4 〇,係於一具相當平整度 之石夕基板41 (或玻璃基板)上,以黃光微影製程技術製作 一微鏡片垂直定位裝置40,該微鏡片垂直定位單元4〇包括 一第一固定端42a、一第二固定端4 2b、一第一扭轉元件 421、一第二扭轉元件422、一定位鏡片43、一反射鏡片 4 4、一擋塊4 5與一微線圈4 6。 其中該二固定端42a、42b,該第一扭轉元件421、第 二扭轉元件422、該定位鏡片43、該反射鏡片44、該擋塊 45係藉前述黃光微影製程一體成型者,其材料通常係具適 當彈性之多晶石夕(p〇ly-silicon);該二固定端42a、42b之 間係相隔一適當距離,並分別固定於矽基板4丨之上,該第522255 One ~ One—— ☆ Car 丨 6th of May, 5. Description of invention (7) The micro lens positioning device. Detailed description of the preferred embodiment: Those skilled in the art are not used to limit the present invention. The invention will be described below. Please refer to the drawings. It must be understood that the description below is for illustration only. In order to solve the above-mentioned problems in the conventional technology, the present invention proposes a new micro lens positioning device 3, which includes a vertical positioning unit 40, a horizontal positioning unit 50 and an interference-free unit 60, which can solve the conventional technology respectively. The vertical positioning problem, the horizontal positioning problem and the optimization problem of the microlens 10 or the microlens array 20. Figures 9 and 10 show the three-dimensional schematic and front views of the first preferred practical example of the microlens positioning device 3 of the present invention. In the first preferred embodiment, the vertical positioning unit 40 of the present invention is attached to a Shixi substrate 41 (or a glass substrate) having a relatively flatness, and a micro-lens vertical positioning device 40 is manufactured by using a yellow light lithography process technology. The micro-lens vertical positioning unit 40 includes a first fixed end 42a, a second fixed end 42b, a first torsion element 421, a second torsion element 422, a positioning lens 43, and a reflection lens 4 4. A stop 45 and a micro-coil 46. The two fixed ends 42a, 42b, the first torsion element 421, the second torsion element 422, the positioning lens 43, the reflection lens 44, and the stopper 45 are integrally formed by the aforementioned yellow light lithography process, and the materials are usually Polysilicon with appropriate elasticity; the two fixed ends 42a, 42b are separated by an appropriate distance, and are respectively fixed on the silicon substrate 4 丨, the first

522255 ———— 案號90108048 {夕年ί>月“曰 m WU»^M-IIWMI>HWr— B—mifl _1|_|_丨咖 ___|__· ·1ΓΠΙ_ΙΙ _ 1|丨__ |__ I 丨__丨_ _.广 ΠΙ 五、發明說明(8) 一杻轉元件421、第二扭轉元件422係相互平行、且相隔一 適當距離、以水平懸吊方式分別設於該第一固定端4 2 a與 遠弟一固定端4 2 b之間;該定位鏡片4 3係為第一扭轉元件 42 1中央部份於水平方向之廷長;該反射鏡片44係為第二 扭轉元件422中央部份於水平方向之延長,且該定位鏡片 4 3與該反射鏡片4 4係分別設於第一扭轉元件4 2 1、第二扭 轉元件422兩側。該定位鏡片43之上與該反射鏡片44之上 更分別設有一第一軟磁合金(permalloy) 431與一第二軟 磁合金(permalloy) 441,該第一軟磁合金431與該第二軟 磁合金441係以錢鍍(sputtering)或電鍍 (electroplating)製程,分別固定於該定位鏡片43與該反 射鏡片44之上;該反射鏡片44又設有一反射區域442,其 係為該反射鏡片44上一具高度平整之反射區域,可提供入 射光經反射區域442反射後,改變光路之功能。該擔塊45 係固定於石夕基板41之上之一長條矩形或至少一方形擋塊, 其咼度恰可提供該反射鏡片4 4之水平靜止位置。該微線圈 46係設於該矽基板41下方,可提供推動談反射鏡片44擺動 之磁性斥力。522255 ———— Case No. 90108048 {Xi Nianl > Month "m WU» ^ M-IIWMI &Ht; HWr— B—mifl _1 | _ | _ 丨 咖啡 ___ | __ · · 1ΓΠΙ_ΙΙ _ 1 | 丨 __ | __ I 丨 __ 丨 _ _. ΠΠΙ 5. Description of the invention (8) A turning element 421 and a second torsion element 422 are parallel to each other and spaced at an appropriate distance from each other, and are respectively arranged on the first side in a horizontal suspension manner. Between the fixed end 4 2 a and the remote one fixed end 4 2 b; the positioning lens 4 3 is the length of the central portion of the first twisting element 42 1 in the horizontal direction; the reflecting lens 44 is the second twisting element The central portion of 422 is extended in the horizontal direction, and the positioning lens 43 and the reflecting lens 44 are respectively disposed on both sides of the first torsion element 41 and the second torsion element 422. The positioning lens 43 and the A first soft magnetic alloy (Permalloy) 431 and a second soft magnetic alloy (Permalloy) 441 are respectively disposed on the reflective lens 44. The first soft magnetic alloy 431 and the second soft magnetic alloy 441 are sputtered or plated with money. (electroplating) process, fixed on the positioning lens 43 and the reflective lens 44 respectively; the reflective lens 44 is There is a reflection area 442, which is a highly flat reflection area on the reflection lens 44, which can provide the function of changing the optical path after the incident light is reflected by the reflection area 442. The weight 45 is fixed on the stone evening substrate 41 One of the long rectangular or at least one square stopper can provide the horizontal rest position of the reflective lens 44. The micro-coil 46 is disposed below the silicon substrate 41, and can provide a driving force for the reflective lens 44 to swing. Magnetic repulsion.

請參閱圖十一、圖十二與圖十三,其係分別為本發明 垂直定位單元40第一較佳實際例示意圖,其中圖十一為該 垂直定位單元40位於水平位置,且該微線圈46剛通電時之 示意圖;圖十二為該垂直定位單元40由水平方向擺動至垂 直方向過私中之不思圖,圖十二係該垂直定位單元4 〇垂直 定位示意圖。Please refer to FIG. 11, FIG. 12, and FIG. 13, which are schematic diagrams of the first preferred practical example of the vertical positioning unit 40 of the present invention, respectively. FIG. 11 shows the vertical positioning unit 40 in a horizontal position and the microcoil Fig. 12 is a schematic diagram of the vertical positioning unit 40 swinging from the horizontal direction to the vertical direction, and Fig. 12 is a schematic diagram of the vertical positioning unit 40.

第12頁 522255 ——^ ^ L u 修正 五、發明說明(9) 一 ~ ~ — 圖Η 、圖十二與圖十三中,本發明垂直定位單元40 微線圈46產生一磁通密度461,該軟磁合金mi受該磁通密 度461感應’產生一磁化463,該磁通密度461之Ν極與該磁 化4 6 3之Ν極之間’產生一第二斥力443,該第二斥力443係 將5亥反射鏡片4 4向上推離石夕基板41之一作用力,其原理與 圖二、圖四與圖五中,發明背景習用技術應用微線圈丨6與 軟磁合金141感應’產生之一斥力164,推動反射鏡片14之 原理相同;惟.本發明垂直定位單元4〇揭露以一扭轉元件 421、一定位鏡片43與一軟磁合金4 31將反射鏡片44垂直定 位之機制則為習用技術所無。 請參閱圖十一,定位鏡片43軟磁合金4 31受磁通密度 46 1感應’產生一磁化462,該磁通密度461之Ν極與該磁化 46 2之Ν極間,產生一第一斥力433,此斥力係為將該定位 鏡片43向上推離矽基板41之一作用力,該第一斥力433係 可推動该疋位鏡片43由水平方向垂直方向擺動。同時,該 反射鏡片44軟磁合金441受磁通密度461感應,產生一磁化 463 ’該磁通密度461之Ν極與該磁化463之Ν極間,產生前 述第二斥力443,此第二斥力443係為將該反射鏡片44向上 推離矽基板41之一作用力,該第二斥力443係可推動該反 射鏡片44由水平方向垂直方向擺動。請注意當定位鏡片43 位於水平位置時,該磁通密度461之Ν極與該磁化46 2之ν極 間距離最近,該定位鏡片43所受之第一斥力433最大;同 樣道理,該反射鏡片44位於水平位置時,該磁通密度461 之Ν極與該磁化463之Ν極間距離最近,該反射鏡片44所受 522255 -- ———-案號—年(7^月 < 曰 修正 五、發明說明(10) 之第二斥力443亦最大。 請參閱圖十二,當定位鏡片43與反射鏡片44分別受第 一斥力433與第二斥力443,分別自水平位置向垂直位置擺 動時,該磁通密度4 6 1 N極與該磁化4 6 2 N極間之距離及磁请 岔度4 6 1 N極與該磁化4 6 3 N極間之距離同時逐漸加大,故該 疋位鏡片4 3與該反射鏡片4 4分別所受之第一斥力4 3 3與第 一斥力4 4 3同時逐漸減低,而該第一扭轉元件4 2 1與該第-扭轉元件422則持續提供適當彈性扭曲,分別供該定位鏡 片4 3與該反射鏡片4 4由水平位置繼續向垂直位置擺動。惟 定位鏡片43之質量較小,其由水平位置向垂直位置擺動之 速度略快,故定位鏡片43向垂直位置擺動之進程略領先於 反射鏡片4 4,惟此現象是可以由控制扭轉元件4 2 1、4 2 2之 長度比以及控制軟磁合金431、441之厚度來加以控制的, 亦即扭轉元件4 2 1、4 2 2之長度比越短,則扭轉元件擺動的 時間越短’而軟磁合金431、441之厚度越厚,則擺動的時 間也越短’所以定位鏡片4 3之進程略領先反射鏡片4 4之情 況足可以自由控制的。再者,若定位鏡片43和反射鏡片44 的條件並不相等的情況下,順時與逆時方向的力矩、角加 速度、轉動慣量並不會相等。一般來說反射鏡片受外加磁 場作用的平衡狀態是在90。(因為外加磁場461和磁化463 平行)’但是因為慣性作用’所以反射鏡片4 4會超出9 〇。 些,這對於應用於需要鬲速切換的鏡面是個大問題,所 以經由本案發明所設計的定位鏡片,則可補償因慣性所造 成的角度誤差。Page 12 522255 —— ^ ^ Lu Modification V. Explanation of the invention (9) I ~ ~ — In Figure Η, Figure 12 and Figure 13, the vertical positioning unit 40 microcoil 46 of the present invention generates a magnetic flux density 461, The soft magnetic alloy mi is induced by the magnetic flux density 461 to 'generate a magnetization 463. Between the N pole of the magnetic flux density 461 and the N pole of the magnetized magnet 4 63', a second repulsive force 443 is generated. The second repulsive force 443 is Pushing the 5H reflection lens 4 4 upward from one of the forces of the Shixi substrate 41, the principle is the same as in Figure 2, Figure 4, and Figure 5. Background of the Invention Conventional technology uses micro-coil 6 and soft magnetic alloy 141. The repulsive force 164 drives the reflective lens 14 in the same principle; however, the vertical positioning unit 40 of the present invention discloses a mechanism for vertically positioning the reflective lens 44 with a torsion element 421, a positioning lens 43 and a soft magnetic alloy 4 31. no. Referring to FIG. 11, the positioning lens 43 soft magnetic alloy 4 31 is induced by the magnetic flux density 46 1 to generate a magnetization 462, and a first repulsive force 433 is generated between the N pole of the magnetic flux density 461 and the N pole of the magnetization 46 2. This repulsive force is a force that pushes the positioning lens 43 upward from the silicon substrate 41. The first repulsive force 433 can push the positioning lens 43 to swing from the horizontal direction to the vertical direction. At the same time, the reflecting lens 44 soft magnetic alloy 441 is induced by the magnetic flux density 461 to generate a magnetization 463 'Between the N pole of the magnetic flux density 461 and the N pole of the magnetization 463, the aforementioned second repulsive force 443 and the second repulsive force 443 are generated. It is a force for pushing the reflecting lens 44 upward from the silicon substrate 41, and the second repulsive force 443 can push the reflecting lens 44 to swing from the horizontal direction to the vertical direction. Please note that when the positioning lens 43 is in the horizontal position, the distance between the N pole of the magnetic flux density 461 and the ν pole of the magnetization 46 2 is the shortest, and the first repulsive force 433 that the positioning lens 43 receives is the same; the same reason, the reflective lens When 44 is in the horizontal position, the distance between the N pole of the magnetic flux density 461 and the N pole of the magnetized 463 is the shortest. The reflection lens 44 is subjected to 522255--------Case No.-year (July < 5. Description of the invention (10) The second repulsive force 443 is also the largest. Please refer to FIG. 12, when the positioning lens 43 and the reflective lens 44 are respectively subjected to the first repulsive force 433 and the second repulsive force 443 and swing from the horizontal position to the vertical position, respectively. The distance between the magnetic flux density 4 6 1 N pole and the magnetized 4 6 2 N pole and the magnetic bias 4 6 1 N pole and the magnetized 4 6 3 N pole gradually increase at the same time, so the 疋The first repulsive force 4 3 3 and the first repulsive force 4 4 3 respectively received by the bit lens 4 3 and the reflective lens 4 4 are gradually reduced, and the first torsion element 4 2 1 and the first torsion element 422 are continuously provided. Appropriate elastic twist for the positioning lens 4 3 and the reflecting lens 44 to continue from the horizontal position respectively Vertical position swing. However, the quality of the positioning lens 43 is small, and its speed of swinging from the horizontal position to the vertical position is slightly faster, so the process of swinging the positioning lens 43 to the vertical position is slightly ahead of the reflective lens 4 4; however, this phenomenon can be caused by The length ratio of the torsion elements 4 2 1 and 4 2 2 and the thickness of the soft magnetic alloys 431 and 441 are controlled to control. That is, the shorter the length ratio of the torsion elements 4 2 1 and 4 2 2 is, the longer the time of the torsion element to swing. The shorter it is, and the thicker the thickness of the soft magnetic alloys 431 and 441 is, the shorter the swing time is. Therefore, the process of positioning the lens 4 3 slightly ahead of the reflective lens 4 4 can be controlled freely. Furthermore, if the positioning lens 43 In the case where the conditions of the reflecting lens 44 are not equal, the moment, angular acceleration, and moment of inertia in the clockwise and counterclockwise directions will not be equal. Generally speaking, the equilibrium state of the reflecting lens by the external magnetic field is 90. (because The applied magnetic field 461 is parallel to the magnetization 463) 'But because of the inertia effect', the reflective lens 44 will exceed 9 0. These are a big problem for mirrors that need to be switched at high speed. In this case the invention by positioning a lens designed may be made, to compensate for the inertia of the angle error.

522255 一-f。年 ft月心曰 五、發明說明(11)522255 a-f. Year ft Yuexin Yue V. Description of Invention (11)

接近垂直位置時,該磁通密度461N極與該磁化462N極間之 距離進一步加大,該定位鏡片43所受之第一斥力433亦大 幅降低’富該定位鏡片4 3擺動至一垂直位置1 7之瞬間,該 第一斥力4 3 3無法提供該定位鏡片4 3繼續擺動超過垂直值 置之作用力;惟該定位鏡片43擺動時產生之慣性,造成該 定位鏡片4 3先到達並略超越垂直位置4 7右方才停止;當擺 動進程略落後之反射鏡片44擺動至垂直位置之瞬間,該第 一斥力443無法提供該反射鏡片44繼續擺動超過垂直位置 之作用力;惟該反射鏡片44擺動時產生之慣性,造成反射 鏡片44擺動至垂直位置無法停止於垂直位置47,而超過垂 直位置47後方才停止之缺失,則可藉該定位鏡片43先到達 並略超越垂直位置4 7相對方向之平衡慣性相抵鎖,故該定 位鏡片43與該反射鏡片44二者相接觸並靜止於該垂直位置 47 ’進而達成垂直定位之需求。惟定位鏡片u與反射鏡片 44之相對質量、所受之相對磁矩、第一扭轉元件421與第 二扭轉元件422之相對軸彳f與彈性扭曲能力等,皆為影響 達成垂直定位之因素,故一垂直定位單元4〇需經諸多材料 之選擇、實驗數據之取得與應用等努力方可獲得最佳結 果;而垂直定位之確認可藉複數個不同方向之雷射光束於 定點發射,經垂直定位反射鏡片44之反射,並以分別複數 個感测裝置於預定位置感測反射光束之方式驗證。When approaching the vertical position, the distance between the magnetic flux density 461N pole and the magnetized 462N pole is further increased, and the first repulsive force 433 experienced by the positioning lens 43 is also greatly reduced. 'Fu the positioning lens 4 3 swings to a vertical position 1 At the moment of 7, the first repulsive force 4 3 3 could not provide the force of the positioning lens 4 3 to continue to swing beyond the vertical value; but the inertia generated when the positioning lens 43 swings, causing the positioning lens 4 3 to reach first and slightly surpass it. The vertical position 4 7 is only stopped to the right; when the reflecting lens 44 that is slightly behind in the swinging process swings to the vertical position, the first repulsive force 443 cannot provide the force that the reflective lens 44 continues to swing beyond the vertical position; however, the reflective lens 44 swings Due to the inertia caused by the time, the reflection lens 44 can't stop in the vertical position 47 when it swings to the vertical position, and it can't stop after it exceeds the vertical position 47. You can use the positioning lens 43 to reach and slightly exceed the vertical position 4 7 The balance inertia is interlocked, so the positioning lens 43 and the reflecting lens 44 are in contact with each other and are stationary at the vertical position 47 ′ to achieve the vertical positioning. begging. However, the relative mass of the positioning lens u and the reflective lens 44, the relative magnetic moment received, the relative axis 彳 f of the first torsion element 421 and the second torsion element 422, and the elastic torsion ability are all factors that affect the vertical positioning. Therefore, a vertical positioning unit 40 requires the selection of many materials, the acquisition and application of experimental data to obtain the best results; and the confirmation of vertical positioning can be emitted by a plurality of laser beams in different directions at a fixed point, and the vertical The reflection of the reflective lens 44 is positioned and verified by a plurality of sensing devices respectively sensing the reflected light beam at predetermined positions.

522255 ,*^ 80108048 年(2-月“曰 修正 ··麻I—·τ·^κ___ι·_ wie_mi 丨____mmntmmefmnmMumimmnmrmmmsmmm-irwivmaiae 五、發明說明(12) 規蒼閱圖十四與圖十五所7F ’其係分別為本發明水斗· 定位單元5 0第一較佳實際例導電狀態與非導電狀態之示意 圖,其中該水平定位單元50包括一第一電極52a、一第二 電極52b、一第一懸臂521、一第二懸臂522、一連接懸臂 523、一卡榫53。該微鏡片水平定位單元50更包括有一突 出於矽基板41、與該卡榫53相對應區域之一凸板47。該第 —電極5 2 a、第二電極5 2 b、第一懸臂5 2 1、第二懸臂5 2 2、 連接懸臂523與卡榫53係藉前述黃光微影製程一體成型 者,其材料通常係具適當導電性之銅合金或金合金;該第 一電極52a與該第二電極52b之間係相隔一適當距離,並分 別固定於石夕基板41之上,該第一懸臂521與該第二懸臂522 相互平行或約略平行,而第二懸臂522較第_懸臂52ι為 粗’ 一者之苐 知1係以水平懸吊方式,分別固定設於該第 一電極52a與該第二電極52b,且二者之第二端亦係以水平 懸吊方式,分別與該連接懸臂5 23之兩端連接,故該水平 定位單元50於第一電極52a與該第二電極52b之間,以水平 方式,形成一懸吊之導電迴路。522255, * ^ 80108048 (February, "Amendment ·· 麻 I— · τ · ^ κ ___ ι · _ wie_mi 丨 ____ mmntmmefmnmMumimmnmrmmmsmmm-irwivmaiae V. Description of the invention (12) Figure 14 of the regulations and Figure 15 of the fifteenth chapter 'It is a schematic diagram of the conductive state and the non-conductive state of the first preferred practical example of the water bucket and positioning unit 50 of the present invention, wherein the horizontal positioning unit 50 includes a first electrode 52a, a second electrode 52b, and a first A cantilever 521, a second cantilever 522, a connecting cantilever 523, and a tenon 53. The micro-lens horizontal positioning unit 50 further includes a convex plate 47 protruding from the silicon substrate 41 and a region corresponding to the tenon 53. The first electrode 5 2 a, the second electrode 5 2 b, the first cantilever 5 2 1, the second cantilever 5 2 2, the connecting cantilever 523 and the tenon 53 are integrally formed by the aforementioned yellow light lithography process, and the material is usually Copper alloy or gold alloy with proper conductivity; the first electrode 52a and the second electrode 52b are separated by an appropriate distance, and are respectively fixed on the stone substrate 41, the first cantilever 521 and the second Cantilever 522 is parallel or approximately parallel to each other, while the second cantilever 522 is thicker than the first _ cantilever 52 ι. One of the two is a horizontal suspension method, which is fixed to the first electrode 52a and the second electrode 52b, respectively, and the second end of the two is also horizontally suspended. In a hanging manner, the two ends of the connecting cantilever 5 23 are respectively connected, so the horizontal positioning unit 50 forms a suspended conductive circuit in a horizontal manner between the first electrode 52 a and the second electrode 52 b.

第16頁 522255 一月 6 s 修正 五、發明說明(13) 當定位鏡片43定位於圖十三所示之垂直定位狀態,系 統控制軟體發出指令’切斷微線圈4 6與電源之電性連接, 原磁場消失後,該定位鏡片43第一軟磁合金431與該反射 鏡片44第二軟磁合金441皆停止感應,分別不再受第一斥 力433舆第二斥力443作用,定位鏡片43與反射鏡片44即由 於雨述第一扭轉元件421與第二扭轉元件422之彈性回復 力’分別自該垂直靜止垂直位置分別向水平位置擺動,反 射鏡片44即可.藉其設有之擋塊45,阻止因擺動產生之慣性 而擺動超過其水平位置,使該反射鏡片44靜止於水平位 置,而該水平定位單元5〇於第一電極52a與該第二電極52b 之間形成之水平懸吊之導電迴路則處於電性導通狀態,該 導電迴路之第一懸臂521、連接懸臂523與第二懸臂522具 f相同,膨脹係數之同一金屬材料組成、處於電性導通狀 悲’而第二懸臂522較第一懸臂521為粗,其橫截面較大、 ,阻^低、電阻產生之熱量較低、溫度較低,因熱膨脹於 以產生之線性延長較少,形成第一懸臂5 2 1因線性延 ^較多/向前拉連接懸臂523而第二懸臂522因線性延長較 ’一向後拉連接懸臂5 2 3之相對作用力,故該水平定位單 出^如圖十五所示第一懸臂521與第二懸臂522靠近二 -一 i f向右彎曲之現象’請注意該連接懸臂523因遠較 弟懸臂521及第二懸臂522為短,其熱膨脹線性延長長度Page 16 522255 January 6 s Correction V. Description of the invention (13) When the positioning lens 43 is positioned in the vertical positioning state shown in Fig. 13, the system control software issues a command to 'cut off the microcoil 46 from being electrically connected to the power supply. After the disappearance of the original magnetic field, the first soft magnetic alloy 431 of the positioning lens 43 and the second soft magnetic alloy 441 of the reflecting lens 44 stop sensing, and are no longer affected by the first repulsive force 433 and the second repulsive force 443, respectively. The positioning lens 43 and the reflective lens 44 is due to the elastic restoring force of the first torsion element 421 and the second torsion element 422, respectively, from the vertical rest vertical position to the horizontal position respectively, and the reflecting lens 44 can be used. The stopper 45 provided by it can prevent Due to the inertia generated by the swing, the swing exceeds its horizontal position, so that the reflective lens 44 is stationary at the horizontal position, and the horizontal positioning unit 50 forms a horizontally suspended conductive loop formed between the first electrode 52a and the second electrode 52b. The first cantilever 521, the connecting cantilever 523 and the second cantilever 522 of the conductive circuit have the same f, and the same expansion coefficient of the same metal material is in the electrical conduction state. The second cantilever 522 is thicker than the first cantilever 521, and its cross section is larger, lower resistance, lower heat generated by resistance, lower temperature, due to less linear extension due to thermal expansion. The first cantilever 5 2 1 is more linearly extended / pulled forward to connect the cantilever 523 and the second cantilever 522 is more linearly extended than the relative force of the cantilever 5 2 3 to be pulled backward, so the horizontal positioning is single. As shown in FIG. 15, the first cantilever 521 and the second cantilever 522 are bent close to the two-to-one to the right. 'Please note that the connecting cantilever 523 is much shorter than the younger cantilever 521 and the second cantilever 522, and its thermal expansion linearly extends the length.

-522255 一年(h “ 日 修正 五、發明說明(14) ~~-一一_~一_« =較第一懸臂5 2 1或第二懸臂5 2 2之線性延長長度為短,相 對於一懸臂521或第二懸臂522之相對作用力,其影響可從 略。 ^畜钱水平定位單元50處於導電狀態,且該反射鏡片44 月f 士於水平位置’此時,系統控制軟體發出指令,切斷該 水平懸=之導電迴路與電源之連接,造成該迴路處於非導 f,狀悲’請參閱圖十五所示,該水平定位單元5 〇之第一 懸^521、連接懸臂523與第二懸臂522皆因電阻消失、溫 ^降低j熱膨脹線性延長縮短,逐漸由導電狀態下原向右 幫’曲之第一懸臂521、連接懸臂5 23與第二懸臂522恢復至 ,十五所示之非導電狀態下不再向右彎曲之正常形狀,此 時’該卡榫53即向左移動至與其相對應之凸板47上方,且 恰可與該凸板47接觸,防止該反射鏡片44移動,而此時該 水平定位單元5 〇係處於非導通電狀態,故可提供微鏡片精 準定位裝置3在攜帶及運送過程中,避免震動、碰撞造成 之微鏡片移位或損壞。 本發明微鏡片定位裝置3揭露之免干擾單元60,可解 決前述圖八之微鏡片陣列2 0中,習用技術所存在之微鏡片 因附近磁場影響,無法靜止於水平位置而擺動,且可能攔 截圖八中之入射光或反射光,而造成習用技術微鏡片陣列 2 0操作失常之缺失。請參閱圖十六所示,其係分別為本發 明免干擾單元6 〇第一較佳實際例之正視圖,其中該免干擾 單元60包括設於反射鏡片44之一第一導電薄膜61與設於矽 基板41之一第二導電薄膜62,該第一導電薄膜61與該第二-522255 One year (h "Day correction V. Invention description (14) ~~ -one one _ ~ one_« = shorter than the linear extension length of the first cantilever 5 2 1 or the second cantilever 5 2 2 The relative force of a cantilever 521 or a second cantilever 522 can be ignored. ^ The horizontal positioning unit 50 of the animal money is in a conductive state, and the reflective lens 44f is in the horizontal position. At this time, the system control software issues an instruction. , Cut off the connection between the conductive circuit of the horizontal suspension = and the power supply, causing the circuit to be non-conductive f, like this, please refer to Figure 15, the first suspension 521 of the horizontal positioning unit 50, the connection cantilever 523 Both the second cantilever 522 and the second cantilever 522 are extended linearly and shortened due to the disappearance of the resistance, the decrease in temperature, and the thermal expansion. They gradually recover from the first cantilever 521 in the conductive state to the right, the cantilever 5 23 and the second cantilever 522. The normal shape that is no longer bent to the right in the non-conductive state shown, at this time, 'the tenon 53 is moved to the left above the corresponding convex plate 47 and can just contact the convex plate 47 to prevent the reflection The lens 44 moves, and the horizontal positioning unit 50 is at this time. It can provide the micro-lens precise positioning device 3 during the carrying and transportation process, so as to avoid the displacement or damage of the micro-lens caused by vibration and collision. The interference-free unit 60 disclosed by the micro-lens positioning device 3 of the present invention can solve the aforementioned problem. In the micro lens array 20 of FIG. 8, the micro lenses existing in the conventional technology cannot swing at a horizontal position due to the influence of the nearby magnetic field, and may intercept the incident light or reflected light in FIG. 8, resulting in the conventional technology micro lens array. 2 The lack of abnormal operation. Please refer to FIG. 16, which are front views of the interference-free unit 60 according to the present invention. The interference-free unit 60 includes one of the reflection lenses 44. The first conductive film 61 and a second conductive film 62 provided on the silicon substrate 41. The first conductive film 61 and the second

第18頁 522255 __案號90108048 年P月6 日 修正_一 五、發明說明(15) 導電薄膜62係以濺锻(sputtering)或電鍍 (electroplating)製程,分別固定於該反射鏡片44與該石夕 基板41之上。當該反射鏡片44處於水平狀態時,該導電薄 膜61係位於該反射鏡片44下方,且當該反射鏡片44處於水 平狀態時,該第二導電薄膜62係設於該矽基板41與該第一 導電薄膜61相對應區域之上方。其實施方式為,當該反射 鏡片44位於水平位置且欲避免其他運作中微線圈之磁場干 擾,可將干擾單元60之第一導電薄膜61與第二導電薄膜62 分別與一第一電源63及一第二電源64電性連接,由第一電 源63與第二電源64提供相反之電荷,本實施例中,第一導 電薄膜61與第二導電薄膜62分別呈正電與負電狀態,可提 供該反射鏡片44免於其他微鏡片下方啟動狀態微線圈之磁 場影響,而靜止於水平位置所需之靜電吸引力。若圖八所 示處於水平狀態之十二微鏡片211、212、214、222、 22 3、224、231、233、234、241、242、243,分別設置有 一免干擾單元60,則可免於於該垂直位置四微鏡片213、 221、232、244下方啟動狀態下微線圈之磁場影響,可靜 止於水平位置。同樣,若四微鏡片213、221、232、244分 別設置有一免干擾單元6 0,則當該四微鏡片2 1 3、2 2 1、 232、244處於水平狀態時,亦可免於其他微鏡片下方啟動 狀態中之微線圈之磁場影響,可靜止於水平位置。 請參閱圖十七,其係為本發明垂直定位單元7 〇第二較 佳實際例之立體示意圖,其中該垂直定位單元7 〇,係於一 具相當平整度之一矽基板71 (或玻璃基板)上,以黃光微Page 18 522255 __Case No. 90108048 Rev. P_15. Description of the Invention (15) The conductive film 62 is fixed to the reflective lens 44 and the reflective lens 44 by a sputtering or electroplating process, respectively. Shi Xi substrate 41. When the reflective lens 44 is in a horizontal state, the conductive film 61 is located below the reflective lens 44, and when the reflective lens 44 is in a horizontal state, the second conductive film 62 is disposed on the silicon substrate 41 and the first Above the corresponding region of the conductive film 61. In an implementation manner, when the reflective lens 44 is in a horizontal position and the magnetic field interference of other microcoils is to be avoided, the first conductive film 61 and the second conductive film 62 of the interference unit 60 may be respectively connected to a first power source 63 and A second power source 64 is electrically connected and the opposite charges are provided by the first power source 63 and the second power source 64. In this embodiment, the first conductive film 61 and the second conductive film 62 are in a positive state and a negative state, respectively. The reflective lens 44 is protected from the magnetic field of the micro-coils in the activated state under the other micro-lenses, and the electrostatic attraction required to stand still in a horizontal position. If the twelve micro-lenses 211, 212, 214, 222, 22 3, 224, 231, 233, 234, 241, 242, and 243 in the horizontal state shown in FIG. 8 are respectively provided with an interference-free unit 60, it can be avoided. In this vertical position, the magnetic field of the micro-coils under the activation state of the four micro-lenses 213, 221, 232, and 244 can be left at a horizontal position. Similarly, if the four micro-lenses 213, 221, 232, and 244 are respectively provided with an interference-free unit 60, then when the four micro-lenses 2 1 3, 2 2 1, 232, and 244 are in a horizontal state, other micro-lenses can also be exempted. The magnetic field of the microcoil in the activated state under the lens can be left in a horizontal position. Please refer to FIG. 17, which is a schematic perspective view of a second preferred practical example of the vertical positioning unit 70 of the present invention. The vertical positioning unit 70 is a silicon substrate 71 (or a glass substrate) having a relatively flatness. ) On to Huang Guangwei

522255 修正 曰522255 amendment

號 901f)8(UR 五、發明說明(16) 衫製私技術製作一微鏡片垂直定位農置7 〇,該垂直定位單 元70包括一第一定位單元73、一第二定位單元74、一反射 單元75、一微線圈76與一擋塊77。 該第一定位單元73係包括一第一固定端73a、一第一 扭轉兀件731、一第一定位鏡片734與一第一側邊735 ;該 第二定位單元74係包括一第二固定端74a、一第二扭轉元 件741/ 一第二定位鏡片744與一第二侧邊745 ;該反射單 元75係包括一第三固定端75a、一第四固定端75b、一第三 扭轉兀件751與一反射鏡片754 ;該微線圈76係設於該矽基 板71下方’可提供推動該反射鏡片44擺動之磁性斥力;該 擋塊77係固定於該反射鏡片754之一長條矩形或至少一方 形擔塊’其高度恰可提供該反射鏡片754之水平靜止位 置。 一該第一定位單元73中,該第一固定端73a、第一扭轉 元件731第一定位鏡片734係藉前述黃光微影製程一體成 型者’其材料通常係具適當彈性之多晶矽 (poly-s^ilicon);該第一固定端73a係固定於矽基板71之 ^二該第一扭轉元件731係以水平懸吊方式設於該第一固 疋‘73a,該第一疋位鏡片734係為該第一扭轉元件γη中 央=份於水平方向之延長;該第一定位鏡片734之上更設 有一第一軟磁合金(permaU〇y) 732,該第一軟磁合金 係以濺鍍(Sputtering)或電鍍(electroplating)製程,固 =於第一定位鏡片73之上;該第一側邊735係與該第一扭 轉元件731相垂直。No. 901f) 8 (UR V. Description of the invention (16) Manufacturing of a micro lens for vertical positioning of a farmhouse 70. The vertical positioning unit 70 includes a first positioning unit 73, a second positioning unit 74, and a reflection. Unit 75, a micro-coil 76 and a stopper 77. The first positioning unit 73 includes a first fixed end 73a, a first torsion element 731, a first positioning lens 734 and a first side 735; The second positioning unit 74 includes a second fixed end 74a, a second torsion element 741 / a second positioning lens 744, and a second side 745; the reflection unit 75 includes a third fixed end 75a, a The fourth fixed end 75b, a third torsion element 751, and a reflective lens 754; the micro-coil 76 is provided below the silicon substrate 71, and can provide a magnetic repulsive force for pushing the reflective lens 44 to swing; the stopper 77 is fixed A height of a long rectangular or at least one square weight of the reflection lens 754 can provide the horizontal rest position of the reflection lens 754. In the first positioning unit 73, the first fixed end 73a and the first twist The first positioning lens 734 of the element 731 is based on the aforementioned yellow light lithography The one-piece processer's material is usually poly-silicon with appropriate elasticity; the first fixed end 73a is fixed to the silicon substrate 71; the second torsion element 731 is set in a horizontal suspension manner. At the first fixed lens' 73a, the first position lens 734 is the center of the first torsion element γη = an extension in the horizontal direction; a first soft magnetic alloy (permaU) is further disposed on the first positioning lens 734. 〇y) 732, the first soft magnetic alloy is formed by a sputtering or electroplating process, and is fixed on the first positioning lens 73; the first side 735 is in phase with the first torsion element 731 vertical.

第20頁 522255 屋違―MMQ48 五、發明說明(17) 該第二定位單元74中,該第二固定端74a、第二扭轉 元件741、第二定位鏡片744係藉前述黃光微影製程一體成 型者’其材料通常係具適當彈性之多晶矽 (poly-si Ucon);該第二固定端74a係固定於矽基板71之 上’該第二扭轉元件7 41係以水平懸吊方式設於該第二固 定端74a,且該第二扭轉元件741係與該第一扭轉元件73} 平行;該第二定位鏡片744係為該第二扭轉元件741中央部 份於水平方向.之延長,且該第二定位鏡片744與該第一定 位鏡片7 3 4係设於該第一扭轉元件7 31與第二扭轉元件7 41 之間;該第二定位鏡片744之上更設有一第二軟磁合金 (permalloy) 742,該第二軟磁合金742係以濺鍍 (sputtering)或電鑛(eiectroplating)製程,固定於第二 定位鏡片744之上;該第二侧邊745係與該第二扭轉元件 741相垂直。 該反射單元75中,該第三固定端75a、第四固定端 75b、第三扭轉元件751與反射鏡片754係藉前述黃光微影 製程一體成型者,其材料通常係具適當彈性之多晶;^ (poly-silicon);該第三固定端75a與該第四固定端75b之 間係相隔一適當距離,並分別固定於矽基板71之上,該第 三扭轉元件7 5 1係以水平懸吊方式設於該第三固定端7 5 a與 該第四固定端75b之間,且該第三扭轉元件751係與該第一 扭轉元件7 3 1及該第二扭轉元件7 41相垂直;該反射鏡片 754係為該第三扭轉元件751中央部份於水平方向之延長, 且該反射鏡片754與該第一定位單元7 3及該第二定位單元Page 20 522255 House violation-MMQ48 V. Description of the invention (17) In the second positioning unit 74, the second fixed end 74a, the second torsion element 741, and the second positioning lens 744 are integrally formed by the aforementioned yellow light lithography process. 'The material is usually poly-si Ucon with appropriate elasticity; the second fixed end 74a is fixed on the silicon substrate 71' The second torsion element 7 41 is provided on the second by horizontal suspension The fixed end 74a, and the second torsion element 741 is parallel to the first torsion element 73}; the second positioning lens 744 is an extension of the central portion of the second torsion element 741 in the horizontal direction, and the second The positioning lens 744 and the first positioning lens 7 3 4 are disposed between the first torsion element 7 31 and the second torsion element 7 41. A second soft magnetic alloy (permalloy) is further disposed on the second positioning lens 744. 742, the second soft magnetic alloy 742 is fixed on the second positioning lens 744 by a sputtering or eiectroplating process; the second side 745 is perpendicular to the second torsion element 741. In the reflection unit 75, the third fixed end 75a, the fourth fixed end 75b, the third torsion element 751, and the reflection lens 754 are integrally formed by the aforementioned yellow light lithography process, and the material thereof is usually a polycrystal with appropriate elasticity; ^ (poly-silicon); the third fixed end 75a and the fourth fixed end 75b are separated by an appropriate distance, and are respectively fixed on the silicon substrate 71, and the third torsion element 7 5 1 is suspended horizontally The mode is set between the third fixed end 75a and the fourth fixed end 75b, and the third torsion element 751 is perpendicular to the first torsion element 731 and the second torsion element 741; the The reflection lens 754 is an extension of the central portion of the third torsion element 751 in the horizontal direction, and the reflection lens 754 and the first positioning unit 73 and the second positioning unit

第21頁 522255 a 案號90108048 _—_ill 月A—日 倏正 五、發明說明(18) 74係分別設於該第三扭轉元件75 1相反之兩側;該反射鏡 片754之上更設有一第三軟磁合金(permall〇y)752,該第 三軟磁合金752係以濺锻(sputtering)或電鑛 (electroplating)製程,固定於該反射鏡片754之上,該 反射鏡片7 5 4又設有一反射區域7 5 3,其係為該反射鏡片 7 5 4上一具高度平整之反射區域,可提供入射光經反射區 域754反射後,改變光路之功能。 . 請參閱圖十八與圖十九,其係分別為本發明垂直定位 單元70第二較佳實際例向垂直位置擺動與垂直定位之立體 — 示意圖,其中當啟動該微線圈76後,該第一定位單元73、 φ 該第二定位單元74及該反射鏡片754之擺動原理係與圖十 一、圖十二與圖十三中第一較佳實際例垂直定位單元4〇中 所述之原理相同。請參閱圖十八,當該第一定位鏡片7 3 4 與該第二定位鏡片7 4 4分別由水平位置向垂直位置擺動 時,該第一定位鏡片734與該第二定位鏡片744分別由於質 里較小’由水平位置向垂直位置擺動之速度略快,故該第 一定位鏡片734與該第二定位鏡片7 44向垂直位置擺動之進 程略領先於反射鏡片44。 一 請參閱圖十九,並請參閱圖二十係本發明垂直定位單 元7 0第二較佳實際例垂直定位之正視圖。當該第一定位鏡_ 片734與該第二定位鏡片W4分別因質量小於該反射鏡片 754而分別較該反射鏡片754先擺動至超過垂直位置之約略 · 垂直位置時,由於該第一扭轉元件731與該第二扭轉元件 · 741皆處於水平位置,而該第一侧邊735該第二側邊係Page 21 522255 a Case No. 90108048 ___ill Month A—Sunday 5th, invention description (18) 74 are respectively provided on opposite sides of the third torsion element 75 1; a reflection lens 754 is further provided with a The third soft magnetic alloy (permalloy) 752 is fixed on the reflective lens 754 by a sputtering or electroplating process, and the reflective lens 7 5 4 is further provided with a The reflection area 7 5 3 is a highly flat reflection area on the reflection lens 7 5 4, which can provide the function of changing the light path after the incident light is reflected by the reflection area 754. Please refer to FIG. 18 and FIG. 19, which are three-dimensional schematic diagrams of the vertical positioning unit 70 swinging to the vertical position and the vertical positioning respectively, which are the second preferred practical examples of the present invention. When the micro-coil 76 is activated, the first The positioning principle of a positioning unit 73, φ the second positioning unit 74 and the reflection lens 754 is the same as the principle described in the vertical positioning unit 40 of the first preferred practical example in FIG. 11, FIG. 12, and FIG. the same. Referring to FIG. 18, when the first positioning lens 7 3 4 and the second positioning lens 7 4 4 swing from a horizontal position to a vertical position, respectively, the first positioning lens 734 and the second positioning lens 744 are respectively due to quality. The speed of swinging from the horizontal position to the vertical position is slightly faster, so the process of swinging the first positioning lens 734 and the second positioning lens 7 44 to the vertical position is slightly ahead of the reflection lens 44. First, please refer to FIG. 19, and please refer to FIG. 20, which is a front view of the vertical positioning of the second preferred practical example of the vertical positioning unit 70 of the present invention. When the first positioning lens _ sheet 734 and the second positioning lens W4 are smaller than the reflecting lens 754, respectively, the first positioning lens 734 and the second positioning lens W4 are respectively swung to a position slightly exceeding the vertical position than the reflective lens 754, due to the first torsion element. 731 and the second torsion element · 741 are in a horizontal position, and the first side 735 and the second side are

第22頁 522255 m^9〇l〇8〇48 五、發明說明(19) 與該第二扭轉元件741相垂直,故當該反射鏡片754於稍後 因擺動慣性适成如圖五所示之現象向超過垂直位置擺動 時,該第一定位鏡片734之第一侧邊735與該 ^ 744之第二側邊7d5怜讦提供一卡古仿罟 r弟一 · 754無法超過該垂直V置;垂亩直Λ單,-1該反射鏡片 鏡片754垂直定位。置。支孟直疋位早凡70可將該反射 4 .fli’明芩閱圖二十一及圖二十二,由實驗結果可 :之之寬度愈大’其承受剪應力愈大,而扭轉元 件之長度愈長,其承受之剪應力愈小。 以上所述僅為本發明之較佳實施例,不應 ^而,逯背本發明之精神時,皆應屬本發明之範圍者。 =因士發明於申請前並未曾見於任何公開場 ί要:ί案深具「實用性、新賴性及進步性」之新Ξ專 允撥日”二麦法提出新型專利之申請。祈冑貴審查委員 發$間惠允審查並早賜與專利為禱。 、Page 22 522255 m ^ 9〇〇〇〇〇48. V. Description of the invention (19) is perpendicular to the second torsion element 741, so when the reflecting lens 754 is later adapted to the inertia of the swing as shown in FIG. When the phenomenon swings beyond the vertical position, the first side edge 735 of the first positioning lens 734 and the second side edge 7d5 of the ^ 744 provide a Kagu imitated 754 cannot exceed the vertical V position; The acre is straight, and the reflection lens 754 is positioned vertically. Home. The support of the Meng Zhimao as early as 70 can reflect the reflection 4 .fli 'Ming Figures 21 and 22, from the experimental results can be: the greater the width of the' the greater the shear stress it bears, and the torsional element The longer the length, the smaller the shear stress it bears. The above descriptions are only preferred embodiments of the present invention, and should not fall within the scope of the present invention when they depart from the spirit of the present invention. = Yin Shi's invention has not been seen in any public venue before the application. Important: The case has a "practical, new, and progressive" new patent grant date. Two McFarland filed a new patent application. Pray Your reviewing committee issued a review of $ A Huiyun and granted a patent early.

第23頁 522255 j號 90108048 ——G a 修正 圖式簡單說明 圖示說明: 圖一係習用技術微鏡片擺動裝置1 0之立體示意圖。 圖二係習用技術微鏡片擺動裝置1 0之正視圖。 圖三係習用技術微鏡片擺動裝置1 0位於水平位置之示 意圖。 圖四係習用技衡微鏡片擺動裝置1 〇由水平方向擺動向 垂直方擺動過程之示意圖。 圖五係習用技術微鏡片擺動裝置1 〇擺動至靜止位置1 8 之示意圖。 圖六係習用技術微鏡片擺動裝置1 〇位於靜止位置1 8之 不意圖。 圖七係習用技術微鏡片擺動裝置1 〇擺動至水平位置之 不意圖。 圖八係習用技術一微鏡片陣列2 〇之示意圖。 圖九係本發明微鏡片定位裝置3第一較佳實際例之立 體示意圖。 圖十係本發明微鏡片定位裝置3第一較佳實際例之正 視圖。 圖十一係本發明微鏡片垂直定位單元4〇第一較佳實際 例水平位置示意圖。 、” 圖十二係本發明垂直定位單元40第一較佳實際例由水 平方向向垂直方向擺動過程之示意圖。 —圖十三係本發明垂直定位單元40第一較佳實際例垂直 疋位示意圖。Page 23 522255 j No. 90108048 ——G a Correction Brief description of the diagram Explanation: Figure 1 is a three-dimensional schematic diagram of the conventional microlens swinging device 10. Fig. 2 is a front view of a conventional microlens swinging device 10; Fig. 3 is a schematic view of a conventional microlens swinging device 10 in a horizontal position. FIG. 4 is a schematic diagram of a conventional technology balance micro-lens swinging device 10 swinging from a horizontal direction to a vertical direction. FIG. 5 is a schematic diagram of a conventional microlens swinging device 10 swinging to a rest position 18. FIG. 6 is a schematic view of a conventional technology microlens swinging device 10 located at a stationary position 18. Fig. 7 is a schematic diagram of a conventional microlens swing device 10 that swings to a horizontal position. FIG. 8 is a schematic diagram of a conventional microlens array 20. Fig. 9 is a perspective view of a first preferred practical example of the microlens positioning device 3 of the present invention. Fig. 10 is a front view of a first preferred practical example of the microlens positioning device 3 of the present invention. Fig. 11 is a schematic view showing the horizontal position of the first preferred practical example of the microlens vertical positioning unit 40 of the present invention. Figure 12 is a schematic diagram of the first preferred practical example of the vertical positioning unit 40 of the present invention swinging from the horizontal direction to the vertical direction.-Figure 13 is a schematic diagram of the vertical preferred position of the first preferred practical example of the vertical positioning unit 40 of the present invention. .

第24頁 522255 修正 案號 90108048 圖式簡單說明 圖十四係分別為本發明水平定位單元5 0第一較佳實際 例導電狀態示意圖。 圖十五係本發明水平定位單元5 0第一較佳實際例非導 電狀態不意圖。 圖十六係本發明免干擾單元6 0第一較佳實際例之正視 圖。 圖十七係本發明垂直定位單元7 0第二較佳實際例之立 體示意圖。 圖十八係本發明垂直定位單元7 0第二較佳實際例向垂 直位置擺動之立體示意圖。 圖十九係本發明垂直定位單元7 0第二較佳實際例垂直 定位之立體示意圖。 圖二十係本發明垂直定位單元7 0第二較佳實際例垂直 定位之正視圖。 圖二Η--係本發明扭轉元件之寬度及厚度與最大剪應 力之關係圖。 圖二十二係本發明扭轉元件之長度及厚度與最大剪應 力之關係圖。 參 圖號說明: 1 0 -習用技術微鏡片擺動裝置 1 1 -碎基板 1 2 a -第一固定端 12b -第二固定端 1 2 1 -扭轉元件Page 24 522255 Amendment No. 90108048 Brief description of drawings Figure 14 is a schematic diagram of the conductive state of the 50th first preferred practical example of the horizontal positioning unit of the present invention. Fig. 15 shows the non-conductive state of the first preferred practical example of the horizontal positioning unit 50 of the present invention. Fig. 16 is a front view of the first preferred practical example of the interference-free unit 60 of the present invention. Fig. 17 is a perspective view of a second preferred practical example of the vertical positioning unit 70 of the present invention. Fig. 18 is a schematic perspective view of the second preferred practical example of the vertical positioning unit 70 of the present invention swinging to a vertical position. Fig. 19 is a schematic perspective view of the vertical positioning of the second preferred practical example of the vertical positioning unit 70 of the present invention. Fig. 20 is a front view of the vertical positioning of the second preferred practical example of the vertical positioning unit 70 of the present invention. Fig. 2-is the relationship between the width and thickness of the torsion element of the present invention and the maximum shear stress. Fig. 22 is a graph showing the relationship between the length and thickness of the torsion element of the present invention and the maximum shear stress. Reference Number Description: 1 0-Conventional technology micro lens swinging device 1 1-Broken substrate 1 2 a-First fixed end 12b-Second fixed end 1 2 1-Twisting element

第25頁 522255 _案號 90108048 ❼年 >月石曰 修正_ 圖式簡單說明 1 4 -反射鏡片 1 4 1 -軟磁合金 1 4 2 -反射區域 1 5 -擋塊 1 6 -微線圈 1 6 1 -磁通密度 1 6 3 -磁化 164-斥力 1 7 -垂直位置 1 8 -靜止位置 2 0 -微鏡片陣列 20A、20B、20C、20D-光源 20E、 20F、 20G、 20H-感測單元 213、22卜2 3 2、244-微鏡片(垂直狀態) 21卜 212、 214、 222、 223、 224、 231> 233、 234、 24卜 2 4 2、243-微鏡片(水平狀態) 3 -微鏡片定位裝置 4 0 _垂直定位单元 4 1 -碎基板 42a-第一固定端 42b-第二固定端 421-第一扭轉元件 42 2-第二扭轉元件 4 3 -定位鏡片 4 3 1 -第一軟磁合金Page 25 522255 _Case No. 90108048 Leap Year > Yue Shi Yue Correction _ Simple Description 1 4-Reflective Lens 1 4 1-Soft Magnetic Alloy 1 4 2-Reflective Area 1 5-Stopper 1 6-Micro Coil 1 6 1-magnetic flux density 1 6 3-magnetization 164-repulsion 1 7-vertical position 1 8-rest position 2 0-micro lens array 20A, 20B, 20C, 20D-light source 20E, 20F, 20G, 20H-sensing unit 213 22, 2 3 2, 244-microlenses (vertical state) 21, 212, 214, 222, 223, 224, 231 > 233, 234, 24 2 2 4, 243-microlenses (horizontal state) 3-micro Lens positioning device 4 0 _vertical positioning unit 4 1-broken substrate 42a-first fixed end 42b-second fixed end 421-first twisting element 42 2-second twisting element 4 3-positioning lens 4 3 1-first Soft magnetic alloy

第26頁 522255 案號 90108048 圖式簡單說明 433-第一斥力 44-反射鏡片 44 1 -第二軟磁合金 4 4 2 -反射區域 443-第二斥力 4 5 -擋塊 4 6 _微線圈 5 0 -水平定位單元 4 7 -凸板 52a~*第一電極 52b-第二電極 5 2 1 -第一懸臂 5 2 2-第二懸臂 5 2 3 -連接懸臂 5 3-卡榫 4 3 -定位鏡片 431-第一軟磁合金 44-反射鏡片 44 1 -第二軟磁合金 6 0-免干擾單元 6卜第一導電薄膜 6 2-第二導電薄膜 6 3-第一電源 64-第二電源 7 0 -垂直定位單元Page 26 522255 Case No. 90108048 Brief description of the diagram 433-First repulsive force 44-Reflective lens 44 1 -Second soft magnetic alloy 4 4 2 -Reflective area 443-Second repulsive force 4 5 -Block 4 6 _Microcoil 5 0 -Horizontal positioning unit 4 7 -Convex plate 52a ~ * First electrode 52b-Second electrode 5 2 1 -First cantilever 5 2 2-Second cantilever 5 2 3 -Connecting cantilever 5 3-Ring 4 4 -Positioning lens 431-first soft magnetic alloy 44-reflection lens 44 1 -second soft magnetic alloy 6 0-interference-free unit 6 first conductive film 6 2-second conductive film 6 3-first power supply 64-second power supply 7 0- Vertical positioning unit

第27頁 522255 案號 90108048 年月厶 S 修正 圖式簡單說明 7 3-第一定位單元 73a-第一固定端 731-第一扭轉元件 7 3 2 -第一軟磁合金 734 -第一定位鏡片 7 3 5-第一側邊 74-第二 74a-第 741- 第 742- 第 744-第 74 5-第 定位單元 二固定端 二扭轉元件 二軟磁合金 二定位鏡片 二側邊 7 5 -反射單元 75a-第三固定端 75b-第四固定端 751- 第三扭轉元件 752- 第三軟磁合金 7 5 3 -反射區域 7 5 4 -反射鏡片 7 6 -微線圈 7 7 -擋塊Page 27 522255 Case No. 90108048 厶 S Modified drawing simple description 7 3-First positioning unit 73a-First fixed end 731-First torsion element 7 3 2-First soft magnetic alloy 734-First positioning lens 7 3 5-First side 74-Second 74a-741-742- 744-74- 5-Positioning unit 2 Fixed end 2 Twisting element 2 Soft magnetic alloy 2 Positioning lens 2 Side 7 5-Reflecting unit 75a -Third fixed end 75b-Fourth fixed end 751-Third torsion element 752-Third soft magnetic alloy 7 5 3-Reflective area 7 5 4-Reflective lens 7 6-Micro-coil 7 7-Stopper

第28頁Page 28

Claims (1)

522255 1(丨 案號90108048_.年d月 日 修正___ 丨㈣〜 一 一』 一 六、申請專利範圍 一-------- L 一種微鏡片定位裝置,可用於微鏡片垂直方向之定位, 其包含有: 一基板; 一固定單元,該固定單元具有一第一固定端與一第 二固定端,該第一固定端與第二固定端係相隔一適當距 離固定於該基板;’ 一磁性單元,該磁性單元係設於該基板下方一適當 距離處; 一定位單元,包含有: 一第一扭轉元件,其係可以水平懸吊方式設於該第 一固定端與第二固定端之間,該第一扭轉元件中央部分 並可以水平懸吊方式向其一側延伸一適當距離,且其上 設有一第一平面與一第二平面;以及 一第一磁性感應單元,其係固定於該第一平面或第 二平面,且可受該磁性單元感應;以及 一反射單元,包含有: 一第二扭轉元件,其係與第一扭轉元件相互平行且 相隔一適當距離,並以水平懸吊方式設於該第一固定端 與第二固定端之間,該第二扭轉元件中央部分並以水平 懸吊方式向其一侧延伸一適當距離,且其設有一第三平〇 面與一第四平面;以及 一第二磁性感應單元,其係固定於該第三平面或第 四平面,且可受該磁性單元感應者。 2.如申請專利範圍第1項所述之微鏡片定位裝置,其中該 第29頁 522255 _案號90108048_年月^^日 絛正_— 六、申請專利範圍 第一平面與第二平面係可互相平行。 3 .如申請專利範圍第1項所述之微鏡片定位裝置,其中該 第三平面與第四平面係可互相平行。 4 .如申請專利範圍第1項所述之微鏡片定位裝置,其中該 第二扭轉元件下方更可包含一擋塊。 5 .如申請專利範圍第1項所述之微鏡片定位裝置,其中該 磁性單元係可為一微線圈。 6 .如申請專利範圍第1項所述之微鏡片定位裝置,其中該 第一磁性感應單元係可為一軟磁合金。 7 .如申請專利範圍第1項所述之微鏡片定位裝置,其中該 第二磁性感應單元係可為一軟磁合金。 8 .如申請專利範圍第1項所述之微鏡片定位裝置,其中該 第三平面係可為一反射平面。 9 .如申請專利範圍第1項所述之微鏡片定位裝置,其中該 第四平面可為一反射平面。 1 0 .如申請專利範圍第1項所述之微鏡片定位裝置,其中該 第一扭轉元件、第二扭轉元件、擋塊、定位鏡片、反 射鏡片與播塊係可為多晶石夕(P 〇 1 y - s i 1 i c ο η),且係可 藉黃光微影製程一體成型者。 11. 一種微鏡片定位裝置,可用於微鏡片垂直方向之定 位,其包含有: 一基板; 一磁性單元,該磁性單元係設於該基板下方一適 當距離處; 第30頁 522255 案號 90108048 條正 六、 申請專利範圍 至 少 一定位 單 元,更包含有: 一 第 一扭轉 元 件,係為水平方向延伸之可掀 薄板 結 構 ? 於 薄板狀 第 一扭轉元件的一末端設有一第 一固 定 元 件 其係固 定 於該基板上,使該第一扭轉元 件可 以 固 定 元 件為轴 進 行植轉, 一 第 一磁性 感 應元件,其係固定於第一扭轉 元件 較 遠 離 該 固定元 件 之側;以及 至 少 一反射 單 元,更包含有: 一 第 二扭轉 元 件,係為水平方向延伸之可掀 薄板 結 構 於 薄板狀 第 二扭轉元件的一末端之兩側設 有一信 第 二 固 定 元件與 一 第三固定元件,其係相隔一適 當距 離 分 別 固 定於該 基 板上,使該第二扭轉元件可同 時以 第 二 固 定 元件與 第 三固定元件為軸進行樞轉; 一 第 二磁性 感 應元件,其係固定於第二扭轉 元件 較 遠 離 第 二固定 元 件與第三固定元件之側; 其 中 ,第一 扭 轉元件更具有一第一側邊,該 第一 側 邊 係 設 於第一 扭 轉元件較接近第二扭轉元件之 側。 12 •如 中 請 專 利範圍 第 11項所述之微鏡片定位裝置, 其中 該 定 位 單 元係包 含 一第一定位單元與一第二定位 單 1 元 且 該 第一定 位 單元之樞轉與該第二定位單元 之極 轉 軸 相 平 行。 13.如 中 請 專 利範圍 第 11項所述之微鏡片定位裝置, 其中 該 第 二 扭 轉元件 下 方更可包含一擔塊。 14 •如 中 請 專 利範圍 第 11項所述之微鏡片定位裝置, 其中 第31頁 522255 ^_案號90108048 91年1〇月11日 修正_ 六、申請專利範圍 該磁性單元係可為一微線圈。 1 5 .如申請專利範圍第1 1項所述之微鏡片定位裝置,其中 該第一磁性感應元件係可為一軟磁合金。 1 6 .如申請專利範圍第1 1項所述之微鏡片定位裝置,其中 該第二磁性感應元件係可為一軟磁合金。 1 7 .如申請專利範圍第11項所述之微鏡片定位裝置,其中 該第一扭轉元件係可為多晶石夕(ρ ο 1 y - s i 1 i c ο η ),且係 可藉黃光微影製程一體成型者。 1 8 .如申請專利範.圍第1 1項所述之微鏡片定位裝置,其中 該第二扭轉元件係可為多晶石夕(ρ 〇 1 y - s i 1 i c ο η ),且係 f 可藉黃光微影製程一體成型者。 1 9 .如申請專利範圍第1 1項所述之微鏡片定位裝置,其中 該第一扭轉元件較接近第一固定元件的位置處更設有 一開口。 2 0 .如申請專利範圍第11項所述之微鏡片定位裝置,其中 第一扭轉元件之樞轉軸與第二扭轉元件之樞轉轴相垂 直,且該第一側邊係與該第一扭轉元件之樞轉軸相垂 直。 2 1.如申請專利範圍第1項或第11項所述之微鏡片定位裝 _ 置,更包含有一免干擾單元,且該免干擾單元係包含 有·· 一電源,該電源具有一電源第一端與一電源第二 端; 一第一導電單元,該第一導電單元係可設於一垂522255 1 (丨 Case No. 90108048_. Rev. d, dd, dd, ___ ㈣ ㈣ ~ 一 一 一 六 六, Patent application scope 1 -------- L A micro lens positioning device, which can be used in the vertical direction of micro lenses The positioning includes: a substrate; a fixed unit having a first fixed end and a second fixed end, the first fixed end and the second fixed end are fixed to the substrate at an appropriate distance; A magnetic unit is disposed at an appropriate distance below the substrate; a positioning unit includes: a first torsion element, which can be horizontally suspended on the first fixed end and the second fixed end In between, the central portion of the first torsion element can extend horizontally to an appropriate distance to one side thereof, and a first plane and a second plane are provided thereon; and a first magnetic induction unit is fixed On the first plane or the second plane and can be sensed by the magnetic unit; and a reflection unit comprising: a second torsion element which is parallel to the first torsion element and spaced apart from each other by a suitable distance; When the distance is between the first fixed end and the second fixed end in a horizontal suspension manner, the central portion of the second torsion element extends a suitable distance to one side in a horizontal suspension manner, and it is provided with a The third plane 0 and a fourth plane; and a second magnetic induction unit, which is fixed on the third plane or the fourth plane and can be sensed by the magnetic unit. 2. As the first item of the scope of patent application The said micro lens positioning device, wherein the 29th page 522255 _ case number 90108048 _ month ^ ^ day 绦 _ _ 6, the scope of the patent application The first plane and the second plane can be parallel to each other. 3. If applying for a patent The microlens positioning device according to item 1 of the scope, wherein the third plane and the fourth plane are parallel to each other. 4. The microlens positioning device according to item 1 of the patent application scope, wherein the second torsion element is below It may further include a stopper. 5. The microlens positioning device according to item 1 of the scope of patent application, wherein the magnetic unit may be a microcoil. 6. The microlens positioning according to item 1 of the scope of patent application Device where The first magnetic induction unit may be a soft magnetic alloy. 7. The micro-lens positioning device according to item 1 of the scope of the patent application, wherein the second magnetic induction unit may be a soft magnetic alloy. 8. The scope of the patent application The microlens positioning device according to item 1, wherein the third plane may be a reflection plane. 9. The microlens positioning device according to item 1 of the patent application scope, wherein the fourth plane may be a reflection plane 10. The micro-lens positioning device according to item 1 of the scope of the patent application, wherein the first torsion element, the second torsion element, the stopper, the positioning lens, the reflection lens, and the broadcast block may be polycrystalline stones ( P 〇1 y-si 1 ic ο η), and can be integrated by the yellow light lithography process. 11. A micro-lens positioning device, which can be used for positioning the micro-lens in the vertical direction, includes: a substrate; a magnetic unit, the magnetic unit is located at an appropriate distance below the substrate; page 30 522255 case number 90108048 6. The patent application scope includes at least one positioning unit, which further includes: a first torsion element, which is a thin plate structure extending horizontally? A first fixing element is provided at one end of the thin plate-like first torsion element, which is fixed. On the substrate, the first torsion element can be planted with the fixing element as an axis. A first magnetic induction element is fixed to a side of the first torsion element farther from the fixing element; and at least one reflection unit, more It includes: a second torsion element, which is a tiltable thin plate structure extending in the horizontal direction. A second fixing element and a third fixing element are provided on both sides of one end of the thin plate-like second torsion element, which are separated by one Proper distance It is fixed on the substrate, so that the second torsion element can be pivoted at the same time with the second fixing element and the third fixing element as axes; a second magnetic induction element, which is fixed to the second torsion element and is farther away from the second fixing. The side of the element and the third fixing element; wherein the first torsion element further has a first side edge, and the first side edge is disposed on the side of the first torsion element that is closer to the second torsion element. 12 • The micro-lens positioning device according to item 11 of the patent scope, wherein the positioning unit includes a first positioning unit and a second positioning unit and the pivot of the first positioning unit and the second positioning unit The pole rotation axes of the positioning unit are parallel. 13. The microlens positioning device as described in item 11 of the patent scope, wherein the second twisting element may further include a load below. 14 • The micro lens positioning device as described in item 11 of the patent scope, where page 31 is 522255 ^ _ Case No. 90108048 Amended on October 11, 91 _ 6. The scope of patent application The magnetic unit can be a micro Coil. 15. The micro-lens positioning device according to item 11 of the scope of patent application, wherein the first magnetic induction element is a soft magnetic alloy. 16. The micro-lens positioning device according to item 11 of the scope of patent application, wherein the second magnetic induction element may be a soft magnetic alloy. 17. The microlens positioning device according to item 11 of the scope of the patent application, wherein the first torsion element can be polycrystalline stone (ρ ο 1 y-si 1 ic ο η), and can be borrowed by yellow light lithography Integrated process molding. 18. The microlens positioning device according to claim 11 in claim 11, wherein the second torsion element may be polycrystalline stone (ρ 〇1 y-si 1 ic ο η), and is f Can be integrated by the yellow light lithography process. 19. The microlens positioning device according to item 11 of the scope of patent application, wherein the first torsion element is further provided with an opening at a position closer to the first fixing element. 20. The microlens positioning device according to item 11 of the scope of patent application, wherein the pivot axis of the first torsion element is perpendicular to the pivot axis of the second torsion element, and the first side is connected to the first torsion The pivot axes of the components are perpendicular. 2 1. The micro lens positioning device described in item 1 or item 11 of the scope of patent application, further comprising an interference-free unit, and the interference-free unit includes a power source, the power source has a power source One end and a second end of a power source; a first conductive unit, the first conductive unit may be disposed on a vertical 第32頁 修正 522255 案號 90108048 六、申請專利範圍 直定位裝置,與該電源第一端電性連接;以及 一第二導電單元,該第二導電單元係可設於與該 第一導電單元相對應之一基板上,與該電源第二端電 性連接。 2 2 .如申請專利範圍第2 1項所述之垂直定位裝置,其電源 第一端可為電源正端,其電源第二端可為電源負端。 2 3 .如申請專利範圍第2 1項所述之垂直定位裝置,其電源 第一端可為電源負端,其電源第二端可為電源正端。 24.—種微鏡片定位裝置,可用於微鏡片水平方向之定 位,其包含有: 一電源,該電源具有一電源正端與一電源負端; 一電極單元,其包含有一第一電極與一第二電 極,該第一電極與該第二電極係相隔一適當距離分別 固定於一第一平面之上,且分別與該電源正端與該電 源負端電性連接,以及 一定位單元,其包含有一第一懸臂、一第二懸臂 與一連接懸臂,該第一懸臂與該第二懸臂係相隔一適 當距離,二者之第一端係以水平懸吊方式分別固定設 於該第一電極與該第二電極,且二者之第二端亦係以 水平懸吊方式分別與該連接懸臂之兩端連接,該定位 單元於該第一電極與該第二電極之間形成一水平懸吊 之導電迴路者。 2 5 .如申請專利範圍第2 4項所述之微鏡片定位裝置,其中 該第一懸臂第二端之側方更設有一卡榫。 第33頁Amendment on page 32 522255 Case No. 90108048 6. The patent application scope of the direct positioning device is electrically connected to the first end of the power supply; and a second conductive unit, the second conductive unit can be arranged in phase with the first conductive unit A corresponding substrate is electrically connected to the second terminal of the power source. 2 2. The vertical positioning device according to item 21 of the scope of patent application, wherein the first end of the power supply may be the positive end of the power supply, and the second end of the power supply may be the negative end of the power supply. 2 3. The vertical positioning device as described in item 21 of the scope of patent application, wherein the first end of the power supply may be the negative end of the power supply, and the second end of the power supply may be the positive end of the power supply. 24. A micro-lens positioning device, which can be used for positioning the micro-lens in the horizontal direction, includes: a power source, the power source having a positive power source terminal and a negative power source terminal; an electrode unit including a first electrode and a A second electrode, the first electrode and the second electrode system are respectively fixed on a first plane at an appropriate distance, are electrically connected to the positive terminal of the power source and the negative terminal of the power source, and a positioning unit, It includes a first cantilever, a second cantilever, and a connecting cantilever. The first cantilever and the second cantilever are separated by an appropriate distance. The first ends of the two are fixed to the first electrode in a horizontal suspension manner. And the second electrode, and the second ends of the two are also connected to the two ends of the connecting cantilever in a horizontal suspension manner, the positioning unit forms a horizontal suspension between the first electrode and the second electrode Of the conductive circuit. 25. The micro-lens positioning device according to item 24 of the scope of patent application, wherein a second tenon is further provided on the side of the second end of the first cantilever. Page 33 案號 90108048 修正 522255 f (年P月曰 六、申請專利範圍 2 6 .如申請專利範圍第2 4項所述之微鏡片定位裝置,其中 該第二懸臂之橫截面面積大於第一懸臂之橫截面面 積。 2 7.如申請專利範圍第2 4項所述之微鏡片定位裝置,更包 含一凸板,該凸板係突出於一垂直定位裝置。 2 8 .如申請專利範圍第2 4項所述之微鏡片定位裝置,其中 該第一電極、第二電極、第一懸臂、第二懸臂、連接 懸臂與卡榫係可以導電材料組成, 2 9 .如申請專利範圍第2 8項所述之微鏡片定位裝置,其中 該第一電極、第二電極、第一懸臂、第二懸臂、連接 懸臂與卡榫係可為銅合金,且係可藉黃光微影製程一 體成型者。 3 (K如申請專利範圍第2 8項所述之微鏡片定位裝置,其中 該第一電極、第二電極、第一懸臂、第二懸臂、連接 懸臂與卡榫係可為金合金,且係可藉黃光微影製程一 體成型者。Case No. 90108048 Amendment 522255 f (January, P.Y., patent application scope 26. The micro lens positioning device according to item 24 of the patent application scope, wherein the cross-sectional area of the second cantilever is greater than the cross-section area of the first cantilever Cross-sectional area. 2 7. The microlens positioning device as described in item 24 of the scope of patent application, further comprising a convex plate protruding from a vertical positioning device. 2 8. As item 24 of the scope of patent application The micro-lens positioning device, wherein the first electrode, the second electrode, the first cantilever, the second cantilever, the connecting cantilever and the tenon can be made of conductive materials, as described in item 28 of the scope of patent application. The micro-lens positioning device, wherein the first electrode, the second electrode, the first cantilever, the second cantilever, the connecting cantilever and the tenon can be a copper alloy, and can be integrally formed by the yellow light lithography process. 3 (K 如The micro-lens positioning device according to item 28 of the scope of the patent application, wherein the first electrode, the second electrode, the first cantilever, the second cantilever, the connecting cantilever and the tenon can be a gold alloy, and can be borrowed by Huangguang Process one Body shaper. 第34頁Page 34
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