TW513491B - Cleaning apparatus and method of residual acid on pincers - Google Patents

Cleaning apparatus and method of residual acid on pincers Download PDF

Info

Publication number
TW513491B
TW513491B TW90115584A TW90115584A TW513491B TW 513491 B TW513491 B TW 513491B TW 90115584 A TW90115584 A TW 90115584A TW 90115584 A TW90115584 A TW 90115584A TW 513491 B TW513491 B TW 513491B
Authority
TW
Taiwan
Prior art keywords
tray
wafer
claw
residual acid
platform
Prior art date
Application number
TW90115584A
Other languages
Chinese (zh)
Inventor
Yin-Cheng Ma
Original Assignee
Taiwan Semiconductor Mfg
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Taiwan Semiconductor Mfg filed Critical Taiwan Semiconductor Mfg
Priority to TW90115584A priority Critical patent/TW513491B/en
Application granted granted Critical
Publication of TW513491B publication Critical patent/TW513491B/en

Links

Landscapes

  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

This invention provides a cleaning apparatus and a cleaning method of residual acid on pincers, which are applicable to an etcher, a wafer carrier boat transportation apparatus adjacent to the etcher through a partition plate and a wafer transportation apparatus capable of moving between the etcher and the wafer carrier boat transportation apparatus, in which the wafer transportation apparatus has pincers and the wafer carrier boat transportation apparatus has a platform. The cleaning apparatus consists of: a first tray installed on the partition plate capable of rotating between a first position and a second position, in which the first tray is at the first position and contacts the partition plate when the pincers are at the area of the etcher; and a second tray installed on the platform, in which the first tray is at the second position and contacts the second tray when the pincers are at the area of the wafer carrier boat transportation apparatus. Therefore, residual acid solution on the pincers will not cause any damage to the mechanism of the wafer carrier boat transportation apparatus when the pincers enter the area of the wafer carrier boat transportation apparatus.

Description

二)丄二丄 五、發明說明(1) 本發明係有關於一種挾爪上殘& 法,特別是有關於一種可使搬送時‘:除裝置及方 台免於遭受殘留酸腐姓之挾爪上; = 確保鄰近機 法。 工坟留酸之清除裝置及方 ==是利用特定溶液與薄膜間所進行的化學反 應,來去除薄膜未被光阻覆蓋的部份,而 :供這種餘刻方式也就是所謂的濕 = =純、設備簡成本低、產能高:、= 有優秀的蝕刻選擇性。 濕式蝕刻大概可分為三個步驟·· 〇)反應物質擴散到 =刻材質的表面;(2)反應物與被蝕刻薄膜反應;(3) 出了後的產物從蝕刻表面擴散到溶液中,並隨溶液被排 心、、式钱刻的進行,通常先利用氧化劑,如石夕、銘餘刻 時的硝酸,將被蝕刻材料氧化,形成氧化物(例如, S i 〇2、A “ 〇3 ),再利用另一溶劑,如矽蝕刻中的氫氟酸 (HF),鋁蝕刻中的磷酸(H3p〇4),來將此氧化層溶解,並隨 溶液排除’然後新的氧化層再度形成,如此便可達到蝕刻 ‘的效果。 一般的#刻機台1〇及其周邊設備如第1圖所示,在蝕 刻機台10中設有數個化學槽(chemical bath)ll、12以及 數個清洗槽(〇:16&1^1^&&1;11)13、14;在化學槽11、12中 裝有如上述般的酸性溶液,用以進行蝕刻,而在清洗槽 13、14中則裝有去離子水water),以進行清洗。(B) Twenty-five (5) Description of the invention (1) The present invention relates to a method for removing residues on the claws, and in particular to a method that can be used for transporting: "except the device and the platform to avoid the residual acid rot On the claw; The device and method for removing acid from work grave == The chemical reaction between the specific solution and the film is used to remove the part of the film that is not covered by the photoresist, and the remaining method is also called wet = = Pure, simple equipment, low cost, high productivity :, = Excellent etching selectivity. Wet etching can be roughly divided into three steps. 〇) The reaction material diffuses to the surface of the engraved material; (2) the reactant reacts with the etched film; (3) the product after diffusion from the etched surface to the solution As the solution is evacuated, the type of engraving is usually carried out. Usually, an oxidant, such as Shi Xi and nitric acid in the last moment of engraving, is used to oxidize the etched material to form an oxide (for example, Si02, A " 〇3), and then use another solvent, such as hydrofluoric acid (HF) in silicon etching, phosphoric acid (H3p〇4) in aluminum etching, to dissolve this oxide layer, and with the solution, then the new oxide layer It is formed again, so that the effect of etching can be achieved. As shown in FIG. 1, a general #lithography machine 10 and its peripheral equipment are provided with several chemical baths 11, 12 and 12 in the etching machine 10. Several cleaning baths (0: 16 & 1 ^ 1 ^ &1; 11) 13, 14; The chemical baths 11, 12 are filled with an acidic solution as described above for etching, and the cleaning bath 13 , 14 is equipped with deionized water (water) for cleaning.

0503.6276TW;TSMC2001.〇〇65;tungming.ptd 第4頁 513491 五、發明說明(2) 置20鄰接, 移動架2 1可 舟内裝有數 小,以供後 晶舟搬送裝 機械手臂42 從未圖示的 程’在餘刻 洗槽13、以 數個晶圓搬 稭由另一未 製程與本發 化學槽11、 程而定。 晶圓進入化 ,其表面將 爪41要從蝕 晶圓時,需 挾爪41表面 蝕亥彳機台10藉由一隔板30與一晶舟搬送裝 晶舟搬送裝置20具有一移動架21和一平台22, 沿著隔板3 0搬送未圖示的晶舟至平台2 2上,晶 片晶圓。又,上述隔板3〇上形成足夠的開孔大 述的晶圓搬運裝置4〇通過。 一晶圓搬運裝置4 〇可用以在蝕刻機台丨〇和 置20之間搬運晶圓,其具有機械手臂42,而在 上設有與機械手臂42垂直的挾爪41,挾爪41可 晶舟中挾取晶圓,且可越過隔板3〇而按既定流 機台1 0中按照依序將晶圓浸潰於化學槽丨丨、清 及化學槽1 2中。 應注意的是在一般蝕刻機台丨0中,係設有 運裝置來搬運晶圓,例如在化學槽丨2之後,係 圖示的晶圓搬運裝置來搬運晶圓,由於此後續' 明的特徵無關,在此省略其說明。另外,在兩 1 2之間也不一定需設置清洗槽丨3,這需視各製 如上所述,由於挾爪41需隨著被其挾持的 學槽11、12中,當挾爪41離開化學槽11、12時 殘留有化學槽11、1 2中的酸性溶液,因此在挟 刻機台10再進入晶舟搬送裝置20中挾取另一組 要將挾爪41浸入於清洗槽14中,以去除殘留於 的酸性溶液。 應注意的是上述清洗槽14中並不一定是利用溢流的去 離子水清洗’也有利用氣氣吹拂而去除殘留的酸性溶0503.6276TW; TSMC2001.〇〇65; tungming.ptd Page 4 513491 V. Description of the invention (2) Set 20 adjacent, the moving frame 2 1 can be installed in the boat with a small number for the rear wafer boat to carry a loading robot 42 The process shown in the figure is determined by another unprocessed process and the chemical tank 11 and process of the present invention. When the wafer enters, the surface of the claw 41 is to be etched from the wafer. The surface of the claw 41 needs to be etched. The machine 10 is transported by a baffle 30 and a wafer boat. The wafer boat transfer device 20 has a moving frame 21 With a platform 22, a wafer boat (not shown) is transferred along the partition plate 30 to the platform 22, and the wafer is wafered. The wafer transfer device 40, which has sufficient openings formed in the partition plate 30, passes through. A wafer handling device 40 can be used to transfer wafers between the etching machine 10 and the set 20. The wafer handling device 40 has a robot arm 42, and a claw 41 which is perpendicular to the robot arm 42 is provided thereon. The wafer is picked up in the boat, and the wafer can be immersed in the chemical tank 丨, Qing, and chemical tank 12 in sequence according to the predetermined flow machine 10 according to the predetermined flow machine 10. It should be noted that in the general etching machine 丨 0, a transport device is provided to carry the wafer. For example, after the chemical tank 丨 2, the illustrated wafer transfer device is used to carry the wafer. The features are irrelevant, and descriptions thereof are omitted here. In addition, it is not necessary to set a cleaning tank 3 between 2 and 2, depending on the system described above. Since the claw 41 needs to follow the learning tanks 11 and 12 held by it, when the claw 41 leaves In the chemical tanks 11 and 12, the acidic solution in the chemical tanks 11, 12 remains, so the engraving machine 10 enters the boat transfer device 20 to pick another group to immerse the claw 41 in the cleaning tank 14. To remove the remaining acidic solution. It should be noted that the above-mentioned cleaning tank 14 may not necessarily be cleaned by overflowing deionized water.

513491 五、發明說明(3) 然而’上述清洗槽有下列缺點 1由於需將挾爪41在清洗槽14 轉之間的搬送時間加長了約6 〇秒, 晶圓產 1(WPH , wafer per hour) < 2由於額外的清洗槽丨4來清洗 所需的空間更大。 3在挾爪表面上仍然可能殘留 舟搬送裝置中的機構,有可能遭受 而造成腐 ^(corrosion)。 有鑑於此,本發明之目的係為 一種挾爪上殘留酸之清除裝置及方 短且可確保鄰近機台免於殘留酸腐 在本發明中,提供一種挾爪上 適用於蝕刻機台、經由隔板與蝕刻 置以及可於蝕刻機台及晶舟搬送裝 裝置’其中晶圓搬運裝置具有挾爪 平台’而清除裝置包括:以可於第 轉動的方式設置於隔板上的第一托 ‘刻機台的區域時,第一托盤位於第 以及設置於平台上的第二托盤,其 裝置的區域時,第一托盤位於第二 又在本發明中,清除裝置更包 動機構’用以驅動第一托盤轉動; 中清洗, 且因此降 使相鄰晶圓運 低了每小時的 挾爪41,使得整體機台 有酸性溶 從挾爪滴 了解決上 法,其可 餘。 殘留酸之 機台鄰接 置之間移 ’且晶舟 一位置與 盤,其中 一位置而 中當挾爪 位置而與 括:設置 設置於隔 液,因此在晶 下的酸性溶液 述問題而提供 使搬送時間縮 清除裝置,其 的晶舟搬送裝 動的晶圓搬運 搬送裝置具有 第二位置之間 當挟爪位於钱 與隔板抵接; 位於晶舟搬送 第二托盤抵 於隔板上的驅 板上的轉動 Η513491 V. Description of the invention (3) However, the above-mentioned cleaning tank has the following disadvantages: 1 Because the transfer time of the claw 41 between the 14 rotations of the cleaning tank needs to be extended by about 60 seconds, wafer production 1 (WPH, wafer per hour) ) < 2 Due to the extra cleaning tank 丨 4 more space is required for cleaning. 3 The mechanism in the boat transfer device may still remain on the surface of the claws, and may suffer corrosion. In view of this, the object of the present invention is a device for removing residual acid on the claws, and the method is short and can ensure that the adjacent machine is free from residual acid rot. In the present invention, a claw is suitable for an etching machine, The partition plate and the etching device can be transported and mounted on the etching machine and the wafer boat. 'The wafer handling device has a claw platform.' The cleaning device includes: a first holder which can be arranged on the partition plate in a rotatable manner. ' When the area of the machine is engraved, the first tray is located at the first and the second tray provided on the platform. When the device is in the area, the first tray is located at the second. In the present invention, the cleaning device includes a moving mechanism for driving. The first tray is rotated; the cleaning is performed, and therefore the adjacent wafers are lowered by the jaws 41 per hour, so that the entire machine has an acid solution dripping from the jaws to solve the upper method, which is redundant. The position of the residual acid is moved between adjacent positions, and one position of the crystal boat and the plate, one of which is the position of the claws and the other is included: it is set in the liquid barrier, so the acid solution under the crystal provides a solution to the problem. The transport time shrinking and removing device has a wafer boat transfer wafer transfer device having a second position when the pawl is located on the abutment of the money and the partition plate; Turn on the board

513491513491

以及與第二托盤連通的 軸,用以供第一牦盤設置於其上 洩流管。 又在本發明中,提供一種 清除裝置之清除方法,包括: 架,用以搬運承载晶圓的晶舟 台上時,此時使第一托盤位於 開平台後,將第一托盤轉動至 從钱刻機台至晶舟中挾取晶圓 托盤轉動至第一位置。 利用上述的挾爪上殘留酸之 (a)晶舟搬送裝置具有移動 ’當移動架將晶舟搬送至平 第一位置;(b)在移動架離 第二位置;以及(c)在挾爪 且再移動經過隔板後,第一And a shaft communicating with the second tray for the first pan to be provided thereon with a drain pipe. Also in the present invention, a cleaning method for a cleaning device is provided, including: a rack for carrying a wafer boat platform carrying a wafer, at this time, after the first tray is positioned on the open platform, the first tray is rotated to Take the wafer tray from the engraving machine to the wafer boat and rotate it to the first position. (A) The boat transfer device with the residual acid on the claws has the function of moving the wafer boat to the first flat position when the moving rack is moved; (b) the second position is moved from the moving rack; and (c) the claw And after moving through the partition, the first

以下,就圖式說明本發明之挾爪上殘留酸之清除裝 及方法的實施例。 圖式簡單說明 第1圖係顯示習知姓刻機台及其周邊設備之示意圖; 第2圖係顯示本發明之挾爪上殘留酸之清除裝置之示 意圖; 第3 a圖係顯示裝有本發明之挾爪上殘留酸之清 之敍刻機台及其周邊設備之示意圖第一托二 二位置;以及 乐 第3 b圖係顯示I有本發日月之挾爪上殘留酸之清除裝置 之银刻機台及其周邊設備之示意圖,其中第一托 【 一位置。 、罘 [符號說明]Hereinafter, an embodiment of a device and method for removing residual acid on a claw of the present invention will be described with reference to the drawings. Brief Description of the Drawings Figure 1 is a schematic diagram showing a conventional surname carving machine and its peripheral equipment; Figure 2 is a schematic diagram showing a device for removing residual acid on the claws of the present invention; Figure 3a is a diagram showing the present invention Schematic diagram of the narrative engraving machine and its peripheral equipment for the remaining acid on the claws of the invention, and the first and second positions; and Fig. 3b shows the device for removing the residual acid on the claws of the sun and the moon. Schematic diagram of the silver engraving machine and its peripheral equipment, where the first tray [one position. , 罘 [Symbol description]

五、發明說明(5) 1 〇蝕刻機台、 1 3、1 4清洗槽、 21移動架、 2 2 1定位塊、 4 〇晶圓搬運裝置 4 2機械手臂、 51第一托盤、 5 3驅動機構、 55 轉動轴。 11、1 2 化學槽、 20 晶舟搬送裝置、 22平台、 3 0隔板、 41挾爪、 5 0挾爪上殘留酸之清除裝置 5 2第二托盤、 54洩流管、 參考第2、3a、3b圖,本發明之挾爪上殘留酸之清除 裝置50係適用於如第i圖所示之餘刻機台1〇、晶舟搬 置20以及晶圓搬運裝置40中,其中晶舟搬送裝置2〇係如、上 述般經由隔板30與蝕刻機台1〇鄰接,而晶圓搬運裝置4〇 機台1〇及晶舟搬送裝置20之間移動來搬運晶圓,且 ==。具有挟純,且晶舟搬送褒置2。具有移動 動軸55 1 -托盤51以可轉ί:5方3 3官54以及-轉 挾爪4!位於餘刻機台丨。的區= 上,當 接(以下稱此為第一位置,分別如』板3〇抵 所示),亦即使第-托盤51: 第圖的虛線以及第31)圖 π曰#胃π Μ Γ· 1與隔板30平行;而當挾爪41位 於β曰舟搬送裝置20的區域時,第一托盤51與第二托盤㈣ 第8頁 0503-6276T1VF;TSMC2001.〇〇65;tungming.ptd 513491 、發明說明(6) 接以下稱此為第二位置,分別如第2圖的實線以及第3a圖 所示),亦即使第一托盤51與隔板3〇垂直。 第二托盤52係設置於晶舟搬送裝置2〇的平台22上,平 =22上設有數個定位塊221(如第2圖所示),第二托盤52與 定位塊221對應處設有開口,藉此由移動架21搬送過來的 晶舟61 (如第3a圖所示)可穿過第二托盤52而放置於定位塊 2 2 1上’晶舟6 1内承載有複數片晶圓6 2。 驅動機構5 3係没置於隔板3 〇上,用以驅動第一托盤5 1 轉動,其可為馬達是較佳地;轉動軸55也設置於隔板3〇 上,用以供第一托盤51設置於其上,且可作為第一托盤51 ,的轉動支點。洩流管54與第二托盤52上的開孔連通,以將 從挾爪41滴落於第二托盤5 2上的酸性溶液排除。V. Description of the invention (5) 1 0 etching machine, 1 3, 1 4 cleaning tank, 21 moving rack, 2 2 1 positioning block, 4 0 wafer handling device 4 2 robot arm, 51 first tray, 5 3 drive Mechanism, 55 axis of rotation. 11, 1 2 chemical tank, 20 boat transfer device, 22 platform, 30 partitions, 41 claws, 50 claws residual acid removal device 5 2 second tray, 54 drain pipe, refer to section 2, Figures 3a and 3b. The device 50 for removing residual acid on the claws of the present invention is suitable for the remaining machine 10, the wafer boat 20, and the wafer transfer device 40 as shown in FIG. The transfer device 20 is adjacent to the etching machine 10 via the partition plate 30 as described above, and the wafer transfer device 40 moves between the wafer platform 10 and the wafer transfer device 20 to transfer the wafer, and ==. It has 挟 pure, and the crystal boat transfer 搬 set 2. It has a movable moving shaft 55 1 -tray 51 to be rotatable: 5 squares 3 3 guan 54 and -turning claw 4! Area = up, when connected (hereinafter referred to as the first position, as shown by the "plate 30"), even if the-tray 51: the dashed line in the figure and the 31st) 1 is parallel to the partition 30; and when the claw 41 is located in the area of the β-boat transfer device 20, the first tray 51 and the second tray ㈣ page 8 0503-6276T1VF; TSMC2001.〇〇65; tungming.ptd 513491 6. Description of the invention (6) This is referred to as the second position, as shown by the solid line in Figure 2 and Figure 3a), even if the first tray 51 is perpendicular to the partition 30. The second tray 52 is provided on the platform 22 of the wafer boat conveying device 20, and a plurality of positioning blocks 221 (as shown in FIG. 2) are provided on the flat plate 22. The second tray 52 is provided with an opening corresponding to the positioning block 221. Therefore, the wafer boat 61 (as shown in FIG. 3a) carried by the moving frame 21 can pass through the second tray 52 and be placed on the positioning block 2 2 1 'the wafer boat 6 1 carries a plurality of wafers 6 2. The driving mechanism 5 3 is not placed on the partition plate 30 and is used to drive the first tray 5 1 to rotate. It is preferably a motor; the rotating shaft 55 is also provided on the partition plate 30 for the first The tray 51 is disposed on the tray 51 and can be used as a pivot for the first tray 51. The drain pipe 54 is in communication with the opening in the second tray 52 to remove the acidic solution dripped from the claw 41 onto the second tray 52.

平台22上 位置;在移 二位置(如 晶舟61中挾 仍位於第二 隔板30後, 運裝置20的 可完全隔絕 構上,而在 ’第一托盤On the platform 22; in the second position (for example, the boat 61 is still located in the second partition 30, the transport device 20 can be completely isolated on the structure, and

參考第3 a、3 b圖說明利用上述的狹爪上殘 裝置之清除方法,當移動架22將晶舟61搬送至 時’此時第一托盤51如第3b圖所示,位於第一 動架22離開平台21後,將第一托盤51轉動至第 第2圖之實線所示);在挾爪41從蝕刻機台1〇至 取晶圓62時(如第3a圖所示),此時第一托盤52 位置’最後在挾取晶圓6 2後的挾爪41移動經過 第一托盤51轉動至第一位置(如第3b圖所示)。 應注意的是在晶圓搬運裝置4〇進入晶舟搬 區域中時,第一托盤51均位於第二位置,亦即 挾爪41上的殘留酸滴落在晶舟搬運裝置2〇的 晶圓搬運裝置40離開晶舟搬運裝置2〇的區域時With reference to Figures 3a and 3b, the method for removing the residual device using the narrow claw described above is described. When the moving rack 22 carries the wafer boat 61 to it, 'the first tray 51 is located at the first position as shown in Figure 3b. After the rack 22 leaves the platform 21, the first tray 51 is rotated to the solid line shown in FIG. 2); when the claw 41 is from the etching machine 10 to the wafer 62 (as shown in FIG. 3a), At this time, the position of the first tray 52 ′ is finally the claw 41 after the wafer 62 is picked up and moved through the first tray 51 to rotate to the first position (as shown in FIG. 3b). It should be noted that when the wafer handling device 40 enters the wafer handling area, the first tray 51 is located at the second position, that is, the residual acid on the claw 41 drops on the wafer of the wafer handling device 20 When the conveying device 40 leaves the area of the wafer boat conveying device 20

五 發明說明(7) 留MS第一位置’此時第-托盤51上從挾爪41滴落的殘 滑落至餘刻機台1〇的區域中,而由未圖示的容 3a II ^ -挾爪4 1的行進路線係如習知般,並不會通過如第 晶圓的:ί曰曰舟6 1的正上方,因此並不會有殘留酸滴落於 出而是都會由第二托盤52所承接 藉^本發明之裝置及方法,可得到下列功效: 爪的-ί Ϊ短搬送時間,可提高㈣約1〇%,且由於節省挾 爪的π洗過程,可使製程時間縮短; 1 90*2 9 0〇_省下巧洗槽,可即省機台整體所佔的空間約 3可確保晶舟搬送裝置中的機構 的酸性溶液而造成腐蝕。 再充於延-從挾爪滴下 雖然本發明已以較佳實施例揭露 限定本發明,任何孰習此頊枯蓺去 ^ …、其並非用以 :和範圍0,當可作些許之更動與潤飾,因:月之精 遵範圍當視後附之巾請專利範圍所界定者為準。發月之保 0503-6276TW;TSMC2001-0065;tungming.ptd 第10頁Fifth Description of the Invention (7) Leave the MS in the first position 'At this time, the residual dripping from the claw 41 on the first tray 51 slides into the area of the remaining machine 10, and the unillustrated volume 3a II ^- The travel path of the claw 41 is as it is known, and it will not pass through the first wafer: ί said the boat 6 1 directly above, so no residual acid will drop out but will be passed by the second The apparatus and method of the present invention received by the tray 52 can obtain the following effects:-Short transfer time of the claws, which can increase about 10%, and save the π washing process of the claws, which can shorten the processing time. ; 1 90 * 2 9 0__ save the clever washing tank, which can save about 3 of the space occupied by the machine as a whole, which can ensure that the acidic solution of the mechanism in the wafer boat transport device causes corrosion. Further filling-dripping from the claws. Although the present invention has been disclosed to limit the present invention with a preferred embodiment, anyone who learns this is not going to ^ ..., it is not used to: and range 0, when you can make some changes and Retouching, because: the scope of the moon's fine compliance shall be determined by the scope of the patent attached to the attached towel. Warranty 0503-6276TW; TSMC2001-0065; tungming.ptd Page 10

Claims (1)

51349·^51349 · ^ ^ l一種挾爪上殘留酸之清除裝置,適用於一蝕刻機 口、經由一隔板與該蝕刻機台鄰接的一晶舟搬送裝置以 :於該触刻機台及該晶舟搬送裝£之間移動❾—晶圓搬運 2 ’其中該晶圓搬運裝置具有一挾爪,i該晶舟搬送裝 置具有一平台,而上述清除裝置包括·· 一第一托盤,以可於一第一位置與一第二位置之間轉 動的方式設置於該隔板上,其中當挾爪位於該蝕刻機台的 區域時,該第一牦盤位於該第一位置而與該隔板抵接;以 第一托盤’ ό又置於該平台上’其中當挾爪位於該晶^ 舟搬送裝置的區域時,該第一托盤位於該第二位置而與該 第一托盤抵接。 2 ·如申請專利範圍第1項所述的挾爪上殘留酸之清除 裝置,更包括: 一驅動機構,設置於該隔板上,用以驅動該第一托盤 轉動;以及 一轉動軸,設置於該隔板上,用以供該第一托盤設置 於其上。 3.如申請專利範圍第1或2項所述的挾爪上殘留酸之清 除裝置,更包括: 4 一洩流管,與該第二托盤連通。 4· 一種利用如申請專利範圍第1項所述的挾爪上殘留 酸之清除裝置之清除方法,包括: (a)該晶舟搬送裝置具有一移動架,用以搬運承載晶^ l A device for removing residual acid on a claw, which is suitable for an etching machine port and a wafer transfer device adjacent to the etching machine through a partition plate: to transport and install the touch etching machine and the wafer boat. Move between ❾—wafer handling 2 'wherein the wafer handling device has a claw, i the wafer handling device has a platform, and the above-mentioned removal device includes a first tray so that it can be placed in a first position And the second position is arranged on the partition plate, wherein when the claw is located in the area of the etching machine, the first pan is located in the first position and abuts the partition plate; A pallet is placed on the platform, and when the claw is located in the area of the boat transfer device, the first pallet is located at the second position and abuts against the first pallet. 2 · The device for removing residual acid on the claws according to item 1 of the scope of patent application, further comprising: a driving mechanism provided on the partition plate for driving the first tray to rotate; and a rotating shaft, provided The partition is used for the first tray to be set thereon. 3. The device for removing residual acid on the claws according to item 1 or 2 of the scope of patent application, further comprising: 4 a drain pipe, which is in communication with the second tray. 4. A method for removing residual acid on the claws as described in item 1 of the scope of patent application, comprising: (a) the wafer boat transfer device has a moving frame for carrying a load crystal 0503-6276TO7;TSMC2001-0065;tungming.ptd 第11頁 513491 六、申請專利範圍 圓的一晶舟,當該移動架將該晶舟搬送至該平台上時,此 時使該第一托盤位於該第一位置; (b )在該移動架離開該平台後,將該第一托盤轉動至 該第二位置;以及 (c )在該挾爪從蝕刻機台至該晶舟中挾取晶圓且再移 動經過該隔板後,該第一托盤轉動至該第一位置。0503-6276TO7; TSMC2001-0065; tungming.ptd Page 11 513491 VI. A wafer boat with a round scope of patent application, when the mobile rack transfers the wafer boat to the platform, at this time, the first tray is located at the A first position; (b) rotating the first tray to the second position after the moving frame leaves the platform; and (c) taking a wafer from the etching machine to the wafer boat in the claw and After moving through the partition, the first tray is rotated to the first position. 0503-6276TWF;TSMC2001-0065;t ungm i ng.p t d 第12頁0503-6276TWF; TSMC2001-0065; t ungm i ng.p t d p. 12
TW90115584A 2001-06-27 2001-06-27 Cleaning apparatus and method of residual acid on pincers TW513491B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW90115584A TW513491B (en) 2001-06-27 2001-06-27 Cleaning apparatus and method of residual acid on pincers

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW90115584A TW513491B (en) 2001-06-27 2001-06-27 Cleaning apparatus and method of residual acid on pincers

Publications (1)

Publication Number Publication Date
TW513491B true TW513491B (en) 2002-12-11

Family

ID=27752292

Family Applications (1)

Application Number Title Priority Date Filing Date
TW90115584A TW513491B (en) 2001-06-27 2001-06-27 Cleaning apparatus and method of residual acid on pincers

Country Status (1)

Country Link
TW (1) TW513491B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112264376A (en) * 2020-09-21 2021-01-26 常州捷佳创精密机械有限公司 Mechanical arm hook washing device, control method and cleaning equipment

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112264376A (en) * 2020-09-21 2021-01-26 常州捷佳创精密机械有限公司 Mechanical arm hook washing device, control method and cleaning equipment

Similar Documents

Publication Publication Date Title
US8420549B2 (en) Etching and cleaning methods and etching and cleaning apparatuses used therefor
TWI653663B (en) Developing unit, substrate processing apparatus, developing method and substrate processing method
JP6618334B2 (en) Substrate processing apparatus, film forming unit, substrate processing method, and film forming method
CN108352313B (en) Film processing unit, substrate processing apparatus, and substrate processing method
US20210233784A1 (en) Film processing method
US10331034B2 (en) Substrate processing apparatus and substrate processing method
TW513491B (en) Cleaning apparatus and method of residual acid on pincers
WO2016194285A1 (en) Substrate processing apparatus, film forming unit, substrate processing method and film forming method
US8236382B2 (en) Proximity substrate preparation sequence, and method, apparatus, and system for implementing the same
JP3248789B2 (en) Substrate wet processing method and processing system
JP2020014022A (en) Substrate processing apparatus and substrate processing method
KR102257430B1 (en) Developing apparatus, substrate processing apparatus, developing method, and substrate processing method
JPH08195368A (en) Cleaning method and device, and transfer device
JP2505263Y2 (en) Wafer transfer device for wafer surface treatment device
JP3197539B2 (en) Apparatus and method for cleaning substrate
JP2002329703A (en) Substrate cleansing device and method
JPH06252120A (en) Device and method for wet-cleaning wafer
JPH05129267A (en) Cleaning equipment
CN112309825A (en) Mechanical arm for transmitting wafer and wafer cleaning device
JPH0883745A (en) Treating device
JPH0529289A (en) Chemical liquid processing device for semiconductor substrate
JPH11186356A (en) Substrate processing device

Legal Events

Date Code Title Description
GD4A Issue of patent certificate for granted invention patent
MK4A Expiration of patent term of an invention patent