TW494506B - Manufacturing method of multi-tier substrate for ball grid array package structure - Google Patents

Manufacturing method of multi-tier substrate for ball grid array package structure Download PDF

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Publication number
TW494506B
TW494506B TW090119464A TW90119464A TW494506B TW 494506 B TW494506 B TW 494506B TW 090119464 A TW090119464 A TW 090119464A TW 90119464 A TW90119464 A TW 90119464A TW 494506 B TW494506 B TW 494506B
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Taiwan
Prior art keywords
dielectric layer
layer
conductive
circuit
conductive circuit
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TW090119464A
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Chinese (zh)
Inventor
Yi-Chuan Ding
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Advanced Semiconductor Eng
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/49105Connecting at different heights
    • H01L2224/49109Connecting at different heights outside the semiconductor or solid-state body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors

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  • Production Of Multi-Layered Print Wiring Board (AREA)

Abstract

A manufacturing method of multi-tier substrate for ball grid array (BGA) package structure contains the followings. (a) An inner layer circuit board is provided, in which the first conducting circuit is formed on its upper surface and several solder ball bonding-pads are formed on its lower surface. (b) The first dielectric layer is formed on the upper surface of the inner layer circuit board. (c) The first opening is formed on the first dielectric layer and is followed by forming several first via holes on the first dielectric layer so as to expose the first conducting circuit of the inner layer circuit board. (d) The second conducting circuit is formed on the first dielectric layer and the first conducting circuit that is exposed from the first via hole. (e) The second dielectric layer is formed on the first dielectric layer and the second conducting circuit by halftone printing such that the second dielectric layer is provided with the second opening, which is larger than the first opening of the first dielectric layer, and one part of the second conducting circuit is exposed. (f) Several second via holes are formed on the second dielectric layer to expose the second conducting circuit. (g) The third conducting circuit is formed on the second dielectric layer and the second conducting circuit that is exposed from the second via hole. (h) A solder block is formed on the layout surface of the multi-tier substrate so as to make the region on the conducting circuit, which is used for electrically connecting to a semiconductor chip, and the solder ball bonding-pad, which is used for electrically connecting to the external portion, expose from the solder block.

Description

494506 五、發明說明(1) 【發明領域】 本發明係有關於一種球格陣列(bga) 之製造方法,特別有關於一種用# V體封哀構造 k之多階層(multi-tier )基板製造方法。](GA)封扃構 【先前技術】 由於晶片設計取向減小電晶體大小及 得這些議題變得更為重要。目前举=阳片尺寸,使 晶片並無法具有快速的系統效:業= 的封裝相互搭配。基本上’一封裝或封裝支援㈡ n原,及其它功能之表現如散熱、支撐及對:二 =護:而另-重要的功能為簡單地分配離開晶片的密‘ 輸出入端至印刷電路板之輸出入端。 v、 、考慮晶片的整合方式,球格陣列(BGA)封裝大致 為凹穴向上(cavity up )及凹穴向下(cavity d〇wn°a刀一 種型態。請參照第1圖凹穴向下之球格陣列(bga ) ^ 造,其包含一晶片40設於一基板1〇下表面之凹穴1〇&^ 晶片40表面之晶片銲墊(未示於圖中)係以連接線 ' (bonding wires)連接至設於該基板1〇凹穴週邊的晶片連 接墊(chip bonding pad)22、36,該基板1〇之下表面設有 複數個錫球銲墊3 4位於該複數個晶片連接墊2 2、3 6之週 邊。該複數個錫球銲墊3 4係分別電性連接至相對廡之曰 連接墊22、36。該每一錫球銲墊34係設有一錫球38用以與' 外界電性溝通。該晶片4 〇、連接線以及該基板1 〇之凹穴係 為一封膠體包覆(包括該基板下表面之一部分)。 ^494506 V. Description of the invention (1) [Field of the invention] The present invention relates to a method for manufacturing a ball grid array (bga), and more particularly, to a method for manufacturing a multi-tier substrate using a # V 体 封 封 structure k. method. ] (GA) 封 扃 结构 [Previous Technology] These issues have become more important as the wafer design orientation reduces transistor size. At present, the size of the positive film makes the chip unable to have fast system efficiency: the packaging of the industry is matched with each other. Basically 'a package or package supports the original source, and the performance of other functions such as heat dissipation, support and pairing: two = protection: and the other-the important function is to simply assign the secret from the chip' I / O to the printed circuit board I / O terminal. v. Considering the integration method of the chip, the ball grid array (BGA) package is roughly a cavity up (cavity up) and a cavity down (cavity doown ° a) knife. Please refer to Figure 1 for cavity direction The bottom ball grid array (bga) is fabricated, which includes a wafer 40 provided with a cavity 10 on a lower surface of a substrate 10, and a wafer pad (not shown in the figure) on the surface of the wafer 40 is connected by wires. '(bonding wires) are connected to chip bonding pads 22, 36 provided on the periphery of the substrate 10 cavity, and a plurality of solder ball pads 3 4 are located on the lower surface of the substrate 10 The periphery of the wafer connection pads 2 2, 3 and 6. The plurality of solder ball pads 34 are electrically connected to the opposite connection pads 22 and 36, respectively. Each solder ball pad 34 is provided with a solder ball 38. It is used to communicate with the outside world electrically. The chip 40, the connecting line and the cavity of the substrate 10 are a colloid coating (including a part of the lower surface of the substrate). ^

P01-074.ptd 第5頁 494506 五、發明說明(2) 二=$ ’用“在基板和晶片賴供第一級連接的構造 必二納所,晶片f *之電性連接。而*外部電路元件 之連接(一般係稱為「輸入輸出(input_〇utput)」或 :,1/处〇"連接(connection)」)數目係決定於晶片之結構 ,二功此。具有許多功能的先進晶片其需要一定數目之 : "I/O”連接。然而,由於基板1〇的佈線密度Uiring density)受限於其凹穴10a,因此就可能 "I/O"連接沒有足夠之引線來提供電性連接。 早二 ,國第5,688,408號專利揭示一種凹穴向上(cavity叩 )式封裝構造,#主要包含一晶片5〇承載於一多階層式 (•nulti-Uer)基板60。美國第5 688,4〇8號專利亦提供一 種製造該基板60之方法’其包含提供一内蕊層(例如以 FR-4製成)62,然後將銅羯貼至其下表面。之後,將銅羯 成所要之導電電路。接著,將具有開口(〇pening)之 "電層64 (例如預浸潰體(prepreg))以及導電電路66*_ I由銅箔形成)交錯設於該内蕊層62之上,而形成一 其中相鄰兩層導電電路之間至少設有一預浸潰體。二 ^开y成忒夕層印刷電路板之外層銅箔,再將其蝕刻而形 成所要之導電電路68。最後’將該堆疊體加熱加壓以固化 该預浸潰體之樹脂材料而製得該堆疊體之層壓件 (laminate)。該預浸潰體以及銅箔的總層數(包含内蕊層 上下兩邊的銅4層以及每一個蝕刻成命要電路的銅箔層) 係視所需而定。-般而言,不同導電電路層之間的電性連 接係利用在層壓件上鑽出通孔(thr〇ugh_h〇le)7〇,並且在 P〇l-〇74.ptd 494506 五、發明說明(3) 該通孔塗覆一層導電金屬而達成。 然而,就該多階層式(mu 11 i -1 i e r)基板6 0而言,通孔及 其孔墊是限制線路密度的主要因素之一。孔墊通常要比孔 徑大0 . 2 m m左右,以補償鑽孔偏差(d r i 1 1 misregistration)、層壓件的膨脹收縮(laminate expasion/shrinkage)和曝光設備的膨脹收縮(photo tool expasion/shrinkage)。此外,在多層構造中的内層通孔 墊,由於其無法從外面看到,因此更難控制位置關係,故 孔墊要比孔徑大0· 5-0· 8mm左右。因此,線路設計不易達 到真正的高密度。 【發明概要】 因此本發明之主要目的係提供一種用於球格陣列(β G A) 封裝構造之多階層(m u 11 i -1 i e r )基板製造方法,其可克 服或至少改善前述先前技術之問題及缺點。 根據本發明第一較佳實施例之多階詹(mu 11 i -1 i er 板製造方法,其包含:(a)提供一内層電路板,其上 面已形成一第一導電電路,其下表面已形成數個錫球鲜 墊;(b)形成一第一介電層於該内層電路板上表面; )形成第一開口於該第一介電層’以及形成數個第一介声 洞(via hole)於該第一介電層並裸露出該内層電路板之 弟一導電電路,(d)形成一第二導電電路於該第一介電 層以及裸露於該第一介層洞之第一導電電路上;(e)、網 板印刷一第二介電層於該第一介電層以及第二導電電路之 上,使得遠苐一介電層具有一第二開口大於該第一介電^P01-074.ptd Page 5 494506 V. Description of the invention (2) Two = $ 'Use the structure where the substrate and the wafer are connected for the first-level connection. The chip f * is electrically connected. And * the external circuit The number of component connections (generally referred to as "input_〇utput" or :, 1 / 处 〇 " connection ") is determined by the structure of the chip, and it does the same thing. An advanced chip with many functions requires a certain number of "I / O" connections. However, since the wiring density (Uiring density) of the substrate 10 is limited by its recess 10a, it is possible to "I / O" connections There are not enough leads to provide electrical connection. As early as the second, the national patent No. 5,688,408 disclosed a cavityca package structure, #mainly contains a chip 50 which is carried in a multi-level (nulti-Uer) Substrate 60. U.S. Patent No. 5,688,408 also provides a method of manufacturing the substrate 60, which includes providing an inner core layer (eg, made of FR-4) 62, and attaching copper cymbals to its lower surface. After that, copper is formed into the desired conductive circuit. Next, the "electrical layer 64 (such as a prepreg) having conductive openings and conductive circuits 66 * _I formed of copper foil are staggered" It is arranged on the inner core layer 62 to form at least one pre-impregnated body between two adjacent conductive circuits. Two layers of copper foil are formed on the outer layer of the printed circuit board, and then etched. To form the desired conductive circuit 68. Finally 'add the stack Hot pressing to cure the resin material of the prepreg to obtain a laminate of the stack. The total number of layers of the prepreg and copper foil (including 4 copper layers above and below the inner core layer) And each copper foil layer etched into a critical circuit) depends on the need.-In general, electrical connections between different conductive circuit layers are made by drilling through holes in the laminate (thrugh_h〇 le) 70, and in Poll-〇74.ptd 494506 V. Description of the invention (3) The through hole is coated with a layer of conductive metal. However, the multi-layer (mu 11 i -1 ier) substrate For 60, through-holes and their pads are one of the main factors limiting the density of the line. Hole pads are usually about 0.2 mm larger than the hole diameter to compensate for drilling deviation (dri 1 1 misregistration), Expand expansion / shrinkage and photo tool expasion / shrinkage of the exposure equipment. In addition, the inner via pad in a multilayer structure is more difficult to control the positional relationship because it cannot be seen from the outside. The hole pad is about 0 · 5-0 · 8mm larger than the hole diameter. Therefore, the circuit design It is difficult to achieve true high density. [Summary of the Invention] Therefore, the main object of the present invention is to provide a multi-layer (mu 11 i -1 ier) substrate manufacturing method for a ball grid array (β GA) package structure, which can overcome Or at least the problems and disadvantages of the foregoing prior art are improved. According to the first preferred embodiment of the present invention, a method for manufacturing a multi-layer (mu 11 i -1 i er board) method includes: (a) providing an inner layer circuit board on which A first conductive circuit has been formed, and several solder ball pads have been formed on its lower surface; (b) a first dielectric layer has been formed on the surface of the inner layer circuit board;) a first opening has been formed in the first dielectric layer 'And forming a plurality of first via holes in the first dielectric layer and exposing a conductive circuit of a brother of the inner layer circuit board, (d) forming a second conductive circuit in the first dielectric layer And exposed on the first conductive circuit of the first dielectric hole; (e), the screen prints a second dielectric layer on the first dielectric layer and the second conductive circuit, so that a dielectric is far away; The layer has a second opening larger than the first dielectric ^

P〇lO74.ptd 第7頁 494506P〇lO74.ptd Page 7 494506

494506 五、發明說明(5) 以理解的是,該第二導電電路以及第三導電 用加成(additive)或減成(subtractive)方法形,、。可Μ利 由於该内層電路板、第二導電電路以及二 7曰1係利用盲導孔(blind via )彼此電性連―,所以、路^ 層電=、第二導電電路以及第三導電電 斤内 接不需要利用通孔(through_h〇le)達成。因此,m = 明之多階層式基板’其線路密度不再受限於通孔,因而‘ 容納^多的導電線路,藉此可克服或至少 術之問題及缺點。 』4尤則技 【發明說明】 第3i圖所示為根據本發明較佳實施例之球格陣列(bg 封裝構造。該球格陣列封裝構造主要包含一多階層式 (multi-tier BGA)基板1〇〇用以承載以及電性連接一半 體晶片150。該多階層式(multi — tier BGA)基板1〇〇主要 含一内層基板100、一第一介電層11〇設於該内層電路 100上並具有一第一開口 lu、一第二導電電路1〇23設|^ 第一介電層110上、一第二介電層12〇設於該第一介電層 110以及第二導電電路l〇2a上並具有一第二開口 121、一第 二導電電路102a設於該第二介電層12〇上以及一銲錫遮蔽 1 0 4〃设於該多階層基板上之佈線表面。嫌内層基板1〇〇具有 一第一導電電路101a及一晶片承座101b設於其上表面,以 及複數個錫球銲墊l〇lc設於其下表面。該内層基板丨〇〇具 有數個導電通孔(Plated thr〇ugh h〇le)13〇用以電性連接 该第一導電電路1 〇 1 a以及複數個錫球銲墊丨〇丨c。該第一導494506 V. Description of the invention (5) It is understood that the second conductive circuit and the third conductive body are formed by an additive method or a subtractive method. However, because the inner circuit board, the second conductive circuit, and the second series are electrically connected to each other using blind vias, the circuit layer, the second conductive circuit, and the third conductive circuit are electrically connected to each other. The interconnection does not need to be achieved through holes (through holes). Therefore, the wiring density of m = multi-layer substrate of Ming 'is no longer limited by the through-holes, and therefore, it can accommodate at least a large number of conductive circuits, thereby overcoming or at least technical problems and disadvantages. 』4Special techniques [Explanation of the invention] FIG. 3i shows a ball grid array (bg package structure) according to a preferred embodiment of the present invention. The ball grid array package structure mainly includes a multi-tier BGA substrate 100 is used to carry and electrically connect the half body chip 150. The multi-tier BGA substrate 100 mainly includes an inner substrate 100 and a first dielectric layer 11 disposed on the inner circuit 100 A first opening lu is provided thereon, a second conductive circuit 1023 is provided on the first dielectric layer 110, and a second dielectric layer 120 is provided on the first dielectric layer 110 and the second conductive circuit. There is a second opening 121 on the 102a, a second conductive circuit 102a provided on the second dielectric layer 120, and a solder mask 104 on the wiring surface on the multi-layer substrate. The inner layer is suspected. The substrate 100 has a first conductive circuit 101a and a wafer holder 101b provided on an upper surface thereof, and a plurality of solder ball pads 10lc provided on a lower surface thereof. The inner layer substrate has several conductive vias. A hole (Plated thrugh ughle) 13〇 is used to electrically connect the first conductive circuit 1 〇1 a and a plurality of solder ball pads 丨 〇 丨 c. The first guide

P01-074.ptd 第9頁 ^4506 五、發明說明(6) 1 =路l〇la係有部分裸露於該第一開口丨丨】而形成複數個 :手指101d。該第二導電電路1〇2&係有部分裸露於該 口121而形成複數個第二手指1〇21)。該第三導電電路 ^係有部分形成複數個第三手指10孙。該内層電路板 之第一導電電路101&、第二導電電路1〇2&以及第三 1電路103a之間係利用盲導孔(bHnd νί〇彼此電性連 =。,第一手指101d、第二手指102b、第三手指1〇扑以及 =缂塾101(:係裸露於該銲錫遮蔽m。該半導體晶片⑸ 由禝數條銲線(bonding wires)例如金線電性連接 "ί二手指1〇18、第二手指1〇2b以及第三手指103b。該每 曰f球銲塾l〇lc係、設有一錫球142用以與外界電性連接。 =片承座ioib錫球銲墊1〇4錫球銲墊1〇1〇錫球銲墊1〇卜 ,a至3g圖揭示根據本發明較佳具體實施例之多階声 (mil ti-tier )基板製造方法。 曰 第3a圖揭示根據本發明之該内層電路板ι〇〇 , 1 已形成該第一導電電路1〇1&以及一晶片承座1〇1;,上 =形成複數個錫球銲墊101c。該内層基板1〇有數 iii:;;;ated thr〇Ugh V電電路1 〇la以及複數個錫球銲墊1〇1^^該内声 100可由玻璃纖維強化BT (bismaleimide_tFiaz曰ine 脂’或FR-4玻璃纖維強化環氧樹脂 relnf0rced epoxy resin)製成之蕊層(c〇re) 此增加該内層電路板之機械強度。 成猎 第3b圖揭示-第一介電層11〇形成於該内層電路板⑽上 P01-074.ptd 第10頁 494506 五、發明說明(7) 表面。該第一介電層1丨〇具有一第一開口丨丨1以及數個第一 介層洞(via hole) 1 12,其中該第一導電電路1 〇ia係有部 分裸露於該第一開口 1 1 1而形成複數個第一手指丨〇丨d。該 第一介電層110可利用一感光介質(ph〇t〇imagable dielectric, PI D)以習知技術塗覆在内層電路板1〇〇上。 然後對該感光介質成像(imaging )以及顯影 (developing )而形成該第一開口lu及第一介層洞112。 此外’該第一介電層丨丨〇亦可以使用網版印刷(screen print)塗佈於該内層電路板1〇〇上並直接形成該第一開口 111,再對該第一介電層丨丨〇成相以及顯影而形成該第一介 層洞1 1 2。再者’該第一介層洞丨丨2亦可以機械鑽孔或雷射 鑽孔力^以形成。適合於該步驟之雷射類型包含二氧化碳雷 射 I 鋁石榴石(yttrium aluminum garnet, YAG)雷 射、準分早帝4丄/ · 乂 田射(excimer laser)等,其中較佳使用二氧 化=雷射,因為其產率高。 1 1 (Τα 圖^不一第二導電電路1〇2a形成於該第一介電降 11ϋ以及棵靈於铱 kSr 辞黛-道$ 玄第一介層洞112之第一導電電路101^^。 2。Ϊ細Ϊ電路102a可以利用減成(subtractive)方法形 plating);士導 ::極電鑛(electrolessly 括第一介;、、同^9 錢在該第一介電層110表面(包 然後,來二’° Μ),較佳地,該導電金屬層為一銅層。 ;該導電i:ί蝕刻劑於該導電金屬層上’並且選擇性蝕 是,該第:曰以形成第二導電電路102a。可以理解的 電電路102a亦係可以利用加成(additive)方P01-074.ptd Page 9 ^ 4506 V. Description of the invention (6) 1 = The road 10a is partially exposed in the first opening 丨】 and forms a plurality of fingers 101d. The second conductive circuit 102 is partially exposed at the port 121 to form a plurality of second fingers 1021). The third conductive circuit is partially formed with a plurality of third fingers. The first conductive circuit 101 & the second conductive circuit 102 and the third circuit 103a of the inner layer circuit board are electrically connected to each other by using a blind via (bHnd νί〇), the first finger 101d, the second finger The finger 102b, the third finger 10, and = 101 (: are exposed on the solder mask m. The semiconductor wafer is electrically connected by a plurality of bonding wires such as gold wires " two fingers 1 〇18, the second finger 102b and the third finger 103b. The f-ball soldering system 10lc is provided with a solder ball 142 for electrical connection with the outside world. = Sheet ioib solder ball pad 1 〇4 solder ball pads 010 solder ball pads 10b, a to 3g figure discloses a method for manufacturing a mil ti-tier substrate according to a preferred embodiment of the present invention. Figure 3a reveals According to the present invention, the inner-layer circuit board ι0, 1 has formed the first conductive circuit 101 & and a wafer holder 101; upper = forming a plurality of solder ball pads 101c. The inner-layer substrate 10 There are several iii: ;;; ated thr〇Ugh V electrical circuit 10a and a plurality of solder ball pads 1011 ^ The internal sound 100 can be reinforced by glass fiber BT (bismaleimide_tFiaz) is a core layer made of FR-4 glass fiber reinforced epoxy resin (relnf0rced epoxy resin). This increases the mechanical strength of the inner circuit board. Figure 3b of the hunting reveals-the first introduction The electrical layer 11 is formed on the inner circuit board P P01-074.ptd Page 10 494506 V. Description of the invention (7) Surface. The first dielectric layer 1 has a first opening 1 and several A first via hole 1 12, wherein the first conductive circuit 10a is partially exposed on the first opening 1 1 1 to form a plurality of first fingers 丨 〇 丨 d. The first dielectric The layer 110 may be coated on the inner layer circuit board 100 by a conventional technique using a photodielectric medium (PID). Then, the photosensitive medium is formed by imaging and developing. The first opening lu and the first interlayer hole 112. In addition, the first dielectric layer can also be coated on the inner-layer circuit board 100 using a screen print and directly form the first dielectric layer. The opening 111 is formed by phase forming and developing the first dielectric layer. Interstitial hole 1 1 2. Furthermore, 'the first interstitial hole 丨 2 can also be formed by mechanical drilling or laser drilling force ^. Laser types suitable for this step include carbon dioxide laser I aluminum garnet (Yttrium aluminum garnet, YAG) laser, quasi-early early emperor 4 丄 / · Putian laser (excimer laser), etc. Among them, the use of dioxide = laser is preferred because of its high yield. 1 1 (Tα Figure ^ A second conductive circuit 102a is formed on the first dielectric drop 11ϋ and a tree is formed on the iridium kSr. The first conductive circuit 101 of the first interlayer hole 112 ^^ 2. The fine circuit 102a can be formed using a subtractive method (plating); Shidao :: electrolessly (including the first dielectric); the same dielectric layer on the surface of the first dielectric layer 110 ( After that, the conductive metal layer is preferably a copper layer. The conductive i: an etchant is on the conductive metal layer, and the selective etching is, the first: forming The second conductive circuit 102a. It can be understood that the electrical circuit 102a can also use an additive method.

P01-074.ptd 第11頁 4V4!)06P01-074.ptd Page 11 4V4!) 06

it =成1咩細言之,先形成一電鍍遮蔽(Plati n§ mask)於 μ :"電層1 1 〇表面,然後無電極電鍍一導電金屬以形 成該導電電路l〇2a。 #多』第3 d圖,將該第二介電層丨2 〇網板印刷於該第一 "電層0上並直接形成該第二開口丨2 i,該第二開口 12工 大於A第一開口lli藉此裸露出該第二導電電路之 指102b 。 、請參照第3e圖’對該第二介電層12〇成像以及顯影而形 成數個第二介層洞(via ho le)122並裸露出該第二導電電 路 102a。 第3f圖揭示一第三導電電路103a形成於該第二介電層 1/0以及裸露於第二介層洞122之第二導電電路1〇2&上。該 第導電電路可以利用加成(additive)或減成 (subtractive)方法形成。 清參照第3g圖,將銲錫遮蔽丨〇4形成於該多階層基板_ 之佈線表面’使得該第二導電電路1〇2a及第三導電電(遵 3 a上用以電性連接至該半導體晶片丨5 〇之區域以及用以 電性連接至外部之錫球銲墊丨〇丨c係裸露於該銲錫遮蔽 1/4_’該第三導電電路1〇38裸露於該銲錫遮蔽1〇4的部分為 第二手指103b ’藉此製得該多階層(multi-tier)基板 100 〇 第3h至3i圖係用以說明利用本發明之多階層基板丨〇〇製 造球格陣列(BGA)封裝構造之方法。 請參照第3h圖’在完成該多階層(multi_tier )基板It = 1 咩 In detail, a plating mask is formed on the surface of the electric layer 1 10, and then a conductive metal is electrolessly plated to form the conductive circuit 102a. # 多 ”第 3d 图 , The second dielectric layer 丨 2 〇 screen is printed on the first " electrical layer 0 and directly forms the second opening 丨 2 i, the second opening 12 is greater than A The first opening 11i thereby exposes the finger 102b of the second conductive circuit. Referring to FIG. 3e ', the second dielectric layer 120 is imaged and developed to form a plurality of via holes 122 and expose the second conductive circuit 102a. Figure 3f reveals that a third conductive circuit 103a is formed on the second dielectric layer 1/0 and the second conductive circuit 102 & exposed on the second via 122. The second conductive circuit can be formed using an additive or a subtractive method. Referring to FIG. 3g, a solder mask is formed on the wiring surface of the multi-layer substrate so that the second conductive circuit 102a and the third conductive circuit (in accordance with 3a for electrical connection to the semiconductor) The area of the chip 丨 5 〇 and the solder ball pads for electrical connection to the outside 丨 〇 c are exposed to the solder shield 1 / 4_ 'the third conductive circuit 1038 is exposed to the solder shield 104 Partly, it is the second finger 103b ', thereby making the multi-tier substrate 100. Figures 3h to 3i are used to illustrate the use of the multi-layer substrate of the present invention to manufacture a ball grid array (BGA) package structure. Please refer to Figure 3h to complete the multi-tier substrate.

P01-074.ptd 第12頁P01-074.ptd Page 12

15〇利用、L 一曰曰片150黏貼於該晶片承座l〇lb後,將該晶片 扣1 n 9k XZ设數條薛線電性連接至該第一手指1 0 1 d、第二手 八昂二手指103b。 請參胛塗q . 士胳咕Γ 圖’數個錫球142黏著於該錫球銲墊101c藉 ltu m 0¾ ^ [tth B, JL' κ I i.. 印刷雷肷4層式球格陣列封裝構造安裝於一基板,例如一 ^ ^ . 板’並且錫球1 42可以電性連接該該封裝構造以 板第1圖^所^為根據本發明另一較佳實施例之多階層式基 造方法為:(a)提供一内層電路板2 00,其上表 雪踗2fl/面分別已形成一第一導電電路201及一第二導電 一 "亥内層電路板200具有數個導電通孔250 ; (b) 形成-第-介電層210於該内層電路板200上表面。:)) 二ΐ二開0211及數個第一介層洞(via hole)212於^ 200之"第;1 〇 第一介層洞2 1 2裸露出該内層電路板自 二Λ 電路2〇1 ; U)形成-第二介電層“Ο於該 内曰電二板20 0下表面;(e)形成數個第二介層洞 hole)222於該第二介電層22〇,該第二介層洞222裸露出該 内層電路板200之第二導電電路2〇2;("電鍍第一 :屬:203在該内層電路板,上表面(包括第一開口以及 ΐ ΓΛ洞)ΛΛ電鑛第二導電金屬層2 〇 4在該内層電路 板2:0下表面(包括第二介層洞);(g)選擇性蝕刻 =金I:2:::成第三導電電路2〇3a以及選擇性|虫 刻二導電金屬層2〇4以形成第四導電電路20“ ;(" 網板p刷-第三介電層230於該第—介電層2i〇上並直接形15〇 After using L, a piece of film 150 is pasted to the wafer holder 10lb, the wafer buckle 1 n 9k XZ is set with several Xue wires electrically connected to the first finger 1 0 1 d, the second hand Eight Ang two fingers 103b. Please refer to Tu Tu. Shi Gu Γ Figure 'Several solder balls 142 adhere to the solder ball pad 101c by ltu m 0¾ ^ [tth B, JL' κ I i .. Printed thorium 4-layer ball grid array The package structure is mounted on a substrate, such as a ^^. Board, and the solder balls 142 can be electrically connected to the package structure. The board is shown in Fig. 1 as a multi-level base according to another preferred embodiment of the present invention. The manufacturing method is as follows: (a) An inner layer circuit board 200 is provided, and a first conductive circuit 201 and a second conductive layer 201 have been formed on the upper surface 2fl / surface of the "inner layer circuit board 200." Hole 250; (b) forming a -first dielectric layer 210 on the upper surface of the inner-layer circuit board 200. :)) Two and two open 0211 and several first via holes (212) ^ 200 of the "first; 1 〇 first via hole 2 1 2 exposed the inner layer circuit board from two Λ circuit 2 〇1; U) formation-the second dielectric layer "0 on the lower surface of the second electrical plate 200; (e) forming a number of second dielectric hole (222) in the second dielectric layer 22, The second interlayer hole 222 exposes the second conductive circuit 202 of the inner layer circuit board 200 (" Plating first: genus: 203) On the inner layer circuit board, the upper surface (including the first opening and the ΓΓΛ hole) ) The second conductive metal layer 2 of ΛΛ power ore is on the lower surface of the inner circuit board 2: 0 (including the second via hole); (g) Selective etching = gold I: 2 ::: to form a third conductive circuit 〇3a and selective | etch the second conductive metal layer 204 to form a fourth conductive circuit 20 "; " stencil p-brush-third dielectric layer 230 on the first-dielectric layer 2i0 and Direct form

P〇l-074.ptd 第13頁 494506 五、發明說明(10) 成一第二開口231,該第二開口231大於該第一開口211藉 此裸露出該第三導電電路2〇3a之一部分;(i )形成一第 I介電層240於該第二介電層220上;(j)形成數個第三 ^層洞(via hole ) 232於該第三介電層230並裸露出該第 二導電電路20 3a以及形成數個第四介層洞(via h〇ie ) 242於5玄第四介電層240並裸露出該第四導電電路; 一(k)將第三導電金屬層205鍍在全部的表面區域(包括第 ::層洞以及通孔);(1)選擇性蝕刻該第三導電金屬 形成—第五導電電路2G5a、—晶片承座252以及數 :::=53 ; (m)形成一銲錫遮蔽2。6於該多階層基 |〇佈線表面,使得該第一導電電路201、第三導雷雷 路203a及第五導電電路2〇5&上用以電性連接至該 片2 6 0之區域以及用以電性連 〇x V體日日 露於該鋅錫遮蔽2G6。 接至外1之錫球料253係裸 f然本發明已以前述較佳實施例揭示, 當可作各種之修:精秦 圍备視後附之申請專利範圍所界定者為準。毛月之保護範 494506P〇l-074.ptd Page 13 494506 V. Description of the invention (10) A second opening 231 is formed, which is larger than the first opening 211 to expose a part of the third conductive circuit 203a; (I) forming a first dielectric layer 240 on the second dielectric layer 220; (j) forming a plurality of third via holes 232 in the third dielectric layer 230 and exposing the first dielectric layer 230 Two conductive circuits 20 3a and several fourth via holes (via h0ie) 242 are formed in the fifth dielectric layer 240 and the fourth conductive circuit is exposed; (k) the third conductive metal layer 205 Plated on all surface areas (including the first: layer holes and through holes); (1) selective etching of the third conductive metal to form-the fifth conductive circuit 2G5a,-the wafer holder 252 and the number: :: = 53; (m) forming a solder shield 2. 6 on the surface of the multi-level base wiring, so that the first conductive circuit 201, the third conductive circuit 203a and the fifth conductive circuit 205 & are used for electrical connection The area of 260 to the film and exposed to the zinc tin shade 2G6 for electrical connection 0x V body every day. The solder ball material 253 connected to the outer part 1 is naked. However, the present invention has been disclosed in the foregoing preferred embodiment. When various modifications can be made: Jing Qin Wei is subject to the definition of the scope of the attached patent. Mao Yue's Protection 494506

第1圖·習用凹六向下(cavity down)式奸、 (BGA )封裝構造之部分剖視圖; 1旱列 式封裝構造之剖視 第2圖·習用凹穴向上(cavity up 圖, 第3a至3g圖:其用以說明根據本發明較佳具體實施例之 多階層(multi-tier)基板製造方法$ 第3 h至3 i圖··其說明利用本發明之多階層基板丨〇 〇製造 一球格陣列(BGA )封裝構造之製造方法;及 弟4圖·根據本發明另一較佳實施例之多階層 (multi-tier )基板之剖視圖。 【圖號說明】 10 散熱片 20 夾層電路板 22 導電電路 24 開口 30 介電層 32 介層洞 34 錫球銲墊 36 導電電路 38 錫球 40 晶片 50 晶片 60 基板 62 内蕊層 64 介電層 66 導電電路 68 導電電路 70 通孔 100 多階層式基板1 0 1 a 第一導電電路 101b 晶片承座 101c 錫球銲墊 101d 手指 102a 第二導電電路 102b 手指 103a 第三導電電路 103b 手指Figure 1 · Partial cross-sectional view of a conventional cavity down package (BGA) package structure; 1 Sectional view of a dry-line package structure Figure 2 · Conventional cavity up (cavity up chart, Figures 3a to Figure 3g: It is used to explain a multi-tier substrate manufacturing method according to a preferred embodiment of the present invention. Figures 3h to 3i are diagrams illustrating the use of the multi-layer substrate of the present invention. Manufacturing method of ball grid array (BGA) package structure; and Figure 4 · A cross-sectional view of a multi-tier substrate according to another preferred embodiment of the present invention. [Illustration of drawing number] 10 heat sink 20 sandwich circuit board 22 conductive circuit 24 opening 30 dielectric layer 32 via hole 34 solder ball pad 36 conductive circuit 38 solder ball 40 chip 50 chip 60 substrate 62 inner core layer 64 dielectric layer 66 conductive circuit 68 conductive circuit 70 through-hole 100 levels Type substrate 1 0 1 a first conductive circuit 101b wafer holder 101c solder ball pad 101d finger 102a second conductive circuit 102b finger 103a third conductive circuit 103b finger

494506494506

圖式簡單說明 104 銲 錫 遮 蔽 110 第 一 介 電 層 111 第 一 開 V 112 第 一 介 層 洞(v i a hole) 121 第 二 開 V 130 通 孑 L (through— hole) 142 錫 球 150 晶 片 200 内 層 電 路 板 201 第 一 導 電 電路 202 第 二 導 電 電路203 第 一 導 電 金屬層 2 0 3a 第 三 導 電 電路204 第 二 導 電 金屬層 2 04a 第 四 導 電 電路205 第 導 電 金屬層 2 0 5a 第 五 導 電 電路21 0 第 一 介 電 層 211 第 一 開 口 212 第 一一 介 層 洞(v i a hole) 220 第 二 介 電 層 222 第 —— 介 層 洞(v i a hole) 230 第 三 介 電 層 231 第 開 D 2 3 2 第三介層洞(viahole) 240 第四介電層 242 第三介層洞 问 2 5 0 通孔(through-hole) 2 52 晶片承座 2 5 3 錫球銲墊 2 6 0 晶片 2 62 錫球 2 0 6 銲錫遮蔽Brief description of the drawing 104 Solder masking 110 First dielectric layer 111 First opening V 112 First via hole 121 Second opening V 130 Through-hole 142 Solder ball 150 Chip 200 Inner circuit Plate 201 first conductive circuit 202 second conductive circuit 203 first conductive metal layer 2 0 3a third conductive circuit 204 second conductive metal layer 2 04a fourth conductive circuit 205 first conductive metal layer 2 0 5a fifth conductive circuit 21 0 First dielectric layer 211 First opening 212 First first via hole 220 Second dielectric layer 222 First-via hole 230 Third dielectric layer 231 First opening D 2 3 2 The third via hole 240 The fourth dielectric layer 242 The third via hole 2 5 0 through-hole 2 52 chip holder 2 5 3 solder ball pad 2 6 0 chip 2 62 tin Ball 2 0 6 solder mask

P01-074.ptd 第16頁P01-074.ptd Page 16

Claims (1)

494506 六、申請專利範圍 1. 一種用於球格陣歹,j 包含: 提供一内層電路板 形成一第一介電層 形成第一開口於該 洞(via hole)於該 第一導電電路; 形成一第二導電電 介層洞之第一導電電 封裝構造之多階層基板製造方法,其 ’其上表面已形成一第一導電電路· 於該内層電路板上表面; 第一介電層,以及形成數個第一介層 第一介電層並裸露出該内層電路板之 路於該第一介電層以及裸露於該第一 路上; 網板印刷一第二介 路之上,使得該第二 電層之第一開口藉此 電性連接至一半導體 形成數個第二介層 露出該第二導電電路 形成一第三導電電 介層洞之第二導電電 形成一锝錫遮蔽於 導電電路上用以電性 電性連接至外部之錫 電層於該第一介電層以及第二導電電 介電層具有一第二開口大於該第一介 裸露出該第二導電電路之一部分用以 晶片; 洞(via hole )於該第二介電層並| , ^ 路於該第二介電層以及裸露於該第二 路上;及 j夕階層基板上之佈線表面,使得該 ^接至該半導體晶片之區域以及用以 I'鋅墊係裸露於該銲錫遮蔽。 2·依申請專利範圍第1項之用於琰执 驟達成1鍍-導電金屬層,沐後=步驟係藉由下 之、後選擇性蝕刻該導電金屬 P0i-074.ptd $ 17頁 494506494506 VI. Application Patent Scope 1. A ball grid array, j includes: providing an inner circuit board to form a first dielectric layer to form a first opening in the via hole in the first conductive circuit; forming A method for manufacturing a multi-level substrate of a first conductive electrical package structure with a second conductive dielectric layer hole, which has a first conductive circuit formed on the upper surface of the inner layer circuit board surface; a first dielectric layer, and Forming a plurality of first dielectric layers and a first dielectric layer and exposing the inner layer circuit board on the first dielectric layer and exposing on the first road; the screen is printed on a second dielectric path so that the first The first openings of the two electrical layers are thereby electrically connected to a semiconductor to form a plurality of second dielectric layers to expose the second conductive circuit to form a third conductive dielectric layer. The second conductive electrical layer forms a tin to shield the conductive circuit A tin electrical layer for electrically and electrically connecting to the outside is provided on the first dielectric layer and the second conductive dielectric layer with a second opening larger than the first dielectric to expose a part of the second conductive circuit for Chip via hole) on the second dielectric layer, and ^ is on the second dielectric layer and exposed on the second road; and the wiring surface on the substrate, so that the ^ is connected to the area of the semiconductor wafer And I'zinc pad is exposed to the solder mask. 2 · According to item 1 of the scope of the patent application, the step 1 is used to achieve 1 plating-conductive metal layer, and the post = step is to selectively etch the conductive metal by the following and after P0i-074.ptd $ 17 pages 494506 六、申請專利範圍 層以形成該導電電路 圍=用二球格陣列封裝構造之多階 電金屬以形成該導atlng mask),然後電鑛-導 4·依申請專利範圍第1項 層基板製造方法,其中内#路7陣列封裝構造之多階 其上表面,用以承載: = 另包含-晶片承座設於 5.依申§月專利範圍第!項之用 層基板製造方法,刚第一導電7列封裝構造之多階 露於該第一介電層之第_開 至 > 有一部份係裸 晶片。 …開口 ’用以電性連接至該半導體 6·依申請專利範圍第丨項之用於球格 層基板製造方法,其中内層電路板之下f裂構造之多階 球銲墊,用以電性連接至一外部電路表面已形成數個錫 7. —種用於球格陣列(BGA)封裝構 (multi-tier)基板製造方法,其包含夕階層 提供一内層電路板,其上表面已形2a · 網板印刷一第一介電層於該内層第一導電電路, 曰電路板上表面,使得該6. Apply for a patent scope layer to form the conductive circuit enclosure = use a two-ball grid array package to construct a multi-level electrical metal to form the conductive atlng mask), and then conduct electricity mining-conductive 4. Manufacture according to the first scope of the patent scope Method, where the upper surface of the inner # 7 7 array package structure has multiple steps on it for carrying: = In addition-the chip holder is located at 5. according to the application § month patent scope! In the manufacturing method of the layer substrate, the multiple steps of the first conductive 7-row package structure are exposed from the first dielectric layer to the first dielectric layer, and a part is a bare wafer. … Openings ”for electrically connecting to the semiconductor 6. The method for manufacturing a ball grid layer substrate according to item 丨 of the patent application scope, wherein a multi-stage ball pad with f-split structure under the inner circuit board is used for electrical connection Several tins have been formed connected to an external circuit surface. 7. A method for manufacturing a multi-tier substrate for a ball grid array (BGA) package, which includes an inner layer circuit board provided on the upper layer, and the upper surface of the circuit board has a shape of 2a. The screen prints a first dielectric layer on the inner first conductive circuit, that is, the surface of the circuit board, so that the P01-074.ptd 第18頁 494506 六、申請專利範圍 第一介電層具有一第一開口; -形成數個第一介層洞(via hole)於該第一介電層並裸 露出該内層電路板之第一導電電路; 電鍍一第一導電金屬層於該第一介電層以及裸露於該第 一介層洞之第一導電電路上; 選擇性蝕刻該第一導電金屬層以形成一第二導電電路; 網板印刷一第二介電層於該第一介電層之上,使得該第 二介電層具有一第二開口大於該第一介電層之第一開口藉 此裸露出該第二導電電路之一部分;P01-074.ptd Page 18 494506 VI. Scope of patent application The first dielectric layer has a first opening;-forming several first via holes in the first dielectric layer and exposing the inner layer; A first conductive circuit of a circuit board; electroplating a first conductive metal layer on the first dielectric layer and a first conductive circuit exposed on the first via hole; selectively etching the first conductive metal layer to form a A second conductive circuit; a second dielectric layer is printed on the first dielectric layer by the screen so that the second dielectric layer has a second opening larger than the first opening of the first dielectric layer and is exposed. A part of the second conductive circuit; 形成數個第二介層洞(via hole)於該第二介電層並裸 露出該第二導電電路; 電鍍一第二導電金屬層於該第二介電層以及裸露於該第 二介層洞之第二導電電路上; 選擇性蝕刻該第二導電金屬層以形成一第三導電電路;Forming a plurality of second via holes in the second dielectric layer and exposing the second conductive circuit; electroplating a second conductive metal layer on the second dielectric layer and exposing the second dielectric layer On the second conductive circuit of the hole; selectively etching the second conductive metal layer to form a third conductive circuit; 形成一銲錫遮蔽於該多階層基板上之佈線表面,使得該 導電電路上用以電性連接至一半導體晶片之區域以及用以 電性連接至外部之錫球銲墊係裸露於g銲錫遮蔽。 8.依申請專利範圍第7項之用於球格陣列(BGA)封裝構造之 多階層(m u 11 i -1 i e r )基板製造方法,其中該導電電路形 成步驟係藉由下列步驟達成:電鍍一導電金屬層,然後選 擇性蝕刻該導電金屬層以形成該導電電路。A solder is formed to shield the wiring surface on the multi-layer substrate, so that the area on the conductive circuit for electrically connecting to a semiconductor wafer and the solder ball pad for electrically connecting to the outside are exposed to the g solder. 8. A method for manufacturing a multi-layer (mu 11 i -1 ier) substrate for a ball grid array (BGA) package structure according to item 7 of the scope of patent application, wherein the conductive circuit forming step is achieved by the following steps: The conductive metal layer is then selectively etched to form the conductive circuit. P01-074.ptd 第19頁 494506 六、申請專利範圍 、 9.依申請專利範圍第7項之用於球格陣列(BGA)封裝構造之 多階層(multi-tier )基板製造方法,其中該導電電路形 成步驟係藉由下列步驟達成:形成一電鍍遮蔽(plat ing mask),然後電鍍一導電金屬以形成該導電電路。 1 0 .依申請專利範圍第7項之用於球格陣列(BG A )封裝構造 之多階層(multi- tier)基板製造方法,其中内層電路板 另包含一晶片承座設於其上表面,用以承載該半導體晶 片0 :該 A中 G (B其 列, 陣法 格方 球造 於製 用板 之基 項} 7 r 第e • 1 圍-t · IX It JnJ li 矛u 專(m 請⑤ 層 申皆 依; 11之 造 構 裝 封 第 D一 第 之 層 電 介一 第 該。 於片 露晶 裸體 係導 份半 部該 一至 有接 至性 路電 電以 内 N > A中 G (B其 列, 陣法 格方 球造 於製 用板 之基 項} 7 r 第 e • 1 圍 t I AT巳 i I t tnj. li 矛u 專(m 請s 層 中皆 依t 多 L2之 造 構 裝 封 βτ 立口 外一 至 接 -\gc 性 電 以 用 墊 銲 球 錫 個 數 成 形 已 面 表 下。 之路 Ivl·'P01-074.ptd Page 19, 494506 VI. Patent application scope, 9. Multi-tier substrate manufacturing method for ball grid array (BGA) package structure according to item 7 of patent application scope, wherein the conductive The circuit formation step is achieved by forming a plating mask, and then electroplating a conductive metal to form the conductive circuit. 10. A method for manufacturing a multi-tier substrate for a ball grid array (BG A) package structure according to item 7 of the scope of the patent application, wherein the inner-layer circuit board further comprises a wafer holder provided on the upper surface thereof, Used to carry the semiconductor wafer 0: The A in G (B in the column, the matrix method is used to make the base board of the manufacturing board) 7 r th e • 1 round-t · IX It JnJ li u u (m Please ⑤ layer Shen Jieyi; the 11th construction of the package D-first layer of the dielectric layer of the first. In the exposed part of the bare system, the first half of the first to the access to the electrical power N > A in G (B is the list, the base of the matrix ball is made from the board) 7 r th e • 1 t t AT ATi i t tnj. The structure of the package sealing βτ outside the one-to-connected-\ gc electric power to form the number of solder balls with a pad has been surfaced. Road Ivl · ' P01-074.ptd 第20頁 電用 導, 板 路 電P01-074.ptd Page 20 Electrical Guide, Board Circuit <4< 4
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