TW492246B - Automatic intelligent recording system and method for monitoring broken wafer image - Google Patents
Automatic intelligent recording system and method for monitoring broken wafer image Download PDFInfo
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- TW492246B TW492246B TW89118413A TW89118413A TW492246B TW 492246 B TW492246 B TW 492246B TW 89118413 A TW89118413 A TW 89118413A TW 89118413 A TW89118413 A TW 89118413A TW 492246 B TW492246 B TW 492246B
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492246 五、發明說明(1) 本發明係提供一種具智慧型之晶元破片影像監看自動 錄製系統和方法,藉由攝影裝置和個人電腦之使用,而可 利於相關工程人員判斷、會診、真因驗證或工程改善管理 為目的者。 由於晶元廠之遠景看好,產能不斷擴增,設備數量亦 隨之驟增而機台自動化更是世界之趨勢,然而在此情況人 員技術訓練日趨煩瑣且對於不常發生之機台異常,如破片 或誤動作以長期現場監看等常難以應付,故舉凡CMP Ebara機台雖穩定性佳但仍有不明原因破片及掉片之情事 產生。 為有效查證其破片及掉片原因權宜之計不外乎作機台 監看,但一般常以人力站岗或錄影機方式錄影,效益極差 且不益多方傳閱及多方人士探討,且資料保存管理皆非常 費事。 〆 因而,本發明之主要目的係提供一種具智慧型之晶元 破片影像監看自動錄製系統和方法以利相關工程人員判 斷、會診、真因驗證或工程改善管理。 本發明之次要目的係提供一種具智慧型之晶元破片影 像監看自動錄製系統和方法,只對研磨中破片及破片前2 筆晶元研磨動作影像會自動記錄,非常便宜又有利於破片 之要因分析,且不會佔用太多硬碟空間。 茲為使 貴審查委員更能瞭解本發明之目的特徵及功 效,謹佐以較佳之實施例,並配合所附之圖示,對本發明 作一詳細說明,說明如后:492246 V. Description of the invention (1) The present invention provides an intelligent recording system and method for monitoring wafer fragment image monitoring. The use of photographic devices and personal computers can facilitate the judgment, consultation, and authenticity of related engineering personnel. For verification or engineering improvement management. As the wafer factory has a bright future, the production capacity is constantly expanding, the number of equipment has also increased sharply, and machine automation is the world's trend. However, in this case, personnel technical training is becoming more and more cumbersome and the machine exceptions that occur infrequently, such as Fragments or malfunctions are often difficult to cope with, such as long-term on-site monitoring. Therefore, although the CMP Ebara machine has good stability, there are still unknown reasons for fragmentation and dropping. In order to effectively verify the reasons for its fragmentation and dropout, the expedient is nothing more than monitoring the machine, but it is usually recorded by human guards or video recorders. The efficiency is very poor and it is not beneficial to be circulated and discussed by multiple parties. Both are very laborious. 〆 Therefore, the main purpose of the present invention is to provide an intelligent wafer chip automatic monitoring system and method for fragment image monitoring to facilitate relevant engineering personnel's judgment, consultation, cause verification or engineering improvement management. A secondary objective of the present invention is to provide an intelligent recording system and method for monitoring wafer fragment images with intelligent, only recording the wafer grinding motion images and the first two wafer grinding motion images, which is very cheap and beneficial for fragmentation. Cause analysis, and does not take up too much hard disk space. In order to make your reviewers better understand the objective features and functions of the present invention, I would like to provide a detailed description of the present invention with the preferred embodiments and the accompanying drawings. The description is as follows:
4^2246 五、發明說明(2) 元破本發明之較佳實例之具種智慧型之晶 機之攝影穿m統’其具多台如ccd攝影機或-般錄影 將攝影事ίίΓ可同時監看晶元研磨時之狀況;再 傳送至二多影像訊號以—多機影像傳送器(12) 多機同時攝因所錄製之影像已數位化且為 影接:r; 像訊號至-個人電=部:ί: 入/輪出瑝…η 人電細亦接收由研磨裝置輸 磨事置ΓΓ )傳輸來之晶元進入和離開研 系:置之吼谠及破片時之訊號;“b而形成一整體之監看 請參閱第2圖,在個人電腦(PC )巾設i :〜ge=Image⑻三㈣’首先將該三槽清空(。 右日日兀開始進入研磨裝置(22 ),研磨裝晋腺、、,山日一、 入訊號至個人電腦,電腦則 乂 ^日日元進 下私令予多台攝影裝置開始截取影像並旦 Image(3)檔中(23 )。晶元繼續前進至研迫":諸存於該 .^ ^ 疋主研磨地點,研廢宕 成後離開研磨室;從晶元進入到離開研磨室為止, 狀 置皆一直在攝影監看,而期間所攝得之影像訊號以〜衣4 ^ 2246 V. Description of the invention (2) Yuan breaks the best example of the present invention. The photographic system of various intelligent crystal machines has multiple cameras, such as a ccd camera or a video recording camera. Look at the condition of the wafer grinding; then send it to the two multi-image signal to—multi-camera image transmitter (12) simultaneous multi-camera recording because the recorded image has been digitized and filmed: r; image signal to-personal = Department: ί: In / round out 瑝 ... η also receives the crystals transmitted from the grinding device (the grinding device set ΓΓ) to enter and leave the research department: the signal when set the roar and fragment; "b and See Figure 2 for a whole monitor. Set i: ~ ge = Image⑻ 三 ㈣ 'on a personal computer (PC). First empty the three slots. (Riji Wu enters the grinding device (22) and grinds Install the Jin gland, the mountain, the sun, and the signal to the personal computer, and the computer will send a private order to multiple photography devices to start capturing images and enter the Image (3) file (23). Epistar continues Proceed to the research ": all exist in this. ^ ^ 疋 The main grinding site, leave the grinding room after the research waste is finished; enter from the wafer to Until leaving the grinding room, the position has been monitored by photography, and the image signals taken during the period are ~
Image(3)、Image(2)和 Image(l)之順序抽矽 二 '· 要接收一新影像時,Ima.ge(2)會將影像訊‘移▲到亦即當Image (3), Image (2), and Image (l) in order. I'm going to receive a new image, Ima.ge (2) will move the image message to ▲
Imaged) Mmage(3)之影像訊號則會移存到丨㈣伙 新攝得之影像訊號則儲存於I mage ( 3 ), 取 故攝影裝置係沿著Imaged) The image signal of Mmage (3) will be transferred to the team. The newly captured image signal will be stored in Image (3).
ΗΗ
五、發明說明(3) ----—--—~〜 晶元研磨過程摄寻彡吉 μ . a . 攝〜置至個人電腦接收到研磨裝置之晶元破 月或曰日7L離開研磨劈w 洋斗成μ 士外Η表置之訊號才停止攝影。因而,當晶元 產生破片時(2 4、,旦/ & .ί9Α1 , J 衫像戴取系統會保持該狀態並停止運 ;(、),好讓工作人員對Image⑴、Image(2)和 IT彳二9 ^所存之影像加以分析就很容易分析出晶元破裂原 、。 排除困難後再繼續研磨。另一方面,若研磨 f私順利無破片產生,確定晶元離開該研磨裝置後(2 5 將Image(l)棺儲存到Image(2)檔後將Image(3)儲存到V. Description of the invention (3) ------------ ~~ Photograph of the wafer grinding process is taken to search for the μ μ. A. Photo ~ Placed on the personal computer to receive the grinding device, the wafer breaks the moon or the day 7L leaves the grinding The signal was stopped when the signal was placed on the surface of the μ outside. Therefore, when the wafer is broken (2, 4, Dan / &. 9A1, J-shirt wearing system will maintain this state and stop shipping; (,), so that the staff to the Image⑴, Image (2) and It is easy to analyze the original crystal breakage by analyzing the stored image of IT 彳 2. After removing the difficulties, continue to grind. On the other hand, if the grinding process is smooth and no fragments are generated, make sure that the wafer leaves the grinding device ( 2 5 Save Image (l) to Image (2) and save Image (3) to
Image(2)檔,並清空1mage(3)檔(26),並重複整個過程 直至整批晶元研磨結束。 再睛麥閱第3圖,係一種晶元影像截取、合併和儲存 之過程’其主要步驟係包括: (2 ) (3 ) (4 ) (1 )用複數台攝影裝置截取一影像訊號(3丨); 將該影像訊號傳送至一影像接收器(32); 遠接收器接收該影像訊號(3 3 ); 邊接收器將同時截取之影像合併在同一晝面(3 4 進入研磨室(儲存指令是否為Image (2), and empty 1mage (3) (26), and repeat the whole process until the end of the batch of wafer grinding. Looking at Figure 3 again, it is a process of capturing, merging, and storing wafer images. Its main steps include: (2) (3) (4) (1) Intercepting an image signal with multiple cameras (3丨); send the image signal to an image receiver (32); the remote receiver receives the image signal (3 3); the side receiver combines the images captured at the same time on the same day (3 4 into the grinding room (storage Whether the instruction is
ON (5 ) 確認晶元是否進入 (35 ); (6)若晶元進入研磨室,則以一個人電腦(pc)中 取卡數位化截取之影像(3 6 ); 之一檔 影機。至於確認ON (5) Confirm whether the wafer enters (35); (6) If the wafer enters the grinding chamber, use a personal computer (pc) to take a card and digitize the captured image (3 6); a file camera. As for confirmation
Image(3)中(37 ) 其中,步驟(5 )中之攝影機可為CCD攝 (7 )將該數位化截取之影像儲存於該pC5中所設 一案號 89118413 五、發明說明(4) 曰 修正 年月 日H丨補充 方式可由則面所述之輸入/ 而第(4 )步驟中与後韵% /輸出埠所傳出之訊號來確認。 ㉛μ店 驟^〜像截取糸統保持並停止德,為了被主 破片原因,可由工你人g十士 了上1丁止傻馬ί確知 貝來查證’並排除問題,如此的 活,即可恢復正常研磨程序。 的 ^圖所顯示的是上述之處理程序更可以㈣計方式 & 功能,只要將上述過程之第(3 )至(7 )步騍之機 此“ ^合併而成一控制卡,更可使整體系統精簡化。 再明參閱苐5圖’將本發明之輸入/輸出埠(1/〇 P^ort )所輪出之訊號改為小偷進入房間或小偷聲響之訊 號’而將本發明之系統安裝在家庭中即可達到家庭防盜匪 之自動監錄存證之目的。其原理和步驟完全相同於前面所 述者,故在此不再贅述。 以上是有關具智慧型之晶元破片影像監看自動錄製系 統和方法之本發明實施例及變更型式的詳細說明,但對在 此7員域之本發明揭示的内容可具有諸多的替代構造。 圖號說明:Image (3) (37) Among them, the camera in step (5) can be taken by CCD (7) The digitized captured image is stored in a case number set in the pC5 89118413 V. Description of the invention (4) The correction year, month, and day H 丨 supplementary method can be confirmed by the input / described in step (4) and the signal transmitted from the rear rhyme% / output port. ㉛μ 店 骤 ^ ~ like intercepting the system to maintain and stop the morals, in order to be broken by the master, you can get the job by g Shishi 1 Dingzhi stupid horses to confirm the shell to verify 'and eliminate the problem, so live, you can Resume normal grinding procedure. The figure ^ shows that the above-mentioned processing procedure can be calculated in more ways &functions; as long as the machine in steps (3) to (7) of the above process is combined into a control card, it can make the whole The system is simplified. Refer to Figure 5 again to change the signal of the input / output port (1 / 0P ^ ort) of the present invention to the signal of a thief entering the room or the sound of a thief to install the system of the present invention. In the home, the purpose of automatic surveillance and registration of the family anti-robbers can be achieved. The principle and steps are exactly the same as those described above, so I will not repeat them here. The above is about the intelligent wafer chip image monitoring A detailed description of the embodiments and modified types of the present invention of the automatic recording system and method, but there may be many alternative structures for the content disclosed by the present invention in this 7-member domain.
11 攝影裝置 12多機影像傳送器 13多機影像接收器 14同一晝面 15 輸入/輸出埠11 Cameras 12 Multi-camera image transmitter 13 Multi-camera image receiver 14 Same day and night 15 Input / output port
第7頁 492246 圖式簡單說明 第1圖:係本發明硬體實際接連示意圖。 第2圖:係本發明之具智慧型之晶元破片影像監看自動錄 製系統和方法之流程圖。 第3圖:係本發明整個晶元監看影像之截取、合併及儲存 程序圖。 第4圖:係本發明以I C設計方式和控制卡執行晶元監看影 像之截取、合併及儲存程序之示意圖。 第5圖:係本發明衍生及改良之家庭防盜之自動監錄存證 系統之流程圖。Page 7 492246 Brief description of the drawings Figure 1: It is a schematic diagram of the actual connection of the hardware of the present invention. FIG. 2 is a flowchart of the intelligent wafer chip image monitoring automatic recording system and method of the present invention. Fig. 3: It is a flowchart of interception, merger and storage of the whole wafer monitoring image of the present invention. FIG. 4 is a schematic diagram of the process of intercepting, merging and storing the wafer monitoring image by the IC design method and the control card of the present invention. FIG. 5 is a flowchart of an automatic surveillance and record keeping system for home anti-theft derived and improved from the present invention.
第8頁Page 8
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TW89118413A TW492246B (en) | 2000-09-08 | 2000-09-08 | Automatic intelligent recording system and method for monitoring broken wafer image |
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TW89118413A TW492246B (en) | 2000-09-08 | 2000-09-08 | Automatic intelligent recording system and method for monitoring broken wafer image |
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