TW476848B - Measurement probe device - Google Patents

Measurement probe device Download PDF

Info

Publication number
TW476848B
TW476848B TW089115734A TW89115734A TW476848B TW 476848 B TW476848 B TW 476848B TW 089115734 A TW089115734 A TW 089115734A TW 89115734 A TW89115734 A TW 89115734A TW 476848 B TW476848 B TW 476848B
Authority
TW
Taiwan
Prior art keywords
probe
guide
measurement
protection
probe device
Prior art date
Application number
TW089115734A
Other languages
Chinese (zh)
Inventor
Minoru Chiba
Tomoyuki Kojima
Original Assignee
Tokyo Weld Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Weld Co Ltd filed Critical Tokyo Weld Co Ltd
Application granted granted Critical
Publication of TW476848B publication Critical patent/TW476848B/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

The measurement probe device of the present invention is capable of preventing the tip of a measurement probe from being damaged in advance when mounting the measurement probe device to a body base. The invented measurement probe device 10 is mounted to a body base 1 having a probe guide 2. The measurement probe device 10 is provided with a frame 11 and a rocking arm 12, which is installed at the frame 11 and can be rocked freely for retaining a measurement probe 20. A protection guide 22 is provided between the probe guide 2 and the tip side of the measurement probe 20 on the frame 11. When the measurement probe device 10 is mounted to the body base 1, the protection guide 22 is used to protect the measurement probe 20 of the measurement probe device 10.

Description

476848 A7 _ B7 五、發明說明(1 ) 〔發明之技術領域〕 本發明係有關一種具有供測定片狀電子零件之測定用 探針的測定用探針裝置,尤指一種在分解時,可有效保護 測定用探針前端之測定用探針裝置。 〔習用技術之說明〕 按,爲了測定片狀電子零件電氣特性,傳統上係將測 定用探針與電子零件接觸進行測定。 測定用探針係組裝於測定用探針裝置,而測定用探針 裝置係固定脫離自如地安裝於本體基座,該本體基座具有 探針導件,該探針導件中形成有引導孔。 此測定用探針裝置具有一機架,以及一擺動臂,該擺 動臂係擺動自如地設於上述機架,供保持測定用探針。 此種測.定用探針裝置係安裝於本體基座,測定用探針 係插入探針導件之引導孔內,藉由擺動臂之擺動作用,其 會自引導孔突出或縮入。 經濟部智慧財產局員工消#合作社印製 又,該測定用探針裝置係相對本體基座成固定脫離自 如,當將測定用探針裝置安裝於本體基座時,若測定用探 針前端露出於外方,此一測定用探針前端有破損的可能。 〔發明之解決課題〕 如上所述^測定用探針裝置雖相對本體基座成固定脫 離自如,但當將測定用探針裝置安裝於本體基座時,可預 想的是,測定用探針前端與其他零件會有抵接之情形。由 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) -4- 經濟部智慧財產局貝工消费合作社印製 476848 A7 _ B7 五、發明說明(2 ) 於測定用探針前端非常之細且脆,若與其他零件抵接,將 會容易地破損。 本發明係有鑑此點開發而成者,其目的係在提供一種 在安裝於本體基座時,可確實保護測定用探針前端之測定 用探針裝置。 本發明測定用探針裝置,其係固定脫離自如地設於本 體基座,該本體基座具備形成有引導孔之探針導件,其特 徵在於:此測定用探針裝置具有:機架,擺動自如地設於 該機架之擺動臂,保持於該擺動臂,可進入探針導件的引 導孔內之測定用探針,及設於上述機架之探針導件側且具 備供收容測定用探針前端予以保護的保護孔之保護導件; 在將該測定用探針裝置自本體基座部卸除時,擺動臂會擺 動而使測定用探針前端縮入保護導件之保護孔內,令測定 用探針前端由保護導件所保護;當將該測定用探針裝置安 裝於本體基座時,擺動臂會擺動而使測定用探針前端自保 護導件之保護孔進入探針導件之引導孔內。 根據本發明,當將測定用探針裝置自本體基座卸除時 ,測定用探針前端係縮入保護導件之保護孔內,使得測定 用探針前端由保護導件所保護;當將測定用探針裝置安裝 於本體基座時,測定用探針前端係自保護導件之保護孔進 入探針引導孔內,因此,在將測定用探針裝置安裝時,測 定用探針前端不會露出至外方。 〔發明之實施形態〕 本紙張尺度適用中國國家標準(CNS>A4規格(210 X 297公釐〉 ------------!%! —訂---------線一 (請先閱讀背面之注意事項再填寫本頁) -5- 476848 A7 B7 五、發明說明(3 ) 經濟部智慧財產局貝工消费合作社印製 以下,茲佐以圖面將本發明之實施形態說明之。 圖1〜圖6係本發明測定用探針裝置的一實施形態圖 〇 如圖1〜圖6中所示,測定用探針裝置1 0,係固定 脫離自如地安裝於本體基座1,該本體基座1具有一探針 導件2,該探針導件2中形成有引導孔3。 又,當圖未示之工件到達本體基座1之探針導件2上 時,組裝於測定用探針裝置1 0之兩支測定用探針2 〇係 朝上方突出,而以前端接觸於工件、工件之電氣特性,係 由測定用探針2 0所測定。 其次,茲就本發明測定用探針裝置1 0詳述之。如圖 1〜圖6所示,測定用探針裝置1 0備有一固定於本體基 座1之機架1 1,以及在機架1 1上介以支點1 2 a擺動 自如地安裝之擺動臂1 2 ;兩支測定用探針2 0係保持於 擺動臂1 2之前端。 此一場合,測定用探針2 0之自擺動臂1 2而始的上 方部份具有柔軟性,可容易地撓曲。又,本體基座1上係 如上所述般之設有探針導件2,供引導測定用探針2 0之 前端;此一探針導件2中,形成有供測定用探針2 0之前 端側貫通之引導孔3。 擺動臂1 2係可在測定用探針2 0自探針導件2朝上 方突出之突出位置,與測定用探針2 0自探針導件2朝下 方後退之後退位置之間擺動。 又,機架11上固定有電磁線圈19,另一方面,擺 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 閱 讀 背 A 之 注476848 A7 _ B7 V. Description of the Invention (1) [Technical Field of the Invention] The present invention relates to a measuring probe device having a measuring probe for measuring a sheet-shaped electronic part, and particularly to a measuring device which is effective during decomposition A measuring probe device for protecting a measuring probe tip. [Explanation of Conventional Technology] In order to measure the electrical characteristics of chip-shaped electronic parts, conventionally, the measurement probes are brought into contact with the electronic parts for measurement. The measuring probe is assembled in a measuring probe device, and the measuring probe device is fixedly and detachably mounted on a main body base having a probe guide, and a guide hole is formed in the probe guide. . This measurement probe device includes a frame and a swing arm, and the swing arm is swingably provided on the frame to hold the measurement probe. This type of measuring probe device is installed on the base of the body. The measuring probe is inserted into the guide hole of the probe guide, and it will protrude or retract from the guide hole by the swinging action of the swing arm. Printed by the Intellectual Property Bureau, Employees' Department of the Ministry of Economic Affairs # Cooperative Society The probe device for measurement is fixed and detachable from the base of the body. When the probe device for measurement is installed on the base of the body, the tip of the probe is exposed. Externally, the tip of this measuring probe may be damaged. [Solution of the Invention] As described above, ^ Although the measurement probe device is fixed and detachable from the main body base, when the measurement probe device is mounted on the main body base, it is expected that the front end of the measurement probe There may be contact with other parts. The paper size applies the Chinese National Standard (CNS) A4 specification (210 X 297 mm) -4- Printed by the Shelley Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economy Very thin and brittle, it will easily break if it comes into contact with other parts. The present invention has been developed in view of this point, and an object thereof is to provide a measurement probe device which can reliably protect the front end of a measurement probe when mounted on a base of a body. The measuring probe device of the present invention is fixedly and detachably provided on a main body base, the main body base is provided with a probe guide with a guide hole formed, and the measuring probe device has a frame, A swing arm provided on the rack freely swings, held by the swing arm, a measurement probe that can enter a guide hole of a probe guide, and a probe guide provided on the rack and provided for storage The protection guide of the protection hole protected by the front end of the measurement probe; When the measurement probe device is detached from the base portion of the body, the swing arm swings, so that the front end of the measurement probe is retracted into the protection guide. Inside the hole, the front end of the measurement probe is protected by a protection guide; when the measurement probe device is mounted on the base of the body, the swing arm will swing so that the front end of the measurement probe enters from the protection hole of the protection guide. Inside the guide hole of the probe guide. According to the present invention, when the measurement probe device is removed from the base of the body, the front end of the measurement probe is retracted into the protection hole of the protection guide, so that the front end of the measurement probe is protected by the protection guide; When the measurement probe device is mounted on the base of the body, the front end of the measurement probe is inserted into the probe guide hole from the protection hole of the protection guide. Therefore, when the measurement probe device is installed, the front end of the measurement probe is not. Will be exposed to the outside. [Implementation form of the invention] This paper size applies the Chinese national standard (CNS > A4 specification (210 X 297 mm) ------------!%! --Order -------- -Line 1 (Please read the notes on the back before filling this page) -5- 848 848 A7 B7 V. Description of the invention (3) The following is printed by the Shellfish Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs. 1 to 6 are diagrams showing an embodiment of the measuring probe device of the present invention. As shown in FIG. 1 to FIG. 6, the measuring probe device 10 is fixedly detachably mounted on The main body base 1, which has a probe guide 2, and a guide hole 3 is formed in the probe guide 2. In addition, when a workpiece (not shown) reaches the probe guide 2 of the main body base 1, In the above case, the two measuring probes 20 assembled to the measuring probe device 10 are projected upward, and the tip is in contact with the workpiece, and the electrical characteristics of the workpiece are measured by the measuring probe 20. Herein, the measurement probe device 10 of the present invention is described in detail. As shown in FIGS. 1 to 6, the measurement probe device 10 is provided with a fixed base 1 The frame 11 and the swing arm 12 mounted on the frame 11 with a fulcrum 1 2 a swinging freely; two measuring probes 20 are held at the front end of the swing arm 12. In this case, The upper part of the measuring probe 20 from the swing arm 12 is flexible and can be easily bent. In addition, the probe base 2 is provided on the main body base 1 as described above. The front end of the measuring probe 20 is guided; a guide hole 3 is formed in the probe guide 2 for the front end side of the measuring probe 20 to pass through. The swing arm 1 2 can be used for the measuring probe 2 0 The protruding position protruding upward from the probe guide 2 swings with the measuring probe 20 retracted from the probe guide 2 downward and back. The electromagnetic coil 19 is fixed to the frame 11 and the other On the other hand, the size of this paper is in accordance with Chinese National Standard (CNS) A4 (210 X 297 mm).

II

填·· 頁IFill in ·· Page I

I I 訂 • I I I I I -6- 經濟部智慧財產局員工消费合作社印製 476848 A7 B7 五、發明說明(4 ) 動臂1 2上固定有在電磁線圈1 9通電時,由電磁線圈 1 9吸附之吸附板1 7,藉由此等電磁線圈19及吸附板 1 7,構成將擺動臂1 2驅動至突出位置之驅動機構。此 一場合,在吸附板1 7與電磁線圈1 9抵接之位置’係擺 動臂1 2之突出位置。 另,機架1 1上滑動自如地設有軸套1 4,此一軸套 1 4係藉由固定彈簧1 3朝擺動臂1 2側被蓄勢。又,軸 套1 4上安裝有調整螺釘1 6,藉由此調整螺釘1 6保持 阻尼器1 5。又,調整螺釘1 6之外周,安裝有位於軸套 1 4與擺動臂1 2之間的復原彈簧2 1。此一復原彈簧 2 1係構成將擺動臂2 1驅動至後退位置爲止之驅動機構 。擺動臂1 2之後退位置雖係由阻尼器1 5的規制,但藉 由將調整螺釘1 6相對軸套1 4鎖緊及旋鬆,該阻尼器 1 5之位置係可改變。 再者,機架1 1上又設有將朝擺動臂1 2側移動之軸 套1 4的移動予以規制之擋止件2 9。 又,在測定用探針2 0之前端側,在機架1 1上設有 位於機架1 1與探針導件2之間的保護導件2 2。此一保 護導件2 2上形成有保護孔2 2 a供收容測定用探針2 0 之前端予以保護。 測定用探針裝置1 0係相對本體基座1成固定脫離自 如,當自本體基座1將測定用探針裝置1 〇卸除之場合, 測定用探針2 0之前端係縮入保護導件2 2之保護孔 2 2 a內,使得測定用探針2 0之前端由保護導件2 2所 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 0 ϋ I ·ϋ ϋ ϋ amt n ϋ ϋ n i_B« aMmm I · ϋ ·_1 ϋ ϋ ϋ ·1 · 1 ϋ 1 -1 .言 (請先閲讀背面之注意事項再填寫本頁) 線一 476848 經濟部智慧財產局員工消费合作社印製 A7 B7_____ 五、發明說明(5 ) 保護。 另,測定用探針裝置2 0之機架1 1,係藉著將固定 螺栓1 8貫穿本體基座1插固於軸套1 4內,而固定於本 體基座1。 其次,茲就由此等構成所形成之本實施形態之作用說 明之。首先,以圖5表示測定用探針裝置1 〇自本體基座 1卸除之狀態。此一場合下,固定螺栓1 8係自本體基座 1及軸套1 4拔出,藉此,軸套1 4係由固定彈簧1 3朝 下方被蓄勢,而抵接於擋止件2 9停止。 又,由於電磁線圈1 9係成未通電狀態,因此,擺動 臂1 2係藉復原彈簧2 1之作用被壓向阻尼器1 5側〃此 時,測定用探針2 0之前端係縮入保護導件2 2之保護孔 2 2 a內,依此,測定用探針2 0之前端將可由保護導件 2 2所保護。 其次,如圖6所示,測定用探針裝置2 0係被安裝於 本體基座1。此一場合下,固定螺栓1 8係貫穿本體基座 1插固於軸套1 4內,藉由將固定螺栓1 8鎖於軸套1 4 內,藉此,相對本體基座1,達成測定用探針1 0之安裝 〇 如此,藉由將測定用探針裝置1 0安裝於本體基座1 ,測定用探針2 0之前端係自圖4所示之保護導件2 2的 保護孔2 2 a ·,進入圖3所示之探針導件2的引導孔3內 〇 如圖3及圖4所示保護導件2 2之保護孔2 2 a內, 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) ------------1 -----r---訂---------線· <锖先閱讀背面之注意事項再填寫本頁) -8- 476848 A7 _____ B7 五、發明說明(6 係朝探針導件2之引導孔3形成爲漸細狀。因此,配置於 保護導件2 2之保護孔2 2 a的測定用探針2 0之前端, 係可平順地導入探針導件2之引導孔3內。 又,探針導件2之引導孔3,也是形成爲朝外方成漸 細狀。 如上所述,當將測定用探針裝置1 0安裝於本體基座 1時,測定用探針2 0之前端係由保護導件2 2所保護, 因此,測定用探針2 0之前端與其他零件抵接以致破損之 情形不會發生。故而,在測定用探針裝置1 〇安裝時,可 確實地保護測定用探針2 0。 以下,茲就測定用探針裝置1 0安裝於本體基座1後 之作用說明之。 首先,工件係達於探針用導件2之上方。此一場合下 ’電磁線圈1 9係成未通電之狀態,而擺動臂1 2係藉復 原彈簧2 1之作用被壓向阻尼器1 5側,此時擺動臂1 2 係處於後退位置。亦即,測定用探針2 0之前端,不會自 探針導件2突出(請參見圖3)。 其次,以測定用探針2 0測定工件之電氣特性的場合 ,電磁線圈1 9係被通電,藉此,吸附板1 7係被吸附於 電磁線圈1 9,而擺動臂1 2係擺動至突出位置,亦即測 定用探針2 0之前端自探針導件1 8突出之突出位置。 此一場合下,測定用探針2 0係以圓弧形軌道朝上方 移動,但測定用探針2 0之前端係由探針導件2所引導而 可朝正上方昇。又,經由一圓弧形軌道之測定用探針2 0 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 請 先 閱 讀 背 面 之 注 意 事 項 再Order II • IIIII -6- Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 476848 A7 B7 V. Description of the invention (4) The boom 1 2 is fixed with the electromagnetic coil 19 when it is energized. The plate 17 constitutes a driving mechanism for driving the swing arm 12 to the protruding position by the electromagnetic coil 19 and the suction plate 17. In this case, the protruding position of the swing arm 12 is the position where the suction plate 17 is in contact with the electromagnetic coil 19. In addition, a shaft sleeve 14 is slidably provided on the frame 11, and this shaft sleeve 1 4 is stored in a potential toward the swing arm 12 by a fixed spring 13. Further, an adjustment screw 16 is attached to the bushing 14, and the damper 15 is held by the adjustment screw 16. Further, on the outer periphery of the adjustment screw 16, a restoration spring 21 is located between the sleeve 14 and the swing arm 12. This restoring spring 21 constitutes a driving mechanism for driving the swing arm 21 to the retracted position. Although the receding position of the swing arm 12 is regulated by the damper 15, the position of the damper 15 can be changed by tightening and loosening the adjusting screw 16 relative to the shaft sleeve 14. Furthermore, the frame 11 is provided with a stopper 29 for regulating the movement of the shaft sleeve 14 moving toward the swing arm 12 side. On the front end side of the measurement probe 20, a protection guide 22 is provided on the frame 11 between the frame 11 and the probe guide 2. A protection hole 22a is formed in the protection guide 22 to store the front end of the measurement probe 20 for protection. The measuring probe device 10 is fixed and detachable from the main body base 1. When the measuring probe device 10 is removed from the main body base 1, the front end of the measuring probe 20 is retracted into the protection guide. In the protective hole 2 2 a of the piece 22, the front end of the measuring probe 2 0 is protected by the protective guide 2 2 The paper size is applicable to the Chinese National Standard (CNS) A4 (210 X 297 mm) 0 ϋ I · ϋ ϋ mt amt n ϋ ϋ n i_B «aMmm I · ϋ · _1 ϋ ϋ ϋ · 1 · 1 ϋ 1 -1. (please read the precautions on the back before filling this page) Printed by employees' consumer cooperatives A7 B7_____ 5. Description of invention (5) Protection. In addition, the frame 11 of the measuring probe device 20 is fixed to the body base 1 by inserting fixing bolts 18 through the body base 1 into the shaft sleeve 14. Next, the role of this embodiment formed by these structures will be explained. First, a state where the measurement probe device 10 is removed from the main body base 1 is shown in FIG. 5. In this case, the fixing bolt 18 is pulled out from the main body base 1 and the shaft sleeve 14, thereby the shaft sleeve 14 is stored downward by the fixing spring 13 and abuts against the stopper 2 9 stop. In addition, since the electromagnetic coil 19 is in a non-energized state, the swing arm 12 is pressed toward the damper 15 by the action of the return spring 21. At this time, the front end of the measuring probe 20 is retracted. Within the protective hole 2 2 a of the protective guide 22, the front end of the measuring probe 20 can be protected by the protective guide 22. Next, as shown in FIG. 6, the measurement probe device 20 is mounted on the main body base 1. In this case, the fixing bolt 18 is penetrated through the body base 1 and inserted into the shaft sleeve 14, and the fixing bolt 18 is locked in the shaft sleeve 1 4, thereby achieving a measurement relative to the body base 1. Mounting with the probe 10 In this way, by installing the measuring probe device 10 on the main body base 1, the front end of the measuring probe 20 is attached to the protective hole of the protective guide 22 shown in FIG. 4 2 2 a · Into the guide hole 3 of the probe guide 2 shown in Fig. 3 〇 As shown in Fig. 3 and Fig. 4 inside the protection hole 2 2 a of the guide 2, the paper size applies to Chinese national standards (CNS) A4 Specifications (210 X 297 mm) ------------ 1 ----- r --- Order --------- line · < 锖 先Read the precautions on the back and fill in this page again) -8- 476848 A7 _____ B7 V. Description of the invention (6 The guide hole 3 towards the probe guide 2 is tapered. Therefore, it is arranged in the protection guide 2 2 The front end of the measuring probe 20 for the protective hole 2 2 a can be smoothly introduced into the guide hole 3 of the probe guide 2. The guide hole 3 of the probe guide 2 is also formed outward. As described above, when the measuring probe device 10 is mounted on In the case of the body base 1, the front end of the measurement probe 20 is protected by the protection guide 22, and therefore, the front end of the measurement probe 20 does not come into contact with other parts to cause damage. Therefore, in When the measuring probe device 10 is installed, the measuring probe 20 can be reliably protected. Hereinafter, the function of the measuring probe device 10 after it is mounted on the main body base 1 will be described. First, the workpiece is Above the probe guide 2. In this case, the 'magnetic coil 19' is in a non-energized state, and the swing arm 1 2 is pressed to the damper 15 side by the action of the restoration spring 21, and at this time swings The arm 12 is in the retracted position. That is, the front end of the measurement probe 20 does not protrude from the probe guide 2 (see FIG. 3). Next, the electrical characteristics of the workpiece are measured with the measurement probe 20. In this case, the electromagnetic coil 19 is energized, whereby the adsorption plate 17 is attracted to the electromagnetic coil 19, and the swing arm 12 is swung to the protruding position, that is, the front end of the measuring probe 20 is self-probing. The protruding position of the needle guide 18 is protruding. In this case, the measuring probe 20 is a circular arc-shaped rail. It moves upward, but the front end of the measuring probe 20 is guided by the probe guide 2 and can be raised directly upward. Also, the measuring probe 2 through an arc-shaped track is suitable for the country of China. Standard (CNS) A4 (210 X 297 mm) Please read the precautions on the back first

頁IPage I

I I 訂 • I I I I 經濟部智慧財產局員工消t合作社印製 -9- 經濟部智慧財產局貝工消费合作社印製 476848 A7 B7 五、發明說明(7 ) 的橫向移動,係由測定用探針2 0之撓曲而吸收。 當擺動臂1 2來到突出位置時,則開始測定用探針 2 0對於工件之測定件業。 當利用測定用探針2 0之對於工件的電氣測定終了後 ,電磁線圈1 9係成爲未通電狀態,而擺動臂1 2係藉由 復原彈簧2 1之作用回到後退位置。 如上所述,根據本實施例,在將測定用探針裝置1 0 安裝於本體基座1時,測定用探針2 0之前端係由保護導 件2 2所保護,因此,可確實地保護測定用探針2 0之前 端,防止測定用探針之破損。 〔發明之效果〕 如上所述,根據本發明,當將測定用探針裝置安裝於 本體基座時.,由於測定用探針前端不會露出至外方,因此 在安裝之際,測定用探針前端不會抵接於其他零件而招致 破損。 〔圖式簡單說明〕 圖1係本發明測定用探針裝置之一個實施形態圖。 圖2係圖1中箭頭A方向之剖視圖。 圖3係圖1中B部份之擴大圖,其係測定用探針在探 針導件內之狀態圖。 圖4係圖1中B部份之擴大圖,其係測定用探針在保 護導件內之狀態圖。 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 丨丨-! _ I _ _ _ i _ I h _ _ 訂·-丨 I _! •線 (請先閱讀背面之注意事項再填寫本頁) -10- 476848 A7 B7 五、發明說明(8 ) 圖5係測定用探針裝置自本體基座卸除之狀態圖。 圖6係測定用探針裝置安裝於本體基座之狀態圖。 〔元件編號說明〕 1 本體基座 2 探針導件 3 引導孔 10 測定用探針裝置 1 1 機架 12 擺動臂 12a 支點 13 固定彈簧 1 4 軸套 1 5 .阻尼器 16 調整螺釘 1 7 吸附板 18 固定螺栓 經濟部智慧財產局貝工消费合作社印製 19 電磁線圈 2 0 測定用探針 2 1 復原彈簧 22 保護導件 22a 保護孔 2 9 擋止件 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) -11 -Order II • IIII Printed by the Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs -9- Printed by the Shellfish Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 476848 A7 B7 5. The lateral movement of the description of the invention (7) is made by the measuring probe 2 0 deflection and absorption. When the swing arm 12 reaches the protruding position, the measurement of the probe 20 for the workpiece is started. When the electrical measurement of the workpiece with the measuring probe 20 is completed, the electromagnetic coil 19 is de-energized, and the swing arm 12 is returned to the retracted position by the action of the return spring 21. As described above, according to the present embodiment, when the measuring probe device 10 is mounted on the main body base 1, the leading end of the measuring probe 20 is protected by the protection guide 22, so that it can be reliably protected. The front end of the measuring probe 20 prevents damage to the measuring probe. [Effects of the Invention] As described above, according to the present invention, when the probe device for measurement is mounted on the base of the body, the tip of the probe for measurement is not exposed to the outside. The tip of the needle will not come into contact with other parts and cause damage. [Brief Description of the Drawings] Fig. 1 is a view showing an embodiment of a probe device for measurement according to the present invention. FIG. 2 is a sectional view in the direction of arrow A in FIG. 1. Fig. 3 is an enlarged view of part B in Fig. 1, which is a state diagram of the measuring probe in the probe guide. Fig. 4 is an enlarged view of part B in Fig. 1, which is a state diagram of the measuring probe in the protective guide. This paper size applies to China National Standard (CNS) A4 (210 X 297 mm) 丨 丨-! _ I _ _ _ i _ I h _ _ Order ·-丨 I _! • Line (Please read the note on the back first Please fill in this page again for details) -10- 476848 A7 B7 V. Description of the invention (8) Figure 5 is a state diagram of the probe device for measurement removed from the base of the body. FIG. 6 is a state diagram of a measurement probe device mounted on a main body base. [Description of component number] 1 Body base 2 Probe guide 3 Guide hole 10 Probe device for measurement 1 1 Frame 12 Swing arm 12a Pivot point 13 Fixed spring 1 4 Bushing 1 5. Damper 16 Adjustment screw 1 7 Adsorption Plate 18 Fixing bolt Printed by Shelley Consumer Cooperative, Intellectual Property Bureau, Ministry of Economic Affairs 19 Solenoid coil 2 0 Probe for measurement 2 1 Restoring spring 22 Protective guide 22a Protective hole 2 9 Stopper This paper applies Chinese national standard (CNS) A4 size (210 X 297 mm) -11-

Claims (1)

476848 A8 s B8 C8 D8 一六、申請專利範圍 1 · 一種測定用探針裝置,其係固定脫離自如地設於 本體基座,該本體基座具備形成有引導孔之探針導件,其 特徵在於: 此測定用探針裝置具有: 機架, 擺動自如地設於該機架之擺動臂, 保持於該擺動臂,可進入探針導件的引導孔內之測定 用探針,及 設於上述機架之探針導件側且具備供收容測定用探針 前端予以保護的保護孔之保護導件; 在將該測定用探針裝置自本體基座部卸除時,擺動臂 會擺動而使測定用探針前端縮入保護導件之保護孔內,令 測定用探針前端由保護導件所保護;當將該測定用探針裝 置安裝於本體基座時,擺動臂會擺動而使測定用探針前端 自保護導件之保護孔進入探針導件之引導孔內。 2 ·如申請專利範圍第1項之測定用探針裝置,其中 該保護導件之保護孔,係形成爲朝探針導件之引導孔內爲 漸細狀。 (請先閲讀背面之注意事項存4 •装· 訂 線 經濟部智慧財4¾員工消費合作社印製 本紙張尺度適用中國國家樣準(CNS ) A4规格(210X297公釐) -12-476848 A8 s B8 C8 D8 16. Application for Patent Scope 1 · A probe device for measurement, which is fixedly and detachably provided on the body base, which is provided with a probe guide with a guide hole formed. The measuring probe device includes: a frame, a swing arm oscillatingly provided in the frame, held by the swing arm, and a measurement probe that can enter a guide hole of a probe guide, and The probe guide side of the rack is provided with a protection guide for protecting the front end of the probe for measurement. When the probe device for measurement is removed from the base portion of the body, the swing arm will swing and The front end of the measurement probe is retracted into the protection hole of the protection guide, so that the front end of the measurement probe is protected by the protection guide; when the measurement probe device is installed on the base of the body, the swing arm will swing and cause The front end of the measuring probe enters the guide hole of the probe guide from the protection hole of the protection guide. 2 · The probe device for measurement according to item 1 of the patent application scope, wherein the protection hole of the protection guide is formed to be tapered toward the inside of the guide hole of the probe guide. (Please read the Precautions on the back of the book 4 • Assembling and ordering. Wisdom of the Ministry of Economic Affairs 4¾ Printed by the Employee Consumer Cooperative. This paper size applies to China National Standard (CNS) A4 (210X297 mm) -12-
TW089115734A 2000-03-23 2000-08-04 Measurement probe device TW476848B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000082090A JP3664936B2 (en) 2000-03-23 2000-03-23 Measuring probe device

Publications (1)

Publication Number Publication Date
TW476848B true TW476848B (en) 2002-02-21

Family

ID=18598938

Family Applications (1)

Application Number Title Priority Date Filing Date
TW089115734A TW476848B (en) 2000-03-23 2000-08-04 Measurement probe device

Country Status (3)

Country Link
JP (1) JP3664936B2 (en)
KR (1) KR100384358B1 (en)
TW (1) TW476848B (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004129376A (en) * 2002-10-02 2004-04-22 Tokyo Weld Co Ltd Operation control method for electromagnetic drive mechanism
TWI595240B (en) * 2016-02-04 2017-08-11 All Ring Tech Co Ltd Probe fixing guide structure for electronic component inspection device
KR102357238B1 (en) * 2021-10-22 2022-02-08 애프터레인 주식회사 Probe for measuring bioelectrical impedance

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3256124B2 (en) * 1996-02-22 2002-02-12 株式会社ミツトヨ Shape measuring instruments

Also Published As

Publication number Publication date
JP3664936B2 (en) 2005-06-29
JP2001272417A (en) 2001-10-05
KR100384358B1 (en) 2003-05-22
KR20010092634A (en) 2001-10-26

Similar Documents

Publication Publication Date Title
TW378184B (en) Rear derailleur with shock absorber
US5274889A (en) Fastener means
US3827687A (en) Device for supporting sensitive paper cassette for electrophotography copier
TW486401B (en) Laser processing head
TW476848B (en) Measurement probe device
MY126936A (en) Inertial latch for an actuator in a disk drive device
KR19990022628A (en) Monostable Active Latch for Disk Drive Actuator
KR850001707B1 (en) Speed setting device for sewing machine
DE68907286D1 (en) REWINDABLE BARRIER.
US2690348A (en) Magnetic door catch
US2442174A (en) Coin switch
TW559665B (en) Driving apparatus of measuring probe
US1836153A (en) Stylus holder
TW436763B (en) Floppy disc drive chucking device
CN207028536U (en) Inductor governor motion for bar code printer
GB2349416A (en) Improvements in or relating to packaging
JPH0640293Y2 (en) Lock strike
JP2017220323A (en) Card connector and electronic device
JP3388456B2 (en) Money storage device
TW384415B (en) Electric motor mirror drive in a mirror reflective camera
JP2584037Y2 (en) Card detector
JPS6245182Y2 (en)
JP2019157485A (en) Joint cover device
JPS5931413Y2 (en) Printing mechanism
JP2770143B2 (en) Pendulum clock

Legal Events

Date Code Title Description
GD4A Issue of patent certificate for granted invention patent
MK4A Expiration of patent term of an invention patent