TW475060B - Method and device for measuring ion density in liquid crystal panel - Google Patents

Abstract

To measure the ion density in a liquid crystal display panel by a nondestructive method and to know the distribution of ion density in a liquid crystal display panel Flickers are observed by applying square waves of the frequency as low as 1 Hz (step S303). The amplitude of the observed flickers is measured (step S308). The ion density in the liquid crystal panel is calculated from the calibration curve preliminarily obtained (which shows the correlation between the amplitude or area of flickers and the ion density) (step S307).

Description

475060 V. Description of the Invention (1) Technical Field of the Invention The present invention relates to a method and a device for measuring the density (concentration) of impurity ions in a liquid crystal display panel, and particularly relates to a non-destructive measurement of the ion density of a liquid crystal. Method and device. Conventional technology Because the impurity ions in the nematic liquid crystal display panel directly affect the electrical parameters of the panel, it has become the cause of the poor display of the liquid crystal display panel or the quality of the display is reduced. Therefore, in the industrial production operation, it is required to detect the impurity ion density in the liquid crystal display panel of the product at the same time as the problem of the inspection process occurs. In the conventional method, there is a method of knowing the type or concentration of ions in the extracted liquid crystal by electrochemical analysis after destroying the panel, or re-injecting the extracted liquid crystal into the evaluation unit after destroying the panel and measuring the electrical response to determine Methods of ion concentration, etc. However, because these methods need to damage the panel, not only can it be measured after a considerable time has passed since the problem occurred, but also the liquid crystal is recontaminated during the test piece manufacturing operation, which makes it difficult to measure with high accuracy. In addition, the poor display of a liquid crystal display panel is often caused by the uneven distribution of ions in the surface of the liquid crystal display panel. Information on the distribution of ions in the surface is required, but the method of destroying the panel cannot measure the surface of the liquid crystal display panel. Within distribution. In order to obtain the information about the ions in the liquid crystal display panel in a non-destructive manner, it is only necessary to independently measure the electrical characteristics of the pixels forming the liquid crystal display panel. Because information about ions is often derived from the response current waveform to the applied voltage. However, the electrical drive of liquid crystal displays

Page 4 4〇υϋϋ V. Description of the invention (2) The method obtains only some kind of data in a simple matrix, but it affects. In addition, the electrical data of the moving-array liquid crystal are measured after the conventional miscellaneous board is intended to be solved by the invention. In addition, in the process management of the board, one of the objects of the present invention is to make the degree. After the panel's ionic dense current voltage, its degree will be changed. In addition, it is difficult to obtain the most transparent area from a part of the area, and it is difficult to completely use a thin-film electrical display panel for the independence of the liquid crystal panel's LCD display. The subject Mass ion density is not only time-consuming and familiar measurement important information The subject is to solve the non-breaking means to make the above-mentioned purpose Degree measurement method Transmitted light intensity Good self-transmitted photon density. In addition, the intensity of the light reaches the above-mentioned son density measurement display panel. By optimizing the driving conditions of the pixel's response current, it is possible to obtain a driving method for driving off the adjacent electrode-induced crystal (TF T) caused by crosstalk. The method of measuring each pixel independently on the constituent circuit is because the surface force of the liquid crystal display is destroyed, and there is a problem in the measurement accuracy. Method, it is impossible to know the in-plane ion distribution on the liquid crystal display surface. In order to solve the problems of the above-mentioned conventional technology, the first measurement of the ion density of the liquid crystal display panel can grasp the in-plane distribution of the ion density. 'If a liquid crystal is provided according to the present invention', it is characterized in that an alternating flicker waveform is applied to the liquid crystal panel to detect the amplitude or flicker wave of the flicker waveform of the ion-dense intensity in the liquid crystal. Ions, density in some areas. Purpose ‘if provided according to the present invention, a device’ is provided with any device for driving a liquid crystal panel 475060

The intentional waveform generating device, the spleen also ^ a, the elbow first applies the light source of the LCD panel, observes and transmits the 4 _ Agency $ & ^ shirt image sensor and the arbitrary waveform generating device, which controls the arbitrary shape, that is, The liquid crystal surface of a data processing device with a memory device acting like a sensor + an ion bifurcation measuring device from a 7 ^ plate can individually process the long-term image of the surface image sensor I β & t ^, Ask Chan. < The detection data of the valley pixels, and each pixel can be detected. ^^^ It also has an oscilloscope II which can monitor the output waveform of the surface image sensor. The Haibei material processing device collects the output data of the area image sensor through the oscilloscope. Action-In order to obtain information on impurity ions in a liquid crystal display panel, the present invention focuses on the flicker of the transmitted light intensity caused by the ions in the liquid crystal. In addition, positive and negative symmetrical AC voltages are applied to the pixels of the nematic liquid crystal display panel. In the case where ions are not present, an equal voltage is applied to the liquid crystal in each application area of the AC voltage. In this case, the liquid crystal molecules maintain a constant inclination angle without changing according to the magnitude of the applied voltage, and there is no flicker of the transmitted light intensity. Although the details are unclear, internal voltages occur in the liquid crystal cell for some reason. In this case, because the internal voltage and the applied voltage overlap, a voltage having a different size in each applied region acts on the liquid crystal. For example, when the TN mode of a nematic liquid crystal with a positive dielectric anisotropy is the normal white mode, the voltage applied to the liquid crystal becomes higher when a voltage with the same sign and internal voltage is applied, and the tilt angle of the liquid crystal is larger than the ideal tilt angle. , The transmitted light intensity becomes low. However, when a voltage with a sign opposite to the internal voltage is applied to the liquid crystal,

475060 V. Description of the invention (4) — becomes lower, the tilt angle of the liquid crystal is smaller than the ideal tilt angle, and the transmitted light intensity is low. This is an example of the glitter of LCD panels. The period of the flickering (the period of the flickering of the ions independently) is the same as the period of the applied voltage. In addition, there are mobile ions in the liquid crystal that can track the period of the applied voltage. On the second month, the electric field drop caused by the drift of ions occurs in each applied area = the voltage of the liquid crystal decays with time. For example, when a positive voltage is applied, the highest voltage is applied to the liquid crystal at the instant when the voltage is applied, and the liquid level rises. At the same time, as the ions in the liquid crystal begin to drift toward the polarity and the opposite electrode direction, the voltage applied to the liquid crystal over time ^: t This voltage decreases, and the liquid crystal begins to tilt from a certain time = the transmittance also decreases until a certain time, But: Hou Jiyu also: The situation of Changbai mode in his life). Then, the same phenomenon occurs in the £ domain where a negative voltage is applied. Therefore, the frequency of the mobile ion in the case of the right frequency = the rate at which the application rate can be traced. ] 墚 has eight times the frequency of her plus frequency. As shown above, the flicker has a high applied frequency that the electrons cannot track. Therefore, if electricity is applied to a sufficiently low frequency region where the liquid crystal display surface is filled with tracking low frequencies, observations are as follows: Two: Ions can be traced without damaging the liquid crystal display panel, and τ's flicker can be confirmed. The size (flicker amplitude, etc.) and: Said: the existence of ions. And, depending on the degree, by observing the size of the flicker, the ion density in the panel can be known. Also, the size of the flicker and the light: the emitting surface: J can know the ion density. Density is dependent. In other words, each part in the face of the panel, part of the ions of each part 77, the flicker of part of the part is large 475060 V. Description of the invention (5)-Small and dependent on the ion density of the part in the panel. Therefore, in the present invention, a surface-type image sensor such as a CCD camera is used to collect scintillation data of each part 9 in the panel surface, and the ion density of each part in the surface is obtained accordingly. Therefore, according to the present invention, it is possible to recognize the ion density distribution in the plane of the liquid crystal panel. Embodiment of the Invention Next, an embodiment of the present invention will be described with reference to the drawings. Figures 1 to 3 are flowcharts showing an embodiment of the present invention. Fig. 4 is a block diagram showing an outline of a measuring device for performing the ion-density measuring method of the present invention. The light emitted from the light source 41 passes through the polarizing plate 42 after passing through the polarizing plate 43 and then passes through the polarizing plate 43 and is detected by the light detector 45. After the oscilloscope is temporarily collected, it is transmitted to a data processing device 48 such as a personal computer. ,:: Memory device 所附 attached to the material processing device 48. The arbitrary-wave generator 46 is used to apply a voltage to the liquid crystal cell 44. The voltage value with respect to time and the light intensity and transmitted light intensity are stored in the oscilloscope 47 and transmitted to the data processing device 48. The operations of these arbitrary waveform generator 46, light detector 45 and oscilloscope 47 are under the control of data processing device 48. In addition, the program is stored in the memory device 49. When the light source 41 is attached to the entire surface of the liquid crystal cell 44, a _ prime lamp, a metal halide lamp, or a cold cathode tube can be used, and when the liquid crystal is partially irradiated to the liquid crystal unit 44, visible light can be used. Laser. On the photodetector '45, to measure the average light intensity of the entire surface of the LCD panel, a general photodetector that can measure the light intensity can be used, but on the measurement liquid, the crystal unit 44 In the case of local transmitted light intensity, a planar image sensor such as a CCD (Cha ^ e Caupled Development) solid-state imaging device is used. In the latter case,

475060 V. Description of the invention (6) _ The data processing device 48 of each pixel or group of the area image sensor collects and processes it. The data of the detection light is based on and 'can be configured to suppress one side of the side or the light detector 45 side or the double light source 41 lens system of the light detector 41 as needed. To obtain parallel light, the ordinary liquid crystal display panel, polarizing plate and liquid crystal unit are connected together. Therefore, it is not necessary to configure the polarizing plates 42, 43 in the 1-test device for the two solid-arranged brothers. I, ^ 2 hair : According to this, the measurement of the sub-density is performed in accordance with stage i shown in FIG. 1, but not: stage π and the stage shown in FIG. 3 are sequentially performed. The second part in = is used to implement the core of the present invention. : === Obtained data ..., can be saved = Ϊ 因 ΐ ϊ 'that is, the intermediate stage voltage is susceptible to the drift of ions. The pressure is determined when the ion data is measured. The steepness of the transmitted light intensity characteristic curve on the rate graph is better in measurement efficiency. Therefore, in stage 1, the voltage and voltage values are calculated. After the steep area of the rate curve, the application of the flicker measurement is decided Dianbaixian 'In step S1 〇1, specify the voltage to start measurement, in Step S1 02 from the arbitrary waveform generator 46 is applied to the liquid crystal cell 44 are electrically designated

Page 9 4 / ^ 060 V. Description of the invention (7) AC voltage and applied voltage 48. Next, after measuring the voltage units, return to step S105, and change the processing of the steepest change (the obtained v). In addition, the liquid crystal used in a very small amount of ions is made of undoped ion in phase I is in phase. π, value. As long as it is in the stage, in the stage Π curve application liquid unit is made from product ions. First, the voltage value obtained from one of the ion contaminated liquid cells-using a light detector 45 to detect the transmittance at that time, after the data was caught in the oscilloscope 4 7 and passed to the data processing device: 103, check whether the applied voltage has reached a predetermined amount and reported that it has not been reached. S1 02. If the voltage at the end of the measurement is reached, the VT (voltage-transmittance) characteristic curve of shift = will be determined to be one of the characteristic curves after applying the applied voltage for measurement, such as shown in Figure J 0 Show). The liquid crystal cell used will be completely free of ions or containing as a reference,

The yuan is used in the second, 70, 70 every day. Also, in phase I: it can be selected from the units used in the product, and liquid crystal cells determined by the applied voltage can also be used. ^ The voltage value of t 疋 is used in phase η and phase, but it is not necessary to strictly implement the voltage value in the vicinity of & S and stage melon need to use the same applied voltage. Use a multi-plate correction with different ion concentrations. For the correction curve and line. The liquid crystal used in stage II may be selected, but it is also possible to apply a liquid crystal cell containing curve I in advance. Ready to contain as many different concentrations of impurity ions. In step S2 02, select the prepared liquid ^ v S2 0 3 Apply, for example, 1 η z the rectangular wave obtained in phase I, and observe the transmitted light intensity when the voltage is applied, also 475060 V. Description of the invention (8) flicker. Here, the selected 1 Hz at the frequency of the applied voltage is determined because the predetermined ions will be sufficiently saturated. Therefore, if the frequency is suitable for this purpose, it can be changed appropriately. Next, in step S204, it is checked whether there is an area where flicker does not occur, that is, whether there is an area where the transmitted light is fixed. If the area where the transmitted light is fixed does not exist, move to step S205. After reducing the frequency, apply a voltage to perform the amount of flicker. Measurement, return to step S204. In step S204, when it is confirmed that the area where the transmitted light is fixed exists, the process moves to step S206, and the flicker amplitude or flicker area is obtained. Here, the flicker amplitude is the maximum value of the amplitude (absolute value) seen from the area where the transmitted light is fixed, and the flicker area is the area surrounded by the horizontal line and the flicker waveform indicating that the transmitted light is fixed. Next, in step S207, a triangular wave voltage of a low frequency (for example, 0.1 Hz) is applied to measure the current flowing in the liquid crystal cell at that time. Therefore, the current flowing in the unit depends on the ion density contained in the unit. The ion density can be obtained by measuring the current. Therefore, at step S208, the ion density is calculated from the peak value of the ion current at which the obtained response current waveform appears. Next, in step S209, it is checked whether all the prepared liquid crystal cells have been measured. If the measurement is not completed, return to step S202 and select the next liquid crystal cell. When all the prepared liquid crystal cells have been measured, a calibration curve is created in step S2 10. That is, on the correlation diagram, a correction curve is obtained by the combination of the amplitude of the daytime scintillation or the scintillation area and the ion density (for example, the obtained correction curve is shown in Fig. 11). In stages I and II, in the case of a liquid crystal cell used in the preparation stage or in the stage n, a cell having a single pixel is produced. The application of single-pixel units to measure the application of active array liquid crystal display panels

475060 V. Description of the invention (9) The voltage situation, by making a single silly note, # α, to find the application of Lei Yu: two early advance into the virtual active array move the circuit shown in 5 (a), meaning, curve. Figure 5 (a), Figure 51 (a), 51 series waveform generator, 52 series anti-retro, ^ series liquid crystal cell. Here, the impedance transformer 52 performs the action of σκτΓ to interact with the Λ impedance state. The virtual thin film transistor is shown in FIG. 5 (b) and FIG. Segment η, in the case of using the LCD panel of the actual product, active ", night :: surface drive to the same display state. * In this case, for dynamic.] Liquid day display is not displayed on the panel, and active array drive is performed in step S102. Phase 冚 becomes the core of the measurement method of the present invention—whether or not, in movable ions. The applied voltage at this time is determined in phase I :: The frequency is added, for example, using ι〇Ηζ, but according to the gap of the unit 'or The mobility of the ion of the spoon changes the frequency appropriately, as long as it is the frequency of GCi plus voltage or the saturation frequency of the tube; it is acceptable. In the case of detecting the effect of trace ions, the effect of ion shift is brought to t To a large extent, the drift distance between the system and the ions becomes longer: and the ratio is better. However, the influence of θ ions occurs due to the movement of the ions, and the ions can also be detected at the unsaturated frequency. In this case, the measurement time is shortened. ^ Impurity-based ionization In the case of flickering of the child, as shown in FIG. 6, the flickering frequency is shown in the upper part of the input voltage as shown in the upper part of the figure, and a flicker having a frequency of 2% of the applied power is observed. In step S302, it is determined whether flickering occurs. If

Page 12 475060 5 Description of the invention (10) No flash or thorium is observed, ++ is self-throwing, head I 1 At this day, the measurement of the liquid crystal cell 44 is finished. After detecting the flash of the scorpion string moving in the application area; Qiaoliang in step S303, in order to confirm the transmittance after the ion drift; changed =: flicker waveform appears in the application area, observe the flashing. This time, .σσ reduces the application frequency to, for example, 1 Hz. As shown in the figure, the broad green j starts from the flicker caused by impurity ions S303. Steps S301 and S302, and step by step, there is no field = frequency of the voltage applied to the area where the transmitted light intensity is fixed, 拄 =: 2 From the month, move to step S30 5 and reduce the application In the confirmation; step S306 appears in the area. Fig. 7 shows the situation in which the £ field exists. Moving to Fig. 1 where the voltage is applied, the change in transmittance and the state region 71 in the second embodiment. "The difference between the transmittance change = the saturated state of change-ππ + Γ 2 is defined as the flashing amplitude of 73 詈, 目, 七, and the seven water meter is not flashing in the saturated state region 71 of the river. Or, the area Let f be the measurement of the scintillation area 74. Next, surrounded by the ten lines and the scintillation waveform, in step S307, the ion is obtained from the relationship between the pre-moxibustion p ^ flicker amplitude (or flicker area): indicates the ion density and the flicker degree. Next, the detailed description of Example 1 will be described with reference to the drawings. In this example, the ion density of the flashing amplitude in the self-opposing nematic liquid shape wave will be described; 475060 V. Description of the invention (11) The liquid crystal cell used in this embodiment is made as shown in Figs. 8 (a) and (b). As shown in Fig. 8, a 3cmx4cm glass substrate made of Corning 70 5 9 is used. A film of indium tin oxide (IT0) was formed on 81, an image of a pinhole > element electrode 82 was formed in the central portion, and a pull-out electrode 83 was formed. After the electrode was formed, it was spin-coated on top of the electrode to form 9 (rc3〇). After 30 minutes of temporary baking, bake at 0 ° C for 1 hour to form a polyimide orientation film 84. In addition, in order to set up a coincidence, two substrates with an orientation film are needed. Use poly (4,4—biphenylene tetramer) in polyamic acid. Also, The thickness of the polyfluorene-imide oriented film was measured with a reflection-in-vibration ellipsometer 1 from 800 to 800. Grinding using a Rayon roller was performed at a rotation speed of 8000 rpm and a pressure of η rw. The condition is performed once per second. After grinding, the 2R R soil plates 8_ 丨 are overlapped so that their respective grinding directions are opposite, and fixed with an epoxy-based adhesive 8 5 mixed with straight spacer particles. It is homogenized in the unit. Anti-flat ί After the nematic liquid crystal 8 6 ', the hole is sealed with ultraviolet curing resin, as the outer, ^: ^ (phase-the direction of the direction of the 2 planes differs by 180 degrees). This film. ° Not shown' in A liquid crystal cell formed by forming a light-shielding pattern on a glass substrate other than the pixel electrode is arranged in the measuring device shown in Fig. 4. Therefore, the relationship between the polarizing plates 42, 43 and the alignment film 84 in the polishing direction is shown in Fig. 9 (a). “I in China” indicates the polarizing plates 42 and 43 with arrows 91 and 92, respectively, and the polishing direction of the polarized polyimide alignment film 84 is shown in FIG. 9 Xi 1 Austin nine plates 42, 42 hold stop perpendicular to the polarization direction of scholars, and its polarization direction and each RESEARCH

475060 V. Description of the invention (12) Formation of 45 degrees in the grinding direction. As shown above, make multiple pieces of liquid crystal cells in response to the current to determine the ion density. It will not be possible to confirm: off; measurement of the transmitted light intensity characteristic curve on the transmittance graph of electricity. I use it as an electric power ~ As early as the second, I used a liquid for measuring the ion current as a measurement liquid, and used it to make a positive curve from the amplitude of the transmittance described below. Said :, degree & school conditions and the above- # 'but soaked before the substrates are stuck. It is made as a liquid crystal cell for calibration curve production.' The liquid is getting older every day. First, the reference liquid crystal cell was measured. Voltage one [4 measurement device, by using arbitrary waveform to generate two two on two

▲ 、 Only 0.1V interval application, the intensity of the transmitted light and the respective voltage value on the surface of the liquid crystal cell shall be equal to 庳 σθ knife or JE · A surface treated material W / 1 Q ^ Measurement. Then, the program in the time-transmissive memory device 49 is converted to transmittance by applying 0v degrees as _, and transmitting light intensity when applying lov as 0%. The transmitted light intensity characteristic curve of the voltage-transmitted power obtained as a result is shown in FIG. 10. At this time, the emissivity characteristic curve changes the transmittance with respect to the change in voltage. The voltage at the U point is set as the flicker measurement voltage. • In the case of FIG. 10, the analysis result of J using the shell processing device 48 was determined to be 27V. ，， — 人, make a calibration curve to find the ion density from the flicker amplitude. Apply a rectangular shape of ± 27v, lHz to the liquid crystal cell for calibration curve production

IH8, Page 15 475060 V. Description of the invention (13) Wave voltage, find the flicker amplitude (stage Π, steps S203 ~ 206) 5 Then when the triangle wave voltage with amplitude of 10 V, 0 · 〇1 Η z is applied Find the ion density in response to the current (stage Π, steps S207, 208). The calibration curve obtained by measuring the knots of multiple liquid crystal cells is shown in FIG. 11. The ion density is expressed in numbers per cm3 under the assumption that the ions are monovalent and the positive and negative ions are equal. The equation of the obtained calibration curve is as follows. 7V。 Ion density = 2.6 In this example, using the present invention was determined to be 2.7V. It is shown as a rectangle of order 2 · 7V, 10Hz. As shown in Fig. 12, the movable ion 1Ηz can be confirmed, and the flicker amplitude can be obtained (shown. The correction curve [evaluation] can be used to compare the response current at this time to obtain a slight difference. The measurement of the two is valid. X 1012 X flicker amplitude. The liquid crystal cell for measuring the object to be measured is 7. Measure the ion density of these. The flow chart for flicker measurement voltage has been determined (Figure 3). First, apply soil and waves. At that time, One of the flickering waveforms that appears is shown in Figure 12, because flickering has a frequency twice the applied frequency, and there is a second. The frequency of the applied voltage: when the flickering waveform is obtained-for example, the picture shows the flicker of the respective flickering towels. Chang asked for a cut-off degree of 3.13. The results of the ion density obtained from the applied ion density and the self-applied ion density are shown in Table 丨. The results of the angular wave voltage are quite consistent.

Page 16 475060

V. Description of the invention (14) Table 1 The present invention 1.2 5.4 2.4 IS 3.1 2.9 2.2 Triangular wave 1.4 5.2 2 · 1 1.9 2.9 2.8 2.1 (Unit: X 1013 pcs / cm3) Embodiment 2 This embodiment is specifically described by using the following The method of calculating the ion density by showing the flicker area on the graph of the occurrence of flicker. That is, in this embodiment ', firstly, the correction curve of the flicker area is obtained in the phase π, and then the correction curve is used in the phase m to calculate the ion density. The liquid crystal cell used in this embodiment is a twisted nematic (TN) liquid crystal cell made as shown below. By interposing substrates that differ by 90 degrees in the orientation direction, liquid crystals with positive dielectric anisotropy, The orientation direction is continuously twisted by 90 degrees. The liquid crystal cell is a Meiji structure in which a chiral nematic liquid crystal is sandwiched between two glass substrates. The glass substrate used 3cm X 4cm icorning705. As in the case of Example 1 shown in Fig. 8, an indium tin oxide film was formed, a pixel electrode of 1 cm x 1 CU was formed in the central portion of the glass substrate, and a pull-out electrode was formed. After the electrode is formed, it is spin-coated and temporarily baked for 30 minutes at 90 minutes and 30 minutes at 230 ° C for 1 hour to form a polyimide alignment film. Poly (4,4-hydroxybiphenylene pyromellitic acid) is used as the polyfluorinated acid. Page 17 475060 V. Description of the Invention (15) In addition, the film thickness of the film is measured with a reflective polarized light ellipsimeter. System 52〇λ ~ 5 50 Α. Grinding using Rayon's rollers at a rotation speed of 600 rpm / min, pressing in. Sheet 5: Glass II is performed once under the condition of Λ speed A2 ° mm / S. After grinding, 2 pieces? The glass substrate was re-integrated in the direction of grinding, and fixed with epoxy adhesives mixed with straight particles. The unit was homogeneously injected. ^ ΓΓwide wide liquid crystal material. 1 UV-curing resin to seal the holes. T I Γ Ϊ ^ column of liquid crystal cells. To make multiple pieces of this type of liquid crystal cell, the ion density can not be confirmed from the applied-response current: 2 is used to measure the transmitted light intensity characteristic curve and confirm the ion current. As a liquid crystal cell for measurement. B is 7 ° as early as the day of the day. In order to check the ion density from the area generated by the flicker, the system is' made a liquid crystal sheet for forced pollution. But soak it in methanol before the substrate sticks, change the soaking time to make the surface of the orientation film dirty Different dyeing levels = change to a liquid crystal cell for making a right curve. First, the following is the same as in the case of Example 1. The first measurement refers to the transmitted light intensity of the liquid crystal cell for reference [made through I -1 sex curve. # 'Set the liquid crystal cell at the measurement intensity: 0.1v up to ± lov. Apply a rectangular wave of 10Ηζ at an interval of 0.1 ¥, one or all of the opposite * irradiation transmitted light intensity * respective U ,: light And measure. Then, use the stored in the memory device: the transmitted light intensity is 100% when the == plus ον is applied, and the intensity is 0% to convert the transmitted light intensity into the transmittance. Use knotting light 5. Transparent description of the invention (16) ^ ^ The light intensity characteristic curve is prepared as shown in Fig. 14 with the voltage as the horizontal axis and the radiographic rate as the vertical axis. The transmitted light intensity characteristic curve is The voltage at which the change in transmittance with respect to the change in voltage becomes the maximum is set as the flicker measurement voltage. In the case of Figure 丨 4, it is deduced as 3 · 丨 v. It is made by people to determine the area generated by flicker Calibration curve of ion density. Use 4 parent positive curve to make LCD The unit uses the device structure of FIG. 4 to perform the processing of stage n of FIG. 2. That is, after the ion density is calculated from the response current when a triangular wave voltage of amplitude 丨 0v and 0 1 Hz is applied, the amplitude ± 3 · 1 is applied. V, 1 Hz rectangular wave voltage, find the flicker area. The calibration curve obtained from the measurement of multiple liquid crystal cells is shown in Figure 丨 5. The ion density is assumed to be one valence and the positive and negative ions are equal. The number of cm3 is expressed. The formula of the obtained calibration curve is as follows. Ion density = 2 · 3 X 1 (FX flicker area. Secondly, according to the flow chart of stage 图 shown in Figure 3, apply ± 3. 丨 v, 10Hz The rectangular wave 'confirmed the existence of ions as in the case of Example 1. Secondly, change the frequency of the applied voltage to 丨 Hz, measure the flicker waveform, and find the flicker area. One example of the flicker waveform that occurs is shown in FIG. 6. The flicker area is represented by 16 1 in FIG. 16 '. The ion density can be calculated by using the sum of the two of the flicker area 丨 6 1 and referring to the calibration curve just obtained. [Evaluation] Table 2 shows the results of comparing the ion density obtained in this way with the ion density obtained from the response current when a triangle wave voltage was applied. Although there is a slight difference, the results of the two are quite consistent, and it is known that the present invention is effective for ion density measurement. m

Page 19 ^^ 060

Table 2 The present invention 2.8 1.4 0.7 1.7 3 ~ triangle wave 2.4 1.7 0.5 1.9 ~ 3.2 (Unit: X 1 013 pcs / cm3) Example 3 Active iim film transistor (tft) control driving t black and white active matrix liquid crystal The ion density of the display panel. In the example only, the intermediate voltage is used for the measurement voltage, and the measurement of the phase 1 'is not performed. The measurement of the phase π is the same as that used in Example 2—the liquid crystal cell is fabricated by using polarizing plates on both sides of the cell.) An active matrix type liquid crystal display panel is used in the stage dish. The structure of the telemetry device is shown in Fig. 17 and only the device shown in Fig. 4 is changed. The structure of the devices other than the faculty of science and optics is the same as that of Fig. 4. The liquid crystal display panel 170 to be measured is one in which the polarizing plates 172 and 173 are mounted on the liquid crystal cell 171: a halogen lamp is used for the light source 1 7 7 and a lens 1 7 4 on the incident side is used to convert the light into parallel light to illuminate the liquid crystal display panel 1 7 〇Part of the surface or the entire surface. After the light from the lens 175 on the exit side is refocused, it is detected by the CCD detector 176. The concentration of ionic contamination of the liquid crystal cell used for the calibration curve is changed by changing the time when it is placed in the processing environment. The ion currents and degrees of these liquid crystal cells are obtained from the response current when a triangular wave voltage with an amplitude of 10 V,), and 0 1 Hz is applied. In addition, the flicker measurement is performed using the circuit shown in FIG. 5 (a).

Page 20 V. Description of the invention (18) The same conditions as for the calibration curve are also set when the positive curve is as shown in the 18M panel. The resulting ions are poor; no. The equation of the weighted curve is shown below. χ1〇11χflashing amplitude This coefficient is compared with the constant application like 彳, 9 due to the liquid crystal when a rectangular wave is applied. ▲: 1 digit. This is a charge, but in the active-array liquid crystal :::::: 2, the electrode charge is not supplied during the drift of the ions, and the voltage is not supplied during the measurement period. Before the thin film transistor A was reversed to Yang Bei using a one-step process to produce Λ Ah m JtK soil, it was placed in the processing environment for a longer time than a ship before the substrate was stuck to the opposite substrate. Syria longer

Assume that the thin film transistor is applied. Your master A applies an intermediate voltage and the charging time of the prime charge is 1. . The crystal panel is driven here: ° fi499: V Figure 19: For the former liquid = line, the ion density in this region is about 5 × 1 22 / Figure 2 0 For the latter, the formula is + Cheng Xi & Xi Yue, Sun 丨 ^ pieces were exposed to the test piece that handled J Ailing), and the results were measured across the entire face of the panel. In Fig. 20, the black area plate is 1012 /-, the white area system, and the ion density area. In the calculation, the ion density of the area surrounded by the white circle = / cm3 ′ can also be observed and compared visually. 1 (3) It is known that the present invention is effective for evaluating the in-plane ion density distribution of the product-level liquid crystal display panel, that is, the main type liquid crystal display panel. Example 4 Use the ion density measurement method of the present invention to check the display burnout of the main display panel. Bad marks. Black and white active for measurement

Page 21 475060 V. Description of the invention (19) 'The display panel is manufactured in the same manner as in Example 3, and it is placed in the manufacturing process for a longer time than in the case of Example 3 before the substrates are adhered. Furthermore, for the black and white pattern display shown in Fig. 2, the pulse voltage of ± 10V is applied to the black display portion for a charging time i 〇〇 # s and the holding period of 49 · 9ms, and no voltage is applied to the white display portion. After the display continued for 48 hours, when the middle-level voltage gray display was performed on the entire LCD display panel, as shown in FIG. 22, a pattern remaining in the accumulated display portion was thicker than the white display portion. ........ Measure the change in the ion density accompanying the pattern residue. Figure 23 shows the ion density distribution in the panel surface before pattern display. In the figure, the black area is an area where the ion density is less than 5 × 10 12 atoms / cm3, and the white density is higher than the density / cm3. It was found that the ion density may be higher and more uniform than that of Example 3 due to the long processing time. The ion density distribution after 48 hours of pattern display is shown in Figure 24. The ion density of the love display is lower than that of the white display. This ion is poorly produced: it may be due to the adsorption of ions on the surface of the alignment film. In addition, the adsorption of ions on the surface of the film reduces the movable ion density in the liquid crystal, which makes the voltage retention rate of important electrical parameters of the main and column-type liquid crystal display panels rise to τ. As a result, the local voltage retention rate increases, and the transmission is different. Burn marks were confirmed. ^ Poor difference Therefore, if according to the present invention, Min Ke. ^ I0 ^ Thinking 3 can investigate the behavior and separation of the LCD panel

The correlation of the ions can be distinguished from those caused by non-I ions, but can be caused by the ions or by effective devices. In addition, the present invention can be applied to not only liquid crystal display panels but also liquid crystal display panels.

Page 22 V. Invention ____ f is used for-ordinary LCD panel. The effect of the invention is as described above, because the present invention is to detect the ion density of the liquid crystal panel through the liquid crystal panel. The measuring method is equal to the cost. It can be measured non-destructively after the flicker of 2 appears. The invention, because we can know the ion = ion density in the plate. In addition, depending on the ion density of the region, it is possible to provide two distributions in the panel surface or effective local analysis. x, six: analysis of liquid crystal panel operation / defective results, the day j 1 into the right According to the present invention, because the time from the occurrence of the problem to the value of the ion density data = 1 is short, the industrial use pattern is simple Explanation (one figure) 1 is a flowchart for explaining the embodiments and examples of the present invention (one figure) 2 is a flowchart for explaining the embodiments and examples of the present invention FIG. 3 is used to explain the present inventions The flow chart β of the embodiment of the invention and the embodiment is a schematic structural diagram for explaining the embodiment and the quantity of the embodiment of the invention. The three lines are used to explain the circuit and voltage waveforms of the embodiment and the embodiment of the present invention. The electric diagram 0 m shows a waveform diagram (the first) for explaining the embodiment of the present invention. FIG. 7 is a waveform diagram for explaining the embodiment of the present invention (No. 2, FIG. 8 Sun Tian,, J J ′, to illustrate the pattern diagram and cross-sectional view of Embodiment 1 of the present invention

Page 23 475060 V. Description of the invention (21) FIG. 9 is a diagram illustrating the configuration of a polarizing plate according to the first embodiment of the present invention. FIG. 10 is a characteristic diagram (1) for explaining Embodiment 1 of the present invention. FIG. 11 is a characteristic diagram (No. 2) for explaining Embodiment 1 of the present invention. FIG. 12 is a waveform chart (1) for explaining Embodiment 1 of the present invention. FIG. 13 is a waveform diagram (No. 2) for explaining Embodiment 1 of the present invention. FIG. 14 is a characteristic diagram (1) for explaining Embodiment 2 of the present invention. FIG. 15 is a characteristic diagram (No. 2) for explaining Embodiment 2 of the present invention. FIG. 16 is a waveform diagram for explaining Embodiment 2 of the present invention. Fig. 17 is a diagram for explaining the structure of a measuring device according to a third embodiment of the present invention. FIG. 18 is a characteristic diagram for explaining Embodiment 3 of the present invention. FIG. 19 is a waveform diagram for explaining Embodiment 3 of the present invention. Fig. 20 is an ion density distribution diagram for explaining Example 3 of the present invention. FIG. 21 is a pattern diagram for explaining Embodiment 4 of the present invention. Fig. 22 is a pattern diagram for explaining Embodiment 4 of the present invention. Fig. 22 is an ion density distribution diagram for explaining Embodiment 4 of the present invention. Fig. 24 is an ion density distribution diagram for explaining Example 4 of the present invention. Explanation of symbols 41 ~ light source; 4 2, 4 3 ~ polarizing plate; ′ 44 ~ liquid crystal unit; 45 ~ light detector; 46 ~ arbitrary waveform generator; 47 ~ oscilloscope;

Page 24 475060 V. Description of the invention (22) 48 ~ data processing device; 7 1 ~ saturated saturation of transmittance 7 2 ~ minimum transmittance; 74 ~ flicker area; 82 ~ pixel electrode; 84 ~ polyimide; 8 6 ~ nematic liquid crystal; 9 3 ~ rubbing direction; 1 70 ~ liquid crystal display panel; 1 7 2, 1 7 3 ~ polarizing plate; 17 6 ~ (^ 0 detector; 49 ~ memory device; status area; 73 ~ Flicker amplitude; 8 1 ~ glass substrate; 8 3 ~ pull-out electrode; 85 ~ epoxy-based adhesive; 9 1, 9 2 ~ polarizing direction of polarizing plate; 1 6 1 ~ flash area; 1 71 ~ liquid crystal Unit; 174, 175 ~ lens; 1 7 7 ~ light source.

Page 25

Claims (1)

口 5060 6. Application patent scope 1. A method for measuring the ion density of a liquid crystal panel, which is characterized in that the j f crystal panel detects the ion density in the liquid crystal from the flicker waveform of the transmitted light intensity after the AC voltage is applied. Fang 2, · As claimed, the ion density measurement of the liquid crystal panel in item 丨 of the patent scope 1 L, in which the flow voltage of the ions applied in the liquid crystal is sufficiently low to cause flicker. Formulation ^ If the ion density of the liquid crystal panel is saturated according to item 1 or 2 of the scope of the patent application, it includes driving the liquid crystal panel with an AC voltage at which the ions in the liquid crystal can track the applied voltage and the frequency of ^ = and confirming the ion Existing formulas, and claims for patent range 苐 1 or 2 of the ionic density measurement of liquid crystal panels, which include driving the liquid crystal panel with an AC voltage at a frequency that can be traced by the ions in the liquid crystal and: ^ ^ and confirm the ions Existence • If the ionic density measurement of the liquid crystal panel according to item 凊 of the patent application, the voltage value of the AC voltage between the two steps is acceptable. The liquid crystal panel can display the method. Method 6: The ion density of the liquid crystal panel of the first range The amplitude of the flicker waveform of the transmitted light intensity is measured to determine the ion density. Method, in which the horizontal line and the flickering waveform part of the flicker waveform are measured in the flicker waveform of the intensity of transmitted light. The area is not ion-density. Page 26 475060 VI. Patent application method, in which the LCD panel is driven by a rectangular wave or an active array. 9. The method for measuring the ion density of a liquid crystal panel according to item 1 of the scope of patent application, wherein the entire surface of the liquid crystal panel to which an AC voltage is applied is irradiated with uniform visible light. 10. The method for measuring the ion density of a liquid crystal panel according to item 1 of the scope of patent application, wherein a part of the liquid crystal panel to which an AC voltage is applied is irradiated with uniform visible light. 11. The method for measuring the ion density of a liquid crystal panel according to item 1 or 9 of the scope of patent application, wherein the average light intensity of transmitted light emitted from the entire surface of the panel is measured. 1 2 · According to the method for measuring the ion density of a liquid crystal panel in the scope of patent application No. 1, 9, or 10, wherein the intensity of transmitted light from a partial region of the liquid crystal panel is individually measured, and the ion density of each partial region is obtained. 1 3. The method for measuring the ion density of a liquid crystal panel according to item 12 of the scope of patent application, wherein the transmitted light of the liquid crystal panel is observed with a photographic element, and the liquid crystal panel is measured separately for each pixel or each grouped pixel of the photographic element. Of transmitted light. 1 4. An ion density measurement device for a liquid crystal panel, comprising: an arbitrary waveform generating device for driving the liquid crystal panel; a light source for irradiating light to the liquid crystal panel; a surface image sensor for observing light intensity transmitted through the liquid crystal panel; and controlling the arbitrary waveform A liquid crystal panel with a memory device and a processing device with a memory device that generates the actions of the device and the surface image sensor is characterized in that it can separately process the detection data of each pixel of the surface image sensor, Page 27 475060 6. Scope of patent application Flicker can be detected for each pixel. 15. The ionic density measuring device for a liquid crystal panel, such as the item 14 in the scope of patent application, which also includes an oscilloscope that can monitor the output waveform of the surface image sensor. 1 6. The ion density measuring device for a liquid crystal panel according to item 15 of the patent application scope, wherein the data processing device collects output data of the area image sensor through the oscilloscope. Page 28