414867 A7 B7 經濟部申央標準局貝工消費合作社印氧 五、發明説明（） 〈發明領域〉 本發明係有關於一種鍵盤測試系統，尤指一種具自動 測試電子設備鐽盤功能及記錄、儲存測試結果者。 〈發明背景及先前技藝〉 按，鐽盤廣泛使用於各種電子設備中，Μ作為電子設 備之控制命令或資料輸入之週邊設備，例如：常見之個人 電腦、工業控制器、收銀機...等等具資訊輸入功能之電 子設餚，因此，鍵盤之品質優劣及其功能是否可正常操作 ，將直接影響該電子設備之操作穩定性，又，在於鏈盤中 最為直接之操作單元件為按鍵，故按鍵之測試對於鍵盤而 言，食為重要之一環。 然，傅統上，一般業界對於上述鐽盤中之微處理器、 LED顯示燈及按鍵功能之測試，則係Μ人工方式來測試， 即Μ人工方式逐一測試該鍵盤中之微處理器、LED顯示燈 及每一個按鍵，不但費時費工，且其測試效率較低；再者 ，諸如Μ人工逐一歷按按鐽之測試方式，由於每一按鍵應 按之力道大小不一，或因按鍵鍵帽表面歷按受力不均，極 易產生誤判之情況，將使該鐽盤之測試品質更加惡壊，況 且，在測試更多種不同型態鍵盤之狀態下，諸如機械接點 式鐽盤及電容薄膜式鍵盤，其兩者壓按壓力間明顯有差距 ，以習知之人工一逐一壓按測試，將使測賦者因指尖壓按 力道需随時調節變動而倍感艱辛，同時，在測試過程中， 亦極易因壓力之變化過大，而使誤判之機率大幅增加，嚴 重影響鐽盤產品之品質管制，實乃目前業界所極待解決之 -2 - 本紙ft尺度逍用t國國家捸率（CNS Ϊ八4此格（210X297公釐） Ί¾------ —IT------m <請先閏讀背面之注意事項再^本頁) { 414867 A7 B7 五、發明説明（） 主要課題。 〈發明目的及概述〉 緣此，本發明之主要目的，即是在提供一種鍵盤測試 糸統，以逐一自動測試鏈盤之微處理器、按鍵壓按及燈號 顯示功能，節省鐽盤測試之人力及工時，進而提昇鐽盤之 測試效率。 本發明之再一目的，即是在於提供一種鐽盤測試糸統 ，該測試壓按鏈盤之輸出壓按力量一致，Μ使各按鐽壓按 測試之力道均勻，降低誤判機率，Μ提高鐽盤之測試品質 〇 本發明之又一目的，即是在於提供一種鍵盤測試糸統 ,該測試壓按鐽盤之力量可經由元件接觸或氣嘴氣體噴出 之方式，加以精確調整控制，Μ符合不同壓按力道之鍵盤 測試。 為達上述之目的，本發明之鍵盤測試系統，係以一測 試裝置與鐽盤作電氣訊號連結，測試待測鍵盤内之微處理 器，再以一燈號感測器，測試待測鐽盤之顯示燈，並以一 按鐽壓按測試機構，Μ接觸壓按或氣壓噴出觸動之方式， 來歷按測試該待測鐽盤上之按鍵，並配合以一横軸移位機 構横移該待測鐽盤，Μ使每一個按鍵均可被歷按測測試機 構壓按測試，並由該測試裝置於上逑各測試步驟中之其中 一步驟發生偵測錯誤或故障時，驅動一警示裝置發出警示 訊號或燈號，並且該偵測錯誤之訊號或測試結果，則由測 試裝置記錄儲存，以自動測試鏈盤各項功能及記錄其測試 -3 - 本纸fit尺度逍用t國國家鏢準（CNS) Α4洗格{ 210Χ297公釐） (請先閏讀背面之注意Ϋ項再wk本頁) .裝---- 線 經濟部中央標準局負工消費合作社印氧 經濟部中央橾準局真工消费合化社印装 414867 A7 B7 五、發明説明（） 結果。 本發明之詳细構造及實際操作，將藉由以下詳细之說 明使之明確，同時，列舉一較佳實施例，並佐以相關圖式 ,俾使其技術内容及结構空間形態得Μ更加清楚明瞭，其 中： (一）圖式部份： 第一圖係本發明鍵盤測試系統之糸統方塊圖； 第二圖係、本發明鍵盤測試糸統之測試流程圖； 100 鏈盤測試糸統 10 測試裝置 20 燈號感測器 30 按鍵壓按測試機構 31 氣動元件組 32 末端元件組 40 橫軸移位驅動機構 50 警示裝置 200 待測裝置 300 測試鏈盤微處理器功能 310 判別鐽盤微處理器功320 測試鏈盤LED顯示燈功 fit 330 半[JS[J鍵盤LED顯示燈340 測試鍵盤按鍵壓按功能 350 横軸移位逐一壓ί安鍵360 判別鐽盤按鍵歷按功能 盤每一按鐽 370 儲存、記錄鐽盤測試380 發出警示訊號 結果 390 儲存、記錄鏈盤異常 、故障測試結果 -4- 本纸張Λ度遑用中國Η家橾率（CNS ) Α4洗格（2丨0Χ297公釐} \----------ΐ衣-------ΪΤ------.it (請先Μ1#背面之注意事項再wk本頁) { 經濟部4-央橾準局貝工消费合#-社印製 “4867 A7 B7 五、發明説明（） 〈發明之詳細敘述〉 首先請參閱第一圖所示，係本發明之鏈盤測試糸統之 系統方塊圖，Μ下係以100編號來表示本發明之鏈盤測試 糸統，其中，該鐽盤測試糸統100係包括一測試裝置10, 其型態不拘，在本發明中係列舉MPC個人電腦及PLC (可 程式控制器）複合之型態構成者，係具有預設鐽盤測試之 微處理器、顯示燈及按鏈壓按等測試參數、比對判謓測試 結果、錯誤警示及儲存測試資料之功能，且進一步地，並 可作鍵盤自動測試控制流程資訊之儲存及執行，其詳細之 控制流程在以下文中會有詳细說明，容後陳明。且上述之 測試装置10,並Μ電氣連結方式與一待測鏈盤200相連結 ，以使待測鏈盤200之微處理器訊號及按鏈歷按測試訊號 ，得Μ連結送至測試裝置10中判謓比對，旦Μ待測鍵盤20 0中之微處理器測試為優先。 一燈號感測器20,為光感測元件所構成，並用以測試 上述待測鐽盤200上之LED燈號顯示是否正常，並將測言式 結果回傳至上述之測試裝置10中。 一按鍵麼按測試機構30 ,係包括一氣動元件組31及末 端元件組32構成，該氣動元件組31由若干氣應姐所組成， ,受該測試裝置10之驅動，而使其動作桿作伸締之運動， 該末端元件組32則設於該氣動元件組31中之各氣壓姐之動 作桿末端，得Μ接觸待測鐽盤200之按鏈或不接觸待测鐽 盤200之按鐽方式，JE按該待測鍵盤200之按鐽，例如： 該末端元件組32為若干接觸元件構成時，則可藉伸、縮運 -5- 本紙張尺度逍用中國Η家揉率（CMS ) Α4规格（210Χ297公釐> <請先Μ讀背面之注意事項再'^寫本頁} 裝. -Φ 經濟部中央橾準局WC工消費合作社印裝 414867 A7 _ B7 五、發明説明（） 動來接觸應按該待測鐽盤200之按鏈；或該末端元件組32 為若干噴氣氣嘴構成時，則可藉由氣體氣壓唄氣方式，以 不接觸待測_盤200之方式，由該嗔出之氣體壓力控制來 使該待測_盤200之按鐽作壓按操作之動作。 —横軸移位驅動機構40 ,係用Μ驅動横移上述按鍵壓 按測試機構30 ,使該末端元件組32得以藉由逐步横移方式 來逐一地壓按操作該待測鍵盤200中之每一按鐽，使該待 測鐽盤200之每一個按鐽壓按測試結果，得Μ回傳至上述 之測試裝置10中作比對判讀，該橫軸移位驅動機構40係亦 受該測試裝置10之驅動控制，以配合待測鍵盤200之按鏈 佈設位置及鍵距來作同步位移驅動該按鐽壓按測試機構30 〇 一警示裝置50, 為聲音及燈號鉴示元件構成，諸如Λ乂 蜂鳴器及LED顯示燈構成，其中，係受上述測試裝置10之 驅動，Μ於上述待測鏈盤200進行微處理器、LED顯示燈 及按_壓按測試等任一項測試結果有異狀或故陣時，則由 該警示裝置50發出聲音及顯示燈號之警訊，並停止所有測 試動作，以使現場監控人員得Μ將該測試故障或不良之待 測鍵盤200作適當之處置，並且該測試錯誤之結果，同時 送入該測試裝置10中來加以儲存、記錄。 誚再配合第二圖所示，係本發明之待測鍵盤200之測 试流程，即是用來驅動控制上述本發明之鍵盤測試糸統10 0之步驟，其相對之控制軟體寅訊則可寫入及儲存於上述 測試裝置10中來執行，其中，步驟300 ,係測試鍵盤微處 -6 - 本紙ft尺度遑用tHB家#率（CNS ) Α4洗格 ( 2丨〇><297公釐） 扣衣 .I 訂 線 (請先閲讀背面之注意事項再< 寫本頁} { 經濟部中央標準局β：工消费合t杜印製 414867 A7 B7 五、發明説明（） 理器功能之步驟.即是以測試裝置10以電氣連结方式來偵 測該待測鐽盤200中之微處理器功能，再Μ步驟310判讓 微處理器測試功能是否正常，此步驟則以測試裝置10中所 預先儲存之待測鏈盤200之微處理器標準資訊與實際待測 鏈盤200所測得之微處理器資訊加Μ比對，若為正常，則 繼續步驟320 , 即測試鍵盤LED顯示燈之功能，即由上述 之燈號感測器20來加Μ測試該待測鐽盤200中之各LED燈 號之顯示功能，並以步驟330來加Μ判斷該鍵盤LED顯示 功能是否正常，若為正常，則再Μ步驟340進行測試鍵盤 壓按功能，.即是Μ上述按鐽歷按測試機構30來進行該待測 鐽盤200之各按_壓按測試，並再以步驟350進行逐一横 移應按待測鍵盤200上之每一按鍵，以作所有之按鍵測試 ，並以步驟360來判讀該待測鐽盤200之按鐽壓ί安功能是 否正常。 上述步驟360之待測鍵盤200之各按鍵壓按測試功能 判讀，若其結果皆為正常，則以步驟370加以儲存、記錄 其結果，即將該測試功能正常之結果，儲存、記錄於上述 之測試裝置10中，並由該測試裝置10本身之顯示裝置（圖 未顯示）來顯示告知琨場監控人員，Μ對該功能正常之待 測鍵盤200作適當之處置，並繼續下一個待測鍵盤200之 功能測試。 在上述步驟310、步驟330及步驟360中對該待測鍵 盤200之微處理器、LED顯示燈及每一按鏈歷按測試功能 判謓之步驟中，若其中有任一判別步驟為不正常之狀態， —7 — 本纸張尺度適用中國Η家接率（CNS } A4此格（2丨0X297公釐} ；----------¾.-------ΪΤ------0 (請先《讀背面之注意事項再W寫本頁；I { A7 B7 414867 五、發明説明（） (婧先¾讀背面之注意事項再$本頁 即該鏈盤微處理器、LED顯示燈或每一個按鏈功能之任一 者有測試異常或故障之狀態，則進行一蓄示流程，即以步 驟380發出警示訊號，即由該測試裝置10驅動該警示裝置 50發出聲響或燈號顯示，Μ黎示現場監控人員對該測試功 能異常或故障之待測鍵盤作適當之處置，並Μ步驟390加 Μ記錄、儲存該錯誤之測試結果及資訊，並停止一切之測 試動作，直至該測試功能異常或故障之待測鐽盤200作脫 離上述本發明之鍵盤測試系統100之動作為止。 上述本發明所示之鍵盤測試糸統100，由其整體技術 所顯現之發明精神，乃是在於提供一種可自動測試各種電 子設備鍵盤中之微處理器、LED顯示燈及每一按鍵功能， 並自動將其測試結果作儲存、記錄，並於測試功能異常時 ，發出聲訊及記錄其異常及故障之資訊，可達到節省人力 、工時之鍵盤測試效果。 線 經濟部中央揉準局負工消费合作社印装 Μ上第一圖及第二圖所示本發明之鍵盤測試糸統，其 中所揭示之說明及圖式，係僅本發明為便於闉明其技術内 容及技術手段，所列舉較佳實胞例之一隅，並非用Μ拘限 本發明之範_。並且，擧凡一切針對本發明之技術内容所 作之細部修飾，或其元件之等效置換，當不脫離本發明之 發明精神及範囀，其範圍將由以下之申請專利範圍來界定 之。 -8- 本紙伕尺度遑用中Η國家播準（CNS ) Α4Α格（210X297公釐}414867 A7 B7 Printing of oxygen by the Shenyang Bureau of Standards, Ministry of Economic Affairs, Shellfish Consumer Cooperative, V. Description of the Invention (Field of Invention) The present invention relates to a keyboard test system, especially a system with automatic test function for electronic equipment and recording and storage Test results. <Background of the Invention and Previous Techniques> According to this, the disk is widely used in various electronic devices, and M is used as a peripheral device for control commands or data input of electronic devices, such as common personal computers, industrial controllers, cash registers, etc. Such as electronic settings with information input functions, therefore, the quality of the keyboard and whether its functions can be operated normally will directly affect the stability of the operation of the electronic equipment, and the most direct operating unit in the chain plate is the key, Therefore, testing the keys is an important part of the keyboard. However, in terms of Fu Tong, the general test of the microprocessor, LED display light and key functions in the above-mentioned disk is performed by the M manual method, that is, the M manual method tests the microprocessor and LED in the keyboard one by one. The display lamp and each key are not only time-consuming and labor-intensive, and their testing efficiency is low. Furthermore, such as the manual test method of pressing the keys one by one, because the strength of each key should be different, or due to the different keys The surface of the cap is unevenly pressed according to the force, and it is easy to cause misjudgment, which will make the test quality of the disk more horrible. Moreover, under the state of testing more different types of keyboards, such as mechanical contact type disk And capacitive membrane keyboards, there is a clear gap between the two pressing pressures. Pressing the test one by one with conventional manual will make the tester feel hard because the fingertip pressing force needs to be adjusted at any time. At the same time, During the test, it is also very easy to increase the probability of misjudgment due to excessive changes in pressure, which seriously affects the quality control of disk products, which is currently a very urgent issue in the industry. National rate (CNS Ϊ84 this grid (210X297 mm) Ί¾ ------ --IT ------ m < Please read the notes on the back before ^ this page) {414867 A7 B7 V. Description of the invention () Main subject. <Objective and Summary of the Invention> Therefore, the main object of the present invention is to provide a keyboard test system to automatically test the microprocessor, key press, and light display functions of the chain disk one by one, saving the test of the disk. Manpower and working hours, thereby improving the test efficiency of the disk. Another object of the present invention is to provide a test system for testing the disks. The test pressure is consistent with the output pressure of the chain disk, so that the pressure of each test is uniform, reducing the probability of misjudgment, and improving the test accuracy. Test quality of the disk. Another object of the present invention is to provide a keyboard test system. The test pressure can be precisely adjusted and controlled through the way that the power of the disk can be contacted by the component or the gas from the nozzle. Press the keyboard test with force. In order to achieve the above purpose, the keyboard test system of the present invention uses a test device and an electric disk as electrical signals to test the microprocessor in the keyboard under test, and then uses a light sensor to test the electric disk under test. Display the lamp, and press the test mechanism with one press, press the pressure with M or press the air pressure, and then press the button on the test disk to test, and cooperate with a horizontal axis shift mechanism to traverse the test The test disk, M enables each key to be pressed and tested by the test test mechanism, and when the test device detects an error or failure in one of the test steps of the last test, it drives a warning device to issue The warning signal or light signal, and the detected error signal or test result, will be stored by the test device to automatically test the various functions of the chainring and record its test -3-this paper fit standard free use t country national dart standard (CNS) Α4 wash grid {210 × 297 mm) (Please read the note on the back before wk this page) Real Consumer Goods Co., Ltd. Printing 414867 A7 B7 5. Description of the invention () Results. The detailed structure and actual operation of the present invention will be made clear by the following detailed description. At the same time, a preferred embodiment is enumerated, and related drawings are added to make the technical content and structural space shape more M. It is clear, of which: (1) Schematic part: The first diagram is a block diagram of a keyboard test system of the present invention; the second diagram is a test flowchart of a keyboard test system of the present invention; 100 chain disk test system 10 Test device 20 Light sensor 30 Key press test mechanism 31 Pneumatic component group 32 End component group 40 Horizontal axis shift drive mechanism 50 Warning device 200 Device under test 300 Test chain disk microprocessor function 310 Discrimination Processor power 320 Test chain disk LED display light function fit 330 half [JS [J keyboard LED display light 340 test keyboard key press function 350 horizontal axis shift one by one press ampere key 360 judge the disk key calendar press each function panel Press 鐽 370 to store and record the disk test 380 to issue a warning signal result 390 to store and record the chain disk abnormality and failure test results -4- The paper Λ degree is used in China's domestic market (CNS) Α4 wash grid (2 丨 0 × 297 mm) \ ---------- ΐ 衣 -------- ΪΤ ------. It (Please note the back of Μ1 # before wk (This page) {Ministry of Economic Affairs 4-Central Bureau of Standards and Technology Bureau Shellfish Consumption # -printed by the agency "4867 A7 B7 V. Description of the invention () <Detailed description of the invention> First, please refer to the first figure, which is the invention System block diagram of the chain disk test system. The number M below represents the chain disk test system of the present invention with a 100 number. The system 100 of the disk test system includes a test device 10. The type is not limited. In the series of inventions, a combination of MPC personal computer and PLC (programmable controller) is a type of composition. It has a microprocessor with a preset disk test, display lights, and test parameters such as chain pressure and comparison test. The function of results, error warning and storage of test data, and further, it can be used for the storage and execution of keyboard automatic test control flow information. The detailed control flow will be explained in detail in the following text. The test device 10 is connected to a chain link 200 to be tested in an electrical connection manner, so that the micro-processing of the chain link 200 to be tested is performed. The signal and the test signal according to the chain calendar, and the M link is sent to the test device 10 to judge the comparison. The microprocessor test in the M test keyboard 20 is given priority. A light sensor 20 is a light sensor. It is composed of a test element and used to test whether the LED light on the test plate 200 to be tested is normal, and returns the test result to the test device 10. The test mechanism 30 includes a button and a button. The pneumatic element group 31 and the terminal element group 32 are formed. The pneumatic element group 31 is composed of a plurality of air-stressed sisters, and is driven by the test device 10 to cause its action lever to perform an extending movement. The terminal element group 32 is Set at the end of the action lever of each pneumatic pressure sister in the pneumatic component group 31, it is possible to make the M contact the pressing chain of the disk 200 to be tested or not to touch the pressing disk 200, and JE press the button of the keyboard 200 to be tested.例如 For example: When the end element group 32 is composed of several contact elements, it can be extended and contracted. -5- This paper size is free to use China's household kneading rate (CMS) Α4 size (210 × 297 mm) < please Read the precautions on the back first, and then write '^ this page} Install. -Φ Central Standards of Ministry of Economy Printed by WC Industrial Cooperative Cooperative 414867 A7 _ B7 V. Description of the invention () When contacting, the pressing chain of the pan 200 to be tested should be pressed; or when the end element group 32 is composed of several jet nozzles, gas can be used. The air pressure and gas pressure mode, in a way that does not contact the disk 200 to be measured, is controlled by the pressure of the gas released to make the pressure of the disk 200 to be tested. -The horizontal axis shift driving mechanism 40 is used to drive the above-mentioned keys and press the test mechanism 30 horizontally, so that the end component group 32 can press and operate each of the keyboards 200 to be tested one by one by stepwise horizontal shifting. With one click, each test plate 200 to be tested is pressed and the test result is obtained, and M is transmitted to the above-mentioned test device 10 for comparison and interpretation. The horizontal axis shift driving mechanism 40 is also subjected to the test. The driving control of the device 10 is synchronized with the position and key distance of the keyboard 200 to be tested to perform synchronous displacement driving. The pressing test device 30 is a warning device 50, which is composed of sound and light identification elements, such as Λ 乂 buzzer and LED indicator light. Among them, driven by the test device 10 above, the microprocessor performs the microprocessor, LED indicator, and pressing test results on the chain disk 200 to be tested. When there is an abnormality or failure, the warning device 50 will issue a sound and display a warning signal and stop all test actions, so that the site monitoring staff can make the test failure or defective keyboard 200 appropriate. Disposition, and the test is wrong As a result, while feeding the test apparatus 10 to be stored in the record.诮 In conjunction with the second figure, the test flow of the keyboard 200 to be tested of the present invention is the steps for driving and controlling the keyboard test system 100 of the present invention. The writing and storing are performed in the above-mentioned test device 10, wherein step 300 is to test the micro-point of the keyboard -6-this paper ft scale uses tHB home # rate (CNS) Α4 wash grid (2 丨 〇 < 297 (Mm) Button.I Thread (Please read the precautions on the back before you write this page} {Central Standards Bureau of the Ministry of Economic Affairs β: Industrial and consumer stamps 414867 A7 B7 5. Description of the invention () processor Function step. That is, the test device 10 is used to detect the microprocessor function in the disk 200 to be tested by electrical connection, and then step 310 determines whether the microprocessor tests the function normally. This step is to test The microprocessor standard information of the chain link 200 to be tested stored in the device 10 is compared with the microprocessor information measured in the actual chain link 200 to be tested plus M. If it is normal, proceed to step 320, which is to test the keyboard. The function of the LED display light is to add M test by the above-mentioned light sensor 20 The display function of each LED light in the test disk 200 is determined by step 330 to determine whether the keyboard LED display function is normal. If it is normal, then step 340 is performed to test the keyboard pressing function, that is, It is the above-mentioned press calendar and test institution 30 to perform each pressing test of the disk 200 to be tested, and then perform stepwise traverse in step 350. Each key on the keyboard 200 to be tested should be pressed for all Key test, and step 360 to judge whether the pressing and pressing function of the test disk 200 is normal. The test of each key pressing of the keyboard 200 to be tested in step 360 is judged. If the results are normal, Then, the result is stored and recorded in step 370, that is, the result of the normal test function is stored and recorded in the test device 10 described above, and displayed by the display device (not shown) of the test device 10 to inform the market Supervisor, M will properly handle the keyboard 200 to be tested normally and continue the functional test of the next keyboard 200 to be tested. In the above steps 310, 330 and 360, the details of the keyboard 200 to be tested Controller, LED display light and each step of judging by the test function according to the chain calendar, if any of the judging steps is abnormal, —7 — This paper standard is applicable to China's home access rate (CNS} A4 this grid (2 丨 0X297 mm); ---------- ¾ .------- ΪΤ ------ 0 (Please read "Cautions on the back side before writing" This page; I {A7 B7 414867 V. Description of the invention () (Jing first ¾ Read the precautions on the back and then $ This page means that the chain disk microprocessor, LED display light or each of the chain functions have tests If the state is abnormal or faulty, a warning process is performed, that is, a warning signal is issued in step 380, that is, the test device 10 drives the warning device 50 to emit a sound or a light display. Or the faulty keyboard under test is properly handled, and step 390 plus M records, stores the test results and information of the error, and stops all test operations until the test disk 200 that is abnormal or faulty is disconnected The operation of the keyboard test system 100 of the present invention has been described above. The above-mentioned keyboard test system 100 shown in the present invention, the inventive spirit manifested by its overall technology, is to provide a microprocessor, LED display lamp and each key function that can automatically test the keyboard of various electronic devices, and The test results are automatically stored and recorded, and when the test function is abnormal, an audio signal is issued and the abnormal and fault information is recorded, which can achieve the keyboard test effect of saving manpower and man-hours. The keyboard test system of the present invention shown in the first and second figures on the printed product M of the Central Bureau of Work and Consumer Cooperatives of the Central Ministry of Economic Affairs, the description and drawings disclosed therein are for the convenience of the present invention. The technical content and technical means, one of the preferred cell examples, are not intended to limit the scope of the present invention. In addition, all detailed modifications made to the technical content of the present invention, or equivalent replacements of its elements, without departing from the spirit and scope of the present invention, will be defined by the scope of the following patent applications. -8- This paper uses standard Chinese Broadcasting Standard (CNS) Α4Α grid (210X297 mm)