TW400431B - Intracavity laser spectroscopy for detection of gas contaminants - Google Patents

Intracavity laser spectroscopy for detection of gas contaminants Download PDF

Info

Publication number
TW400431B
TW400431B TW86105046A TW86105046A TW400431B TW 400431 B TW400431 B TW 400431B TW 86105046 A TW86105046 A TW 86105046A TW 86105046 A TW86105046 A TW 86105046A TW 400431 B TW400431 B TW 400431B
Authority
TW
Taiwan
Prior art keywords
laser
gas
gas sample
ils
gain medium
Prior art date
Application number
TW86105046A
Other languages
Chinese (zh)
Inventor
George H Atkinson
Esmail Mehdizadeh
Original Assignee
Innovative Lasers Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US08/675,554 external-priority patent/US5742054A/en
Application filed by Innovative Lasers Corp filed Critical Innovative Lasers Corp
Application granted granted Critical
Publication of TW400431B publication Critical patent/TW400431B/en

Links

Landscapes

  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

A gas detection system (10) for detecting the presence of gaseous species in a gas sample containing corrosive gas using a method for detecting the presence of gaseous species in a gas sample containing corrosive gas, the method comprising the steps of: (a) selecting a spectral region wherein (i) said gaseous species has at least one absorption feature and (ii) said corrosive gas has essentially no interfering absorption features; (b) providing a laser (500) comprising a laser cavity (5) and a gain medium (507) which resides therein, said gain medium (507) outputting light having a wavelength distribution at least a portion of which is in said selected spectral region; (c) providing a gas sample cell (406) having windows (404, 405) which are transparent to light in said selected spectral region such that a beam of light can pass through said gas sample cell (406); (d) inserting said gas sample cell (406) in said laser (500) such that light output from said gain medium (507) passes through said gas sample prior to exiting said laser cavity (5); (e) inserting said gas sample containing said corrosive gas in said gas sample cell (406) such that light output from said gain medium (507) passes through said gas sample, said gas sample sealed within said gas sample cell (406) such that said corrosive gas does not react with said laser (500); and (f) directing said light output from said gain medium (507) after exiting said laser cavity (5) to a detector assembly (700) for determining the presence and/or concentration of said gaseous species in said gas sample; said system (10) comprising: (a) said laser cavity (5); (b) said gain medium (507) which resides therein, said gain medium (507) outputting light having a wavelength distribution at least a portion of which is in said spectral region; (c) said gas sample cell (406) which is contained in said laser (500); (d) conduits (408, 409) for inserting said gas sample containing said corrosive gas in said gas sample cell (406); and (e) said detector assembly (700) for determining the presence and/or concentration of said gaseous species in said gas sample, said light output from said laser (500) being directed to said detector assembly (700).

Description

五 、發明説明( A7 B7 你古本毛ϋ大广上有關於氣體中雜質的檢測,更特別地, 術進行氣態分子、原子、自由圓—LS)之雷射技 檢列 圏及/或離子的高靈敏度 在I備用於微電子卫業中之高品質的半導體材料時( 例如,石夕薄膜),眾所周知的是雜質必須被控制。未做好 雜質控制,亦如眾所周知及察知,能夠引致如最終之產品 典型地不能被使用於它們所欲之目的般之重要 的結果。 通常,在石夕薄膜的製程中,開始材料本質上包含氣體 ’典轉^笨重.的㈣广(例如,氫或者氬)便r 特製的(specialtyr (例如,氯化氫、演化氫、 。.被設計«射導崎料之製造設備的成功運作係全缺 視開始氣體的純度,及在氣體至處理$之傳送與材料處理 進行期間之維持氣體純度的氣體處理能力而定。該等開始 氣體之純度的適當控制(即’監視及防止可能被包含於該 等氣體内的高程度雜質)是必要的。 人 很夕刀子原子、自由團、及離子種類係出現於在半 導體材料之製備(例如,化學蒸氣沉積法或者,,cvd〃)與 加工(掺雜及蝕刻)中所使用之笨重和特製的氣體中,它們 會被視為”雜質(contaminants)',。該等雜質會使所製造 出來之半導體材料的品質或者製備半導體材料的效率降級 在控制及/或消除這些雜質中的第一個步驟為在被使 本纸張尺度適用中國國家標準(CNS ) A4規格(210x297公釐) 讀先閏讀背面之注意事項再填寫本頁) 丨0 裝-'1— 訂 r------i — 經濟部中央標準局貝工消費合作社印製 -4 經濟部中央標準局員工消费合作社印製 A7 ~~~____ _._ B7 五、發明説明(2) — 用作為開始材料之笨重和特製彳的氣體中偵測該等雜質。雖 然這是普遍被認定的,然而,迄今所實施的方法普遍為不 適當的。這主要是由於由表面上持續增加被發展之競爭性 工業標準所產生的狀況所致。特別地,隨著微電子裝置的 尺寸被降低而性能規格被加強,氣體.純度的要求(即,微 雜質的不存在)被提升。 面對這樣子的背景,會很清楚的是,若干測量基準對 偵測效力係重要的:(1)絕對檢測靈敏度通常被敘述為在 樣中的總氣體分子數分率(即,每〗0+6背景分子之雜質 分子數分率或者百萬分率);(2)種類選擇性或者測量一種 種類在另一種種類之出現下之濃度的能力;(3)得到一希 望之訊號雜訊比的測量快速性;(4)監視在非反應和反應 氣體中之雜質的能力,·及(5)能夠被測量之氣體濃度的線 性及動力範圍。 用於雜質檢測(例如,水)之目前的習知裝置包含多種 測量技術。例如,用於水蒸氣檢測之目前的習知裝置利用 V電性及電化學,直接吸收頻譜術,和大氣壓為離子化質 、量頻譜術(APIMS)技術。然而,這些方法皆無法適當地提 供這些需求。 特別地,直接吸收頻譜術通常係與來自外部來源之光 線經由該樣品的通過及測量在光線強度上由在樣品中之分 子、原子、自由團、及/或離子吸收所引致的降低有關。 檢測靈敏度主要視兩大數目的相減而定(在通過該樣品之 前之來自外部來源的光線強度與在離開該樣品之後之其之 本紙張尺度適用中國國家標準(CNS ) Α4規格(·210Χ 297公釐) (請先閲讀背面之注意事項再填窝本頁) 訂 Λ 經濟部中央標準局貝工消费合作社印製 A7 ^----- B7 五、發明説明(3) — 強度)。延限制檢測靈敏度到直接吸收係通常被視為低靈 敏度方法論的程度。V. Description of the invention (A7, B7, your ancient book, Mao, Daguang, Guangxi, there are detections of impurities in gas, more specifically, gaseous molecules, atoms, free circles-LS) for laser detection of radon and / or ions When high sensitivity is used for high-quality semiconductor materials in the microelectronics health industry (eg, Shi Xi thin film), it is well known that impurities must be controlled. Inadequate impurity control, as is well known and known, can lead to important results as the final products typically cannot be used for their intended purpose. Generally, in the production process of the Shixi film, the starting material essentially contains a gas, which can be bulky (for example, hydrogen or argon), and a specialtyr (for example, hydrogen chloride, evolutionary hydrogen, ...) is designed «The successful operation of the production equipment for the Radiation Guide Material is completely dependent on the purity of the starting gas and the gas processing ability to maintain the purity of the gas during the transmission of the gas to the process and the material processing. The purity of the starting gas Appropriate control (ie, 'monitoring and prevention of high levels of impurities that may be contained in such gases) is necessary. Knife atoms, free radicals, and ionic species appear in the preparation of semiconductor materials (eg, chemical Vapor deposition or cvd〃) and the bulky and special gases used in processing (doping and etching), they will be regarded as "contaminants'. These impurities will make the manufactured The first step in controlling and / or eliminating these impurities is the degradation of the quality of semiconductor materials or the efficiency of the preparation of semiconductor materials. Home Standard (CNS) A4 (210x297 mm) Read the precautions on the back before filling out this page) 丨 0 Pack-'1— Order r ------ i — Shellfish Consumption of the Central Standards Bureau of the Ministry of Economic Affairs Printed by the cooperative -4 Printed by the Consumers' Cooperative of the Central Standards Bureau of the Ministry of Economic Affairs A7 ~~~ ____ _._ B7 V. Description of the Invention (2) — Detect these impurities in the bulky and special radon gas used as the starting material. Although this is generally recognized, the methods implemented so far are generally inappropriate. This is mainly due to the situation caused by the continuous increase in superficially developed competitive industry standards. In particular, with the The size of the electronic device is reduced and the performance specifications are strengthened, and the gas and purity requirements (ie, the absence of micro-impurities) are improved. In the context of this, it will be clear that several measurement benchmarks are related to the detection effectiveness. Important: (1) Absolute detection sensitivity is usually described as the total number of gas molecules in the sample (that is, the number of impurity molecules or parts per million of 0 + 6 background molecules); (2) species Selectivity or measurement The ability to measure concentrations in the presence of another species; (3) the ability to obtain a desired signal-to-noise ratio measurement speed; (4) the ability to monitor impurities in non-reactive and reactive gases, and (5) capable of Linearity and dynamic range of the measured gas concentration. Current conventional devices for impurity detection (eg, water) include a variety of measurement techniques. For example, current conventional devices for water vapor detection use V electrical and electrochemical Science, direct absorption spectroscopy, and atmospheric pressure are ionizing mass spectrometry (APIMS) techniques. However, none of these methods can properly provide these needs. In particular, direct absorption spectroscopy is usually performed by passing light from external sources through The passage and measurement of the sample are related to the reduction in light intensity caused by the absorption of molecules, atoms, free radicals, and / or ions in the sample. The detection sensitivity is mainly determined by the subtraction of two large numbers (the light intensity from an external source before passing the sample and the original paper size after leaving the sample are applicable to the Chinese National Standard (CNS) A4 specification (· 210 × 297 (Mm) (Please read the notes on the back before filling in this page) Order Λ Printed by Shellfish Consumer Cooperative, Central Standards Bureau, Ministry of Economic Affairs, A7 ^ ----- B7 V. Description of Invention (3)-Strength). Delays limit detection sensitivity to the point that direct absorption systems are often considered low sensitivity methodologies.

I 在本發明的内容中,雷射頻譜術,特別為腔内雷射頻 4術(ILS),係被揭露如一個被使用作為在非常高靈敏度 水平下檢測氣體種類(雜質)的偵測器(感應器)^關於這應 用,雷射頻譜術提供超越習知方法,特別是水蒸氣檢測, 之氣體種類(雜質)檢測之顯著的優點。 在作為氣體種類(雜質)之檢測之雷射的習知應用中, 雷射產生的輪射線係被使用來激磁在雷射外部的氣體樣品 俾可產生一第二訊號(例如,離子化或者螢光或者,雷 射在它通過一氣體樣品之後的強度,對其之初始強度標準 化’能夠被測量(即,吸收)。 大約—十年前,另一種檢測方法論,腔内雷射頻譜術 ,係首次被探討,其中,雷射本身係被使用作為一偵測器 ,見,例如,由 G. Atkinson,A. Laufer, M. Kurylo在 1973 年7月1曰出版之59 Journal Of Chemical Physics中戶斤提出 的 Detection of Free Radicals by an Intracavity Dye LaserI In the context of the present invention, laser spectroscopy, especially intracavity laser radiofrequency 4 (ILS), is disclosed as a detector used to detect gas species (impurities) at very high sensitivity levels ( Sensors) ^ Regarding this application, laser spectroscopy offers significant advantages over conventional methods, especially water vapor detection, and gas type (impurity) detection. In the conventional application of lasers as the detection of gas species (impurities), a laser-generated wheel ray system is used to excite a gas sample outside the laser, which can generate a second signal (eg, ionization or fluorescence Or, the intensity of the laser after it has passed through a gas sample, normalized to its initial intensity 'can be measured (ie, absorbed). About-ten years ago, another detection methodology, intracavity laser spectroscopy, was For the first time, the laser itself was used as a detector, see, for example, 59 Journal Of Chemical Physics, published by G. Atkinson, A. Laufer, M. Kurylo on July 1, 1973 Detection of Free Radicals by an Intracavity Dye Laser

Technique"—文。 腔内雷射頻譜術(ILS)結合通常與其他雷射技術,像 雷射感應螢光(LIF)和多光子離子化(MPI)頻譜術般相關聯 之具有高檢測靈敏度之習知吸收頻譜術的優點。ILS係以 被發現於多模式,同質加寬雷射之光學共振器腔室内之與 氣體種類(例如’原子、分子、自由團、或者離子)中之吸 收相關聯的腔内損失為基礎。這些腔内吸收損失以在該雷 本紙張尺度適用中國國家標準(CNS ) Λ4規格(210Χ297公釐) ---^-------©裝! (請先閱讀背面之注意事項再·填寫本頁) 訂 -6- A7 __ B7 五、發明説明(4) ^ ~~-- 射裝置(即,增益媒質)中所產生的增益,透過一多模式雷 射的正常模式動力學來競爭。典型地,似研究係藉著染 料雷'射的使用來被支配’因為它們的多模式特性滿足有效 模式角逐所需的條件且它們的寬廣可調譜性提供進入很多 不同之氣體種類的頻譜。某些ILS實驗冑已就多模式,可 調错固態f射裝置來被執行,像色彩_心及鈦:藍寶石般 ;£ « > *D. Gilmore, P Cvijin, G. Atkinson^Optics C〇mmunications 77 (199〇) 385_89 中所提出的,,intracavity Absorption Spectroscopy With a Titanium : Sapphire Laser-—文。 ILS亦業已被成功地使用來檢測在實驗條件下穩定及 知:暫種類,其中,咼檢測靈敏度的要求已排除吸收頻譜術 為一種上選的方法。例如,ILS業已被使用來在如低溫冷 卻室、電漿放電、光解和熱解還原、及超聲波喷射渗)脹般 之環境測驗中檢測氣體樣品。11^更業已被使用來經由吸 收線形狀的分析獲得定量吸收資訊(例如,線強度和碰撞 加寬係數)°其中一些係被描述在由G. Atkinson於SPIE Conf·,Soc. Opt. Eng. 1637 (1992)中所提出的,’Intracavity Laser Spectroscopy"内 〇 然而’執行ILS的習知方法,雖然係適於在實驗室環 境中使用’但在商業環境中係不可被接受的。商業事實的 拘束’如以上簡潔地記錄般,本質上是該一種偵測器為便 利地定以尺寸、相當便宜、及可靠的。實驗模型完全不能 符合這些要求。 本紙張尺度適用中國國家榡準(CNS ) Λ4規格(210X297公釐) ---------oil— (請先閲讀背面之注意事項再填寫本頁) 訂Technique " —text. Intracavity laser spectroscopy (ILS) combines conventional absorption spectroscopy with high detection sensitivity that is often associated with other laser technologies like laser-induced fluorescence (LIF) and multi-photon ionization (MPI) spectroscopy The advantages. ILS is based on the intra-cavity loss found in a multimode, homogeneously widened laser cavity of an optical resonator that is associated with absorption in a gas species (eg, 'atoms, molecules, free radicals, or ions). These absorption losses in the cavity are in accordance with the Chinese National Standard (CNS) Λ4 specification (210 × 297 mm) at the size of this paper. (Please read the notes on the back before filling in this page) Order-6- A7 __ B7 V. Description of the invention (4) ^ ~~-The gain generated in the radiation device (ie, the gain medium), Mode lasers compete with normal mode dynamics. Typically, research systems are dominated by the use of dye lasers because their multi-mode characteristics meet the conditions required for effective mode competition and their wide adjustable spectrum provides access to the spectrum of many different gas species. Some ILS experiments have been performed on multi-mode, adjustable error solid-state f-radiation devices, such as color_heart and titanium: sapphire; £ «> * D. Gilmore, P Cvijin, G. Atkinson ^ Optics C〇 As proposed in mmunications 77 (199〇) 385_89, intracavity Absorption Spectroscopy With a Titanium: Sapphire Laser. ILS has also been successfully used to detect stable and known species under experimental conditions. Among them, the requirement for tritium detection sensitivity has excluded absorption spectrum as a preferred method. For example, ILS has been used to detect gas samples in environmental tests such as cryogenic cooling chambers, plasma discharge, photolysis and pyrolysis reduction, and ultrasonic jet infiltration. 11 ^ has been used to obtain quantitative absorption information (eg, line strength and collision widening coefficient) through analysis of the shape of the absorption line. Some of these are described by G. Atkinson in SPIE Conf ·, Soc. Opt. Eng. Proposed in 1637 (1992), 'Intracavity Laser Spectroscopy', however, 'the conventional method of performing ILS, although suitable for use in a laboratory environment', is unacceptable in a commercial environment. The constraints of business facts' are as concisely recorded as above, essentially this kind of detector is conveniently sized, relatively cheap, and reliable. The experimental model cannot meet these requirements at all. This paper size applies to China National Standard (CNS) Λ4 specification (210X297 mm) --------- oil— (Please read the precautions on the back before filling this page) Order

J 經濟、哪中央標準局貝工消費合作社印製 :HM置心飄Γ—...... -7- 經濟部中央標準局—工消费合作社印製 A7 __B7 五、發明説明(5) ~ 此外,在ILS檢測能·夠被施加的商業環境中,該氣體 樣品會被包含在一個非理想的環境中。特別地,就工業生 產方‘法而言,該氣體樣品係通常被包含在腐蝕性的氣體内 。例如,在半導體組件的製造中,在腐蝕性氣體的出現下 (像氣化氫般)檢測雜質(像水蒸氣般)之出現的能力會特別 有用的。 使用ILS技術以Cf: YAG雷射來檢測在氮保護氣氛中 小量水蒸氣之可行性的實驗證明係被描述在由D. Gi]m We, Ρ· Cvijin,G. Atkinson在〇ptics Communicati〇ns 1〇3 (i993) 370-74 中所提出的"Intracavity Laser Spectr〇sc〇py 比丈心J Economy, which printed by the Central Standards Bureau Shellfish Consumer Cooperative: HM 心心 飘 Γ —...... -7- Printed by the Central Standards Bureau of the Ministry of Economy—Industrial Consumer Cooperatives A7 __B7 V. Description of Invention (5) In addition, in commercial environments where ILS testing can be applied, the gas sample will be contained in a non-ideal environment. In particular, in the case of the industrial production method, the gas sample is usually contained in a corrosive gas. For example, in the manufacture of semiconductor components, the ability to detect the presence of impurities (like water vapor) in the presence of corrosive gases (like hydrogen gas) can be particularly useful. The feasibility of using the ILS technology with Cf: YAG laser to detect small amounts of water vapor in a nitrogen-protected atmosphere is described in D. Gi] m We, P. Cvijin, G. Atkinson in Optics Communicatións Introcavity Laser Spectr〇sc〇py proposed in 1〇3 (i993) 370-74

1-38-1.55 Spectral Region Using a Multimode Cr4+:YAG 雷射',内。所使用的實驗裝置就運算特性的證來 意的,但對於如本發明所考慮般之商業應用上的實施= ,例如,對於如氯化氫(HC1)般之腐蝕性氣體中之水蒸氣 的檢測,則不理想。 根據本發明的各種特徵,本發明提供一種具有婁接吸 收技術之優點卻有戲劇性地增加之檢測靈敏度之使用者有 利的,即,相當簡單的,檢測系、统,其能夠以商業上可實 盯的成本來檢測在反應和非反應樣品中的氣體種類,特別 是在腐純樣品中。關於這一點,本發明提供長久以來痛 刀所南之種進行在反應和非反應樣品_之雜質之高靈敏 度檢測之方法及裝置,特別是在商業環境中的腐钱性氣體 系統中。 根據本發明,一種用於檢測在—氣體樣品甲之氣體種 本纸張尺錢财_家標準(CNS ) M規格(21{)χ_ϋ^~·~~~-- -8 - (請先閲讀背面之注意事項再•填寫本頁} -3 -----------------,一__ 五 、發明説明(6) A7 B7 經濟部中央標準局負工消費合作社印製 類之出現的氣體檢測线係被提供。該檢測系統包含: (a)—雷射腔; ;(b) 一摻雜離子的晶體; 外邻⑷:抽送雷射器,該抽送雷射器被定位於該雷射腔 夢二具有一光學地激磁該摻雜離子之晶體的輸出端, 错此產生一離開該雷射腔的輸出束流;及 揭⑷一谷盗’該容器係用於容置在該雷射腔内的氣體 ,’在離開該雷射腔之前,該摻雜離子之晶體的輸出束 流通過該氣體樣品。 卜㈣於&測在包含腐钱性氣體之-氣體樣品 中之氣體種類之出現的方法係被提供。該方法包含如下之 步驟: ⑷選擇一光譜範圍’其中(0氣體種類具有至少一吸 收特徵及⑼腐純氣體本f上不具有吸收特徵; ⑻提供-雷射器,該雷射器包含—雷射腔及一位於 其内的增益媒質,該增益媒質輸出具有—波長分佈㈣線 ,該波長分佈的至少一部份係在所選擇的光譜範圍内; (C)提供-氣體樣品槽,該氣體樣品槽具有對於在所 選擇之光譜範圍内之紐來說係透明的透窗以致於一光線 束流能夠通過該氣體樣品槽; (d) 將該氣體樣品槽插入該雷射器内以致於來自該增 益媒質的輸出光線在離開該雷射腔之前通過該氣體樣品; (e) 將包含腐蝕性氣體的氣體樣品插入該氣體樣品槽 内以致於來自該增S媒質的輸出光線通過該氣體樣品,該 本紙張尺度適用中國國家標準(CNS ) A4規格(2丨0X297公釐) (請先閱讀背面之注意事項#-填寫本頁) ~Γτ裝丨· --訂·------1^.----- - - m —I f m m · -9-1-38-1.55 Spectral Region Using a Multimode Cr4 +: YAG Laser ', inside. The experimental device used is based on the proof of the computing characteristics, but for commercial implementation as considered by the present invention =, for example, for the detection of water vapor in corrosive gases such as hydrogen chloride (HC1), then not ideal. According to the various features of the present invention, the present invention provides a user who has the advantages of the absorption technology but has a dramatic increase in detection sensitivity. That is, it is quite simple, and the detection system can be commercially implemented. The cost of detection is to detect the types of gases in reactive and non-reactive samples, especially in pure samples. In this regard, the present invention provides a method and apparatus for the long-term sensitivity detection of impurities in reactive and non-reactive samples, particularly in the case of corrupted gas systems in commercial environments. According to the present invention, a paper ruler for detecting gas samples in a gas sample A money rule _ house standard (CNS) M specification (21 {) χ_ϋ ^ ~ · ~~~--8-(Please read first Note on the back again • Fill out this page} -3 -----------------, I __ V. Description of invention (6) A7 B7 Off-line consumption by the Central Standards Bureau of the Ministry of Economic Affairs Co-operative printed gas detection lines are provided. The detection system includes: (a) a laser cavity;; (b) an ion-doped crystal; outer neighbors: a pumped laser, the pumped laser The emitter is positioned at the output end of the laser cavity Dream II, which has an optically excited crystal of the doped ion, which in turn produces an output beam leaving the laser cavity; and exposes the container system. Used to contain the gas in the laser cavity, 'before leaving the laser cavity, the output beam of the ion-doped crystal passes through the gas sample. -A method for the appearance of gas species in a gas sample is provided. The method includes the following steps: ⑷ Select a spectral range 'where (0 gas species has at least Absorptive characteristics and sacrificial pure gases have no absorptive characteristics; 本 Provides a laser, which includes a laser cavity and a gain medium located in it, the output of the gain medium has a wavelength distribution chirp At least a part of the wavelength distribution is within the selected spectral range; (C) Provide-a gas sample tank having a transparent window for a button in the selected spectral range so that A beam of light can pass through the gas sample tank; (d) insert the gas sample tank into the laser so that the output light from the gain medium passes through the gas sample before leaving the laser cavity; (e) A gas sample containing a corrosive gas is inserted into the gas sample tank so that the output light from the S-increasing medium passes through the gas sample. The size of this paper applies to the Chinese National Standard (CNS) A4 specification (2 丨 0X297 mm) ( Please read the precautions on the back # -Fill this page first) ~ Γτ Equipment 丨 ------ Order ------ 1 ^ .-------m —I fmm · -9-

經濟部中央標準局貝工消费合作社印製 五、發明説明(7) 氣體樣品被密封於該氣體樣品槽内以致於該腐蝕性氣體不 與雷射反應;及 I · ‘(f)在離開該雷射腔之後,指引該增益媒質的輸出束 流至一檢測器總成俾決定在該氣體樣品中之氣體種類的出 現及/或者濃度。 本發明的ILS氣體檢測系統最好包含一個被使用來提 供運作該ILS雷射器所需之光學激磁的抽送雷射器、在該 波長範圍運作的一多模式ILS雷射器,在該波長範圍中有 趣的種類吸收、一氣體樣品槽,該氣體樣品槽被置放在該 ILS雷射器的光學共振器腔内,其可以包含腐蝕性氣體、 能夠以分光譜分解該ILS雷射器之輪出的一波長散佈光譜 儀、能夠測量該ILS雷射器輸出之分解波長強度的檢測器 、及一電子電路,該電子電路能夠讀取來自該檢測器的訊 號並且轉換它成能夠被一電腦處琿的電子訊號。該ILS氣 體檢測系統亦可以包括被設計來周期性地中斷該抽送雷射 器束流之強度及來自該ILS雷射器之輸出的一斬波、脈衝 調制、或者調變總成。 根據本發明的各種特徵,雜質係藉著使用ILS技術在i 個十億分率(ppb)之下及延伸到一個低於丨個千億分率(ppt) 之程度的濃度下被光學地檢測。在腐蝕性氣體中,在j個 百萬刀率(ppm)及延伸至一個低於1個ppb之程度的濃度能 夠被檢測。就檢測在HC1中的水蒸氣而言,一個有掺雜有 離子之晶體裝置及在1300nm至150〇nm光譜範圍中運作的 固態雷射器最好作用為偵測器。包含氣態雜質種類(例如 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) <.請先閱讀背面之注意事項再·填寫本頁) I .~7 丨IT_----------- -10- 五、 發明説明(8) A7 B7 經濟部中央標準局貝工消費合作社印製 ,水蒸氣)及腐蝕性氣體(例如,HC1)的氣體樣品係被置放 在該辑射器的光學共振器腔内部(在反射表面或者鏡之間) 及在'有源裝置的一側上。具有Cr4+:YAG&Cr4+:LuAG的雷 射裝置係被描述於此,但像其他具有多縱向及橫向腔模式 之摻雜離子之晶體般的其他增益媒質也能夠被使用。其他 雷射系統亦可以被使用。例如,具有一摻雜離子之晶體裝 置之一抽送二極管雷射的固態雷射器可以被光學地構形來 提供ILS檢測.。 本發明之較佳的模範實施例會配合附圖來被描述在下 文,其中相同的標號標示相同的元件。除非有特別註明, 在這描述中所參考的該等圖式應要被了解並非依據比例修 製。 S 第1A和1B圖係本發明之雜質檢測器系統的示意方塊 圖;第1A圖顯示基本構形,而第1B圖貝j顯示被實施在第2 圖中所顯示之模範實施例中的構形; 、第2圖係本發明之雜質檢測器系統之模範實⑽之更 詳細的示意立體圖; 第3 A至3C圖包括簡單之雷射萝番认_ 土门 J于〜由耵屐置的不意圖及從該等 裝置所獲得之伴隨的圖解式光譜輪出; 第4圖係包括在第2圖中所騎之室組件之—ils室的 示意立體圖,某些組件似部份拆除形式來被顯示; 第5圖係-模範ILS雷射晶體固持器和在第·中所顯 示之雜質檢測器系統中有用之散埶 双热益的立體圖; 第6圖係一束流成形裝置之植^ <极祀貫施例的擴大立體 圖 {7 ;裝-TI (請先閎讀背面之法意事項展填寫本頁) 、17 'y 本紙張尺度適用中國國家標4*.(匚阳)八4規格(210\ 297公楚 A7 A7 五、發明説明(9) 經濟部中央標準局負工消費合作社印製 B7 ’該裝置包括一斬波元件,其可以有利地被使用於在第2 圖中所顯示的雜質檢測器系統中; 第7圖描繪顯示在乂與^^丨氣體中之模範水吸收光譜 在1433-1440¾微米之波長内的圖表; 第8圖描繪顯示在N2與HC1氣體中之ILS水吸收在 1420-1434毫微米之波長内的圖表; 第9圖描繪顯示藉著滲透管/體積膨脹技術所測定之 水吸收強度對水濃度的圖表;及 第10圖描繪顯示藉著一直列式淨化器所測定之在 1420-1430nm範圍中水吸收強度對水濃度的圖表。 現在睛詳細參考本發明的特定實施例,其描繪本案發 明人目前為了實施本發明所考慮的最佳模式。其他的實施 例亦適當地被簡略描述。 如先前簡略地提到,本發明的主題係特別適合使用於 半導體組件的製造,而因此,本發明的較佳模範實施例將 會與半導體組件的製造相關聯地來作描述。然而,馮要確 認的是,該描述並不是作為限制本發明的使用或者應用性 ,而僅只是描述本發明的一較倖模範實施例而已。 關於這一點,本發明係特別適合雜質的檢測。在此中 所使用的雜質係指像可能出現於氣態材料般之分子、原子 、自由團、及離子種類,像在被使用於秒薄膜之製造中的 氣態材料,即,吸油管路。或者,該名詞雜質亦可以指氣 體材料本身,冑’例如,當本發明的檢測器係被使用來決 疋e路(例如,HC1官路)是否已充分地排除氣態材料般 本紙張尺度適用中國國家標準(CNS ) A4規格(210^75^7 「請先閱讀背面之注意事項再•填寫本頁)Printed by Shellfish Consumer Cooperative of the Central Standards Bureau of the Ministry of Economic Affairs 5. Description of the invention (7) The gas sample is sealed in the gas sample tank so that the corrosive gas does not react with the laser; and I · '(f) is leaving the After the laser cavity, the output beam of the gain medium is directed to a detector assembly to determine the appearance and / or concentration of the type of gas in the gas sample. The ILS gas detection system of the present invention preferably includes a pumping laser used to provide the optical excitation required for operating the ILS laser, and a multi-mode ILS laser operating in the wavelength range. An interesting kind of absorption, a gas sample tank, which is placed in the optical resonator cavity of the ILS laser, which can contain corrosive gases and can be used to split the spectrum of the wheel of the ILS laser. A wavelength dispersion spectrometer, a detector capable of measuring the intensity of the decomposed wavelength output by the ILS laser, and an electronic circuit that can read the signal from the detector and convert it into a signal that can be processed by a computer. Electronic signal. The ILS gas detection system may also include a chopping, pulse modulation, or modulation assembly designed to periodically interrupt the intensity of the pumping laser beam and the output from the ILS laser. According to various features of the present invention, impurities are optically detected by using ILS technology at a concentration of i billion parts per billion (ppb) and extending to a concentration of less than a hundred parts per billion (ppt). . In corrosive gases, concentrations at j million knife rate (ppm) and extending to a level below 1 ppb can be detected. For the detection of water vapor in HC1, an ion-doped crystal device and a solid-state laser operating in the 1300nm to 150nm spectral range are best used as detectors. Contains gaseous impurities (for example, this paper size applies Chinese National Standard (CNS) A4 specification (210X297 mm) < .Please read the precautions on the back before filling in this page) I. ~ 7 丨 IT _----- ------ -10- V. Description of the invention (8) A7 B7 Printed by the Shellfish Consumer Cooperative of the Central Standards Bureau of the Ministry of Economic Affairs, water vapor) and corrosive gases (for example, HC1) gas samples are placed The collector's optical resonator cavity is inside (between the reflective surface or the mirror) and on the 'active device' side. A laser device having Cr4 +: YAG & Cr4 +: LuAG is described here, but other gain media like other ion-doped crystals with multiple longitudinal and lateral cavity modes can also be used. Other laser systems can also be used. For example, a solid-state laser with a pump diode laser, one of an ion-doped crystal device, can be optically configured to provide ILS detection. Preferred exemplary embodiments of the present invention will be described below with reference to the drawings, in which the same reference numerals denote the same elements. Unless otherwise noted, the drawings referred to in this description should be understood not to scale. S Figures 1A and 1B are schematic block diagrams of the impurity detector system of the present invention; Figure 1A shows the basic configuration, and Figure 1B shows the structure implemented in the exemplary embodiment shown in Figure 2 Figure 2, Figure 3 is a more detailed schematic perspective view of the model of the impurity detector system of the present invention; Figures 3 A to 3C include a simple laser fan recognition _ Tumen J Yu ~ set by It is not intended and the accompanying graphical spectrum wheel obtained from these devices; Figure 4 is a schematic perspective view of the ils room including the components of the room riding in Figure 2. Some components seem to be partially removed. Is shown; Figure 5 is a perspective view of a model ILS laser crystal holder and scattered dual heat gains useful in the impurity detector system shown in Figure · Figure 6 is a plant of a beam forming device ^ < Enlarged three-dimensional view of the extreme example {7; equipment-TI (please read the French and Italian matters on the back to fill out this page first), 17 'y This paper size applies Chinese national standard 4 *. (Liyang) eight 4 Specifications (210 \ 297 Gongchu A7 A7 V. Description of the invention (9) Consumers' Cooperatives, Central Standards Bureau, Ministry of Economic Affairs System B7 'This device includes a chopper element that can be advantageously used in the impurity detector system shown in Figure 2; Figure 7 depicts a typical water absorption spectrum shown in the gaseous and ^^ 丨 gas Graphs at a wavelength of 1433-1440 ¾ microns; Figure 8 depicts a graph showing the absorption of ILS water in N2 and HC1 gas at a wavelength of 1420-1434 nanometers; Figure 9 depicts a graph showing expansion by osmotic tube / volume A graph of water absorption intensity versus water concentration as measured by technology; and Figure 10 depicts a graph showing water absorption intensity versus water concentration in the range of 1420-1430 nm as measured by an in-line purifier. Reference will now be made in detail to the present invention Specific embodiment of the present invention, which depicts the best mode currently considered by the inventors for the implementation of the present invention. Other embodiments are also briefly described as appropriate. As mentioned earlier, the subject matter of the present invention is particularly suitable for use in semiconductors. The manufacture of components, and therefore, the preferred exemplary embodiment of the present invention will be described in connection with the manufacture of semiconductor components. However, Feng would like to confirm that the description does not It is intended to limit the use or applicability of the present invention, and merely describes a more fortunate exemplary embodiment of the present invention. In this regard, the present invention is particularly suitable for the detection of impurities. The impurities used herein refer to the possibility of Molecules, atoms, free radicals, and ionic species that appear in gaseous materials, like the gaseous materials used in the manufacture of second films, that is, oil absorption lines. Alternatively, the term impurity can also refer to the gaseous material itself. 'For example, when the detector system of the present invention is used to determine whether the e-path (for example, HC1 official road) has sufficiently excluded gaseous materials, the paper size applies the Chinese National Standard (CNS) A4 specification (210 ^ 75 ^ 7 "Please read the notes on the back before completing this page)

-12- 五 、發明説明(1〇) A7 B7 鯉濟部中央標準局員Η消費合作衽印製 ri[_Mk· —ΊΜ,-—- 根據本發明的一較佳實施例及第1A圖所示,一氣體( 雜質)檢測系統10適當地包含一抽送雷射系統A、一 ILS雷 射器與相關的室B、—光譜儀c、及一檢測器與相關的電 子學(例如,電腦、數位電子學、等等)D。更特別地,並 凊參閱第1B和2圖,抽送雷射系統八適當地包含一抽送雷 射器100、一束流成形光學總成2〇〇和一束流調變總成3〇〇 ,雷射器與.室B適當地包含一室.總成4〇〇和一 ils雷射器 5〇〇 ;光譜儀C適當地包含一光議儀總成6〇〇 ;及,檢測器 D適當地包含-檢測器總成和—電腦系統8⑼。如將會 於此中更完全地描述般’氣體檢測系統1G有利地檢測被適 當地包含在-氣體樣品中的氣體種類(雜質)。通常,抽送 雷射系統A抽送ILS雷射器彻,最好係在或者接近臨界位 準以致於—雷射束流通過該氣體樣品,藉此致使該氣體樣 品的光譜被獲得。這光譜透過檢測器/電腦系肋而係適 當地被檢測’該檢測器/電腦系㈣,在運作時,致使可 能被包含在該氣體樣品内之氣逾種類(雜質)之出現及濃度 之在高靈敏度水平下之可靠及精準的測定。 又 請參閱第从找圖所示,為了更完全地說明本發明 2⑽施例所使用的科學原理,腔内雷射頻譜術㈣ 的-般原理係被作為例證地顯示。如眾所周知,以最簡 的說法一雷射器能夠被描述為包含_增益媒質,衫 ::學增益係被產生,及一共振器,其係由像 几件所構成。光學損失可以出現於包含該雷射腔(例如 單 中 學 (請先閱讀背面之注意事項再·填寫本頁)-12- V. Description of the invention (10) A7 B7 Member of the Central Standards Bureau of the Ministry of Economic Affairs, Consumer Cooperation, printed ri [_Mk · —ΊΜ, -—- According to a preferred embodiment of the present invention and shown in Figure 1A A gas (impurity) detection system 10 suitably includes a pumping laser system A, an ILS laser and associated chamber B, a spectrometer c, and a detector and associated electronics (eg, computer, digital electronics) Study, etc.) D. More specifically, referring also to Figures 1B and 2, the pumping laser system 8 suitably includes a pumping laser 100, a beam-shaping optical assembly 2000, and a beam modulation assembly 300, The laser and chamber B suitably contain a chamber 400 and an ils laser 5000; the spectrometer C suitably contains a photodetector assembly 600; and the detector D appropriately Contains-detector assembly and-computer system 8⑼. As will be described more fully herein, the 'gas detection system 1G advantageously detects the kind of gas (impurity) contained in the -gas sample. In general, the pumping laser system A pumps the ILS laser, preferably at or near a critical level, so that the laser beam passes through the gas sample, thereby causing the spectrum of the gas sample to be obtained. This spectrum is properly detected through the detector / computer system. 'The detector / computer system', during operation, causes the presence and concentration of gas that may be contained in the gas sample to exceed the type (impurity). Reliable and accurate measurement at high sensitivity levels. Please also refer to the figure below. In order to more fully explain the scientific principle used in the second embodiment of the present invention, the general principle of intracavity laser spectroscopy is shown as an example. As is well known, in the simplest terms, a laser can be described as containing a gain medium, a shirt :: learning gain system is generated, and a resonator is composed of several pieces. Optical loss can occur in the laser cavity (such as single school (please read the precautions on the back before filling in this page)

、1T --- '13-, 1T --- '13-

經濟部中央操準局貝工消費合作社印製 共振器)的光學元件及增·益媒質中。請特別參閱第3A圖, 個在其之最簡單形式的雷射裝置能夠被示意地描纟會為包 括一1增益媒質1A ’對應的鏡2A和3A係被置放在該增益媒 λ 1A周圍俾形成一雷射腔5。鏡2A和3A係被典型地塗佈 俾具有遍及一廣泛光譜範圍的高反射性表面。例如,塗佈 於鏡2Α上的鏡可以完全反射,而塗佈在鏡3Α上的鏡可以 部份地反射,藉此容許一些光線從該雷射腔5脫逃。在鏡2Α 和3 Α之反射.表面之間之被置放有該增益媒質1 a之該空間 性的區域形成該雷射共振器或者腔,而在本發明的上下文 中係被稱為所謂的”腔内區域〈intracavjty regi〇n)” 。 該雷射輸出的強度(I)可以藉著波長範圍及共振器元 件(例如,鏡2A和3A)的反射度來被決定,該增益媒質1A 在該波長範圍内運作(又)。通常,這輸出是廣寬的而且沒 有尖銳的、特殊的光譜面貌,如在第3八圖之圖表3八中所 k供之I對波長(又)的圖表中所顯.示般。 藉著選擇不同的光學元件來形成該雷射腔5’芎雷射 器的光譜輸出能夠被改變或者&quot;調整(tuned)” 。例如,請 特別參閱第3B圖所示,一調整過的共振器腔可以包括一 繞射光柵2B,該繞射光柵26取代在第3A圖中所顯示之高 反射性鏡2A。如圖所示,該雷射裝置因此包括繞射光栅2b 、鏡3B、及被定位在該繞射光栅邛與鏡3,B之間的增益媒 質1B。通常,來自這調整過之雷射器之光譜輸出的結果 會變窄並且呈現如在由該增益媒質1A與該等鏡2八和3八(第 3A圖)所形成之雷射器之原有光譜輸出内的波長。 ---------J--Ί. (讀先閱讀背面之注意事項再填寫本頁) 訂------- n ---- .ί - ί I II-ϊ(Resonator printed by the Shellfish Consumer Cooperative of the Central Bureau of Guidance, Ministry of Economic Affairs) in optical components and gain media. Please refer to FIG. 3A in particular, a laser device in its simplest form can be schematically depicted as including a 1 gain medium 1A 'corresponding mirrors 2A and 3A are placed around the gain medium λ 1A俾 forms a laser cavity 5. Mirrors 2A and 3A are typically coated with a highly reflective surface over a wide spectral range. For example, the mirror coated on the mirror 2A may be completely reflected, and the mirror coated on the mirror 3A may be partially reflected, thereby allowing some light to escape from the laser cavity 5. The spatial area where the gain medium 1 a is placed between the reflections 2A and 3A of the surface forms the laser resonator or cavity, and in the context of the present invention is called a so-called "Intraluminal area <intracavjty region)". The intensity (I) of the laser output can be determined by the wavelength range and the reflectivity of the resonator elements (for example, mirrors 2A and 3A). The gain medium 1A operates (again) in this wavelength range. In general, this output is broad and has no sharp, special spectral appearance, as shown in the graph of I vs. wavelength (again) in Figure 38 of Figure 38. By selecting different optical elements to form the laser cavity 5 '芎 laser, the spectral output of the laser cavity can be changed or "tuned". For example, please refer to FIG. 3B for a tuned resonance. The cavity may include a diffraction grating 2B which replaces the highly reflective mirror 2A shown in Figure 3A. As shown in the figure, the laser device therefore includes a diffraction grating 2b, a mirror 3B, and The gain medium 1B is positioned between the diffraction grating chirp and the mirrors 3, B. Generally, the result of the spectral output from this adjusted laser is narrowed and appears as if the gain medium 1A and the The wavelength in the original spectral output of the laser formed by mirrors 28 and 38 (Figure 3A). --------- J--Ί. (Read the precautions on the back before filling (This page) Order ------- n ---- .ί-ί I II-ϊ

-14- cmlf fe 經濟部中央標準局負工消费合作社印製-14- cmlf fe Printed by the Consumer Standards Cooperative of the Central Bureau of Standards of the Ministry of Economic Affairs

五、發明説明(I2) 田、’s變乍之輸出之強度(I)對波長(λ )的示意圖表係被描 繪在圖表3Β圖。 該雷射輪出藉著置放在基態或者激磁態之氣體分子、 原子、自由團、及/或離子在該光學共振器(例如,腔)内 而係亦能夠被改變。請參閱第3C圖所示,一個被如此構 形的雷射器可以包括—高反射鏡2(:、具有一增益媒質⑴ 的°卩伤反射鏡3C、及被置放於其間的一腔内吸收器4。 在延情況中,腔内吸收器4可以包含該等氣體種類(例如, 包含雜質的樣品)。該等腔内氣體種類對於雷射輸出的影 響忐夠被觀察。例如,該一種裝置之I對又的圖表係被顯 不在圖表3C中。圖表3C包含被包含於腔内吸收器4内之氣 體種類的及收光譜。被描繪在圖表3C中之不同的吸收特 徵係口腔内種類損失而產生,雷射增益必須與該等腔内種 類損失對抗。 因此,該等腔内種類的吸收光譜可以呈現於該雷射器 的光°曰輸出中。特別地,在較強之腔内吸收特徵有效地對 抗該共振器之增益特性之波長處的雷射輸出強度⑴係更 加被降低。結果,如圖所示,取代一個相當平滑的連續輸 出,像在圖表3 A中所顯示般,如在圖表3c中所顯示般的 一結構雷射輸出可以被觀察。在強度(I)上的降低,如在 圖表3C中所顯示般,係由於由該等氣體腔内種類的吸收 所引起’即’吸收特徵越強,在雷射輸出強度上的降低越 大。根據本發明,由有一腔内吸收器被使用之腔内雷射測 里所獲彳于的吸收光譜能夠被使用於該等氣體種類的高靈敏 本紙張尺度制中297公釐) (請先閱讀背面之注意事項再填寫本頁) 裝丨V. Description of the invention (I2) The schematic diagram of the intensity (I) vs. wavelength (λ) of the output of the field and 's change is plotted in Figure 3B. The laser wheel can also be changed by placing gas molecules, atoms, free radicals, and / or ions in the ground or excited state in the optical resonator (eg, cavity). Please refer to FIG. 3C, a laser configured in this manner may include a high-reflection mirror 2 (:, an angle-damped mirror 3C with a gain medium ⑴, and a cavity placed therebetween. Absorber 4. In the extended case, the intra-cavity absorber 4 may contain such gas species (for example, samples containing impurities). The effect of such intra-cavity gas species on the laser output cannot be observed. For example, this kind of The diagram of the device pair is shown in Fig. 3C. Fig. 3C contains the spectrum and absorption spectrum of the gas species contained in the intracavity absorber 4. The different absorption characteristics depicted in Fig. 3C are the species in the mouth. Loss is generated, and the laser gain must be opposed to the loss of the types in the cavity. Therefore, the absorption spectrum of the types in the cavity can be presented in the light output of the laser. In particular, in the stronger cavity The absorption characteristics effectively reduce the laser output intensity at the wavelengths that effectively counteract the gain characteristics of the resonator. As a result, instead of a rather smooth continuous output, as shown in Figure 3A, As in The laser output of a structure like that shown in Figure 3c can be observed. The decrease in intensity (I), as shown in Figure 3C, is due to the 'i.e.' caused by the absorption of species in these gas cavities The stronger the absorption characteristics, the greater the decrease in laser output intensity. According to the present invention, the absorption spectrum obtained from the intra-cavity laser measurement using an intra-cavity absorber can be used for these gas types High-sensitivity paper size (297 mm) (Please read the precautions on the back before filling this page)

、tT -15 - 經濟部中央標準局員工消費合作社印製 A7 _ _ B7 五、發明説明(13) 度檢測。業已被發現的是,每個氣體種類藉著其之對應的 吸收光譜(特徵(signature))而係能夠被獨特地鑑定而因此 能夠彳皮使用來確信地鑑定該等氣體種類(雜質)。 本案發明人發現,在該雷射共振器内之吸收種類(氣 體元件)在增益與損失之間的競爭之前及/或期間的呈現 導致透過ILS之使用的增強檢測靈敏度,在增益與損失之 間的競爭係隨著該雷射系統接近臨界值而自然地發生。鑑 於與該腔内吸收器相關之損失變成在該雷射器内之增益與 損失之間之競爭之部份的事實,連與一弱吸收轉移及/或 一極小吸收器濃度相關的一小吸收率在該增益/損失競爭 期間係被戲劇性地放大。結果,該競爭清楚地呈現在該ils 訊號的輸出(見圖表3C)。因此,使用這些原理,ILS能夠 被使用來檢測弱吸收及/或極小吸收器濃度。 IL S檢測與其他使用雷射器的頻譜術方法係顯然不同 的。如在以上所描述般被使用於頻譜術之雷射器的輸出 典型地引起在氣體種類中一個其後被監視的第二現^。或 者,一雷射器的輸出可以通過一氣體種類而在該雷射器之 輸出中之選擇波長的吸收提供用於顯示該氣體之特徵的手 段。在任何—種情況_,該雷射器的運作係與被測量的氣 體種類分開且不受該被測量的氣體種類所影響。 然而,就ILS檢測而言,該雷射器之運作係直接受到 氣體種類所影響。在這形式中,該ILS雷射器5〇〇本身係作 為一檢測器。特別地,來自該ILS雷射器5〇〇的輸出當它離 開該雷射腔5時係包含有關氣體種類的光譜資訊。這模 本纸張尺度適用中國國家標绛(CNS ) A4規格(210X 297公釐) (請先閱讀背面之注意事項再4·寫本育) -Q裝- n H - I - i\ - In - - · -16- 五, TT -15-Printed by the Consumer Cooperatives of the Central Standards Bureau of the Ministry of Economic Affairs A7 _ _ B7 V. Description of the invention (13) Degree detection. It has been found that each gas species can be uniquely identified by its corresponding absorption spectrum (signature) and therefore can be used to identify those gas species (impurities) with certainty. The inventor of the present case found that the appearance of the absorption type (gas element) in the laser resonator before and / or during the competition between gain and loss leads to enhanced detection sensitivity through the use of ILS, between gain and loss The competitive system occurs naturally as the laser system approaches a critical value. Given the fact that the loss associated with the intra-cavity absorber becomes part of the competition between gain and loss within the laser, even a small absorption associated with a weak absorption transfer and / or a minimum absorber concentration The rate is dramatically amplified during this gain / loss competition. As a result, the competition is clearly presented at the output of the ils signal (see Figure 3C). Therefore, using these principles, ILS can be used to detect weak absorption and / or minimal absorber concentrations. The IL S detection is clearly different from other spectroscopic methods using lasers. The output of a laser used for spectroscopy as described above typically causes a second occurrence of one of the gas species to be monitored thereafter. Alternatively, the output of a laser can provide a means for displaying the characteristics of the gas through the absorption of a selected wavelength in the output of the laser by the type of gas. In any case, the operation of the laser is separate from the type of gas being measured and is not affected by the type of gas being measured. For ILS testing, however, the operation of the laser is directly affected by the type of gas. In this form, the ILS laser 500 itself acts as a detector. In particular, the output from the ILS laser 500, when it leaves the laser cavity 5, contains spectral information about the type of gas. The paper size of this model applies to the Chinese National Standard (CNS) A4 specification (210X 297 mm) (please read the precautions on the back before you write the book) -Q Pack-n H-I-i \-In- -· -16- five

經濟部中央標準局員工消費合作社印製Printed by the Consumer Cooperatives of the Central Bureau of Standards of the Ministry of Economic Affairs

A7 ----- -B7發明説明(叫 的運作是ILS檢測及該ILS雷射器5〇〇特有的。 據此’ ILS雷射器500係與習知雷射器不同並且具有非 驾知雷射益所有的運作特性。例如,產生損失的吸收種類 係故意地被引入至ILS雷射器5〇〇的雷射腔5中。這些吸收 種類貫現ILS雷射器5〇〇的運作並且改變其之輸出。 而且’不同於在習知應用中所使用的雷射器,ILS雷 射器500在臨界值之上但接近臨界值運作(例如,在極限功 率的10%内).。然而,接近臨界值運作經常引致扎8雷射器 5〇〇的輸出不穩定。據此’指向於穩定ILS雷射器5〇〇之輸 出之額外的技術會被要求。 相反’習知雷射器典型地在相當高於臨界值下運作俾 將輸出增加至最大。然而,將輸出增至最大並非ILS雷射 器500的目的。因此,效率低及/或不產生高輸出功率的 雷射裝置’當該等雷射裝置不利於很多其他雷射應用時, 係可以被使用於ILS檢測。ILS雷射器500的目的不是產生 光線’而係監視在該雷射腔5内的損失。如以上所述,在 該雷射腔5内的模式競爭致使在該ILS雷射器500内的該損 失在加強的靈敏度之下被檢測。 由於ILS檢測具有習知光學頻譜技術所不能及之提升 的靈敏度’來自具有弱吸收及/或極小吸收器濃度之背景 氣體的干擾會係重要的,即使該等干擾在習知頻譜技術下 係可忽略的。 透過ILS之氣體的檢測藉著使用不同的雷射系統而係. 能夠被達成。(像在此中所使用的一樣,該雷射系統包括ILS 本紙張尺度適用中國國家標準(CNS ) Α4規格(2丨0X 297公釐) (請先閱讀背面之注意事項再·填寫本頁) 、τ -17- 五、發明説明(15) A7 B7 經濟部中央標準局貝工消费合作社印製 雷射卯500及抽送雷射益1〇〇。)這些雷射系統各分享極高 檢測靈敏度所需的若干共同特性。習知技術具有經辱認的 三種該等特性。第一’該等雷射系統展現接近產生雷射之 &amp;里臨界值的多模式運作^第二,該等雷射系統提供一個 相對於該等被監視之氣體種類或者雜質(即,分子、原子 、自由團、及/或離子)係實質上寬廣的運作波長寬度。 第三,該等雷射系統保持穩定的強度及波長。 會被察覺到的是,具有不同物理及光學特性之不同的 IL S雷射系統符合極高檢測靈敏度之這些以上所列的標準 。雷射系統之不同的物理和光學特性亦可提供像關於工l s 測置被完成之實驗條件(例如,資料獲得時間樣的不同 優點。此外,這些不同的物理和光學特性可以影響下列的 一項或者多項:⑴能夠被檢測的氣體種類或者雜質(即, 分子、原子、自由團、及/或離子);(2)每個氣體種類之 能夠被決定之對應的漠度;及(3)檢測能夠被實施之樣品 的實際類形。後者的例子包括樣品的總壓力、樣品尺寸、 及樣品被包含的環境。 &quot; 面對這些一般原理的背景,在本發明的上下文中,本 案發明人已發明出-種商業上可實行的雜質感測系統丄〇, 其提供在可能包含腐餘性氣體之氣體樣品内之雜質的加強 檢測(即,與包含ILS雷射器之組件反應的氣體)。 現在請參閱第1A和2圖所示,根據本發明的一較佳模 犯貫施例,-氣體檢測系統1()適當地包括雷射器驅動器_ 和-包含有ILS雷射器5〇〇在其内的ms室總成彻。光 裝 I (請先閲讀背面之注意事項#·填寫本頁) 丁 -一一·1 1— I. ^^1 n Hi 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公兼)A7 ----- -B7 invention description (The operation is called ILS detection and the ILS laser 500 is unique. Accordingly, the ILS laser 500 is different from the conventional laser and has non-driver knowledge All operating characteristics of the laser. For example, the absorption types that cause the loss are deliberately introduced into the laser cavity 5 of the ILS laser 500. These absorption types are consistent with the operation of the ILS laser 500 and Change its output. And 'unlike lasers used in conventional applications, the ILS laser 500 operates above but close to a critical value (for example, within 10% of the limit power). However, Operation near the critical value often results in unstable output of the Z8 laser 5000. According to this, additional techniques directed at stabilizing the output of the ILS laser 500 will be required. Instead, the conventional laser Typically operating at considerably higher thresholds, increasing the output to its maximum. However, increasing the output to its maximum is not the purpose of the ILS laser 500. Therefore, laser devices that are inefficient and / or do not produce high output power ' When such laser devices are detrimental to many other laser applications, It can be used for ILS detection. The purpose of the ILS laser 500 is not to generate light, but to monitor the loss in the laser cavity 5. As described above, the mode competition in the laser cavity 5 results in the This loss in the ILS laser 500 is detected with enhanced sensitivity. Since the ILS detection has an increased sensitivity that cannot be achieved with conventional optical spectrum technology, it comes from a background gas with weak absorption and / or minimal absorber concentration Interference can be important, even if such interference is negligible under conventional spectrum technology. The detection of gas through ILS can be achieved by using different laser systems. (Like the one used here Similarly, the laser system includes ILS. The paper size is applicable to the Chinese National Standard (CNS) A4 specification (2 丨 0X 297 mm) (Please read the precautions on the back before filling in this page). Τ -17- 5. Invention Note (15) A7 B7 The Laser Standard 500 printed by the Central Laboratories of the Ministry of Economic Affairs and the Consumers Cooperatives of Laser and Pumped Laser Benefits 100.) These laser systems each share several common characteristics required for extremely high detection sensitivity. Skill Has three such characteristics that have been stigmatized. First, the laser systems exhibit multi-mode operation close to the threshold of the laser generating ^ Second, the laser systems provide a The types of gases or impurities (ie, molecules, atoms, free radicals, and / or ions) have a substantially broad operating wavelength width. Third, these laser systems maintain a stable intensity and wavelength. What will be perceived is The different IL S laser systems with different physical and optical characteristics meet the above-listed standards for extremely high detection sensitivity. The different physical and optical characteristics of the laser system can also provide information about how the measurement is completed. Experimental conditions (e.g. data to obtain different advantages over time samples. In addition, these different physical and optical properties can affect one or more of the following: ⑴ the type of gas or impurities that can be detected (ie, molecules, atoms, free radicals, and / or ions); (2) each gas type The corresponding indifference that can be determined; and (3) the actual type of the sample that can be tested. Examples of the latter include the total pressure of the sample, the sample size, and the environment in which the sample is contained. &quot; Faced with the background of these general principles, in the context of the present invention, the inventor of the present case has invented a commercially viable impurity sensing system, which is provided in a gas sample that may contain a residual gas Enhanced detection of impurities (ie, gases that react with components containing ILS lasers). Referring now to Figures 1A and 2, according to a preferred embodiment of the present invention,-the gas detection system 1 () suitably includes a laser driver_ and-contains an ILS laser 50. The ms room assembly is complete. Light I (please read the notes on the back # · fill this page first) Ding-One · 1 1— I. ^^ 1 n Hi This paper size is applicable to China National Standard (CNS) A4 (210X297)

,I - I --- - 111 1 - - I— -1 I -18 - 經濟、中央橾準局貝工消費合作社印製 A7 ________B7 五、發明説明(16) 總成600和-檢㈣器/電腦系統·,8〇〇係適當地被光學連 接至來自ILS雷射||5GG的輸出,於是吸收光譜係被適當地 運作,'藉此致能氣體種類(㈣)之出現及/或濃度的高靈敏 度檢測。 該ILS雷射器500在一個適於被包含在氣體樣品(例如 ,水療氣)内之雜質之檢測的波長範圍或者光譜範圍内運 作。在运光譜範圍内,一特徵吸收光譜能夠被獲得。由於 氣相光譜係被廣泛地研究,一個大且直接有用的學問係存 在的,其顯示氣體種類係如何能夠被獨特地鑑定。 會被察覺到的是,ILS檢測藉著選擇適當的光譜窗而 能夠被使用來在腐蝕性氣體(例如,氯化氫)存在時監視一 氣體種類(例如,水蒸氣),測量吸收係在該適當的光譜窗 内。特別地,一光譜範圍必須被決定,其中⑴該雜質或 者氣體種類具有至少一個吸收特徵及(ii)該腐蝕性氣體本 質上不具有干擾吸收特徵。由於干擾吸收特徵代表重疊被 使用來鑑定氣體種類之吸收特徵的吸收特徵,藉此致使在 氣體種類與腐蝕性氣體之間的檢測選擇力被妥協。很多該 等光譜窗(在那裡,腐蝕性氣體沒有吸收或者有非常弱的 吸收)存在於氣體種類的吸收範圍之内。由於由該腐餘性 氣體所作的吸收在這些光譜窗内係極弱的(如果可測量的 話)’在這些波長下運作的ILS感測器100能夠被使用來在 沒有干擾之下檢測氣體種類。尋找有該一種光譜窗存在的 波長範圍(為了避免干擾光譜訊號)會需要重要的努力。特 別地,用於測量在氣體中之吸收之ILS檢測之加強的檢測 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) -19- -----------}裝11 /•V (請先閲讀背面之注意事項再·填寫本頁), I-I ----111 1--I— -1 I -18-Printed by the Economic and Central Bureau of Standards, Shellfish Consumer Cooperative A7 ________B7 V. Description of the invention (16) Assembly 600 and-Detector / The computer system, 800 series is suitably optically connected to the output from the ILS laser || 5GG, so the absorption spectrum system is properly operated, thereby enabling the appearance and / or high concentration of gas species (㈣) Sensitivity detection. The ILS laser 500 operates in a wavelength range or a spectral range suitable for the detection of impurities contained in a gas sample (e.g., a spa gas). Within this spectral range, a characteristic absorption spectrum can be obtained. Since the gas phase spectroscopy system is widely studied, a large and directly useful science system exists, which shows how the gas species system can be uniquely identified. It will be noticed that ILS detection can be used to monitor a gas species (eg, water vapor) in the presence of corrosive gases (eg, hydrogen chloride) by selecting an appropriate spectral window. Inside the spectral window. In particular, a spectral range must be determined, in which the impurity or gas species has at least one absorption characteristic and (ii) the corrosive gas has essentially no interference absorption characteristics. Since the interference absorption characteristics represent overlapping absorption characteristics that are used to identify the absorption characteristics of the gas species, thereby causing a compromise in the detection selectivity between the gas species and the corrosive gas. Many of these spectral windows (where corrosive gases are not absorbed or have very weak absorption) exist within the absorption range of the gas species. Because the absorption by the residual gas is extremely weak (if measurable) within these spectral windows, the ILS sensor 100 operating at these wavelengths can be used to detect the type of gas without interference. Finding the wavelength range in which such a spectral window exists (to avoid interfering with spectral signals) will require significant effort. In particular, the enhanced detection of ILS detection for measuring the absorption in gas This paper size applies the Chinese National Standard (CNS) A4 specification (210X297 mm) -19- -----------} Pack 11 / • V (Please read the precautions on the back before filling in this page)

、1T—~ H -α_ A7 A7 經濟部中央標準局員工消費合作社印製 五、發明説明(π) 靈敏度意味著連來自具有弱吸收及/或極小吸收器濃度之 背景氣體的干擾會係重要的;即使該等干擾在習知頻譜技 術下‘係可忽略的。此外,ILS雷射器5〇〇在一個有一特別光 譜特性存在之特定光譜範圍中的運作亦會需要相當大的努 力。 儘管如此,一特定氣體種類之獨特的光譜鑑定能夠依 f貝例地被要求。因此,在所檢測之氣體種類中的選擇性係 能夠達成。然而,這些光譜窗的存在只會在高光譜分辨力 下才明顯。因此,足夠的光譜分辨力會被要求來分開彼此 靠近地出現的吸收特徵。 更進一步被察覺到的是,一特定之光譜窗的波長位置 和寬度係直接視該特定的氣體種類和該特定的腐蝕性氣體 而疋。例如,就氯化氫(Ηα)中之水蒸氣的檢測而言,一 光譜範圍會從大約142〇與測毫㈣㈣之間的波長範圍 中選擇出來。或者,一光譜範圍可以從大約1433與1440毫 微米之間的波長範圍令選擇出來。 據此’該ILS雷射器500必須輸出具有一波長分佈的光 線,該波長分佈的至少-部份係在所選擇的光譜範圍内。 為了驅動ILS雷射器500,氣體檢測系統1〇需要一抽送 來源其傳送具有足夠功率和在一適當之波長範圍内的軸 射線俾可在該ILS雷射③的臨界值或者在稍微高於該似雷 射器的臨界值之下光學地激磁該ILS雷射器。關於這—點 ,重要的是ILS雷射器500運作以致於在該雷射裝置中的增 益超過全部的光學損失,包括那些與該增益㈣、鏡^ 本紙張尺度適用中國國家插準(CMS ) Α4規格(210x297公產) ---------0 裝! 1· (請先閲讀背面之注意事項界填寫本頁) ~· --訂---------- ·II _ -20- A7 B7 五、發明説明(18) 非鏡的腔内光學元件有關的損失,與在該光學共振器腔内 之任何氣體種類的吸收。而且,最好的是雷射器500以多 縱向輟式運作,即,遍及一廣寬的波長範圍。典型地,有 雷射動作發生之一可希望的帶寬是在大約2nm與大約15nm 之間。雖然ILS雷射器500亦能夠以多於一個橫向共振器模 式運作,但如此是不需要的。根據本發明的較佳模範實施 例,該雷射器驅動器包含一光學抽送雷射器100。適當地 ,抽送雷射器100的該等光學參數(例如,平均功率密度、 峰值功率密度、擴射度及束流直徑)係有利地與ILS雷射器 500的光學要求相配的。像將會被察覺到的一樣,要如此 係需要決定多少光子在一特定容積内及在距離該抽送雷射 器100 —約定距離下能夠在一段特定時間上被傳送。通常 ,根據本發明,該等決定係根據眾所周知的定理及質量方 程式來完成以致於該抽送雷射器100係適當地被選擇俾有 利地與ILS雷射器500的光學特性相配合。 經濟部中央標隼局貝工消费合作社印製 雖然其他的驅動器可以被使用在本發明的上下文中, 最好的是,一抽送雷射器100係以其之運作波長及其之光 學參數為根據來被選擇以致於它能夠單獨被使用來激磁 ILS雷射器500。如在下面詳細地描述般,在抽送雷射器1〇〇 無法單獨驅動(抽送)ILS雷射器500的情況中,束流變化光 學,像束流成形裝置200般,能夠被使用。· 束流變化光學的例子包括繞射光學、折射光學、折射 分度軸向地改變的梯度分度光學、折射分度徑向地改變的 梯度分度光學、微光學、及其之組合。 -21 - (請先閲讀背面之注意事項再填寫本頁) 本纸張尺度適用中國國家標準(CNS ) A4規格(210X 297公釐)1T— ~ H -α_ A7 A7 Printed by the Consumer Cooperative of the Central Standards Bureau of the Ministry of Economic Affairs 5. Description of the invention (π) Sensitivity means that even interference from background gas with weak absorption and / or minimal absorber concentration will be important ; Even though such interference is 'negligible' under conventional spectrum technology. In addition, the operation of the ILS laser 500 in a specific spectral range where a particular spectral characteristic exists may require considerable effort. Nevertheless, the unique spectral identification of a particular gas species can be routinely required. Therefore, selectivity in the type of gas detected can be achieved. However, the existence of these spectral windows is only apparent with hyperspectral resolution. Therefore, sufficient spectral resolution will be required to separate the absorption features that occur close to each other. It is further noticed that the wavelength position and width of a particular spectral window depend directly on the particular gas type and the particular corrosive gas. For example, for the detection of water vapor in hydrogen chloride (Ηα), a spectral range is selected from a wavelength range between approximately 142 ° and the measured milli㈣㈣. Alternatively, a spectral range may be selected from a wavelength range between approximately 1433 and 1440 nm. According to this', the ILS laser 500 must output a light having a wavelength distribution, at least-part of which is within the selected spectral range. In order to drive the ILS laser 500, the gas detection system 10 needs a pumping source which transmits axial rays with sufficient power and in an appropriate wavelength range. The ILS laser may be at a threshold value of the ILS laser ③ or slightly higher than this. The ILS laser is optically excited below the laser-like threshold. In this regard, it is important that the ILS laser 500 operates so that the gain in the laser device exceeds all the optical losses, including those related to the gain and mirror. ^ This paper standard applies to China National Standards Interpretation (CMS) Α4 size (210x297) --------- 0 Pack! 1 · (Please read the notes on the back to fill in this page first) ~ · --Order ---------- · II _ -20- A7 B7 V. Description of the invention (18) Non-mirror cavity The loss associated with an optical element is related to the absorption of any kind of gas in the cavity of the optical resonator. Moreover, it is best that the laser 500 operates in multiple vertical drops, that is, across a wide wavelength range. Typically, one of the desirable bandwidths where laser action occurs is between about 2nm and about 15nm. Although the ILS laser 500 can also operate in more than one transverse resonator mode, this is not required. According to a preferred exemplary embodiment of the present invention, the laser driver includes an optical pumping laser 100. Suitably, the optical parameters (eg, average power density, peak power density, spread, and beam diameter) of the pumped laser 100 are advantageously matched to the optical requirements of the ILS laser 500. As will be noticed, to do so requires deciding how many photons can be transmitted within a certain volume and within a certain distance from the pumping laser 100 at a given distance. Generally, according to the present invention, these decisions are made according to well-known theorems and mass equations such that the pumping laser 100 is appropriately selected to favorably match the optical characteristics of the ILS laser 500. Printed by the Central Bureau of Standards, Ministry of Economic Affairs, Shellfish Consumer Cooperative, although other drives can be used in the context of the present invention, it is best that a pumping laser 100 is based on its operating wavelength and its optical parameters Was chosen so that it could be used alone to excite the ILS laser 500. As described in detail below, in the case where the pumping laser 100 cannot individually drive (pump) the ILS laser 500, the beam variation optics, like the beam shaping device 200, can be used. Examples of beam-changing optics include diffraction optics, refractive optics, gradient indexing optics with refractive index changes axially, gradient indexing optics with refractive index changes radially, micro-optics, and combinations thereof. -21-(Please read the precautions on the back before filling this page) This paper size applies to China National Standard (CNS) A4 (210X 297 mm)

經濟部中央標準局員工消費合作社印製 五、發明説明(19) 然而’在那些自雷射器100發出之輻射線適當地與包 含在ILS雷射器500内之ILS增益媒質之抽送要求(例如,模 式谷稽)相配合的情況中’如此的束流變化光學係不需要 的。 根據本發明的一模範實施例,抽送雷射器j 〇〇包含一 個在一波長,;Ip ’下運作的雷射器(在這情況中,其為一 固態晶體雷射器,即,有一TEM〇〇橫向模式結構,具有一 個比大約2.8.瓦特大的輸出功率,在大約1〇64nm下運作的 Nd:YAG)。適當地,自抽送雷射器1〇〇傳送出來的束流e 具有一線偏振並且係可與傳送之平面成垂直地轉動。最好 的疋,來自抽送雷射器1〇〇之輸出束流(束流E)的擴射是大 約小於0.5 mrad並且顯示一個大'约小於5ιηιη的束流直徑。 一特定之較佳的抽送雷射器1〇〇為來自加拿大,补“的Printed by the Consumers 'Cooperative of the Central Standards Bureau of the Ministry of Economic Affairs. 5. Description of the Invention (19) However,' the radiation from those lasers 100 is appropriate to the pumping requirements of the ILS gain medium contained in the ILS laser 500 (eg , Mode Gu Ji) in the case of 'such beam changes are not needed for optical systems. According to an exemplary embodiment of the present invention, the pumping laser j 〇〇 includes a laser operating at a wavelength; Ip '(in this case, it is a solid-state crystal laser, that is, a TEM (〇〇 lateral mode structure, has an output power greater than about 2.8. Watts, Nd: YAG operating at about 1064nm). Suitably, the beam e transmitted from the pumping laser 100 has a linear polarization and can be rotated perpendicularly to the plane of transmission. At best, the spread of the output beam (beam E) from the pumping laser 100 is about less than 0.5 mrad and shows a beam diameter that is large 'about less than 5 μm. A specific and better pumping laser 100 is from Canada.

Physics of Mountain View的型號T20_1054C。如將於下面 更70全地說明般,該一種抽送雷射器100的使用典型地需 要使用束流成形光學總成200。 應被察覺到的是,驅動器100可以包含會適當地激磁 ILS雷射器50〇之任何適當的光學抽送來源,是連貫抑或是 不連貝的,是連續抑或是成脈衝的。結果,即使根據先前 所述的較佳實施例,抽送雷射器1〇〇在一習知形式下運作 並且發射出遍及一希望之頻率帶及具有一希望之帶寬的輻 射線。例如,抽送雷射器1〇〇可以包含一二極管雷射器。 ; ' 使用一極管雷射器作為抽送雷射器1 〇〇典型地需 要使用束流成形光學總成200。 本紙張尺度剌巾關^7^5) Μ規格 (請先閲讀背面之注意事項再*填寫本頁)Model T20_1054C for Physics of Mountain View. As will be explained more fully below, the use of such a pump laser 100 typically requires the use of a beamforming optical assembly 200. It should be noticed that the drive 100 may include any suitable optical pumping source that will properly excite the ILS laser 50, whether it is coherent or non-coupling, continuous or pulsed. As a result, even in accordance with the previously described preferred embodiment, the pumping laser 100 operates in a conventional manner and emits radiation throughout a desired frequency band and having a desired bandwidth. For example, the pumping laser 100 may include a diode laser. ; 'Using a diode laser as the pumping laser 100 typically requires the use of a beam-shaping optical assembly 200. Dimensions of this paper size ^ 7 ^ 5) Μ specifications (Please read the precautions on the back before filling in this page)

、1T, 1T

J A7 ____B7 五、發明説明(2G) 請繼續參閱第2圖所示,ILS雷射器500,在最簡單的 情況中包含一個由在對應之鏡501,5〇3,5〇5之間之整個光 學路;徑長度所形成的光學共振器腔。 然而,在系統10被使用來檢測在該樣品内之不與該雷 射本身之組件(例如,增益媒質或者晶體、鏡、機械裝置 、及其類似)化學反應之氣體(雜質)的那些情況中,該共 振器腔能夠由在鏡501,503和505之間的區域所形成。在該 一種情況中·,該氣體樣品區域(即,該氣體樣品存在的區 域)包含在鏡501,503,505之間的區域(除了該雷射器晶體 507 外)。 然而,就包含腐蝕性氣體的氣體樣品而言,即,與一 個或者更多個雷射器組件化學反應的氣體,係可希望將該 氣體樣品區域從該等組件分開(例如,增益媒質、鏡 '等 等)。根據本發明的較佳實施例,一分開的樣品系統4〇〇a 可以有利地被使用來將該樣品從該等雷射器組件隔離。 經濟部中央標準局員工消费合作社印製 請參閱第2和4圖所示,根據本發明的這較佳特徵,樣 品系統400A最好包含一氣體樣品槽本體4〇6,該氣體樣品 槽本體406係被適當地保持在一氣體樣品槽固持器4〇7内。 對應的槽窗4 04和4 0 5係被適當地安裝於氣體樣品槽本體 406的遠端上並且提供對在該槽本體内之樣品的光學通路 。窗404和405亦適當地密封槽本體406。如會更詳細地在 下面时淪般,系統400A被適當地置放的區域係被象散地 補償。給與這象散補償,窗404和405不是''有源(active) &quot;光學元件,其明顯地改變及擾亂該ILS雷射束流的輪 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) -23 -J A7 ____B7 V. Description of the invention (2G) Please continue to refer to Figure 2. In the simplest case, the ILS laser 500 includes a mirror between the corresponding mirrors 501, 50, 5 and 5 The entire optical path; the optical resonator cavity formed by the diameter length. However, in those cases where the system 10 is used to detect gases (impurities) within the sample that do not chemically react with components of the laser itself (eg, gain media or crystals, mirrors, mechanical devices, and the like) The resonator cavity can be formed by the area between the mirrors 501, 503 and 505. In this case, the area of the gas sample (ie, the area where the gas sample exists) contains the area between the mirrors 501, 503, 505 (except the laser crystal 507). However, for gas samples containing corrosive gases, that is, gases that chemically react with one or more laser components, it may be desirable to separate the gas sample area from the components (e.g., gain media, mirrors 'and many more). According to a preferred embodiment of the present invention, a separate sample system 400a may be advantageously used to isolate the sample from the laser components. Printed by the Consumer Cooperative of the Central Standards Bureau of the Ministry of Economics Please refer to Figures 2 and 4. According to this preferred feature of the present invention, the sample system 400A preferably includes a gas sample tank body 406, the gas sample tank body 406 The system is suitably held in a gas sample cell holder 407. The corresponding slot windows 404 and 405 are suitably mounted on the distal end of the gas sample tank body 406 and provide optical access to the sample within the body of the tank. The windows 404 and 405 also properly seal the slot body 406. As will be described in more detail below, the area where the system 400A is appropriately placed is astigmatically compensated. To compensate for this astigmatism, the windows 404 and 405 are not `` active '' optical elements, which obviously change and disturb the ILS laser beam. The paper size of the paper applies the Chinese National Standard (CNS) A4 specification. (210X297 mm) -23-

經濟部中央標準局貝工消费合作社印製 五、發明説明(21) ,除了關於傳輸之外。一輸入導管4〇8和一輸出導管4〇9係 可運作地連接至氣體槽本體4〇6。 &quot;月參閱第4圖所示,聯接管408和409係被有利地使用 來保證氣體樣品到及離開氣體(雜質)樣品槽系統4〇〇A之有 效率及有效的輸送。據此,本發明的氣體檢測系統丨〇能夠 持續監視在可變化氣壓下的流動氣體,包括高壓力。特別 地’该氣體樣品槽本體406的使用係有利地當測量具有一 個不同於大氣壓力(即,較高或者較低)之壓力或者具有該 ILS雷射器被設計來產生雷射之壓力的氣體時,致能該ils 雷射500的運作。沒有該一種氣體樣品槽本體4〇6,當監 視一個具有與ILS雷射器500 —致之壓力不同之壓力的氣體 時’產生雷射係難以達成,因此,該氣體樣品槽本體4〇6 在一個具有超過大氣壓力或者該ILS雷射器被設計來產生 雷射之壓力之壓力的氣體樣品時,容許該ILS雷射器5〇〇的 穩定運作。或者,該氣體樣品可以具有一個比大氣壓力小 或者該ILS雷射器500被設計來產生雷射之壓力小的壓力( 例如’當真空存在於該氣體樣品槽本體4〇6時)。此外,該 氣體樣品槽本體406在一個具有波動之壓力的氣體樣品時 ’致能該ILS雷射器500的穩定運作。 適當地,槽本體406包含一不銹鋼本體,其具有適當 地在10至90微米(mm)範圍内的尺寸。根據本發明之一特 疋的較佳特徵中’樣品系統4〇〇a形成一開口(即,在本體 406中的開口),該開口具有一個大約蚤叶的直徑。最好的 是,在本體40ό中的開口係與氣體樣品槽本體4〇6的中心對 本紙張尺度適用中國國家標準(CNS ) Α4規格(210X 297公楚) (請先閲讀背面之注意事項晃填寫本頁) ~裝 I--- ^---!--訂 -------ί. -24- A7 B7 五、發明説明(22) 稱的。最好的是,在槽本體406中之開口的直徑係被適當 地選擇到比入射束流的直徑大以致於氣體樣品系統400A 的光:學對齊可以輕易獲得。窗404,405的厚度係適當地被 選擇俾避免會干擾經由該氣體檢測系統10之運作所獲得之 ILS吸收光譜之品質的干涉效應。根據這特徵,在形成窗 404,405中所使用的材料係被最適宜地選擇俾將在ILS雷射 器500運作之範圍中的吸收損失減至最少,如在1350至1550 毫微米(nm)的範圍般。例如,窗404,405可以由一種可光 學相容的材料形成,像可從Research Electro Optics of Boulder,CO獲得的Infrasil™般,其係被極度撤光。窗 404,405係被適當地擺置成一布儒斯特角(Brewster's angle) 俾可更進一步將來自該等窗表面的反射損失減至最少。 經濟部中*標準扃負工消费合作社印製 當如此構形時,氣體樣品槽406適當地容許束流Η通 過要被分析的氣體樣品。附有一段管的聯接器408,409係 被適當地選擇俾提供輕易的調節,像可以被要求來在不改 變臨’界值抽送條件下重新對齊及/或對齊在ILS雷射_器500 内的窗404,405。該共振器腔,在系統400Α被使用的情況 中,係被適當地由在鏡501,503,505之間的物理長度所形 成(包括該雷射器晶體507及包括在窗404,405之間的區域 且窗404和405本身包含該樣品系統400Α)。然而,在樣品 不與該等雷射器組件化學反應的該等情況中,該樣品槽會 名義上分別由在鏡501,503,和505之間的物理區域所形成( 除了雷射器晶體507外)。 會被察覺到的是,任何在室400之内之要被檢測的氣 -25 - (請先閲讀背面之注意事項再填寫本頁) 本紙張尺度適用中國國家標準(CNS ) Α4规格(210X 297公釐) 經濟部中央標準局貝工消费合作社印製 A7 ^_____B7 五、發明説明(23) 體(雜質)必須被適當地移去或者消除,以致於與被包含在 系統400A内之氣體樣品内之那些氣體(雜質)之量或者出現 有關之經由該氣體檢測系統丨〇之使用所得之樣品的吸收光 譜係準確的。根據本發明的較佳特徵,室4〇〇係有利地顯 不一密封容器,其能夠洗淨要被檢測的氣體(雜質),或者 被撤空俾移去要被檢測的氣體(雜質),或者在其内之氣體 (雜質)的程度能夠被降低到低於在該樣品系統400A中之要 被檢測的程度。如在下面更完整地描述般,雜質的持續移 去藉著,例如’吸氣法而能夠被達成。Printed by the Shellfish Consumer Cooperative of the Central Standards Bureau of the Ministry of Economic Affairs 5. Description of Invention (21), except for transmission. An input duct 408 and an output duct 409 are operatively connected to the gas tank body 406. &quot; As shown in Fig. 4, the connection pipes 408 and 409 are advantageously used to ensure the efficient and effective delivery of gas samples to and from the gas (impurity) sample tank system 400A. According to this, the gas detection system of the present invention can continuously monitor the flowing gas under variable air pressure, including high pressure. In particular, the use of the gas sample cell body 406 is advantageous when measuring a gas having a pressure different from atmospheric pressure (ie, higher or lower) or having the pressure of the ILS laser designed to generate a laser At the same time, the operation of the ils laser 500 was enabled. Without this kind of gas sample tank body 406, it is difficult to achieve laser generation when monitoring a gas having a pressure different from that of the ILS laser 500. Therefore, the gas sample tank body 406 is A gas sample having a pressure in excess of atmospheric pressure or the ILS laser is designed to generate the pressure of the laser allows the ILS laser to operate stably at 500. Alternatively, the gas sample may have a pressure that is less than atmospheric pressure or the ILS laser 500 is designed to generate a pressure that is less than the pressure of the laser (e.g., when a vacuum is present in the gas sample cell body 406). In addition, the gas sample tank body 406 enables stable operation of the ILS laser 500 when a gas sample having a fluctuating pressure is used. Suitably, the slot body 406 comprises a stainless steel body having a size suitably in the range of 10 to 90 micrometers (mm). In a preferred feature of one of the features of the present invention, the 'Sample System 400a' forms an opening (i.e., an opening in the body 406) having an approximately flea leaf diameter. The best is that the opening in the body 40 and the center of the gas sample tank body 406 is applicable to the paper size of the Chinese National Standard (CNS) Α4 specification (210X 297). (Please read the precautions on the back first and fill in (This page) ~ Install I --- ^ ---!-Order -------. -24- A7 B7 V. Description of Invention (22). Most preferably, the diameter of the opening in the groove body 406 is appropriately selected to be larger than the diameter of the incident beam so that the optical: chemical alignment of the gas sample system 400A can be easily obtained. The thicknesses of the windows 404, 405 are appropriately selected to avoid interference effects that would interfere with the quality of the ILS absorption spectrum obtained by the operation of the gas detection system 10. Based on this feature, the materials used in forming the windows 404, 405 are optimally selected to minimize absorption losses in the range in which the ILS laser 500 operates, such as in the range of 1350 to 1550 nanometers (nm) Like. For example, windows 404, 405 may be formed from an optically compatible material, such as Infrasil ™, available from Research Electro Optics of Boulder, CO, which is extremely light-repellent. The windows 404, 405 are properly positioned at a Brewster's angle, which further minimizes reflection losses from the surface of such windows. Printed by the Ministry of Economic Affairs * Standard Consumer Work Cooperatives When so configured, the gas sample tank 406 appropriately allows the beam to pass through the gas sample to be analyzed. The couplers 408,409 with a tube attached are appropriately selected to provide easy adjustments, such as can be required to realign and / or align the windows in the ILS laser device 500 without changing the threshold pumping conditions. 404,405. The resonator cavity, in the case where the system 400A is used, is suitably formed by the physical length between the mirrors 501, 503, 505 (including the laser crystal 507 and the area included between the windows 404, 405 and the windows 404 and 405 itself contains the sample system 400A). However, in those cases where the sample does not chemically react with the laser components, the sample slot is nominally formed by the physical regions between the mirrors 501, 503, and 505 (except for the laser crystal 507 outer). What will be noticed is that any gas in the room 400 to be detected is -25-(Please read the precautions on the back before filling this page) This paper size applies the Chinese National Standard (CNS) Α4 specification (210X 297 (Mm) A7 printed by the Shellfish Consumer Cooperative of the Central Bureau of Standards of the Ministry of Economic Affairs ^ _____ B7 V. Description of the invention (23) The body (impurity) must be properly removed or eliminated so that it is compatible with the gas sample contained in the system 400A The amount of those gases (impurities) or the absorption spectra of the samples obtained through the use of the gas detection system are accurate. According to a preferred feature of the present invention, the chamber 400 is advantageously a sealed container capable of washing the gas (impurity) to be detected or being evacuated to remove the gas (impurity) to be detected, Or the degree of the gas (impurity) therein can be reduced to a level lower than that to be detected in the sample system 400A. As described more fully below, continuous removal of impurities can be achieved by, for example, the &quot; suck &quot; method.

請參閱第2和4圖所示,根據本發明的較佳實施例,ILS 至400(除了該樣品系統4〇〇a外)係適當地包含一容器底座 401和一可聯結的頂蓋41〇。對應的窗4〇2,4〇3係以一適當 的形式及與被形成在其内之光學共振器腔相關的位置來被 適當地定位在本體401的壁中。容器底座401和頂蓋41〇適 當地由不銹鋼或者鋁所構成。頂蓋41〇係依據任何適於容 許在其内之雜質之撤空、洗淨及/或進一步移去的習知技 術來被有利地鎖固至本體4 01。例如,一填隙料41 〇 a或者 其他具有密封策略之適當的裝置(例如,機械辅助器、金 屬密封物、黏合劑、及其類似,所有皆沒有被顯示)可以 被使用於如此的用途。希望的是,底座401和頂蓋41〇在送 至使用者之前係有效地以相當無法隨便開封的形式被密封 〇 為了洗淨或者撤空室400的目的,用於真空抽送及/ 或洗淨的一輸入管411和用於真空抽送及/或洗淨的一輸 本紙張尺度適用中國國家標準(CNS ) A4規格(2丨0X29&quot;?公釐) (請先閲讀背面之注意事項再*填寫本頁) •-ο 裝- 訂Please refer to FIGS. 2 and 4. According to a preferred embodiment of the present invention, ILS to 400 (except the sample system 400a) suitably include a container base 401 and a connectable top cover 41. . The corresponding windows 402, 403 are appropriately positioned in the wall of the body 401 in an appropriate form and at a position related to the optical resonator cavity formed therein. The container base 401 and the top cover 41 are suitably made of stainless steel or aluminum. The top cover 410 is advantageously locked to the body 401 in accordance with any conventional technique suitable for allowing evacuation, washing and / or further removal of impurities therein. For example, a gap filler 410a or other suitable device with a sealing strategy (for example, mechanical aids, metal seals, adhesives, and the like, all of which are not shown) can be used for such applications. It is desirable that the base 401 and the top cover 41 are effectively sealed in a form that cannot be easily opened before being sent to the user. For the purpose of washing or evacuating the chamber 400, it is used for vacuum pumping and / or washing. One input tube 411 and one paper size for vacuum pumping and / or cleaning are applicable to China National Standard (CNS) A4 specifications (2 丨 0X29 &quot;? mm) (Please read the notes on the back before filling in (This page) • -ο Binding-Staple

經濟部中央標準局員工消费合作社印製 五、發明説明(24) 出管412係被設置。 窗402,403係被適當地置放在容器4〇1的壁中,藉此提 供對ILS室400的光學通路。最好的是,窗4〇2係被適當地 設有一大約1000至110〇nm ’最佳為大約1〇64nm的抗反射 (AR)塗層。另一方面,窗403最好係由一沒有八尺塗層的光 學窗所構成。窗402係被適當地設計俾提供在波長λ p下的 最大傳輸’在這情況中為1 〇64nm。同樣,窗403係被適當 地没汁俾提供在ILS雷射器500之運作波長範圍上的最大傳 輸(例如’ 1350nm至大約I550nm)。 更特別地,降低在室400(除了樣品系統4〇〇A)中之氣 體(雜質)至一可接受程度可以適當地包含洗淨或者撤空具 有頂蓋410的可密封容器401以致於氣體(雜質)的程度是低 於在該樣品系統内之氣體樣品中之要被檢測的程度。會被 察覺到的是,當在(1)在該室中之氣體的濃度與(2)在該氣 體樣OO槽本體中之氣體的濃度之間的比率與在(1)該腔之 長度(即,在鏡501與鏡505之間)與(2)該ILS雷射器束流通 過該槽本體的長度之間的比率相等時,由在該室4〇〇中之 氣體所促成的損失會係可以與由在該氣體樣品槽本體4〇6 中之氣體所促成的損失相比的。 在雜質由水蒸氣所構成的該等情況中,在室4〇〇中的 水水平必須被降低到在被包含於該樣品内的那些下面。根 據本發明,少於10ppt(在腐蝕性氣體中lppb)的撿測水平 係可獲得的。雖然任何目前已知或者於此後想出之用以將 雜質(例如,水)從室400(除了樣品系統40〇a外)的方法妒 本纸張尺度適用中國國家榇隼(CNS ) A4規格(210X 297公釐) (請先閱讀背面之注意事項恭填寫本頁)Printed by the Consumers' Cooperative of the Central Standards Bureau of the Ministry of Economic Affairs 5. Description of the Invention (24) The outlet 412 system was set up. The windows 402, 403 are appropriately placed in the wall of the container 401, thereby providing optical access to the ILS chamber 400. Preferably, the window 402 system is suitably provided with an anti-reflective (AR) coating of about 1000 to 1 100 nm ', preferably about 1064 nm. On the other hand, the window 403 is preferably constituted by an optical window without an eight-foot coating. The window 402 is appropriately designed to provide a maximum transmission at a wavelength λp 'in this case of 1064 nm. Similarly, the window 403 is appropriately immersed to provide the maximum transmission over the operating wavelength range of the ILS laser 500 (e.g., '1350 nm to about 1550 nm). More specifically, reducing the gas (impurities) in the chamber 400 (except for the sample system 400A) to an acceptable level may suitably include washing or emptying the sealable container 401 with the top cover 410 so that the gas ( Impurities) are below the level to be detected in a gas sample in the sample system. What will be noticed is when the ratio between (1) the concentration of the gas in the chamber and (2) the concentration of the gas in the body of the gas sample OO tank and (1) the length of the cavity ( That is, when the ratio between the mirror 501 and the mirror 505) and (2) the length of the ILS laser beam passing through the groove body is equal, the loss caused by the gas in the chamber 400 will be This is comparable to the loss caused by the gas in the gas sample cell body 406. In these cases where the impurities consist of water vapor, the water level in the chamber 400 must be reduced below those contained in the sample. According to the present invention, detection levels of less than 10 ppt (lppb in corrosive gas) are available. Although any method currently known or later conceived to remove impurities (eg, water) from the chamber 400 (except for the sample system 40oa), this paper size is applicable to the Chinese National Cricket (CNS) A4 specification ( 210X 297 mm) (Please read the notes on the back first and fill in this page)

-27 --27-

五、發明説明(25) ~ 經濟部中央標準局員工消費合作社印製 夠被貫施在本發明的上下文内’然而,最好的是,室4〇〇 係適當地被密封而且惰性氣體,像氮氣般,係被抽送在其 内。’在某些情況中,會係必須進一步撤空該室4〇〇俾可產 生一個貫質上移去所有被包含於其内之雜質的真空。而且 ’在撤空時將該室400加熱係有用的。如果該室4〇〇在連續 被撤空時受到冷卻,該加熱或者&quot;烘烤(baking)”的應用 會致使較高程度的真空被達成。根據本發明的又再一特徵 ’一吸氣器(getter)(圖中未示)可以被有利地與室4〇〇一起 使用俾提供在該室之内之水之更進一步的消除。如會由熟 知此項技藝之人仕所察覺般,具有連續吸收水之能力的吸 氣器(例如,一分子泡沬材料)可以被使用來降低水(雜質) 的程度到在該氣體樣品槽406中之要被檢測的水濃度下面( 例如,少於1 〇ppt)。 該氣體樣品藉著連接一氣體管線至連接器4〇8,409及 供應該氣體至樣品糸統400A内而係被適當地連通至系統 400A。 如以上簡潔地所述般,ILS感測器500適當地光學檢測 被包含於被置放在室400内之氣體樣品中的氣體種類(雜質 ,例如,水蒸氣)。根據本發明,ILS雷射器500適當地包 含一被安裝於一晶體固持器508中的晶體(增益媒質)507。 晶體507係被適當地安裝於晶體固持器5〇,8中以致於晶體 507亦相對於入射束流來被最佳地置放。如先前所述般, 該入射束流係藉著抽送雷射器1 〇〇的運作或者經由束流成 形裝置200的使用而係被適當地成形以致於入射束流jf係 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) -28 - 請先閲讀背面之注意事項再·填寫本頁) 裝. -1·I、i iw ml ^nv\1 ! - - 1 B ^^^^1 ϋ^ϋ —«If— I i p 經濟部中央標準局員工消费合作社印裝 A7 ^____ B7 五、發明説 適當地與該ILS增益媒質.(例如,晶體5〇7)的模容積相配。 通常,ILS雷射器500係被適當地構形,以致於在該腔 内區域中的雷射束流在該束流被引入至該氣體樣品的區域 中,係實質上平行的(即,被象散地補償),例如,像被包 含於系統400八内-樣。雖然不同的光學構形可以被使用 於這目的,這些鏡構形業已被發現為特別有利的。該一種 構形容許該ILS雷射束流之準確的象散補償,藉此容許同 τ相付*要在產生雷射臨界值下抽送ILS雷射.器5⑼和一雷 射束流之產生的先學條件,該雷射束流在被引入該氣體樣 品時係實質上平行的,像被包含於系統4〇〇A内一樣。 根據本發明的這特徵,對應的窗5〇丨,5〇5和一折疊式 鏡503係被適當地使用於這目的。鏡5〇1最好係由一具有一 AR塗層的光學鏡所構成,其係被最佳地定以大約又p的中 〜位置,例如,在大約1〇〇〇與j 1〇〇nm之間,最佳為i〇64nm 。鏡501亦有一塗層,其有效地提供大约ρ9·8%到大約ι〇〇% 的反射度在該ILS雷射器500之運作之所欲的光譜範圍中( 例如,大約1350至大約l550nmp適當地,鏡5〇1由一凹 面鏡所構成。例如,鏡501可以具有大約1〇厘米(cm)的曲 率半徑(ROC)和大約1.〇至大約1 30cm的直徑。最好的是, 鏡503由一折疊式鏡所構成,其係與鏡5〇1類似地被構形並 且具有類似的反射塗層。根據本發明的較佳特徵,鏡503 具有一個適於在所欲之光譜範圍(例如,大約135〇至 1550nm)内達成大约99.8%至大約100%之反射度的塗層。 最好的是,鏡505由一平面鏡(roow所構成。請參閱第2 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) (請先閱讀背面之注意事項界填寫本頁) •Jo·^ —I.------訂----- • - - - - -29-V. Description of the invention (25) ~ Printed by the Consumer Cooperatives of the Central Bureau of Standards of the Ministry of Economic Affairs is sufficient to be applied in the context of the present invention. However, it is best that the chamber 400 is properly sealed and inert gas, such as Nitrogen was pumped into it. ’In some cases, the department must further evacuate the chamber 400 俾 to create a vacuum that removes all impurities contained in it. Moreover, 'the chamber 400 is useful for heating during evacuation. If the chamber 400 is cooled while continuously being evacuated, the application of heating or &quot; baking &quot; may cause a higher degree of vacuum to be achieved. According to yet another feature of the present invention, 'aspiratory A getter (not shown) can be advantageously used with the chamber 400 to provide further elimination of the water within the chamber. As will be noticed by those skilled in the art, An aspirator (for example, a molecular foam material) capable of continuously absorbing water can be used to reduce the level of water (impurities) to below the concentration of water to be detected in the gas sample tank 406 (for example, less (At 10 ppt). The gas sample is properly connected to system 400A by connecting a gas line to connectors 408,409 and supplying the gas to sample system 400A. As briefly described above, ILS The sensor 500 suitably optically detects the kind of gas (impurity, for example, water vapor) contained in a gas sample placed in the chamber 400. According to the present invention, the ILS laser 500 suitably includes a One crystal holder 508 The crystal (gain medium) 507 in the crystal. The crystal 507 is appropriately installed in the crystal holder 50.8, so that the crystal 507 is also optimally placed with respect to the incident beam. As described previously, the The incident beam is appropriately shaped by the operation of the pumping laser 100 or through the use of the beam forming device 200 so that the incident beam jf is a Chinese paper standard (CNS) A4 specification ( 210X297 mm) -28-Please read the precautions on the back before filling in this page) Pack. -1 · I, i iw ml ^ nv \ 1!--1 B ^^^^ 1 ϋ ^ ϋ — «If — I ip Printed by the Consumer Standards Cooperative of the Central Bureau of Standards of the Ministry of Economic Affairs A7 ^ ____ B7 5. The invention is appropriately matched to the mold volume of the ILS gain medium (for example, crystal 507). Generally, the ILS laser 500 series Are appropriately configured so that the laser beam in the region within the cavity is substantially parallel (ie, astigmatically compensated) in the region where the beam is introduced into the gas sample, for example, The image is included in the system 400-like. Although different optical configurations can be used for this purpose, These mirror configurations have been found to be particularly advantageous. This configuration allows accurate astigmatism compensation of the ILS laser beam, thereby allowing compensation with τ * to pump the ILS laser at a laser threshold The prior conditions for the generation of a device 5a and a laser beam, which is substantially parallel when introduced into the gas sample, as if contained in the system 400A. According to the invention With this feature, the corresponding windows 50, 50, and a folding mirror 503 are suitably used for this purpose. The mirror 501 is preferably composed of an optical mirror with an AR coating, and its system It is optimally set at about the middle position of p, for example, between about 1000 and j 100 nm, and most preferably 64 nm. The mirror 501 also has a coating, which effectively provides a reflectance of about ρ 9.8% to about ιη% in the desired spectral range for the operation of the ILS laser 500 (for example, about 1350 to about 1550 nmp is appropriate Ground, the mirror 501 is composed of a concave mirror. For example, the mirror 501 may have a radius of curvature (ROC) of about 10 centimeters (cm) and a diameter of about 1.0 to about 1 30 cm. Preferably, the mirror 503 It is composed of a folding mirror, which is similarly configured as the mirror 501 and has a similar reflective coating. According to a preferred feature of the present invention, the mirror 503 has a structure suitable for the desired spectral range (for example, (Approximately 1350 to 1550nm) to achieve a reflectance of about 99.8% to about 100%. It is best that the mirror 505 is composed of a flat mirror (roow. Please refer to the second paper standard applicable to Chinese national standards ( CNS) A4 specification (210X297mm) (Please read the notes on the back to fill out this page first) • Jo · ^ —I .------ Order ----- •-----29-

圖所示,鏡505面對鏡50.3的一侧,係被有利地設置有一反 射塗層在該ILS雷射器500之產生雷射之所欲之光譜範圍内 ,例如,在1350與大約1550mn之間。鏡5〇5的另一側5〇5]8 係被適當地未塗覆。 最好的是’鏡505的表面係彼此適當地形成一個大约 〇·5至大約3.0度的角度,最佳為大約1〇度。本案發明人發 現以這升&gt; 式將該等表面形成楔形傾向於將會引致干擾效果 之不希望的反射減至最小。 安裝件502,504,和506容許機械調節俾光學地對齊在 至400之内的ILS腔。例如,本案發明人發現該ILS雷射器5〇〇 的效率,在鏡501和505被排成與大約〇。之束流入射角成 直線及鏡503被排成與大約12.5。之束流入射角成直線的 雷射器構形中’係被發揮至最大。 經濟部中央標準局員工消费合作社印製 -II1 m 1--— 11 I - - - - I 5'..&quot;V 1 (請先閲讀背面之注意事項再填寫本頁) 訂 由於鏡501,503,和505的適當設計、置放、及構形, 束流Η在鏡503和505之間的區域中係實質上平行(即,調 準(colhmated))。結果,樣品系統4〇〇A^iLS雷射器5〇〇之 性能上沒有明顯有害的效果之下,能夠被插入在腔内區域 之内。然而,會被察覺到的是,在該ILS雷射器5〇〇内之任 何反射表面(例如,鏡及窗)之間的距離必須不可以是有任 何干擾發生在該ILS雷射器内的程度。如果在該等反射表 面之間的距離係相等於可與該ILS雷射器晶體5〇7運作之波 長相比之波長的整數的話,干擾圖型係被產生。 如以上所述,ILS雷射器晶體5〇7最好係在一個適於被 包含在該氣體樣品(例如’水蒸氣)内之雜質之檢測的 本紙張尺度適用中爵國家標準(CNS ) A4規格(2ωχ2974&gt;麓) -30- 經濟部中央標準局員工消费合作社印製 A7 ____B7___ 五、發明説明(28) 範圍中運作,在該波長範圍内,一特徵吸收光譜能夠被獲 得。如先前所述’雷射器晶體507通常展現一多模式雷射 系統1的特性。會被察覺到的是,該雷射器晶體5〇7之輸出 的模間隔係被要求為小到足以準確表示該氣體樣品的吸收 特徵。由雷射器晶體507所產生的光線典型地具有一個大 约450百萬兆赫(MHz)到550MHz的模間隔,最好係大約 500MHz,藉此保證吸收帶之準確的光譜重現。雖然在本 發明的上下文中任何晶體都可以被使用,一 Cr4+:YAG咬 者Cr4+:鑛(Lu)AG雷射器晶體係最適於使用在本發明中(例 如,就HC1中之水蒸氣的檢測而言)。此外,Cr4+離子的其 他基質材料可以被使用而且其他摻雜至這些基質晶體内的 離子可以被替換。本案發明人發現,在填塞基質材料(garnet h〇st)(例如,YAG或者LuAG)中之Cr〇系統的低增益效率 能夠被成功地運作如一個使用大約丨〇至3〇Inm長度和5mm 直徑之晶體的雷射器。最好的係,該摻雜濃度在如此的填 塞基質材料中是在大约0.10%至〇_3〇%的範圍内。一特定 的幸父佳雷射器增益媒質507包含一 Cr4+:YAG或者Cr4+· LuAG晶體,該晶體係以布儒斯特角形式切割俾將反射損 失減至最低。更特別地,具有大約〇15%摻雜含量之大約 23至27mm之晶體長度之以布儒斯特角切割的一 Cr4+: yag 晶體(例如,η為大約1.82且ΘΒ為大約61·2.〇的晶體折射指 數)業已被發現在本發明之氣體檢測系統1〇的上下文中係 特別有利的。 能夠被適當地使用於本發明之其他雷射器晶體5〇7 本纸張尺度適用中國國家標準(CNS ) A4規格(2!0X 297公釐) --GT 裝— (請先閲讀背面之注意事項再填寫本頁) —7 I I -- I T I— I I . .-° • 1 1 1^1 1 —^1 . -31 - Α7 __Β7 五、發明説明(29) 例子係如下:Cr:Tm:H.o:YAG、Cr4+:YSO、Cr4+:YAG、As shown in the figure, the side of the mirror 505 facing the mirror 50.3 is advantageously provided with a reflective coating in the desired spectral range of the ILS laser 500, for example, between 1350 and about 1550mn. between. The other side of the mirror 5105 is properly uncoated. It is preferable that the surfaces of the 'mirror 505' form an angle of about 0.5 to about 3.0 degrees with each other appropriately, and most preferably about 10 degrees. The inventors of the present case found that wedge-forming these surfaces in this liter formula tends to minimize unwanted reflections that cause interference effects. Mounts 502, 504, and 506 allow mechanical adjustment of optically aligned ILS cavities to within 400. For example, the inventor of the present case found that the efficiency of the ILS laser 500 was aligned with mirrors 501 and 505 to about 0. The beam angle of incidence is straight and the mirrors 503 are aligned with approximately 12.5. In the laser configuration where the beam incident angle is linear, the system is maximized. Printed by the Consumer Cooperatives of the Central Bureau of Standards of the Ministry of Economic Affairs -II1 m 1 --- 11 I----I 5 '.. &quot; V 1 (Please read the precautions on the back before filling this page) Order due to mirrors 501,503, With proper design, placement, and configuration of the 505 and 505, the beam currents are substantially parallel (ie, collhmated) in the area between the mirrors 503 and 505. As a result, the sample system 400A ^ iLS laser 5000 could be inserted into the cavity region without significantly detrimental performance. However, it will be observed that the distance between any reflective surfaces (eg, mirrors and windows) within the ILS laser must not be such that any interference occurs within the ILS laser degree. If the distance between the reflective surfaces is an integer equal to the wavelength that can be compared to the wavelength at which the ILS laser crystal 507 operates, an interference pattern is generated. As mentioned above, the ILS laser crystal 507 is preferably in a paper standard suitable for the detection of impurities contained in the gas sample (for example, 'water vapor'). The national standard (CNS) A4 is applicable. Specifications (2ωχ2974 &gt; Lu) -30- Printed by the Consumer Cooperatives of the Central Standards Bureau of the Ministry of Economic Affairs A7 ____B7___ V. Description of Invention (28) In this wavelength range, a characteristic absorption spectrum can be obtained. As previously mentioned, the 'laser crystal 507 typically exhibits the characteristics of a multi-mode laser system 1. It will be noticed that the mode spacing of the output of the laser crystal 507 is required to be small enough to accurately represent the absorption characteristics of the gas sample. The light generated by the laser crystal 507 typically has a mode interval of about 450 million megahertz (MHz) to 550 MHz, preferably about 500 MHz, thereby ensuring accurate spectral reproduction of the absorption band. Although any crystal can be used in the context of the present invention, a Cr4 +: YAG biter Cr4 +: mine (Lu) AG laser crystal system is most suitable for use in the present invention (for example, for the detection of water vapor in HC1 In terms of). In addition, other matrix materials of Cr4 + ions can be used and other ions doped into these matrix crystals can be replaced. The inventors of the present case have found that the low gain efficiency of the Cr0 system in a garnet hst (e.g., YAG or LuAG) can be successfully operated as one using a length of about 0 to 30 Inm and a diameter of 5 mm Laser of crystal. Most preferably, the doping concentration in such a packing matrix material is in the range of about 0.10% to 0-30%. A specific Xingfujia laser gain medium 507 includes a Cr4 +: YAG or Cr4 + · LuAG crystal, which is cut in the form of Brewster's angle to minimize reflection losses. More specifically, a Cr4 +: yag crystal cut at a Brewster's angle with a crystal length of about 23 to 27 mm with a doping content of about 0.015% (for example, η is about 1.82 and ΘB is about 61.2. Crystal Refractive Index) has been found to be particularly advantageous in the context of the gas detection system 10 of the present invention. Can be appropriately used in other laser crystals of the present invention. 507 This paper size is applicable to the Chinese National Standard (CNS) A4 specification (2! 0X 297 mm). -GT equipment-(Please read the note on the back first Please fill in this page for matters) —7 II-ITI— II. .- ° • 1 1 1 ^ 1 1 — ^ 1. -31-Α7 __Β7 V. Description of Invention (29) The example is as follows: Cr: Tm: Ho : YAG, Cr4 +: YSO, Cr4 +: YAG,

Cr4+:YSAG、Er:GSGG、Er3+:YLF、Er3+:Yb3+:玻璃、Cr4 +: YSAG, Er: GSGG, Er3 +: YLF, Er3 +: Yb3 +: glass,

Ho3-:YSGG ' Ho3+:Tm3+:LuAG ' Tm3+:Ho3+:YLF ' Tm3+:Ho3+ :YAG、Tm3+:Ca Y SOAP、Tm3+:YLF、Tm3+:Tb3+:YLF、Tm3+: 玻璃、Tm3+:Ca La SOAP、Tm3+:Y〇S、Tm3+:YSGG、Tm3+: YAG、Yb3+:YAG、Cr:鎮橄欖石、Er:Yb:玻璃、c〇2+:MgF2 、Cr :ZnSe、Cr2+:ZnS/ZnSe/ZnTe、Ti3+:A1203、及 Ni2+:Ho3-: YSGG 'Ho3 +: Tm3 +: LuAG' Tm3 +: Ho3 +: YLF 'Tm3 +: Ho3 +: YAG, Tm3 +: Ca Y SOAP, Tm3 +: YLF, Tm3 +: Tb3 +: YLF, Tm3 +: Glass, Tm3 +: Ca La SOAP, Tm3 + : Y〇S, Tm3 +: YSGG, Tm3 +: YAG, Yb3 +: YAG, Cr: olivine, Er: Yb: glass, c〇2 +: MgF2, Cr: ZnSe, Cr2 +: ZnS / ZnSe / ZnTe, Ti3 +: A1203, and Ni2 +:

BaLiF3 〇 目刖可付之雷射窃晶體5 Ο 7 ’雖然在效率上有改良 仍然係有相當大的損失。該等損失轉換成熱能。根據本 明,晶體507係以一個容許在運作中如此被產生之熱能: 效移去的形式來被適當地安裝。然而,應要察覺到的是 當雷射器晶體507的效率隨著新晶體被研發出來而持^ =時,對於熱能移去裝置的需要或者要求會被降低且很^ 此’在某面’該等損失會小到移去該熱能的需要會j 部被消’除'然而’使用目前可得的晶體5()7,雷射器系統% 最好係更包含一散熱系統500A。 經濟部中央標準局貞工消f合作社印It 、請繼續參閱第2圖並請配合第5圖所示,散熱系統肌 被連接至安裝件5〇8和晶體5〇7(在第5圖中未被顯示女 在第5圖中所顯示般,固持器最好係包含一個被適當地 配置俾機械地固持該雷射器晶體507的兩部件固持器。费 熱系統500A最好係包括一銅質散熱橋51〇、—熱電冷卻哭 電感卿511。此外,—電氣溫度㈣界面^ °又 室400之本體401的壁中(見第4圖)。與橋51〇 本麻纽制巾 -32- 五、發明説明(30BaLiF3 〇 Affordable laser theft crystal 5 0 7 ′ Although there is an improvement in efficiency, there is still a considerable loss. These losses are converted into thermal energy. According to the present invention, the crystal 507 is properly installed in a form that allows the thermal energy: efficiency to be so removed during operation. However, it should be noticed that when the efficiency of the laser crystal 507 is maintained as new crystals are developed, the need or requirement for the thermal energy removal device will be reduced and very ^ this 'on a certain side' Such losses will be so small that the need to remove the thermal energy will be eliminated. However, using the currently available crystal 5 () 7, the laser system% preferably includes a heat dissipation system 500A. The Central Standards Bureau of the Ministry of Economic Affairs, Zhengong Consumer Cooperative Co., Ltd. Please continue to refer to Figure 2 and cooperate with Figure 5. The cooling system muscle is connected to the mounting member 508 and the crystal 507 (in Figure 5). As shown in Figure 5, the holder preferably includes a two-part holder that is appropriately configured to mechanically hold the laser crystal 507. The thermal system 500A preferably includes a copper Mass cooling bridge 51 °,-thermoelectric cooling circuit 511. In addition,-electrical temperature ㈣ interface ^ ° in the wall of the main body 401 of the chamber 400 (see Figure 4). And bridge 51 〇 Ben Ma Ni towel -32 -V. Description of the invention (30

-起的女裝件508、冷卻器5〇9、及感測器5ιι作為來適當 地將晶體507與包含ILS雷射器5〇〇的其他光學元件對齊, 與及致能該晶體之熱特性的控制。 mV 1ί ml nn 經濟部中央標準局員工消费合作社印製 根據本發明的較佳特徵,散熱系統500A是與晶體5〇7 成直接^理接觸。透過由束流F所引起之光學激能之晶體 5〇7之正常運作所產生的熱能係被有效地傳導離開晶體507 ,藉此保持一相當固定的運作晶體溫度。最好的是,晶體 固持器508包含被運作地連接至冷卻器5〇9和散熱橋51〇的 銅/鋁。適當地,散熱橋51〇包含一位於室4〇〇之本體4〇ι 内的銅散熱器以致於過多的熱能被傳導離開晶體5〇7。感 測器511測量固持器5〇8、冷卻器5〇9、橋51〇、及晶體 的溫度以致於最佳的運作溫度被保持。根據本發明的這特 徵,晶體507的熱管理被獲得,藉此消除會不必要地拖累 和複雜該氣體檢測系統1〇之運作之冷卻液的需求。 ILS雷射系統500係被適當地配置以致於激能晶體5〇7 之該束流與來自鏡503之反射束流的角(0 )是大約2〇。至 30° ’最好係從大約23。至27。,而且最佳為大約25。。 這束流(束流H)是指向於樣品系統400A。 在通過樣品系統400A之後,來自ILS雷射器500的輸 出束流G被指向於光議儀總成6〇〇。如在第2圖中所顯示般 ’藉著一個被適當地安裝於一鏡安裝件602上之折疊式鏡 6〇1的使用’如此的方向能夠被獲得。鏡601最好係包含一 平面鏡,其包含一個為了在ILS雷射器500之運作之所欲光 譜範圍中有高反射性的塗層(例如,1350至1550nm)。 本紙張尺度遥用中國國家標準(CNS ) A4規格(210X297公釐) -33 - 請先閲讀背面之注意事項再·填寫本頁) /l\ I - -----------裝一;;--^ it----訂------The women's clothing 508, the cooler 509, and the sensor 5m are used to properly align the crystal 507 with other optical elements including the ILS laser 500, and enable the thermal characteristics of the crystal control. mV 1ί ml nn Printed by the Consumer Cooperative of the Central Standards Bureau of the Ministry of Economic Affairs According to a preferred feature of the present invention, the heat dissipation system 500A is in direct contact with the crystal 507. The thermal energy generated by the normal operation of the optically excited crystal 507 caused by the beam F is effectively conducted away from the crystal 507, thereby maintaining a fairly constant operating crystal temperature. Preferably, the crystal holder 508 comprises copper / aluminum operatively connected to a cooler 509 and a heat sink bridge 510. Suitably, the heat dissipation bridge 51o includes a copper heat sink located within the body 400m of the chamber 400 so that excessive thermal energy is conducted away from the crystal 507. The sensor 511 measures the temperature of the holder 508, the cooler 509, the bridge 510, and the crystal so that the optimal operating temperature is maintained. According to this feature of the present invention, thermal management of the crystal 507 is obtained, thereby eliminating the need for a coolant that would unnecessarily drag and complicate the operation of the gas detection system 10. The ILS laser system 500 is configured so that the angle (0) between the beam current of the exciter crystal 507 and the reflected beam current from the mirror 503 is about 20. To 30 ° 'is preferably from about 23. To 27. , And the best is about 25. . This beam (beam H) is directed to the sample system 400A. After passing through the sample system 400A, the output beam G from the ILS laser 500 is directed toward the optical analyzer assembly 600. As shown in FIG. 2, such a direction can be obtained by using a folding mirror 601 which is appropriately mounted on a mirror mount 602. Mirror 601 preferably includes a flat mirror that includes a coating (e.g., 1350 to 1550 nm) that is highly reflective in the desired spectral range of operation of ILS laser 500. This paper uses the Chinese National Standard (CNS) A4 specification (210X297 mm) -33-Please read the notes on the back before filling in this page) / l \ I------------ Pack one;-^ it ---- Order -----

經濟部中央標準局貝工消费合作社印裝 會被察覺到的是,來自該ILS雷射器500的輪出能夠透 過光纖接線來被更替地傳輸至一遙遠位置以供光譜分析 。特別地,束流G能夠被連接至一光纖或者一束光纖。該 ILS雷射器500的輸出,在通過氣體種類之後,係藉此被送 至位於該遙遠位置的該光議儀總成6〇〇。在適當的條件之 下,該光纖傳輸業已被證明不使該光譜資料失真。 請繼續參閱第2圖所示,光議儀總成6〇〇包含散佈光栅 ’該等散佈光栅係被設計來光譜地分解一相干束流,特別 疋’在要被檢測之樣品中之雜質的吸收光譜。適當地,該 光譜儀600的光譜散佈係足夠大到清楚地分解該雜質的吸 收特徵,藉此致能每個雜質之',特徵&quot;的鑑定及該雜質之 濃度的數值判定。雖然任何已知或者於此後被提出的光譜 儀可以根據本發明來被使用,最好的是光譜儀6〇〇包含兩 個繞射光栅總成600A和600B,該兩個繞射光柵總成6〇〇A 和600B係配合一光學束流擴張裝置600C和一聚焦透鏡總 成600D運作。光學束流擴張裝置6〇〇C最好包含經由安裝 件604和606之使用而被適當地安裝於該氣體檢測系統1〇内 的透鏡603和605。透鏡603最好係包含一負透鏡而透鏡605 最好係包含一調準透鏡;每個透鏡最好具有一 AR塗層, 其係被定以中心位置在大約要被檢測之樣品中之雜質的吸 收光譜附近,例如,在大約lOOOnm與1500nm之間,最佳 為 1400nm。 繞射光栅總成600A和600B適當地包含被安裝於對應 之繞射光柵安裝件608和610上之對應的繞射光栅607和609 本紙張尺度適用中國國家標準(CNS ) A4規格(210X 297公釐) -34- C请先閲讀背面之注意事項Α填寫本頁) ,ιτ 五、發明説明( 經濟部中央標準局員工消費合作社印製 A7 B7 32、 。如將被察覺般,安裝件608,610容許在光議儀總成6〇〇内 之繞射光柵607,609的調和及調節。 聚焦透鏡總成600D最好係包含一透鏡611,該透鏡6 j i 包含一個在該ILS雷射器500運作之波長下的ar塗層,例 如’在大約lOOOnm與1500nm之間,最佳為1400nm。該透 鏡611聚焦該光譜儀600的輸出至多路陣列檢測器7〇丨上。 該ILS雷射器500運作之光譜範圍係由光議儀總成6〇〇 所產生並且係空間性.地横越一個該多路陣列檢測器7〇 1被 適當地固定在一安裝件702上的平面。包含被要求來運作 及讀取來自該多路檢測器701之資訊之控制及計時電子元 件的一電子板703係被可運作地連接至它那裡。結果,被 要求經由該氣體檢測系統1 〇之使用來被鑑定之特定雜質之 整個光s普散佈吸收光s普能夠被獲得。該雜質之特定之吸收 特徵的位置和相對強度能夠被使用來獨特地鑑定該被檢測 氣體(雜質)而且數值判定該氣體(雜質)的量亦如是被檢測 〇 該檢測器701可以包含,例如,具有256個有1〇〇# m 間隔之像素的一 InGaAs多路陣列檢測器。由多路檢測器 701所檢測的光線最好係在每個檢測器元件(像素)處被轉 換成電子訊號,訊號其後係經由電子板703被轉移至一類 比至數位(A/D)轉換器801。轉換器8〇1係經由— BNC連接 器及屏蔽電纜704來被適當地連接以致於資訊的準確轉移 被保證。只要該資料係如此被轉換,它係被發送至一電腦 802,該電腦802可以適當地被程式俾轉換該等電子訊號成 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公楚) (請先閲讀背面之注意事項再填寫本頁)What will be noticed by the Central Standards Bureau of the Ministry of Economic Affairs of the Bayer Consumer Cooperative Printing is that the turn-out from the ILS laser 500 can be transmitted to a remote location alternately through a fiber optic cable for spectral analysis. In particular, the beam G can be connected to an optical fiber or a bundle of optical fibers. The output of the ILS laser 500, after passing through the type of gas, is thereby sent to the optical analyzer assembly 600 located at the remote location. Under appropriate conditions, the fiber optic transmission has been shown not to distort the spectral data. Please continue to refer to Figure 2. The optical analyzer assembly 600 includes a dispersion grating 'these dispersion grating systems are designed to spectrally decompose a coherent beam, especially' the impurities in the sample to be detected Absorption spectrum. Suitably, the spectral dispersion of the spectrometer 600 is large enough to clearly decompose the absorption characteristics of the impurity, thereby enabling the identification of each impurity's characteristics, and the numerical determination of the concentration of the impurity. Although any known or later proposed spectrometer can be used in accordance with the present invention, it is best that the spectrometer 600 includes two diffraction grating assemblies 600A and 600B, the two diffraction grating assemblies 600. A and 600B operate with an optical beam expansion device 600C and a focusing lens assembly 600D. The optical beam expansion device 600C preferably includes lenses 603 and 605 which are appropriately mounted in the gas detection system 10 via the use of mounts 604 and 606. The lens 603 preferably contains a negative lens and the lens 605 preferably contains an alignment lens; each lens preferably has an AR coating which is centered on the impurities in the sample to be detected Near the absorption spectrum, for example, between about 100 nm and 1500 nm, the best is 1400 nm. Diffraction grating assemblies 600A and 600B appropriately include the corresponding diffraction gratings 607 and 609 mounted on the corresponding diffraction grating mounting pieces 608 and 610. This paper size is applicable to the Chinese National Standard (CNS) A4 specification (210X 297 mm) (Central) -34- C Please read the note on the back first to complete this page), ιτ V. Description of the invention (printed by A7 B7 32, Consumer Cooperatives of the Central Standards Bureau of the Ministry of Economic Affairs. If it will be noticed, the installation parts 608,610 allow Harmonization and adjustment of the diffraction gratings 607,609 within the optical analyzer assembly 600. The focusing lens assembly 600D preferably includes a lens 611, and the lens 6 ji contains a wavelength at which the ILS laser 500 operates Ar coating, such as' between about 100 nm and 1500 nm, preferably 1400 nm. The lens 611 focuses the output of the spectrometer 600 onto the multi-channel array detector 70. The spectral range in which the ILS laser 500 operates is It is generated by the optical interferometer assembly 600 and is spatial. The ground traverses a plane where the multi-channel array detector 701 is properly fixed on a mounting piece 702. It is required to operate and read from The multipath detection An electronic board 703 of the information control and timing electronics of 701 is operatively connected to it. As a result, the entire light s diffusion absorption of a specific impurity identified by the use of the gas detection system 10 is required. The light source can be obtained. The position and relative intensity of the specific absorption characteristics of the impurity can be used to uniquely identify the gas (impurity) to be detected and numerically determine the amount of the gas (impurity). The detector 701 may include, for example, an InGaAs multiplexed array detector having 256 pixels with 100 # m intervals. The light detected by the multiplexed detector 701 is preferably tied to each detector element (pixel). The signal is converted into an electronic signal, and the signal is then transferred to an analog-to-digital (A / D) converter 801 via the electronic board 703. The converter 801 is appropriately connected via a BNC connector and a shielded cable 704. The connection is such that the accurate transfer of information is guaranteed. As long as the data is so converted, it is sent to a computer 802, which can be appropriately programmed to convert the electronics Signal cost paper size applies to Chinese National Standard (CNS) A4 specification (210X297). (Please read the precautions on the back before filling this page)

-35- 經濟部中央標準局员工消費合作社印裝 A7 B7 五、發明説明(33) 光譜資訊’即,鑑定一特定氣體(雜質)及氣體(雜質)之濃 度的光譜特徵。 '或者,通過要被監視之氣體種類之ILS雷射器500的輸 出能夠被指向於一光議儀總成600,該光議儀總成6〇〇具有 至少一個能夠對於波長被掃描的散佈光學元件在其内(例 如,繞射米柵607和609)。該光議儀總成600的輸出能夠被 指向於一單路檢測器。在該雷射器腔5中之氣體種類的光 睹特徵係藉著掃描該散佈光學元件來被獲得,而經由該光 議儀總成600所傳輸的光線則通過被置放在該單路檢測器 刖面之一適當的隙縫(例如’狹縫)。經由該光議儀總成6〇〇 所傳輸之光線的強度,即’該光議儀總成6〇〇的輸出,當 該散佈光學元件被掃描時係被記錄。 現在請參閱第2圖所示,如先前所述,一旦抽送雷射 益100引致該ILS雷射器在或者接近其之臨界值水平運作時 ,該氣體檢測系統10檢測該ILS雷射器500運作的光譜地分 解區域。在驅動器1〇〇之光學特性適當地與ILS雷射器5〇〇 的那些相配的情況中,沒有驅動器1 〇〇之輸出的額外變化 係需要的。然而,在來自驅動器1〇〇之被轉移至增益媒質(-35- Printed by the Consumer Cooperatives of the Central Bureau of Standards of the Ministry of Economic Affairs A7 B7 V. Description of the invention (33) Spectral information ', that is, a spectral characteristic that identifies a specific gas (impurity) and the concentration of a gas (impurity). 'Alternatively, the output of the ILS laser 500 through the type of gas to be monitored can be directed to an optical interferometer assembly 600 having at least one dispersion optic capable of being scanned for wavelengths The element is inside it (for example, diffractive meter grids 607 and 609). The output of the optical interferometer assembly 600 can be directed to a single detector. The optical characteristics of the gas species in the laser cavity 5 are obtained by scanning the diffuse optical element, and the light transmitted through the optical analyzer assembly 600 is detected by being placed in the single path. One of the appropriate slits (for example, a 'slit'). The intensity of the light transmitted through the optical analyzer assembly 600, that is, the output of the optical analyzer assembly 600, is recorded when the scattering optical element is scanned. Now referring to FIG. 2, as described earlier, once the pumping of the laser benefit 100 causes the ILS laser to operate at or near its threshold level, the gas detection system 10 detects the operation of the ILS laser 500. Spectrally decomposed regions. In the case where the optical characteristics of the driver 100 are appropriately matched to those of the ILS laser 5000, no additional change in the output of the driver 1000 is required. However, after being transferred from the driver 100 to the gain medium (

即,晶體507)之抽送輻射線的容積不適當地與必須在ILS 雷射器5 0 0之增益媒質内被光學激能的容積相配合的那些 情況中,束流變化系統2〇〇能夠被使用來促成該容積配合 〇 束流變化光學的例子包括繞射光學、折射光學、折射 分度軸向地改變的梯度分度光學、折射分度徑向地改 本纸張尺度適用中國國家標準(CNS ) Α4規格(210χ 297公釐) --------0111 {請先閱讀背面之注意事項再填寫本頁)That is, the volume of the pumped radiation of crystal 507) is inappropriately matched with the volume of optically excited energy in the gain medium of the ILS laser 500, the beam variation system 200 can be Examples of optics used to facilitate this volume in conjunction with beam change optics include diffraction optics, refractive optics, refractive indexing, gradient indexing optics that change axially, refractive indexing, and radial indexing. This paper's dimensions are subject to Chinese national standards ( CNS) Α4 specification (210 × 297 mm) -------- 0111 {Please read the precautions on the back before filling this page)

、1T -36 - A7 B7 五、發明説明(34) 梯度分度光學、微光學、及其之組合。在其之最簡單形式 ,束流變化系統200最好係包含一光學望遠鏡,該光學望 遠鏡藉著聚焦所需的光子密度成該ILS雷射器500之增益媒 質的正確位置和容積而能有效於將傳送至ILS雷射器500的 輻射線發揮至最大效用。特別地,束流變化系統200係被 使用來改變驅動器100的抽送輻射線俾符合ILS雷射器500 的要求。 根據本發明,束流變化系統200可以包含一束流擴張 望遠鏡。特別地,在抽送雷射器100包含該較佳光譜物理 二極管抽送固態晶體雷射器(preferred Spectra Physics diode pumped solid state laser)及 ILS 晶體 507 包含一 Cr4+: YAG或者一 Cr4+:LuAG晶體的該等情況中,該抽送雷射器 輸出的束流擴張會係必須的。 經濟部中央標準局員工消費合作社印製 如在第6圖中所顯示般,系統200適當地包含一列透鏡 及可調節的隙缝。特別地,一框體201被設置,其適當地 包括對應的直立壁,對應之可變的隙缝裝置202和20j係被 適當地設置在該等對應的直立壁中。雖然任何變化雷射器 100之輸出(例如,束流E)進入或者離開系統200所穿過之 開口之隙缝之適當的裝置可以被使用,適當地,裝置202 和205包含習知的隙縫變化裝置。系統200亦最好係包括一 聚焦透鏡203和一調準透鏡204。最好的是,透鏡203包含 一聚焦透鏡而透鏡204最好係包含一調準透鏡,該等透鏡 203,204皆具有一個在波長,;I p,的AR塗層,例如,在大 約1000至llOOnm,最佳為大約1064nm。如在第6圖中所顯 -37- (請先閱讀背面之注意事項再填寫本頁) 本紙張尺度適用中國國家標準(CNS ) A4規格(210X 297公釐)1T -36-A7 B7 V. Description of the invention (34) Gradient indexing optics, micro optics, and combinations thereof. In its simplest form, the beam variation system 200 preferably includes an optical telescope that is effective at focusing the photon density required to the correct position and volume of the gain medium of the ILS laser 500. The radiation transmitted to the ILS laser 500 is maximized. In particular, the beam variation system 200 is used to change the pumping radiation of the driver 100 to meet the requirements of the ILS laser 500. According to the present invention, the beam variation system 200 may include a beam expansion telescope. In particular, the pumping laser 100 includes the preferred spectral physical diode pumped solid state laser and the ILS crystal 507 includes a Cr4 +: YAG or a Cr4 +: LuAG crystal. In this case, the beam expansion of the pumped laser output may be necessary. Printed by the Consumer Standards Cooperative of the Central Bureau of Standards of the Ministry of Economics As shown in Figure 6, the system 200 suitably includes a column of lenses and an adjustable slot. In particular, a frame body 201 is provided, which appropriately includes corresponding upright walls, and the corresponding variable slit devices 202 and 20j are appropriately provided in the corresponding upright walls. Although any suitable device for changing the output of the laser 100 (eg, beam E) into or out of the slot through which the system 200 passes may be used, suitably devices 202 and 205 include conventional slot changing devices . The system 200 also preferably includes a focusing lens 203 and an alignment lens 204. Preferably, the lens 203 includes a focusing lens and the lens 204 preferably includes an alignment lens. The lenses 203, 204 each have an AR coating at a wavelength; Ip, for example, at about 1000 to 110 nm, The optimum is about 1064nm. As shown in Figure 6 -37- (Please read the precautions on the back before filling out this page) This paper size applies the Chinese National Standard (CNS) A4 specification (210X 297 mm)

五、發明説明(35) 示般,透鏡203和2〇5係被適#地連接至框體加俾容許它 們在束流E内之對應的對齊。 \請繼續參閱第2圖所示.,在某些應用中,該入射束流 係必須適當地聚焦至ILS雷射器5〇〇内的雷射器增益媒質( 例如,摻雜離子的晶體或者玻璃)5〇7中。根據本發明的較 佳特徵’-?式焦透鏡206可以被有利地安裝於一雷射器透 鏡安裝件207中以致於該聚焦鏡係被適當地定位在束流f 的路徑内。.根據本發明的一特定較佳特徵,聚焦透鏡2〇6 適田地包合-光學聚焦透鏡,其具有一十心位置被定位於 波長;lp的AR塗層,例如,在大約1〇〇〇與u〇〇nm之間且最 佳為1064nm塗層。聚焦透鏡2〇6可以被適當地構形來顯示 一平凸或者凸凸構形。 如會由熟知此項技藝之人仕所察覺般,可經由該氣體 檢測系統10之使用所獲得之定量資訊的品質係,至少一部 伤,視ILS雷射器500的穩定運作而定。在本發明的上下文 中每射姦500的穩疋性係直接視可重現ILS雷射.器5〇〇如 何到達臨界值而定。希望的是,抽送雷射器1〇〇適當地持 、’’只在接近其之最大靈敏度可以被獲得的臨界值下抽送ILs 雷射器500。然而,並非所有驅動器能夠可靠地在一持續 形式下運作。此外,持續運作傾向於要求保持該ILS雷射 器500之振幅和波長穩定性的相當努力,其對於成本會有 不利的打擊而藉此產生對於氣體檢測系統丨〇之可商業實行 性不利的衝擊。 作為持續運作ILS雷射器500的另一種選擇,根據本發 本紙ί長尺度適用中國國家標準(CNS ) A4規格(210X25»7公釐) m m nn fm · (請先閱讀背面之注意事項展填寫本頁) 經滴部中央標準局員工消费合作社印製 ^ Ji J------訂----------- -38- A7 B7 五、 經濟'部中央標準局員工消费合作社印製 其中,一機械運作斬波器、一聲光調變器、一光閘 類似,而係能夠被達成。 或者,抽送雷射器100的輸出強度可以在不二次斬切 *亥輸出束流(束流E)下來被調變。特別地,如果該抽送 射器100包含—二極管雷射器㈣,被供應至該二極管 射器抽送雷射器的電力能夠被調變俾更替地獲得剛在引 該ILS雷射器500產生雷射所需的之上和之下的電壓。因 ,該ILS雷射器5〇〇會被打開和關閉。 雖然任何已知或者其後被提出之產生間歇模式或者脈 發明説明(36) 明的較佳實施例,該IL3雷射器係在一夕脈衝模式,,或者 一間歇模式&quot;下運作。如於此中所使用般,該等名詞 脈衝模式^和&quot;間歇模式〃係指用於可重現曝露ILs雷射 器500(即,摻離離子的晶體5〇7)來抽送輻射線以致於該 雷射器會被打開和Μ的方法。減相當於致使該抽送輕 射線在一固定頻率下和在一固定(通常對稱)工作週期内在 零強度與-固定強度值之間更替。相反,產生脈衝相當於 致能抽送輻射線在一個會改變和典型地非相稱的工作週期 内在零強度與非零強度(其為不必要固定的)之間更替。( 或者,該抽送輻射線能夠被調變以致於該抽送束流的強度 不到達零強度但更替地在至少兩個使該ILS雷射器5〇〇更替 地在臨界值之上和之下的強度水平之間更替地變動。) 透過在該間歇模式或者脈衝模式下的運作,與定量光 譜和濃度測量一致之ILS雷射器5〇〇的穩定運作可以在一可 商業實行形式下獲得。該強度調變(例如,中斷)利用,在 及其 雷 雷 致 此 .-0Γ 裝丨 --------訂-------Q^. (請先閲讀背面之注意事項再填寫本頁) -39- A7 B7 五、發明説明(37) 衝模式的形式能夠根據本發明來被使用,該等模式係有利 地經由調變總成300的使用來被獲得。 根據本發明的這特徵,束流E係藉著轉動一個周期性 地阻擋和傳送該抽送雷射束流£的調變器301而被周期性 地防止到達ILS雷射器500。特別地,在第6圖中,調變器3〇 1 包含一機械斬波器。機械斬波器3〇丨係被適當地置放因此 束流E在到達ILS雷射器500之前被調變。雖然調變器3〇1 可以被有利地置放在束流變化系統2〇〇之前或者之後,根 據本發明的較佳實施例,該斬波器係被適當地置放在束流 變化系統200内的焦點處。或者,該斬波器3〇丨可以被置放 於該抽送雷射器1〇〇前面。如在第2圖中所描繪般,斬波器 3〇1係被適當地安裝於該束流變化裝置2〇〇的框體2〇1中。 經濟部中央標隼局貝工消费合作社印*)木 應要被察覺到的是,斬波器301能夠由任何周期性地 阻擋或者調變該抽送雷射束流的裝置所取代,例如,機械 或者電光。如先刖所述般,根據本發明,從抽送雷射器1〇〇 發出之抽送輻射線的強度必須只下降到使得lLS雷射器5〇〇 到達臨界值所需的下面而因此,不需到達零值。然而,會 進一步被察覺到的是,在每個調變的周期期間,由該抽送 雷射器100傳送至該ILS雷射器500的總光學抽送能量(即, 積分強度)必須依然固定不變。 就脈衝模式或者間歇模式而言,包含該吸收資訊之ILS 雷射器500的輸出可以被周期性地取樣。請再次參閱第2圖 所示,根據本發明的較佳實施例,調變總成3〇〇包含調變 器301(設有適當的電子電路組件)和調變器3〇 設有適 本紙張尺度適用中國國家標準(CNS ) Λ4規格(210X 297公釐(-- -40- 經濟部中央標準局員工消费合作社印^5. Description of the invention (35) As shown, the lenses 203 and 205 are appropriately connected to the frame body, allowing them to be aligned in the beam E correspondingly. Please continue to refer to Figure 2. In some applications, the incident beam system must be properly focused to the laser gain medium within the ILS laser 500 (for example, an ion-doped crystal or Glass) in 507. According to the preferred feature of the present invention'-? The focal lens 206 can be advantageously mounted in a laser lens mount 207 so that the focusing lens system is appropriately positioned within the path of the beam f. According to a specific preferred feature of the present invention, the focusing lens 206 is a field-fitting-optical focusing lens having a ten-centre position positioned at a wavelength; the AR coating of lp, for example, at about 1,000. And uOOnm and optimally 1064nm coating. The focusing lens 206 can be appropriately configured to display a plano-convex or convex-convex configuration. As will be apparent to those skilled in the art, the quality of the quantitative information that can be obtained through the use of the gas detection system 10, at least one injury, depends on the stable operation of the ILS laser 500. The stability of each shot 500 in the context of the present invention is directly dependent on how the reproducible ILS laser device 500 reaches a critical value. It is desirable that the pumping laser 100 is properly held, and that the pumping of the ILs laser 500 is performed only near a critical value at which the maximum sensitivity can be obtained. However, not all drives can operate reliably in a continuous mode. In addition, continuous operation tends to require considerable effort to maintain the amplitude and wavelength stability of the ILS laser 500, which can have a negative impact on cost and thereby have a negative impact on the commercial viability of the gas detection system. . As another option for the continuous operation of the ILS laser 500, according to this paper, the Chinese National Standard (CNS) A4 specification (210X25 »7 mm) is applied to the long scale. Mm nn fm · (Please read the precautions on the back first to fill in (This page) Printed by the Consumer Standards Cooperative of the Central Bureau of Standards of the Ministry of Justice ^ Ji J -------- Order ----------- 38- A7 B7 V. Consumption by the Central Bureau of Standards of the Ministry of Economy The cooperative prints a mechanical operation chopper, an acousto-optic modulator, and an optical shutter similarly, but the system can be achieved. Alternatively, the output intensity of the pumped laser 100 may be adjusted without a second chopping * output current (beam current E). In particular, if the pumping laser 100 includes a diode laser, the power supplied to the diode laser pumping laser can be adjusted. Alternatively, the laser generated by the ILS laser 500 can be obtained. The required voltage above and below. Because of this, the ILS laser 500 will be turned on and off. Although any known or later proposed intermittent mode or pulse is the preferred embodiment of the invention description (36), the IL3 laser is operated in overnight pulse mode, or in an intermittent mode &quot;. As used herein, the terms pulse mode ^ and &quot; intermittent mode &quot; refer to a laser 500 for reproducible exposure to ILs (i.e., ion-doped crystal 507) to pump radiation so that The laser will be turned on and the M method. The subtraction is equivalent to causing the pumped light ray to alternate between zero intensity and-fixed intensity values at a fixed frequency and a fixed (usually symmetrical) duty cycle. In contrast, generating a pulse is equivalent to enabling the pumping radiation to alternate between zero intensity and non-zero intensity (which is not necessarily fixed) within a duty cycle that will change and is typically disproportionate. (Alternatively, the pumping radiation can be modulated so that the intensity of the pumping beam does not reach zero intensity but alternately at least two times that make the ILS laser 500 alternately above and below the critical value. The intensity level changes alternately.) Through operation in the intermittent mode or pulse mode, the stable operation of the ILS laser 500, consistent with quantitative spectrum and concentration measurements, can be obtained in a commercially viable form. The intensity modulation (for example, interruption) is used, and it is caused by this. 0Γ Install 丨 -------- Order ------- Q ^. (Please read the precautions on the back first (Fill in this page again) -39- A7 B7 V. Description of the Invention (37) The form of the punching mode can be used according to the present invention, and these modes are advantageously obtained through the use of the modulation assembly 300. According to this feature of the present invention, the beam E is periodically prevented from reaching the ILS laser 500 by turning a modulator 301 that periodically blocks and transmits the pumped laser beam. In particular, in Fig. 6, the modulator 301 includes a mechanical chopper. The mechanical chopper 30 is properly placed so that the beam E is modulated before it reaches the ILS laser 500. Although the modulator 300 can be advantageously placed before or after the beam change system 2000, according to a preferred embodiment of the present invention, the chopper system is appropriately placed in the beam change system 200. Within focus. Alternatively, the chopper 3o can be placed in front of the pumping laser 100. As depicted in FIG. 2, the chopper 3001 is appropriately installed in a frame 201 of the beam current changing device 200. Printed by the Central Bureau of Standards, Ministry of Economic Affairs, Shellfish Consumer Cooperatives *) It should be noticed that the chopper 301 can be replaced by any device that periodically blocks or modifies the pumping laser beam, such as machinery Or electro-optic. As described above, according to the present invention, the intensity of the pumping radiation emitted from the pumping laser 100 must be reduced only to a level below that required for the 1LS laser 500 to reach a critical value, and therefore, it is not necessary Reached zero. However, it is further noticed that during each modulation cycle, the total optical pumping energy (ie, integral intensity) transmitted by the pumping laser 100 to the ILS laser 500 must remain constant . For pulse mode or intermittent mode, the output of the ILS laser 500 containing the absorption information may be sampled periodically. Please refer to FIG. 2 again. According to the preferred embodiment of the present invention, the modulation assembly 300 includes a modulator 301 (provided with appropriate electronic circuit components) and a modulator 30 with a suitable paper Standards apply to Chinese National Standards (CNS) Λ4 specifications (210X 297 mm (--40) printed by Staff Consumer Cooperatives, Central Bureau of Standards, Ministry of Economic Affairs

光 例 A7 B7 i、發明説明(38: 當的電子電路組件)。調變器301有利地調變來自抽送雷射 器100和透鏡203之輸出束流E的強度,而調變器3〇4適當 地調變離開室400之ILS雷射器500的輸出束流,藉此周期 性地取樣該ILS雷射器的輪出。適當地,調變器3〇丨更替地 阻擋抽送束流E到達ILS雷射器500增益媒質(例如,晶體 507),而調變器304更替地阻擋離開室4〇〇的ILS雷射器束 流到達光議儀總成600和檢測器總成。 適虽地斬波器3 01在一開與關位置之間轉動。斬波 器301係適當地由一個經由一個或者多個適當之電氣連接 益302的使用來被連接至斬波器的斬波器驅動器则所驅動 。當驅動器303使得斬波器3〇1轉動至該開位置時,束流£ 到達ILS雷射器500,藉此使ILS雷射器在雷射器作動的 臨界值之上。ILS雷射盗500持續運作直到驅動器3〇3使得 斬波器301轉動至該關位置,然後斬波器3〇1有效地阻擔抽 送束流E到達ILS雷射器500。 離開室400的ILS雷射器5⑽輸出係被適當地指向於調 變器304。根據本發明的不同特徵,調變器綱包含一-聲 調變器。然而’應要被察覺到的是,其他可得的裝置,例 如,其他機械運作斬波器或者甚至—光閘係可以適當地被 使用於這目的。如以上所討論般,要從該U雷射器5嶋 開束流摘取定量資訊’調變器3〇4周期性地取樣包含被包 含於該特定樣品中之雜質(例如,氣體種類)之吸收資料之 Μ雷射器的輸出。(會被察覺到的是,不使用調變器则 ,檢測器總成7〇0可以更替地打開或者關閉俾周期性地取 本紙張尺度制巾賴家標^T^NS ) A4規格( (請先閲讀背面之注意事項再·填寫本頁)Light example A7 B7 i, description of the invention (38: current electronic circuit components). The modulator 301 advantageously modulates the intensity of the output beam E from the pumping laser 100 and the lens 203, and the modulator 304 appropriately modulates the output beam of the ILS laser 500 leaving the chamber 400, This periodically samples the rotation of the ILS laser. Suitably, modulator 3o alternately blocks the pumping beam E to the ILS laser 500 gain medium (eg, crystal 507), while modulator 304 alternately blocks the ILS laser beam leaving the chamber 400 The stream arrives at the optical analyzer assembly 600 and the detector assembly. The chopper 3 01 is properly turned between an on and off position. The chopper 301 is suitably driven by a chopper driver connected to the chopper via the use of one or more appropriate electrical connections 302. When the driver 303 rotates the chopper 301 to the open position, the beam current reaches the ILS laser 500, thereby placing the ILS laser above a threshold value at which the laser operates. The ILS laser theft 500 continues to operate until the driver 303 rotates the chopper 301 to the off position, and then the chopper 300 effectively blocks the pumping beam E to the ILS laser 500. The output of the ILS laser 5 'exiting the chamber 400 is appropriately directed to the modulator 304. According to different features of the invention, the modulator class includes a one-voice modulator. It should be perceived, however, that other available devices, such as other mechanically operated choppers or even-shutter systems can be used appropriately for this purpose. As discussed above, quantitative information is to be extracted from the open beam of the U laser 5. The modulator 300 periodically samples the impurities (for example, the type of gas) contained in the specific sample. The output of the M laser that absorbs the data. (It will be noticed that the detector assembly 7000 can be turned on or off alternately without the use of a modulator. Periodically, take this paper-size towel and make it ^ T ^ NS) A4 size ((please first (Read the notes on the back and then fill out this page)

-41 - 經濟部中央標準局I工消费合作社印製 A7 _______B7 五、發明説明(39) 樣ILS雷射器500的輸出,如將會更完整地於下面討論般。 )雖然特定形式的調變係可變的,調變的使用致能在化8雷 射器500内之可重現、有效之光學路徑長度的產生。換個 方式說,藉著改變該產生時間(tg),即,在ILS雷射器5〇〇 内之腔内模式角逐被容許發生的時間周期,在該腔内共振 器内之有效吸收路徑長度能夠被控制及被選擇來達成該 ILS氣體檢測器1 〇之最佳的定量應用。 有利地·,該抽送雷射器100之輸出的調變係有利地與 調變總成304同步的以致於來自ILS雷射器5〇〇的定量資訊 能夠在一分析時間形式下被摘取。藉著將抽送束流E通過 斬波器3 01,抽送輪射線e係有效地被間歇地傳送至ILS雷 射器500。間歇地傳送輻射線更替地使得ILS雷射器5〇〇在 臨界值之上和在臨界值之下。在產生時間,tg,隨著ILs 雷射益500到達其之臨界值而逝去之後,該ILS雷射器輸出 係被調變器304偏向到進入光議儀總成6〇〇和檢測器總成 7〇〇俾供檢測。然而,ILS雷射器500輸出束流G只咚偏向 至光4儀總成600和檢測器總成700 —段由調變總成30 i和 304之同步所決定的短時間間隔。調變器3〇1和3〇4的同步 保證來自ILS雷射器500的輻射線在一個界限分明的時間間 隔(tg)内被取樣。 調變器的同步可以藉著若干習知方法來被達成,像, 例如,透過由可運作地連接至氣體檢測系統丨〇之電腦8〇2 所運作之數位電路(圖中未示)的電子控制般。典型地,調 變器301和304的同步會適於產生大約小於約3〇〇至5〇〇微秒 本紙張尺度適用中國國家標準(CNS )以現格(2丨〇χ 297公着) ---------CD&quot;裝· (請先閱讀背面之注意事項#·填寫本頁) —M* Ji I I ―I, 、言 -42- 經濟部中央標準局貞工消费合作社印製 A7 ____B7 五、發明説明(4〇) (#ec)的產生時間(tg),更好的是大約小於1〇至1〇(^“, 而最佳為大約小於約1 # ec。該同步產生該調變總成3〇〇容 泎該i由送雷射器100之輸出當調變器3〇4被關閉時不間斷通 過的結果。在當該抽送雷射器1〇〇之輸出不被該調變總成 3〇〇中斷與當調變器304開啟時之間的時間間隔係由、決定 〇 · 該產生時間’ tg ’在不使用調變器3〇4之下,藉著使 該抽送雷射器100的輸出成脈衝而能夠被改變。如以上所 述,使成脈衝相當於引致該抽送輻射線在可以被改變之工 作週期内在零強度與非零強度值之間更替’藉此使該ILS 雷射器500更替地在臨界值之上和之下。據此,該ILS雷射 盗500被關閉和打開。該11:8雷射器5〇〇產生雷射的持續時 間可以藉著改變抽送雷射器丨〇〇之輸出的工作週期來被改 隻,特別地,該抽送雷射器抽送該ILS雷射器至臨界值的 持續期間。據此,該產生時間(tg),即,在ILS雷射器5〇〇 内之腔内模式角逐被容許發生的時間周期,被改變。在這 情況中,該檢測器總成700依然被持續作動且離開室-4〇〇之 ILS雷射器束制輸出純料持續到達該光議儀總成_ 和該檢測器總成。 然而,如以上所述般,在每個調變周期期間由該抽送 雷射器100傳送至該ILS雷射器5〇〇的總光學抽送能量或者 積分強度必須依然固定不變,即使該ILS雷射器輸出光線 的持續時間被改變。要保持固定不變的總光學抽送能量, 該抽送束流的強度水平在tg要被改變之每個不同的調變周 本紙張尺ΑίδΛΙ巾ϋ國家標4*- ( CNS 規格(210X297公楚) ' II - - 1 -« - - - I -'I - I - /rlv^ (請先閱讀背面之注意事項再填寫本頁) Ί---Μ I 訂 4 -43- 經濟部中央標準局男工消贽合作社印製 A7 ^^^- _____ B7 $、發明測(4〇 ' ~~~ - 期下被調節。據此,該抽送束流的強度和該雷射器二極管 抽送雷射器1〇〇抽送該ILS雷射器5〇〇至臨界值的持續^ 皆被改變俾提供不同的產生時間。 曰 使該抽送雷射器100的輪出成脈衝藉著以一〃脈衝產 生裔來外部控制該抽送束流的傳輸而能夠達成。或者, 如果該抽送雷射器100為二極管雷射器的話,該二極管雷 射器抽送雷射器的輸出強度藉著改變被供應至該二極管雷 射器的電力而可以被調變。(如以上所述,被供應至—二 極管雷射器抽送雷射器100的電力能夠被調變俾更替地獲 得剛在引致該ILS雷射器500產生雷射所需的之上和之下^ 電壓。) ' 據此,本發明之氣體檢測系統1〇可以包括任何下列構 形,每個下列構形致能該產生時間被改變: (1) 該抽送雷射器1〇〇的輪出能夠由一外部斬波器(例 如,斬波器301)斬切且該檢測器7〇〇在來自該ILS雷射器5〇〇 之輸出至該檢測器的傳輸受一脈衝產生器(例如,調變器 304)控制之下能夠被持續作動俾致能周期性取樣; (2) 該抽送雷射器1〇〇的輸出能夠由一外部斬波器(例 如,斬波器301)斬切且該檢測器7〇〇可以被鼓動開和關來 致能來自該ILS雷射器500之輪出的周期性取樣; (3) 該抽送雷射器100的輸出藉由一外部脈衝產生器而 可以使成為脈衝且該檢測器7〇〇可以被持續作動,在該ILS 雷射器500之輸出與氣體種類之間之交互作用的持續時間 係由引致該ILS雷射器產生雷射之來自該抽送雷射器之 nn nn n^i · 裝--、 , (請先聞讀背面之注意事項再填寫本頁) .-- __ I - -|{ II »11 丁 ; 、τ .1 本紙張尺廋適用中國囤家標準(CNS ) Λ4規格(210X297公釐) -44- A7 B7 五、發明説明(42) 衝的持續時間所控制; ()在該抽送雷射器100為二極管雷射器的情況中,該 一極管雷射器的輸出藉著改變被供應至該二極管雷射器的 電力而可以使成為脈衝且該檢測器700可以被持續作動, 在該ILS雷射器500之輸出與氣體種類之間之交互作用的持 續時間係由引致該ILS雷射器產生雷射之來自該二極管雷 射器之脈衝的持續時間所控制; (5) 在該抽送雷射器1〇〇為二極管雷射器的情況中,該 —極官雷射器的輸出藉著改變被供應至該二極管雷射器的 電力而可以被斬切且該檢測器7〇〇可以被持續作動,來自 該ILS雷射器500之輸出至該檢測器的傳輸係由一脈衝產生 盗(例如,調變器304)所控制俾致能周期性取樣;及 (6) 在該抽送雷射器100為二極管雷射器的情況中,該 一極管雷射器的輸出藉著改變被供應至該二極管雷射器的 電力而可以被斬切且該檢測器7 〇 〇可以被鼓動開和關俾致 能來自該ILS雷射器500之輸出的周期性取樣。在上述本發 明之氣體檢測系統1〇的實施例中,該ILS雷射器5〇〇具有一 個由三面鏡(即,鏡501,5〇3,和5〇5)形成的雷射腔,其中鏡 5〇3為一折疊式鏡。如上所述,三面鏡的這構形係被設計 俾提供一象散補償或者實質上平行的束流在鏡5〇3與5〇5之 間的區域中。 或者,本發明的氣體檢測系統10可以包含具有一被簡 化之雷射腔5的一ILS雷射器500。在本發明之如此的另一 種實施例中,該雷射腔5並非被設計來提供象散補償。更-41-Printed by the Central Industry Bureau of the Ministry of Economic Affairs, I Industrial Consumer Cooperative A7 _______B7 V. Description of Invention (39) The output of the ILS laser 500, as will be discussed more fully below. ) Although certain forms of modulation are variable, the use of modulation enables the generation of reproducible and effective optical path lengths within the laser 8. In other words, by changing the generation time (tg), that is, the time period during which mode competition in the ILS laser is allowed to occur, the effective absorption path length in the cavity resonator can be Controlled and selected to achieve the best quantitative application of the ILS gas detector 10. Advantageously, the modulation of the output of the laser 100 is advantageously synchronized with the modulation assembly 304 so that quantitative information from the ILS laser 500 can be extracted in an analysis time format. By passing the pumping beam E through the chopper 3 01, the pumping wheel ray e is efficiently transmitted to the ILS laser 500 intermittently. Intermittently transmitting radiation alternately causes the ILS laser 500 to be above and below the threshold. After the generation time, tg, elapses after the ILs Laser 500 reaches its critical value, the output of the ILS laser is biased by the modulator 304 to enter the optical analyzer assembly 600 and the detector assembly 〇〇〇 for testing. However, the output beam G of the ILS laser 500 is only biased to the optical 4 instrument assembly 600 and the detector assembly 700-a short time interval determined by the synchronization of the modulation assembly 30 i and 304. The synchronization of the modulators 301 and 304 ensures that the radiation from the ILS laser 500 is sampled within a well-defined time interval (tg). Synchronization of the modulator can be achieved by a number of conventional methods, such as, for example, through the electronics of a digital circuit (not shown) operated by a computer 802 operatively connected to the gas detection system. Controlled. Typically, the synchronization of the modulators 301 and 304 will be suitable to produce approximately less than about 3,000 to 5,000 microseconds. This paper size applies the Chinese National Standard (CNS) to the present standard (2 丨 〇χ 297)- -------- CD &quot; (Please read the notes on the back first # Fill this page) —M * Ji II ―I,》 -42- Printed by Zhengong Consumer Cooperative, Central Bureau of Standards, Ministry of Economic Affairs A7 ____B7 5. The invention description (4〇) (#ec) production time (tg), more preferably less than about 10 to 10 (^ ", and most preferably less than about 1 #ec. The synchronous generation The modulation assembly has a capacity of 300. The output from the laser 100 is continuously passed when the modulator 300 is turned off. When the output of the laser 100 is not changed, The time interval between the modulation assembly 300 interruption and when the modulator 304 is turned on is determined by and. The generation time 'tg' is under the condition that the modulator 300 is not used. The output of the pumping laser 100 can be pulsed and can be changed. As described above, making the pulse is equivalent to causing the pumping radiation to be at zero intensity during a duty cycle that can be changed Change to non-zero intensity value 'thereby making the ILS laser 500 alternately above and below the critical value. Accordingly, the ILS laser theft 500 is closed and opened. The 11: 8 laser The duration of the 500 laser generation can be changed by changing the duty cycle of the output of the pumping laser. In particular, the duration of the pumping laser pumping the ILS laser to a critical value According to this, the generation time (tg), that is, the time period within which the intra-cavity mode competition within the ILS laser is allowed to occur, is changed. In this case, the detector assembly 700 is still The ILS laser beam output material that continues to operate and leaves the room -400 is continuously reaching the photodetector assembly and the detector assembly. However, as described above, during each modulation cycle The total optical pumping energy or integral intensity transmitted by the pumping laser 100 to the ILS laser 500 must remain fixed, even if the duration of the light output from the ILS laser is changed. It must be fixed Total optical pumping energy, the intensity level of the pumping beam is at tg For each of the different modulation papers that have been changed, the paper rule ΑίδΛΙ national standard 4 *-(CNS specification (210X297)) 'II--1-«---I -'I-I-/ rlv ^ ( Please read the precautions on the back before filling this page) Ί --- Μ I Order 4 -43- Printed by A7 ^^^-___ B7 $ 、 发明 测 (4〇 ' ~~~-The period is adjusted accordingly. According to this, the intensity of the pumping beam current and the laser diode pumping laser 100 pumping the ILS laser 500 to a critical value ^ are changed 俾Provide different generation times. The pulse of the pumping laser 100 can be achieved by externally controlling the transmission of the pumping beam with a chirp pulse. Alternatively, if the pumping laser 100 is a diode laser, the output intensity of the diode laser pumping laser can be adjusted by changing the power supplied to the diode laser. (As described above, the power supplied to the diode laser pumped laser 100 can be modulated, and alternately obtained just above and below what is required to cause the ILS laser 500 to generate a laser ^ Voltage.) According to this, the gas detection system 10 of the present invention may include any of the following configurations, each of which enables the generation time to be changed: (1) The rotation of the pumping laser 100 can Chopped by an external chopper (eg, chopper 301) and the transmission of the detector 700 at the output from the ILS laser 500 to the detector is subject to a pulse generator (eg, a modulation Under the control of the transformer 304) can be continuously actuated to enable periodic sampling; (2) the output of the pumping laser 100 can be chopped by an external chopper (eg, chopper 301) and the The detector 700 can be agitated on and off to enable periodic sampling from the wheel of the ILS laser 500; (3) The output of the pumped laser 100 can be enabled by an external pulse generator Becomes a pulse and the detector 700 can be continuously operated, the output of the ILS laser 500 and the gas The duration of the interaction between the body types is caused by the nn nn n ^ i from the pumping laser that caused the ILS laser to produce lasers. (-Please read the precautions on the back before reading (Fill in this page) .-- __ I--| {II »11 D;, τ .1 This paper size is applicable to the Chinese storehouse standard (CNS) Λ4 specification (210X297 mm) -44- A7 B7 V. Description of the invention (42) Controlled by the duration of the rush; () In the case where the pumping laser 100 is a diode laser, the output of the unipolar laser is changed by changing the power supplied to the diode laser. The pulse can be made and the detector 700 can be continuously operated. The duration of the interaction between the output of the ILS laser 500 and the type of gas is from the diode that causes the ILS laser to generate a laser. The duration of the pulse of the laser is controlled; (5) In the case where the pumping laser 100 is a diode laser, the output of the polar laser is supplied to the diode laser by changing The power of the emitter can be cut and the detector 700 can be continuously operated to The transmission from the ILS laser 500 to the detector is controlled by a pulse generator (eg, the modulator 304) to enable periodic sampling; and (6) the pumping laser 100 is a diode In the case of a laser, the output of the monopole laser can be chopped by changing the power supplied to the diode laser and the detector 700 can be activated by being turned on and off. Periodic sampling of the output from the ILS laser 500. In the above embodiment of the gas detection system 10 of the present invention, the ILS laser 500 has a laser cavity formed by a three-sided mirror (ie, mirrors 501, 503, and 505), wherein The mirror 503 is a folding mirror. As mentioned above, this configuration of the three-sided mirror is designed to provide an astigmatic compensation or a substantially parallel beam in the area between the mirrors 503 and 505. Alternatively, the gas detection system 10 of the present invention may include an ILS laser 500 having a simplified laser cavity 5. In such another embodiment of the invention, the laser cavity 5 is not designed to provide astigmatism compensation. more

-45 - 發明説明(43) Α7 Β7 經濟、那中央標準局負工消費合作社印t 確切地5兄,該雷射腔5可以被形成在兩面鏡之間,藉此且 有-個不提供象散補償之實質上線型的構形。然而,由: 發明之該如此的另—種實施例所使用的該線型腔設計致能 要被構築的氣體檢測系統10為實質上較小且較簡單。因此 ,本發明之氣體檢的該—種實_與以上所述的 貫施例比較起來係構築更經濟且更容易運作。此外,以一 線型雷射腔為基礎之本發明的這另一種實施例能夠被構築 成為f多實際應用所需要的更碩壯或者機械穩定的。 線型雷射腔係'代表與一被形成在僅兩面鏡之間之 雷射腔同等的雷射腔5。在其之最簡單形式中,一線型雷 射腔包含-個被形成在一第一鏡和一第二鏡之間的雷射腔 5。會被察覺到的是,任何數量之為平面之額外的鏡可以 被包括在内俾操縱一束流從該第一鏡至該第二鏡的行進( 即,改變路徑)。然而,這些額外之鏡的包括不變改在該 雷射腔5内之束朗形狀(規定在該第—鏡與該第二鏡之間 的巨離疋不被改變)。據此,在一雷射器之雷射腔5巧之額 外平面鏡的包括不影響該雷射器的運作卻僅改變該雷射器 被物理地構形的形式。因此,被形成在—第—鏡與一第二 鏡之間的-雷射腔5’具有額外的平面鏡在其間,是與單 獨被形成在該第-鏡與該第二鏡之間的—雷射腔同等的; 移去該等額外的平面鏡既不改變該束流的形狀,也不改變 該田射器的運作。然而,該等額外之平面鏡的使用可以被 使用來安裝一雷射腔5到—具有空間限制#包裝中。 •Θ裝 ί (請先閱讀背面之注意事項再填寫本頁) • I— 11--. ------ - 訂—---- j,i HI (^1· · 因此 種用於藉著使用氣體檢測系統1〇來檢測包含 本紙張尺㈣则,S?^7cNS ) A4規格(2!ΟΧ297^ΐ7~- -46- 經濟部中央標隼局貝工消費合作社印製 A7 B7 五、發明説明(44) 腐蝕性氣體之氣體樣品中之雜質之出現和濃度的裝置係業 已被揭露。根據本發明的較佳實施例,一種高靈敏度檢測 方法亦被揭露於此中。該方法適當地包含如下之步驟:降 低在樣品室400中的氣體(雜’質)至一可接受程度;置放要 被檢測之氣體的樣品在樣品系統400A中、在或者接近臨 界值下抽送ILS雷射器500、最好係經由調變總成3〇〇來周 期地取樣來自ILS雷射器500的光學輪出、以光議儀總成6〇〇 -和檢測器總成7 0 0測量在該樣品内之氣體(雜質)的吸收光 譜、及分析該吸收光譜俾鑑定氣體種類(雜質)並且利用電 腦/軟體系統800決定其之在該樣品内的濃度。 用於檢測包含腐蝕性氣體之氣體樣品中之氣體種類之 出現的該方法需要一光譜範圍被選擇,其中,⑴氣體種 類具有至少一種吸收特徵及(ii)該腐蝕性氣體本質上不具 有干擾吸收特徵。(如上所述,一干擾吸收特徵相當於一 個重疊被使用於鑑定氣體種類之吸收特徵的吸收特徵,以 致於在氣體種類與腐蝕性氣體之間的檢測選擇性被連累。 )根據本發明的方法,包含一雷射腔5和一增益媒質5〇7之 輸出具有一波長分佈之光線的一雷射器係被提供,該波長 分佈的至少一部份係在所選擇的光譜範圍内。該ILS雷射 器500係被包含在一樣品室4〇〇。具有窗4〇4和405的一氣體 樣品槽406亦被提供,該等窗404和405在命選擇的光譜範 圍内是透光的以致於光線束流能夠通過該氣體樣品槽。該 氣體樣品槽406被插入在該ILS雷射器500内以致於來自增 益媒質507的輸出光線在離開該雷射腔5之前通過該氣體樣 本紙張尺度適用中國國家標準(CNS ) A4規格(210X 297公釐) (請先聞讀背面之注意事項再填寫本頁)-45-Description of the invention (43) Α7 Β7 Economy, the Central Bureau of Standards, Consumer Cooperative Cooperatives, exactly 5 brothers, the laser cavity 5 can be formed between the two mirrors, and there is a The substantially linear configuration of discrete compensation. However, the linear cavity design used by such an alternative embodiment of the invention enables the gas detection system 10 to be constructed to be substantially smaller and simpler. Therefore, compared with the embodiments described above, the gas detection method of the present invention is more economical and easier to operate. In addition, this alternative embodiment of the present invention based on a linear laser cavity can be constructed to be more robust or mechanically stable for practical applications. The linear laser cavity system 'represents a laser cavity 5 which is equivalent to a laser cavity formed between only two mirrors. In its simplest form, a linear laser cavity comprises a laser cavity 5 formed between a first mirror and a second mirror. What will be perceived is that any number of additional mirrors that are planar can be included to manipulate the travel of a beam from the first mirror to the second mirror (ie, change the path). However, these additional mirrors include the beam shape unchanged in the laser cavity 5 (providing that the large distance between the first mirror and the second mirror is not changed). According to this, the inclusion of an extra-flat mirror in the laser cavity of a laser does not affect the operation of the laser, but only changes the form in which the laser is physically configured. Therefore, the laser cavity 5 'formed between the first mirror and a second mirror has an additional plane mirror therebetween, and the laser is formed separately between the first mirror and the second mirror. The cavities are equivalent; removing these additional plane mirrors does not change the shape of the beam nor the operation of the field emitter. However, the use of these additional plane mirrors can be used to mount a laser cavity 5 to—with space restrictions # in the package. • Θ 装 ί (Please read the notes on the back before filling this page) • I— 11--. -------Order —---- j, i HI (^ 1 · · Therefore this kind of By using the gas detection system 10 to detect the paper rule including this paper, S? ^ 7cNS) A4 specification (2! 〇Χ297 ^ ΐ7 ~--46- Printed by Aigong Consumer Cooperative, Central Bureau of Standards, Ministry of Economic Affairs Explanation of the invention (44) A device for the appearance and concentration of impurities in a gas sample of a corrosive gas has been disclosed. According to a preferred embodiment of the present invention, a high-sensitivity detection method is also disclosed here. The method is appropriate The ground includes the following steps: reducing the gas (heterogeneous substance) in the sample chamber 400 to an acceptable level; pumping the sample of the gas to be detected in the sample system 400A at or near a critical value to pump an ILS laser The sensor 500 is preferably periodically sampled from the ILS laser 500 by the modulation assembly 300. The optical sensor assembly 600- and the detector assembly 700 are measured at this position. The absorption spectrum of the gas (impurity) in the sample, and analysis of the absorption spectrum, identify the type of gas (impurity), and And the computer / software system 800 is used to determine its concentration in the sample. The method for detecting the occurrence of gas species in a gas sample containing corrosive gases requires a spectral range to be selected, wherein the radon gas species has at least An absorption feature and (ii) the corrosive gas does not have an interference absorption feature in nature. (As mentioned above, an interference absorption feature is equivalent to an absorption feature that overlaps the absorption feature used to identify the type of gas, so that Detection selectivity with corrosive gases is compromised.) According to the method of the present invention, a laser system comprising a laser cavity 5 and a gain medium 507 outputting light with a wavelength distribution is provided, At least part of the wavelength distribution is within the selected spectral range. The ILS laser 500 is contained in a sample chamber 400. A gas sample tank 406 with windows 400 and 405 is also provided The windows 404 and 405 are transparent in the selected spectral range so that a beam of light can pass through the gas sample slot. The gas sample slot 406 is inserted in the ILS Within the laser 500 so that the output light from the gain medium 507 passes through the gas sample before leaving the laser cavity 5 The paper size applies the Chinese National Standard (CNS) A4 specification (210X 297 mm) (Please read the (Please fill in this page again)

-47- A7 經濟部中央標準局貝工消費合作社印製 ___五、發明説明(45) —'^~ 品。在樣品室400内的氣體(雜質)被降低到一可接受程度 。要被檢測之氣體的樣品係被置放在該氣體樣品槽4〇6中 。該ILS雷射器500在或者接近臨界值下被柚送且來自ILS 雷射器5 0 0的光學輸出係被周期地取樣,最好係經由|周變 總成300。在該樣品内之氣體(雜質)的吸收光譜係以光古姐 儀600和檢測器總成700測量。該吸收光譜被分析俾鑑定氣 體種類(雜質)並且利用電腦/軟體系統800決定其之在該 樣品内的濃度。 更特別地’降低在室400(除了該氣體樣品槽4〇6外)中 之氣體(雜質)至一可接受程度可以適當地包含洗淨或者撤 空具有頂蓋410的可密封容器401以致於氣體(雜質)的程度 疋.在該氣體樣品槽4 0 6内之氣體樣品中之要被檢測的下面 。如先前所述,用於降低氣體(雜質)之程度的其他裝置係 可以被使用’倘若它們能夠降低氣體(雜質)的程度至一可 接受程度。最好的是,容器底座401被密封至頂蓋41〇且被 包含在其内的雜質被有效地移去(或者降低到一可接受程 度)。希望的是,底座401和頂蓋410在傳送到一使用者之 前係有效地以相當無法隨便開封的形式被密封。 一樣品藉著連接一氣體管線至連接器4〇8,4〇9及供應 該氣體至該氣體樣品槽内而係被適當地連通至氣體樣品槽 406(例如,當該樣品包含一腐蝕性或者反應氣體時)。 更特別地,在或者接近臨界值抽送ILS雷射器5〇〇包含 選擇正確的抽送雷射器1〇〇功率、使用束流變化裝置2〇〇和 透鏡206之在雷射器晶體5〇7處的聚焦條件、及 調器 本紙張纽刺巾關家標卑(CNsTX4規格(21GX297公着)' (請先閱讀背面之注意事項再填寫本頁) ---:——j-------lilli—— 訂— • HI nn m€ t·^— . -48- 經濟部中央標準局貝工消费合作社印製 A7 _______B7___ 五、發明説明(46) 系統300的調變條件。本發明之用於檢測氣體種類的方法 進一步包含在臨界值或者接近臨界值但在臨界值之上驅動 ILS雷射器500。根據本發明,驅動器1〇〇適當地抽送ILS雷 射器500。必要時,抽送束流E係藉著束流成形裝置200來 被適當地成形俾符合ILS雷射器500的光學要求。再者,在 氣體檢測系統10係在脈衝或者間歇模式下運作時,如以上 所述’調變總成,特別地,調變器30丨可以周期地中斷抽 送束流E,藉此防止束流e到達ILS雷射器500。自調變器301 和束流成形裝置200輸出的束流F係被適當地指向於ILS雷 射器500。 根據這方法,當束流F經由被置放在密封容器本體401 之壁中的窗402進入室400時,束流F係被適當地指向於ILS 雷射1§ 500 °束流F的額外聚焦和方向當束流f自窗402通 過至聚焦透鏡2〇6時係可以被適當地達成’其中,聚焦透 鏡206適當地聚焦束流F並且指引它通過鏡501。束流F適 當地在或者接近臨界值抽送晶體5〇7,且該輸出束淹係被 適當地指向於在該氣體樣品槽406内的氣體樣品,像藉由 •兄5 03和5 05般》該離開的束流,包含來自該氣體(雜質)樣 之吸收資料’然後經由被適當地置放於密封容器本體4 01 之壁中的窗403離開氣體室400。 使用調變器3〇4 ’ ILS雷射器500可以i一脈衝模式或 者一間歇模式下運作,該調變器304係適當地與調變器301 同步且其周期地取樣來自該ILS雷射器的輸出束流並且傳 ^如此獲知的取樣輪出至光議儀總成600和檢測器總成700 本紙張尺度適^-:- (讀先閔讀背面之注意事項再填寫本頁)-47- A7 Printed by the Shellfish Consumer Cooperative of the Central Standards Bureau of the Ministry of Economic Affairs ___V. Description of Invention (45) — '^ ~ product. The gas (impurities) in the sample chamber 400 is reduced to an acceptable level. A sample of the gas to be detected is placed in the gas sample cell 406. The ILS laser 500 is fed at or near a critical value and the optical output from the ILS laser 500 is sampled periodically, preferably through a 300-cycle variable assembly. The absorption spectrum of the gas (impurities) in the sample was measured with a photometer 600 and a detector assembly 700. The absorption spectrum is analyzed to identify the type of gas (impurity) and the computer / software system 800 is used to determine its concentration in the sample. More specifically, 'reducing the gas (impurities) in the chamber 400 (except for the gas sample tank 406) to an acceptable level may suitably include washing or emptying the sealable container 401 with the top cover 410 so that Degree of gas (impurity) 疋. Below the gas sample in the gas sample tank 406 to be detected. As mentioned earlier, other devices for reducing the level of gas (impurities) can be used 'provided that they can reduce the level of gas (impurities) to an acceptable level. Preferably, the container base 401 is sealed to the top cover 41 and the impurities contained therein are effectively removed (or reduced to an acceptable level). It is desirable that the base 401 and the top cover 410 are effectively sealed in a form that cannot be easily unsealed before being transferred to a user. A sample is properly connected to the gas sample tank 406 by connecting a gas line to the connectors 408, 409, and supplying the gas into the gas sample tank (for example, when the sample contains a corrosive or When reacting with gas). More specifically, pumping the ILS laser 500 at or near the critical value includes selecting the correct pump laser power 100, using the beam changer 2000 and the lens 206 in the laser crystal 507. Focusing conditions at the place, and the adjustment of the paper and thorn stab towel Guan Jiabiao (CNsTX4 specification (21GX297)) (Please read the precautions on the back before filling this page) ---: --j ------ -lilli—— Order— • HI nn m € t · ^ —. -48- Printed by A7 _______B7___, Shellfish Consumer Cooperative, Central Bureau of Standards, Ministry of Economic Affairs 5. Description of the invention (46) Modulation conditions of system 300. Use of the present invention The method for detecting the kind of gas further includes driving the ILS laser 500 at or near the critical value but above the critical value. According to the present invention, the driver 100 appropriately pumps the ILS laser 500. If necessary, pumping the beam The stream E is appropriately shaped by the beam forming device 200, which conforms to the optical requirements of the ILS laser 500. Furthermore, when the gas detection system 10 is operated in a pulse or intermittent mode, it is adjusted as described above. Transformer assembly, in particular, the modulator 30 丨 can cycle The ground beam E is interrupted to prevent the beam e from reaching the ILS laser 500. The beam F output from the self-modulator 301 and the beam shaping device 200 is appropriately directed to the ILS laser 500. According to this method When the beam F enters the chamber 400 through the window 402 placed in the wall of the sealed container body 401, the beam F is appropriately pointed at the ILS laser 1 § 500 ° additional focus and direction of the beam F The beam current f can be appropriately achieved when it passes from the window 402 to the focusing lens 206, where the focusing lens 206 appropriately focuses the beam current F and directs it through the mirror 501. The beam current F is appropriately pumped at or near a critical value. Crystal 507, and the output beam flooding system is properly pointed at the gas sample in the gas sample tank 406, and the exiting beam current, like from "Brother 5 03 and 5 05", contains the gas from ( Impurity) -like absorption data 'and then leave the gas chamber 400 through a window 403 which is appropriately placed in the wall of the sealed container body 40 01. Using the modulator 304' the ILS laser 500 can be in a pulse mode or Operates in an intermittent mode, the modulator 304 is properly connected to the modulator 301 synchronizes and periodically samples the output beam from the ILS laser and transmits the sampling wheel thus known to the optical analyzer assembly 600 and the detector assembly 700. The paper size is suitable ^-:-(read first (Notes on the back of Min Du, please fill out this page)

-49- Α7 Β7 五、發明説明(47) 。或者’在該抽送雷射器100包含二極管雷射器的情況中 ’被供應至該二極管雷射器抽送雷射器的電力可以被調變-49- Α7 Β7 V. Description of the Invention (47). Or 'in the case where the pumping laser 100 includes a diode laser', the power supplied to the diode laser's pumping laser can be modulated

I 及與調變器304同步。適當地,鏡601指引來自ILS雷射器500 的取樣輸出束流G至光議儀總成600和檢測器總成700。或 者’不使用調變器304,檢測器總成700可以被打開和關閉 俾取樣來自ILS雷射器500的輸出。 本發明之用於檢測氣體種類的方法更包含分析從ILS 雷射器500取樣出來的輸出束流g。最好的是,光議儀總 成600光譜地分析而檢測器總成7〇〇適當地分析從ILs雷射 盗500取樣出來的束流〇。光議儀總成6〇〇適當地經由束流 擴張裝置600C、繞射裝置600A,600B和聚焦裝置600D來光 譜散佈來自ILS雷射器500的束流G。離開光議儀總成600 之經光譜分析的ILS吸收資料係被適當地空間位移到由包 含’例如,多路檢測器701的檢測器總成7〇〇檢測。 會被察覺到的是’本發明的氣體檢測系統i 〇和方法能 夠被使用來在不同波長範圍内獲得在如HC1般之腐魅性氣 體或者如N2般之非腐钱性氣體中之像水蒸氣般之雜質的 吸收光譜。特別地’第7和8圖顯示在每個環境(腐姓性或 者非腐蝕性)中之水蒸氣的特徵能夠經由氣體檢測系統1〇 的運作來被獲得。特別地’第7圖顯示在大約1433至144〇nm 之範圍内在HC1(曲線900)和在N2(曲線902)中之水之標準 化雷射強度/吸收對波長的圖表,而第8圖則顯示在大約 1420至I434nm之波長範圍内在HC1(曲線904)和在N2(曲線 906)中之水之標準化雷射強度/吸收對波長的類似圖表。 本紙張人度通用中國國家標净(CNS ) M規格(2]〇&gt;&lt; 297公釐) (請先閱讀背面之注意事項再填寫本頁) 、-°I is synchronized with the modulator 304. Suitably, the mirror 601 directs the sampled output beam G from the ILS laser 500 to the photodetector assembly 600 and the detector assembly 700. Or 'without using the modulator 304, the detector assembly 700 can be turned on and off. Sampling the output from the ILS laser 500. The method for detecting a gas type of the present invention further includes analyzing an output beam g sampled from the ILS laser 500. Preferably, the optical analyzer assembly 600 is spectrally analyzed and the detector assembly 700 appropriately analyzes the beams sampled from the ILs 500. The optical analyzer assembly 600 appropriately spreads the beam G from the ILS laser 500 through the beam expansion device 600C, the diffraction devices 600A, 600B, and the focusing device 600D, as appropriate. The spectrally-analyzed ILS absorption data leaving the optical analyzer assembly 600 is suitably spatially shifted to be detected by a detector assembly 700 that includes &apos; for example, the multiplexer 701. What will be noticed is that 'the gas detection system i 0 and method of the present invention can be used to obtain water-like images in different wavelength ranges such as HC1 rotten gas or non-corruption gas such as N2 Absorption spectrum of vaporous impurities. In particular, Figures 7 and 8 show that the characteristics of water vapor in each environment (humorous or non-corrosive) can be obtained through the operation of the gas detection system 10. In particular, Figure 7 shows a graph of the normalized laser intensity / absorption versus wavelength for water in HC1 (Curve 900) and N2 (Curve 902) in the range of approximately 1433 to 1440 nm, while Figure 8 shows Similar graphs of normalized laser intensity / absorption versus wavelength for water in HC1 (curve 904) and N2 (curve 906) in a wavelength range of approximately 1420 to 1434 nm. The paper size is in accordance with China National Standard Net (CNS) M specifications (2) 〇 &gt; &lt; 297mm) (Please read the precautions on the back before filling this page),-°

T 經濟部中央標準局貝工消費合作社印製 -50- 經濟部中央標準局貞工消费合作社印製 A7 ______ B7______ 五、發明説明(48) ~ 在第7和8圖中所顯示的光譜係以光議儀總成6〇〇及藉著測 量二極管701的輸出來被獲得。如會被察覺般,每個資料 點描繪來自不同測量的結果。 _出現在第7和8圖中所顯.示之圖表中的資料證明水能夠 成功地利用本發明的方法來在氯化氩中被檢測。此外,在 外觀上該等水吸收光譜是相同的,不管該測量是否在氯化 氫或者氮氣中完成,證明沒有光譜干擾來自氯化氫,即使 它係在極高濃度下出現(例如,一個大氣總壓力)。 既知在強度與濃度之間的關係,一旦該雜質,例如, 水蒸氣,的特性特徵被獲得,被包含於該樣品内之雜質的 濃度能夠隨時獲得。根據本發明,電腦8〇2能夠被適當地 程式化來解譯該資料並且提供顯示包含於該樣品内之雜質 之出現及/或濃度的輸出。經由本發明之使用所獲得之在 N2氣體中之水吸收強度對水濃度的典型圖表係被顯示在 第9和10圖中。該&amp;氣體的水淨化係分別以第9和1 〇圖之 一滲透裝置和一直列式淨化器為基礎。 (會被察覺到的是’在光譜特徵中所發現的吸收特徵 必須被測定。由於腔内雷射頻譜術提供優於習知方法的增 進靈敏度,先前沒有被測量的弱轉移藉由本發明的氣體檢 測系統會首次變成可測量的。在該等情況中,這些弱轉移 能夠被使用來鑑定光譜特徵並且證明氣體癃類的出現。該 等弱轉移亦能夠由該氣體檢測系統1〇測定,藉此使得氣體 種類的濃度藉著對應於這些弱轉移之吸收特徵的強度而能 夠被決定。) 本紙張尺度適用中國國家標準(CNS ) A4規格(210X 297公麓) --------©^1 — (請先閲讀背面之注意事項再填寫本頁) 訂--- — J.----------,,----- -51 - 經濟部中央標準局員工消費合作社印製 A7 B7 五、發明説明(49) 雖然本發明在以上係被顯示為被應用於獲得在腐蝕性 氣體|像hci般,〔中之雜質:,像水蒸氣般lm,光i, 對於熟知itt:項技藝之人仕來說會很明顯的是其他適當的雜 質和腐蝕性或者反應氣體亦可以被使用於本發明的實施中 。適當地與本發明一起使用之腐蝕性氣體的例子包括,但 並非限制,下列的:N20、NO、N02、HONO、HN02、so 、S03、H2S04、Cl2、CIO、C1202、HOC卜 PH3、OCS、HI 、HF、HBr .、BC13、BC1、S02、BF3、Br2、I2、F2、〇3、 AsH3、NH3、SiH4、B2H4、HN03、HCN、HNC、H2S、COF2 、和CH4 xXx ’其中X為F或者Cl且x等於1至4。特別被揭 露於此的腐餘性或者反應氣體,包括以上所列的那些,並 非意指無遺漏的;更確切地說,當係適合於所考慮之特定 的使用時,其他腐蝕性或者反應氣體可以被使用。例如, 3亥腐飯性氣體可以包含在半導體組件之製造中所使用之其 他的腐蝕性氣體。此外,會被察覺到的是,該腐蝕性氣體 可以包含由任何數目之如以上所列之那些般之腐蝕竺氣體 的組合。會進一步被察覺到的是,要被檢測的氣體種類可 以包含,但並非限制,以上所列之腐蝕性氣體中的一種或 者多種。 那些热知此項技藝之人仕會察覺到的是,經由本發明 之實施所得到的檢測程度通常係超越可經‘由習知裝置得到 的那二。再者,氣體檢測系統10能夠直列式使用並且獲得 被包含於特定腐蝕性樣品中之雜質之出現和量之迅速,接 近即時的測量,藉此解決很多隨著習知震置之使用而產生 0裝丨丨 (請先閱讀背面之注意事項再填寫本頁}T Printed by the Shellfish Consumer Cooperative of the Central Standards Bureau of the Ministry of Economic Affairs -50- Printed by the Zhengong Consumer Cooperative of the Central Standards Bureau of the Ministry of Economic Affairs A7 ______ B7______ 5. Description of the Invention (48) ~ The spectra shown in Figures 7 and 8 are based on The optical analyzer assembly 600 is obtained by measuring the output of the diode 701. As will be noticed, each data point depicts results from a different measurement. The information presented in the graphs shown in Figures 7 and 8 demonstrates that water can successfully be tested in argon chloride using the method of the present invention. In addition, these water absorption spectra are the same in appearance, regardless of whether the measurement is performed in hydrogen chloride or nitrogen, it proves that there is no spectral interference from hydrogen chloride, even if it occurs at very high concentrations (for example, a total atmospheric pressure). Knowing the relationship between strength and concentration, once the characteristic characteristics of the impurity, such as water vapor, are obtained, the concentration of the impurities contained in the sample can be obtained at any time. According to the present invention, the computer 802 can be appropriately programmed to interpret the data and provide an output showing the presence and / or concentration of impurities contained in the sample. Typical graphs of water absorption intensity versus water concentration in N2 gas obtained through the use of the present invention are shown in Figures 9 and 10. The &amp; gas water purification system is based on an infiltration unit and in-line purifiers in Figures 9 and 10, respectively. (It will be noticed that 'the absorption characteristics found in the spectral characteristics must be determined. Because intracavity laser spectroscopy provides enhanced sensitivity over conventional methods, weak transfers that have not been measured previously with the gas of the invention The detection system will become measurable for the first time. In these cases, these weak transfers can be used to identify spectral characteristics and prove the presence of gas species. These weak transfers can also be determined by the gas detection system 10, whereby So that the concentration of the gas species can be determined by the intensity corresponding to the absorption characteristics of these weak transfers.) This paper size applies the Chinese National Standard (CNS) A4 specification (210X 297 feet) -------- © ^ 1 — (Please read the notes on the back before filling out this page) Order --- — J .---------- ,, ----- -51-Staff Consumption of Central Standards Bureau, Ministry of Economic Affairs Cooperative printed A7 B7 V. Description of the invention (49) Although the present invention has been shown above to be used to obtain corrosive gases | like hci, [impurities in :, like water vapor lm, light i, for Familiar with itt: It will be obvious to people Other suitable impurities are corrosive or reactive gas and may also be used in the embodiment of the present invention. Examples of corrosive gases suitable for use with the present invention include, but are not limited to, the following: N20, NO, N02, HONO, HN02, so, S03, H2S04, Cl2, CIO, C1202, HOC, PH3, OCS, HI, HF, HBr., BC13, BC1, S02, BF3, Br2, I2, F2, 〇3, AsH3, NH3, SiH4, B2H4, HN03, HCN, HNC, H2S, COF2, and CH4 xXx 'where X is F Or Cl and x is equal to 1 to 4. Corrosive or reactive gases specifically disclosed herein, including those listed above, are not meant to be exhaustive; rather, other corrosive or reactive gases, when appropriate for the particular use under consideration Can be used. For example, the 30-hour rotten gas may include other corrosive gases used in the manufacture of semiconductor devices. In addition, it will be appreciated that the corrosive gas may comprise a combination of any number of corrosive gases such as those listed above. It will be further noticed that the type of gas to be detected may include, but is not limited to, one or more of the corrosive gases listed above. Those who are keen on this technique will perceive that the degree of detection obtained through the implementation of the present invention usually exceeds that which can be obtained through the ‘conventional device’. Furthermore, the gas detection system 10 can be used in-line and obtains rapid, near-instantaneous measurements of the presence and quantity of impurities contained in a particular corrosive sample, thereby solving many of the problems that occur with the use of conventional seismic settings. Install 丨 丨 (Please read the precautions on the back before filling in this page)

、1T -52-, 1T -52-

五、發明説明(50) 一 的缺點。特別地,本發明的方法提供在習知技術中無法得 到之檢測程度下之在包含腐蝕性氣體之氣體樣品内之迅速 、在原位置的水蒸氣檢測。 應要被了解的是,以上的描述係有關於本發明的較佳 實施例,且本發明並不受限於在此中所顯示的特定形式。 對於在此中所描述之元件之設計和排列之不同的變化在沒 有離開在所附申請專利範圍中所表示之本發明的範圍下可 以被完成。再者,氣體檢測系統1〇的應用及該ILs氣體檢 測器的位置,例如,在半導體製造裝置中,能夠隨著所希 望的來改變。例如,該氣體檢測系統1 〇本身和在該IL S室4 0 〇 内之不同元件的特定配置,當它們的構形和配置適當地致 能ILS雷射器500在-可迅速重現形式下的光學激磁時,係 可以被改變。目前已知及於此後由熟知此項技藝之人仕所 提出之對本發明之設計、配置、和應用之這些及其他變化 是由所附的申請專利範圍所料到。 (請先閱讀背面之注意事項再填寫本頁) -------ο裝1 經濟部中央標準局貝工消f合作社印製 本紙張尺度適用中國國家榡準(CNS ) Λ4規格(210X297公釐) 1----!—II------政------------ 1- I ί -53- A7 B7 五、發明説明(51) 元件標號對照 200.. .束流成形裝置 201.. .框體 202···可變的隙缝裝置 203.. .聚焦透鏡 204.. .調準透鏡 205···可變的隙缝裝置 206.. .聚焦透鏡 207.. .安裝件 300.. .束流調變總成 301.. .調變器 302.. .電氣連接器 303 ....驅動器 304.. .調變器 400.. .室總成 _ 4 0 0A…樣品糸統 401…容器底座 經濟部中央標隼局員工消f合作社印製 A...抽送雷射系統 B…ILS雷射與室 C. ..光譜儀 D. ..檢測器與電子學 F. ..入射束流 Η…束流 G. ..束流 Ε…束流 1Α...增益媒質 1Β...增益媒質 1C...增益媒質 2 A. _ ·鏡 2B...繞射光柵 2C...高反射鏡 3 A···鏡 3B · ·.鏡 3C...部份反射鏡 4.. .腔内吸收器 5.. .雷射腔 10.. .氣體檢測糸統 100.. .抽送雷射器 100.. .雷射器驅動器 (謂先鬩讀背面之注意事項再填寫本頁) 402.. .窗 403.. .窗 404.. .窗‘ 405.. .窗 406…氣體樣品槽本體 407···氣體樣品槽固持器 本紙張尺度適用中國國家標準(CNS ) Λ4規格(210X297公釐) -54- A7 B7 經濟部中央標準局員工消费合作社印製 600C...光學束流擴張裝置 600D...聚焦透鏡總成 601.. .折疊式鏡 602.. .鏡安裝件 603.. .透鏡 605.. .透鏡 607.. .繞射光柵 608.. .安裝件 609.. .繞射光柵 610.. .安裝件 611.. .透鏡 7 0 0...檢測益總成 701.. .多路陣列檢測器 702··.安裝件 7 0 3 ...電子板 704…BNC連接器及屏蔽_電纜 8 0 0...電腦糸統 801···類比至數位轉換器 8 0 2...電腦 (請先鬩讀背面之注意事項再填寫本頁)V. Description of the invention (50) 1 Disadvantages. In particular, the method of the present invention provides rapid, in-situ water vapor detection in a gas sample containing a corrosive gas to a degree that is not available in conventional techniques. It should be understood that the above description relates to preferred embodiments of the present invention, and that the present invention is not limited to the specific forms shown herein. Variations in the design and arrangement of the elements described herein can be made without departing from the scope of the invention as expressed in the scope of the appended patents. Furthermore, the application of the gas detection system 10 and the position of the ILs gas detector can be changed as desired in a semiconductor manufacturing apparatus, for example. For example, the specific configuration of the gas detection system 10 itself and the different components within the ILS chamber 400, when their configuration and configuration properly enable the ILS laser 500 in a-rapidly reproducible form The optical system can be changed when it is optically excited. These and other changes to the design, configuration, and application of the present invention that are now known and thereafter proposed by those skilled in the art are expected from the scope of the attached patent application. (Please read the precautions on the back before filling in this page) ------- ο Packing 1 Printed by the Central Standards Bureau of the Ministry of Economic Affairs, Bei Gong Xiao F Cooperative, printed on paper standards applicable to China National Standards (CNS) Λ4 specifications (210X297 (Mm) 1 ----! — II ------ 政 ------------ 1- I ί -53- A7 B7 V. Description of the invention (51) Component reference 200 ... Beam shaping device 201... Frame 202... Variable slot device 203... Focus lens 204... Adjustment lens 205... Variable slot device 206... Focus lens 207 ... Mounting 300 ... Beam modulation assembly 301 ... Modulator 302 ... Electrical connector 303 ... Driver 304 ... Modulator 400 ... Room assembly _ 4 0 0A ... Sample system 401 ... Container base Ministry of Economic Affairs Central Standards Bureau staff printing Cooperative print A ... pump laser system B ... ILS laser and chamber C ... spectrometer D ... detector And electronics F ... incident beam Η ... beam G ... beam E ... beam 1A ... gain medium 1B ... gain medium 1C ... gain medium 2 A. _ · mirror 2B. .. Diffraction Grating 2C ... High Reflector 3 A ... Mirror 3B ... Mirror 3C ... Partial Mirror 4 .. Cavity Absorber 5 .. Ray Cavity 10. Gas detection system 100. Laser pump 100. Laser driver (It is necessary to read the precautions on the back before filling this page) 402 .. Window 403 .. Window 404 .. Window 405 ... Window 406 ... Gas sample tank body 407 ... Gas sample tank holder This paper size applies Chinese National Standard (CNS) Λ4 specification (210X297 mm) -54- A7 B7 Central Ministry of Economic Affairs Standard Bureau employee consumer cooperative printed 600C ... Optical beam expansion device 600D ... Focusing lens assembly 601 ... Folding mirror 602 ... Lens mount 603 ... Lens 605 ... Lens 607. Diffraction grating 608 .. Mounting piece 609 .. Diffraction grating 610 .. Mounting piece 611 ... Lens 7 0 0 ... Detection benefit assembly 701 .. Multi-channel array detector 702 · · Mounting parts 7 0 3 ... Electronic board 704 ... BNC connector and shield_cable 8 0 0 ... Computer system 801 ··· Analog to digital converter 8 0 2 ... Computer (please first (Read the notes on the back and fill out this page)

五、發明説明(52) 408.. .輸入導管 409.. .輸出導管 410.. .頂蓋 410A...填隙料 411.. .輸入管 412.. .輸出管 500.. .1.S雷射器 500A...散熱系統 501···鏡 503…鏡 505…鏡 507.. .雷射器晶體 508.. .晶體固持器 509…熱電冷卻器 510…銅質散熱橋 5 11…熱電感測器 512.. .電氣溫度控制界面 600…光諧儀裝置 600A...繞射光柵總成 600B...繞射光柵總成 本纸張尺度適用中國國家標準(CNS ) A4規格(210X 297公釐)V. Description of the invention (52) 408 ..... Input conduit 409... Output conduit 410... Cap 410A... Interstitial material 411... Input pipe 412... Output pipe 500... 1. S laser 500A ... cooling system 501 ... mirror 503 ... mirror 505 ... mirror 507 ... laser crystal 508 ... crystal holder 509 ... thermoelectric cooler 510 ... copper heat sink 5 11 ... Thermal sensor 512 .. Electrical temperature control interface 600 ... Photoharmonic device 600A ... Diffraction grating assembly 600B ... Diffraction grating total cost Paper size applies to Chinese National Standard (CNS) A4 specification (210X 297 mm)

Claims (1)

、申請專利範圍 第86105046號申請案申請專利範圍修正本 修正日期:88年7月 (請先閱讀背面之注意富.項再填寫本頁) 1. 一種氣體檢測系統(10),利用檢測在包含腐蝕性氣體 之一氣體樣品中之氣體種類之出現的方法,來檢測在 一包含腐蝕性氣體之氣體樣品中之氣體種類之出現^該 方法包括如下步驟: (a) 選擇一光譜範圍,其中⑴氣體種類具有至少 一吸收特徵及(11)該腐姓性氣體本質上不具有干擾吸收 特徵; (b) 提供一雷射器(5〇〇),該雷射器(5〇〇)包含一雷 射腔(5)及一位於其内的增益媒質(5〇7),該增益媒質 (507)輸出具有一波長分佈的光線,該波長分佈的至少 一部份係在該所選擇的光譜範圍内; (c) 提供一氣體樣品槽(4〇6),該氣體樣品槽(4〇6) 具有對於在該所選擇之光譜範圍内之光線來說係透明 的透窗以致於一光線束流能夠通過該氣體樣品槽(4〇6) 9 * 經濟部智慧財產局員工消費合作社印製 (d) 將該氣體樣品槽(4〇6)插入該雷射器(5〇〇)内以 致於自該增盈媒質(5〇7)輸出的光線在離開該雷射腔 之前通過該氣體樣品; (e) 將包含腐钱性氣體的氣體樣品插入該氣體樣 品槽(406)内以致於自該增益媒質(5〇7)輸出的光線通過 該氣體樣品’該氣體樣品被密封於該氣體樣品槽(4〇6) 内以致於該腐蝕性氣體不與該雷射器(5〇〇)反應;及 本紙張尺度適用中國國家標準(CNS)A4規格(210 x 297公釐I -56-、 Application for Patent Scope No. 86105046 Application for Patent Scope Amendment Date of this revision: July 88 (Please read the note on the back. Please fill in this page before filling out this page) 1. A gas detection system (10). A method for detecting the presence of a gas species in a gas sample, which is a corrosive gas, to detect the presence of a gas species in a gas sample containing a corrosive gas. The method includes the following steps: (a) selecting a spectral range, where ⑴ The gas type has at least one absorption characteristic and (11) the humiliating gas does not have interference absorption characteristics in nature; (b) a laser device (500) is provided, and the laser device (500) includes a laser Cavity (5) and a gain medium (507) located therein, the gain medium (507) outputting light having a wavelength distribution, at least a part of the wavelength distribution is within the selected spectral range (C) providing a gas sample cell (406) having a transparent window for light in the selected spectral range so that a beam of light can Through the gas Sample slot (406) 9 * Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs (d) Insert the gas sample slot (406) into the laser (500) so that the medium from the enrichment (5) the output light passes through the gas sample before leaving the laser cavity; (e) a gas sample containing a corrosive gas is inserted into the gas sample slot (406) so that the gain medium (50) 7) The output light passes through the gas sample 'The gas sample is sealed in the gas sample tank (406) so that the corrosive gas does not react with the laser (500); and this paper size applies China National Standard (CNS) A4 (210 x 297 mm I -56- 、申請專利範圍 第86105046號申請案申請專利範圍修正本 修正日期:88年7月 (請先閱讀背面之注意富.項再填寫本頁) 1. 一種氣體檢測系統(10),利用檢測在包含腐蝕性氣體 之一氣體樣品中之氣體種類之出現的方法,來檢測在 一包含腐蝕性氣體之氣體樣品中之氣體種類之出現^該 方法包括如下步驟: (a) 選擇一光譜範圍,其中⑴氣體種類具有至少 一吸收特徵及(11)該腐姓性氣體本質上不具有干擾吸收 特徵; (b) 提供一雷射器(5〇〇),該雷射器(5〇〇)包含一雷 射腔(5)及一位於其内的增益媒質(5〇7),該增益媒質 (507)輸出具有一波長分佈的光線,該波長分佈的至少 一部份係在該所選擇的光譜範圍内; (c) 提供一氣體樣品槽(4〇6),該氣體樣品槽(4〇6) 具有對於在該所選擇之光譜範圍内之光線來說係透明 的透窗以致於一光線束流能夠通過該氣體樣品槽(4〇6) 9 * 經濟部智慧財產局員工消費合作社印製 (d) 將該氣體樣品槽(4〇6)插入該雷射器(5〇〇)内以 致於自該增盈媒質(5〇7)輸出的光線在離開該雷射腔 之前通過該氣體樣品; (e) 將包含腐钱性氣體的氣體樣品插入該氣體樣 品槽(406)内以致於自該增益媒質(5〇7)輸出的光線通過 該氣體樣品’該氣體樣品被密封於該氣體樣品槽(4〇6) 内以致於該腐蝕性氣體不與該雷射器(5〇〇)反應;及 本紙張尺度適用中國國家標準(CNS)A4規格(210 x 297公釐I -56-、 Application for Patent Scope No. 86105046 Application for Patent Scope Amendment Date of this revision: July 88 (Please read the note on the back. Please fill in this page before filling out this page) 1. A gas detection system (10). A method for detecting the presence of a gas species in a gas sample, which is a corrosive gas, to detect the presence of a gas species in a gas sample containing a corrosive gas. The method includes the following steps: (a) selecting a spectral range, where ⑴ The gas type has at least one absorption characteristic and (11) the humiliating gas does not have interference absorption characteristics in nature; (b) a laser device (500) is provided, and the laser device (500) includes a laser Cavity (5) and a gain medium (507) located therein, the gain medium (507) outputting light having a wavelength distribution, at least a part of the wavelength distribution is within the selected spectral range (C) providing a gas sample cell (406) having a transparent window for light in the selected spectral range so that a beam of light can Through the gas Sample slot (406) 9 * Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs (d) Insert the gas sample slot (406) into the laser (500) so that the medium from the enrichment (5) the output light passes through the gas sample before leaving the laser cavity; (e) a gas sample containing a corrosive gas is inserted into the gas sample slot (406) so that the gain medium (50) 7) The output light passes through the gas sample 'The gas sample is sealed in the gas sample tank (406) so that the corrosive gas does not react with the laser (500); and this paper size applies China National Standard (CNS) A4 (210 x 297 mm I -56- 六、申請專利範圍 經濟邹智慧財產局員工消費合作杜印制衣 (f)在離開該雷射腔(5)之後,指引自該增益媒質 (5〇7)輸出的光線至一檢測器總成(7〇〇)俾決定在該氣體 樣品中之氣體種類的出現及/或者濃度;^ 該氣體檢測紊統(10)包含: (a) 該雷射腔(5); (b) 存在於其内的該增益媒質(5〇7),該增益媒質 (507)輸出具有一波長分佈的光線,該波長分佈的至少 一部份是在該光譜範圍中; (c) 被包含於該雷射器(500)内的該氣體樣品槽; (d) 用於插入包含該腐蝕性氣體之該氣體樣品在該 氣體樣品槽(4〇6)内的導管(408,409);及 (e) 用於決定在該氣體樣品中之氣體種類之出現及 /或濃度的該檢測器總成(700),自該雷射器(500)輸出 的光線被指向於該檢測器總成(7〇〇)。 2.如申請專利範圍第丨項所述之氣體檢測系統(1〇),其中 ,該增益媒質(507)係由一抽送雷射器(1〇〇)抽送,該抽 送雷射器(100)係從包含固態晶體雷射器與二極瞢雷射 器的群別中選擇出來。 3 ·如申請專利範圍第丨項所述之氣體檢測系統(丨〇),其中 ,該雷射腔(5)係被包含在一室(4〇〇)内,該室(4〇〇)係 被構形成撤空要被檢測的氣體種類。 4.如申請專利範圍第1項所述之氣體檢測系統(1〇),其中 ,該氣體樣品係被包含於該雷射腔(5)的區域内,其係 被象散補償俾降低從該增益媒質(5〇7)輸出之光線的象 本纸張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) I _1 ^1 ·1· n n a^i 'N* ^ϋ n n n B— 0 n n n n n 1 I /- . c f t c (請先間讀背面之注意事項再填寫本頁) -57- A8 B8 C8 D8 六、申請專利範圍 散。 5. 如申請專利範圍第1項所述之氣體檢測系統(10),其中 ,該增益媒質(507)包含一個從包含Cr:Tm:Ho:YAG、 Cr4+:YSO、Cr4+:YAG、Cr4+:YSAG、Er:GSGG、Er3+:YLF 、Er3+:Yb3+:玻璃、Ho3+:YSGG、Ho3+:Tm3+:LuAG、 Tm3 + :Ho3+:YLF、Tm3+:Ho3+:YAG、Tm3+:Ca Y SOAP、 Tm3+:YLF、Tm3+:Tb3+:YLF、Tm3+:玻璃、Tm3+:Ca La SOAP、Tm3+:YOS、Tm3+:YSGG、Tm3+:YAG、Yb3+:YAG 、Cr:鎂橄欖石、Er:Yb:玻璃、Co2+:MgF2、Cr2+:ZnSe 、Cr2+:ZnS/ZnSe/ZnTe、Ti3+:A1203、及 Ni2+:BaLiF3 之 群別中選擇出來的雷射器晶體材料。 6. 如申請專利範圍第2項所述之氣體檢測系統(10),其中 ,該抽送雷射器(100)具有由束流成形裝置(200)所成形 的輸出,該束流成形裝置係從包含繞射光學、折射光 學、折射分度軸向地改變的梯度分度光學、折射分度 徑向地改變的梯度分度光學、微光學、及其之組合的 群別中選擇出來。 (請先閱讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) -58-Sixth, patent application scope Economy Zou Intellectual Property Bureau employee consumer cooperation Du printed clothing (f) After leaving the laser cavity (5), direct the light output from the gain medium (507) to a detector assembly (700) determine the appearance and / or concentration of the type of gas in the gas sample; ^ the gas detection system (10) contains: (a) the laser cavity (5); (b) existing in it Within the gain medium (507), the gain medium (507) outputs light having a wavelength distribution, at least a part of the wavelength distribution is in the spectral range; (c) is included in the laser (500) the gas sample tank; (d) a conduit (408,409) for inserting the gas sample containing the corrosive gas in the gas sample tank (406); and (e) for determining The presence and / or concentration of gas species in the gas sample is detected by the detector assembly (700), and the light output from the laser (500) is directed to the detector assembly (700). 2. The gas detection system (10) according to item 丨 of the patent application scope, wherein the gain medium (507) is pumped by a pumping laser (100), and the pumping laser (100) The system is selected from the group consisting of solid-state crystal lasers and two-pole chirped lasers. 3. The gas detection system (丨) as described in item 丨 of the patent application scope, wherein the laser cavity (5) is contained in a chamber (400), and the chamber (400) is Constructed to evacuate the type of gas to be detected. 4. The gas detection system (10) according to item 1 of the scope of patent application, wherein the gas sample is contained in the area of the laser cavity (5), which is compensated by astigmatism and reduced from the The size of the light output by the gain medium (507) applies to the Chinese paper standard (CNS) A4 (210 X 297 mm). I _1 ^ 1 · 1 · nna ^ i 'N * ^ ϋ nnn B— 0 nnnnn 1 I /-. Cftc (Please read the precautions on the back before filling this page) -57- A8 B8 C8 D8 6. The scope of patent application is scattered. 5. The gas detection system (10) as described in item 1 of the scope of the patent application, wherein the gain medium (507) includes an element including Cr: Tm: Ho: YAG, Cr4 +: YSO, Cr4 +: YAG, Cr4 +: YSAG , Er: GSGG, Er3 +: YLF, Er3 +: Yb3 +: Glass, Ho3 +: YSGG, Ho3 +: Tm3 +: LuAG, Tm3 +: Ho3 +: YLF, Tm3 +: Ho3 +: YAG, Tm3 +: Ca Y SOAP, Tm3 +: YLF, Tm3 +: Tb3 +: YLF, Tm3 +: glass, Tm3 +: Ca La SOAP, Tm3 +: YOS, Tm3 +: YSGG, Tm3 +: YAG, Yb3 +: YAG, Cr: forsterite, Er: Yb: glass, Co2 +: MgF2, Cr2 +: ZnSe, Laser crystal materials selected from the group of Cr2 +: ZnS / ZnSe / ZnTe, Ti3 +: A1203, and Ni2 +: BaLiF3. 6. The gas detection system (10) according to item 2 of the scope of patent application, wherein the pumping laser (100) has an output formed by a beam forming device (200), the beam forming device is from It is selected from the group consisting of diffraction optics, refractive optics, gradient indexing optics in which refractive index changes axially, gradient indexing optics in which refractive index changes radially, micro-optics, and combinations thereof. (Please read the notes on the back before filling out this page) Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs This paper applies the Chinese National Standard (CNS) A4 specification (210 X 297 mm) -58-
TW86105046A 1996-07-03 1997-04-18 Intracavity laser spectroscopy for detection of gas contaminants TW400431B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/675,554 US5742054A (en) 1995-09-01 1996-07-03 Ultra-sensitive detection of contaminants in corrosive gas via intracavity laser spectroscopy (ILS)

Publications (1)

Publication Number Publication Date
TW400431B true TW400431B (en) 2000-08-01

Family

ID=24710993

Family Applications (2)

Application Number Title Priority Date Filing Date
TW88111199A TW382655B (en) 1996-07-03 1997-04-18 Intracavity laser spectroscopy for detection of gas contaminants (2)
TW86105046A TW400431B (en) 1996-07-03 1997-04-18 Intracavity laser spectroscopy for detection of gas contaminants

Family Applications Before (1)

Application Number Title Priority Date Filing Date
TW88111199A TW382655B (en) 1996-07-03 1997-04-18 Intracavity laser spectroscopy for detection of gas contaminants (2)

Country Status (1)

Country Link
TW (2) TW382655B (en)

Also Published As

Publication number Publication date
TW382655B (en) 2000-02-21

Similar Documents

Publication Publication Date Title
CA2203780C (en) Ultra-sensitive detection of contaminants in gas via intracavity laser spectroscopy (ils)
CA2203775C (en) Diode laser-pumped and linear cavity laser systems for ultra-sensitive gas detection via intracavity laser spectroscopy (ils)
Yin et al. Highly sensitive SO 2 photoacoustic sensor for SF 6 decomposition detection using a compact mW-level diode-pumped solid-state laser emitting at 303 nm
WO1997009607A9 (en) Ultra-sensitive detection of contaminants in gas via intracavity laser spectroscopy (ils)
Wysocki et al. Influence of molecular relaxation dynamics on quartz-enhanced photoacoustic detection of CO 2 at λ= 2 μm
CN204086105U (en) A kind of gas sensor system
US5841533A (en) Intracavity laser spectroscopy for high sensitivity detection of contaminants in gas
JP6371706B2 (en) Heterodyne detection system and method
Kassi et al. Cavity ring down spectroscopy with 5× 10− 13 cm− 1 sensitivity
US8240189B2 (en) Thermal selectivity multivariate optical computing
Ren et al. Hydrogen peroxide detection with quartz-enhanced photoacoustic spectroscopy using a distributed-feedback quantum cascade laser
Hancock et al. Direct and wavelength modulation spectroscopy using a cw external cavity quantum cascade laser
US5689334A (en) Intracavity laser spectroscope for high sensitivity detection of contaminants
US10768101B2 (en) Measuring device and method for sensing different gases and gas concentrations
EP3571489A1 (en) Close-coupled analyser
US20140071446A1 (en) Dual-Gas Microcavity Raman Sensor and Method of Use
WO2011089243A1 (en) Evanescent wave absorption based devices
JP4947988B2 (en) Gas detector
GB2023822A (en) Photoacoustic raman spectroscopy
TW480332B (en) Contaminant identification and concentration determination by monitoring the wavelength, or intensity at a specific wavelength, of the output of an intracavity laser
TW400431B (en) Intracavity laser spectroscopy for detection of gas contaminants
TW504572B (en) Contaminant identification and concentration determination by monitoring the intensity of the output of an intracavity laser
US20200141805A1 (en) Measuring device based on an optical measurement in an opto-mechanical cavity
Abe et al. Dual-laser cavity ring-down spectroscopy for real-time, long-term measurement of trace moisture in gas
JP4767755B2 (en) Method for detecting and quantifying oxygen molecules in a sample

Legal Events

Date Code Title Description
GD4A Issue of patent certificate for granted invention patent