TW399238B - The method and device of removing the cooling by-product remained in the exhaust pipeline for the low pressure chemical vapor deposition (LPCVD) - Google Patents

The method and device of removing the cooling by-product remained in the exhaust pipeline for the low pressure chemical vapor deposition (LPCVD) Download PDF

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TW399238B
TW399238B TW87107495A TW87107495A TW399238B TW 399238 B TW399238 B TW 399238B TW 87107495 A TW87107495 A TW 87107495A TW 87107495 A TW87107495 A TW 87107495A TW 399238 B TW399238 B TW 399238B
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sublimation
condensed
products
patent application
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TW87107495A
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Chinese (zh)
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Wei-Fan Lin
Jeng-Chang Hung
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Vanguard Int Semiconduct Corp
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Abstract

This is a device to sublime and vaporize ammonium chloride (NH4Cl) (the by-product in the silicon nitride deposition process). Reflux condition is prevented from entering into the reactor, and the vapor and particles is prevented to block the vacuum pump. The exhaustion pipeline includes the new valve assembly, sublimation and the cold trap, the cooling and heating device, to decrease the particle number of the cooled NH4Cl in the first path cold trap. Thus, it decreases maintenance work, increases equipment uptime, and increases product yield.

Description

經濟部中央標準局員工消费合作社印簟 A7 B7 - --------- — ' ——-----—-~~--- . 五、發明説明(1 ) 本發明有關於一種製造半導體薄膜的裝置和方法。 特別是,本發明有關於在低壓化學氣相沈積膜製造製程 中,可有效降低製程固體生成(buildup)的方法和裝置》 以下四篇文獻有關於使用熱捕捉器(hot trap)和冷捕 捉器(冷凝器)(c〇ld trap)以從反應室中分離出來源物質的 方法。 1979年9月25日發證之K. Degenhardt et al.的美國 專利第4,168,741號顯示一種用於影印機中供應氨氣的裝 置。 1991 年5月 14 日發證之R. D. Varrin,Jr. et al.的美 國專利第5,015,503號揭露一種製造化合物半導體薄膜的 裝置。此裝置包括用以從反應室中分離來源物質的熱捕 捉器和冷凝器,並提供用以控制反應物種(species)之供 應。此熱捕捉器和冷凝器經由熱和冷腳與反應室相連, 以建立一封閉的迴路循環流。 1993年1〇月5日發證之S. Miyazaki的美國專利第 5,250,323號揭露具有包括捕捉器(trap)之排氣裝置 (exhaust device)的一種化學氣相成長裝置。此專利包括 一捕捉器,其設置於第一排氣裝置内,用來吸收殘留在 來源氣體入口和氣體流速控制器中的來源氣體》 1993年11月16日發證之W. Basta et al.的美國專利 第5,261,963號揭露包括排氣氣相冷凝設備的一種CVD裝 置。此裝置包括一反應器,反應器有反應室,反應室有 一個沈積區用來沈積基板,以及一個排氣區《冷凝總成 本紙張尺度逍用中國國家標準(CNS)八4規格(2丨0><297公釐) (請先閲讀背面之注意事項再填寫本頁) 訂 " Λ7 B7_____ 五、發明説明(2 ) 設置在排氣區内,用以在用過的氣體尚未進入出口之 前,將用過的氣體中的過多的、未反應的氣相反應物予 以冷凝。此冷凝總成包括設於排氣區内的高表面積、有 孔的構造,其中用過氣體流的溫度被足夠地降低,以自 其中冷凝過多的、未反應的氣相反應物》 低壓化學氣相沈積法(LPCVD)是一種已知的在基板 上沈積並形成一保護性薄膜的方法。一般說來,基板置 於一反應室内,加熱到適當的反應溫度,在反應器中暴 露於一種或多種升高溫度的氣相反應物中,以與基板表 面反應以在其上形成一塗層。此LPCVD沈積之塗層可藉 由在反應器中適當的加熱以與基板反應,以在其上形成 一保護性的擴散塗層。 氣化銨副產物是在氮化矽製程中,當於一 LPCVD反 應器内在一半導體基板上形成一薄氮化矽層時所產生 的。此氣化銨是以氣相的形態產生,並快速地結晶為蒸 氣/晶體混合物(vapor/crystal mix)而由排氣口排出。此蒸 氣/結晶混合物被帶入一冷凝器中。 經濟部中央梯率局負工消费合作社印製 (請先閲讀背面之注意事項再填寫本頁)Employees 'Cooperatives of the Central Bureau of Standards, Ministry of Economic Affairs, A7 B7---------- —' ——-------- ~~ ---. V. Description of the Invention (1) The present invention relates to An apparatus and method for manufacturing a semiconductor thin film. In particular, the present invention relates to a method and a device which can effectively reduce the buildup of solids in a low pressure chemical vapor deposition film manufacturing process. The following four documents are related to the use of hot traps and cold traps. (Condenser) (cold trap) A method for separating a source substance from a reaction chamber. U.S. Patent No. 4,168,741 issued to K. Degenhardt et al. On September 25, 1979 shows an apparatus for supplying ammonia gas in a photocopying machine. US Patent No. 5,015,503 issued to R. D. Varrin, Jr. et al. On May 14, 1991 discloses a device for manufacturing a compound semiconductor thin film. The device includes a heat trap and a condenser for separating source materials from the reaction chamber, and provides a supply for controlling reaction species. The heat trap and condenser are connected to the reaction chamber via hot and cold feet to establish a closed loop circulating flow. US Patent No. 5,250,323 issued to S. Miyazaki on October 5, 1993, discloses a chemical vapor growth device having an exhaust device including a trap. This patent includes a trap, which is arranged in the first exhaust device to absorb the source gas remaining in the source gas inlet and the gas flow rate controller. W. Basta et al., Issued on November 16, 1993. US Patent No. 5,261,963 discloses a CVD apparatus including an exhaust gas phase condensation apparatus. This device includes a reactor, the reactor has a reaction chamber, the reaction chamber has a deposition area for depositing substrates, and an exhaust area "total cost of condensation paper size free use Chinese National Standard (CNS) 8 4 specifications (2 丨 0 > < 297 mm) (Please read the notes on the back before filling out this page) Order " Λ7 B7_____ V. Description of the invention (2) It is set in the exhaust area to be used before the used gas has entered the outlet Excessive, unreacted gaseous reactants in the used gas are condensed. This condensation assembly includes a high surface area, porous structure located in the exhaust zone, in which the temperature of the used gas stream is sufficiently reduced to condense excessive, unreacted gaseous reactants from it. Phase deposition (LPCVD) is a known method for depositing and forming a protective film on a substrate. Generally speaking, the substrate is placed in a reaction chamber, heated to an appropriate reaction temperature, and exposed to one or more elevated-temperature gaseous reactants in the reactor to react with the substrate surface to form a coating thereon. . The LPCVD deposited coating can be reacted with the substrate by appropriate heating in a reactor to form a protective diffusion coating thereon. The ammonium gaseous by-product is produced during the silicon nitride process when a thin silicon nitride layer is formed on a semiconductor substrate in an LPCVD reactor. This vaporized ammonium is produced in the gas phase and quickly crystallizes into a vapor / crystal mix and is discharged from the exhaust port. This vapor / crystallized mixture is taken into a condenser. Printed by the Consumers' Cooperative of the Central Ramp Bureau of the Ministry of Economic Affairs (please read the precautions on the back before filling this page)

A 就定義而言’冷凝器的作用為一低溫泵。系統壓力 是在真空系統下因蒸氣之低溫冷凝而降低的。當一表面 被引入溫度足夠低可冷凝存在的蒸氣之系統中時,此系 統内的壓力將成為冷凝物之蒸氣壓的壓力。當冷凝物固 化時’此固體溫度的略微下降通常將會使得蒸氣壓有劇 烈的下降。低溫泵就是基於上述之原理。在某些情況下, 捕捉器是用來以冷凝或冷凍這些蒸氣的方式,將流動蒸 4 本紙張尺度適用中國國家標準(CNS )从麟(2丨〇χ297公楚) '~~*- 經濟部中央標準局負工消费合作社印製 A 7 _________B7 五、發明説明(3 ) "—~ ' 氣(油或水銀)抽出真空管路之外,或抽出其他泵之外。 在其他的情況下,一個捕捉器的主要功用是藉著抽出各 種可冷凝的蒸氣,以使抽出時間縮短。 在傳統LPCVDs所使用的冷凝器收集並保留ΝΗ4α 固體,使其不進入真空泵中。這可使得當抽出蒸氣時固 體不致於損害泵》當冷凝時Nha固體增加時,系統壓 力漸漸變成很難控制。為了避免因在冷凝管路中固體體 積增加所導致的蒸氣無法從反應室中抽出,必須要中止 LPCVD製程。維護人員必須要將真空管路拆下並清潔, 於是,降低了設備製程的利用度。 第la至lc圓顯示習知排氣管路的許多具體實施例。 每個具體實施例包括具有一排氣出口 14的一 LPCVD反應 器10 ’ 一壓力感測器15,一第一閥23 ’ 一冷凝器11,以 及一真空果21 ’均以上述之順序而依序設置。一第二閥 24設置為提供另一個通路以迂迴第一閥23。 在LPCVD製備時,所有的閥都是關閉的,一半導體 基板和一來源物質(未顯示)置於並密封於反應管2〇内。 在沈積循環開始時,打開第二閥24以限制空氣從反應管 的猛衝出’藉此避免在排氣管路内NH4C€固體被帶入真 空泵21中的干擾。當室壓力下降到一既定最大值時,打 開第一閥23以使壓力加速抽低到一既定的製程麽力。來 源物質加熱至一既定的蒸發溫度。此蒸氣圍繞著半導體 基板並與其反應而在其上生成一氮化物保護膜,而得到 一 NH4C<副產物蒸氣。此副產物蒸氣被排出,且當排出 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公廣) (請先閱讀背面之注意事項再填寫本頁}A By definition, the condenser acts as a cryopump. The system pressure is reduced in the vacuum system due to the low temperature condensation of the vapor. When a surface is introduced into a system whose temperature is sufficiently low to condense the vapor present, the pressure in the system becomes the pressure of the vapor pressure of the condensate. When the condensate solidifies, a slight drop in the temperature of this solid will usually result in a dramatic drop in vapor pressure. The cryopump is based on the above principle. In some cases, the trap is used to condense or freeze these vapors, to steam the flow of 4 papers. Applicable to China National Standard (CNS) Conglin (2 丨 〇χ297 公 楚) '~~ *-Economy Printed by the Central Standards Bureau of the Ministry of Work and Consumer Cooperatives A 7 _________B7 V. Description of the Invention (3) " — ~ 'The gas (oil or mercury) is pumped out of the vacuum line, or pumped out. In other cases, the main function of a trap is to reduce the extraction time by extracting various condensable vapors. The condenser used in traditional LPCVDs collects and retains the NΗ4α solids so that they do not enter the vacuum pump. This can prevent the solids from damaging the pump when the steam is extracted. When the Nha solids increase during condensation, the system pressure gradually becomes difficult to control. In order to avoid that the vapor cannot be extracted from the reaction chamber due to the increase in solid volume in the condensing line, the LPCVD process must be stopped. Maintenance personnel must remove and clean the vacuum lines, thus reducing the utilization of the equipment process. Circles 1a to 1c show many specific embodiments of conventional exhaust lines. Each embodiment includes an LPCVD reactor 10 ′ having an exhaust outlet 14, a pressure sensor 15, a first valve 23 ′, a condenser 11, and a vacuum fruit 21 ′ in the order described above. Sequence settings. A second valve 24 is provided to provide another passage to bypass the first valve 23. During the LPCVD preparation, all valves are closed, a semiconductor substrate and a source substance (not shown) are placed and sealed in the reaction tube 20. At the beginning of the sedimentation cycle, the second valve 24 is opened to limit the surge of air from the reaction tube ', thereby avoiding the interference of NH4C solids being introduced into the vacuum pump 21 in the exhaust line. When the chamber pressure drops to a predetermined maximum value, the first valve 23 is opened to accelerate the pressure down to a predetermined process force. The source material is heated to a predetermined evaporation temperature. This vapor surrounds the semiconductor substrate and reacts with it to form a nitride protective film thereon to obtain an NH4C < by-product vapor. This by-product vapor is discharged, and when it is discharged, the paper size is applicable to the Chinese National Standard (CNS) A4 specification (210X297). (Please read the precautions on the back before filling this page}

.V ,π 經濟部中央梯準局貝工消费合作社印製 A7 B7 五、發明説明(4 ) 至排氣出口 14時開始結晶。當此蒸氣/晶體混合物被推入 排氣管路内,通過開啟的第一閥23並進入冷凝器η中 時’晶體被凝集住,並且只有蒸氣可被推出並被泵21所 排出。此冷凝器11的溫度乃利用將製程冷水在具有延伸 導電表面的附設冷板内循環,以固化NH4C/並保留NH4C/ 使不被泵21所攝入。 一般說來’ NH4C/副產物會在反應器排氣管路中足 夠冷的位置處結晶,結果會阻塞排氣管路。排氣阻塞的 問題會影響製程壓力控制,致使LPCVD裝置須停止。防 止的維持需要費時的拆卸和清潔步驟,反映出由於較低 的設備利用度所導致的製造費用的增加》 目前的半導體化學製程,需要透過製程固體有效的 減少,而達到較少的維護及產品良率的提高。可有效降 低在泵線路中這些污染物的解決方式是,組合使用加熱 線路和一蒸氣昇華捕捉器。此蒸氣昇華捕捉器吸引排出 之蒸氣’並在其有機會回流到反應室而污染半導體基板 之前將其固化。亦可避免蒸氣和顆粒進入並損壞真空 泵。 半導體CVD和蝕刻製程中所製造出的氣相副產物, 會很容易地被抽出反應室之外。然而,由於線路溫度比 反應室的溫度低,他們通常會在真空管線中固化。線路 阻塞意味著較長的停機時間(down time)和較低的產品良 率’特別是對於較大晶圓和較小元件尺寸(feature size) 的趨勢之下。 本紙張尺度適用中國國家橾準(CNS ) A4規格(21〇X 297公釐) (請先閲讀背面之注意事項再填寫本頁) J. 訂 ^f^mr^r^f^rs'^ i i ttiAr ^ nzw ^ >ASV? 297吟除.V, π Printed by the Shellfish Consumer Cooperative of the Central Ladder Bureau of the Ministry of Economic Affairs A7 B7 V. Description of the Invention (4) Crystallization starts at 14:00 of the exhaust outlet. When this vapor / crystal mixture is pushed into the exhaust line, passes through the opened first valve 23 and enters the condenser η, the crystals are condensed, and only the vapor can be pushed out and discharged by the pump 21. The temperature of the condenser 11 is obtained by circulating the cold water in the attached cold plate with an extended conductive surface to solidify the NH4C / and retain the NH4C / so as not to be taken in by the pump 21. Generally speaking, ’NH4C / by-products crystallize at a location that is sufficiently cold in the reactor exhaust line, resulting in clogging of the exhaust line. Exhaust clogging issues can affect process pressure control and cause the LPCVD plant to stop. Preventive maintenance requires time-consuming disassembly and cleaning steps, reflecting the increase in manufacturing costs due to lower equipment utilization. "Current semiconductor chemical processes require effective reduction of solids through the process to achieve less maintenance and products. Yield improvement. A solution that can effectively reduce these contaminants in the pump circuit is to use a combination of a heating circuit and a vapor sublimation trap. This vapor sublimation trap attracts the exhausted vapor ' and solidifies it before it has a chance to return to the reaction chamber to contaminate the semiconductor substrate. It also prevents vapors and particles from entering and damaging the vacuum pump. Gaseous by-products produced during semiconductor CVD and etching processes can be easily extracted from the reaction chamber. However, because the line temperature is lower than the temperature of the reaction chamber, they are usually cured in a vacuum line. Line congestion means longer downtime and lower product yields', especially for larger wafers and smaller feature size trends. This paper size is applicable to China National Standard (CNS) A4 (21〇X 297 mm) (Please read the precautions on the back before filling this page) J. Order ^ f ^ mr ^ r ^ f ^ rs' ^ ii ttiAr ^ nzw ^ > ASV? 297

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A7 B7 五、發明説明(6 ) 凝器所需之製造時停機時間。 本發明之目的為提供一種改良的LPCVD裝置和方 法,其中藉由收集在氣化碎成長製程中在反應器中所產 生的蒸氣和顆粒,可避免回流及真空泵損壞。 本發明之另一目的為提供改良的裝置和方法,其中 被冷凝和被收集的NH4C彳固體之體積被維持於最小值, 藉此避免對於在反應器内被加工的半導體基板的製程控 制問題及損壞。 本發明之另一目的為降低拆卸及清潔設備的頻率, 於是可增加設備的利用度。 圖式之簡單說明 第la、lb和lc圖為習知技術之許多蒸氣排氣管路的 圖示。 第2圖為本發明之排氣管路具體實施例的部分構造 囷。 第3圓為本發明另一具體實施例之排氣管路具體實 施例的部分構造圖。 第4圖為NH4Cf之蒸氣壓圓。 首先參考第4圖,顯示NH4C/之蒸氣壓囷形,依此, 以溫度對壓力的函數描繪出NH4C/之蒸氣到固體的轉 移。本發明是依據溫度75°C或以上及壓力3 X 10·3 Torr之 下會使NH4C/由固相蒸發的這項事實來預測的。此事實 本紙張尺度適用中國國家標準(CNS ) A4规格(210X297公釐) (請先閲讀背面之注意事項再填寫本頁) 訂 .1 · Μ Β7 五、發明説明(7 ) 使得只要使用溫和的加熱和壓力即可使得NH4C€固體在 排氣管路中蒸發,並且使其體積減少。 參考第2圖,顯示一 LPCVD沈積系統,其包括製程 反應器10,其具有一反應室11,此反應室11具有一沈積 區13用以沈積一基板(未顯示),以及一排氣區12與沈積 區13相連。此沈積區包括引入一來源物質的裝置(未顯 示)’來源物質被加熱以與基板反應以在其上形成一保護 性層,同時製造出一NH4C/蒸氣副產物。排氣區12包括 將在反應室所產生的NH4C€蒸氣經由一反應器出口 14而 帶入排氣管路15的一裝置。 在本發明之一具體實施例中,如第2圖所示,由製 程反應器出口 14而開始的一絕緣且加熱的真空導管π, 通過真空管路15而導引一真空環境。此真空管路在鄰近 昇華捕捉器(sublimation trap)31之出口處分叉。第一條路 徑在閥33之後生出,第二條路徑在閥36之後生出,兩者 分別在泵37,38處終止。 經濟部中央橾準局貝工消费合作社印笨 (請先閲讀背面之注意事項再填寫本頁) 在典型的LPCVD沈積循環中,一半導體基板和一來 源物質(未顯示)放置於沈積區13内,熱控制器34是關閉 的,閥33是打開的,而真空泵37和38是打開的。製程反 應器是密封的並確保為抽氣狀態,以降低其壓力。打開 一兩階段閥23。閥23是一分離閥,可使得真空系統慢慢 地抽氣。此閥的兩階段包括一小的迁迴閥和一主分離 閥。此迁迴閥建立一小開口用作起初的抽氣下降(pump down) ’以減慢系統的抽氣。這減低了因顆粒擾亂 本紙張尺度適用中國國家梯準(CNS ) Α4規格(210X297公釐) 經濟部中央梂丰局負工消费合作社印袋 A7 ______B7 五、發明説明(8 ) (particulate turbulence)所引起的污染以及因突然的壓力 改變所導致的損壞。當製程壓力和溫度達到時,氣相沈 積循環便開始了。 來源物質和半導體基板反應之沈積,會產生氣相的 氣化銨(NH/O副產物。此蒸氣由出口 14而被排出。當 NH4<^蒸氣冷卻時,在小於75〇c的溫度下及大於3 χ 1〇-3 Torr的壓力之下開始結晶。冷卻立刻發生,蒸氣和晶體 的混合物進入出口 14。當蒸氣/晶體混合物經由出口 14而 被除去時,蒸氣/晶體混合物被以冷凝的形式引入並保持 在昇華捕捉器31中。 當完成沈積循環時’關閉主閥23和閥33以隔離真空 管路的第一路徑。打開閥36以使得第二路徑被真空泵38 而抽氣下降。第二路徑具有一冷凝器32,設置於昇華捕 捉器31和真空泵38之間,只有在閥36開啟時才會相連。 在裝卸產品之時’打開熱控制器34,打開混合閥43和44, 以讓熱和冷水循環到昇華捕捉器31的熱表面,以在其内 蒸發固體NH/f。一感測器34a提供溫度回饋至熱控制器 34,以控制混合閥43和44。此熱控制器維持昇華捕捉器 在理想的氣相狀態’以除去及/或減少在捕捉器31中所產 生的固體。蒸氣和顆粒被轉移至冷凝器32並且再被冷 凝。 在關閉與第二路徑相連的閥之前,藉由使得氮氣展 進入主閥23和捕捉器31之間的真空導管,由泵%所建立 的真空環境被排至大氣中。在氮氣清除之後,關閉所有 本紙張尺度適用中國國家揉準(CNS ) A4規格(2丨0X29*7公楚) (請先閱讀背面之注意事項再填寫本頁)®ν * ^ F Lengzhai 0 s MLΛσ (NHUC,) coffee-J _It & U- Sr 4, § ΛΓ NWI * s ^ \\\ ^. V & p 」$ 隹 Λ * 涂 紫 4 Xu + 华Although d ο report to Saki do article. Bismuth X Feng IsriAQ Ge 50 3HOWH-JM $ Μ Tea batch t rush selection 卅 3 Ο Λ Printed by the Consumers' Cooperative of the Central Standards Bureau of the Ministry of Economy time. An object of the present invention is to provide an improved LPCVD apparatus and method in which reflux and damage to a vacuum pump can be avoided by collecting vapors and particles generated in a reactor during a gasification crushing process. Another object of the present invention is to provide an improved device and method in which the volume of NH4C 彳 solids condensed and collected is maintained to a minimum, thereby avoiding process control problems for semiconductor substrates processed in the reactor and damage. Another object of the present invention is to reduce the frequency of disassembling and cleaning the equipment, thereby increasing the utilization of the equipment. Brief Description of the Drawings Figures la, lb, and lc are diagrams of many vapor exhaust lines of conventional technology. Fig. 2 is a partial structure 囷 of a specific embodiment of the exhaust pipe of the present invention. The third circle is a partial structural diagram of a specific embodiment of an exhaust pipe according to another embodiment of the present invention. Figure 4 shows the vapor pressure circle of NH4Cf. First referring to Fig. 4, the vapor pressure profile of NH4C / is shown. Based on this, the transfer of NH4C / vapor to solid is plotted as a function of temperature versus pressure. The present invention is predicted based on the fact that NH4C / evaporates from the solid phase at a temperature of 75 ° C or above and a pressure of 3 X 10 · 3 Torr. This fact applies to the paper size of China National Standard (CNS) A4 (210X297 mm) (please read the precautions on the back before filling this page) Order. 1 · Μ B7 V. Description of the invention (7) Heating and pressure cause the NH4C € solid to evaporate in the exhaust line and reduce its volume. Referring to FIG. 2, there is shown an LPCVD deposition system including a process reactor 10 having a reaction chamber 11 having a deposition region 13 for depositing a substrate (not shown) and an exhaust region 12 It is connected to Shenji District 13. This deposition zone includes a device (not shown) that introduces a source material. The source material is heated to react with the substrate to form a protective layer thereon, while producing an NH4C / vapor by-product. The exhaust area 12 includes a device for introducing NH4C vapor generated in the reaction chamber into an exhaust line 15 through a reactor outlet 14. In a specific embodiment of the present invention, as shown in FIG. 2, an insulated and heated vacuum pipe π started from the process reactor outlet 14 is guided through a vacuum pipe 15 to a vacuum environment. This vacuum line branches off near the exit of the sublimation trap 31. The first path is generated after the valve 33, and the second path is generated after the valve 36, and the two ends at the pumps 37 and 38, respectively. Yin Ben, the Central Bureau of Standards and Quarantine of the Ministry of Economic Affairs (please read the notes on the back before filling this page) In a typical LPCVD deposition cycle, a semiconductor substrate and a source substance (not shown) are placed in the deposition area 13 The thermal controller 34 is closed, the valve 33 is opened, and the vacuum pumps 37 and 38 are opened. The process reactor is hermetically sealed and must be evacuated to reduce its pressure. Open one or two-stage valve 23. Valve 23 is a separation valve that allows the vacuum system to slowly evacuate. The two stages of this valve consist of a small return valve and a main disconnect valve. This shuttle valve establishes a small opening for initial pump down 'to slow down the system's pumping. This reduces the application of the Chinese National Standard (CNS) A4 specification (210X297 mm) due to particles disturbing the paper size. The printing bag A7 of the Consumer Cooperatives of the Central Bureau of Economic Affairs of the Ministry of Economic Affairs ______B7 V. Description of Invention (8) Pollution and damage due to sudden pressure changes. When the process pressure and temperature are reached, the vapor deposition cycle begins. The deposition of the reaction between the source material and the semiconductor substrate will produce vaporized ammonium (NH / O by-products. This vapor is exhausted through outlet 14. When NH4 < ^ vapor is cooled, at a temperature of less than 75 ° C and Crystallization begins at pressures greater than 3 x 10-3 Torr. Cooling occurs immediately and the vapor and crystal mixture enters outlet 14. When the vapor / crystal mixture is removed via outlet 14, the vapor / crystal mixture is condensed Introduced and held in the sublimation trap 31. When the deposition cycle is complete 'close the main valve 23 and valve 33 to isolate the first path of the vacuum line. Open the valve 36 so that the second path is pumped down by the vacuum pump 38. Second The path has a condenser 32, which is placed between the sublimation trap 31 and the vacuum pump 38, and will be connected only when the valve 36 is opened. When the product is loaded and unloaded, 'the thermal controller 34 is opened, and the mixing valves 43 and 44 are opened so that Hot and cold water is circulated to the hot surface of the sublimation trap 31 to evaporate solid NH / f therein. A sensor 34a provides temperature feedback to the thermal controller 34 to control the mixing valves 43 and 44. This thermal controller maintains Rise The trap is in the ideal gas phase state to remove and / or reduce solids generated in the trap 31. Vapors and particles are transferred to the condenser 32 and re-condensed. Before closing the valve connected to the second path, By introducing nitrogen into the vacuum duct between the main valve 23 and the trap 31, the vacuum environment established by the pump% is discharged to the atmosphere. After the nitrogen is purged, all paper standards are closed. Applicable to Chinese national standards (CNS) ) A4 specification (2 丨 0X29 * 7 public Chu) (Please read the precautions on the back before filling this page)

、1T -1. 經濟部中央梂準局貝工消费合作社印製 A7 B7 五、發明説明(9 ) 的閥,打開閥33以準備開始下一次的製程循環。 參考第3囷,敘述本發明之第二具體實施例。在製 程反應器之出口 14開始的絕緣真空導管17,經由真空管 路而導引一真空環境。此真空管路在鄰近昇華捕捉器31 之出口處分叉。第一條路徑在閥33之後生出,第二條路 徑在閥36之後生出。藉由加入設置在冷凝器32之出口端 的閥51,冷凝器32可與第一和第二路徑分離。藉由加入 閥51,只需要一個真空泵37 ^第二具鱧實施例的操作順 序與第一具體實施例相同,除了閥51之開啟與關閉的情 形不同。其開關順序和閥36相同。兩者都是在同樣的時 間内開啟和關閉》 加入感測器和回饋器的組合,工具控制器可執行昇 華循環的操作順序,以及執行處理在第一排氣路徑中的 副產物,只留下手動清潔在第二路徑中之冷凝器内的冷 凝物。本發明降低此手動清潔的頻率,且可以在氮化矽 沈積過程中作此手動清潔。 依照昇華捕捉器31設計上的差異,冷凝器32入口端 亦可併聯接至昇華捕捉器31的入口處,以執行前述設計 之功能。 雖然本發明已以較佳實施例揭露如上,然其並非用 以限定本發明,任何熟習此項技藝者,在不脫離本發明 之精神和範圍内,當可作更動與潤飾,因此本發明之保 護範圍當視後附之申請專利範圍所界定者為準。 111T -1. Printed by the Central Laboratories of the Ministry of Economic Affairs, Shellfish Consumer Cooperative, A7 B7 V. The valve of invention description (9), the valve 33 is opened to prepare to start the next process cycle. Referring to Section 3, a second embodiment of the present invention will be described. The insulated vacuum conduit 17 starting at the outlet 14 of the process reactor, guides a vacuum environment through the vacuum conduit. This vacuum line branches off near the exit of the sublimation trap 31. The first path is generated after the valve 33, and the second path is generated after the valve 36. By adding a valve 51 provided at the outlet end of the condenser 32, the condenser 32 can be separated from the first and second paths. By adding the valve 51, only one vacuum pump 37 is required. The operation sequence of the second embodiment is the same as that of the first embodiment, except that the opening and closing of the valve 51 are different. The switching sequence is the same as that of the valve 36. Both are turned on and off at the same time. "With the combination of sensors and feedback, the tool controller can perform the operation sequence of the sublimation cycle, and perform processing of by-products in the first exhaust path, leaving only Manually clean the condensate in the condenser in the second path. The present invention reduces the frequency of this manual cleaning, and can perform this manual cleaning during the silicon nitride deposition process. According to the difference in the design of the sublimation trap 31, the inlet end of the condenser 32 may also be connected to the entrance of the sublimation trap 31 in parallel to perform the functions of the aforementioned design. Although the present invention has been disclosed as above with preferred embodiments, it is not intended to limit the present invention. Any person skilled in the art can make changes and retouching without departing from the spirit and scope of the present invention. The scope of protection shall be determined by the scope of the attached patent application. 11

本紙張尺度適用中國國家標準(CNS ) A4規格(210X 297公釐) (請先閲讀背面之注意事項再填寫本頁)This paper size applies to China National Standard (CNS) A4 (210X 297 mm) (Please read the precautions on the back before filling this page)

Claims (1)

經濟部中央標準局貝工消費合作社印製 六、申請專利範圍 1.一種除去低壓化學氣相沈積裝置之排氣管路中所 保留的已冷凝之副產物的方法,該已冷凝之副產物是由 該低壓化學氣相沈積裝置之反應器内的來源物質和半導 體基板之間的化學反應所產生的氣相物,對於該已冷凝 之副產物的處理及除去包括以下步驟: 將一半導體基板置於製程反應器之一支持物上,以 於其上形成一保護性層; 藉由一來源物質導入裝置將至少一種來源物質導引 入製程反應器中; 由至少一種來源物質以在該半導體基板上形成一保 護性層; 將該製程反應器之化學反應所產生的蒸氣副產物排 出; 提供一第一路徑裝置以排出該蒸氣副產物,該第一 路徑裝置包括一昇華捕捉器以冷凝並儲存一已冷凝的副 產物’並避免該副產物蒸氣回流及損壞第一路徑真空 泵; 提供一第二路徑裝置’其設置於與該第一路徑裝置 平行’該第二路徑包括一分離閥,一冷凝器,和一輔助 真空泵; 提供一兩階段閥,以在完成低壓化學氣相沈積製程 之後將第一和第二路徑與製程反應器分離; 提供一第二分離閥裝置,設置於該第一泵裝置的入 口’以在加熱該昇華捕捉裝置中所保留的已冷凝之副產 12 本紙張尺度適用中國國家標準(CNS > A4規格(210X297公釐) 1^ 7------ (請先閲讀背面之注$項再填寫本頁) 订 經濟部中央標準局貝工消费合作社印製 A8 B8 C8 D8 、申請專利範圍 物固趙時’將該第-果裝置與該昇華捕捉裝置分離;以 及 提供一冷凝器分離閥裝置,設置於該冷凝器的入 口,以在氮化柬成長過程中將該第一路徑昇華捕捉裝置 之出口與該冷凝器裝置分離。 2·如申請專利範圍第丨項所述之方法,其中該昇華 捕捉器的溫度可調整為在氮化物成長過程中冷凝蒸氣副 產物。 3. 如申請專利範圍第1項所述之方法,其中該昇華 捕捉器的溫度可調整為在氮化物成長過程完成之後蒸 發已冷凝之副產物以將其由該昇華捕捉器中除去。 、 4. 如申請專利範圍第1項所述之方法,其中該昇華 捕捉器的溫度是以一熱電隅來偵測,並且以一溫度控制 器來控制以與一程式化的工具控制器一致。 5. 如申請專利範圍第1項所述之方法,藉由加熱該 已冷凝之副產物到一蒸發溫度,以及藉由在產品裝卸時 將該已蒸發之副產物排到該該第二路徑冷凝器中,以從 該昇華捕捉器中除去已冷凝之副產物,藉此,需要較少 的維護,增加設備利用度,並且增進產品良率。 6. 如申請專利範圍第1項所述之方法,其中來源氣 體為二氣矽烷和氨。 7. 如申請專利範圍第6項所述之方法,其中清潔氣 體為氮氣。 8. 如申請專利範圍第7項所述之方法,其中第二路 本紙張尺度適用申國國家揉準(CNS ) A4規格(210X297公釐) (請先閲讀背面之注$項再填寫本頁) 訂 -f A8 B8 C8 D8 經濟部中央梯準局貞工消費合作社印製 、申請專利範圍 徑冷凝器包括一吸附劑,其為擇自來源氣體的成份。 9.一種除去低壓化學氣相沈積裝置之排氣管路中所 保留的已冷凝之副產物的裝置,該已冷凝之副產物是由 該低壓化學氣相沈積裝置之反應器内的來源物質和半導 體基板之間的化學反應所產生的氣相物,對於該已冷凝 之副產物的處理及除去的裝置包括: 一製程反應器’以進行一低壓化學氣相成長製程, 以在一半導體基板上形成一保護性層; 排氣裝置,以將該製程反應器之化學反應所產生 的蒸氣副產物排出; 一第一路徑裝置,以排出該蒸氣副產物,該第一路 徑裝置包括一昇華捕捉器以冷凝並儲存一已冷凝的副產 物,並避免該副產物蒸氣回流及損壞第一路徑真空泵; 一第二路徑裝置,其設置於與該第一路徑裝置平 行,該第二路徑包括一分離閥,一冷凝器,和一輔助真 空泵; 一兩階段閥,以在完成低壓化學氣相沈積製程之後 將第一和第二路徑與製程反應器分離; 一第二分離閥裝置’設置於該第一泵裝置的入口, 以在加熱該昇華捕捉裝置中所保留的已冷凝之副產物固 體時,將該第一泵裝置與該昇華捕捉裝置分離;以及 一冷凝器分離閥裝置,設置於該冷凝器的入口,以 在氮化物成長過程中將該第一路徑昇華捕捉裝置之出口 與該冷凝器裝置分離。 (請先聞讀背面之注意事項再填寫本頁) n^n H · 訂 _ ! 14 A8 B8 C8 D8 六 «濟部中夹橾率局貝工消费合作社印装 申請專利範圍 10. 如申請專利範圍第9項所述之裝置,其中該昇華 捕捉器的恤度可調整為在氮化物成長過程中冷凝蒸氣副 產物。 …w 11. 如申請專利範圍第9項所述之裝置,其中該昇華 捕捉器的溫度可調整為在氮化物成長過程完成之後蒸 發已冷凝之副產物以將其由該昇華捕捉器中除去。 12. 如申請專利範圍第9項所述之裝置,其中該昇華 捕捉器的溫度是以一熱電隅來偵測,並且以一溫度控制 器來控制以與一程式化的工具控制器一致。 13. 如申請專利範圍第9項所述之裝置,其中藉由加 熱所有的泵線路以及真空元件,包括在第一路徑中的 閥’可降低固體的生成。 14. 如申請專利範圍第9項所述之裝置,其十可選擇 性地藉由設置在該第二路徑冷凝器之出口處的一分離閥 的加入,而除去該第二路徑真空泵,並且將該分離閥之 出口與鄰近該第一路徑真空泵之入口處的該第一路徑連 接。 15. 如申請專利範圍第9項所述之裝置,藉由加熱該 已冷凝之副產物到一蒸發溫度,以及藉由在產品裝卸時 將該已蒸發之副產物排到該該第二路徑冷凝器中,以從 該昇華捕捉器中除去已冷凝之副產物,藉此,需要較少 的維護,增加設備利用度,並且增進產品良率。 15 本紙張尺度逋用中國國家標準(CNS ) A4規格(210X297公釐) τ . 缴------π------線...t (請先聞讀背面之注意事項再填寫本頁)Printed by the Central Standards Bureau of the Ministry of Economic Affairs, Shellfish Consumer Cooperatives 6. Scope of patent application 1. A method for removing condensed by-products retained in the exhaust pipeline of a low-pressure chemical vapor deposition device. The condensed by-products are The processing and removal of the condensed by-products of the vapor phase produced by the chemical reaction between the source substance in the reactor of the low-pressure chemical vapor deposition device and the semiconductor substrate includes the following steps: placing a semiconductor substrate A protective layer is formed on a support of the process reactor; at least one source substance is introduced into the process reactor by a source substance introduction device; and the at least one source substance is used to form the semiconductor substrate on the semiconductor substrate. A protective layer is formed thereon; the vapor by-products generated by the chemical reaction of the process reactor are discharged; a first path device is provided to discharge the vapor by-products, and the first path device includes a sublimation trap to condense and store A condensed by-product 'and prevent the by-product vapor from flowing back and damaging the first path vacuum pump; providing a first The path device is 'parallel to the first path device'. The second path includes a separation valve, a condenser, and an auxiliary vacuum pump. A two-stage valve is provided to complete the first step after the low-pressure chemical vapor deposition process is completed. The first and second paths are separated from the process reactor; a second separation valve device is provided, which is provided at the inlet of the first pump device to heat the condensed by-products retained in the sublimation capture device 12 paper sizes applicable China National Standard (CNS > A4 specification (210X297 mm) 1 ^ 7 ------ (Please read the note on the back before filling in this page) Order the A8 printed by the Bayer Consumer Cooperative of the Central Standards Bureau of the Ministry of Economic Affairs B8 C8 D8, the patent application scope Gu Shi Zhao 'to separate the first fruit device from the sublimation capture device; and to provide a condenser separation valve device, which is set at the inlet of the condenser, in the process of growth Separate the outlet of the sublimation capture device from the first path from the condenser device. 2. The method as described in item 丨 of the patent application range, wherein the temperature of the sublimation capture device can be adjusted to Condensate vapor by-products during nitride growth. 3. The method as described in item 1 of the patent application scope, wherein the temperature of the sublimation trap can be adjusted to evaporate the condensed by-products after the nitride growth process is completed to remove them. Removed from the sublimation trap. 4. The method as described in item 1 of the scope of patent application, wherein the temperature of the sublimation trap is detected by a thermoelectric chirp, and controlled by a temperature controller to communicate with a The programmed tool controller is consistent. 5. As described in item 1 of the scope of the patent application, by heating the condensed by-product to an evaporation temperature, and by heating the condensed by-product during product loading and unloading. Drain into the second path condenser to remove condensed by-products from the sublimation trap, thereby requiring less maintenance, increasing equipment availability, and improving product yield. 6. The method according to item 1 of the scope of patent application, wherein the source gases are digas silane and ammonia. 7. The method according to item 6 of the patent application, wherein the cleaning gas is nitrogen. 8. The method described in item 7 of the scope of the patent application, in which the second paper size is applied to the application of the national standard of China (CNS) A4 (210X297 mm) (please read the note on the back before filling in this page) ) Order -f A8 B8 C8 D8 Printed and patented by the Central Industrial Standards Bureau of the Ministry of Economic Affairs, Zhengong Consumer Cooperative. The condenser includes an adsorbent, which is a component selected from the source gas. 9. A device for removing condensed by-products retained in an exhaust line of a low-pressure chemical vapor deposition device, the condensed by-products being a source substance and The gas phase produced by the chemical reaction between the semiconductor substrates. The device for processing and removing the condensed by-products includes: a process reactor to perform a low pressure chemical vapor phase growth process to a semiconductor substrate; Forming a protective layer; an exhaust device to exhaust vapor by-products produced by the chemical reaction of the process reactor; a first path device to exhaust the vapor by-products, the first path device including a sublimation trap A condensed by-product is condensed and stored, and the by-product vapor is prevented from flowing back and damaging the vacuum pump of the first path; a second path device is arranged in parallel with the first path device, and the second path includes a separation valve , A condenser, and an auxiliary vacuum pump; a two-stage valve to connect the first and second paths with the Process reactor separation; a second separation valve device 'is provided at the inlet of the first pump device to heat the condensed by-product solids retained in the sublimation capture device, the first pump device and the sublimation The capture device is separated; and a condenser separation valve device is provided at the inlet of the condenser to separate the outlet of the first path sublimation capture device from the condenser device during nitride growth. (Please read the precautions on the reverse side before filling out this page) n ^ n H · Order _! 14 A8 B8 C8 D8 Six «The Ministry of Economic Affairs of the Chinese Ministry of Economy and Trade Coordination Bureau Shellfish Consumer Cooperatives printed the scope of patent application 10. If you apply for a patent The device of range 9 wherein the shirt of the sublimation trap can be adjusted to condense vapor by-products during nitride growth. ... w 11. The device according to item 9 of the scope of the patent application, wherein the temperature of the sublimation trap can be adjusted to evaporate the condensed by-products after the nitride growth process is completed to remove it from the sublimation trap. 12. The device according to item 9 of the scope of patent application, wherein the temperature of the sublimation trap is detected by a thermoelectric device and controlled by a temperature controller to be consistent with a stylized tool controller. 13. The device according to item 9 of the scope of the patent application, wherein the generation of solids is reduced by heating all pump lines and vacuum elements, including valves' in the first path. 14. The device described in item 9 of the scope of patent application, which can optionally remove the second-path vacuum pump by adding a separation valve provided at the outlet of the condenser of the second-path, and An outlet of the separation valve is connected to the first path adjacent to an inlet of the first path vacuum pump. 15. The device as described in item 9 of the scope of patent application, by heating the condensed by-product to an evaporation temperature, and by condensing the evaporated by-product to the second path during product loading and unloading To remove condensed by-products from the sublimation trap, thereby requiring less maintenance, increasing equipment availability, and improving product yield. 15 This paper uses the Chinese National Standard (CNS) A4 size (210X297 mm) τ. Pay ------ π ------ line ... t (Please read the precautions on the back before reading (Fill in this page)
TW87107495A 1998-05-14 1998-05-14 The method and device of removing the cooling by-product remained in the exhaust pipeline for the low pressure chemical vapor deposition (LPCVD) TW399238B (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI771191B (en) * 2021-06-24 2022-07-11 南韓商未來寶股份有限公司 Apparatus for trapping of reaction by-product for etching process

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI771191B (en) * 2021-06-24 2022-07-11 南韓商未來寶股份有限公司 Apparatus for trapping of reaction by-product for etching process

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