TW398154B - Electron beam profile measurement device for CRT - Google Patents

Abstract

This is an electron beam profile measurement device, which could reduce the amount of error due to the repeated measurement taken at different CRT display panel's measurement positions. In an electron beam profile measurement device for CRT, the image signal acquired from picturing test patterns is used to calculate the electron beam profile along the horizontal or vertical direction, wherein an optical device is installed in front of a photographing apparatus constructed with a CCD line sensor and the photographing range of the CRT display screen of the photographing apparatus is magnified optically at least along the vertical direction by the device. Since each pixel of the photographing element individually receives the integrated light emitted from a fluorescent substance within the magnified photographing range, averaged image signals for the line width of the test pattern are obtained independently of the photographed position even if a non-uniform distribution in the vertical direction exists. Therefore, it can reduce the error of repeated testing.

Description

V. Description of the invention (1), "Technical Field" The present invention relates to an electron beam profile measuring device for measuring a cathode ray tube (CRT). The vibration set is displayed on the cathode ray tube (cr τ). Dot pattern or intersection pattern is displayed on the surface, and the test pattern is photographed with a photographing device to obtain image data. The image data is used to measure the luminance distribution in the direction of the cross line pattern (Line

Profile) or dot brightness distribution (Dot profHe). "Background technology" In the past, "as a method for quantitatively and accurately evaluating the focusing performance of a color CRT", an electron beam was spot-irradiated on the display surface of the color CRT to obtain the brightness distribution of the spot or the electron beam was continuously irradiated. A method for measuring the brightness distribution in the line direction on the display of a color CRT. Because the degree distribution of the point or line direction is proportional to the energy distribution in the irradiated electron beam that generates the point or line, the brightness distribution of the measurement point is equivalent to measuring the 3-dimensional spatial distribution profile of the electron beam, and the brightness distribution of the line direction. The two-dimensional spatial distribution profile of the valence and direction of the measured electron beam. This method of measuring the profile of an electron beam basically irradiates an electron beam with a certain amount of energy onto a phosphor and converts it into light energy. Photographic devices such as a Charge Coupled Device are used to convert this light energy into photoelectricity. The electrical energy (image data) is obtained by transformation, and the energy distribution of the electron beam is quantitatively measured using the image data obtained by the photographing device. However, the fluorescent systems of the R, G, and B primary colors of the baffle-type color cathode ray tube are discretely and regularly coated on the display surface, and because the baffle-type transmits only a part of the electron beam to make a predetermined phosphor emit light, Electron beam system

V. Description of the invention (2) The spot light or line type is irradiated on a specific position of the CRT display surface, and even if this fluorescent phosphor is used in a photographic device, a large amount required for measuring the profile of the electron beam is obtained first. Electricity =: brightness data of a plurality of positions). Electron beam cross section Therefore, in the known technology, phosphors are placed at the positions of the electrons and made to emit light. These luminous phosphors are used to quantitatively determine the profile of the electron beams using image data obtained from photographic data. For example, in the US patent No. 44〇8163 (published on October 4th) discloses a kind of electron beam profile measuring device. It talks about changing the irradiation position of the electron beam for a specific phosphor and changing the irradiation position. Photograph the light-emitting phosphor at the position: Use the phases of a plurality of phosphors at each irradiation position to calculate the outline of the electron beam. ^ ^ ^ ^ ^ ^ ^ ^ The position of Yinyou and the founding party In addition, in Japanese Patent Heisei 8_20433 (published on August 9, 1996), an electron beam profile measuring device is disclosed. A specific plurality of phosphors are placed to cause the electron beams to pass through. The irradiation position is changed up and down, and the left ^ changes slightly and a plurality of pictures are radiated at each irradiation position: the phase of the plurality of glorious bodies at each irradiation position is used to calculate the profile of the electron beam. However, for example, when measuring the profile of the vertical line, the electron beam is irradiated on the display surface of the color CRT_ longitudinally at a certain grating interval and repeatedly displayed in the longitudinal direction. The fine distribution is somewhat uneven. Strictly speaking, the vertical line width displayed on the display surface of a color CRT has a convex-concave distribution. For this reason, photographic elements such as line sensors are on the line. V. Description of the invention (3) If there is insufficient photographic range in the direction of __, the measurement result of the contour will not be obtained, 'because the vertical measurement position is different, and Distribution results are inaccurate). When the relative position relationship causes the range between the line pattern 2 ^ = 70 pieces and the phosphor, the measurement result of the insufficient shooting profile due to the projection onto the photographing element # is uneven. As = will be different, it will also cause unevenness of the reel, and the sense sample cannot be accurately pinched on the fruit. In the color CRT process, the test used in the white and blue firs is always used for the test. The display surface of the color CRT observes the vertical line of the cross pattern or the white display of the sweep line, for example, using eye distance. However, observation with the eyes; the display performance of the focus color CRT of Jie Cai⑽T is also used qualitatively, direct evaluation of the eyes will cause the difference in evaluation results, 彳, but not by the evaluator (quantitative evaluation) . The recording order is evaluated stably and objectively. In addition, the known electron beam profile measurement and objectively evaluate the display performance of the color CRT. If the device mouth can be quantified, the range of the process can be overcome. The advantages of a reliable focus adjustment step for color CRTs. Although the above-mentioned known electron beam profile is used to evaluate the display performance of a CRT, it is not expected that the results of objective merging will be different from the results evaluated by a measuring device. Observation evaluation is actually strictly speaking, even if the vertical line width is produced :::: Thousand average value for observation, I hope that the electron beam wheel ^ will also change the average line width along the vertical line direction, try to be as clear as possible with the eye Explanation (4) Result: This idea is the same when measuring the profile of the horizontal line. In order to solve this problem, you can consider the skin t_image sensor to change the photo pattern A line shadow along the line direction into an area. Yes, using the area sensor will make the data :: Wai, the bigger way. However, it takes a long time to perform high-speed column line contour calculation processing. It also increases the price of the device. Therefore, taking into account the highest possible measurement, the author writes the information necessary for the profile measurement. _ 2 When the sensor is used for the measurement, the line direction is not enough. _ = ° f However, the measurement error described above is transmitted using a wire. Photon Qianwei, will be introduced from the measurement position, because the above-mentioned electron beam wheelhouse mother color component (R, G, B color is eight) is placed on the outline of the color CRT, and the white test pattern visual% Measure the electron beam wheel of the body immediately and apply it to the visual evaluation based on white = low, which is difficult to be the same. The points shown in white are the same as the white outline, and the white electron beam profile is not evaluated visually; Two == and low, it is more difficult to apply it to the correlation between 隹 For more correlation, when focusing, R, G, ^, color distance H Yanchen 'Figure 40 (a) is the intention, Figure 4 0 (b ) d knife nt electron beam outline color (B) color component movement-0 becomes movement + 0.2mm, the blue electron beam outline diagram. Pw: The outline of each color component of B and white, green, and blue electron beams. Γ g and b are white, red, and five. Explanation of the invention (5) This is the case, and the present invention. Mingxi B quickly measures CRT f * + φ ^ # from. + Λ, which is to provide a stable, High. The in-profile CRT electron beam profile measurement method and its equipment are as follows: ΐ 詈 a delete electron beam profile measurement method and its equipment are roughly the same; r when the calculation and visual inspection pattern display color visual plane; It # 之Correlation between the evaluation result at the point or degree distribution (contour) and the visual result. · "Summary of Invention"

Q in d invention relates to a CRT electron beam profile determination method, which includes a description of a test pattern on a different surface f, using a photographing device to make it true; # 1 the image signal obtained by pattern photography to calculate the above test Photographing of the pattern ^ 1 The special purpose is that the circumference of the shirt on the CRT display surface of the photographing device is optically enlarged at least in the vertical direction. : Moreover, the present invention also relates to a CRT electron beam profile measurement device including a display control device, which displays the measured and test patterns on the CRT display surface; a photographing device is provided on the CRT display surface " A mechanism photographs the above-mentioned test pattern; an optical device is arranged in front of the photographing device, the mechanism optically expands the above-mentioned CRT display of the photographing device = a shirt range at least in a vertical direction; and a computing device, The test pattern is photographed to obtain an image, and the image signal is used to calculate the brightness distribution of the test pattern in the horizontal or vertical direction. μ According to the present invention, wherein the photographing device photographs the above-mentioned CRT display surface: the periphery is optically enlarged at least in the vertical direction, a display control device, which makes the test pattern displayed on the CRT display surface according to different light emitting positions

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The profile of the electron beam in the setting operation is approximately the same, which can reduce repeated measurement errors. The present invention also relates to a color CR τ electron beam profile measuring method, which is characterized in that a predetermined test pattern for a predetermined mixed color formed by light emission from a light emitting body of at least two colors is displayed on a color CRT display surface, and has phase visibility characteristics. A photographing device photographs the test pattern, and uses the photographing device to obtain a color component signal constituting a mixed color for each color component. The luminance distribution of the test pattern is then combined, and the luminance distribution is synthesized to calculate the test pattern display. Color brightness distribution. The invention also relates to a color CRT electron beam profile measuring device. It is characterized by including a display control device that displays at least a predetermined test pattern on a color 3RT display surface that is formed by the two colors of phosphors to form a predetermined mixed color; a photographing device is provided in a color crt display face-to-face 'The mechanism photographs the test pattern with a photographing device having a relative visibility characteristic; the first computing device' This mechanism photographs the test pattern with the photographing device to obtain a color component letter constituting a mixed color ^ 'Based on the color component signal Calculate the brightness distribution of the test pattern in the horizontal or vertical direction for each color component; a second computing device that uses the first computing device to compute the brightness distribution for each color component, and then synthesize the exemption distribution The brightness distribution of the test pattern display color is obtained. Further, the display color of the above-mentioned color CRT is white. According to the present invention, since a photographing device having a relative visibility characteristic is used for the above-mentioned test pattern photography, the luminance distribution of the test pattern is calculated for each color component based on the color component signals constituting the mixed color, and then the luminance distribution is further calculated.

V. Description of Invention (7)

Mouth Seung-yun differentiates the degree of TF color from the test pattern obtained by the test, and obtains a high correlation with the visual evaluation result. The measurement results are reduced. The unevenness of the measurement result caused by the qualitative visual evaluation. Objectively evaluates the color. CRT focus performance. So be able to. And it is possible to quantify and especially because the test pattern display color is white. Convergence is possible with the conventional visual evaluation of the white test pattern. Quantitative evaluation of effective focusing performance "Invention Example" Combined with the attached drawings, the present invention is about CRT mines; * ± The device will be described in detail. Electron beam profile determination The present invention relates to a CRT electron beam contour measurement device for measuring the shape of an electron beam on a CRT fluorescent screen (the electron beam is broken, and the beam strikes. The distribution of the moon and the moon) δ brother.% -1. Example of the W 疋 principle. There are two well-known methods for measuring the profile of an electron beam. A vertical or horizontal line displayed on the CRT fluorescent screen is along its width: the electron's profile (the energy of the electron beam) The two-dimensional measurement of the degree of distribution of the two-dimensional vacancies displayed on the CRT screen by the three-dimensional phylogeny measures two measurement methods, the latter measurement is the electronic method. The measurement of the fruit is equivalent to the measurement of the CRT glory The outline of the WV shot on the screen itself, so the latter is called the electron beam, and the line profile of the beam itself is measured to show the difference. However, the second one is called the beam shape of the electron beam on the c screen The present invention relates to this common measurement method. In the present invention,

Page 10 V. Description of the invention (8) For the sake of convenience, the former method of measuring the line contour is described as an example. Result ia ΐ :: In the description, a distinguishes between the two methods of measurement. The test data will require Hr (red), G (green), and β (blue) colors, according to the standard q (q = r, g, b). . In particular, "King said that when using various color components, the feet are root green: 1 vertical = system, barrier, ACR: the display surface is horizontally spaced to show" the 3 series C () color light-emitting state diagram, the same figure ⑴ ". 1 = 11 ^, the redundancy distribution of \ ~ is unintentional II i) The ic mind will be Λ graph ⑴ each _ state diagram:…. After the conversion, the CRT of the green (G) outline Lg is calculated:-Fig. 2) The JV vertical line ... The ellipse within the frame is irradiated on the color f-beam. The "Feng rectangular band is green") fluorescent phosphor Fg.) Shows the "solid phosphor m-light portion" from the left. In the same figure (b) and (c), the adjacent line of the f-line shows that the color component is actually a line wheel gallery, and the line wheel temple 2 ^: = color component line contour. In addition, the fluorescent bodies 卩 卩., '疋 出 ,, and the affinity (G) _⑴ from the left L = body' vertical line Lng (〇 (i = 1, 2 ^ body /

Spacer of Fg (j)) = k (k is non-integer) n (interval 〇 Rongguang body color CRT display surface. In this way, the size of the private grating in the color can make each vertical line Lng⑴ by the phosphor F According to the setting of the interval ", the precursor Fg (1, k) is formed in the horizontal direction

The vertical bars look different. A check pattern consisting of a reversed complex vertical line Lng (i), for example, a camera with a CCD line sensor is used to take an image only once, as shown in (b), and each vertical line Lng ( The phosphors included in i) μ γ u), the relative positions in the horizontal direction (set the # Λ and the luminance distribution in the vertical line Lng (i), as shown in (c), The line = composition of the redundancy distribution can calculate the vertical line guide g of the green (G) color component. That is, the phosphor from the vertical line Lng (1) ^^ ㈠, 丄) ~ ^ (1 3) The obtained luminance distribution, the phosphor from the vertical line Lng (2). . ,) = Brightness distribution obtained from Fg (2,3), brightness distribution obtained from vertical line Lng (3) i phosphor '1) ~ Fg (3,3), coordinate position set along the corresponding vertical line Synthesize (ie press FgU, 1), Fg (2,1), Fg (3,; m ;, Fga, 2 ″, Fg (3,2), Fg (1,3), Fg (2, S) Sequentially synthesizes the degree distribution). A vertical line profile Lg of the G color component can be obtained. f ”巴 风 刀 Also, when using the barrier-type CRT display surface to measure the profile of the horizontal line, as shown in FIG. 2 ', the electron beam is continuously scanned in the horizontal direction to obtain the horizontal line _⑴, two; # / Hi. As shown in Figure 3, because the line sensor imaging surface A is both: 5 lines Lllg (1), Lng (2), Lng (3) are taken vertically. To this end, each horizontal line Lng (1), u (2) ...... Each phosphor Fg (l) Fg (i) Fsm is set, it is not necessary to measure as described above 2: Second, in order to display the outline of the vertical line at any position of J 疋, consider the horizontal line in the line, the description of the invention (10 ) Pattern. FIG. 4 is a block diagram of a color c R τ line μ &, B, + line profile measurement setting portion. 3, the signal generator 4 and the data reading control unit 2, the CCD camera The signal generator 4 and the measurement control control unit # 5 are configured, in which the camera 3 is connected to the reading control unit 2. ^ θ. _The knife is connected to the data 5 through a connection line (not shown). It is accessible: Data: Take the control part 2 and the measurement control part as the color CRT of the object to be measured. The production part 2 in the wire wheel temple measuring device. connection. The unconnected cable and data reading control Yu CCD camera 3 is a detection device that detects the full ArDTgs _ and emits light. In the color CRT display, it is the detection device for the luminous brightness of the fluorescent precursor of Nine Earth due to the electron beam irradiation. . ⑽Camera 3 (shown in Figure 8) is composed of a photographic lens, semi-reflective sensors 12A, 12B, and two semi-cylindrical lenses 13A, 13B. @In the optical system not shown in the figure / 1, there are provided a line sensor for measuring the longitudinal line contour, a sensor 1 A and a CC for measuring the horizontal line contour]) line sensor 丨 2B. Moreover, as the imaging element of the CCD camera 3, not only a 7L CCD-type solid-state imaging element but also a MOS-type solid-state imaging element can be used. The CCD line sensor 12A is set so that its axis direction is parallel to the horizontal direction of the display surface of the color CRT6 '. The CCD line sensor 12B is set so that its axis direction is parallel to the color CRT6, but not parallel to the longitudinal direction. Thus, the CCD camera 3 can appropriately control the exposure speed by controlling the charge storage time of the CCD line sensors 12A'12B. The CCD line sensors 12A, 12B, which are imaging elements, can also be replaced by CCD area sensors. If using a CCD area sensor, apply the above measurement

Page 13 V. Description of the invention (11) Fine: the advantages of measuring the beam profile of the electron beam if. But, cry: 疋 The beam profile of the electron beam requires high-density area sensing. Too much? In order to obtain the given area sensor, it is more difficult to manufacture = two. ^ 'The horizontal / vertical pixels mean that the area sensors of the high-resolution wide-area photography range of the photographic surface will be as many as 4000 × 4000 = 16 million. It is technically difficult to get these two :: degree CCD area sensors. Therefore, if the main objective is to measure corridors, it is technically advantageous to use line sensors. "In Fig. 8, the photographic lens 10 images 12 people using a CCD line sensor and 12B to form the image G of the test pattern of the CRT6 display surface (this figure is a cross-line pattern). The half mirror u separates the light image transmitted through the photographing lens 10 into two parts, one of which is transmitted through the CCD line sensor 12A, and the other is reflected to the CCD line sensor i2B. The half mirror 11 is appropriately arranged behind the optical axis of the photographing lens 10, and then the UA is appropriately arranged behind it. The CCD line sensors are appropriately arranged on the half mirror 11T. The semi-cylindrical lenses 13A and 13B respectively transmit the CCD line. The vertical direction of the line 12A, ί is visually expanded (this direction is called ^ fang 1 to 2B). As shown in FIG. 9, if the photographing range A of the CCD line sensors 12A and 12B on the display surface of the color CRT6 is L (length direction) x ψ (wide production direction), the photographing range A of the CCD line sensors 12A and 12B is visually ^ The skin is enlarged into a photographic range A — with a width (> W). ^ The reason why the photographic range A of the CCD line sensors 1 2 A and 1 2B is optically enlarged only in the width direction is because if the photographic range ^

I. Description of the invention (12) The width direction is narrow, and the measurement position of the line contour along the line direction will be different because of different measurement positions. This is to avoid this phenomenon. As shown in FIG. 1Q, on the display surface of the porous barrier type CRT, the complex electric fBm is irradiated at a predetermined interval in the horizontal direction, discretely and in the vertical direction, and is irradiated at a scanning interval Pv to form a monochromatic light vertical Line Ln (vertical line formed by the electron beams Bm arranged in an overlapping manner). Since the scanning interval of the electron beam Bm in the T ++ direction is only 1 ^, the vertical line η of the color CRT display surface is strictly 3, and the convex-concave distribution will be generated in the line width direction. Therefore, (as shown by jA), the imaging range a of the CCD line sensor 12A is set to a narrow line width at position 1 (approximately in the middle of the overlapping portion of the electron beam ^): The brightness distribution of F⑴ ~ F (3) π μ ~ μ (, and (as shown in Figure (B)) when the CCD line sensor 12A is photographed, and the area A is not placed at the position 2 with a wider line width (in the middle of the electron beam ^). The brightness distributions c2 (i) ~ of the luminous glare bodies F (1) to F (3) calculated by the same are the same. 13 Therefore, the final line contour measurement results PI and P2 obtained according to the above measuring principle are also different. 1 m Medium 'is generally adjusting the focal length while visually observing the father's crosshair pattern on the crt display surface. At this time, it can only be averaged when it is convex and concave, which is t 2' ^, and You Kuan produces M Xin total. # M i AI Γ 饧 Its line contour, so the CRT focal length adjustment is evaluated based on the average line contour result. In the CRT focal length adjustment, the measurement result and visual evaluation result of the line contour measuring device are introduced. * At the measurement position The difference results in the measurement of line rotation, and the results: J difference is not both

Therefore, in this embodiment, 'or the CCD line sensor is set to' KB

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The light receiving range W of each pixel is optically expanded to be at least larger than the light receiving range W of the electron beam Bm in the vertical scanning interval Pv, or the light receiving range W is extended / expanded between the phosphors included in the vertical line. The light receiving range W ′ with a large interval is such that the light receiving amount of each pixel is the sum of the light emitting amounts of the phosphors included in the light receiving range. Therefore, 'because the photographic range of the CCD line sensors 12A and 12B is visually enlarged along its width direction, even for the vertical line pattern, the photographing positions of the CCD line sensors 12A and 12B are arbitrarily set on the CRT display surface, and at each photographing position The obtained vertical contours are almost the same, and the results of repeated measurements tend to be consistent

(Small error) 'can obtain a measurement result approximately the same as the result of visual evaluation. When the light receiving range W of each pixel of the CCD line sensors 12A and 12B is enlarged to a light receiving range W larger than the scanning interval pv of the electron beam Bm in the vertical direction, as shown in FIG. 11, even with respect to the vertical line LnCCD line sensor 1 2 The shooting range of A is at different positions. The shooting range of the line direction roughly contains the phosphors contained in an electron beam, and each pixel of the CCD line sensor 12A receives the sum of the luminescence of these phosphors. Therefore, as shown in Figure (A),

The brightness distribution Cl (l) ~ Cl (3) of the light-emitting phosphors F (l) to F (3) calculated by setting the photographing range A 'of the CCD line sensor 12A to the position where the line width is narrow} is as shown in the figure As shown in (B), the luminance distributions C2 (l) to C2 (3) of the light-emitting phosphors F (1) to F (3) calculated by setting the photographing range A of the CCD line sensor 12A to position 2 having a wide line width ) Are almost the same, and the line profile measurement results PI and P2 are obtained substantially the same. Furthermore, since the images of the CCD line sensors 12A and 12B are optically enlarged

Page 16 V. Description of the invention (14) In the C range, the amount of light received by each pixel becomes larger, so it also covers the S / N ratio of the output signal of each image. , ~ Again. In addition, for a porous barrier-type color CRT, the above-mentioned determination of the longitudinal line contour is based on the principle of horizontal t tj, and the output signal of the adaptor 1 2B can be directly divided according to the convex and concave of the CCD line transmission line width. | w ^ The continuous line profile carried out, omitting the semi-circle sound is smaller than that in the longitudinal and line contour measurements, so the line contour can be determined ^: 2 in the 'considering that it is suitable for vertical and horizontal line wheel points and 13B in other forms. In addition, the Λ line sensor 1 has a semi-cylindrical lens. The horizontal line profile is expanded optically due to the Λ barrier # -type color CRT, which has improved the number of ° green ridges produced by each image. The line sensor 12 input and input line wheel gallery image signals are summed and averaged, and can be calculated to have more directions: line / sensor m, i2B line width profile. The color picture tube 61 is used to measure the color of the reel with high resolution and accuracy. Figure 4 'Color CRT6 as the measurement target of the color CRT6 series electromagnetic bias type color image frequency dry H image color picture tube 61, to control the color picture tube range control circuit 62 and a second drive control circuit 63 that controls the color picture tube display scan size). V. Description of the invention (15) The color picture tube 61 (as shown in Fig. 12) on the fluorescent screen) is regularly plated with strip-shaped red back phosphors Fr, Fg, and FB. * Gw 1 In addition, the (G) blue (B) surface R11 and Cheng Rongxian firstly, in addition, the picture tube fluorescent well surface 611 is located at a certain interval from the other side and is also referred to as a lattice-shaped porous 卩 1 ϊ 612. Returning to FIG. 4, corresponding to R in the electronic grabbing installation portion 613, G = 3 electronic grabbers 614 at the end of the electronic grabbing installation portion 61; ^ color turn coil 6 1 5. j '「Example》 • Another partial =, the control circuit 62 controls the shape of the electron beam Bm corresponding to each color of B emitted by the electron grab 614 (the cross-sectional shape of the electron beam and the electron energy density in this section f) Distribution). The first drive control circuit 62i is driven by the control signal output by the read-in control device 2 (driven by the electron gun 614. Control ^ The second drive control circuit 63. Controls the electron beam Bm on the fluorescent surface Raster scan ^ The second drive control circuit 63 of its scanning range (irradiation range) controls the display position of the electron beam Bm emitted by the electron grab 614 based on the raster size control signal (biased control signal) output by the read-in control device 2 2. The data reading control unit 2 is a control device that controls the reading of data required for measuring the line contour of the inspection pattern, specifically, controls the display of the color CRT6 and the drive control device of the CCD camera 3. As described later In the measurement of the line contour, a compensation coefficient for compensating the luminous efficiency of the phosphor and a grating size for displaying a measurement test pattern must be specified in advance during the measurement. The compensation coefficient is used to compensate for the luminous effect between the phosphors. The difference, raster size setting corresponds to the set of FIG. 1 (A) of the interval [alpha]. Moreover, the setting process is equivalent to the sum of the two lines of a contour compensation process measurement device.

Page 18 V. Description of the invention (16) In addition to controlling the reading of the data necessary for determining the compensation coefficient and the size of the thumb, and the display of the color CRT6 required for reading the data when actually measuring the line contour In addition, the shooting operation of the CD 3 camera 3 for reading data is controlled. The data reading control unit 2 calculates the compensation coefficient and the raster size using the image signal read by the CCD camera 3, and transmits the calculation result to the measurement control unit 5. When the line contour is actually measured, the luminance distribution of the phosphor is calculated for each of the plurality of lines, and the calculation result is transmitted to the measurement control unit 5. Fig. 5 is a block diagram showing the configuration of the data reading control unit 2 of the line profile measuring device. The lean material reading control unit 2 is composed of A / D converter 21, VRAM (Video

Random Access Memory 22, RAM (Random Access Memory) 23, and (Read Only Memory) 24 are composed of a control section 25 composed of a microcomputer, a synchronization signal delay section 26, a vertical synchronization signal detection section 27, and a communication section 28.

The A / D converter 21 is a conversion device that converts the image signal output from the CCD camera 3, the brightness signal read by each pixel of the CCD line sensors 2A, 2β, such as a 10-bit digital signal. AM 2 2 is a memory that stores each pixel that is converted into data signals by A / D 降 f 2 1. VRAM2 2 has the memory capacity of each pixel read by the “CCD” ^ CCD line sensor, 2A, and 2β. ^ Μ 2 4 is a storage area for storing a control program for performing line profile measurement. At the second time, the RAM 23 is a memory area (work area) where the control unit 25 performs calculations on the pixels in the record 2 2 according to the above control program. The control section 25 centrally controls the movement of each part in the data reading control section 2

5. Description of the invention on page 19 (17) In addition to controlling the color, the vertical synchronization of the synchronization signal and the luminous efficiency of the synchronization signal are compensated and irradiated on the phosphor, as described later. The vertical pattern signal is used at the interval Pv to control the volume distribution. The vertical beam Bm irradiates the display of the electron beam Bm illumination CRT6 staggered at the same vertical position of the synchronization signal and reads the pixels of the CCD camera 3 to measure the data exchange of the control unit 5. 5 ί The pattern signal number sent from the signal generator 4 is delayed according to the control time of 25M. Regarding the calculation of the coefficients, since the electron beams of uniform energy must be used as a whole, and then the luminous efficiency between the phosphors must be compared, as described above, for ordinary raster scanning systems that use vertical scanning and straight scanning, the fluorescent surface 611 is used. The display of the full-colored shirt color CRT6 varies due to the vertical energy of the electron beam Bm and the direct scanning interval Pv, and cannot be applied to the entire phosphor with uniform energy. The delay section 26 delays the pattern step signal that all the display surface of the CRT6 emits. By starting raster scanning of each half-sweep scan, raster scanning can be performed, so that the energy variation in the vertical direction can be projected on the entire phosphor. Moreover, in this embodiment, a raster size control signal is output from the data reading control section 2 to the color CRT6 to change the scale of the CRT display surface, as shown in FIG. 6. The signal generator 4 may also be sent to the color m6. ,

The pattern signal delay is used to change the raster size. This method increases the speed of change. In the figure, the OR gate (0R) 7 and the delay circuit 8 are connected in series. The input of the OR gate 7 is input from the signal generator 4 for testing.

The delay circuit 8 outputs a test pattern to CRT6. In addition, the OR circuit 7 ^ other = input terminals feedback the output signal of the input delay circuit 8. Delay circuit 8S

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The delay time ΔT can be changed. For example, the data read control unit 2 can control the delay time ΔΤ. As shown in FIG. 7, the image number 9 of the test pattern of the signal generator 4 is sequentially delayed by the serial circuit of the OR circuit 7 and the delay circuit 8 according to the delay time AT set by the delay circuit 8 and output to the color CRT 6 . ○ Returning to Fig. 5, the vertical synchronization signal detection unit 27 detects a delayed vertical synchronization signal in the pattern signal. This detection signal is used to control the shutter of the CCD camera 3 so that the imaging position of the CCD camera 3 on the CRT display surface is just right when the fluorescent body emits light, and the communication section 28 outputs a control signal for driving and controlling the CC]) Camera 3, color CRT6, and controls the data exchange with the measurement control unit 5. In addition, the signal generator 4 is used to generate a predetermined test pattern signal (cross signal) displayed on the color & CRT6. In order to obtain a predetermined raster scan size on the color crt6, the electron generator of the signal generator 4 series generates a pattern signal by superimposing a predetermined vertical synchronization signal and a horizontal synchronization signal on a shadow signal displaying the content of the pattern. The measurement control unit 5 is composed of a PC microcomputer control unit 51, a CRT device 52, and a keyboard 53. In addition to controlling the operation of the line profile measuring device], it also uses the brightness dividing line calculated by the data reading control unit 2. Contour, the calculation result is displayed on the display 52 as needed. The line profile measuring device is used below to measure the wire wheel hole barrier grid color CRT6 as an example to do the following measurement. "The text is explained as follows. Baixian, the vertical line wheel will be described using the above-mentioned line profile measuring device 1 to calculate the luminous efficiency compensation system of the phosphor F. The line profile measurement procedure (1 number, (2) is displayed by the raster scan.

V. Description of the invention (19) _ Measurement of test patterns and gadolinium caused by changes in drawing size The line contour of R, G, and B color components can be the same =: to determine the line contour. Therefore, in the following description, the 2 2 profile measurement is taken as an example. Bapo line reel First, the calculation of the luminous efficiency compensation coefficient will be explained. The luminous efficiency compensation coefficient compensates for the energy conversion between the phosphors into light ... uneven sentence. When carrying out the vertical line wheel dagger: Since the luminous phosphors contained in each line are not included, it is necessary to compensate the luminous efficiency between the glory bodies. When measuring the profile of the horizontal line, The form is the same, and it is not necessary to compensate the luminous efficiency of each light. Fig. 1 is used as an example for description between the lenticular bodies. For the convenience of explanation, it is assumed that the luminous efficiency in each phosphor Fq (j) is constant. j) between. Let the luminous efficiency of the phosphor "(〗) be Kq (j) 'Compensate the phosphors Fq (2), Fq (3) with the luminous efficiency Kq (1) of the phosphor Fq (1) as the reference ... ... the luminous efficiency Kq (2), Kq (3) ......, then the compensation coefficient of each phosphor Fq (j) (j = 2, 3 .......) is q (j) = Kq⑴ / Kq (j). Since the luminous efficiency Kq (j) of each fluorescent precursor Fq (j) is equivalent to the luminous amount Lq (j) when irradiated with the same energy electron beam Bmq, During the compensation process of the line contour rigid foot device 1, the formula q (j) = Lq (l) / Lq (; j) (j ^ 2 '3' ......) is used to calculate the compensation coefficient 7? Q (j) If the luminous efficiency is not the same in each phosphor Fq (j), a plurality of measurement positions (χ, γ) can be set in each phosphor Fq (j).

Page 22

V. Explanation of the invention (20) The luminous amount Lq (X, γ) calculated from the measurement of the thorium position (X, Y) can be calculated using the formula (X, Y) = Lq (X0, Y0) / Lq (X, Υ).料 (X, Υ). This morning, Lq (χ0, Υ0) is the luminous amount of the reference position of the operation compensation system. '' As mentioned above, even if the pattern signal that makes all of the fluorescent surface 61 丨 emit light is used to control the display of the color CRT6, since the electron beam Bm is scanned along the vertical direction at a grid interval Pv, the energy distribution of the electron beam Bm is along the vertical direction It is impossible to uniformly irradiate an entire electron beam with the electron beam by changing the grating interval Pv. In other words, with regard to raster scanning for CRT display, since the raster scan Pv (> d) is performed with horizontal raster scanning at a raster interval Pv (> d) having a large peak range d of the sub-beam Bm, the longitudinal energy of the electron beam Bm of the raster scan is °

) Shows a pulse wave. U 7 is shown in Figure 13 (3). In this state, the CRT display surface is photographed. The luminance distribution corresponding to the longitudinal energy distribution of the electron beam ^ is streaked. T ('j) cannot be accurately used with such photographic image data The photographic sound for which the compensation coefficient is calculated is the photographic image obtained by photographing the CRT display surface when all 0 colors are illuminated. The same figure (B) is a schematic diagram of the longitudinal energy distribution along the longitudinal scanning. The black part of Figure 13 (A) is a beam of lightning. Beam Bm tracing part (photographed by the peak value of the energy distribution of the electron beam Bm ': image, the oblique line is the valley value of the vertical raster scan: (as shown in Figure i3 (b)), the white part is painted by ^' electricity at the same time There are R and B color phosphors, but the phosphors are not η

P. 23 images. In this embodiment, the calculation processing of the compensation coefficient is moved along the longitudinal raster scan with the auxiliary line as a unit, so that the flower direction is irradiated with the average energy. That is, as shown in FIG. 14 (A) (the precursor body moves along the vertical grid scanning from the second time onwards, the raster scan start position (for example, Pv / 1/10 degree) is gradually moved, as shown in FIG. I 4 (two, the auxiliary line raster scan The maximum energy irradiation can also be obtained everywhere. No, using this vertical raster scanning method, the brightness distribution of the G-color phosphors of all glory G 14 (A) is flat in the vertical direction. This photographic image data can be accurately The compensation coefficient and () knife are calculated. The calculation process of 々 is explained in detail below with reference to the flowchart of FIG. 15. The compensation coefficient color crt! L f ϋ Camera 3 is aligned with the designated position of the CRT display surface and the All colors m are illuminated (# 2). Here, all monochromatic light emission means that all the phosphors of one color component are emitted in the Ur component. = When the phosphors of all colors are illuminated, the electronic grab 614 is directed to G color with a = This amount is strong. The electron beam center scans the entire area of the CRT6 display surface. F. In this case, the irradiation range of the electron beam can also be determined by the imaging range of the CCD. Then, in this state, the CCD camera 3 is used for CRT display surface all glowing shadow image After taking pictures, the image signals constituting this photographed image are sequentially transferred to the shell material reading control section 2 and converted into a 10-digit signal by the A / D converter 2 丨 and stored in the VRAM22 (# 4). 'Output the vertical synchronization from the data reading control unit 2 to the CCD camera. Page 24 V. Description of the invention (22) " ί 吕 号 and horizontal synchronization, though, Α φ y at the moment of the shooting range H electricity: scanning irradiation CCD The image of the camera 3 and the photofield around the yoke yoke is illuminated by the CCD camera 3 '. You can take a picture with the CCD camera 3. From this, you can take a picture like this (Striped makeup and Germany, Figure 17 (A)) Will be sequentially transferred to; material ,: the pixel i constituting this photographic image will reach the master reading control unit 2. Then, the pixel data stored in the VRAM 22 will be replaced with the two ΛΛ λ before, When viewing the pixel data in Figure 3, due to the initial value of RAM23, it is n (, J 2 and 'the original data was transferred to the 23 as it is "# Pixels stored in VRAM 22 (eg Ϊ 2 二 Π ^ ()) The same delay signal f is delayed only by the specified time Δ Tv the auxiliary scanning interval Δρν. " Time ^, which is equivalent to the established in Figure 14; whether the raster scan position movement process has been performed (refer to Figure 14 (C)) and the initial movement process is irradiated with electron beams of the same energy equally. ~ ^^ (ΝΟ)) ^ 4Γ; 4 All luminous images are photographed, and the pixel data of the photograph f 彡 image is stored after moving the M / \ grid / drawing position with the image stored in coffee 3 ^ ^ ^ Λ / Λν; V # 6 ^ RAM23: " ^ ^ Shellfish [well 4, # 6). That is, RAM23 memory

Page 25 5. Description of the invention (23) The pixel data with the largest storage value. Then, the electronic chirped grating is gradually moved at intervals Δ Pv sequentially, and the position is repeatedly performed. Steps # 4 and # 6 (# 4〜 朿 # 垂 10Straight) direction: ^ = Swipe position movement processing to a predetermined number of times (# When the answer of i 0 is Tian S)), the calculation of the compensation coefficient π (j) 2 = the pixel signals (maximum energy electron beam Zhao βΜΜΜ) of the pixel stored in the RAM23 is received. The maximum received light signal corresponding to the amount of luminescence) The compensation of ',' When you batch /., Uy photowell compensation coefficient 7? (J) (# 丨 2), the process ends. The description of the y-plane using the flowchart of FIG. 16 is to perform the following steps to change the raster size. First, align the CCD camera 3 to a predetermined position on the CRT display surface to make all the color of the compensation system age (# 20). This monochromatic light emission process is the same as that for the compensation coefficient calculation. Next, in this display state, the CCD camera 3 is used to photograph the entire CRT display surface adjacent to the photo image (# 2 2), and the phosphor interval / 3 (# 24) is calculated using this photographic image data. In the flowchart of Fig. 16, the calculation of the phosphor spacer is performed again and the breeding data is read again. Because the calculation of the phosphor interval can also be used to compensate the data when the coefficient is 0. For the pixel data stored in the RAM 23 when the calculation of the compensation coefficient is finished, the steps # 20 and # 22 can be omitted. The pixel data read during the calculation process using the compensation coefficient ^ (j) is used to calculate the phosphor interval / 5 as follows. VRAM22 stores all the monochromatic light-emitting shadows as shown in Figure 17 (a).

Page 26

Image pixel data. Regarding this figure, the diagonal lines are equivalent to the pixel data M (1), M (2), ... M (8) are multiplied by the corresponding compensation coefficients respectively; 7 (i), C (2) ... .... 々 (8) to obtain the adjustment signal L (X) for adjusting the value of the light-emitting part shown in the same figure (β). In addition, this signal L (X) is subjected to binary (digital) processing at a specified switching signal value (for example, 4%) to obtain a pulse signal P (X) shown in the same figure (c). This pulse signal P (X) has the same period as the twill part ^ as shown in the figure. Therefore, for example, the interval TAB between AB shown in the same figure (c) is converted into the distance dAB of the photographic surface of the CCD line sensors 12A and 12B, and the optical magnification stone 1 of the photographic lens is used to convert the distance DAB of the CRT display surface. . The interval TAB is converted into the distance dAB system. The address of the pixel data corresponding to points a and β in the VRAM 22 is nA and nB. The pixel interval of the CCD line sensor 12A in the line direction is pH. The formula dAB = (ηβ_ηΑ) · pH calculations. The conversion from distance dAB to distance DAB is performed by the formula DAB = dAB / 0 1. Therefore, the distance D A B uses the addresses n A, η B, and the pixel interval to be ρ η, and is calculated by the formula DAB = (ηΒ-ηΑ) · ΡΗ / PI. Moreover, 'the number of diagonal lines included in the distance DAB is NAB (figure 7 (C) is 7), the phosphor interval / 5 is determined by the formula = DAB / NAB = (nB-nA) · PH / ($ 1 · NAB) operation. Returning to FIG. 16 ′, the monochromatic full emission display of the color CRT6 is then changed to a test pattern (# 2 6) formed by the electron beams being irradiated discretely at three line intervals in the horizontal direction. In this long ’3 lines, the irradiation system is scattered as shown in the figure.

Page 27 Fifth, the description of the invention (25)-Fluorescent 'ί P two fLl1 (1), Ln (2) ......... are three lines (1), F (3) ... … F (2R + 1) (R = 0, ^ &) The result of irradiation at the government office. The vertical line interval α is α = 3, where the center of U (1) and the center of the irradiated phosphor F (j) 钭 @ ^ ti are the fluorescent lights included in each vertical line 1 ^ (i) The needle pattern portions caused by volume light emission are all the same. The CCD image and the test pattern can be displayed on the CRT display surface or in the part of the image capture range. In addition, a line part is displayed with /. As shown in the photo 19 (A), in order to make the diagonal lines caused by the luminescence of the fluorescent precursor included in the vertical line Ln (1), the diagonal lines caused by the luminescence of Europe are adjacent to 8222, and the phosphor included in the line (10). (㈣ ~ # 32 cycle; 7: ie. The scan size included in the scan size in the horizontal direction is adjusted. That is, the scan size in the horizontal direction is adjusted so that the vertical line ^ is the same as the diagonal portion so that it can be changed at will. Fluorescent 5 C 3: : As explained briefly, * The vertical line cross section is included in part of the luminous brightness, as shown in 19, the electron energy density of the light position at the desired position of the line contour, especially in the case of FIG. 18 :: after the evening ::: Illumination position ... Therefore, if there are 3 bodies in each line: / The twill parts included in the line are all the same.

If the coordinates are displayed, it is x j, x f is set to 3 points in the line width direction. Θ), X2 (= 〇) and X3 (= + stone scan G inside ΪΪ; 9 lines of doors can not be separated by the same twill part can be changed arbitrarily ㈣ limit the line between α < 3 does not make the horizontal measurement point IX, description of the invention (26) Increase 9 times to 27 (= 3 X9) points. When the line interval α is limited to α < 3 ys, the display position of the i-th vertical line Ln (i) '3 .......) Change the frontier level by moving the grating size ^ moving M · n) (here, Δdlfa), the unitary measurement point in this line becomes Adm (id) as χι (= 召 d i-1)) 3 d ri ~ l)), X2 (= + △ (! · (i-1)), and χ3, but the number of measurement points increases as the line interval change amount α decreases, and the measurement accuracy increases as the number of measurement points increases And the improvement / factor ", 'determines the number of measurement points corresponding to the predetermined measurement accuracy, and determines the change amount Δ d (= 3 stone __ α) of the line interval α. Now, let ’s set a vertical line The line width dimension is the size that can contain up to 3 phosphors in the line. 'Calculate the line% from the diagonal portions of the η lines that are different from each other. Set the raster size change amount of the test pattern in Figure 16 △ (1 makes \ vertical line Included firefly The oblique portion caused by body luminescence is the same as the oblique portion caused by phosphor luminescence included in the η + _. Two △ d = y5 / η, substituting this into α = Ad will get "= 3, (ll / 3r0. In this embodiment, since η = 9, for example, yS is 270 _, the line interval α becomes reward: body interval = 780 / zm. Β '2 * 89X270 The change in the size of the grating is specifically the second light peach sweep ( ㈣), based on this photographic image as shown in Figure 19⑴

(1) Exemption data C of electrical body in Dnxian line Ln (1.)

Sample the phosphor F when the center of the electron beam is illuminated. V. Brightness data C (27) of the description of the invention (27) (27), Jiang ^ v number θ β ~ ϋ , And then make a comparison between the two. Figure 19 shows the test pattern displayed on the brightness data cf, consistent makeup r 栌 * 夕 Α π 1) and the brightness data C (27) == t. Line — "Xing [11 (10) only shows that all sharp light bodies F (〇) ~ F (28) are emitting light. for. The oblique lines indicate the fluorescent light, the glorious volume, the sound of the sound μ, ρ, οη Ν < Zanxian position (shell center of gravity) is bright

Zr ^ oo n: normalized value of ... The difference between this brightness data C (1) and & is the pixel data corresponding to the light emission position and its bit = compensation detection coefficient; ^ multiplication to compensate the luminous efficiency. The figure here is the "normalized value", but it is not necessary to perform normalization processing when changing the raster size. If the brightness data C (1) and the brightness data c (27) are not consistent (# 30 judgment result is N0) , According to the quantitative change of the raster size, perform the next ° field scan (# 32), photograph the test pattern, again C⑴ and the brightness data cm) (㈣). Below, constantly compare and compare the brightness jitter data C (1) and The brightness data c (27) and the raster size are changed until the brightness data C⑴ and the brightness data C (27) are the same (# 3Q is judged to be half and YES), and the processing is terminated. The principle of line contour measurement is described below. Ending the raster size After changing the processing, the test pattern shown in Figure 19 (A) is displayed on the color CRT6. The test pattern is photographed with the CCD camera 3, and the phosphors ρ ( 1) ~ ρ (26) light emitting bit

V. Description of the invention (28) The brightness data c (1) to c (2 6). Then, the synthetic processing of imitation ^ ⑴ ~ C (26) is played, and the measurement data of the line profile of the luminance data c is calculated. The difference is shown in Fig. 12, and the brightness data c (1) to c (26) of the chi chi sound pledge (" ~ "26" ..., the line is the coordinates of the square of the line width) are exchanged. This processing may be performed in the Shinji Peak 1 Makibei reading control unit 2 or in the measurement control unit 5. The size of the vertical line width is the size that can get 3 phosphors to emit light at maximum. 'Make the brightness data C (h) (h = 0, 1.... 28) every 3 lines correspond to 1 line Ln (i) (i = 1,2, ... 9). If c (i, k) (k = 1, 2, 3) is used to represent the three luminance data corresponding to the vertical line Ln (i), i, k is represented by i = {(h / 3) integer part}, k = (h + l) _3 (i-1) is determined, and the brightness data c (h) shown in FIG. 19 (B) can be converted into the brightness data C (i, k) as shown in FIG. Moreover, if X i 'k is used to represent the X coordinate of the light emission position in a line composed of three luminance data C (i, k) (k = 1, 2, 3) corresponding to the vertical line Ln (i), each X Coordinates Xi, k are χί in the range of ± 20,000, 1 =-; 5 + Δ d · (i -1) 'X i > 2 = + Δ d · (i -1)' Xi > 3 = + yS + Λ d * (il). Here, for example, Ad = 3y3-o:,; (3 = 270 #m, in the case of the example in FIG. 17 (A), a = 78 Oem, / ^ == 30. Therefore, the calculation corresponds to each luminance data in the electron. The X-coordinates Xi, k in the beam cross-section are calculated by drawing the luminance data C (i, k) corresponding to each X-coordinate Xi, k, and the measurement data showing the contour of the line is calculated. Then, the measurement results are displayed in the measurement control unit 5 on the display 5 2.

V. Description of the invention (29) FIG. 21 shows the measurement data of the line contour obtained by not synthesizing the luminance data c (〗, j) to 2) in FIG. ^ Interval decomposition ', whose Y coordinate value is normalized after being standardized, and the above-mentioned test pattern can be displayed as the eight-photograph β area of the CCD camera 3. As the measurement data, only the necessary map machine can be displayed. case. King Trout? In the examples, the measurement of the contour profile of the porous barrier type color CRT line was made. The present invention is also applicable to the measurement of the circular shadow mask type or the slit shadow mask type color gallery. In addition, it can also be applied to the measurement of the profile of a single-color (black-and-white) two-porous barrier-type color CRT vertical line. Since the light-emission positions of the line-width cube light are discretely extracted, only the gratings for the test f The size changes in the horizontal direction, but when measuring the vertical and horizontal line contours of the circular spare mask type or official shadow mask color CRT, the light emitting position of the phosphor is discretely extracted because of the line width direction. It is also necessary to change the raster size of the test pattern for measurement in the horizontal direction and profile measurement in the vertical direction. Therefore, it is assumed that the interval between the phosphors in the horizontal direction is ySX, and the interval between the phosphors in the vertical direction is Y '. The electron beam interval in the horizontal direction is αX, and the electron beam interval in the vertical direction is αΥ. When the profile of the vertical line is measured, αχ becomes α X = η · (1-1 / 3η) · Dimension change of the grating in the horizontal direction is performed, and α Υ becomes α Υ m (1 -1 / 3m βΥ

Performs vertical raster size change processing. Here, η and m are respectively the increase rate of the measurement data during the direction and vertical direction grating size change processing, and the horizontal vertical line profile measurement. For example, the G color electron beam, VL water half a quarter, and Ding Wan direction are divided into three The extraction interval (3/3 X) is irradiated and displayed discretely. When the test pattern from the vertical line is used, the line width of the test pattern is fixed at 3 points, and the measurement point is increased to 27 points by changing the size of the grating. , The increase rate of the measured data becomes η (η 二 27/3 = 9), as shown in FIG. 20, the horizontal electrical interval α × is changed to α × = 9 α-1 / 27) • χ = 2. 8 9 million X can be. 22 and 23 show the electron beam Bm illuminated by the ellipse, and the small circle shows the phosphor F. Here, a small circle with a thick line shows phosphor g in color g, and a black circle shows that phosphor F is emitting light. Regarding the circular shadow mask color CRT, it is easy to understand when comparing FIG. 18 and FIG. 22, because the luminous amount of the phosphor included in the line width is smaller than that of the porous barrier color ^ * CRT '. If the CCD line sensors 12A and 13A are not used, The light receiving range in the width direction is set to be wider than that in a porous barrier type color CRT measurement, and measurement errors may occur due to different measurement positions. The measurement error due to different measurement positions is similar to the measurement error described with reference to FIG. In Fig. 10, when the electron beam center is scanned in the vertical direction, Pv is large, and the energy distribution along the vertical line direction produces a convex-concave distribution. Different results may be produced due to different measurement positions. The measurement error of the circular shadow mask type or slit shadow mask color CRT due to different measurement positions is caused by the convexity and depression generated by the energy distribution along the vertical line, and also includes the number of light emitting phosphors in the measurement range A. Error caused by different. Even if fe hits the phosphor, the electron beam Bm has the same energy.

Page 33 V. Description of the invention (31) If the number of phosphors that emit light is different, the calculation of the product of the luminescence of all phosphors at the same position in a certain position according to the vertical line ^ degree direction is calculated. Π24 (A) At the center of the line, the brightness distribution is calculated based on the 2 contained luminous fluorescent lights = different vandalism distribution ci⑴ ~ C1 (13), and at the center of the meter line in the same figure (B) based on only 1 contained luminous phosphor. Μ (丄 二 结; r ;;: this; described ... Finally, therefore, when you want to determine the contour of a circular shadow mask or slot-shaped shadow line, or the CCD line sensor -12A, 12B each image y light range r is more porous than the thumb-type color CRT line with = ^ ϊ. ί; Tt; ^ 12A m2b ^ is the # once the line direction is enlarged so as to shoot into each pixel, the latter method can be used, for example, the cylindrical mirror 1-line direction Unfocused optical system to achieve. And at 5, the black ellipse is displayed on the CCD line sensor, and the fiber-optic fluorescent screen 14 has the same effect. Optical fiber fluorescent screen: screen υ-plane and CCD line sensors 12A, 12β capture As shown in Figure 27, in order to enlarge the two sides close to each other, the other side to adjust the optical fiber polishing screen The cross-sectional area is fish :: 14; 2 of 3 ⑽ line sensor, 12B photographic range a, set at a predetermined ruler. This will be on page 34 of this and invention description (32) 'Because of the ⑽ line sensor and ⑽ line = Department, can simplify the photography system with the -rate 丄 ir :; the province has performed luminous fixation. The compensation process is omitted here. The high-definition measurement is performed early. It is called a #close line contour measurement device. It is based on each R. It is called magic line: line contour. If you want to adapt to the color CRT color component, because the focus adjustment system uses white test ^ line adjustment, sometimes According to each R, G, and B color component: fixed = depending on the results of the two valences, so that there is the most idle price in terms of measurement accuracy and reliability = the practice is based on each _, G, β color component. , White, and then display the calculation result on the display 52

β ", ^ ^ ^ ϊ Λ :::: Λ V; Sv. Schering 34 Min vv ^ vimf μ 41 a The white and green outlines photographed by CCD are inconsistent with the results of visual evaluation. jgthis ’: 3 examples related to line contour determination equipment] As a miscellaneous Section 1 implementation. ㈣ 疋 The device 1 is difficult to adapt to focus adjustment in color CRT process = set T = i; = line wheel for focus adjustment in RT process. (Line contour measuring device of the second embodiment below) V. Description of the invention (33) The example is briefly explained), G (green), B characters "R", "G" characters "In order to identify R (red W (white) each color 'if necessary, add a small, "w", collectively referred to each color component to add a small. And (blue), "B" q "(q = R, G, B) vertical line The outline is to gradually move and display the direction of the irradiation position of the electron beam on the color CRT display surface. Each vertical line is photographed with a CCD camera to read multiple white vertical line image data, and each color component = line image data is calculated. After the outline of the vertical line is obtained, the contours of the colors R, G, and β are combined to calculate the white vertical line.., 2-8 i means that the irradiation position of the electron beam is gradually shifted 3 times in the horizontal direction. The relationship between the secondary electron beam and the position of the light-emitting phosphor. The relationship between the electron beam of the black component and the position of the light-emitting phosphor is the mouth chart =) The relationship between the electron beam of the color component and the position of the light-emitting phosphor门 关 # 二 θ (C) Electron beam and luminous phosphor position of the color-making componentΐ And, each color Electron beam reference points (corresponding value) of the reference see the ten (corresponding value) is compensated. In the same figure, the electron beam Bmq (q = R, G, B ^ is the electron beam of each electron beam at the i-th irradiation, which is M⑴U + H) shows that 4 electric = component ^ luminous body causes light to emit light In the electron beam, V starts from the left and the second is the body. From left to right; 1 luminous phosphor J ^ from the luminous phosphor Fq (1 phosphors Fq (j) of the same color are discretely arranged with p, it is obvious from the same figure that the interval = Horizontal

Page 36

) ~ Fq (3) can only get 3-point line contours. Gradually move the irradiation position along the right plural times, and irradiate with the electron beam Bmq (i). At this time, the positions of the light emitting phosphors Fq (丨) to Fq (3) in the electron beam Bmq (1) are relatively changed. Actually, Can increase the measurement point of the line contour. X Figure 28 moves the electron beams Bmq (2) and Bmq (3) relative to the electron beam Bmq (1) by about ph / 3, respectively. The center of the electron beam Bmq (1) is the origin. Let the measurement points of the Ph / 3 interval be ±, ± X2, ± X3, ± X4, and the brightness data A1, A2 of the phosphors Fq (1) to Fq (3) caused by the irradiation of the electron beam Bmq (j) , A3 are paid by the brightness data of the measurement points -X3, 0, + X3, and the brightness data B1, B2, B3 of the phosphors Fq (1) to Fq (3) caused by the irradiation of the electron beam Bmq (2) are given by The brightness data of measurement points -X2, + X1, + χ4 are paid, and the brightness data Cl, C2, and C3 of the phosphor 1) to Fq (3) are irradiated by the electron beam Bmq (3). , -XI, + χ2 brightness data is paid.

Therefore, the shell data A1 ~ A3, B1 ~ B3, C1 ~ C3 of each color component R, G, and B are calculated based on the image data obtained by photographing each vertical line. XI, soil X2, ± χ3, and soil X4 are exchanged. As shown in FIG. 29, the luminance distributions (line contours) LR, LG, and LB for each color of r, 0, and β can be calculated. Further, in FIG. 29, the white bar graph is the luminance data of the g color component, the dot-slot bar graph is the luminance data of the R color component, and the oblique bar graph is the luminance data of the B color component. Then, simply adding the line contours lr, LG, and LB of each color of R, G, and B together, as shown in FIG. 30, a vertical line contour of white light can be calculated. and

Page 37 V. Description of Invention (35)

And 'in Fig. 30, the line contour lw, #actually> the L contour. The vertical line wheel component of white light on ',', ΐ = 2 R, G, B color wheel wheels LR, LG, LB: J obtained by photographing white vertical lines, simply R, G , B line contour LW. If you can calculate the vertical direction of the white light as described above, you can use the calculation formula (M, M, and M for the line contour measuring device 1 LG ^ G, B. The line contour of each color is more than white: Relative visibility parameters _, KG, KB, that is, the vertical line contour LW of white light can be calculated. Φ LW-KR -LR + KG -LG + KB · Lb …… (1) 〇, with: Degree parameter KR'KG, KB is when Set the sensitivity of the human eye to R, (4) Λ $. When ⑽, ⑽, the formula ⑴ ~ CT2. For example, in the color with the representative spectral characteristics in Figure 31, KR% 20%, KG and 70%, KB% 10%. KR (QR + QG + QB) (2) KG = QGX (QR + QG + QB) ... (3) KB ^ QB // (QR + QG + QB) ··· ... (4) Price is due to the fact that in color CRT processes, visual evaluation is generally used first: point adjustment, in order to obtain a measurement that is slightly the same as its visual evaluation, the visual evaluation shows that the calculation is white The longitudinal line of the light is used to convert the qualitative eye diagram into a quantitative measurement result. Therefore, 'when the visual evaluation test deer 1 and the color are mixed colors other than white, as long as it can be calculated, " Colorless vertical line outline At this time the above-mentioned (a) at least two monochromatic formula

Page 38 V. Description of the invention (36) ΐ Mixing into a mixed color green wheel formula, we can get this mixed color wheel 2f In the above description, the electron beam is irradiated on the phosphor = number of movements, in the line A plurality of white lines having different positions relative to the light emitting phosphor ^ ^ face 1 glorious body are formed: line color ^ These white vertical lines are fed using a single-shot operation to achieve high-speed measurement. It's enough to make it clear. The following is a brief description of the horizontal line profile measurement. As shown in FIG. 32, the horizontal line profile measurement system continuously scans the white horizontal line LnW. Since the two sides of the line sensor beam center and the white horizontal line LnW are perpendicular to each other, each pixel of the line sensor 3: R , G, B of each color of the light-emitting phosphors FR, FG, FB, g = hair. In this way, since each pixel ρ of the line sensor 3 can have two shades of light, the intensity data '# shown in Fig. 33, and this brightness data can straighten the line contour LW of the white horizontal line LnW. 1 :: White horizontal knitting can be displayed anywhere on the color CRT display surface = again! : To i; to measure the contour of the line, you have to consider the line inside the line fU. Consider the compensation for the unevenness of the rate between each color component glory body. Furthermore, if only one white horizontal line LnW is displayed on the color crt display surface, the horizontal line profile can be measured. With reference to the description, a line contour measurement system according to the second embodiment will be described. The line-contour measurement system according to the second embodiment is the same as the line-contour measurement device according to the first embodiment, except for the CCD camera 3 optical system.

Five 'invention description (37) constitutes a block diagram. Since the block diagram of the line contour measurement system according to the second embodiment is the same as the block diagrams of Fig. 4 and Fig. 5, only the differences of the optical system of the CCD camera 3 will be described here, and the description of other configurations will be omitted. Fig. 34 is a diagram showing the configuration of the optical system of the CCD camera 3 of the line contour measuring device according to the second embodiment. _ Figure 34 is a relative visibility furnace color device 15 set between the photographing lens 10 and the half mirror 丨 丨 in FIG. 8. Moreover, the 'relative visibility filter 5' may be appropriately set ^ between the photographic lens 10 and the half mirror n, and may also be disposed on the front surface of the photographic lens or the rear surface of the semi mirror. The R relative visibility color filter 15 separates the radiation from the CCD line sensors 12 and 12B, and adjusts the input of the CCD line sensors 12A and 12B. Example: Phase i Ϊ Ϊ Make the output of each color component to human The stimulus of the eye is all "Ϊ, Ϊ2 = the spectroscopy proportional to the stimulus value ?, 12BΛ combined constitutes a receiver with 3 values). And the photoelectric receiver (directly read the stimulus and give two according to the corresponding brightness. According to the International Commission for Illumination f (CIE), the visibility value is the largest. The graph of the characteristics of the visibility of the light, and the relative value at 555nm. 2 The example has ±± 1 +, and the pattern is stacked in white light. ≫ Test the color components β, G, R > 仃 & and calculate the line contour based on the white light test pattern: contour, and then determine the line contours of each color component R, G, β. Outside the two stops, basically the same line contour KG wheel as described in the first embodiment

Page 40 Luminescence of different phosphors F. Description of the invention (38) Compensation coefficient '(2) Shows the test caused by changing the scan size (3) The order of measuring the line contour is performed, where (" Compensation coefficient is different The processing is the same as the principle explained in the flowchart of FIG. 15. (2) The scanning 2 change processing is only to display a plurality of white lights with steps ㈣ ~ _ in the flowchart of FIG. 16. This point is different, and (1) and details are omitted here. The explanation is supplementary to the processing of (3). After the scan size change processing is finished, as shown in FIG. 36 (A), a test chart composed of a plurality of white vertical lines LnW (0 $%) is displayed in the color CRT6. Tea 0 color vertical ㈣M inch is reduced according to the established < inch, and is formed by a plurality of white patterns. This figure is only a depiction of the positional relationship and vertical line of L = f light body FR, FB vertical line—Π) Corresponding vertical lines in the white test pattern when the 5 sets of relationships are consistent

LnW (1) to Lnw (6). The same picture (A) shows that when the color crt6 display surface is coated with a fluorescent handle and a plurality of white vertical lines Lnw (" The same picture (B) shows that the color CRT6 display surface is not coated with G color fluorescent light ( C) This is a schematic diagram of the relationship between this Λ beam oyster, the same as in Figure i, the color CRT6 display surface is coated with R color fluorescent deletion and radiance: ^ corresponding color electron beam BmR, the same The color CRT6 display surface is coated with β-color fluorescent light, and the relationship between the surface electron beam pair is shown on f. The opposite color of the electron beams BmG, BmR, and BmB is the outline of each color component. The urine profile is based on the spectroscopic value. Posterior line

Page 41

V. Description of the invention (39) Furthermore, in Fig. 36 (A), a rod with an imaginary point, a rod with full whiteness, and a rod with obliqueness indicate the phosphors FR, FG, and FB of each color of R, G, and B, respectively. The electron beam values of the vertical component lines LnR, LnG, and LnB of each color component shown in the same figures (B) to U) are values normalized with reference to white light. In the line profile measurement, the white test pattern displayed on the color CRT 6 was photographed with the CCD camera 3, and the phosphors Fq (〇) to Fq (13) (q = R) were calculated for each color component based on the photographic image data. , G, b) Redundancy data Cq (0) to Cq (13) (q = R, G, B) of light emitting positions. As shown in FIG. 36 (B) ~ (〇, these brightness data C (1 (〇) ~ Cq) correspond to the luminescence values of the phosphors Fq (〇) ~ Fq (1 3). Then, as shown in FIG. 37 It is shown that by synthesizing the luminance data Cq (0) to Cq (13), the vertical line contours LR, lg, and LB for each color component can be calculated, and these vertical line contours LR, LG, and LB can be further simply calculated. Add together to calculate the white line contour LW. The synthetic processing of the luminance data Cq (0) to Cq (13) is by combining the luminance data Cq (0) to Cq (1 3) along the width of the vertical line ( X coordinates) are exchanged and arranged separately. As Figure 3 6 is also the size of the width of the vertical line, the size of the three phosphors is greatly increased, as shown in Figure 19. The brightness data Cq (h) (h = 〇, 1 '...... 1 5) and the electron beam (i) (q = R, G, B, i = 1, 2 ...... .5) Correspondingly, i 'k is determined by i = {(h / 3) integer part} + 1, k = (h +1) -3 (il). On the other hand,' and electron beam 3111 (1 ( i) corresponding to the luminous position in the line of the three luminance data Cq (i, k) (k-1, 2, 3), k does not exceed Over the soil 2

Page 42 V. Description of the invention (40) / 5 The range is Xi, l =-/ S + Ad · (i-1), Xi, 2 = Ad · (i — 1), and Xi, 3 = + / 3 + Ad · (i-1). In Figure 36, substitute / 3 = 250 / zm and α = 700 / zm into Δ (1 = 3/5-α to get / ^ (1 = 50 // m, and then change this / 3, △ (! Value Substituting in the above formula can calculate each luminance data Cq (i, k) (k = 1, 2, 3). The luminous position in the line is the measurement point in the line, as shown in Table 1. Table 1 Brightness coordinates Cq ( O) Cq (l, l) -250 Cq (l) Cq (l, 2) 0 Cq (2) Cq (l, 3) +250 Cq (3) Cq (2, l) -200 Cq (4) Cq (2,2) +50 Cq (5) Cq (2,3) +300 Cq (6) Cq (3, l) -150 Cq (7) Cq (3,2) +100 Cq (8) Cq (3 3) — Cq (9) Cq (4, l) -100 Cq (10) Cq (4f2) + 150 Cq (ll) Cq (4,3)-300 Cq (12) Cq (5? L) -50 Cq (13) Cq (5,2) +200 Moreover, in Table 1, the coordinates of the brightness data of Cq (3,3) are ± 350 # m, and the phosphor Fq (8) is located on the vertical line Liui (3) and vertical Between the lines Lnq (4), the electron beam Bmq is not irradiated, in fact, its brightness data does not exist, and it has no effect on the line contour calculation. According to the above Table 1, the corresponding brightness information is calculated for each R, G, and B color component.

Page 43 V. Description of the Invention (41)

The X coordinate of the material Cq (1, k) is interpolated to draw the luminance data C (1 (i, k) corresponding to the χ coordinate, and the line contours LR, LG, and lb are calculated as shown in FIG. 37. Further, According to CW (1, k) = CR (i, k) + CG (i, k) + CB (i, k), the luminance data of each color component is simply CR (i inch), c (;,, CB (1 'k ) Is added to “-” to draw the luminance data cw p'k), and the line contour Lw is calculated as shown in FIG. 37. Then, the measurement and the result are displayed on the display 52 of the measurement control unit 5. The calculated white color may also be displayed. Line contours via FFT (

Fourier transform) processing, which compensates the frequency characteristics of the spatial space after processing. 扁 μ ★ w w Village, I I Α Α ^ Θ ^ *, using integral processing in the two frequency domains to obtain high-performance data with ϊϊΓ The horizontal line profile measurement will be described below the display 52.

On the basis of the wire pass ^, the horizontal line reel phase setting system will set the CCD-" βt ^ FR. "And set it to a vertical phase (refer to Figure 32). Since each pixel of the light-emitting ΔΤ′Β can be obtained along the line width direction An approximately continuous white pattern. After color = 3: different plural oblique lines of the luminous body, this white W Ϊ is displayed with at least one white horizontal line. However, the following Λ / material directly calculates the white line wheel ㈣. Measure the horizontal and vertical color CRT horizontal lines of the mask-type or slot-type color CRT.

V. Description of the invention (42) When measuring the line and line contours, “Because the light emitting position of the phosphor is discretely extracted in the line width direction” Even if the horizontal line contour measurement is performed, the raster size of the test pattern for measurement must be along The vertical direction is changed (refer to Figs. 2, 2 and 3). When the vertical line is measured, α) [becomes α: χ = η · (1-1 / 3η) · β. The grating size in the horizontal direction is changed. When measuring the line profile, α γ becomes aY = m · (1-l / 3m) · / 3γ The vertical dimension of the grating is changed. As shown in Fig. 23 ', three white horizontal lines on a circular shadow mask color CRT display surface are photographed with a CCD line sensor 12B. As shown in Fig. 38, different brightness distribution data are obtained on the line. In Fig. 38, the horizontal axis represents the light position of the line sensor 12B in the pixel arrangement direction, and the origin 0 is set at the center of the line of the middle white horizontal line LnW (1). Each light receiving position discretely forms the center of a plurality of white oblique lines within the horizontal line, and the bar graph displays the white brightness data at this position. Since each pixel of the line sensor 12B is the light receiving amount after combining the light emitting amounts of the light emitting phosphors, the brightness data at each light receiving position is the output data of each pixel of the line sensor 12B. Luminance data is expressed as a normalized relative value with a maximum value as a reference value. In addition, the white portion, the dotted line portion, and the oblique line portion in the bar graph indicate the values of the respective color components of r, g, and b that constitute white. As shown in FIG. 38, the white horizontal line LnW (i) (i = 0, 1, 2) contains the CW (i, k) (i = 0, 1, 2, k) white luminance data from the left, k = l '2 ....... 5) indicates that each white horizontal line LnW (i) is related to the

Page 45 V. Description of the invention (43) The relationship between the line profile brightness data CW (i, k) and the electron beam BmG (i) (i = 1, 2, 3) in Figure 2 8 (A) and The relationship between measurement point 0, soil X1, ... is the same. That is, the measurement point along the width of the horizontal line is

-Υ6, -Υ3, 0, + Υ3, + Υ6 ', the brightness data CW (1,1), CW (1,2), CW (1,3), CW (1) that constitute the middle horizontal line LnW (1) '4) and CW (1, 5) are given by the brightness data of their measurement points -Y6, -Y3, 0, + Y3, + Υ6, and the brightness data cw of the left horizontal line Lnw (〇)

(〇, 1), CW (0,2), CW (0,3), CW (〇, 4), CW

(〇 ′ 5) is given by the brightness data of its measurement points _Y5, -Y2, + Y1, + Y4, + Y7, and the brightness data CW (2, 1), CW p, 2 of the right horizontal line Lnw (2) ), CW (2, 3), CW (2, 4), CW (2, 5) are given by the brightness data of their measurement points -Y7, -Y4, -Y1, + Y2, + Y5, and the outline of monochrome light Measurement is also performed by exchanging the luminance data cw. (丨, k) and its corresponding measurement point to obtain a horizontal line profile LW as shown in FIG. 39. As described above, in the line contour device according to the second embodiment, since the oblique line patterns between the light-emitting phosphors are different from each other in the color CRT6 to be measured, the adjustment line interval is displayed by vertical lines or horizontal lines. A plurality of white test patterns are constructed. On the other hand, this test pattern is photographed by a CCD camera with relative I visibility characteristics, and the lines of each color component of R, G, and B are output using the brightness data obtained from the photographic image. In addition, the f-line contours of each color are added together to form a white line contour (that is, the display of the color line contour can determine a line contour that has a high correlation with visual evaluation. Moreover, when misfocusing occurs, it does not reduce the Correlation of visual evaluation. Furthermore, in the above-mentioned examples, the latter of the above measuring principle is explained

Fifth, the description of the invention on page 46 (44) The CRT6 display surface at the same time displays a plurality of different slash patterns at the same time. The former (the color CRT6 display surface is displayed differently from each other. &Quot; /, a plurality of white The method of line) is also suitable for measuring the contour of a line. That is, in the measurement of the vertical line contour of the porous barrier-type color CRT, as shown in FIG. 3, the white vertical line LnW (", UW (2), ..., etc.) is repeatedly displayed 5 times on the corresponding vertical itching, respectively. Camera 3 takes a picture, and then calculates the Brahma data Cq (i, k). The heart is born and ^ ΐ i is in the round shadow mask type or slit shadow mask type color CRT horizontal line contour =, at least as shown in Figure 38 , The white horizontal lines M (〇), I, LnW (2) corresponding to the horizontal lines are repeatedly displayed on the color CRT6 3 =, for the other CCD camera 3 to take pictures and then calculate the brightness data q (丨, 匕 i column and then The measurement data corresponding to the degree data CQ (1, k) is exchanged. IS is shown in white in the example shown in FIG. 37 or in the white example shown in the tank. In order to improve the measurement accuracy, the first step is added. It is also possible to omit the compensation processing for the measurement. Moreover, in the above-mentioned each of the above, Gaishi Λ < Deng Cai early in the CRT / Cai Yangji issued a copy / In order to improve the measurement accuracy of the color case; the use of its photographic image of the image The data is used for the wire wheel; ^ / The picture can also be used according to the white light measurement method! A test line profile measurement. 卞 耵 ~ 家Brief Description of the drawings into Tu Figure 1 is a schematic diagram illustrating the principle of line profilometer, with FIG. U) based on the barrier

Page 47 5: 4, Description of the invention (45) —---------------- ^ Thumb-type +. Schematic diagram of the state of light emission on each green plural vertical lines, (B) Schematic diagram of the brightness distribution of multiple luminous phosphors. Schematic diagram of the outline state of the brightness distribution obtained from the busbars. Fig. 2 is a schematic view showing a state in which a plurality of horizontal lines emit light on a barrier-type CRT display surface

For the transmission of pollution, the imaging direction of I series mountain relative to the horizontal line CCD line sensor and the transmission output of the resting state by the CCD line are shown in Fig. 4. The outline of the line of 1 series constitutes a block diagram of the measurement part of the post-SIR ± device. Illustration. Fig. 5 is a block diagram of the data reading control part of the line contour measuring device. Fig. 7 is an example of an output signal of a delay circuit. J 8 :: c: A perspective view of an example of the basic structure of the optical part of a CCD camera of a ΐ sensor. Shadow range = 2 An illustration of the misalignment of the CCD line sensor that is enlarged for the sake of convenience in the picture. The measurement error caused by the different measurement positions in the contour measurement. (A) The measurement position is set to a narrow line width. (B) is the schematic diagram of the brightness distribution in the line when the measurement position = the wide position. Schematic illustration of the measurement error of the position measurement error of the on-line sensor and the extension of the vertical photographic range. For the measurement, the vertical measurement is set to 5 and the brightness distribution within the line is narrow when the line visibility is narrow. (B) is

Page 48 5 'Explanation of the invention (46) Schematic diagram of the brightness distribution in the line when the measurement position is set to the line width and wide position. Illustration. Fig. 12 is a perspective view of the main parts of a porous barrier-type ατ fluorescent screen structure. Fig. 1 is a schematic illustration of the calculation processing of the compensation coefficient. (The heart is a schematic diagram of the light emitting state of the phosphor on the CRT display surface when the green sun II is issued. (B) ^ Schematic diagram of the energy distribution of the electron beam in the vertical direction during the direct scanning process. It is the vertical beam of the electron beam used for the compensation coefficient calculation on the CRT display surface = = energy distribution diagram, (a) is the energy distribution during the first raster scan

:, (B) is a schematic diagram of the energy distribution during the second raster scan, and (c) is a schematic diagram of the energy distribution in the vertical direction after being scanned on the phosphor after the number of light thumb scans. Figure 15 is a block diagram of the calculation process of the compensation coefficient of the luminous efficiency of the 5 series glory. Figure 16 is a block diagram of the process of scanning size change. Figure 7: Schematic diagram of the calculation method of the 7-dimensional light body interval, (a) is a schematic diagram of the stripe pattern obtained after the monochromatic light is emitted on the RT display surface, and (B) is obtained by sampling the pixel data on a specific horizontal line The signal schematic diagram '(c) is a pulse signal diagram obtained by digitizing the signal of (B).

句 图 1 8 series_ Schematic diagram of the state of a plurality of vertical lines when the electron beams are spaced horizontally into three beams and irradiated discretely on the cedar CRT display>. Fig. 19 is a schematic illustration of a longitudinal profile measurement process, (A) is a schematic diagram of a test pattern composed of a plurality of vertical lines, and (B) is a diagram showing each phosphor on a CRT display surface and an electron beam irradiated on the display surface. Relationship diagram.

Page 49 V. Explanation of the invention (47) Figure 20 is the conversion of the brightness data C (0) ~ C (28) of each phosphor F (〇) ~ F (28) in Figure 19 (β) to display each fluorescence Light body brightness data c (i, work) ~ C (10, 2). FIG. 21 is a schematic diagram of longitudinal profile measurement data obtained by synthesizing the luminance data c (i, ι) to c (10, 2) shown in FIG. 20. Fig. 22 is a schematic view showing a plurality of vertical lines in a light emitting state on a display surface of a circular baffle type CRT. Fig. 23 is a schematic view showing a plurality of horizontal lines in a light emitting state on a display surface of a circular baffle type CRT. Fig. 24 is a schematic diagram illustrating the reasons for measurement errors caused by different positioning when measuring the longitudinal contour of a circular baffle CRT. (A) It is the measurement of 2 sets of H in the multi-time line of the phosphor included in the center of Λ. Luminance distribution force = 丄 ', then the position is set as a schematic diagram of the intensity distribution in the time line of the phosphors contained in the center of the line. Figure 25 is on the photographic surface of the CCD line sensor.

, N, cut M ~ Na shirt back to I in the width direction of the schematic diagram of the state. Enlargement = Tether line display shows that the Λ fiber light-emitting screen caused blurring ^ Enlarged light sensor plane image of the line sensor. Enlarged = 7: The side view of the photo area caused by the light screen caused by the light on the width of the image. The moving picture "the germline is not in the same color white; the intention, (b) is the line P The positional relationship with the luminescent phosphor shows the positional relationship between the red (R) vertical line and the luminescent phosphor

V. Description of the invention (position of (48)) The calculated line contours and line contours are synthesized, and (c) is a blue (B) vertical relationship. , ', Liang and Luminescent Fluorescence Figure 29 is a schematic diagram of various color components (R, G).

Figure 30 is a schematic diagram of the outline of the white line with various color components (R, G.) Figure 31 is a relative reflection diagram of a representative color CRT. Figure 32 shows the characteristics of the visibility factor on a porous barrier-type color CRT. Schematic diagram of the photographic positional relationship of the camera. '' ', Loose line and line sensing Figure 33 is a schematic diagram of the white horizontal waveform using a line sensor. The output signal taken at Figure 34 is about the second embodiment of the line wheel projector. The optical part basically constitutes a three-dimensional view. "疋 The flat CCD photo 35 is a relative visibility factor profile. Figure 36 is a drawing showing the test pattern with the grating reduced to a predetermined size. (X Λ vertical line Structure & tolerance map (A) is a schematic diagram of the positional relationship between the color CRT display surface with Θ phosphor and a plurality of white vertical lines' (6)% is a color CRT display surface coated with green (G) color Schematic diagram of the relationship between the phosphor and the electron beam irradiated on it, (C) is a schematic diagram of the relationship between the color CRT display surface coated with red (R) / color phosphor and the electron beam irradiated on it, (d) The color CRT display surface is coated with blue (B) phosphor and Showing the relationship between the emitted electron beam. FIG. 37 lines of the luminance information Cq displayed in Figure 36 (square) ~cq (13) Synthesis of

Page 51 5. Description of the invention (49) The outline of the white vertical line is obtained after processing. Fig. 38 is a schematic diagram of the brightness distribution obtained by photographing a number of circular barrier patterns in a horizontal form: RTI \, which are different from each other. Color horizontal line outline illustration. Redundancy_The white picture 40 obtained after reordering the shell material is about the various colors > The outline map of the round Rui Qianyin Yuanbacheng knife (RG, B) and the white electron beam, (a) is the focus When the colors are the same, (B) is when the focus is not the same-the ^ ^ ^ ^ ^ fuss symbol indicates that the outline of the beam is not intended. Bu line profile measuring device; 2 ~ data reading); 2 1 ~ A / η Μ from w (do not control the magic η A / D converter; 22 ~ VR〇M; 23 25 ~ control section; 26 ~ Signal production peak cry. 27 π cattle & 〇M, 24 ~ RAM,

Mu π half el generator, 27 ~ sync ^ chain delay section; 28 ~ vertical 冋; / 仏 detection section; 29 ~ communication section; 3 ~ CCD seat is b measurement control section (the first and second Computing device ^. Q ~ missing w part, 53 ~ keyboard; 52 ~ display cry; 6 ~ color crt. Β1 work 62, drive control circuit; 6; 2nd drive control circuit female 7 pole shot =; electric R circuit; 9 ~ Image signal; 10 ~ Photographic lens; 11 ~ Semi-mirror '12A, 12B ~ CCD line sensor (photographic device); 13A, 13β ~ Semi-cylindrical lens (optical system); 14 ~ Fiber optic screen (optical device) 15 pairs of visibility tints. '~ #

Page 52

Claims (1)

6. Scope of patent application ^ 1. A CRT electron beam profile measurement method, which displays the existing trial pattern on the CRT display surface, and uses the image signal obtained by photographing the test pattern with a photographing device to calculate the brightness of the test pattern The distribution is characterized in that: the photographic range of the CRT display surface is moxibusted in the horizontal or vertical direction in the above-mentioned photographing device, "2. The method for measuring the CRT electron beam profile as described in item 1 of the scope of patent application," The test pattern is composed of a line pattern, and a photographing range of the photographing device is a range in which a line pattern displayed on the CRT display surface is optically enlarged in a line direction. 3. —A CRT electron beam wheel temple measuring device, including: Ningxun control device—sets to display a predetermined test pattern on the CRT display surface; a photographing device is set on the CRT display face to face, and the above test _ pattern photography ; The optical device 'is set in front of the above-mentioned photography j, and the photography range of the CRT display surface of the photography device is optically and horizontally expanded in the horizontal or vertical direction; and the operation' uses the above-mentioned photography device to obtain an image by photographing the test pattern Signal, use this image signal to calculate the brightness distribution of the test pattern in the horizontal or vertical direction. 4 · The CRT electron beam profile measuring device as described in the "Scope Item 3" of the patent application, wherein the test pattern _ is composed of a line pattern; the optical equipment is to display the photographic range of the photographing device to the CRT. After the line pattern of the display surface is optically enlarged along the line direction; Page 53 6. Scope of patent application The above-mentioned arithmetic equipment 5 · If you apply for special installation, where the above-mentioned trial pattern shows the predetermined test along the horizontal level, use the above-mentioned photographic equipment trial pattern to take photos separately. ϊ'The distribution of the above-mentioned luminescence and fluorescence, and the subsequent test patterns 6. If you apply for special placement, the above-mentioned displayed patterns are different along the horizontal scheme, and are displayed in an array; All the above-mentioned photographic patterns are used to photograph the above arithmetic equipment. Figure _. All the cases obtained the brightness distribution of the above-mentioned crossbow, and then the test pattern was used to calculate the brightness distribution of the line pattern along the line along the water. The control device for measuring the CRT electron beam profile as described in the third paragraph makes the light emitting position on the CRT display surface different from the light measuring direction or the vertical direction, and multiple echo patterns are displayed; the multiple echo images are displayed on the CRT display surface. For each of the above-mentioned photogrammetry, the above-mentioned plurality of tears are set using the above-mentioned photographing device, and the trial-one-to-to-a-number of image signals are provided, and for each test pattern light body in the test pattern in the horizontal direction or vertical direction, then these Luminance distribution synthesis, calculation and final synthesis of the luminance distribution along the horizontal or vertical direction. The non-control device of the CRT electron beam profile measuring device described in the third item of the scope of interest makes the light emitting position of the luminescent phosphor on the CRT display surface or the direction of M 1 correspond to the test chart so that a plurality of test patterns are horizontal or The vertical test will display the above-mentioned multiple tests on the CRT display surface. ^) The above-mentioned tests are used: the shadow device uses the shirt image signal 1 for the above-mentioned multiple tests to calculate the test pattern along each test pattern. The horizontal or vertical direction Z synthesizes these luminance distributions, and finally calculates the horizontal or vertical luminance distributions. 54 Page 54 6. Scope of patent application 7. The CRT electron beam profile measuring device described in item 6 of the patent application range, wherein the display control device changes the scanning size of the CRT electron beam raster so that the luminous phosphor pattern is horizontal. The light emission position in the vertical or vertical direction varies depending on the test pattern. 8. The CRT electron beam profile measuring device according to item 3 of the scope of patent application, wherein the above-mentioned computing device comprises: a first computing device that computes the position of the light-emitting phosphor in the horizontal or vertical direction using a pattern; And the luminous brightness; and a second computing device that uses the luminous phosphor luminous position and luminous brightness calculated by the first computing device to compute the luminance distribution of the test pattern in a horizontal direction or a vertical direction. '9. The CRT electron beam profiling device described in item 3 of the scope of patent application, which includes a compensation device designed to compensate for the uneven luminous efficiency among the CRT phosphors. 10. The CRT electron beam profile measuring device according to item 9 of the scope of the patent application, wherein the compensation device includes: a light-emitting control device that causes the CRT electron beam to scan in a vertical direction at intervals smaller than a standard vertical scanning interval, Make all the phosphors corresponding to the electron beam contained in the photographing device of the above-mentioned photographing device monochromatically emit light; the photographing control device photographs all the monochromatic luminous images of the above-mentioned light-emitting control button_device displayed on the CRT; --Compensation coefficient calculation device,-Using the above-mentioned photographing device to photograph the image signals obtained from all of the above j-images, to calculate a compensation coefficient aimed at compensating for the uneven luminous efficiency among the crt phosphors; and The & > setting obtained by the compensation #let causes the above-mentioned photographing device to take the above-mentioned test pattern as a compensation signal of the above-mentioned ¥ compensation coefficient. The light and shadow i 2 i ϊ i ΐ device of the CRT electron beam profile measurement as described in Item 3 of the α-eye patent fan garden is a device that does not focus the light amount of the imaging surface of the imaging device in the ^ direction or the vertical direction, so that This photographic device is a CRT electron beam profile measurement display as described in item 3 of the Lashin Kiss patent range. The photometric device is the same as the CKT of the above photographic device. The ammonium is as large as perpendicular to the CRT. Direction raster scan interval setting 13 · Λ 申 Λ 专 Λ1? The measurement display surface of the CRT electron beam profile described in item 3 Photograph: 犷 ®ίί: Expands the range of the above-mentioned crt of the photography set i The phosphor phase-separating device perpendicular to the crt is a crt electron beam profile measuring device described in item 3 of the patent scope, wherein the photoacoustic cylindrical lens described above. Xie Qiao 15. A method for measuring the profile of a CRT electron beam, which includes the following steps: displaying a test pattern constituting a predetermined mixed color to phosphor emission on a CRT display surface; a photographic dream with relative visibility characteristics for each color Photographing; the device uses the above-mentioned test pattern to obtain a signal constituting a mixed color using the above-mentioned photographing device, and calculates the above-mentioned test chart for each color component ^ ^ image and ', redundant knife cloth; six patent application scope' " = The brightness distribution is calculated to calculate the brightness of the display pattern of the test pattern described above. 16 · The CRT electron beam measurement described in item 5 of the patent application claims the measurement range of the color CRT display surface of the photography device. The water direction or the vertical direction is optically enlarged. Fang Niugan Ruxin stated that the CRT electron beam profile measurement method described in item 15 of the patent scope, in which the above-mentioned test pattern display color is white. .—A CRT electron beam profile measuring device, comprising: a display control device that displays a test pattern for emitting at least two colors of phosphors constituting a predetermined mixed color on a color CRT display surface; and a 2 shadow device provided in the color CRT Display surface and the relative visibility characteristics of the above-mentioned test pattern photography; 搌 少 Ϊ 1 using a different device, the above-mentioned test pattern is used by the above-mentioned photographing device: to the percentage of the color component image that constitutes the mixed color, and the color component is different for each color component The brightness distribution of the patterns used in the above 4 tests; and the various measurement devices, "Sergeant Λ" described the first 1 Yun Weifu's formula for calculating the components of each color using the degree distribution of the patterns, which shows the brightness distribution of the package. 4- Display the pattern for the above-mentioned test 4. 19. Please refer to the m-electron device described in item 18 of the range, where the display control device is on the color CRT display surface & the pattern for the X-ray phosphor test. The horizontal direction or vertical direction μ is set differently. A plurality of times are used to display a predetermined test pattern. The above-mentioned photographing device is to be photographed separately with a trial pattern and a trial pattern displayed on a color CRT display surface. Sixth, the scope of the patent application Composition calculation ==== The second operation device of the above operation device is a combination of the brightness distribution of each test pattern of the above calculation device, and the brightness distribution of the test pattern display color. -— For transporting out 20, the CRT electron beam profile measurement as described in item 18 of the scope of the application for a patent ί = 1 The above display control device is set to emit light on the color CRT display surface, and the pattern is horizontal or vertical The light emitting position is different with respect to the test pattern, so that a plurality of test patterns of a predetermined mixed color formed by at least the two color phosphors emit light are arranged and displayed in a horizontal-direction or a vertical direction; the above-mentioned photographing device will be The plurality of test patterns displayed on the multi-color CRT display surface are photographed in their entirety; the first operation device of the computing device uses the photographing device to photograph the plurality of test patterns to obtain image signals of each color component constituting the mixed color. The color component calculates the brightness distribution of each test pattern in the horizontal direction or the vertical direction; the second calculation operation of the above-mentioned calculation device > 2 is a combination of the brightness of each test pattern calculated by the first calculation device for each color component. , Calculate the brightness distribution of the test pattern display color. 21. The CRT electron beam profile measuring device according to item 20 of the scope of patent application, wherein the display control device changes the color CRT electron beam. P.58 6. Scope of patent application Raster scan size 'makes the light emitting position of the luminescent phosphor pattern in the horizontal or vertical direction different from the test pattern. 2 2. The CRT electron beam profile measuring device according to item 18 of the scope of the patent application, wherein the first computing device includes:-The third computing device 'calculates the above-mentioned test pattern of the light-emitting phosphor in a horizontal direction or a vertical direction And a fourth computing device that uses the above-mentioned light-emitting position and air light intensity calculated by the third computing device to calculate a brightness distribution of the measurement-trial pattern along a horizontal direction or between vertical blades. A 23. The CRT electron beam profile measuring device as described in item 18 of the scope of patent application, wherein the test pattern display color is white. 24. The CRT electron beam profiling device 'described in item 8 of the scope of the patent application, which includes a compensation device, which is designed to compensate for the uneven luminous efficiency among the color CRT phosphors. -2 5. The CRT electron beam profile measuring device as described in item 24 of the scope of patent application, wherein the compensation setting includes: 抻 __set to make the above-mentioned color CRT electron beam sweep vertically than the standard I:;: on t, scanning in the vertical U direction, so that the photography of the above-mentioned photographing device]. All the phosphors corresponding to this electron beam emit monochromatic light, the photographic control device, the Uβ gas control light device is in the above-mentioned color CRT The apparent tilt coefficient operation device "the image signal obtained by photographing all the monochromatic light-emitting images mentioned above using the above-mentioned imaging device" operation is intended to compensate the above-mentioned CRT Page 59 VI. Compensation coefficient for non-uniform luminous efficiency among phosphors in the scope of patent application; and signal compensation device, which uses the above-mentioned photographing device to take the image signal obtained by photographing the test pattern as a compensation letter for the aforementioned compensation coefficient / number. 2 6. The CRT electron beam profile measuring device as described in item 18 of the scope of patent application, which includes an optical device, which is set in front of the photographic surface of the above-mentioned photographic equipment-______ and displays the above-mentioned color CRT of I 学 i The photographic range of the surface is optically enlarged in the horizontal or vertical direction. Page 60