TW379379B - A method to avoid dishing in shallow trench isolation - Google Patents

A method to avoid dishing in shallow trench isolation Download PDF

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Publication number
TW379379B
TW379379B TW87106988A TW87106988A TW379379B TW 379379 B TW379379 B TW 379379B TW 87106988 A TW87106988 A TW 87106988A TW 87106988 A TW87106988 A TW 87106988A TW 379379 B TW379379 B TW 379379B
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Taiwan
Prior art keywords
layer
removal rate
rate
item
trench
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TW87106988A
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Chinese (zh)
Inventor
Ji-Jin Lou
Shiue-Jung Chen
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Ind Tech Res Inst
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Abstract

The invention relates to a method of filling the shallow trench isolation having the filling material undergo CMP, without dishing on the surface. Therefore, an additional layer is placed between the defined trench masking material and the trench stuffing material, the transitory layer has the characteristics of a removal speed (under chemical and mechanical polishing) larger than that of the coating and stuffing material. The other important improvement of the invention deals with the easier end point detection due to the significant difference between the removal speeds of the masking layer and the transitory layer.

Description

^^370 ^^370 Λ7 B7 五、發明説明ΐΤΤ "~ ~~~ - 發明背景 (1)發明領域: 尤其學機械研磨(CMP)製程之-般領域, 絕緣時形成碟形凹_峻)的問題。 元件f 序的一部分’將各個不同的主動 局邻矽緣^必要的。使用最廣的方法可能是 ϋ化至相LQ=S)’其中將半導體表面上所選的區域加 ίίίί5界㉝表原f是氧化物與半導 =的:雾'终=加:》化區擴展至基板表面上與 、古。’於*發展出淺溝槽絕緣师)的方 。相ΐ於此種絕緣技術有-嚴重U (ΐ/iTgf。械研糾’所填溝槽的表面會產生碟形凹陷 我們,在參考圖la加以說明,圖1&為一矽基 經濟部中央標準局貝工消費合作社印製 ^_減層2覆以氮化梦層3。後 t準的微影技術加以圖型化並已侧,秘1 ^槽5時(通相反舰軒侧)作為—鮮制; 者以一層絕緣材料如氧化矽4全部覆蓋。 更肴接 的填充材料4接者以化學機械研磨法移除’通常 4的移除速率(以化學機械研磨法)明顯高於溝样 罩材料3的移除速率。為了滿足後續的處理要求,“ ·、、 除全部的層4(填充溝槽5者除外),結果如圖作所: ?4ίίί 5變成—凹形稱為碟形凹陷(dishmg),因為移除 大部分系統都提供裝置在化學機械研磨過程中偵測 A7 A7 五 發明説明(2) _ ' " 層3 ’這很重要’為了是保證當層4完全移除後, 不移除層3。為達此目的,層4相對於層3的一個實 移除速率是需要的。實務上,使層4的移除速率 3者為快才能達成此種必要的差異。因此對於層3與 $二工相對的移除速率有不同的需求,使其不易僅移除^ 元柯且不超過,同時避免碟形凹陷(dishing)效應。 μ .5^主技術中已提供許多方法處理此種問題,比方說, ^ i(l=年7月的美國專利第5,540,811號)說明一種方 臂性地在快速研磨材料的凸(突)面區域上置著含 料的區域以作保護。Buike等人Ο994年1〇月的 二_^ + 1第5,356,513號)交替疊置硬層與軟層,至少是硬_ 結構,在研磨時,移除硬材料時是從高點 軟材料接著快速加以#除,而仍在低點 i的加以侧,於是形成—大抵平坦的表 麵涵發ϋ用在充填鶴的通孔表面之平面化上,因為 鎢很硬,不會有碟形凹陷(dishing)的問題。 示-ϊΐϋίϋ961 i月的美國專利第5,516,729號教 =等當人㈣者時: 忠1 Ϊ的,以帽層材料保護。 這些s極工題系列次溝槽’ 發明綜論 溝槽目的在提供—種在频電路中作討效淺 (請先閱讀背面之注意事項再填寫本頁) 裝-^^ 370 ^^ 370 Λ7 B7 V. Description of the invention ΐΤΤ " ~~~~-Background of the invention (1) Field of invention: Especially the general field of mechanical polishing (CMP) process, a dish-shaped recess is formed during insulation) The problem. A part of the f sequence of the element ′ will be necessary for each different active local silicon edge ^. Probably the most widely used method is to convert to the phase LQ = S) 'where the selected area on the semiconductor surface is added, and the original f is oxide and semiconducting =: fog', and finally: plus: Extend to the surface of the substrate. ’Yu * developed a shallow trench insulation division). Relative to this type of insulation technology, there is-severe U (ΐ / iTgf. Mechanical research and correction 'the surface of the trench filled will produce dish-shaped depressions. We will explain it with reference to Figure 1a, which is the center of a silicon-based economic ministry. Printed by the Standard Bureau Shellfish Consumer Cooperative ^ _ Minus Layer 2 is covered with Nitrided Dream Layer 3. The post-quasi lithography technology has been patterned and has been placed on the side, secret 1 ^ slot 5 (through the opposite side of the ship) As—fresh; one is completely covered with a layer of insulating material such as silicon oxide 4. The more filling material is removed by chemical mechanical polishing method, and the removal rate (usually chemical mechanical polishing method) of 4 is significantly higher than Removal rate of the trench-like hood material 3. In order to meet the subsequent processing requirements, "..., except for all the layers 4 (except those filling the trench 5), the result is as shown in the figure:? 4ίί 5 becomes-concave called Dish-shaped dish (dishmg), because most of the systems are removed, the device is provided to detect A7 A7 during the chemical mechanical polishing process. 5 Description of invention (2) _ '" Layer 3' This is very important 'in order to ensure that when layer 4 is completely After removal, layer 3 is not removed. To achieve this, a real removal rate of layer 4 relative to layer 3 is required In practice, it is necessary to make the removal rate 3 of layer 4 fast to achieve this necessary difference. Therefore, there are different requirements for the relative removal rate of layer 3 and $ 2, which makes it difficult to remove only ^ Yuanke It does not exceed, while avoiding dishing effect. Μ .5 ^ Many methods have been provided in the main technology to deal with this kind of problem, for example, ^ i (l = US Patent No. 5,540,811 in July) illustrates a The square arm is provided with a material-containing area on the convex (protruded) surface area of the fast-grinding material for protection. Buike et al. (No. 5,356,513, October 10, 1994)) alternately stack hard layers and A soft layer, at least a hard structure, is removed from the high point soft material and then quickly removed during grinding when the hard material is removed, while it is still on the side of the low point i, so it forms-a flat surface It is used for the planarization of the surface of the through hole of the filling crane, because tungsten is very hard, and there is no problem of dishing. The US patent No. 5,516,729 for the month of 1981 is waiting for people : Loyalty 1 is protected by the cap material. These s pole work series of sub-grooves' invention summary Object to provide a trench - kind of effect as discussed shallow (Read Notes on the back and then fill the page) installed in the pilot circuit -

、1T 線--- &濟部中央標準局員工消費合作社印製 sv紙張尺度朝中标準(CNS )71¾^- (210X29?公兗 五、發明説明(3 A7 B7 良的終點 經濟部中央標準局員工消費合作社印製 目口!ΐ碟形凹陷_=。 間加上二額夕槽f遮罩材料與溝槽填充材料之 (以化學機械研特縣其移除速率 要的優點為ί點ΐ與填充材料兩者。另一] 之間的移除迷率f 更為谷胃’因為鮮層與過渡層 法,包括“已往技術形成並填充—溝槽的方 =!开:亡的碟形凹陷(dishing)效應。 加以填充Γ且置的各層,以準備按照本發明形成溝槽並 ^ 步驟之前所形成且填過頭的溝槽。 溝槽。’、出一已填充且平面化的沒有碟形凹陷(dishing)的 SSiSilSS. 特別縣說明-娜除的方法, 於本==^1:;2即$上述的溝槽邊緣之型態。因此關 ίί 。但應該注意的是,其他材料(我們將 招+玄ί可使用而不會偏離本發明的精神與範圍。 路之ί %国我們示出一種在製造程序中的積體電 矣而^刀一面不意圖。矽基板1含有—薄的熱氧化物2之 之Η 9已塗上一層氮化矽3,厚度約在αι與0.2微米 比特性是一種硬性材料,在化學機械研磨時 材ϋΐ?的?除速率為低。此例中氣化石夕是〆種優選 4因為其具有其他性質使其適用於IC的製造,但本發 本“尺度^^^^^7^47--- 請 先 閱 重I零 面 之 注 意 事 項 再 填 裝 訂 線, 1T line --- & Printed sv Paper Standards (CNS) 71 ^-(210X29?) By the Consumers' Cooperative of the Central Standards Bureau of the Ministry of Economic Affairs. Bureau ’s Consumer Cooperatives printed the Mouthpiece! Ϊ́ dish-shaped depression _ =. In addition to the two masking materials and groove filling materials for the Er'erxi groove (the advantage of the removal rate of chemical machinery research special county is ί point) ΐ and filling material. Another] the removal of f between the more frustrated 'because of the fresh layer and transition layer method, including "formed and filled by the previous technology-the square of the groove =! Kai: dead dish Dishing effect. The layers filled with Γ are filled to prepare trenches formed before the trenches are formed and filled in accordance with the present invention. Trenches. ', A filled and planarized Dish-shaped depression (SSiSilSS). Special county description-the method of removing, in this book == ^ 1 :; 2 is the shape of the groove edge described above. Therefore, it should be noted that other materials (We will use the + XuanLi can be used without departing from the spirit and scope of the present invention. We show an integrated circuit in the manufacturing process, but the knife is not intended. The silicon substrate 1 contains-a thin thermal oxide 2 of 9; has been coated with a layer of silicon nitride 3, the thickness is about αι and 0.2 The micron ratio characteristic is a hard material, and the removal rate of the material is low during chemical mechanical grinding. In this example, the gasified stone is the preferred type 4 because it has other properties that make it suitable for IC manufacturing, but the present invention This "size ^^^^^ 7 ^ 47 --- Please read the precautions for re-zeroing the zero side before filling the binding line

五、發明説明(4·) 經濟部中央標準局員工消費合作社印製 明若2=硬性材料如氮化硼,也仍缺有效。 形成-遮3將加以_化並_ 不同之要點為,在二j發明所介紹的與此慣例 上,r2; r重r: 以及稱後肋於層3 ί^ΐίί -sifr 刻,形成一溝槽遮罩' 随匕/加關 材料4填過頭/通常充 u2ifS5械研磨時的移除速率約為層4移除i率ί,4. ㈣,材層 用:=以的圖二:=;j} 勒快於層4,層21的移除速率則遠高於層3。的移除速皁 化學機械研磨之正確終止時間(即當層21 P全邱敕 ί 始移除層3時)現在‘當:易取^ 與層3間鎌速柄實騎致。由於有雜顯g 請 閲 讀 背 之 項 再i f % 本 頁 裝 訂 線V. Description of the invention (4 ·) Printed by the Consumer Cooperatives of the Central Standards Bureau of the Ministry of Economic Affairs. If 2 = hard materials such as boron nitride, it is still not effective. The formation-cover 3 will be _ified and _ different. The main point is that in the invention introduced by the second invention and this convention, r2; r heavy r: and called the back rib in layer 3 ί ^ ΐίί -sifr carved to form a groove The slot mask 'fills the head with the dagger / plus material 4 / usually the removal rate when the machine is filled with u2ifS5 is about the removal rate of layer 4,., ㈣, the material layer is used: = 以 的 图 二: =; j} is faster than layer 4, and the removal rate of layer 21 is much higher than that of layer 3. The correct end time of the removal of the speed soap of the chemical mechanical grinding (that is, when the layer 21 P Quan Qiu began to remove the layer 3) is now ‘dang: easy to take ^ and layer 3 sickle speed handle real riding. Due to miscellaneous content, please read the item on the back, and then i f% gutter on this page

) A« ( 21〇X297^iT A7 V 产 广、--一 〇/ V 0 - ----------- 五、發明細(5 ) '〜— 異,所以幾種終點偵測設計現在就可以有效作業, 視研磨馬達所吃的電流以及監視研磨塾的溫度。當務降; 率變慢時,這些數量都會增加,表示已經在晶圓與墊 間產生較大的磨擦。 雖然本發明已特別參考其優選實例示出並加以說明, 但本行專家應該瞭解,可以在不偏離本發明的精神與範圍 之下作出各種型態與細節的改變。 (請先閱讀背面之注意事項再填寫本頁) 經濟部中央標準局員工消費合作社印掣) A «(21〇X297 ^ iT A7 V production, --10 / V 0------------ V. Invention details (5) '~-Different, so several kinds of endpoint detection The test design can now operate effectively, depending on the current consumed by the grinding motor and monitoring the temperature of the grinding pad. When the rate decreases, these numbers will increase, indicating that greater friction has occurred between the wafer and the pad. Although the present invention has been shown and explained with particular reference to its preferred examples, experts in the bank should understand that various forms and details can be changed without departing from the spirit and scope of the present invention. (Please read the note on the back first Please fill in this page again)

本紙浪纽適用中CNS ) A4^ ( 21GX297公釐"TCNS for this paper Langau) A4 ^ (21GX297 mm " T

Claims (1)

f*; ί·\ ’ J θ V - ' 丨 、申請專利範圍 轉_麵材料之 一層提供-基板,部分覆蓋以具有—第^除速率的一第 的第iiiii積大於該第-移除速率 沉積一第三層,具有一小於=筮_ 第-移除速率之第三移除速率:g :⑤笠,率而大於該 上,該第二層因而形成該第一盘談j =二板及該第二層 提供偵測移除速率改變的二層間的界面; 該第二材料’直到該裝置偵測到 i如氮^補侧第1項之枝,射料—層為氮化石夕 3产申請專利範圍第1項之方法,其 矽、磷矽玻璃、或硼磷石夕玻璃。 ^第一層為夕μ &如申請專利朗第〗項之方法,其中該第三層為氧化 ^如申請專利範圍第1項之方法,其 fif十於該第一層之移除速率約在U ί 〇"ΐίρ?除速 率,於該第三層之移除速率約六移除速 Hi電路時填充-溝槽之製程H 改變提絲置用以在化學機械研磨時_材料移除速率之 在該碎基板之一表面上形成一層熱氧化物. 在該層熱氧化物上沉積一層氮化發. ’ 之移:機械研磨 形成-溝槽’具有壁面與寬度’延伸n (請先閲讀背面之注意事項再填寫本頁) .I — H ‘裝----- 訂 線 經濟部中央橾準局員工消費合作社印裝 7f *; ί \ 'J θ V-' 丨, one of the layers of the patent application range of surface materials is provided-the substrate, partially covered with a first iiiii product with a-^^ division rate is greater than the -removal rate A third layer is deposited with a third removal rate less than = 筮 _ the first-removal rate: g: ⑤ 笠, and the rate is greater than the above, the second layer thus forms the first panel j = two plates And the second layer provides an interface between the two layers that detects a change in the removal rate; the second material 'until the device detects i such as nitrogen, a branch of the first item on the side, and the shot-layer is a nitride stone 3 The method of producing patent application No. 1 is silicon, phosphosilicate glass, or borophosate glass. ^ The first layer is the method of applying for the first item of the patent, where the third layer is oxidized ^ The method of applying the first item of the scope of the patent, the fif is about ten times the removal rate of the first layer. The removal rate at U ί 〇 "? Ίρ ?, the removal rate of the third layer is about six. The process of filling-trenching when removing the Hi-circuit H. Changing the wire set for chemical mechanical polishing_ material removal A layer of thermal oxide is formed on one of the surfaces of the broken substrate. A layer of nitrided oxide is deposited on the layer of thermal oxide. 'Movement: Mechanically Grinding-Grooves' have a wall surface and a width of' n (please first (Please read the notes on the back and fill in this page) .I — H 'Installation ——- Printed by the Consumers' Cooperatives of the Central Government Bureau of the Ministry of Economic Affairs 申請專利範圍 減艺錆熱ίίίί進入該梦基板一深度内; 魂過厚度足以將該溝槽 開始雜㈣,奸賊置_到已 厚度’其找層氮切沉積之 9.如申請專利範圍第7項之製程, 度約在300與15〇〇 A之間。其中該過渡層沉積之厚 度約她 7項之製程’其中該溝槽寬度約在 項l其中該溝槽各壁之斜度 ;%申程,其中該續為多晶範圍第^項之製程,其中該用以_移除速ί ft裝置並含監視研磨馬達所吃電流或監祝研磨螯溫 度之裝置。 η 先 閲 1¾ 之 注 I 1 募裝 訂 線 經濟部中央榡準局員工消费合作社印裝 尽紙遘用肀國两豕棣率(CNS) A4規格(210><297公嫠)The scope of the patent application is reduced to a depth of the dream substrate; the thickness of the soul is too thick to start mixing the groove. The process of this item is between 300 and 150A. The process in which the thickness of the transition layer is deposited is about 7 of her process, wherein the width of the trench is about 1 in which the slope of the walls of the trench; Among them, the device for removing the high-speed ft device and includes a device for monitoring the current consumed by the grinding motor or monitoring the temperature of the grinding chel. η Please read the note of 1¾ first. I 1 Binding Line Printed by the Consumers' Cooperative of the Central Bureau of Standards of the Ministry of Economic Affairs. Printed out of paper. Use the National Two Rate (CNS) A4 Specification (210 > < 297g)
TW87106988A 1998-05-07 1998-05-07 A method to avoid dishing in shallow trench isolation TW379379B (en)

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