TW372273B - Micro normal force calibrator and calibration method - Google Patents

Micro normal force calibrator and calibration method

Info

Publication number
TW372273B
TW372273B TW087114929A TW87114929A TW372273B TW 372273 B TW372273 B TW 372273B TW 087114929 A TW087114929 A TW 087114929A TW 87114929 A TW87114929 A TW 87114929A TW 372273 B TW372273 B TW 372273B
Authority
TW
Taiwan
Prior art keywords
force
strain gauge
micrometer
probe
gauge
Prior art date
Application number
TW087114929A
Other languages
Chinese (zh)
Inventor
Hung-Ru Yan
Li-Sheng Chen
Wei-Tai Jao
Jr-Ming Wu
Original Assignee
Ind Tech Res Inst
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ind Tech Res Inst filed Critical Ind Tech Res Inst
Priority to TW087114929A priority Critical patent/TW372273B/en
Application granted granted Critical
Publication of TW372273B publication Critical patent/TW372273B/en

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  • Testing Or Calibration Of Command Recording Devices (AREA)

Abstract

A kind of micro normal force calibrator which includes a table supporter which has a two-dimensional displacement tuning device on the base; and with a fixture for a flexibly strain gauge. There is a micrometer on the supporter which connects a probe below it. With a load cell on the probe, the load cell and the flexible strain gauge are connected to a signal transmitter to output to a signal amplifier for display. The calibration method employing the said calibrator to calibrate a precise measuring apparatus which includes (1) fix the flexible strain gauge on the fixture; (2) use the two-dimensional displacement tuning device to adjust the position of gauge; (3) adjust the micrometer so the probe can contact lightly on the surface of gauge and reset the amplifier to zero; (4) adjust the micrometer so the probe move downward and force on the strain gauge; at the same time, to record the force and strain from the micrometer and amplifier; (5) plot the two calibration curves by force and displacement. The user can use the curves to get the normal clamping force when he set up another flexible strain gauge with the connector.
TW087114929A 1998-09-08 1998-09-08 Micro normal force calibrator and calibration method TW372273B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW087114929A TW372273B (en) 1998-09-08 1998-09-08 Micro normal force calibrator and calibration method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW087114929A TW372273B (en) 1998-09-08 1998-09-08 Micro normal force calibrator and calibration method

Publications (1)

Publication Number Publication Date
TW372273B true TW372273B (en) 1999-10-21

Family

ID=57941612

Family Applications (1)

Application Number Title Priority Date Filing Date
TW087114929A TW372273B (en) 1998-09-08 1998-09-08 Micro normal force calibrator and calibration method

Country Status (1)

Country Link
TW (1) TW372273B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106895930A (en) * 2017-02-22 2017-06-27 深圳市中葛科技有限公司 A kind of micro- power of cantilever beam structure and micro-displacement sensing device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106895930A (en) * 2017-02-22 2017-06-27 深圳市中葛科技有限公司 A kind of micro- power of cantilever beam structure and micro-displacement sensing device

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