TW366427B - Manufacturing defect analysis method and the apparatus - Google Patents

Manufacturing defect analysis method and the apparatus

Info

Publication number
TW366427B
TW366427B TW086107783A TW86107783A TW366427B TW 366427 B TW366427 B TW 366427B TW 086107783 A TW086107783 A TW 086107783A TW 86107783 A TW86107783 A TW 86107783A TW 366427 B TW366427 B TW 366427B
Authority
TW
Taiwan
Prior art keywords
analysis method
defect analysis
manufacturing defect
flaws
connection
Prior art date
Application number
TW086107783A
Other languages
Chinese (zh)
Inventor
Hsi-Hua Hsiao
Original Assignee
Jet Test Equipment Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jet Test Equipment Inc filed Critical Jet Test Equipment Inc
Priority to TW086107783A priority Critical patent/TW366427B/en
Application granted granted Critical
Publication of TW366427B publication Critical patent/TW366427B/en

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  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

The present invention of manufacturing defect analysis method and the apparatus is for use for testing of flaws in the connection between the assembly circuit board and the lead on the IC components, by using mainly the equivalent circuit of diodes to AC signals and in simple, effective operation procedures and devices for measurement of flaws in connection on the selected lead pairs.
TW086107783A 1997-06-05 1997-06-05 Manufacturing defect analysis method and the apparatus TW366427B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW086107783A TW366427B (en) 1997-06-05 1997-06-05 Manufacturing defect analysis method and the apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW086107783A TW366427B (en) 1997-06-05 1997-06-05 Manufacturing defect analysis method and the apparatus

Publications (1)

Publication Number Publication Date
TW366427B true TW366427B (en) 1999-08-11

Family

ID=57941110

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086107783A TW366427B (en) 1997-06-05 1997-06-05 Manufacturing defect analysis method and the apparatus

Country Status (1)

Country Link
TW (1) TW366427B (en)

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