TW359014B - Anti-stripping IC bonding pad structure - Google Patents
Anti-stripping IC bonding pad structureInfo
- Publication number
- TW359014B TW359014B TW086113410A TW86113410A TW359014B TW 359014 B TW359014 B TW 359014B TW 086113410 A TW086113410 A TW 086113410A TW 86113410 A TW86113410 A TW 86113410A TW 359014 B TW359014 B TW 359014B
- Authority
- TW
- Taiwan
- Prior art keywords
- conductive layer
- stripping
- bonding pad
- pad structure
- layer
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/484—Connecting portions
- H01L2224/4847—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a wedge bond
Landscapes
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Abstract
An anti-stripping IC bonding pad structure, disposed on the substrate of a semiconductor, including: an insulation layer, formed on the substrate; a conductive layer, formed on the insulation layer; a coating, covering the perimeter of the conductive layer and overlapping the metal layer, being the conductive layer not be covered a connection region; and a plurality of island objects, formed between the insulation layer under the bonding region and the conductive layer, in connection with the conductive layer interlockedly.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW086113410A TW359014B (en) | 1997-09-15 | 1997-09-15 | Anti-stripping IC bonding pad structure |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW086113410A TW359014B (en) | 1997-09-15 | 1997-09-15 | Anti-stripping IC bonding pad structure |
Publications (1)
Publication Number | Publication Date |
---|---|
TW359014B true TW359014B (en) | 1999-05-21 |
Family
ID=57940575
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW086113410A TW359014B (en) | 1997-09-15 | 1997-09-15 | Anti-stripping IC bonding pad structure |
Country Status (1)
Country | Link |
---|---|
TW (1) | TW359014B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI585927B (en) * | 2014-02-21 | 2017-06-01 | 新川股份有限公司 | Method for producing semiconductor apparatus, semiconductor apparatus and wire bonding apparatus |
-
1997
- 1997-09-15 TW TW086113410A patent/TW359014B/en not_active IP Right Cessation
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI585927B (en) * | 2014-02-21 | 2017-06-01 | 新川股份有限公司 | Method for producing semiconductor apparatus, semiconductor apparatus and wire bonding apparatus |
US9887174B2 (en) | 2014-02-21 | 2018-02-06 | Shinkawa Ltd. | Semiconductor device manufacturing method, semiconductor device, and wire bonding apparatus |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |