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Application filed by Macronix Int Co LtdfiledCriticalMacronix Int Co Ltd
Priority to TW086118825ApriorityCriticalpatent/TW350953B/en
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Publication of TW350953BpublicationCriticalpatent/TW350953B/en
For Increasing The Reliability Of Semiconductor Memories
(AREA)
Abstract
A sort of low-current page buffer floating port memory unit page writing operation, programming, reading and removal test method, including the memory state for determination of the memory unit array where the memory unit execution programming, reading memory unit array memory unit, for execution of the memory unit and removal of part of it and the memory IC.
TW086118825A1997-12-131997-12-13Low-current page buffer floating port memory unit page writing operation, programming, reading and removal test method
TW350953B
(en)