TW339168U - Structure of a testing device for electric components - Google Patents

Structure of a testing device for electric components

Info

Publication number
TW339168U
TW339168U TW086211884U TW86211884U TW339168U TW 339168 U TW339168 U TW 339168U TW 086211884 U TW086211884 U TW 086211884U TW 86211884 U TW86211884 U TW 86211884U TW 339168 U TW339168 U TW 339168U
Authority
TW
Taiwan
Prior art keywords
testing device
electric components
electric
components
testing
Prior art date
Application number
TW086211884U
Other languages
Chinese (zh)
Inventor
Hai-Tao Huang
Wei Huang
Original Assignee
Hai-Tao Huang
Wei Huang
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hai-Tao Huang, Wei Huang filed Critical Hai-Tao Huang
Priority to TW086211884U priority Critical patent/TW339168U/en
Publication of TW339168U publication Critical patent/TW339168U/en

Links

TW086211884U 1997-07-16 1997-07-16 Structure of a testing device for electric components TW339168U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW086211884U TW339168U (en) 1997-07-16 1997-07-16 Structure of a testing device for electric components

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW086211884U TW339168U (en) 1997-07-16 1997-07-16 Structure of a testing device for electric components

Publications (1)

Publication Number Publication Date
TW339168U true TW339168U (en) 1998-08-21

Family

ID=54634558

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086211884U TW339168U (en) 1997-07-16 1997-07-16 Structure of a testing device for electric components

Country Status (1)

Country Link
TW (1) TW339168U (en)

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