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Application filed by United Microelectronics CorpfiledCriticalUnited Microelectronics Corp
Priority to TW086103716ApriorityCriticalpatent/TW337602B/en
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Publication of TW337602BpublicationCriticalpatent/TW337602B/en
A method of chip testing, in which the chip at least comprises a plurality of input/output blocks and corresponding input/output terminals, which method comprising: based on the input/output blocks with same electrical properties, connecting the corresponding input/output terminals in parallel; through the input/output terminals, writing at least one test data item in the input/output blocks; and through the input/output terminals, writing at least one item of data from the input/output blocks, and comparing whether the data is identical to the test data.
TW086103716A1997-03-241997-03-24Chip testing device and method thereof
TW337602B
(en)