TW337602B - Chip testing device and method thereof - Google Patents

Chip testing device and method thereof

Info

Publication number
TW337602B
TW337602B TW086103716A TW86103716A TW337602B TW 337602 B TW337602 B TW 337602B TW 086103716 A TW086103716 A TW 086103716A TW 86103716 A TW86103716 A TW 86103716A TW 337602 B TW337602 B TW 337602B
Authority
TW
Taiwan
Prior art keywords
input
output
chip testing
testing device
output terminals
Prior art date
Application number
TW086103716A
Other languages
Chinese (zh)
Inventor
Jiann-Shin Lii
Original Assignee
United Microelectronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by United Microelectronics Corp filed Critical United Microelectronics Corp
Priority to TW086103716A priority Critical patent/TW337602B/en
Application granted granted Critical
Publication of TW337602B publication Critical patent/TW337602B/en

Links

Landscapes

  • Semiconductor Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

A method of chip testing, in which the chip at least comprises a plurality of input/output blocks and corresponding input/output terminals, which method comprising: based on the input/output blocks with same electrical properties, connecting the corresponding input/output terminals in parallel; through the input/output terminals, writing at least one test data item in the input/output blocks; and through the input/output terminals, writing at least one item of data from the input/output blocks, and comparing whether the data is identical to the test data.
TW086103716A 1997-03-24 1997-03-24 Chip testing device and method thereof TW337602B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW086103716A TW337602B (en) 1997-03-24 1997-03-24 Chip testing device and method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW086103716A TW337602B (en) 1997-03-24 1997-03-24 Chip testing device and method thereof

Publications (1)

Publication Number Publication Date
TW337602B true TW337602B (en) 1998-08-01

Family

ID=58263218

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086103716A TW337602B (en) 1997-03-24 1997-03-24 Chip testing device and method thereof

Country Status (1)

Country Link
TW (1) TW337602B (en)

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees