Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ind Tech Res InstfiledCriticalInd Tech Res Inst
Priority to TW086100753ApriorityCriticalpatent/TW333629B/en
Application grantedgrantedCritical
Publication of TW333629BpublicationCriticalpatent/TW333629B/en
An identifying method to proceed model match for unknown input sample with characteristic vector of reference model with k classifications, in which, 1≰k≰K. This method includes following steps: Calculate critical value CRk of sample distribution region related to each classification k. Calculate critical value Dak of fuzzy sample distribution region related to each classification k. Input a to-be-identified sample. Calculate the characteristic vector X of input sample. Find the classification M nearest to input sample, and 2nd near classification S. Based on the critical value CRm of sample distribution region and Dam of fuzzy sample distribution region in classification M, to determine the input sample whether is identified alone or rejected.
TW086100753A1997-01-221997-01-22The design method and apparatus for reliability identifying system
TW333629B
(en)
Method and equipment of processing sample for optical analysis, and method of controlling the equipment thereof in the semiconductor device manufacturing process