TW332291B - Semiconductor memory, device for driving data signal of circuit to wanted level, circuit for driving first and second signal to wanted level, DRAM structure, method for driving data signal to wanted level, method for driving first and second signal to wa - Google Patents
Semiconductor memory, device for driving data signal of circuit to wanted level, circuit for driving first and second signal to wanted level, DRAM structure, method for driving data signal to wanted level, method for driving first and second signal to waInfo
- Publication number
- TW332291B TW332291B TW086100328A TW86100328A TW332291B TW 332291 B TW332291 B TW 332291B TW 086100328 A TW086100328 A TW 086100328A TW 86100328 A TW86100328 A TW 86100328A TW 332291 B TW332291 B TW 332291B
- Authority
- TW
- Taiwan
- Prior art keywords
- driving
- voltage
- signal
- pair
- power terminal
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
- G11C5/147—Voltage reference generators, voltage or current regulators; Internally lowered supply levels; Compensation for voltage drops
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/4076—Timing circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4091—Sense or sense/refresh amplifiers, or associated sense circuitry, e.g. for coupled bit-line precharging, equalising or isolating
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4094—Bit-line management or control circuits
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Dram (AREA)
- Semiconductor Memories (AREA)
Abstract
A semiconductor memory have (1) Bit line pair; (2) A plurality of word lines; (3) A plurality of dynamic cells, each is combined with one of bit lines constituting said bit line pair and one of said a plurality of word lines; (4) Sense amplifier including a pair of PMOS transistors and a pair of NMOS transistors, in which the PMOS transistor pair and the NMOS transistor pair have commonly connected source respectively, and drain respectively connected to said bit line pair, and gate cross-connected to the drain; (5) First power terminal; (6) Second power terminal; (7) First switch transistor connected between said first power terminal and said source of said PMOS transistor; (8) Second switch transistor connected between said second power terminal and said source of said PMOS transistor; (9) Voltage generator for providing first voltage lower than second voltage provided by said second power terminal; And comprises the features: (1) Said sense amplifier for providing complementary signals having H-side voltage and L-side voltage to said bit line pair based on relating information of memory cell selected by said a plurality of dynamic memory; (2) During first period, in response to enable state of said second switch transistor, the said H-side voltage rises to above said first voltage; (3) During second period after said first period, in response to enable state of said first switch transistor, the said H-side voltage falls, thereby forces said H-side voltage to be set to said first voltage.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US998496P | 1996-01-26 | 1996-01-26 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW332291B true TW332291B (en) | 1998-05-21 |
Family
ID=21740850
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW086100328A TW332291B (en) | 1996-01-26 | 1997-01-14 | Semiconductor memory, device for driving data signal of circuit to wanted level, circuit for driving first and second signal to wanted level, DRAM structure, method for driving data signal to wanted level, method for driving first and second signal to wa |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP3810160B2 (en) |
KR (1) | KR100443100B1 (en) |
SG (1) | SG63689A1 (en) |
TW (1) | TW332291B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7423911B2 (en) | 2005-09-29 | 2008-09-09 | Hynix Semiconductor Inc. | Bit line control circuit for semiconductor memory device |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6535415B2 (en) | 1999-02-22 | 2003-03-18 | Hitachi, Ltd. | Semiconductor device |
KR100551070B1 (en) * | 2000-12-30 | 2006-02-10 | 주식회사 하이닉스반도체 | Sense amp overdrive circuit for increasing current efficiency and stability |
KR100746615B1 (en) | 2006-02-20 | 2007-08-06 | 주식회사 하이닉스반도체 | Sense amplifier control circuit and semiconductor device |
KR100869341B1 (en) * | 2007-04-02 | 2008-11-19 | 주식회사 하이닉스반도체 | Semiconductor memory device and operation method thereof |
JP4998443B2 (en) * | 2008-12-01 | 2012-08-15 | 富士通セミコンダクター株式会社 | Semiconductor device |
-
1996
- 1996-12-02 JP JP32122396A patent/JP3810160B2/en not_active Expired - Lifetime
-
1997
- 1997-01-14 TW TW086100328A patent/TW332291B/en not_active IP Right Cessation
- 1997-01-20 KR KR1019970001416A patent/KR100443100B1/en not_active IP Right Cessation
- 1997-01-20 SG SG1997000130A patent/SG63689A1/en unknown
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7423911B2 (en) | 2005-09-29 | 2008-09-09 | Hynix Semiconductor Inc. | Bit line control circuit for semiconductor memory device |
Also Published As
Publication number | Publication date |
---|---|
KR100443100B1 (en) | 2004-10-28 |
JP3810160B2 (en) | 2006-08-16 |
KR970060232A (en) | 1997-08-12 |
SG63689A1 (en) | 1999-03-30 |
JPH09204777A (en) | 1997-08-05 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |