TW330302B - Wafer output control and management method and system in an IC plant - Google Patents

Wafer output control and management method and system in an IC plant

Info

Publication number
TW330302B
TW330302B TW086108856A TW86108856A TW330302B TW 330302 B TW330302 B TW 330302B TW 086108856 A TW086108856 A TW 086108856A TW 86108856 A TW86108856 A TW 86108856A TW 330302 B TW330302 B TW 330302B
Authority
TW
Taiwan
Prior art keywords
plant
wip
calculate
stage
management method
Prior art date
Application number
TW086108856A
Other languages
Chinese (zh)
Inventor
Yean-Sheng Pan
Horng-Huei Tzeng
Original Assignee
Vanguard Int Semiconduct Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Vanguard Int Semiconduct Corp filed Critical Vanguard Int Semiconduct Corp
Priority to TW086108856A priority Critical patent/TW330302B/en
Application granted granted Critical
Publication of TW330302B publication Critical patent/TW330302B/en

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  • Testing And Monitoring For Control Systems (AREA)
  • General Factory Administration (AREA)

Abstract

An output management method for a fabrication plant employing a multiple-step process during a running period includes the following steps: a) determine the stage of work in process (WIP) in flow (Ifij) in the plant; b) determine the stage of WIP out flow (Ofij) in the plant; c) calculate the flow intensity (Flij) of the plant; d) calculate the equipment capacity (Cij) of the plant; e) calculate the equipment capacity allocation (Ecij) of the plant; f) determine the bottleneck stage capacity (Scij) of the plant; g) determine the rolling output (Oij) of the plant; h) calculate the remaining WIP (Rwij) in the plant; I) collect the daily output (Doij); j) duplicate the remaining WIP (Rwij) as the initial WIP (Wij) for the next day; k) test if the running period is already finished; go back to step (a) and repeat the process until the running period is finished.
TW086108856A 1997-06-25 1997-06-25 Wafer output control and management method and system in an IC plant TW330302B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW086108856A TW330302B (en) 1997-06-25 1997-06-25 Wafer output control and management method and system in an IC plant

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW086108856A TW330302B (en) 1997-06-25 1997-06-25 Wafer output control and management method and system in an IC plant

Publications (1)

Publication Number Publication Date
TW330302B true TW330302B (en) 1998-04-21

Family

ID=58262592

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086108856A TW330302B (en) 1997-06-25 1997-06-25 Wafer output control and management method and system in an IC plant

Country Status (1)

Country Link
TW (1) TW330302B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1999042939A1 (en) * 1998-02-20 1999-08-26 Hagen Method Pty. Limited Method and system for controlling processes
US6128540A (en) * 1998-02-20 2000-10-03 Hagen Method Pty. Ltd. Method and computer system for controlling an industrial process using financial analysis

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1999042939A1 (en) * 1998-02-20 1999-08-26 Hagen Method Pty. Limited Method and system for controlling processes
GB2337835A (en) * 1998-02-20 1999-12-01 Hagen Method Pty Limited Method and system for controlling processes
GB2337835B (en) * 1998-02-20 2000-07-19 Hagen Method Pty Limited Improvements relating to controlling processes
US6128540A (en) * 1998-02-20 2000-10-03 Hagen Method Pty. Ltd. Method and computer system for controlling an industrial process using financial analysis

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