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Application filed by United Microelectronics CorpfiledCriticalUnited Microelectronics Corp
Priority to TW084102991ApriorityCriticalpatent/TW326600B/en
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Publication of TW326600BpublicationCriticalpatent/TW326600B/en
For Increasing The Reliability Of Semiconductor Memories
(AREA)
Detection And Correction Of Errors
(AREA)
Abstract
A method of error control coding for rank three mask ROM includes the following steps: a. read out the rank 3 data array to form a data collection with rank 2 structure b. provide plural check bits of rank 2 c. generate the weighting bit with respect to the data collection and the check bits d. correct the data collection according to the weighting bit e. selectively transform the corrected data collection into plural data bits of rank 2.
TW084102991A1995-03-281995-03-28Method and apparatus of error control coding for rank three mask ROM
TW326600B
(en)
Method and system for performing transmission of digital data by coding bit information into the shape of a pulse and decoding the bit information from the shape of the pulse
An information transmission method with error correction for data symbols,an error correcting decoding method for such data symbols,an apparatus for information transmission for use with the method,a device for information decoding for use with the method,and an apparatus for use with such device
Method for transformation of sequence of informatioin words of m bits long into modulated signal, method for manufacture of record medium, coding device, decoding device, recording device, readout device and record medium