TW239224B - Process for Si epitaxy - Google Patents

Process for Si epitaxy

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Publication number
TW239224B
TW239224B TW83108107A TW83108107A TW239224B TW 239224 B TW239224 B TW 239224B TW 83108107 A TW83108107 A TW 83108107A TW 83108107 A TW83108107 A TW 83108107A TW 239224 B TW239224 B TW 239224B
Authority
TW
Taiwan
Prior art keywords
substrate
plasma
epitaxy
sih4
lying
Prior art date
Application number
TW83108107A
Other languages
Chinese (zh)
Inventor
Tsuey-Rong You
Cherng-Shian Chen
Ming-Deng Shieh
Jia-Pyng Lii
Original Assignee
Nat Science Committee
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nat Science Committee filed Critical Nat Science Committee
Priority to TW83108107A priority Critical patent/TW239224B/en
Application granted granted Critical
Publication of TW239224B publication Critical patent/TW239224B/en

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  • Chemical Vapour Deposition (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)

Abstract

A process for growing Si epitaxy in low temperature, which is applicable on one Si substrate, includes the following steps: 1. dull the surface of Si substrate with one chemical solution including H; 2. placing the Si substrate into the reactor chamber of plasma-enhanced chemical vapor deposition system, after vacuum-pumping, then piping the H gas and heating the Si substrate to between 165 and 450 degree centigrade; 3. piping the SiH4 and H2 as the reacting gas, applying one radio frequency plasma to reactivate the reacting gas as plasma and forming as one Si epitaxy on the Si substrate, in which the condition for forming the Si epitaxy includes: (1) the flow of SiH4 lying between 2 and 100 sccm; (2) the flow of H2 lying between 16 and 900 sccm; (3) the total pressure of the reactor chamber of plasma-enhanced chemical vapor deposition system controlled between 50 mTorr and 2 Torr; (4) the power of radio frequency plasma lying between 5 and 50 W; (5) the flow ratio of SiH4 versus H2 being less or equal 1/4.
TW83108107A 1994-09-03 1994-09-03 Process for Si epitaxy TW239224B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW83108107A TW239224B (en) 1994-09-03 1994-09-03 Process for Si epitaxy

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW83108107A TW239224B (en) 1994-09-03 1994-09-03 Process for Si epitaxy

Publications (1)

Publication Number Publication Date
TW239224B true TW239224B (en) 1995-01-21

Family

ID=51400786

Family Applications (1)

Application Number Title Priority Date Filing Date
TW83108107A TW239224B (en) 1994-09-03 1994-09-03 Process for Si epitaxy

Country Status (1)

Country Link
TW (1) TW239224B (en)

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