TW238410B - Process for lateral bipolar transistor - Google Patents

Process for lateral bipolar transistor

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Publication number
TW238410B
TW238410B TW83103959A TW83103959A TW238410B TW 238410 B TW238410 B TW 238410B TW 83103959 A TW83103959 A TW 83103959A TW 83103959 A TW83103959 A TW 83103959A TW 238410 B TW238410 B TW 238410B
Authority
TW
Taiwan
Prior art keywords
conductive
bipolar transistor
mask
collector
implanting
Prior art date
Application number
TW83103959A
Other languages
Chinese (zh)
Inventor
Yng-Tzong Uang
Sheng-Shyong Yang
Original Assignee
United Microelectronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by United Microelectronics Corp filed Critical United Microelectronics Corp
Priority to TW83103959A priority Critical patent/TW238410B/en
Application granted granted Critical
Publication of TW238410B publication Critical patent/TW238410B/en

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  • Bipolar Transistors (AREA)

Abstract

A process for lateral bipolar transistor includes: 1. after implanting the second conductive well mask and ion on the first conductive Si semiconductor substrate, then forming the pad oxide and Si3N4 sequentially, then through one field mask and oxidization to form active region and field oxide on the surface of Si semiconductor substrate and forming the second conductive well; 2. depositing one polysilicon layer and doping it with high density and etching to form the emitter of bipolar transistor, and the etching step including the over etching makes the Si substrate etched to form collector trench; 3. depositing one dielectric layer and etching back to remain dielectric space on the sidewall of collector trench, then implanting the first conductive mask and dopant ion to form the collector of bipolar transistor; 4. implanting the second conductive mask and dopant ion to form the base of bipolar transistor; 5. through one high temperature drive in step to make the first conductive dopant in the polysilicon of emitter expand outside to form emitter expansion area; 6. by separately controlling the depth of collector trench and the width of dielectric space and the structrue of collector trench to achieve the increase of current gain and component density.
TW83103959A 1994-05-02 1994-05-02 Process for lateral bipolar transistor TW238410B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW83103959A TW238410B (en) 1994-05-02 1994-05-02 Process for lateral bipolar transistor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW83103959A TW238410B (en) 1994-05-02 1994-05-02 Process for lateral bipolar transistor

Publications (1)

Publication Number Publication Date
TW238410B true TW238410B (en) 1995-01-11

Family

ID=51400733

Family Applications (1)

Application Number Title Priority Date Filing Date
TW83103959A TW238410B (en) 1994-05-02 1994-05-02 Process for lateral bipolar transistor

Country Status (1)

Country Link
TW (1) TW238410B (en)

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