TW202422086A - Method for detecting crack in ceramic insulated wire - Google Patents
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- 238000000034 method Methods 0.000 title abstract description 4
- 238000005070 sampling Methods 0.000 claims abstract description 21
- 238000012360 testing method Methods 0.000 claims description 26
- 239000000523 sample Substances 0.000 claims description 19
- 238000004364 calculation method Methods 0.000 claims description 6
- 238000012545 processing Methods 0.000 claims description 5
- 238000010998 test method Methods 0.000 claims 3
- 238000005452 bending Methods 0.000 abstract description 12
- 238000009413 insulation Methods 0.000 description 12
- 229910052751 metal Inorganic materials 0.000 description 7
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- 238000004519 manufacturing process Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 238000001000 micrograph Methods 0.000 description 2
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- 230000008859 change Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000006056 electrooxidation reaction Methods 0.000 description 1
- 238000007429 general method Methods 0.000 description 1
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- 230000004048 modification Effects 0.000 description 1
- 239000012811 non-conductive material Substances 0.000 description 1
- 229920003023 plastic Polymers 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920002379 silicone rubber Polymers 0.000 description 1
- 239000004945 silicone rubber Substances 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
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Abstract
Description
本發明係有關於一種可以快速判斷陶瓷電線於彎曲狀態下是否產生裂痕的測試方法。The present invention relates to a testing method that can quickly determine whether a ceramic wire has cracks when it is bent.
目前一般的絕緣導線或是一電纜，主要係在一導線外圍包覆一層不導電的材料，例如：樹脂、塑膠、矽橡膠等，藉以形成一絕緣層，以防止該導線與外界接觸造成漏電、短路、觸電等事故。因此，該絕緣導線或該電纜可廣泛的應用在我們的生活用電或工業用電等範圍。然而，傳統的該絕緣層容易受到高溫的影響而加速老化並損壞，在超過200℃即容易損壞燒毀，以至於因此發生短路、電線走火或引發火災等危險狀況。At present, the general insulated wire or cable is mainly a layer of non-conductive material wrapped around the outer periphery of the wire, such as resin, plastic, silicone rubber, etc., to form an insulating layer to prevent the wire from contacting the outside world and causing leakage, short circuit, electric shock and other accidents. Therefore, the insulated wire or the cable can be widely used in our daily electricity or industrial electricity. However, the traditional insulating layer is easily affected by high temperature and accelerates aging and damage. It is easy to be damaged and burned when it exceeds 200℃, so that short circuit, wire fire or fire and other dangerous situations occur.
因此有中華民國110年7月11日所公開的發明第202125538號「具有陶瓷絕緣層的撓曲導電線的製造方法」專利案。其係揭露：撓曲導電線包括一導線及包覆於該導線之一陶瓷絕緣層，該導線包括一鋁質外層，該撓曲導電線的製造方法包含下列步驟：對該導線施予一彎曲動作使該導線呈一撓曲狀定型；及對該導線施予一電化學氧化反應，使該導線的鋁質外層形成該陶瓷絕緣層，其中，該陶瓷絕緣層包括一緻密底層及一多孔結構層，使該陶瓷絕緣層能承受的介電強度為每毫米600伏特的電壓而不擊穿，則該陶瓷絕緣層能跟著該導線彎曲，解決該陶瓷絕緣層的低延展性導致使用上的限制，且又具有極強的介電強度。Therefore, there is a patent case No. 202125538 "Manufacturing method of a bendable conductive wire with a ceramic insulation layer" published on July 11, 2021. It discloses that: the bendable conductive wire includes a conductive wire and a ceramic insulation layer coated on the conductive wire, the conductive wire includes an aluminum outer layer, and the manufacturing method of the bendable conductive wire includes the following steps: applying a bending action to the conductive wire to shape the conductive wire into a bend; and applying an electrochemical oxidation reaction to the conductive wire to form the aluminum outer layer of the conductive wire into the ceramic insulation layer. The ceramic insulation layer includes a dense bottom layer and a porous structure layer, so that the dielectric strength of the ceramic insulation layer can withstand a voltage of 600 volts per millimeter without breakdown. The ceramic insulation layer can bend along with the wire, thus solving the limitation of use caused by the low ductility of the ceramic insulation layer and having extremely strong dielectric strength.
該專利前案利用該陶瓷絕緣層，能夠承受的介電強度為每毫米600伏特的電壓，而不被擊穿，藉以確保該導電線使用上的安全性。惟該導電線的該陶瓷絕緣層，在製程上會因金屬層氧化不完全或未氧化，甚至是因搬運或使用，而使陶瓷絕緣層產生破損，而導電線上破損會有漏電疑慮，也會增加短路、電線走火或引發火災等發生的機率。如果裂痕是肉眼可見時，係可直接的予以修補；如果是肉眼無法辨視時，則無法發覺裂痕的存在，如果繼續使用時就會有其危險性的存在。The patent application utilizes the ceramic insulation layer, which can withstand a dielectric strength of 600 volts per millimeter without being broken down, to ensure the safety of the conductive wire. However, the ceramic insulation layer of the conductive wire may be damaged during the manufacturing process due to incomplete or unoxidized metal layer, or even due to transportation or use. Damage to the conductive wire may cause leakage, and increase the probability of short circuit, wire spark or fire. If the crack is visible to the naked eye, it can be repaired directly; if it is not visible to the naked eye, the existence of the crack cannot be detected, and it will be dangerous if it continues to be used.
一般裂痕的修補方法，如中華民國110年7月21日所公告的發明第I734325號「電線表面陶瓷絕緣層的修補方法」專利案。其係揭露：該電線包括一金屬導線及包覆於該金屬導線外層之一陶瓷絕緣層，該修補方法包含在該陶瓷絕緣層的一破損處上的一金屬層上施予一高溫氧化處理，使該破損處的金屬層氧化形成一陶瓷層。上述高溫氧化處理可採用電漿或施以高溫火焰，可快速將該金屬層形成絕緣的陶瓷層，避免由該陶瓷絕緣層的破損處產生漏電的風險，且金屬導線在通以250伏特的電壓下，該陶瓷層阻抗大於50MΩ。A general method for repairing cracks is disclosed in Patent No. I734325, "Method for repairing ceramic insulation layer on the surface of electric wire," which was announced on July 21, 2011. It discloses that the electric wire includes a metal wire and a ceramic insulation layer coated on the outer layer of the metal wire. The repair method includes applying a high-temperature oxidation treatment to a metal layer on a damaged portion of the ceramic insulation layer, so that the metal layer at the damaged portion is oxidized to form a ceramic layer. The high temperature oxidation treatment can be performed by plasma or high temperature flame, which can quickly transform the metal layer into an insulating ceramic layer to avoid the risk of leakage caused by the damage of the ceramic insulating layer. When the metal wire is subjected to a voltage of 250 volts, the impedance of the ceramic layer is greater than 50MΩ.
該專利前案雖然可以修補導電線的裂痕，但以不同製造條件所生產的導電線，所能承受的彎曲程度也不同，因此無法快速的檢測出陶瓷絕緣層在不同的彎曲程度下會不會產生裂痕。也無法針對不同的導電線，予以找出使用時的最小彎曲極限。Although the prior patent can repair cracks in conductive wires, conductive wires produced under different manufacturing conditions can withstand different degrees of bending, so it is impossible to quickly detect whether the ceramic insulating layer will crack under different degrees of bending. It is also impossible to find the minimum bending limit of different conductive wires during use.
爰此，有鑑於目前的陶瓷電線於彎曲時容易產生裂痕，而難以被發覺。故本發明提供一種陶瓷電線裂痕測試方法，包含有：A.使一陶瓷電線處於一平直狀態下，施予大於500MV的一電壓，並測量該陶瓷電線表面至少一測量點的阻抗值，以做為一標準值，該阻抗值係介於20MΩ至20000MΩ之間；B.使該陶瓷電線處於一彎曲狀態下，同樣施予該電壓，並測量該陶瓷電線表面於不同曲率下複數個取樣點的阻抗值，以做為一取樣值，該曲率係介於0.05公分 -1至0.5公分 -1之間；C.比對該取樣值與該標準值之間的差異，以取得一比對結果，並根據該比對結果，判斷該待測陶瓷電線是否產生裂痕，該取樣值超出該標準值，則判斷該陶瓷電線有產生裂痕，該取樣值未超出該標準值，則判斷該陶瓷電線沒有產生裂痕。 Therefore, in view of the fact that the existing ceramic wires are prone to cracks when bent, and are difficult to be detected, the present invention provides a ceramic wire crack testing method, comprising: A. placing a ceramic wire in a straight state, applying a voltage greater than 500 MV, and measuring the impedance value of at least one measuring point on the surface of the ceramic wire as a standard value, the impedance value being between 20 MΩ and 20000 MΩ; B. placing the ceramic wire in a bent state, applying the voltage in the same manner, and measuring the resistance of the ceramic wire surface at different curvatures. The impedance values of several sampling points are taken as a sampling value, and the curvature is between 0.05 cm -1 and 0.5 cm -1 ; C. The difference between the sampling value and the standard value is compared to obtain a comparison result, and according to the comparison result, it is judged whether the ceramic wire to be tested has cracks. If the sampling value exceeds the standard value, it is judged that the ceramic wire has cracks, and if the sampling value does not exceed the standard value, it is judged that the ceramic wire has no cracks.
將上述陶瓷電線表面的一端連接至一阻抗分析儀的一接頭，該阻抗分析儀對於該陶瓷電線施予一測試電壓，該測試電壓的電壓值係為500V至10000V，電阻值則為20MΩ至20000MΩ。One end of the surface of the ceramic wire is connected to a connector of an impedance analyzer. The impedance analyzer applies a test voltage to the ceramic wire. The voltage value of the test voltage is 500V to 10000V, and the resistance value is 20MΩ to 20000MΩ.
係以上述阻抗分析儀的一探針棒作為另一端，測量該陶瓷電線表面上該測量點及該等取樣點的阻抗值。A probe rod of the impedance analyzer is used as the other end to measure the impedance values of the measuring point and the sampling points on the surface of the ceramic wire.
上述經由一影像投影儀器測得該陶瓷電線之該曲率。The curvature of the ceramic wire is measured by an image projector.
將上述陶瓷電線捲繞，使其呈立體的一漸開線捲曲狀態。The ceramic wire is wound to be in a three-dimensional gradually unwinding state.
將上述陶瓷電線捲繞，使其呈平面的一漸開線捲曲狀態。The ceramic wire is wound to be in a planar, gradually unwinding state.
將上述取樣值及該標準值，輸入至一運算處理裝置進行比對運算，並運算該取樣值是否有超出該標準值。The sample value and the standard value are input into a calculation processing device for comparison and calculation to determine whether the sample value exceeds the standard value.
上述進一步包含下列步驟D，根據不同曲率下所測得的該比對結果，以計算出該陶瓷電線所能承受的最小曲率。The above further includes the following step D, calculating the minimum curvature that the ceramic wire can withstand according to the comparison results measured under different curvatures.
上述最小曲率係為於0.05公分 -1。 The above minimum curvature is 0.05 cm -1 .
上述陶瓷電線可承受介電強度為每毫米600伏特的電壓而不擊穿。The ceramic wire can withstand a voltage of 600 volts per millimeter without breaking down.
上述技術特徵具有下列之優點：The above technical features have the following advantages:
1.由於陶瓷表面微小裂痕，肉眼難辨，但確影響用電安全，係可透過陶瓷電線彎曲狀態下的取樣值，以比對其是否超出標準值，而可快速的判斷陶瓷電線是否產生裂痕，藉以防止陶瓷電線因為產生裂痕而發生危險。1. Although tiny cracks on the surface of ceramics are difficult to see with the naked eye, they do affect electrical safety. The sample value of the bent ceramic wire can be compared to see if it exceeds the standard value, so as to quickly determine whether the ceramic wire has cracks, thereby preventing the ceramic wire from causing danger due to cracks.
2.係可判斷陶瓷電線在各個不同曲率下是否會產生裂痕，並經由各個不同的曲率，以計算出陶瓷電線於正常彎曲的使用狀態下，所能承受的最小曲率，以避免使用時因彎曲過度，而產生裂痕及發生危險。2. It can determine whether the ceramic wire will crack under different curvatures, and calculate the minimum curvature that the ceramic wire can withstand under normal bending conditions through different curvatures, so as to avoid cracks and dangers caused by excessive bending during use.
3.特別設計該陶瓷電線捲繞，使其呈立體的一漸開線捲曲狀態，和將該陶瓷電線捲繞，使其呈平面的一漸開線捲曲狀態。這兩種型態設計，能以一條陶瓷電線通過捲繞，就能獲得逐漸變大(或變小)的一系列曲率變化值，使量測個別曲率對應的電阻值，無須多條陶瓷電線(一般是一條陶瓷電線圍成一曲率)，更加便利。3. The ceramic wire is specially designed to be wound in a three-dimensional, gradually unwinding state, and the ceramic wire is wound in a two-dimensional, gradually unwinding state. These two types of designs can obtain a series of gradually increasing (or decreasing) curvature change values by winding a ceramic wire, making it more convenient to measure the resistance value corresponding to a single curvature without multiple ceramic wires (generally one ceramic wire encloses a curvature).
請參閱第一圖、第二圖及第三圖所示，本發明第一實施例包含有下列步驟，其中：Please refer to the first, second and third figures, the first embodiment of the present invention includes the following steps, wherein:
A.使一陶瓷電線處於一平直狀態下，施予大於500MV的一電壓，並測量該陶瓷電線表面至少一測量點的阻抗值，以做為一標準值。將待測量的一陶瓷電線1使其在一平直狀態下，然後於該陶瓷電線1表面的一端連接至一阻抗分析儀2的一接頭21，該阻抗分析儀2對於該陶瓷電線1施予一測試電壓，該測試電壓的電壓值係為500V至10000V，電阻值則為20MΩ至20000MΩ。然後再以該阻抗分析儀2的一探針棒22，接觸該陶瓷電線1表面上至少一測量點11的阻抗值，該阻抗值係介於20MΩ至20000MΩ之間，藉以做為一標準值。A. Place a ceramic wire in a straight state, apply a voltage greater than 500MV, and measure the impedance value of at least one measuring point on the surface of the ceramic wire as a standard value. Place a ceramic wire 1 to be measured in a straight state, and then connect one end of the surface of the ceramic wire 1 to a
B.使該陶瓷電線處於一彎曲狀態下，同樣施予該電壓，並測量該陶瓷電線表面於不同曲率下複數個取樣點的阻抗值，以做為一取樣值。係將待測量的該陶瓷電線1將其捲繞，使其在呈立體的一漸開線捲曲狀態下，然後於該陶瓷電線1表面的一端連接至該阻抗分析儀2其中一接頭21，該阻抗分析儀2同樣對於該陶瓷電線1施予該測試電壓，該測試電壓的電壓值係為500V至10000V，電阻值則為20MΩ至20000MΩ。然後再以該阻抗分析儀2的該探針棒22作為另一端，接觸該陶瓷電線1表面分別位於不同曲率下的複數個取樣點12，測量其阻抗值，藉以做為一取樣值。本發明實施例該陶瓷電線1之該曲率係可經由一影像投影儀器測得，且該曲率係介於0.05公分
-1至0.5公分
-1之間。
B. The ceramic wire is placed in a bent state, the voltage is applied, and the impedance values of multiple sampling points on the surface of the ceramic wire at different curvatures are measured as a sampling value. The ceramic wire 1 to be measured is wound up so that it is in a three-dimensional gradually unwinding state, and then one end of the surface of the ceramic wire 1 is connected to one of the
C.比對該取樣值與該標準值之間的差異，以取得一比對結果，並根據該比對結果，判斷該陶瓷電線是否產生裂痕。係將上述分別取得的該取樣值及該標準值，予以輸入至一運算處理裝置3進行比對運算，並運算該取樣值是否有超出該標準值的該阻抗值介於20MΩ至20000MΩ之間，藉以取得一比對結果。如果該取樣值超出該標準值，則判斷該陶瓷電線1有產生裂痕；如果該取樣值並未超出該標準值，則判斷該陶瓷電線1沒有產生裂痕。C. Compare the difference between the sample value and the standard value to obtain a comparison result, and judge whether the ceramic wire has cracks according to the comparison result. The sample value and the standard value obtained above are input into an
D.根據不同曲率下所測得的比對結果，以計算出該陶瓷電線所能承受的最小曲率。該運算處理裝置3經由比對運算後的該比對結果，以判斷該陶瓷電線1在各個不同曲率下是否會產生裂痕，並經由各個不同曲率(0.05公分
-1至0.5公分
-1之間)下的所取得的該等取樣值，以計算出該陶瓷電線1於正常彎曲的使用狀態下，所能承受的最小曲率，該最小曲率係為0.05公分
-1。並以該最小曲率做為該陶瓷電線1彎曲後所能承受的最大極限，於使用時避免彎曲小於該最小曲率，故可承受介電強度為每毫米600伏特的電壓而不擊穿，以防止該陶瓷電線1因產生裂痕而發生危險。
D. According to the comparison results measured under different curvatures, the minimum curvature that the ceramic wire can withstand is calculated. The
本發明第二實施例，請參閱第四圖所示。本第二實施例與上述第一實施例之間的差異，僅在於步驟B，係使該陶瓷電線處於一彎曲狀態下，即在呈平面的一漸開線捲曲狀態下，同樣對於該陶瓷電線1施予該測試電壓，藉以在彎曲狀態下，取得測量該陶瓷電線1表面分別位於不同曲率(0.05公分 -1至0.5公分 -1之間)下的複數個取樣點12之阻抗值。如此，同樣可以判斷出該陶瓷電線1在各個不同曲率下是否會產生裂痕，並計算出該陶瓷電線1於正常彎曲的使用狀態下，所能承受的最小曲率為何，藉以防止該陶瓷電線1因彎曲小於該最小曲率，而產生裂痕且發生危險。 The second embodiment of the present invention is shown in FIG. 4. The difference between the second embodiment and the first embodiment is that in step B, the ceramic wire is placed in a bent state, i.e., in a flat, gradually unrolled state, and the test voltage is applied to the ceramic wire 1 to obtain impedance values of a plurality of sampling points 12 on the surface of the ceramic wire 1 at different curvatures (between 0.05 cm -1 and 0.5 cm -1 ) in the bent state. In this way, it is also possible to determine whether the ceramic wire 1 will crack under different curvatures, and calculate the minimum curvature that the ceramic wire 1 can withstand under normal bending conditions, thereby preventing the ceramic wire 1 from cracking and causing danger due to bending less than the minimum curvature.
本發明實施例經由實驗測試，於測量該陶瓷電線1後取得相同的數據，藉以證明本發明實施例確實可以快速的測試出該陶瓷電線1於不同曲率下進行彎曲，以判斷該陶瓷電線1是否有產生裂痕，並據以計算出該陶瓷電線1所能承受的最小曲率係為0.05公分 -1。實驗測試用的該陶瓷電線1之長度係為25公分，線徑則為2公厘。 The embodiment of the present invention has been tested experimentally and obtained the same data after measuring the ceramic wire 1, which proves that the embodiment of the present invention can indeed quickly test the ceramic wire 1 when it is bent at different curvatures to determine whether the ceramic wire 1 has cracks, and calculates that the minimum curvature that the ceramic wire 1 can withstand is 0.05 cm -1 . The length of the ceramic wire 1 used in the experimental test is 25 cm, and the wire diameter is 2 mm.
本發明進一步可以經由金相顯微攝影，如第五圖及第六圖所示，藉以輔助判斷該陶瓷電線1表面分別位於不同曲率下的該等取樣點12是否有產生裂痕，以驗證該比對結果的準確性。The present invention can further use metallographic microscopy, as shown in the fifth and sixth figures, to assist in determining whether cracks occur at the sampling points 12 on the surface of the ceramic wire 1 at different curvatures, so as to verify the accuracy of the comparison result.
綜合上述實施例之說明，當可充分瞭解本發明之操作、使用及本發明產生之功效，惟以上所述實施例僅係為本發明之較佳實施例，當不能以此限定本發明實施之範圍，即依本發明申請專利範圍及發明說明內容所作簡單的等效變化與修飾，皆屬本發明涵蓋之範圍內。Combined with the description of the above embodiments, the operation, use and effects of the present invention can be fully understood. However, the above embodiments are only preferred embodiments of the present invention and should not be used to limit the scope of the implementation of the present invention. In other words, simple equivalent changes and modifications made according to the scope of the patent application of the present invention and the content of the invention description are all within the scope of the present invention.
1:陶瓷電線 11:測量點 12:取樣點 2:阻抗分析儀 21:接頭 22:探針棒 3:運算處理裝置 1: Ceramic wire 11: Measuring point 12: Sampling point 2: Impedance analyzer 21: Connector 22: Probe rod 3: Calculation processing device
[第一圖]係為本發明第一實施例之測試步驟流程圖。[Figure 1] is a flow chart of the test steps of the first embodiment of the present invention.
[第二圖]係為本發明第一實施例陶瓷電線處於平直狀態下之測試圖。[Figure 2] is a test diagram of the ceramic wire of the first embodiment of the present invention in a straight state.
[第三圖]係為本發明第一實施例陶瓷電線處於彎曲狀態下之測試圖。[Figure 3] is a test diagram of the ceramic wire of the first embodiment of the present invention in a bent state.
[第四圖]係為本發明第二實施例陶瓷電線處於彎曲狀態下之測試圖。[FIG. 4] is a test diagram of the ceramic wire of the second embodiment of the present invention in a bent state.
[第五圖]係為本發明實際測試經1000V電壓擊穿產生裂紋微結構（一）之金相顯微圖。[Figure 5] is a metallographic micrograph of the crack microstructure (I) produced by the actual test of the present invention after breakdown by 1000V voltage.
[第六圖]係為本發明實際測試經1000V電壓擊穿產生裂紋微結構（二）之金相顯微圖。[Figure 6] is a metallographic micrograph of the crack microstructure (II) produced by the actual test of the present invention after breakdown by 1000V voltage.
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