TW202417697A - A guide tube and a crystal pulling furnace used in the process of pulling a crystal rod by a Czochralski method - Google Patents

A guide tube and a crystal pulling furnace used in the process of pulling a crystal rod by a Czochralski method Download PDF

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TW202417697A
TW202417697A TW112148983A TW112148983A TW202417697A TW 202417697 A TW202417697 A TW 202417697A TW 112148983 A TW112148983 A TW 112148983A TW 112148983 A TW112148983 A TW 112148983A TW 202417697 A TW202417697 A TW 202417697A
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melt
guide tube
crystal
crucible
furnace
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宋少杰
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大陸商西安奕斯偉材料科技股份有限公司
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本發明實施例公開了一種在直拉法拉製晶棒的過程中使用的導流筒及拉晶爐,該導流筒的底部具有凹口,該凹口用於通過該導流筒繞自身的縱向軸線轉動使在基準徑向上流經熔體的液面的保護性氣體的流量發生變化。The embodiment of the present invention discloses a guide tube and a crystal pulling furnace used in the process of pulling a crystal rod by the Czochralski method. The bottom of the guide tube has a notch, which is used to change the flow rate of the protective gas flowing through the liquid surface of the melt in the reference diameter direction by rotating the guide tube around its own longitudinal axis.

Description

一種在直拉法拉製晶棒的過程中使用的導流筒及拉晶爐A guide tube and a crystal pulling furnace used in the process of pulling a crystal rod by a CZ method

本發明屬於半導體矽晶圓生產領域,尤其是關於一種在直拉法拉製晶棒的過程中使用的導流筒及拉晶爐。The present invention belongs to the field of semiconductor silicon wafer production, and in particular to a guide tube and a crystal pulling furnace used in the process of Czochralski method crystal rod pulling.

用於生產積體電路等半導體電子元器件的矽晶圓,主要通過將直拉法拉製的單晶矽棒切片而製造出。直拉法包括使由石英製成的坩堝中的多晶矽熔化以獲得矽熔體,將單晶晶種浸入矽熔體中,以及連續地提升晶種移動離開矽熔體表面,由此在移動過程中在相介面處生長出單晶矽棒。Silicon wafers used to produce semiconductor electronic components such as integrated circuits are mainly produced by slicing single-crystal silicon rods pulled by the Czochralski method. The Czochralski method involves melting polycrystalline silicon in a crucible made of quartz to obtain a silicon melt, immersing a single crystal seed in the silicon melt, and continuously lifting the seed to move away from the surface of the silicon melt, thereby growing a single crystal silicon rod at the interface during the movement.

拉製出的單晶矽棒中的氧濃度是影響矽晶圓性能的重要因素。單晶矽棒中的氧能夠增強矽晶圓的強度,或者可以在矽晶圓中形成體微缺陷(Bulk Micro Defect,BMD),BMD的作用在於,能夠吸收加工過程中產生的金屬雜質。然而,氧沉澱也可能會破壞電子器件的性能,例如容易導致漏電流及器件的擊穿等危害。因此,對於具有不同用途的電子器件,對其氧含量的大小及分佈情況也有著不同的要求,而且這些要求是相對苛刻的,這使得要在晶體生長中能夠更好地控制晶體內的氧的含量。The oxygen concentration in the pulled single crystal silicon rod is an important factor affecting the performance of the silicon wafer. The oxygen in the single crystal silicon rod can enhance the strength of the silicon wafer, or form a bulk micro defect (BMD) in the silicon wafer. The role of BMD is to absorb metal impurities generated during the processing. However, oxygen deposition may also damage the performance of electronic devices, such as easily causing leakage current and device breakdown. Therefore, for electronic devices with different uses, there are different requirements for the size and distribution of their oxygen content, and these requirements are relatively harsh, which requires better control of the oxygen content in the crystal during crystal growth.

單晶矽棒中的氧主要來自石英坩堝的熔解,其熔解速度與溫度及熔體對流情況相關。目前通常通過控制對石英坩堝的加熱溫度來控制拉製出的單晶矽棒中的氧的濃度,但另一方面,石英坩堝的加熱溫度又應當滿足比如生產效率的要求,由此導致單晶矽棒中的氧濃度要求與比如生產效率要求之間產生干涉。因此,如何提供一種與石英坩堝的加熱溫度控制不同的方式來控制拉製出的單晶矽棒中的氧濃度成為本領域亟需解決的問題。The oxygen in the single crystal silicon rod mainly comes from the melting of the quartz crucible, and its melting rate is related to the temperature and the convection of the melt. At present, the oxygen concentration in the drawn single crystal silicon rod is usually controlled by controlling the heating temperature of the quartz crucible, but on the other hand, the heating temperature of the quartz crucible should meet the requirements of production efficiency, which leads to interference between the oxygen concentration requirements in the single crystal silicon rod and the production efficiency requirements. Therefore, how to provide a method different from the heating temperature control of the quartz crucible to control the oxygen concentration in the drawn single crystal silicon rod has become a problem that needs to be solved urgently in this field.

為解決上述技術問題,本發明實施例期望提供一種在直拉法拉製晶棒的過程中使用的導流筒及拉晶爐,能夠實現以與對石英坩堝的加熱溫度進行控制不同的方式來控制拉製出的單晶矽棒中的氧濃度。To solve the above technical problems, the embodiments of the present invention hope to provide a guide tube and a crystal pulling furnace used in the process of pulling a crystal rod by the Czochralski method, which can control the oxygen concentration in the pulled single crystal silicon rod in a different way from controlling the heating temperature of the quartz crucible.

本發明的技術方案是這樣實現的: 第一方面,本發明實施例提供了一種在直拉法拉製晶棒的過程中使用的導流筒,該導流筒的底部具有凹口,該凹口用於通過該導流筒繞自身的縱向軸線轉動使在基準徑向上流經熔體的液面的保護性氣體的流量發生變化。 The technical solution of the present invention is implemented as follows: In the first aspect, the embodiment of the present invention provides a guide tube used in the process of CZT pulling a crystal rod, the bottom of the guide tube has a notch, and the notch is used to change the flow rate of the protective gas flowing through the liquid surface of the melt in the reference diameter direction by rotating the guide tube around its own longitudinal axis.

在施加至熔體的水平磁場的方向為上述的基準徑向的情況下,當導流筒處於凹口在豎向上與熔體的液面中與水平磁場平行的徑向相對的位置時,在水平磁場的方向上,保護性氣體會經由導流筒的底部的凹口流動,因此流量會相對較大,由此會促進熔體中的氧的揮發,導致更少的氧到達晶棒與熔體之間的固液介面處,使晶棒中的氧濃度減小,而當導流筒處於凹口在豎向上不與熔體的液面中與水平磁場平行的徑向相對的位置時,在水平磁場的方向上,保護性氣體無法經由導流筒的底部的凹口流動,只能經由導流筒的底部中未形成有凹口的部分與熔體的液面之間的間隙流動,因此流量會相對較小,由此會抑制熔體中的氧的揮發,導致更多的氧到達晶棒與熔體之間的固液介面處,使晶棒中的氧濃度增大。When the direction of the horizontal magnetic field applied to the melt is the above-mentioned reference radial direction, when the guide tube is located at a position where the notch is vertically opposite to the radial direction parallel to the horizontal magnetic field in the liquid surface of the melt, the protective gas will flow through the notch at the bottom of the guide tube in the direction of the horizontal magnetic field, so the flow rate will be relatively large, thereby promoting the volatility of oxygen in the melt, resulting in less oxygen reaching the solid-liquid interface between the crystal rod and the melt, reducing the oxygen concentration in the crystal rod, and when the guide tube is When the notch is not radially opposite to the liquid surface of the melt in the vertical direction and parallel to the horizontal magnetic field, the protective gas cannot flow through the notch at the bottom of the guide tube in the direction of the horizontal magnetic field, and can only flow through the gap between the part of the bottom of the guide tube where the notch is not formed and the liquid surface of the melt. Therefore, the flow rate will be relatively small, thereby inhibiting the volatility of oxygen in the melt, causing more oxygen to reach the solid-liquid interface between the crystal rod and the melt, thereby increasing the oxygen concentration in the crystal rod.

較佳的,該凹口的數量為兩個並且在該導流筒的徑向上對置。Preferably, the number of the notches is two and they are opposite to each other in the radial direction of the guide tube.

由於對於熔體中的氧的揮發而言,能夠受到流經熔體的液面的保護性氣體的流量影響的區域是存在於整個徑向上的,因此,兩個徑向上對置的凹口能夠充分利用這樣的區域,比如在需要使拉製出的晶棒中的氧濃度較低的情況下,與導流筒僅具有單個凹口相比,導流筒具有兩個徑向上對置的凹口更加能夠促使氧從熔體中揮發進而將氧濃度降低。Since the area that can be affected by the flow rate of the protective gas flowing through the liquid surface of the melt for the volatilization of oxygen in the melt exists in the entire radial direction, the two radially opposite notches can make full use of such an area. For example, when it is necessary to lower the oxygen concentration in the pulled crystal rod, compared with the guide tube having only a single notch, the guide tube having two radially opposite notches can better promote the volatilization of oxygen from the melt and thus reduce the oxygen concentration.

較佳的,該導流筒被設置成使得兩個該凹口之間的連接線與施加至該熔體的水平磁場平行。Preferably, the guide tube is arranged so that a connecting line between two of the notches is parallel to a horizontal magnetic field applied to the melt.

在這種情況下,對於流經熔體的液面的保護性氣體而言,在與水平磁場平行的方向上,流量是最大的,因為保護性氣體能夠經由導流筒的底部的凹口流動,或者說,在導流筒的整個周向上,底部中形成有凹口的部分與熔體的液面之間的間隙是最大的,由此能夠獲得氧濃度盡可能低的晶棒。In this case, for the protective gas flowing through the liquid surface of the melt, the flow rate is the largest in the direction parallel to the horizontal magnetic field, because the protective gas can flow through the notch at the bottom of the guide tube, or in other words, in the entire circumference of the guide tube, the gap between the part with the notch formed in the bottom and the liquid surface of the melt is the largest, thereby being able to obtain a crystal rod with an oxygen concentration as low as possible.

並且在這種情況下,最大程度地減小了晶棒在周向上的氧濃度的不均勻性。And in this case, the non-uniformity of oxygen concentration in the circumferential direction of the crystal rod is minimized.

較佳的,該導流筒被設置成使得兩個該凹口之間的連接線與施加至該熔體的水平磁場垂直。Preferably, the guide tube is arranged so that a connecting line between two of the notches is perpendicular to a horizontal magnetic field applied to the melt.

在這種情況下,對於流經熔體的液面的保護性氣體而言,在與水平磁場平行的方向上,流量是最小的,因為保護性氣體只能夠經由導流筒的底部中未形成有凹口的部分與熔體的液面之間的間隙流動,或者說只能夠經由導流筒的底部中相對於凹口為凸起的部分與熔體的液面之間的間隙流動,而這個間隙在導流筒的整個周向上是最小的,由此能夠獲得氧濃度盡可能高的晶棒。In this case, for the protective gas flowing through the liquid surface of the melt, the flow rate is the smallest in the direction parallel to the horizontal magnetic field, because the protective gas can only flow through the gap between the portion of the bottom of the guide tube where no notch is formed and the liquid surface of the melt, or in other words, can only flow through the gap between the portion of the bottom of the guide tube that is convex relative to the notch and the liquid surface of the melt, and this gap is the smallest in the entire circumference of the guide tube, thereby obtaining a crystal rod with an oxygen concentration as high as possible.

較佳的,該凹口呈矩形。這樣,對於流經熔體的液面的保護性氣體而言,在比如需要精確計算導流筒的周向上的不同位置處的流量值時,能夠使計算過程簡化。Preferably, the notch is rectangular. In this way, for the protective gas flowing through the liquid surface of the melt, when, for example, the flow value at different positions on the circumference of the guide tube needs to be accurately calculated, the calculation process can be simplified.

較佳的,該凹口朝向該導流筒的底部漸擴。這樣,在凹口通過去除材料獲得的情況下,能夠使具有凹口的導流筒更容易製造出。Preferably, the recess gradually expands toward the bottom of the guide tube. In this way, when the recess is obtained by removing material, the guide tube with the recess can be manufactured more easily.

第二方面,本發明實施例還提供了一種在直拉法拉製晶棒的過程中使用的拉晶爐,該拉晶爐包括根據第一方面所述的導流筒。In a second aspect, an embodiment of the present invention further provides a crystal pulling furnace used in a process of pulling a crystal rod by the Czochralski method, wherein the crystal pulling furnace comprises a flow guide tube according to the first aspect.

較佳的,該拉晶爐還包括: 爐體,該爐體限定出爐體空腔; 坩堝,該坩堝設置在該爐體空腔中,該熔體容納在該坩堝中。 Preferably, the crystal pulling furnace further comprises: A furnace body, which defines a furnace body cavity; A crucible, which is disposed in the furnace body cavity and contains the melt.

較佳的,該拉晶爐還包括加熱器,該加熱器設置在該爐體空腔中並且設置在該坩堝的外周以對該坩堝進行加熱,從而使容納在該坩堝中的固態原料熔化成該熔體。Preferably, the crystal pulling furnace further includes a heater, which is disposed in the furnace cavity and at the periphery of the crucible to heat the crucible, thereby melting the solid raw material contained in the crucible into the melt.

較佳的,該拉晶爐還包括保溫元件,該保溫元件設置在該爐體的內壁處以抑制該坩堝加熱器產生的熱量經由該爐體散失。Preferably, the crystal pulling furnace further includes a heat-insulating element, which is arranged at the inner wall of the furnace body to inhibit the heat generated by the crucible heater from being lost through the furnace body.

下面將結合本發明實施例中的附圖,對本發明實施例中的技術方案進行清楚、完整地描述。The technical scheme in the embodiment of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiment of the present invention.

首先參見圖1,其示出了常規的用於拉製晶棒R的拉晶爐1A。該拉晶爐主要可以包括:爐體20A;坩堝30A,該坩堝30A設置在爐體20A內部並用於容納熔體M;加熱器40A,該加熱器40A用於對坩堝30A進行加熱以將比如固態多晶矽之類的固態原材料熔化成熔體M以及使熔體M保持所需要的溫度;導流筒10A,該導流筒10A用於將圖1中未詳細示出的保護性氣體比如氬氣引導至熔體M的液面處以避免熔體M發生不期望的化學反應。First, refer to FIG1 , which shows a conventional crystal pulling furnace 1A for pulling a crystal rod R. The crystal pulling furnace may mainly include: a furnace body 20A; a crucible 30A, which is arranged inside the furnace body 20A and used to contain a melt M; a heater 40A, which is used to heat the crucible 30A to melt a solid raw material such as solid polycrystalline silicon into the melt M and to keep the melt M at a desired temperature; and a flow guide 10A, which is used to guide a protective gas such as argon, which is not shown in detail in FIG1 , to the liquid surface of the melt M to prevent the melt M from undergoing an undesired chemical reaction.

拉製出的晶棒R中所含有的氧,主要來自於坩堝30A。具體地,坩堝30A在熔體M的高溫的作用下,會產生熔解,坩堝30A中含有的氧便會進入到熔體M中,而熔體M中的氧如果到達晶棒R與熔體M之間的固液介面處的話,便會進入到晶棒R中。The oxygen contained in the pulled crystal rod R mainly comes from the crucible 30A. Specifically, the crucible 30A will be melted under the high temperature of the melt M, and the oxygen contained in the crucible 30A will enter the melt M. If the oxygen in the melt M reaches the solid-liquid interface between the crystal rod R and the melt M, it will enter the crystal rod R.

另一方面,在拉晶爐1A中,在加熱器40A的加熱作用下,容納在坩堝30A中的熔體M會產生熱對流,熱對流導致的熔體M的不穩定性會影響拉晶。為了降低熔體M中的對流的強度,會對熔體M施加磁場,通過洛倫茲力減緩熔體M中的對流。所施加磁場類型可分為垂直磁場、水平磁場以及勾型磁場等。這些磁場有各自相關優缺點,而如圖1中示出的水平磁場HM由於其所需線圈直徑相比於其它兩種磁場較小,所以可以提供強度最高的磁場(最高0.4T)。但是,水平磁場HM存在的問題是,相比於其它兩種磁場其提供的是非中心對稱的磁場,這導致熔體M中的對流出現了複雜的非對稱性。On the other hand, in the crystal pulling furnace 1A, under the heating effect of the heater 40A, the melt M contained in the crucible 30A will generate thermal convection, and the instability of the melt M caused by the thermal convection will affect the crystal pulling. In order to reduce the intensity of the convection in the melt M, a magnetic field is applied to the melt M to slow down the convection in the melt M through the Lorenz force. The types of applied magnetic fields can be divided into vertical magnetic fields, horizontal magnetic fields, and hook-shaped magnetic fields. These magnetic fields have their own advantages and disadvantages, and the horizontal magnetic field HM shown in Figure 1 can provide the highest intensity magnetic field (up to 0.4T) because the required coil diameter is smaller than that of the other two magnetic fields. However, the problem with the horizontal magnetic field HM is that it provides a non-centrally symmetric magnetic field compared to the other two magnetic fields, which leads to complex asymmetry in the convection in the melt M.

因坩堝30A在熔體M的高溫的作用下熔解所產生的氧主要存在於坩堝30A的內壁處,並會隨著在水平磁場HM的作用下形成的熔體M的對流一起流動,從而到達晶棒R與熔體M之間的固液介面處。下面結合在水平磁場HM的作用下形成的熔體M的對流來對存在於坩堝30A的內壁處的氧到達晶棒R與熔體M之間的固液介面處的情況進行詳細描述。Oxygen generated by the melting of the crucible 30A under the high temperature of the melt M mainly exists at the inner wall of the crucible 30A, and flows along with the convection of the melt M formed under the horizontal magnetic field HM, thereby reaching the solid-liquid interface between the crystal rod R and the melt M. The following is a detailed description of the situation in which the oxygen existing on the inner wall of the crucible 30A reaches the solid-liquid interface between the crystal rod R and the melt M in combination with the convection of the melt M formed under the horizontal magnetic field HM.

參見圖2,其示出了在圖1中示出的加熱器40A和水平磁場HM的共同作用下熔體M流動的跡線的示意圖,其中圖1中示出的拉晶爐1A與圖2中示出的流動跡線處於同一坐標系XYZ中。結合圖1和圖2中可以看出:在垂直於水平磁場HM的XZ平面內,由於存在一個較大穩定渦流,在坩堝30A的內壁處熔解的氧將隨著渦流很快到達熔體M的自由表面而快速揮發掉;但是,在平行於水平磁場HM的豎向平面即XY平面內,在坩堝30A的內壁處的熔體M有向著整個熔體M的中心流動的趨勢,也就是說,在該平面內,從坩堝30A熔解出的氧很難及時流動到熔體M的自由表面而揮發,從而更容易流動到固液介面處造成晶棒R的氧濃度的升高。2 , which shows a schematic diagram of the flow trajectory of the melt M under the combined effect of the heater 40A and the horizontal magnetic field HM shown in FIG. 1 , wherein the crystal pulling furnace 1A shown in FIG. 1 and the flow trajectory shown in FIG. 2 are in the same coordinate system XYZ. Combining FIG. 1 and FIG. 2 , it can be seen that: in the XZ plane perpendicular to the horizontal magnetic field HM, due to the existence of a relatively large and stable eddy current, the oxygen melted at the inner wall of the crucible 30A will quickly reach the free surface of the melt M along with the eddy current and evaporate rapidly; however, in the vertical plane parallel to the horizontal magnetic field HM, i.e., the XY plane, the melt M at the inner wall of the crucible 30A tends to flow toward the center of the entire melt M, that is, in this plane, it is difficult for the oxygen melted from the crucible 30A to flow to the free surface of the melt M in time and evaporate, and it is easier to flow to the solid-liquid interface to cause an increase in the oxygen concentration of the crystal rod R.

在這種情況下,容易理解的是,如果想要通過流經熔體M的液面的保護性氣體的流量來影響熔體M中的氧的揮發的話:假設保護性氣體是在Z軸的方向上流動的,或者說是在與水平磁場HM垂直的方向上流動的,則無論保護性氣體的流量如何都不會對氧的揮發產生影響,因為在該方向上,熔體M中的氧已經主要地到達熔體M的自由表面而揮發掉;但是,假設保護性氣體是在Y軸的方向上流動的,或者說是在與水平磁場HM平行的方向上流動的,則在保護性氣體的流量較大的情況下,會促進熔體M中的氧的揮發,由此導致更少的氧到達晶棒R與熔體M之間的固液介面處,使晶棒R中的氧濃度減小,在保護性氣體的流量較小的情況下,會抑制熔體M中的氧的揮發,由此導致更多的氧到達晶棒R與熔體M之間的固液介面處,使晶棒R中的氧濃度增大。In this case, it is easy to understand that if one wants to influence the volatilization of oxygen in the melt M by the flow rate of the protective gas flowing through the liquid surface of the melt M: assuming that the protective gas flows in the direction of the Z axis, or in other words, in the direction perpendicular to the horizontal magnetic field HM, then no matter what the flow rate of the protective gas is, it will not affect the volatilization of oxygen, because in this direction, the oxygen in the melt M has mainly reached the free surface of the melt M and volatilized; however, assuming that the protective gas flows in the Y axis, If the protective gas flows in the direction of the axis, or in other words, flows in a direction parallel to the horizontal magnetic field HM, then when the flow rate of the protective gas is large, the volatilization of oxygen in the melt M will be promoted, thereby causing less oxygen to reach the solid-liquid interface between the crystal rod R and the melt M, and reducing the oxygen concentration in the crystal rod R. When the flow rate of the protective gas is small, the volatilization of oxygen in the melt M will be suppressed, thereby causing more oxygen to reach the solid-liquid interface between the crystal rod R and the melt M, and increasing the oxygen concentration in the crystal rod R.

在此基礎上,參見圖3至圖5,本發明實施例提供了一種在直拉法拉製如圖1中示出的晶棒R的過程中使用的導流筒10,如在圖3的立體圖和圖4的截面圖中示出的,該導流筒10的底部10B可以具有凹口10N,該凹口10N用於通過該導流筒10繞自身的縱向軸線10X轉動使在基準徑向上流經熔體M的液面L的保護性氣體PG的流量發生變化。具體地,假設水平磁場HM的方向為上述的基準徑向,當導流筒10相對於水平磁場HM處於圖4中所示位置時,在水平磁場HM的方向上,或者說在圖1和圖2中示出的Y軸的方向上,保護性氣體PG會經由導流筒10的底部10B的凹口10N流動,因此流量會相對較大,由此如前所述會促進熔體M中的氧的揮發,導致更少的氧到達晶棒R與熔體M之間的固液介面處,使晶棒R中的氧濃度減小,而當導流筒10相對於水平磁場HM處於圖5中所示位置時,在水平磁場HM的方向上,或者說在圖1和圖2中示出的Y軸的方向上,保護性氣體PG無法經由導流筒10的底部10B的凹口10N流動,只能經由導流筒10的底部10B中未形成有凹口10N的部分與熔體M的液面L之間的間隙流動,因此流量會相對較小,由此如前所述會抑制熔體M中的氧的揮發,導致更多的氧到達晶棒R與熔體M之間的固液介面處,使晶棒R中的氧濃度增大。On this basis, referring to FIGS. 3 to 5 , an embodiment of the present invention provides a guide tube 10 used in a process of pulling a crystal rod R as shown in FIG. 1 by a CZ method. As shown in the three-dimensional view of FIG. 3 and the cross-sectional view of FIG. 4 , the bottom 10B of the guide tube 10 may have a notch 10N, and the notch 10N is used to change the flow rate of the protective gas PG flowing through the liquid surface L of the melt M in the reference diameter direction by rotating the guide tube 10 around its longitudinal axis 10X. Specifically, assuming that the direction of the horizontal magnetic field HM is the above-mentioned reference radial direction, when the guide tube 10 is at the position shown in FIG. 4 relative to the horizontal magnetic field HM, in the direction of the horizontal magnetic field HM, or in the direction of the Y axis shown in FIGS. 1 and 2 , the protective gas PG will flow through the notch 10N at the bottom 10B of the guide tube 10, so the flow rate will be relatively large, thereby promoting the volatilization of oxygen in the melt M as mentioned above, resulting in less oxygen reaching the solid-liquid interface between the crystal rod R and the melt M, reducing the oxygen concentration in the crystal rod R, and when the guide tube 10 is at the position shown in FIG. 4 relative to the horizontal magnetic field HM, the protective gas PG will flow through the notch 10N at the bottom 10B of the guide tube 10, so the flow rate will be relatively large, thereby promoting the volatilization of oxygen in the melt M as mentioned above, resulting in less oxygen reaching the solid-liquid interface between the crystal rod R and the melt M, reducing the oxygen concentration in the crystal rod R, and when the guide tube 10 is at the position shown in FIG. When the planar magnetic field HM is at the position shown in FIG. 5 , in the direction of the horizontal magnetic field HM, or in the direction of the Y axis shown in FIGS. 1 and 2 , the protective gas PG cannot flow through the notch 10N of the bottom 10B of the flow guide tube 10, and can only flow through the gap between the portion of the bottom 10B of the flow guide tube 10 where the notch 10N is not formed and the liquid surface L of the melt M. Therefore, the flow rate will be relatively small, thereby suppressing the volatilization of oxygen in the melt M as mentioned above, causing more oxygen to reach the solid-liquid interface between the crystal rod R and the melt M, thereby increasing the oxygen concentration in the crystal rod R.

也就是說,本發明實施例提供了一種底部10B具有凹口10N的導流筒10,能夠通過該導流筒10繞自身的縱向軸線10X轉動來對拉製出的晶棒R中的氧濃度進行控制。That is, the embodiment of the present invention provides a guide tube 10 having a notch 10N at its bottom 10B, and the oxygen concentration in the pulled crystal rod R can be controlled by rotating the guide tube 10 around its longitudinal axis 10X.

在本發明的可選實施例中,參見圖3和圖4,該凹口10N的數量可以為兩個並且在該導流筒10的徑向上對置。如前所述,對於熔體M中的氧的揮發而言,能夠受到流經熔體M的液面L的保護性氣體PG的流量影響的區域是存在於整個徑向上的,因此,兩個徑向上對置的凹口10N能夠充分利用這樣的區域,比如在需要使拉製出的晶棒R中的氧濃度較低的情況下,與導流筒10僅具有單個凹口10N相比,導流筒10具有兩個徑向上對置的凹口10N更加能夠促使氧從熔體M中揮發進而將氧濃度降低。In an optional embodiment of the present invention, referring to Fig. 3 and Fig. 4, the number of the notches 10N can be two and they are opposite in the radial direction of the guide tube 10. As mentioned above, for the volatilization of oxygen in the melt M, the area that can be affected by the flow rate of the protective gas PG flowing through the liquid surface L of the melt M exists in the entire radial direction, so the two notches 10N opposite in the radial direction can make full use of such an area. For example, when the oxygen concentration in the pulled crystal rod R needs to be lower, compared with the guide tube 10 having only a single notch 10N, the guide tube 10 having two notches 10N opposite in the radial direction can better promote the volatilization of oxygen from the melt M and thus reduce the oxygen concentration.

對於拉製出的晶棒R而言,可能需要其氧濃度是較高的。對此,在本發明的可選實施例中,參見圖5,該導流筒10可以被設置成使得兩個該凹口10N之間的連接線與施加至該熔體M的水平磁場HM垂直,其中,由於圖5為截面圖因此並未示出凹口10N,但可以理解的是,導流筒10的兩個凹口10N之間的連接線與示出圖5的頁面垂直。在這種情況下,對於流經熔體M的液面L的保護性氣體PG而言,在與水平磁場HM平行的方向上,流量是最小的,因為保護性氣體PG只能夠經由導流筒10的底部10B中未形成有凹口10N的部分與熔體M的液面L之間的間隙流動,或者說只能夠經由導流筒10的底部10B中相對於凹口10N為凸起的部分與熔體M的液面L之間的間隙流動,而這個間隙在導流筒10的整個周向上是最小的。For the pulled crystal rod R, it may be necessary to have a higher oxygen concentration. In this regard, in an optional embodiment of the present invention, referring to FIG5 , the guide tube 10 may be arranged so that the connection line between the two notches 10N is perpendicular to the horizontal magnetic field HM applied to the melt M, wherein, since FIG5 is a cross-sectional view, the notch 10N is not shown, but it can be understood that the connection line between the two notches 10N of the guide tube 10 is perpendicular to the page showing FIG5 . In this case, for the protective gas PG flowing through the liquid surface L of the melt M, the flow rate is the smallest in the direction parallel to the horizontal magnetic field HM, because the protective gas PG can only flow through the gap between the portion of the bottom 10B of the guide tube 10 where the notch 10N is not formed and the liquid surface L of the melt M, or in other words, can only flow through the gap between the portion of the bottom 10B of the guide tube 10 that is raised relative to the notch 10N and the liquid surface L of the melt M, and this gap is the smallest in the entire circumferential direction of the guide tube 10.

對於拉製出的晶棒R而言,可能需要其氧濃度是較低的,另外,除了晶棒R整體的氧濃度的要求之外,還可能需要氧濃度在晶棒R的周向上是均勻的。For the drawn crystal rod R, its oxygen concentration may need to be relatively low. In addition, in addition to the requirements for the oxygen concentration of the entire crystal rod R, the oxygen concentration may also need to be uniform in the circumferential direction of the crystal rod R.

對此,在本發明的可選實施例中,參見圖4,該導流筒10可以被設置成使得兩個該凹口10N之間的連接線與施加至該熔體M的水平磁場HM平行,其中,圖4為在圖5的基礎上將導流筒10繞自身的縱向軸線10X轉動90°後的截面示意圖,或者說,圖5為在圖4的基礎上將導流筒10繞自身的縱向軸線10X轉動90°後的截面示意圖,因此在圖4中,導流筒10的兩個凹口10N之間的連接線處於截面中。In this regard, in an optional embodiment of the present invention, referring to FIG. 4 , the guide tube 10 may be arranged so that a connecting line between the two notches 10N is parallel to the horizontal magnetic field HM applied to the melt M, wherein FIG. 4 is a cross-sectional schematic diagram of the guide tube 10 after rotating 90° around its longitudinal axis 10X on the basis of FIG. 5 , or in other words, FIG. 5 is a cross-sectional schematic diagram of the guide tube 10 after rotating 90° around its longitudinal axis 10X on the basis of FIG. 4 , so that in FIG. 4 , the connecting line between the two notches 10N of the guide tube 10 is in the cross section.

在這種情況下,對於流經熔體M的液面L的保護性氣體PG而言,在與水平磁場HM平行的方向上,流量是最大的,因為保護性氣體PG能夠經由導流筒10的底部10B的凹口10N流動,或者說,在導流筒10的整個周向上,底部10B中形成有凹口10N的部分與熔體M的液面L之間的間隙是最大的。In this case, for the protective gas PG flowing through the liquid surface L of the melt M, the flow rate is the largest in the direction parallel to the horizontal magnetic field HM, because the protective gas PG can flow through the recess 10N of the bottom 10B of the guide tube 10, or in other words, in the entire circumference of the guide tube 10, the gap between the portion of the bottom 10B where the recess 10N is formed and the liquid surface L of the melt M is the largest.

對於氧濃度在晶棒R的周向上的均勻性而言,如前所述,晶棒R中的氧主要來自於因坩堝30A在高溫下熔解而進入到熔體M中的氧,但是,在水平磁場HM的作用下,熔體M在自身的周向上的溫度是不均勻的,具體地,參見圖6,其示出了在圖1中示出的加熱器40A的作用下熔體M在與液面平行的平面中的溫度分佈示意圖。從圖6可知,在平行於水平磁場HM的方向上,坩堝30A附近的熔體M的溫度較高,因此坩堝30A會發生較多的熔解,更多的氧會進入到熔體M中,而在垂直於水平磁場HM的方向上,坩堝30A附近的熔體M的溫度較低,因此坩堝30A會發生較少的熔解,更少的氧會進入到熔體M中。在不考慮因水平磁場HM導致的如圖2中示出的對流的情況下,或者說,假設進入到熔體M中的氧到達晶棒R與熔體M之間的固液介面處的可能性是一致的,那麼,在平行於水平磁場HM的方向上,由於更多的氧會進入到熔體M中,因此更多的氧會進入到晶棒R中,而在垂直於水平磁場HM的方向上,由於更少的氧會進入到熔體M中,因此更少的氧會進入到晶棒R中,由此使得晶棒R在周向上的氧濃度是不均勻的並且更具體地在平行於水平磁場HM的方向上的氧濃度大於在垂直於水平磁場HM的方向上的氧濃度。另一方面,在如圖2中示出的對流的作用下,如前所述,在平行於水平磁場HM的方向上,熔體M中的氧很難揮發會使晶棒R的氧濃度升高,在垂直於水平磁場HM的方向上,熔體M中的氧容易揮發會抑制晶棒R的氧濃度升高。也就是說,進一步加劇了或者說惡化了晶棒R在周向上的氧濃度的不均勻性。在本實施例中,如前所述流經熔體M的液面L的保護性氣體PG在與水平磁場HM平行的方向上的流量得到了最大化,由此最大程度地促進了熔體M中的氧的揮發,最少的氧到達晶棒R與熔體M之間的固液介面處,使晶棒R中與水平磁場HM平行的徑向上的氧濃度得到最小化,由此,最大程度地減小了晶棒R在周向上的氧濃度的不均勻性。Regarding the uniformity of oxygen concentration in the circumferential direction of the crystal rod R, as mentioned above, the oxygen in the crystal rod R mainly comes from the oxygen entering the melt M due to the melting of the crucible 30A at high temperature. However, under the action of the horizontal magnetic field HM, the temperature of the melt M in its own circumferential direction is uneven. Specifically, see Figure 6, which shows a schematic diagram of the temperature distribution of the melt M in a plane parallel to the liquid surface under the action of the heater 40A shown in Figure 1. As can be seen from Figure 6, in the direction parallel to the horizontal magnetic field HM, the temperature of the melt M near the crucible 30A is higher, so the crucible 30A will melt more and more oxygen will enter the melt M. In the direction perpendicular to the horizontal magnetic field HM, the temperature of the melt M near the crucible 30A is lower, so the crucible 30A will melt less and less oxygen will enter the melt M. Without considering the convection caused by the horizontal magnetic field HM as shown in Figure 2, or in other words, assuming that the probability of oxygen entering the melt M reaching the solid-liquid interface between the crystal rod R and the melt M is consistent, then, in the direction parallel to the horizontal magnetic field HM, more oxygen will enter the melt M, and therefore more oxygen will enter the crystal rod R, and in the direction perpendicular to the horizontal magnetic field HM, less oxygen will enter the melt M, and therefore less oxygen will enter the crystal rod R, thereby making the oxygen concentration of the crystal rod R in the circumferential direction uneven and more specifically, the oxygen concentration in the direction parallel to the horizontal magnetic field HM is greater than the oxygen concentration in the direction perpendicular to the horizontal magnetic field HM. On the other hand, under the action of convection as shown in FIG2 , as mentioned above, in the direction parallel to the horizontal magnetic field HM, the oxygen in the melt M is difficult to volatilize, which increases the oxygen concentration of the crystal rod R, and in the direction perpendicular to the horizontal magnetic field HM, the oxygen in the melt M is easy to volatilize, which inhibits the increase of the oxygen concentration of the crystal rod R. In other words, the unevenness of the oxygen concentration of the crystal rod R in the circumferential direction is further aggravated or worsened. In this embodiment, as mentioned above, the flow rate of the protective gas PG flowing through the liquid surface L of the melt M in the direction parallel to the horizontal magnetic field HM is maximized, thereby promoting the volatilization of oxygen in the melt M to the greatest extent, and the minimum amount of oxygen reaches the solid-liquid interface between the crystal rod R and the melt M, so that the oxygen concentration in the radial direction parallel to the horizontal magnetic field HM in the crystal rod R is minimized, thereby minimizing the unevenness of the oxygen concentration of the crystal rod R in the circumferential direction.

在本發明的可選實施例中,參見圖3,該凹口10N可以呈矩形。這樣,對於流經熔體M的液面L的保護性氣體PG而言,在比如需要精確計算導流筒10的周向上的不同位置處的流量值時,能夠使計算過程簡化。In an alternative embodiment of the present invention, referring to Fig. 3 , the notch 10N may be rectangular. In this way, for the protective gas PG flowing through the liquid surface L of the melt M, when, for example, the flow rate values at different positions on the circumference of the guide tube 10 need to be accurately calculated, the calculation process can be simplified.

在本發明的可選實施例中,參見圖7,該凹口10N可以朝向該導流筒10的底部10B漸擴。這樣,在凹口10N通過去除材料獲得的情況下,能夠使具有凹口10N的導流筒10更容易製造出。In an alternative embodiment of the present invention, referring to Fig. 7, the recess 10N may gradually expand toward the bottom 10B of the guide tube 10. In this way, when the recess 10N is obtained by removing material, the guide tube 10 having the recess 10N can be manufactured more easily.

參見圖8,本發明實施例還提供了一種在直拉法拉製晶棒R的過程中使用的拉晶爐1,該拉晶爐1可以包括根據本發明上述各實施例所述的導流筒10。8 , an embodiment of the present invention further provides a crystal pulling furnace 1 used in a process of pulling a crystal rod R by the Czochralski method. The crystal pulling furnace 1 may include a guide tube 10 according to the above embodiments of the present invention.

在本發明的可選實施例中,該拉晶爐1還可以包括: 爐體20,該爐體20限定出爐體空腔20C; 坩堝30,該坩堝30設置在該爐體空腔20C中,該熔體M容納在該坩堝30中。 In an optional embodiment of the present invention, the crystal pulling furnace 1 may further include: A furnace body 20, wherein the furnace body 20 defines a furnace body cavity 20C; A crucible 30, wherein the crucible 30 is disposed in the furnace body cavity 20C, and the melt M is contained in the crucible 30.

在本發明的可選實施例中,參見圖8,該拉晶爐1還可以包括加熱器40,該加熱器40設置在該爐體空腔20C中並且設置在該坩堝30的外周以對該坩堝30進行加熱,從而使容納在該坩堝30中的固態原料熔化成該熔體M。In an optional embodiment of the present invention, referring to FIG. 8 , the crystal pulling furnace 1 may further include a heater 40, which is disposed in the furnace cavity 20C and at the periphery of the crucible 30 to heat the crucible 30, thereby melting the solid raw material contained in the crucible 30 into the melt M.

在本發明的可選實施例中,參見圖8,該拉晶爐1還可以包括保溫元件50,該保溫元件50設置在該爐體20的內壁處以抑制該加熱器40產生的熱量經由該爐體20散失。In an optional embodiment of the present invention, referring to FIG. 8 , the crystal pulling furnace 1 may further include a heat-insulating element 50 , which is disposed at the inner wall of the furnace body 20 to suppress the heat generated by the heater 40 from being lost through the furnace body 20 .

除非另外定義,本發明使用的技術術語或者科學術語應當為本實用新型所屬領域內具有一般技能的人士所理解的通常意義。本發明中使用的「第一」、「第二」以及類似的詞語並不表示任何順序、數量或者重要性,而只是用來區分不同的組成部分。「包括」或者「包含」等類似的詞語意指出現該詞前面的元件或者物件涵蓋出現在該詞後面列舉的元件或者物件及其等同,而不排除其他元件或者物件。「連接」或者「相連」等類似的詞語並非限定於實體的或者機械的連接,而是可以包括電性的連接,不管是直接的還是間接的。「上」、「下」、「左」、「右」等僅用於表示相對位置關係,當被描述物件的絕對位置改變後,則該相對位置關係也可能相應地改變。Unless otherwise defined, the technical or scientific terms used in the present invention should be understood by people with ordinary skills in the field to which the utility model belongs. "First", "second" and similar words used in the present invention do not indicate any order, quantity or importance, but are only used to distinguish different components. "Include" or "comprise" and other similar words mean that the elements or objects appearing before the word include the elements or objects listed after the word and their equivalents, but do not exclude other elements or objects. "Connect" or "connected" and other similar words are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "Up", "down", "left", "right" and the like are only used to indicate relative positional relationships. When the absolute position of the described object changes, the relative positional relationship may also change accordingly.

需要說明的是:本發明實施例所記載的技術方案之間,在不衝突的情況下,可以任意組合。It should be noted that the technical solutions described in the embodiments of the present invention can be combined arbitrarily without conflict.

以上所述,僅為本發明的具體實施方式,但本發明的保護範圍並不局限於此,任何熟悉本技術領域的技術人員在本發明揭露的技術範圍內,可輕易想到變化或替換,都應涵蓋在本發明的保護範圍之內。因此,本發明的保護範圍應以本發明申請專利範圍的保護範圍為準。The above is only a specific implementation of the present invention, but the protection scope of the present invention is not limited thereto. Any technical personnel familiar with the technical field can easily think of changes or substitutions within the technical scope disclosed by the present invention, which should be covered by the protection scope of the present invention. Therefore, the protection scope of the present invention shall be based on the protection scope of the patent application of the present invention.

1:拉晶爐 1A:拉晶爐 10:導流筒 10A:導流筒 10B:底部 10N:凹口 10X:縱向軸線 20:爐體 20A:爐體 20C:爐體空腔 30:坩堝 30A:坩堝 40:加熱器 40A:加熱器 50:保溫元件 HM:水平磁場 L:液面 M:熔體 PG:保護性氣體 R:晶棒 1: Crystal pulling furnace 1A: Crystal pulling furnace 10: Flow tube 10A: Flow tube 10B: Bottom 10N: Notch 10X: Longitudinal axis 20: Furnace body 20A: Furnace body 20C: Furnace body cavity 30: Crucible 30A: Crucible 40: Heater 40A: Heater 50: Insulation element HM: Horizontal magnetic field L: Liquid level M: Melt PG: Protective gas R: Crystal rod

圖1為常規的用於拉製晶棒的拉晶爐的結構示意圖; 圖2為在圖1中示出的加熱器和水平磁場的共同作用下熔體流動的跡線的示意圖; 圖3為根據本發明的實施例的在直拉法拉製晶棒的過程中使用的導流筒的立體示意圖; 圖4為根據本發明的實施例的導流筒相對於水平磁場處於第一位置時的截面示意圖; 圖5為根據本發明的實施例的導流筒相對於水平磁場處於第二位置時的截面示意圖; 圖6為在圖1中示出的加熱器的作用下熔體在與液面平行的平面中的溫度分佈示意圖; 圖7為根據本發明的另一實施例的在直拉法拉製晶棒的過程中使用的導流筒的正視示意圖; 圖8為根據本發明的實施例的在直拉法拉製晶棒的過程中使用的拉晶爐的結構示意圖。 Figure 1 is a schematic diagram of the structure of a conventional crystal pulling furnace for pulling crystal rods; Figure 2 is a schematic diagram of the trajectory of melt flow under the combined action of the heater and the horizontal magnetic field shown in Figure 1; Figure 3 is a three-dimensional schematic diagram of a guide tube used in the process of CZO-pulling crystal rods according to an embodiment of the present invention; Figure 4 is a cross-sectional schematic diagram of the guide tube according to an embodiment of the present invention when it is in a first position relative to the horizontal magnetic field; Figure 5 is a cross-sectional schematic diagram of the guide tube according to an embodiment of the present invention when it is in a second position relative to the horizontal magnetic field; Figure 6 is a schematic diagram of the temperature distribution of the melt in a plane parallel to the liquid surface under the action of the heater shown in Figure 1; Figure 7 is a front view schematic diagram of a guide tube used in the process of CZO-pulling crystal rods according to another embodiment of the present invention; FIG8 is a schematic diagram of the structure of a crystal pulling furnace used in the process of pulling a crystal rod by the Czochralski method according to an embodiment of the present invention.

10:導流筒 10: Guide tube

10B:底部 10B: Bottom

10N:凹口 10N: Notch

10X:縱向軸線 10X: Longitudinal axis

Claims (10)

一種在直拉法拉製晶棒的過程中使用的導流筒,該導流筒的底部具有凹口,該凹口用於通過該導流筒繞自身的縱向軸線轉動使在基準徑向上流經熔體的液面的保護性氣體的流量發生變化。A guide tube used in the process of Czochralski crystal rod pulling has a notch at the bottom. The notch is used to change the flow rate of a protective gas flowing through the liquid surface of a melt in a reference diameter direction by rotating the guide tube around its own longitudinal axis. 如請求項1所述的導流筒,其中,該凹口的數量為兩個並且在該導流筒的徑向上對置。A guide tube as described in claim 1, wherein the number of the notches is two and they are radially opposite to each other on the guide tube. 如請求項2所述的導流筒,其中,該導流筒被設置成使得兩個該凹口之間的連接線與施加至該熔體的水平磁場平行。The flow guide sleeve as described in claim 2, wherein the flow guide sleeve is arranged so that a connecting line between two of the notches is parallel to a horizontal magnetic field applied to the melt. 如請求項2所述的導流筒,其中,該導流筒被設置成使得兩個該凹口之間的連接線與施加至該熔體的水平磁場垂直。A flow guide sleeve as described in claim 2, wherein the flow guide sleeve is arranged so that a connecting line between two of the notches is perpendicular to a horizontal magnetic field applied to the melt. 如請求項1至4中任一項所述的導流筒,其中,該凹口呈矩形。A guide tube as described in any one of claims 1 to 4, wherein the recess is rectangular. 如請求項1至4中任一項所述的導流筒,其中,該凹口朝向該導流筒的底部漸擴。A flow guide tube as described in any one of claims 1 to 4, wherein the recess gradually expands toward the bottom of the flow guide tube. 一種在直拉法拉製晶棒的過程中使用的拉晶爐,該拉晶爐包括如請求項1至6中任一項該導流筒。A crystal pulling furnace used in a process of pulling a crystal rod by the Czochralski method, the crystal pulling furnace comprising the guide tube as described in any one of claims 1 to 6. 如請求項7所述的拉晶爐,其中,該拉晶爐還包括: 爐體,該爐體限定出爐體空腔; 坩堝,該坩堝設置在該爐體空腔中,該熔體容納在該坩堝中。 The crystal pulling furnace as described in claim 7, wherein the crystal pulling furnace further comprises: a furnace body, the furnace body defining a furnace body cavity; a crucible, the crucible being disposed in the furnace body cavity, the melt being contained in the crucible. 如請求項8所述的拉晶爐,其中,該拉晶爐還包括加熱器,該加熱器設置在該爐體空腔中並且設置在該坩堝的外周以對該坩堝進行加熱,從而使容納在該坩堝中的固態原料熔化成該熔體。The crystal pulling furnace as described in claim 8, wherein the crystal pulling furnace further includes a heater, which is arranged in the furnace cavity and on the periphery of the crucible to heat the crucible, thereby melting the solid raw material contained in the crucible into the melt. 如請求項9所述的拉晶爐,其中,該拉晶爐還包括保溫元件,該保溫元件設置在該爐體的內壁處以抑制該加熱器產生的熱量經由該爐體散失。The crystal pulling furnace as described in claim 9, wherein the crystal pulling furnace further includes a heat insulation element, which is arranged on the inner wall of the furnace body to inhibit the heat generated by the heater from being dissipated through the furnace body.
TW112148983A 2023-05-26 2023-12-15 A guide tube and a crystal pulling furnace used in the process of pulling a crystal rod by a Czochralski method TW202417697A (en)

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