TW202411672A - Power-on state retention module - Google Patents
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- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
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Abstract
Description
本發明涉及一種開機狀態保持模組,特別是涉及一種使待測試電路板維持於開機狀態的開機狀態保持模組。The present invention relates to a power-on state holding module, and in particular to a power-on state holding module which enables a circuit board to be tested to maintain a power-on state.
電路板於工廠製造完畢後,必須經過一個測試流程,測試流程包含了進行不同的測試機台的測試,只有當每一個測試項目都合格時,才能進入市場進行販售。After the circuit board is manufactured in the factory, it must go through a testing process. The testing process includes testing on different test machines. Only when every test item is qualified can it enter the market for sale.
當待測試電路板進入測試機台時,測試機台對待測試電路板供電以使待測試電路板開機,接著測試機台對待測試電路板進行功能測試。當待測試電路板離開測試機台之後,待測試電路板因為斷電而關機,直到待測試電路板移動至下一個測試機台時,待測試電路板才會再次開機。當待測試電路板需要經過的測試機台越多時,重複開關機次數也越多。當重複開關機的次數越多時,容易導致待測試電路板的資料流失以及發生開機異常的機率增大。When the circuit board to be tested enters the test machine, the test machine supplies power to the circuit board to turn on the circuit board to be tested, and then the test machine performs a functional test on the circuit board to be tested. After the circuit board to be tested leaves the test machine, the circuit board to be tested shuts down due to power failure, and the circuit board to be tested will not be turned on again until the circuit board to be tested moves to the next test machine. The more test machines the circuit board to be tested needs to pass through, the more times it needs to be repeatedly turned on and off. The more times it is repeatedly turned on and off, the more likely it is that the data of the circuit board to be tested will be lost and the probability of abnormal startup will increase.
本發明所要解決的技術問題在於,針對現有技術的不足提供一種開機狀態保持模組。The technical problem to be solved by the present invention is to provide a power-on state holding module in view of the deficiencies of the prior art.
為了解決上述的技術問題,本發明所採用的其中一技術方案是提供一種開機狀態保持模組,其包括一待測試電路板、一控制電路板以及一充電電池。該控制電路板電性連接於該待測試電路板,而該充電電池電性連接於該控制電路板。當該開機狀態保持模組進行一個測試流程時,該控制電路板將該充電電池的一電力提供給該待測試電路板,以使待測試電路板保持於一開機狀態。In order to solve the above technical problems, one of the technical solutions adopted by the present invention is to provide a power-on state holding module, which includes a circuit board to be tested, a control circuit board and a charging battery. The control circuit board is electrically connected to the circuit board to be tested, and the charging battery is electrically connected to the control circuit board. When the power-on state holding module performs a test process, the control circuit board provides power from the charging battery to the circuit board to be tested, so that the circuit board to be tested is kept in a power-on state.
本發明的其中一有益效果在於,本發明所提供的開機狀態保持模組,由於在待測試電路板在進行測試流程時,充電電池都一直持續地供電給待測試電路板以使得待測試電路板保持於開機狀態,所以待測試電路板只會開機一次而省去了重複開關機所浪費的時間。如此一來,將降低待測試電路板完成測試流程所需的時間。此外,也因為待測試電路板不需要重複地開關機,也降低了資料流失以及開機異常的機率。One of the beneficial effects of the present invention is that the power-on status holding module provided by the present invention, because when the circuit board to be tested is undergoing the test process, the charging battery continuously supplies power to the circuit board to be tested so that the circuit board to be tested is kept in the power-on state, so the circuit board to be tested is only powered on once and the time wasted by repeated power on and off is saved. In this way, the time required for the circuit board to be tested to complete the test process will be reduced. In addition, because the circuit board to be tested does not need to be repeatedly powered on and off, the probability of data loss and power-on abnormality is also reduced.
為使能更進一步瞭解本發明的特徵及技術內容,請參閱以下有關本發明的詳細說明與圖式,然而所提供的圖式僅用於提供參考與說明,並非用來對本發明加以限制。To further understand the features and technical contents of the present invention, please refer to the following detailed description and drawings of the present invention. However, the drawings provided are only used for reference and description and are not used to limit the present invention.
以下是通過特定的具體實施例來說明本發明所公開有關“開機狀態保持模組”的實施方式,本領域技術人員可由本說明書所公開的內容瞭解本發明的優點與效果。本發明可通過其他不同的具體實施例加以施行或應用,本說明書中的各項細節也可基於不同觀點與應用,在不悖離本發明的構思下進行各種修改與變更。另外,本發明的附圖僅為簡單示意說明,並非依實際尺寸的描繪,事先聲明。以下的實施方式將進一步詳細說明本發明的相關技術內容,但所公開的內容並非用以限制本發明的保護範圍。The following is a specific embodiment to illustrate the implementation of the "power-on status retention module" disclosed in the present invention. Technical personnel in this field can understand the advantages and effects of the present invention from the content disclosed in this manual. The present invention can be implemented or applied through other different specific embodiments, and the details in this manual can also be modified and changed in various ways based on different viewpoints and applications without deviating from the concept of the present invention. In addition, the drawings of the present invention are only for simple schematic illustrations and are not depicted according to actual sizes. Please note in advance. The following implementation will further explain the relevant technical content of the present invention in detail, but the disclosed content is not intended to limit the scope of protection of the present invention.
應當可以理解的是,雖然本文中可能會使用到“第一”、“第二”、“第三”等術語來描述各種元件或者信號,但這些元件或者信號不應受這些術語的限制。這些術語主要是用以區分一元件與另一元件,或者一信號與另一信號。另外,本文中所使用的術語“或”,應視實際情況可能包括相關聯的列出項目中的任一個或者多個的組合。It should be understood that, although the terms "first", "second", "third", etc. may be used in this document to describe various components or signals, these components or signals should not be limited by these terms. These terms are mainly used to distinguish one component from another component, or one signal from another signal. In addition, the term "or" used in this document may include any one or more combinations of the related listed items depending on the actual situation.
圖1為本發明的開機狀態保持模組的一實施例的立體圖,共同參閱圖1以及圖2,開機狀態保持模組A1包括一待測試電路板100、一控制電路板200、一充電電池300以及一固定框架400,待測試電路板100例如為主機板或無線網卡,而待測試電路板100、控制電路板200以及充電電池300固定於固定框架400內。FIG1 is a perspective view of an embodiment of the power-on status holding module of the present invention. Referring to FIG1 and FIG2 together, the power-on status holding module A1 includes a circuit board to be tested 100, a
圖2為本發明的開機狀態保持模組經過多個測試機台的一實施例的示意圖。如圖2所示,當開機狀態保持模組A1進行一個測試流程時,依序通過一第一測試機台TS1、一第二測試機台TS2、一第三測試機台TS3、一第四測試機台TS4以及一第五測試機台TS5,其中第一測試機台TS1、第二測試機台TS2、第三測試機台TS3、第四測試機台TS4以及第五測試機台TS5分別負責測試待測試電路板100的第一功能、第二功能、第三功能、第四功能以及第五功能是否正常。第一測試機台TS1例如為OS測試機台,第二測試機台TS2例如為CAL測試機台,第三測試機台例如為RF1測試機台,第四測試機台例如為RF2測試機台,而第五測試機台TS5例如為FCT測試機台。以上的測試機台的數量以其測試項目僅為示範,本發明並不侷限於此。Fig. 2 is a schematic diagram of an embodiment of the power-on state holding module of the present invention passing through multiple test machines. As shown in Fig. 2, when the power-on state holding module A1 performs a test process, it sequentially passes through a first test machine TS1, a second test machine TS2, a third test machine TS3, a fourth test machine TS4, and a fifth test machine TS5, wherein the first test machine TS1, the second test machine TS2, the third test machine TS3, the fourth test machine TS4, and the fifth test machine TS5 are respectively responsible for testing whether the first function, the second function, the third function, the fourth function, and the fifth function of the
在開機狀態保持模組A1進入第一測試機台TS1之前,控制電路板200根據外部的開機指令而使得待測試電路板100與充電電池300之間產生連結。當待測試電路板100連結於充電電池300時,待測試電路板100可獲得來自充電電池300所儲存的電力。在待測試電路板100獲得來自充電電池300所儲存的電力之後,待測試電路板100從關機狀態轉變為開機狀態。Before the power-on state holding module A1 enters the first test machine TS1, the
在待測試電路板100開機之後,開機狀態保持模組A1進入第一測試機台TS1,而第一測試機台TS1開始對待測試電路板100的第一功能進行測試。在第一測試機台TS1完成對待測試電路板100之測試後,開機狀態保持模組A1離開第一測試機台TS1。接著,進入運輸設備(例如傳送帶)而朝向第二測試機台TS2移動。After the
在開機狀態保持模組A1離開第一測試機台TS1之後以及尚未進入第二測試機台TS2之前,控制電路板200依然維持待測試電路板100與充電電池300之間的連結,所以待測試電路板100維持於開機狀態。當開機狀態保持模組A1移動至第二測試機台TS2時,由於待測試電路板100已經處於開機狀態,所以第二測試機台TS2可立即對待測試電路板100的第二功能進行測試。在第二測試機台TS2完成對待測試電路板100之第二功能的測試後,開機狀態保持模組A1離開第二測試機台TS2。接著,進入運輸設備(例如傳送帶)而朝向第三測試機台TS3移動。After the power-on state holding module A1 leaves the first test machine TS1 and before entering the second test machine TS2, the
在開機狀態保持模組A1離開第二測試機台TS2之後以及尚未進入第三測試機台TS3之前,控制電路板200依然維持待測試電路板100與充電電池300之間的連結,所以待測試電路板100維持於開機狀態。當開機狀態保持模組A1移動至第三測試機台TS3時,由於待測試電路板100已經處於開機狀態,所以第三測試機台TS3可立即對待測試電路板100的第三功能進行測試。在第三測試機台TS3完成對待測試電路板100之第三功能的測試後,開機狀態保持模組A1離開第三測試機台TS3。接著,進入運輸設備(例如傳送帶)而朝向第四測試機台TS4移動。After the power-on state holding module A1 leaves the second test machine TS2 and before entering the third test machine TS3, the
在開機狀態保持模組A1離開第三測試機台TS3之後以及尚未進入第四測試機台TS4之前,控制電路板200依然維持待測試電路板100與充電電池300之間的連結,所以待測試電路板100維持於開機狀態。當開機狀態保持模組A1移動至第四測試機台TS4時,由於待測試電路板100已經處於開機狀態,所以第四測試機台TS4可立即對待測試電路板100的第四功能進行測試。在第四測試機台TS4完成對待測試電路板100之第四功能的測試後,開機狀態保持模組A1離開第四測試機台TS4。接著,進入運輸設備(例如傳送帶)而朝向第五測試機台TS5移動。After the power-on state holding module A1 leaves the third test machine TS3 and before entering the fourth test machine TS4, the
在開機狀態保持模組A1離開第四測試機台TS4之後以及尚未進入第五測試機台TS5之前,控制電路板200依然維持待測試電路板100與充電電池300之間的連結,所以待測試電路板100維持於開機狀態。當開機狀態保持模組A1移動至第五測試機台TS5時,由於待測試電路板100已經處於開機狀態,所以第五測試機台TS5可立即對待測試電路板100的第五功能進行測試。在第五測試機台TS5完成對待測試電路板100之第五功能的測試後,開機狀態保持模組A1離開第五測試機台TS5。After the power-on state holding module A1 leaves the fourth test machine TS4 and before entering the fifth test machine TS5, the
在開機狀態保持模組A1離開第五測試機台TS5之後,由於待測試電路板100已經完成所有功能的測試,控制電路板200接收到外部裝置到一關機指令,且根據關機指令截斷充電電池300與待測試電路板100之間的連結。當充電電池300與待測試電路板100之間的連結被截斷時,待測試電路板100將無法接收到充電電池300的電力,因此待測試電路板100從開機狀態切換至關機狀態。After the power-on state holding module A1 leaves the fifth test machine TS5, since the
圖3為開機狀態保持模組定位於第一測試機台的一實施例的示意圖。如圖3所示,開機狀態保持模組A1的固定框架400包含有多個定位邊角401,而第一測試機台TS1包含有多個定位板PB,當開機狀態保持模組A1進入第一測試機台TS1時,其中二個定位邊角401分別與該些定位板PB相抵觸。如此一來,當第一測試機台TS1對待測試電路板100進行測試時,開機狀態保持模組A1不容易產生位移。FIG3 is a schematic diagram of an embodiment of positioning the power-on state holding module in the first test machine. As shown in FIG3, the fixed
圖4為開機狀態保持模組定位於第一測試機台的另一實施例的示意圖。如圖4所示,開機狀態保持模組A1的固定框架400還包含有多個定位柱403,而第一測試機台TS1包含有多個定位孔PH,當開機狀態保持模組A1進入第一測試機台TS1時,該些定位柱403分別與該些定位孔PH相卡合。如此一來,當第一測試機台TS1對待測試電路板100進行測試時,開機狀態保持模組A1不容易產生位移。FIG4 is a schematic diagram of another embodiment of positioning the power-on state holding module in the first test machine. As shown in FIG4, the fixed
在其他實施例中,固定框架400可同時透過定位邊角401與定位板PB之抵觸以及定位柱403與定位孔PH之卡合,達到定位於第一測試機台TS1之效果。In other embodiments, the
圖5為本發明的開機狀態保持模組的第一實施例的電路功能方塊圖。如圖5所示,開機狀態保持模組A1的控制電路板200包含有一微處理器201、一開關電路203、一第一傳輸介面IF1、第二傳輸介面IF2以及一第三傳輸介面IF3,微處理器201電性連接於第一傳輸介面IF1以及開關電路203,第一傳輸介面IF1還電性連接於一終端裝置TD,而終端裝置TD例如為行動通訊裝置或者伺服器。第二傳輸介面IF2電性連接於充電電池300以及開關電路203,而第三傳輸介面IF3電性連接於開關電路203以及待測試電路板100的一第四傳輸介面IF4,而待測試電路板100包含有多個測試點TP。FIG5 is a circuit functional block diagram of the first embodiment of the power-on status holding module of the present invention. As shown in FIG5, the
在一實施例中,待測試電路板100例如為無線網路卡或者主機板,開關電路203例如為金屬氧化物半導體場效電晶體,而第一傳輸介面IF1、第二傳輸介面IF2以及第三傳輸介面IF3例如為積體電路匯流排。In one embodiment, the
控制電路板200的開關電路203包含一第一電性接腳2031、一第二電性接腳2033以及一第三電性接腳2035,開關電路203的第一電性接腳2031電性連接於微處理器201。開關電路203的第二電性接腳2033電性連接於第二傳輸介面IF2,而開關電路203的第三電性接腳2035電性連接於第三傳輸介面IF3。The switch circuit 203 of the
控制電路板200的微處理器201經由第一傳輸介面IF1接收終端裝置TD的開機指令。接著,微處理器201根據開機指令向開關電路203發出控制訊號。當控制電路板200的開關電路203接收到微處理器201的控制訊號時,控制電路板200的開關電路203從截止狀態切換至導通狀態。當控制電路板200的開關電路203處於導通狀態時,充電電池300所儲存的電力可經由第二傳輸介面IF2、開關電路203以及第三傳輸介面IF3傳送至待測試電路板100。當待測試電路板100獲得來自充電電池300的電力時,待測試電路板100從關機狀態轉變為開機狀態。The microprocessor 201 of the
以下表1為習知的待測試電路板進行一個測試流程的時間關係表,其中該測試流程包含待測試電路板依序受到CAL測試機台、RF1測試機台、RF2測試機台以及FCT測試機台之測試。
以下表2為本發明的待測試電路板100進行一個測試流程的時間關係表,其中該測試流程包含待測試電路板依序受到CAL測試機台、RF1測試機台、RF2測試機台以及FCT測試機台之測試。
比較表1以及表2,本發明的待測試電路板100在進行測試流程的每一個測試項目時,都是維持於開機狀態,所以待測試電路板100不需重複地開關機,減少了待測試電路板100完成測試流程所需的時間。Comparing Table 1 and Table 2, the
當待測試電路板100完成測試流程時,微處理器201使開關電路203從導通狀態轉變為截止狀態,從而截斷充電電池300與待測試電路板100之間的連結。此時,待測試電路板100從開機狀態轉變為關機狀態。When the
圖6為本發明的開機狀態保持模組的第二實施例的電路功能方塊圖。圖6的開機狀態保持模組A2相較於圖5的開機狀態保持模組A1,其差異在於,省略了第二傳輸介面IF2,充電電池300直接設置於控制電路板200上,控制電路板200的開關電路203的第二電性接腳2033連接於充電電池300。FIG6 is a circuit functional block diagram of the second embodiment of the power-on state holding module of the present invention. The power-on state holding module A2 of FIG6 is different from the power-on state holding module A1 of FIG5 in that the second transmission interface IF2 is omitted, the charging
圖7為本發明的開機狀態保持模組的第三實施例的電路功能方塊圖,圖7的開機狀態保持模組A3相較於圖5的開機狀態保持模組A1,其差異在於,待測試電路板100還包含有多個導電軌跡ET以及一第一電力傳輸介面PF1,每一導電軌跡ET的一端連接於測試點TP,而每一導電軌跡ET的另一端連接於第一電力傳輸介面PF1。充電電池300設有一第二電力傳輸介面PF2,而第二電力傳輸介面PF2電性連接於第一電力傳輸介面PF1。當測試機台的測試工具接觸到待測試電路板100的測試點TP時,測試機台所提供的電力可經由導電軌跡ET、第一電力傳輸介面PF1以及第二電力傳輸介面PF2傳送至充電電池300,達到同時對待測試電路板100進行功能測試以及對充電電池300進行充電的技術效果。FIG7 is a circuit functional block diagram of the third embodiment of the power-on status holding module of the present invention. The power-on status holding module A3 of FIG7 is different from the power-on status holding module A1 of FIG5 in that the
圖8為本發明的具有維持開機狀態功能的測試系統的第四實施例的電路功能方塊圖。圖8的開機狀態保持模組A4相較於圖7的開機狀態保持模組A3,其差異在於,第二電力傳輸介面PF2設置於控制電路板200,而第二電力傳輸介面PF2電性連接於微處理器201。控制電路板200還包含有一電壓偵測電路205,微處理器201電性連接於電壓偵測電路205,而電壓偵測電路205電性連接於第二傳輸介面IF2。當測試機台的測試工具接觸到待測試電路板100的測試點TP且電壓偵測電路205偵測到充電電池300的電壓小於電壓臨界值時,電壓偵測電路205發送一電池電壓偵測訊號給微處理器201,而微處理器201根據電池電壓偵測訊號將測試機台所提供的電力傳送給充電電池300,達到同時對待測試電路板100進行功能測試以及對充電電池300進行充電的技術效果。FIG8 is a circuit functional block diagram of the fourth embodiment of the test system with the function of maintaining the power-on state of the present invention. The power-on state maintaining module A4 of FIG8 is different from the power-on state maintaining module A3 of FIG7 in that the second power transmission interface PF2 is provided on the
[實施例的有益效果][Beneficial Effects of Embodiments]
本發明的其中一有益效果在於,本發明所提供的開機狀態保持模組,由於在待測試電路板進行一個測試流程時,充電電池都一直持續地供電給待測試電路板以使得待測試電路板保持於開機狀態,所以待測試電路板只會開機一次而省去了重複開關機所浪費的時間。如此一來,將降低待測試電路板完成測試流程所需的時間。此外,也因為待測試電路板不需要重複地開關機,也降低了資料流失以及開機異常的機率。One of the beneficial effects of the present invention is that the power-on state holding module provided by the present invention, when the circuit board to be tested is undergoing a test process, the charging battery continuously supplies power to the circuit board to be tested so that the circuit board to be tested is kept in the power-on state, so the circuit board to be tested is only powered on once and the time wasted by repeated power on and off is saved. In this way, the time required for the circuit board to be tested to complete the test process will be reduced. In addition, because the circuit board to be tested does not need to be repeatedly powered on and off, the probability of data loss and power-on abnormality is also reduced.
以上所公開的內容僅為本發明的優選可行實施例,並非因此侷限本發明的申請專利範圍,所以凡是運用本發明說明書及圖式內容所做的等效技術變化,均包含於本發明的申請專利範圍內。The contents disclosed above are only preferred feasible embodiments of the present invention and are not intended to limit the scope of the patent application of the present invention. Therefore, all equivalent technical changes made using the contents of the specification and drawings of the present invention are included in the scope of the patent application of the present invention.
A1~A4:開機狀態保持模組 100:待測試電路板 200:控制電路板 201:微處理器 203:開關電路 2031:第一電性接腳 2033:第二電性接腳 2035:第三電性接腳 205:電壓偵測電路 300:充電電池 400:固定框架 401:定位邊角 403:定位柱 TS1:第一測試機台 TS2:第二測試機台 TS3:第三測試機台 TS4:第四測試機台 TS5:第五測試機台 PB:定位板 PH:定位孔 IF1:第一傳輸介面 IF2:第二傳輸介面 IF3:第三傳輸介面 IF4:第四傳輸介面 TD:終端裝置 TP:測試點 ET:導電軌跡 PF1:第一電力傳輸介面 PF2:第二電力傳輸介面 A1~A4: Power-on status retention module 100: Circuit board to be tested 200: Control circuit board 201: Microprocessor 203: Switching circuit 2031: First electrical pin 2033: Second electrical pin 2035: Third electrical pin 205: Voltage detection circuit 300: Rechargeable battery 400: Fixed frame 401: Positioning corner 403: Positioning column TS1: First test machine TS2: Second test machine TS3: Third test machine TS4: Fourth test machine TS5: Fifth test machine PB: Positioning plate PH: Positioning hole IF1: First transmission interface IF2: Second transmission interface IF3: Third transmission interface IF4: Fourth transmission interface TD: Terminal Device TP: Test Point ET: Conductive Track PF1: First Power Transmission Interface PF2: Second Power Transmission Interface
圖1為本發明的開機狀態保持模組的一實施例的立體圖。FIG. 1 is a perspective view of an embodiment of a power-on status retention module of the present invention.
圖2為本發明的開機狀態保持模組經過多個測試機台的一實施例的示意圖。FIG. 2 is a schematic diagram of an embodiment of the power-on status holding module of the present invention passing through multiple test machines.
圖3為本發明的開機保持模組定位於測試機台的一實施例的示意圖。FIG. 3 is a schematic diagram of an embodiment of the power-on holding module of the present invention positioned on a test machine.
圖4為本發明的開機保持模組定位於測試機台的另一實施例的示意圖。FIG. 4 is a schematic diagram of another embodiment of the power-on holding module of the present invention positioned on a test machine.
圖5本發明的開機狀態保持模組的第一實施例的電路功能方塊圖。FIG5 is a circuit functional block diagram of the first embodiment of the power-on status retention module of the present invention.
圖6本發明的開機狀態保持模組的第二實施例的電路功能方塊圖。FIG6 is a circuit functional block diagram of the second embodiment of the power-on status retention module of the present invention.
圖7為本發明的開機狀態保持模組的第三實施例的電路功能方塊圖。FIG. 7 is a circuit functional block diagram of a third embodiment of the power-on status retention module of the present invention.
圖8為本發明的開機狀態保持模組的第四實施例的電路功能方塊圖。FIG8 is a circuit functional block diagram of a fourth embodiment of the power-on status retention module of the present invention.
A1:開機狀態保持模組 A1: Power-on status retention module
100:待測試電路板 100: Circuit board to be tested
200:控制電路板 200: Control circuit board
201:微處理器 201: Microprocessor
203:開關電路 203: Switching circuit
2031:第一電性接腳 2031: First electrical pin
2033:第二電性接腳 2033: Second electrical pin
2035:第三電性接腳 2035: The third electrical pin
300:充電電池 300: Rechargeable battery
IF1:第一傳輸介面 IF1: First transmission interface
IF2:第二傳輸介面 IF2: Second transmission interface
IF3:第三傳輸介面 IF3: Third transmission interface
IF4:第四傳輸介面 IF4: Fourth transmission interface
TD:終端裝置 TD: terminal device
TP:測試點 TP:Test point
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