TW202345980A - Interference mitigation in an impedance sensing system - Google Patents
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B06—GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
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Abstract
Description
本發明大體上係關於用於監測具有複雜阻抗之負載之方法、裝置或實施方案。本文闡述之實施例亦可揭示用於抑制可不利地影響複雜阻抗之準確及精確量測之雜訊及其他干擾的改良。The present invention generally relates to methods, apparatus or implementations for monitoring loads with complex impedances. The embodiments described herein may also reveal improvements for suppressing noise and other interference that can adversely affect accurate and precise measurements of complex impedances.
振動觸覺換能器,舉例而言,線性諧振致動器(LRA),廣泛用於諸如行動電話之攜帶型器件中,以向一使用者產生振動回饋。各種形式之振動觸覺回饋對一使用者之皮膚產生不同觸摸感覺,且可在現代器件之人機互動中發揮越來越大的作用。Vibrotactile transducers, such as linear resonant actuators (LRA), are widely used in portable devices such as mobile phones to generate vibration feedback to a user. Various forms of vibrotactile feedback produce different touch sensations on a user's skin, and can play an increasing role in human-computer interaction in modern devices.
一LRA可模型化為一質量彈簧機電振動系統。當用適當設計或控制之驅動信號驅動時,一LRA可產生某些所要形式之振動。舉例而言,一使用者指狀部上一尖銳且清晰之振動模式可用於產生模擬一機械按鈕點擊之一感覺。此清晰之振動可接著用作一虛擬開關來代替機械按鈕。An LRA can be modeled as a mass-spring electromechanical vibration system. When driven with appropriately designed or controlled drive signals, an LRA can produce certain desired forms of vibration. For example, a sharp and distinct vibration pattern on a user's finger can be used to create a sensation that simulates the click of a mechanical button. This clear vibration can then be used as a virtual switch instead of a mechanical button.
圖1繪示一器件100中之一振動觸覺系統之一實例。器件100可包括一控制器101,其經組態以控制施加至一放大器102之一信號。放大器102可接著基於該信號驅動一振動致動器(例如,觸覺換能器)103。控制器101可藉由一觸發器觸發以輸出至該信號。舉例而言,觸發器可包括器件100之一螢幕或虛擬按鈕上之一壓力或力感測器。Figure 1 illustrates an example of a vibrotactile system in a device 100. Device 100 may include a controller 101 configured to control a signal applied to an amplifier 102 . Amplifier 102 may then drive a vibration actuator (eg, tactile transducer) 103 based on the signal. The controller 101 can be triggered by a trigger to output to the signal. For example, the trigger may include a pressure or force sensor on a screen or virtual button of device 100 .
在各種形式之振動觸覺回饋中,持續期間之音調振動可發揮一重要作用,以向器件之使用者通知某些預定義事件,諸如來電或訊息、緊急警報及計時器警告等。為了有效產生音調振動通知,其可期望以其諧振頻率操作觸覺致動器。Among various forms of vibrotactile feedback, sustained tonal vibrations can play an important role in notifying the user of the device of certain predefined events, such as incoming calls or messages, emergency alarms, and timer warnings. In order to effectively generate tonal vibration notifications, it may be desirable to operate the haptic actuator at its resonant frequency.
一觸覺換能器之諧振頻率 f 0 可近似估計為: (1) 其中C為彈簧系統之柔度,且M為等效移動質量,其可基於觸覺換能器中之實際移動零件及保持觸覺換能器之攜帶型器件之質量兩者來判定。 The resonant frequency f 0 of a tactile transducer can be approximately estimated as: (1) Where C is the flexibility of the spring system, and M is the equivalent moving mass, which can be determined based on both the actual moving parts in the tactile transducer and the mass of the portable device that holds the tactile transducer.
歸因於個別觸覺換能器中之樣本至樣本變動、行動器件組件變動、由老化引起之時間分量變化及諸如一使用者抓握器件之各種不同強度之使用條件,觸覺換能器之振動諧振可不時改變。Vibrational resonance of tactile transducers due to sample-to-sample variation in individual tactile transducers, mobile device component variations, time component changes due to aging, and usage conditions of varying intensity such as a user grasping the device Can change from time to time.
圖2繪示模型化為一線性系統之一線性諧振致動器(LRA)之一實例。LRA為非線性組件,舉例而言,取決於施加之電壓位準、操作溫度及操作頻率,其等可表現不同。然而,在某些條件下,此等組件可模型化為線性組件。在此實例中,LRA模型化為具有電及機械元件之一第三級系統。特定言之, 及 分別為線圈磁體系統之直流電阻及線圈電感;且 為線圈之磁力因素。驅動放大器輸出具有輸出阻抗 之電壓波形 。可跨觸覺換能器之端子感測端子電壓 。質量彈簧系統201以速度 移動。 Figure 2 shows an example of a linear resonant actuator (LRA) modeled as a linear system. LRAs are non-linear components that can behave differently depending on, for example, applied voltage level, operating temperature, and operating frequency. However, under certain conditions, these components can be modeled as linear components. In this example, the LRA is modeled as a third-level system with electrical and mechanical components. Specifically speaking, and are the DC resistance and coil inductance of the coil magnet system respectively; and is the magnetic factor of the coil. The driver amplifier output has an output impedance voltage waveform . Sensing terminal voltage across the terminals of a tactile transducer . Mass Spring System 201 with Velocity Move.
一觸覺系統可需要精確控制觸覺換能器之移動。此控制可依賴於磁力因素 ,其亦可被稱為觸覺換能器之電磁傳遞函數。在一理想情況下,磁力因素 可由乘積 給定,其中 B為磁通密度,且 l為一磁場中電導體之一總長度。在沿一單軸發生運動之一理想情況下,磁通密度 B及長度 l兩者應保持恆定。 A haptic system may require precise control of the movement of the haptic transducer. This control can rely on magnetic factors , which can also be called the electromagnetic transfer function of the tactile transducer. In an ideal case, the magnetic factor can be obtained by multiplying given where B is the magnetic flux density and l is the total length of an electrical conductor in a magnetic field. In an ideal situation where motion occurs along a single axis, both the magnetic flux density B and the length l should remain constant.
在產生觸覺振動時,一LRA可經歷位移。為了保護一LRA免受損害,此位移可受限制。因此,位移之準確量測在最佳化LRA位移保護演算法中至關重要。位移之準確量測亦可提高LRA之驅動位準。雖然現有方法量測位移,但此等方法有缺點。舉例而言,可使用一霍爾感測器來量測位移,但霍爾感測器之實施成本通常很高。An LRA may experience displacement when tactile vibrations are generated. To protect an LRA from damage, this displacement can be limited. Therefore, accurate measurement of displacement is crucial in optimizing the LRA displacement protection algorithm. Accurate measurement of displacement can also improve the driving level of LRA. Although existing methods measure displacement, these methods have shortcomings. For example, a Hall sensor can be used to measure displacement, but Hall sensors are often expensive to implement.
根據本發明之教示,可減少或消除與用於監測一複雜阻抗之現有方法相關聯之缺點及問題。In accordance with the teachings of the present invention, disadvantages and problems associated with existing methods for monitoring a complex impedance may be reduced or eliminated.
根據本發明之實施例,一系統可包含經組態以將一驅動信號驅動至一輸出換能器之驅動電路、經組態以回應於該驅動信號感測與該輸出換能器相關聯之一物理量之感測電路、及經組態以偵測該系統干擾之存在且抑制該系統中該干擾之效應的干擾偵測電路。According to embodiments of the present invention, a system may include drive circuitry configured to drive a drive signal to an output transducer, configured to sense in response to the drive signal associated with the output transducer. A sensing circuit for a physical quantity, and an interference detection circuit configured to detect the presence of interference in the system and suppress the effects of the interference in the system.
根據本發明之此等及其他實施例,一方法可包含回應於至一輸出換能器之一驅動信號來感測與一輸出換能器相關聯之一物理量,偵測包括該輸出換能器之一系統之干擾的存在,且抑制該系統中該干擾之效應。According to these and other embodiments of the invention, a method may include sensing a physical quantity associated with an output transducer in response to a drive signal to an output transducer, detecting the output transducer including the The existence of interference in a system and suppressing the effect of the interference in the system.
根據本發明之此等及其他實施例,一積體電路可包含感測電路,其經組態以回應於至一輸出換能器之一驅動信號感測與一輸出換能器相關聯之一物理量;及干擾偵測電路,其經組態以偵測包括該輸出換能器之一系統干擾之存在,且抑制該系統中該干擾之效應。According to these and other embodiments of the invention, an integrated circuit may include a sensing circuit configured to sense a drive signal to an output transducer in response to one associated with an output transducer. a physical quantity; and a disturbance detection circuit configured to detect the presence of a disturbance in a system including the output transducer and to suppress the effects of the disturbance in the system.
自本文包含之圖、描述及技術方案,本發明之技術優點對於一般技術者來說可係顯而易見的。實施例之目標及優點將至少藉由技術方案中特別指出之元件、特徵及組合來實現及達成。The technical advantages of the present invention will be apparent to those of ordinary skill from the drawings, descriptions and technical solutions contained herein. The objectives and advantages of the embodiments will be realized and achieved by at least the components, features and combinations specifically pointed out in the technical solution.
應暸解,前述一般描述及以下詳細描述兩者為實例及解釋性的,且不係對本發明中闡述之技術方案之限制。It should be understood that both the foregoing general description and the following detailed description are examples and explanatory, and are not intended to limit the technical solutions set forth in the present invention.
相關申請案Related applications
本發明主張2022年2月9日申請之美國臨時專利申請案第63/308230號之優先權利,該案之全文以引用之方式併入本文中。The present invention claims priority rights to U.S. Provisional Patent Application No. 63/308230, filed on February 9, 2022, the full text of which is incorporated herein by reference.
下文之描述闡述根據本發明之實例實施例。對於一般技術者來說,進一步實例實施例及實施方案將係顯而易見的。此外,一般技術者將辨識到,可應用各種等效技術來代替或結合下文討論之實施例,且全部此等等效技術應視為包含在本發明中。The following description sets forth example embodiments in accordance with the invention. Further example examples and implementations will be apparent to those of ordinary skill. Furthermore, those of ordinary skill will recognize that various equivalent techniques may be employed in place of or in combination with the embodiments discussed below, and all such equivalent techniques shall be deemed to be included in the present invention.
各種電子器件或智慧器件可具有換能器、揚聲器及聲輸出換能器,舉例而言,用於將一適合的電驅動信號轉換成一聲輸出(諸如一音壓波或機械振動)之任何換能器。舉例而言,許多電子器件可包含用於聲音產生之一或多個揚聲器或擴音器,舉例而言,用於音訊內容之重播、語音通信及/或用於提供聲訊通知。Various electronic devices or smart devices may have transducers, speakers, and acoustic output transducers, for example, any transducer that converts a suitable electrical drive signal into an acoustic output, such as a sound pressure wave or mechanical vibration. energy device. For example, many electronic devices may include one or more speakers or amplifiers for sound generation, for example, for playback of audio content, voice communications, and/or for providing audible notifications.
此等揚聲器或擴音器可包括一電磁致動器,舉例而言,一音圈馬達,其機械耦合至一可撓性隔膜,舉例而言,一習知擴音器錐體,或其機械耦合至一器件之一表面,舉例而言,一行動器件之玻璃螢幕。一些電子器件亦可包含能夠產生超音波之聲輸出換能器,舉例而言,用於接近偵測型應用及/或機器對機器通信。Such speakers or loudspeakers may include an electromagnetic actuator, for example, a voice coil motor, mechanically coupled to a flexible diaphragm, for example, a conventional loudspeaker cone, or its mechanical Coupled to a surface of a device, for example, a glass screen of a mobile device. Some electronic devices may also include acoustic output transducers capable of generating ultrasonic waves, for example, for proximity detection-type applications and/or machine-to-machine communications.
許多電子器件可額外地或可替代地包含更特定之聲輸出換能器,舉例而言,觸覺換能器,其按需要制定用於產生用於觸覺控制回饋或通知一使用者之振動。額外地或替代地,一電子器件可具有一連接器,例如,一插座,用於與一配件裝置之一對應連接器進行一可移除的卡合連接,且可配置為向連接器提供一驅動信號,以便在連接時驅動配件裝置之一或多個上述類型之一換能器。因此,此一電子器件將包括用於用一適合的驅動信號驅動主機器件或連接之配件之換能器的驅動電路。對於聲或觸覺換能器,驅動信號通常可為一類比時變電壓信號,舉例而言,一時變波形。Many electronic devices may additionally or alternatively include more specific sound output transducers, for example, haptic transducers, which are tailored to generate vibrations for tactile control feedback or notification to a user as desired. Additionally or alternatively, an electronic device may have a connector, such as a socket, for a removable snap connection with a corresponding connector of an accessory device and may be configured to provide a connector to the connector. A drive signal to drive an accessory device, when connected, to one or more transducers of one of the above types. Therefore, such an electronic device will include drive circuitry for driving the transducer of the host device or connected accessory with a suitable drive signal. For acoustic or tactile transducers, the drive signal may typically be an analogous time-varying voltage signal, for example, a time-varying waveform.
為準確感測一電磁負載之位移,本發明之方法及系統可判定電磁負載之一阻抗,且接著將阻抗轉換為一位置信號,如下文更詳細描述。此外,為量測一電磁負載之阻抗,本發明之方法及系統可利用一相位量測方法及/或一高頻導頻調驅動方法,亦如下文更詳細描述。In order to accurately sense the displacement of an electromagnetic load, the method and system of the present invention can determine the impedance of the electromagnetic load and then convert the impedance into a position signal, as described in more detail below. In addition, to measure the impedance of an electromagnetic load, the method and system of the present invention may utilize a phase measurement method and/or a high-frequency pilot tone driving method, as will be described in more detail below.
為了說明,一電磁負載可藉由一驅動信號 驅動,以跨電磁負載之一線圈產生一感測之端子電壓 。感測之端子電壓 可由下式給定: 其中 為透過電磁負載之一感測電流, Z COIL 為電磁負載之一阻抗,且 為與電磁負載相關聯之反電動勢(反EMF)。 To illustrate, an electromagnetic load can be driven by a drive signal Driven to produce a sensed terminal voltage across a coil of an electromagnetic load . Sensing terminal voltage It can be given by: in is the current sensed through one of the electromagnetic loads, Z COIL is the impedance of one of the electromagnetic loads, and is the back electromotive force (back EMF) associated with the electromagnetic load.
如本文所使用,「驅動」一電磁負載意謂產生一致動信號且將其傳達至電磁負載,以引起電磁負載之一可移動質量之位移。此外,「驅動」一電磁負載亦可意謂將一導頻信號或其他測試信號驅動至電磁負載,從中可量測電磁負載之電參數。As used herein, "driving" an electromagnetic load means generating and communicating an actuation signal to the electromagnetic load to cause displacement of a movable mass of the electromagnetic load. In addition, "driving" an electromagnetic load may also mean driving a pilot signal or other test signal to the electromagnetic load, from which the electrical parameters of the electromagnetic load can be measured.
因為反EMF電壓 可與電磁負載之移動質量之速度成比例,所以反EMF電壓 可繼而提供此速度之一估計。因此,可自感測之端子電壓 及感測之電流 恢復移動質量之速度,假若:(a)感測之電流 等於零,在該情況下 = ;或(b)線圈阻抗 Z COIL 為已知的或為準確估計的。 Because the back EMF voltage Can be proportional to the speed of the moving mass of the electromagnetic load, so the back EMF voltage An estimate of this speed can then be provided. Therefore, the self-sensing terminal voltage and the sensed current The speed at which the moving mass is restored, if: (a) the sensed current equals zero, in which case = ; or (b) the coil impedance Z COIL is known or accurately estimated.
移動質量之位置可與電磁負載之一阻抗相關,包含電磁負載之一線圈電感 L COIL 。在顯著高於電磁負載頻寬之高頻處,反EMF電壓 可變得可忽略,且電感可支配線圈阻抗 Z COIL 。高頻處感測之端子電壓 可藉由下式估計: The position of the moving mass can be related to the impedance of an electromagnetic load, including the coil inductance L COIL of the electromagnetic load. At high frequencies significantly above the electromagnetic load bandwidth, the back EMF voltage can become negligible and the inductance dominates the coil impedance Z COIL . Terminal voltage sensed at high frequency It can be estimated by the following formula:
線圈阻抗 Z COIL 之一電感分量可指示電磁負載之移動質量之一位置或一位移。為了說明,當移動質量靜止時,此電感可為一標稱值。當質量移動時,磁場強度可藉由質量之位置調變,此導致電感之一小交流(AC)調變信號,該信號為質量位置之一函數。 The inductance component of the coil impedance Z COIL can indicate a position or a displacement of the moving mass of the electromagnetic load. To illustrate, this inductance can be a nominal value when the moving mass is stationary. As the mass moves, the magnetic field strength can be modulated by the position of the mass, which results in a small alternating current (AC) modulated signal in the inductance as a function of the mass's position.
因此,在高頻處,電磁負載之移動質量之位置可藉由以下方式自感測之端子電壓 及感測之電流 恢復:(a)將高頻處之線圈阻抗估計為 ,其中 R @HF 為高頻處線圈阻抗之電阻部分, L @HF 為高頻處之線圈電感,且 s為拉普拉斯轉換;及(b)將所量測之電感轉換為一位置信號。速度及/或位置可用於控制電磁負載之移動質量之振動。 Therefore, at high frequencies, the position of the moving mass of the electromagnetic load can be self-sensed by the terminal voltage and the sensed current Recovery: (a) Estimate the coil impedance at high frequency as , where R @HF is the resistive part of the coil impedance at high frequency, L @HF is the coil inductance at high frequency, and s is the Laplace transform; and (b) convert the measured inductance into a position signal . Speed and/or position can be used to control the vibration of a moving mass of an electromagnetic load.
圖3繪示具有一電磁致動器304之一實例主機器件300之選定組件。主機器件300可包含但不限於一行動器件、家庭應用、車輛及/或包含一人機界面之任何其他系統、器件或裝置。電磁致動器304可包含具有一複雜阻抗之任何適合的負載,包含但不限於一觸覺換能器、一擴音器、一微型揚聲器、一音圈致動器、一螺線管或其他適合的換能器。FIG. 3 illustrates selected components of an example host device 300 having an electromagnetic actuator 304. Host device 300 may include, but is not limited to, a mobile device, home application, vehicle, and/or any other system, device, or device that includes a human-machine interface. Electromagnetic actuator 304 may include any suitable load with a complex impedance, including but not limited to a tactile transducer, a loudspeaker, a microspeaker, a voice coil actuator, a solenoid, or other suitable of transducers.
在操作中,主機器件300之一處理子系統305之一信號產生器324可產生一原始換能器驅動信號 (在一些實施例中,其可為一波形信號,諸如一觸覺波形信號或音訊信號)。可基於藉由信號產生器324接收之一期望重播波形來產生原始換能器驅動信號 。 In operation, the signal generator 324 of the processing subsystem 305 of the host device 300 may generate a raw transducer drive signal. (In some embodiments, this may be a waveform signal, such as a tactile waveform signal or an audio signal). The original transducer drive signal may be generated based on a desired replay waveform received by signal generator 324 .
波形預處理器326可接收原始換能器驅動信號 ,波形預處理器可基於自阻抗量測子系統308接收之參數及/或基於任何其他因素來修改原始換能器驅動信號 ,以便產生經處理之換能器驅動信號 及 。舉例而言,此修改可包含對處理之換能器驅動信號 及 之控制,以便防止電磁致動器304之可導致損壞之過度驅動。另外,波形預處理器326可基於基於所偵測之干擾而產生且自阻抗量測子系統308接收之干擾抑制信號來修改原始換能器驅動信號 ,如下文更詳細描述。 Waveform preprocessor 326 may receive the raw transducer drive signal , the waveform preprocessor may modify the original transducer drive signal based on parameters received by the self-impedance measurement subsystem 308 and/or based on any other factors. , in order to generate the processed transducer driving signal and . For example, this modification may include changes to the processed transducer drive signal and control to prevent over-driving of the electromagnetic actuator 304 which may cause damage. Additionally, the waveform preprocessor 326 may modify the original transducer drive signal based on the interference suppression signal generated based on the detected interference and received from the impedance measurement subsystem 308 , as described in more detail below.
經處理之換能器驅動信號 繼而可藉由放大器306a放大以產生用於驅動電磁負載301a之一驅動信號 。類似地,經處理之換能器驅動信號 繼而可藉由放大器306b放大以產生用於驅動電磁負載301b之一驅動信號 。如圖3中展示,放大器306a及306b可藉由一電源轉換器310或其他電源產生之一電源電壓V SUPPLY供電,使得電源電壓V SUPPLY跨一電容器312存在。 Processed transducer drive signal It can then be amplified by amplifier 306a to generate a driving signal for driving electromagnetic load 301a. . Similarly, the processed transducer drive signal It can then be amplified by amplifier 306b to generate a driving signal for driving electromagnetic load 301b. . As shown in FIG. 3 , amplifiers 306 a and 306 b may be powered by a power supply voltage V SUPPLY generated by a power converter 310 or other power source such that the power supply voltage V SUPPLY exists across a capacitor 312 .
因此,主機器件300可操作使得電磁致動器304藉由驅動信號 及驅動信號 交替驅動。因此,主機器件300可在一系列交替相位中操作:一第一相位,其中驅動至電磁負載301a之驅動信號 驅動電磁致動器304,且電磁負載301b用於量測電磁致動器304之一位移,及一第二相位,其中驅動至電磁負載301b之驅動信號 驅動電磁致動器304,且電磁負載301a用於量測電磁致動器304之一位移。 Therefore, the host device 300 is operable such that the electromagnetic actuator 304 is driven by the drive signal and drive signal Alternate drive. Thus, host device 300 may operate in a series of alternating phases: a first phase in which the drive signal to electromagnetic load 301a The electromagnetic actuator 304 is driven, and the electromagnetic load 301b is used to measure the displacement of the electromagnetic actuator 304, and a second phase, in which the driving signal driven to the electromagnetic load 301b The electromagnetic actuator 304 is driven, and the electromagnetic load 301a is used to measure the displacement of the electromagnetic actuator 304.
電磁負載301a之一感測端子電壓 可藉由阻抗量測子系統308感測(例如,使用一電壓表)。類似地,透過電磁負載301a之感測電流 可藉由阻抗量測子系統308感測。舉例而言,電流 可藉由跨一分流電阻器302a之一感測電壓 感測,分流電阻器302a具有耦合至電磁負載301a之一端子之電阻R s。 One of the electromagnetic loads 301a senses terminal voltage Can be sensed by impedance measurement subsystem 308 (eg, using a voltmeter). Similarly, the sensing current through the electromagnetic load 301a Can be sensed by impedance measurement subsystem 308. For example, current The voltage can be sensed across a shunt resistor 302a Sense, shunt resistor 302a has resistance Rs coupled to one terminal of electromagnetic load 301a.
同樣地,電磁負載301b之一感測端子電壓 可藉由阻抗量測子系統308感測(例如,使用一電壓表)。類似地,透過電磁負載301b之感測電流 可藉由阻抗量測子系統308感測。舉例而言,電流 可藉由跨一分流電阻器302b之一感測電壓 感測,分流電阻器302b具有耦合至電磁負載301b之一端子之電阻R s。 Likewise, one of the electromagnetic loads 301b senses the terminal voltage Can be sensed by impedance measurement subsystem 308 (eg, using a voltmeter). Similarly, the sensing current through the electromagnetic load 301b Can be sensed by impedance measurement subsystem 308. For example, current The voltage can be sensed across a shunt resistor 302b Sense, shunt resistor 302b has resistance Rs coupled to one terminal of electromagnetic load 301b.
儘管前述考慮具有電阻R s之兩個感測電阻器,但應暸解,在一些實施例中,分流電阻器302a之一電阻可不同於分流電阻器302b之一電阻。事實上,即使希望使分流電阻器302a之電阻與分流電阻器302b之電阻相同,歸因於處理變動及公差,此等電阻可不同。 Although the foregoing considers two sense resistors having resistance Rs , it should be understood that in some embodiments, the resistance of one of shunt resistor 302a may be different than the resistance of shunt resistor 302b. In fact, even if it is desired that the resistance of shunt resistor 302a be the same as the resistance of shunt resistor 302b, these resistances may be different due to process variations and tolerances.
如圖3中展示,且如下文更詳細描述,處理子系統305可包含一阻抗量測子系統308,其可估計電磁負載301a及301b之各自線圈電感 L COIL 。根據此估計之線圈電感 L COIL ,阻抗量測子系統308可判定與電磁負載(301a或301b)相關聯之一位移。基於此判定之位移,阻抗量測子系統308可將一或多個參數(包含但不限於此位移之值)傳達至波形預處理器326,此可使波形預處理器326修改原始換能器驅動信號 。在一些實施例中,此位移亦可指示一人對電磁致動器304之互動(例如,施加之力)。 As shown in Figure 3, and as described in more detail below, processing subsystem 305 may include an impedance measurement subsystem 308 that may estimate the respective coil inductance L COIL of electromagnetic loads 301a and 301b. Based on the estimated coil inductance L COIL , the impedance measurement subsystem 308 may determine a displacement associated with the electromagnetic load (301a or 301b). Based on the determined displacement, the impedance measurement subsystem 308 may communicate one or more parameters (including but not limited to the value of the displacement) to the waveform preprocessor 326 , which may cause the waveform preprocessor 326 to modify the original transducer. driving signal . In some embodiments, this displacement may also be indicative of a person's interaction (eg, exerted force) with the electromagnetic actuator 304 .
在操作中,為估計阻抗 Z COIL ,阻抗量測子系統308可以任何適合的方式量測阻抗,包含但不限於使用2021年10月8日申請之美國專利申請案第17/497110號中闡述之方法,該案之全文以引用之方式併入本文中。 In operation, to estimate the impedance Z COIL , the impedance measurement subsystem 308 may measure the impedance in any suitable manner, including but not limited to using the methods described in U.S. Patent Application No. 17/497110 filed on October 8, 2021 Methods, the full text of the case is incorporated herein by reference.
作為一特定實例,為了估計線圈阻抗 Z COIL ,波形預處理器326可產生一經處理之換能器驅動信號 或 (取決於哪個電磁線圈301係用於驅動電磁負載(301a或301b)之移動之致動線圈及哪個電磁線圈301用於感測),信號包括用於驅動感測線圈之一高頻激勵。據此回應,阻抗量測子系統308可量測感測線圈之阻抗。 As a specific example, to estimate coil impedance Z COIL , waveform preprocessor 326 may generate a processed transducer drive signal or (Depending on which solenoid 301 is the actuation coil used to drive the movement of the electromagnetic load (301a or 301b) and which solenoid 301 is used for sensing), the signal includes a high frequency excitation for driving the sensing coil. In response, the impedance measurement subsystem 308 can measure the impedance of the sensing coil.
可使用各種方法來估計線圈阻抗 Z COIL ,包含時域及頻域方法。舉例而言,依賴於一斷續傅立葉轉換計算之頻域方法可具有一頻譜之隱式頻格之一優點,該頻譜取決於收集電流及電壓樣本之一時間長度。作為一特定實例,在一200 μs之持續時間內,對感測電流及感測端子電壓計算一斷續傅立葉轉換,導致5 KHz之頻格。在應用斷續傅立葉轉換之前對一信號之額外加窗可濾除諧波且衰減遠離信號頻率之頻率。因此,當使用此一方法時,量測精度可僅受落在一信號頻格內或窗函數峰值處之干擾能量或雜訊之影響。 Various methods can be used to estimate the coil impedance Z COIL , including time domain and frequency domain methods. For example, frequency domain methods that rely on a discontinuous Fourier transform calculation can have the advantage of an implicit frequency grid of a spectrum that depends on the length of time over which current and voltage samples are collected. As a specific example, a discontinuous Fourier transform is calculated on the sense current and the sense terminal voltage over a duration of 200 μs, resulting in a frequency grid of 5 KHz. Additional windows on a signal before applying a discontinuous Fourier transform filter out harmonics and attenuate frequencies far away from the signal frequency. Therefore, when using this method, the measurement accuracy can only be affected by the interference energy or noise falling within a signal frequency bin or at the peak of the window function.
複雜阻抗之準確估計可需要最小化雜訊、偏移誤差、增益誤差及/或藉由量測電路增加之其他干擾。雖然可透過校準使偏移誤差及增益誤差最小化,且可藉由精確電路設計使熱雜訊及量化雜訊最小化,但電源雜訊仍可引起量測效能之退化。Accurate estimation of complex impedances may require minimizing noise, offset errors, gain errors, and/or other interference added by the measurement circuitry. Although offset and gain errors can be minimized through calibration, and thermal and quantization noise can be minimized through precise circuit design, power supply noise can still cause degradation in measurement performance.
為說明此電源雜訊源,主機器件300之各種組件可自不同的電源軌操作。舉例而言,放大器306a及306b可自電源電壓V SUPPLY操作,阻抗量測子系統308之類比部分可在一類比電源軌(例如,圖4中展示之類比電源電壓VDDA)下操作,且阻抗量測子系統308之數位部分可在一數位電源軌(例如,圖4中展示之數位電源電壓VDDD)下操作。此等軌之任何一者上之雜訊可在量測之電壓及電流上引入額外的雜訊,因此影響量測準確。 To account for this source of power noise, various components of host device 300 may operate from different power rails. For example, amplifiers 306a and 306b may operate from supply voltage V SUPPLY , the analog portion of impedance measurement subsystem 308 may operate from an analog supply rail (eg, the analog supply voltage VDDA shown in Figure 4), and the impedance quantity The digital portion of the measurement subsystem 308 may operate on a digital power rail (eg, the digital power supply voltage VDDD shown in Figure 4). Noise on either of these rails can introduce additional noise into the measured voltage and current, thus affecting the accuracy of the measurements.
此外,入射於器件接腳上之干擾信號可增加量測雜訊。另外,藉由一個通道上之一觸覺調或一導頻調之重播引起之在升壓供電軌供電放大器306a及306b中存在之雜訊可增加在另一通道之阻抗感測電路上之量測雜訊。In addition, interference signals incident on device pins can increase measurement noise. In addition, the presence of noise in boost rail powered amplifiers 306a and 306b caused by the replay of a tactile tone or a pilot tone on one channel can increase the measurement on the impedance sensing circuit of the other channel. Noise.
其他潛在干擾源可包含直接入射於耦合至電磁致動器304之器件引腳上之射頻干擾、基板雜訊及/或自鄰近跡線或區塊耦合至感測路徑中之其他雜散雜訊。Other potential sources of interference may include radio frequency interference directly incident on the device pins coupled to the electromagnetic actuator 304, substrate noise, and/or other spurious noise coupled into the sensing path from adjacent traces or blocks. .
圖4繪示根據本發明實施例之一實例阻抗量測子系統308之選定組件。如圖4中展示,電磁負載301a之感測端子電壓 可藉由一類比前端(AFE) 401a調節,且藉由一類比至數位轉換器(ADC) 403a轉換為感測端子電壓 之一數位表示。同樣地,電磁負載301b之感測端子電壓 可藉由一AFE 401b調節,且藉由一類比至數位轉換器(ADC) 403b轉換為感測端子電壓 之一數位表示。類似地,指示電流 之感測電壓 可藉由一AFE 402a調節且藉由一ADC 404a轉換為一數位表示。類似地,指示電流 之感測電壓 可藉由一AFE 402b調節且藉由一ADC 404b轉換為一數位表示。 FIG. 4 illustrates selected components of an example impedance measurement subsystem 308 according to an embodiment of the present invention. As shown in Figure 4, the sensing terminal voltage of the electromagnetic load 301a It can be adjusted by an analog front end (AFE) 401a and converted to a sensing terminal voltage by an analog to digital converter (ADC) 403a One digit representation. Similarly, the sensing terminal voltage of the electromagnetic load 301b It can be adjusted by an AFE 401b and converted to the sensing terminal voltage by an analog-to-digital converter (ADC) 403b One digit representation. Similarly, indicating current The sensing voltage May be conditioned by an AFE 402a and converted to a digital representation by an ADC 404a. Similarly, indicating current The sensing voltage Can be adjusted by an AFE 402b and converted to a digital representation by an ADC 404b.
感測端子電壓 、感測端子電壓 、感測電壓 及感測電壓 之數位表示可藉由一阻抗估計器410接收及處理,阻抗估計器410可根據歐姆定律判定線圈阻抗 Z COIL ,如上文更詳細描述。 Sense terminal voltage , sensing terminal voltage , sensing voltage and sensing voltage The digital representation may be received and processed by an impedance estimator 410, which may determine the coil impedance Z COIL based on Ohm's law, as described in greater detail above.
亦如圖4中展示,阻抗量測子系統308亦可包含用於偵測及抑制主機器件300中存在之干擾之組件,該干擾可不利地影響阻抗估計器410之量測準確,包含上文描述之該等干擾源。舉例而言,阻抗量測子系統308可包含電壓削波偵測電路412、電流削波偵測電路414及干擾判定電路416。在操作中,一大於預期之帶內信號可導致AFE 401a、401b、402a及402b中之任一者及/或ADC 403a、403b、404a及404d中之任一者之信號削波(例如,期望之信號幅度大於一電源電壓,使得信號被電源電壓之幅度「削波」),因此將誤差引入阻抗量測。假定阻抗估計器410之下游處理塊可不知道任何上游削波,則在此等處理塊之輸出處量測之信號可不用於偵測干擾之存在。因此,電壓削波偵測電路412及電流削波偵測電路414之各者可經組態以判定在量測之電壓及電流信號之任一者或兩者中是否發生信號削波,舉例而言,藉由將此等信號與等於相關電源電壓(例如,VDDA)減去一預判定信號容許度之一臨限值比較。若一或多個此等信號超過其各自臨限值,則干擾判定電路416可判定干擾存在,且產生一或多個干擾抑制信號以抑制干擾之存在,如下文更詳細描述。As also shown in FIG. 4 , the impedance measurement subsystem 308 may also include components for detecting and suppressing interference present in the host device 300 that may adversely affect the measurement accuracy of the impedance estimator 410 , including the above. Describe the sources of interference. For example, the impedance measurement subsystem 308 may include a voltage clipping detection circuit 412, a current clipping detection circuit 414, and an interference determination circuit 416. In operation, a larger-than-expected in-band signal may cause signal clipping at any of the AFEs 401a, 401b, 402a, and 402b and/or any of the ADCs 403a, 403b, 404a, and 404d (e.g., the desired The signal amplitude is greater than a supply voltage, causing the signal to be "clipped" by the amplitude of the supply voltage), thus introducing errors into the impedance measurement. Assuming that the downstream processing blocks of the impedance estimator 410 may not be aware of any upstream clipping, the signals measured at the outputs of these processing blocks may not be used to detect the presence of interference. Accordingly, each of voltage clipping detection circuit 412 and current clipping detection circuit 414 may be configured to determine whether signal clipping occurs in either or both of the measured voltage and current signals, for example. In other words, by comparing these signals to a threshold equal to the associated supply voltage (eg, VDDA) minus a predetermined signal tolerance. If one or more of these signals exceeds their respective thresholds, interference determination circuit 416 may determine that interference is present and generate one or more interference suppression signals to suppress the presence of interference, as described in greater detail below.
亦如圖4中展示,阻抗量測子系統308可包含複數個快速傅立葉轉換(FFT)塊418,各FFT塊418經組態以對ADC 403a、403b、404a及404b之一者之一各自輸出執行一快速傅立葉轉換。除上文描述之削波偵測方法之外或替代地,當無信號被驅動至電磁致動器304時,或作為無期望之觸覺效應被驅動至電磁致動器304之一結果,或作為其中一零幅度信號被驅動至電磁致動器304之一專屬偵測模式之一結果,干擾判定電路416與FFT塊418協作,可執行一零信號干擾偵測。當無信號被驅動至電磁致動器304時,跨一電磁負載301之量測電壓及透過此電磁負載301之電流兩者理想應為零。然而,若當無信號被驅動至電磁致動器304時,所量測電流之一者或兩者高於一各自臨限值,則接著干擾判定電路416可安全地斷定存在一帶內干擾。此電壓及電流比較可在量測之電壓及電流信號之FFT頻格之後執行,以將各頻格中之信號幅度與一臨限值比較,以確保量測及識別關注之一帶中之任何干擾信號。As also shown in Figure 4, the impedance measurement subsystem 308 may include a plurality of fast Fourier transform (FFT) blocks 418, each FFT block 418 configured to output one of the ADCs 403a, 403b, 404a, and 404b. Perform a fast Fourier transform. In addition to or alternatively to the clipping detection method described above, when no signal is driven to the electromagnetic actuator 304, or as a result of an undesired tactile effect being driven to the electromagnetic actuator 304, or as As a result of a zero-amplitude signal being driven into one of the dedicated detection modes of the electromagnetic actuator 304, the interference determination circuit 416, in cooperation with the FFT block 418, can perform a zero-signal interference detection. When no signal is driven to the electromagnetic actuator 304, both the measured voltage across an electromagnetic load 301 and the current through the electromagnetic load 301 should ideally be zero. However, if one or both of the measured currents is above a respective threshold when no signal is driven to the electromagnetic actuator 304, then the interference determination circuit 416 can safely conclude that an in-band interference exists. This voltage and current comparison can be performed after the FFT bins of the measured voltage and current signals to compare the signal amplitude in each bin to a threshold to ensure measurement and identification of any interference in the band of interest signal.
儘管圖4將FFT塊418描繪為在阻抗估計器410之外,但在一些實施例中,FFT塊418可為阻抗估計器410之整合。Although FIG. 4 depicts FFT block 418 as external to impedance estimator 410, in some embodiments, FFT block 418 may be integrated with impedance estimator 410.
除上文描述之削波偵測方法及/或零信號偵測方法以外或替代地,干擾判定電路416與FFT塊418協作,可對一干擾執行一直接干擾偵測。為了說明,干擾判定電路416可藉由在比一典型阻抗估計週期更長之一時段內計算一DFT來判定一干擾之一頻率。此更長之估計週期可將頻譜分為更較窄的頻格,有助於相對於信號頻率精確定位干擾之頻率。舉例而言,一FFT頻格可為f s/N寬,其中N為FFT點數,且f s為採樣頻率。對於FFT點之一第一數量N 1,落在一頻格之外之任何潛在干擾可作為非干擾信號而被拒絕。然而,可藉由計算具有一第二數量N 2> N 1之FFT點之一更大FFT來偵測落入信號頻格內之任何干擾,以希望將信號及潛在干擾放置在單獨頻格中。在與更大FFT中之信號之頻格鄰近之一頻格中存在能量可識別一帶內干擾之存在,而在更大FFT之一鄰近頻格中缺少能量可確認缺少干擾信號。 In addition to or alternatively to the clipping detection method and/or the zero signal detection method described above, the interference determination circuit 416 cooperates with the FFT block 418 to perform a direct interference detection for an interference. To illustrate, the interference determination circuit 416 may determine a frequency of an interference by calculating a DFT over a period longer than a typical impedance estimation period. This longer estimation period divides the spectrum into narrower bins, helping to pinpoint the frequency of interference relative to the signal frequency. For example, an FFT bin may be f s /N wide, where N is the number of FFT points and f s is the sampling frequency. For a first number N 1 of FFT points, any potential interference falling outside one frequency bin can be rejected as a non-interfering signal. However, any interference falling within the signal bin can be detected by computing a larger FFT with a second number of N 2 > N 1 FFT points, with the hope of placing the signal and potential interference in a separate bin. . The presence of energy in a frequency bin adjacent to that of the signal in the larger FFT identifies the presence of in-band interference, while the lack of energy in an adjacent frequency bin in the larger FFT confirms the absence of an interfering signal.
已使用一或多個前述方法偵測干擾之存在,干擾判定電路416可使用下文描述之一或多個方法或使用任何其他適合的方法來抑制干擾。舉例而言,在一些實施例中,干擾判定電路416可藉由增加信號頻率之振幅來抑制一信號干擾之一影響。在此等實施例中,其可較佳地係,只要在感測電路之信號路徑中不發生削波,則僅增加振幅。Having detected the presence of interference using one or more of the aforementioned methods, the interference determination circuit 416 may suppress the interference using one or more of the methods described below or using any other suitable method. For example, in some embodiments, the interference determination circuit 416 may suppress the effects of a signal interference by increasing the amplitude of the signal frequency. In such embodiments, it may be preferable to only increase the amplitude as long as no clipping occurs in the signal path of the sensing circuit.
作為另一實例,在此等及其他實施例中,干擾判定電路416可藉由修改信號頻率來抑制一信號干擾之一影響,使得信號頻率及干擾頻率不在鄰近之FFT頻格中。As another example, in these and other embodiments, interference determination circuit 416 may suppress the effects of a signal interference by modifying the signal frequency so that the signal frequency and the interference frequency are not in adjacent FFT bins.
作為一進一步實例,在此等及其他實施例中,干擾判定電路416亦可引起阻抗估計器410之一濾波器在干擾之頻率處施加一陷波或歸零,以便進一步抑制信號干擾之影響。As a further example, in these and other embodiments, the interference determination circuit 416 may also cause a filter of the impedance estimator 410 to apply a notch or zero at the frequency of the interference to further suppress the effects of signal interference.
作為又一實例,在此等及其他實施例中,若一干擾源為已知的,舉例而言,電源電壓V SUPPLY上之一紋波,則干擾判定電路416可經組態以引起此等源之衰減。作為一特定實例,在干擾來自電源電壓V SUPPLY上之一紋波之情況下,電容器312之電容可為可變的(例如,其中電容器312可藉由開關電容元件之一並列組合來實施),且干擾判定電路416可產生一或多個干擾抑制控制信號(圖4中未清楚展示),以增加電容器312之電容,以相對於信號振幅減小紋波之幅度。 As yet another example, in these and other embodiments, if a source of interference is known, for example, a ripple on supply voltage V SUPPLY , interference determination circuit 416 may be configured to cause such The decay of the source. As a specific example, the capacitance of capacitor 312 may be variable (e.g., where capacitor 312 may be implemented with a parallel combination of switched capacitive elements) in the case where the interference comes from a ripple on the supply voltage V SUPPLY . And the interference determination circuit 416 can generate one or more interference suppression control signals (not clearly shown in FIG. 4 ) to increase the capacitance of the capacitor 312 to reduce the amplitude of the ripple relative to the signal amplitude.
如本文中使用,當兩個或更多個元件被稱為彼此「耦合」時,此術語指示此兩個或更多個元件處於電子通信或機械通信(如適用)中,無論間接連接或直接連接,有或無中介元件。As used herein, when two or more elements are referred to as being "coupled" with each other, this term indicates that the two or more elements are in electronic communication or mechanical communication, as applicable, whether indirectly connected or directly connected. Connections, with or without intervening elements.
本發明包括一般技術者將暸解之對本文實例實施例之全部變化、置換、變動、改變及修改。類似地,在適當情況下,隨附發明申請專利範圍包括一般技術者將暸解之對本文實例實施例之全部變化、置換、變動、改變及修改。此外,在隨附發明申請專利範圍中,對適於、配置成、能夠、經組態以、可使、可操作成或操作成執行一特定功能之一裝置或系統或一裝置或系統之一組件之引用包括該裝置、系統或組件,無論其或該特定功能是否啟動、開啟或解鎖,只要該裝置、系統或組件經如此適應、配置、能夠、組態、啟用、可操作或操作。因此,在不脫離本發明之範疇之情況下,可對本文描述之系統、裝置及方法進行修改、添加或省略。舉例而言,系統及裝置之組件可被整合或分開。此外,本文揭示之系統及裝置之操作可藉由更多、更少或其他組件執行,且所描述之方法可包含更多、更少或其他步驟。另外,步驟可以任何適合的順序執行。如在此件中使用,「各」指一集合之各部件或一集合之一子集之各部件。The present invention includes all variations, permutations, alterations, alterations and modifications of the example embodiments herein that would be apparent to one of ordinary skill in the art. Likewise, where appropriate, the scope of the accompanying invention claims includes all variations, permutations, alterations, alterations and modifications of the example embodiments herein that would be apparent to one of ordinary skill in the art. Furthermore, within the patent scope of the accompanying invention application, a device or system or one of a device or system that is suitable for, configured to, capable of, configured to, enable, operate or operate to perform a specific function. A reference to a component includes that device, system or component, whether or not it or that particular function is enabled, enabled or unlocked, so long as the device, system or component is so adapted, configured, capable, configured, enabled, operable or operative. Accordingly, modifications, additions, or omissions may be made to the systems, devices, and methods described herein without departing from the scope of the invention. For example, components of systems and devices may be integrated or separated. Furthermore, operations of the systems and devices disclosed herein may be performed by more, fewer, or other components, and the methods described may include more, fewer, or other steps. Additionally, the steps may be performed in any suitable order. As used herein, "each" refers to each component of a collection or a subset of a collection.
儘管例示性實施例在圖中繪示且在下文描述,但可使用任何數目之技術來實施本發明之原理,無論當前是否已知。本發明決不應限制於圖式中繪示及上文描述之例示性實施方案及技術。Although illustrative embodiments are shown in the figures and described below, the principles of the invention may be implemented using any number of techniques, whether currently known or not. This invention should in no way be limited to the exemplary embodiments and techniques illustrated in the drawings and described above.
除非另有明確說明,否則圖式中描繪之物品不一定按比例繪製。Items depicted in the drawings are not necessarily to scale unless expressly stated otherwise.
本文敘述之全部實例及條件語言旨在用於教學目的,以幫助讀者暸解本發明及發明人為推進該技術所貢獻之概念,且被解釋為不限制於此等明確敘述之實例及條件。儘管已詳細描述本發明之實施例,但應暸解,在不脫離本發明之精神及範疇之情況下,可對其進行各種變化、置換及改變。All examples and conditional language described herein are intended for teaching purposes to help readers understand the present invention and the concepts contributed by the inventor to advance this technology, and are not to be construed as limited to such explicitly stated examples and conditions. Although the embodiments of the present invention have been described in detail, it should be understood that various changes, substitutions and alterations can be made thereto without departing from the spirit and scope of the invention.
儘管上文已列舉特定優點,但各種實施例可包含一些、沒有或全部列舉之優點。另外,在檢視前述圖及描述之後,對於一般技術者來說其他技術優點可變得顯而易見。Although specific advantages have been enumerated above, various embodiments may include some, none, or all of the enumerated advantages. Additionally, other technical advantages may become apparent to those of ordinary skill upon review of the foregoing figures and descriptions.
為幫助專利局及就本申請案發佈之任何專利之任何讀者解釋隨附發明申請專利範圍,申請人希望注意,其等不希望任何隨附發明申請專利範圍或發明申請專利範圍元件引用35 U.S.C. § 112(f),除非在特定發明申請專利範圍中明確使用詞語「構件用於」或「步驟用於」。To assist the Patent Office and any reader of any patent issued with respect to this application in interpreting the accompanying invention claims, Applicants wish to note that they do not intend that any accompanying invention claims or invention claim elements reference 35 U.S.C. § 112(f), unless the words "means for" or "step for" are expressly used in the patentable scope of a particular invention.
100:器件 101:控制器 102:放大器 103:振動致動器 201:質量彈簧系統 300:主機器件 301a,301b:電磁負載 302a,302b:分流電阻器 304:電磁致動器 305:處理子系統 306a,306b:放大器 308:阻抗量測子系統 310:電源轉換器 312:電容器 324:信號產生器 326:波形預處理器 401a,401b,402a,402b:類比前端 403a,403b,404a,404b:類比至數位轉換器 410:阻抗估計器 412:電壓削波偵測電路 414:電流削波偵測電路 416:干擾判定電路 418:傅立葉轉換(FFT)塊 100:Device 101:Controller 102:Amplifier 103:Vibration actuator 201: Mass spring system 300: Host device 301a, 301b: Electromagnetic load 302a, 302b: shunt resistor 304:Electromagnetic actuator 305: Processing subsystem 306a, 306b: Amplifier 308: Impedance measurement subsystem 310:Power converter 312:Capacitor 324: Signal generator 326:Waveform preprocessor 401a, 401b, 402a, 402b: analog front end 403a, 403b, 404a, 404b: analog to digital converter 410: Impedance estimator 412: Voltage clipping detection circuit 414: Current clipping detection circuit 416: Interference determination circuit 418: Fourier Transform (FFT) block
藉由參考以下結合隨附圖式之描述,可獲得對本實施例及其優點之一更完整暸解,其中相同元件符號指示相同特徵,且其中:A more complete understanding of this embodiment and one of its advantages may be obtained by referring to the following description taken in conjunction with the accompanying drawings, in which like reference numerals refer to like features, and in which:
圖1繪示此項技術中已知之一器件中之一振動觸覺系統的一實例;Figure 1 illustrates an example of a vibrotactile system in a device known in the art;
圖2繪示此項技術中已知之模型化為一線性系統之一線性諧振致動器(LRA)之一實例;Figure 2 illustrates an example of a linear resonant actuator (LRA) known in the art modeled as a linear system;
圖3繪示根據本發明實施例之一實例主機器件之選定組件;且3 illustrates selected components of an example host device according to one embodiment of the invention; and
圖4繪示根據本發明實施例之一實例阻抗量測子系統之選定組件。Figure 4 illustrates selected components of an example impedance measurement subsystem according to an embodiment of the invention.
300:主機器件 300: Host device
301a,301b:電磁負載 301a, 301b: Electromagnetic load
302a,302b:分流電阻器 302a, 302b: shunt resistor
304:電磁致動器 304:Electromagnetic actuator
305:處理子系統 305: Processing subsystem
306a,306b:放大器 306a, 306b: Amplifier
308:阻抗量測子系統 308: Impedance measurement subsystem
310:電源轉換器 310:Power converter
312:電容器 312:Capacitor
324:信號產生器 324: Signal generator
326:波形預處理器 326:Waveform preprocessor
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